BGX7100 evaluation board application note

AN11014
BGX7100 evaluation board application note
Rev. 1.0 — 13 April 2012
Application note
Document information
Info
Content
Keywords
BGX7100, I/Q modulator, EVB, IP3, CP1, NF, PCB
Abstract
This application note describes the BGX7100 evaluation board (EVB)
design and its performance. BGX7100 is an I/Q modulator designed for
base station applications. This EVB includes the 50 Ω standard SMA
connectors for ease of evaluation.
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BGX7100 evaluation board application note
Revision history
Rev
Date
Description
1.0
Initial version
20120413
Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
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BGX7100 evaluation board application note
1. Introduction
The evaluation board (EVB) described in this document allows evaluating the BGX7100.
This document provides the EVB circuit schematic, the bill of materials of the board, the
information about PCB technology and its artwork, list of equipments for a typical test
set-up required to evaluate the device, and finally the typical test results expected to be
obtained.
2. Product Description
The BGX7100 is a high linearity I/Q modulator and provides 1.5 dB of typical voltage
gain, 11 dBm of 1 dB output compression point (OCP1dB) and 27 dBm typical outputs
IP3O. BGX7100 has 200 Ω differentials I/Q input termination internally. Thanks to its
flexible input Vi(cm) feature, any common mode voltage value between 0.25 V up to 3.3 V
can be acceptable for similar RF performances.
Fig 1.
Pin description
Its high level of integration enables easy application usage and reduced BOM. Dedicated
power OFF/ON pin permits to switch ON or OFF the device. In addition, multiple supply
and ground pins allow for independent supply domains to improve the isolation between
blocks.
3. EVB Circuit Description
The evaluation board was built on a 25 mil, 4 layers PCB using FR4 based technology
and is illustrated in Fig.2 associated with its schematic in Fig.3.
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Fig 2.
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Evaluation board
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Fig 3.
Evaluation board schematic
Two LO configuration options available, resulting two bills of material:
1.
2.
LO differential (use RF transformer to apply LO in differential between LO_N and LO_P)
LO single (LO source connected to LO_P using matching surface mount component,
LO_N connected to ground using a DC bypass capacitor)
Choice depends on performances to be achieved.
LO differential mode will be chosen to improve image suppression and IP2. Whereas LO
single mode will be chosen to improve LO leakage.
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Description
Package
Vendors
Qty
Multi Contact
2
T1, T2
2 mm 200 – 52 Banana Plug supply connector
RX1, RX2, RX3, RX4, RX5, RX6
142-0701-851
SMA connector, 50 Ω
Emerson/Johnson
6
L7
BLM18SG700TN1D
ferrite bead
0603
Murata
1
capacitor
0805
Murata
1
Samtec
1
C10
Values
4.7 µF / 16 V
2.54 mm header 2 ways
Poff drive
C6, C7
COG
capacitor
0402
Murata
2
18 pF
C4, C9
COG
capacitor
0402
Murata
2
100 nF
C1
COG
capacitor
0403
Murata
1
39 pF
C5, C8
COG
capacitor
0402
Murata
2
22 pF
C12
GJM1555C1HR70WB01
capacitor
0402
Murata
1
0.8 pF
C13
GJM1555C1HR30WB01
capacitor
0402
Murata
1
0.3 pF
C11
NC
L2, L8
NC
TR1
TC1-1-43A+
LO transformer
AT224 – 1A
Mini-circuits
1
resistor
0402
Murata
4
I/Q modulator
HVQFN24 (SOT616 – 3) NXP
R5, R8, R10, R13, R14
NC
U1
BGX7100
0Ω
1
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BGX7100 evaluation board application note
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CAV1
R4, R7, R9, R12
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Application note
Bill Of Material (BOM) of BGX7100 EVB – LO differential
Reference
Part
Description
Package
Vendors
Qty Values
Multi Contact
2
Emerson/Johnson
6
T1, T2
2 mm 200 – 52 Banana Plug supply connector
RX1, RX2, RX3, RX4, RX5, RX6
142-0701-851
SMA connector, 50 Ω
L7
BLM18SG700TN1D
ferrite bead
0603
Murata
1
capacitor
0805
Murata
1
Samtec
1
Murata
2
12 pF
C10
4.7 µF / 16 V
2.54 mm header 2 ways
Poff drive
C7, C11
COG
capacitor
0402
C4, C9
COG
capacitor
0402
Murata
2
100 nF
C1
COG
capacitor
0402
Murata
1
39 pF
C5, C8
COG
capacitor
0402
Murata
2
22 pF
C12
GJM1555C1HR70WB01
capacitor
0402
Murata
1
0.8 pF
L2
NC
inductor
0402
Murata
1
resistor
0402
Murata
6
I/Q modulator
HVQFN24 (SOT616 – 3) NXP
C13
NC
TR1
NC
R4, R7, R9, R12, R14, C6
R5, R8, R10, R13
NC
U1
BGX7100
0Ω
1
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BGX7100 evaluation board application note
Rev. 1.0 — 13 April 2012
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CAV1
L8
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Application note
Bill Of Material (BOM) of BGX7100 EVB – LO single
Reference
Part
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BGX7100 evaluation board application note
Fig 4.
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Evaluation board component placement
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Fig 5.
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Evaluation board top layer PCB layout
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Fig 6.
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Evaluation board inner layer_1 PCB layout
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Fig 7.
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Evaluation board inner layer_2 PCB layout
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Fig 8.
Evaluation board bottom layer PCB layout
(1) Etching class: Class5 standard.
(2) Minimum copper conductor with: 150 µm.
(3) Minimum conductor spacing: 150 µm.
(4) Ni-Au (Cobalt) finishing: 3 µm - 25 µm of nickel and 0.1 µm – 1.5 µm of gold.
(5) Board dimension: 45.5 mm x 28.75 mm.
(6) Solder mask both sides green color.
(7) Silkscreen on top layer white color.
(8) Finished thickness: 1 mm +/- 10 %.
(9) Top layer 460 µm traces are controlled impedance, 50 Ω lines.
Fig 9.
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Evaluation board PCB technology
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4. Test Setup
Fig 10. Test setup block diagram
5. Quick Start
The BGX7100 EVB kit is fully assembled and factory tested.
Test Equipment Required
Fig 10 shows the equipment required to verify the operation of the BGX7100 EVB kit. It is
intended as a guide only, and some substitutions are possible.
Connections
This section provides a step-by-step guide to testing the basic functionality of the EVB
kit. As a general precaution to prevent damaging the outputs by driving high-VSWR
loads, do not turn on DC power or RF signal generators until all connections are
made:
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1.
Connect 3 dB pads to the DUT ends of each RF signal generators and SMA
cables (RF OUT / LO IN). This padding improves VSWR, and reduces the errors
due to mismatch.
2.
Measure loss in 3 dB pads and cables. Use this loss as an offset in all output
power/gain calculations.
3.
Disable all RF signal sources.
4.
Connect the signal sources to the appropriate SMA inputs.
5.
Set the LO and IF signal generators according to the following:
•
•
IF AWG signal source: 1 V (p-p) differential into DUT at 5 MHz
LO signal source: 0 dBm into DUT at 1960 MHz
(fRF = 1965 MHz)
6.
Set the DC supply to +5.0 V and set a current limit around 250 mA. Connect
supplies to the EVB kit through the ammeter. Turn on the supply.
Readjust the supply to get +5.0 V at the EVB kit. There will be a voltage drop
across the ammeter when the mixer is drawing current.
7.
Enable the LO and the IF sources.
6. Typical Operating Characteristics
6.1 RF measurements:
VCC = 5 V, PRF = - 10 dBm, Pi(lo) = 0 dBm, TC = +25 °C.
(1) Matching optimized for 2 GHz frequency range.
Fig 11. LO port input matching single ended
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(1) Matching optimized for 2 GHz frequency range.
Fig 12. LO port input matching differential
Fig 13. RF port output matching
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Fig 14. I/Q input signal
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(1) Temperature = -40 °C.
(2) Temperature = -20 °C.
(3) Temperature = 0 °C.
(4) Temperature = 20 °C.
(5) Temperature = 25 °C.
(6) Temperature = 40 °C.
(7) Temperature = 60 °C.
(8) Temperature = 80 °C.
Fig 15. Current consumption
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(1) Temperature = -40 °C.
(2) Temperature = -20 °C.
(3) Temperature = 0 °C.
(4) Temperature = 20 °C.
(5) Temperature = 25 °C.
(6) Temperature = 40 °C.
(7) Temperature = 60 °C.
(8) Temperature = 80 °C.
Fig 16. Voltage gain versus temperature
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(1) Vi(cm) I/Q = 0.5 V.
(2) V i(cm) I/Q = 1.7 V.
(3) V i(cm) I/Q = 2.5 V.
Small dependency with input common mode voltage on I/Q inputs.
Power level collected with a spectrum analyzer, which explains the variations.
Fig 17. Voltage gain versus common mode
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(1) Temperature = -40 °C.
(2) Temperature = -20 °C.
(3) Temperature = 0 °C.
(4) Temperature = 20 °C.
(5) Temperature = 40 °C.
(6) Temperature = 60 °C.
(7) Temperature = 80 °C.
I/Q = 5 MHz +/- 0.5 MHz.
Fig 18. Output IP3O versus temperature
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(1) V i(cm) = 0.5 V.
(2) V i(cm) = 1.7 V.
(3) V i(cm) = 2.5V.
IP3O identical for different V i(cm) voltages.
Improved compared to last design.
I/Q = 5 MHz +/- 0.5 MHz.
Fig 19. Output IP3O versus common mode
Fig 20. 1 dB compression point
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(1) Q path.
(2) I path.
(3) First order model.
RF generator on each I/Q baseband lines is used so that we can reach high frequencies.
This explains some ups and downs on the attenuation curves.
I/Q lines are well matched.
Estimated first order cut-off frequency around 800 MHz.
Fig 21. I/Q frequency response
Fig 22. Harmonic emissions – one tone at 2 GHz
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(1) F1 level (dBm) = -2000 – 6.2.
(2) F2 level (dBm) = -2000 – 6.2.
(3) LO + F1 + F2 level (dBm) = -2000 – 6.2.
(4) LO – (F2 – F1 level (dBm) = -2000 – 6.2.
(5) LO – (F1 – F2 level (dBm) = -2000 – 6.2.
(6) LO – F1 – F2 level (dBm) = -2000 – 6.2.
(7) LO – 2F2 level (dBm) = -2000 – 6.2.
(8) LO – 2F1 level (dBm) = -2000 – 6.2.
Fig 23. Po and IM2 at 2 GHz
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(1) LO + F1 + F2 level (dBm) -0.2 - -10.
(2) LO + F1 + F2 level (dBm) -3.2 - -10.
(3) LO + F1 + F2 level (dBm) -6.2 - -10.
(4) LO + F1 + F2 level (dBm) -9.2 - -10.
(5) F1 level (dBm) -0.2 - -10.
(6) F1 level (dBm) -3.2 - -10.
(7) F1 level (dBm) -6.2 - -10.
(8) F1 level (dBm) -9.2 - -10.
Fig 24. IM2 versus Pi(lo) on all frequency band
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(1) Temperature = -40 °C.
(2) Temperature = -20 °C.
(3) Temperature = 0 °C.
(4) Temperature = 20 °C.
(5) Temperature = 25 °C.
(6) Temperature = 40 °C.
(7) Temperature = 60 °C.
(8) Temperature = 80 °C.
Fig 25. Unadjusted sideband suppression versus Pi(lo) and temperature
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(1) Temperature = -40 °C.
(2) Temperature = -20 °C.
(3) Temperature = 0 °C.
(4) Temperature = 20 °C.
(5) Temperature = 25 °C.
(6) Temperature = 40 °C.
(7) Temperature = 60 °C.
(8) Temperature = 80 °C.
Fig 26. Unadjusted sideband suppression versus frequency and temperature
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(1) Temperature = -40 °C.
(2) Temperature = -20 °C.
(3) Temperature = 0 °C.
(4) Temperature = 20 °C.
(5) Temperature = 25 °C.
(6) Temperature = 40 °C.
(7) Temperature = 60 °C.
(8) Temperature = 80 °C.
Fig 27. Unadjusted carrier suppression versus frequency and temperature
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(1) Temperature = -40 °C.
(2) Temperature = -20 °C.
(3) Temperature = 0 °C.
(4) Temperature = 20 °C.
(5) Temperature = 25 °C.
(6) Temperature = 40 °C.
(7) Temperature = 60 °C.
(1) Temperature = 80 °C.
Fig 28. Unadjusted carrier suppression versus Pi(lo) and temperature
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(1) Device number = 5.
(2) Device number = 15.
(3) Device number = 70.
(4) Device number = 75.
(5) Device number = 69.
Fig 29. Adjusted sideband suppression
(1) Device number = 5.
(2) Device number = 15.
(3) Device number = 70.
(4) Device number = 75.
(5) Device number = 69.
Fig 30. Adjusted carrier suppression
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DC offset, phase and gain unbalance and on different devices after adjustment
Frequency (MHz) 2000
Device
Optimal I/Q
Optimal I/Q
mismatch phase mismatch gain
Optimal I/Q
Optimal I/Q
mismatch DC I mismatch DC Q
Carrier level
Image suppression
Tx output power
(deg)
(dB)
(mV)
(mV)
(dBm)
(dB)
(dBm)
5
2.684
-0.229
-2
-0.9
-75.1
80.6
-1.1
15
0.269
-0.013
-4.5
-1.6
-79.1
85.3
-1
70
0.892
-0.005
-4.4
-1.3
-74.1
81.4
-1
75
-0.146
0.007
-4.2
-2.5
-86.3
89.1
-1
69
0.343
-0.008
-2.9
-1.6
-74.4
76.2
-1
Frequency (MHz )
Optimal I/Q
mismatch phase
Optimal I/Q
mismatch gain
Optimal I/Q
Optimal I/Q
mismatch DC I mismatch DC Q
Carrier level
Image suppression
Tx output power
(Deg)
(dB)
(mV)
(mV)
(dBm)
(dB)
(dBm)
900
-0.36
0.004
-0.3
-0.7
-81.9
79.6
-1.1
1000
-0.27
0.004
-0.4
-0.9
-78.4
77.5
-1
1800
0.608
-0.003
-2.3
-1.6
-74.8
80.2
-1.2
1900
2000
0.513
-0.007
-2.5
-1.6
-77.8
84.6
-1.1
0.343
-0.008
-2.9
-1.6
-75.4
76.2
-1
2600
-0.15
-0.021
-3.7
-1.9
-76
81.8
-1
3300
-0.377
-0.02
-3.7
-4
-80.7
78
-1.2
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DC offset, phase and gain unbalance at different frequency for the same device
Device
69
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(1) Device number = 15.
(2) Device number = 75.
(3) Device number = 69.
Fig 31. Noise floor without signal – offset = 5 MHz
(1) LO power = -3 dBm.
(2) LO power = 0 dBm.
(3) LO power = 3 dBm.
(4) LO power = 6 dBm.
Fig 32. Noise floor with signal – frequency = 1960 MHz - offset = 10 MHz
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Fig 33. IP3O, IM3, noise floor and output power
Fig 34. Power OFF functionality
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Fig 35. Power OFF functionality
Fig 36. Power OFF functionality
The device could be used in a frequency band extension down to 400 MHz and up to 4
GHz with small degradation on sideband suppression.
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6.2 Comparison between differential and single ended LO input:
(1) dB(S11): POFF_P = shutdown disabled.
(2) dB(S11): POFF_P = shutdown enabled.
Fig 37. Power OFF/ON behavior single ended LO port input matching
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(1) dB(S11): POFF_P = shutdown disabled.
(2) dB(S11): POFF_P = shutdown enabled.
Fig 38. Power OFF/ON behavior differential LO port input matching
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(1) Differential LO input.
(2) Single ended LO input.
Main difference seen at high frequency: differential input is better for Image Rejection but worse for
LO Leakage.
Fig 39. Sideband and carrier suppression versus single ended and differential LO
input matching
3 IM2 products measured: LO + F1 + F2; LO – F1 – F2; LO + F2 – F1.
Differential LO input gives significantly less IM2 power (especially at high frequency).
Fig 40. IM2 versus single ended and differential LO input matching
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6.3 System measurement:
6.3.1 One carrier GMSK
Fig 41. One carrier GMSK Po = 0dBm
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Fig 42. One carrier GMSK Po = -5dBm
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6.3.2 One carrier Edge
Fig 43. One carrier EDGE Po = -1.5dBm
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Fig 44. One carrier EDGE Po = -5dBm
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6.3.3 Six carriers GMSK
Fig 45. Six carrier GMSK Po = -10dBm
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6.3.4 One carrier WCDMA
Fig 46. One carrier WCDMA Po = -8dBm
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(1) ACLR_5M; Pi(lo) = 2 – 3 dBm; VCC = 5 V; PO = -8 dB.
(2) ACLR_10M; Pi(lo) = 2 – 3 dBm; VCC = 5 V; PO = -8 dB.
Fig 47. One carrier WCDMA - ACLR
(1) Pi(lo) = 2 – 3 dBm; VCC = 5 V; PO = -8 dB; PXA measurement.
(2) Pi(lo) = 2 – 3 dBm; VCC = 5 V; PO = -8 dB; FSQ measurement.
Fig 48. One carrier WCDMA - EVM
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6.3.5 Two carriers WCDMA
Fig 49. Two carriers WCDMA
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(1) ACLR_5M; Pi(lo) = 2 dB – 3 dB; VCC = 5 V; Po = -11 dBm per carrier.
(2) ACLR_10M; Pi(lo) = 2 dB – 3 dB; VCC = 5 V; Po = -11 dBm per carrier.
Fig 50. Two carriers WCDMA ACLR
(1) Pi(lo) = 2 dBm – 3 dBm; VCC = 5 V; Po = -11 dBm per carrier.
Fig 51. Two carriers WCDMA EVM
7. DC Interface between DAC1408D650 or DAC1627D1G25 and BGX7100
DAC1408D650/750 is a high speed 14-bit dual channel Digital-to-Analog Converter
(DAC) with selectable 2x, 4x, 8x interpolating. Its serial interface “JESD204A” feature
simplifies the baseband/FPGA to DAC interface and enables the high density integration,
easy PCB layout, lower radiated noise and spurs, lower pin count, self-synchronous link,
skew compensation. Because of its digital on-chip complex modulator, the
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DAC1408D650/750 allows the complex pattern provided through lane0, lane1, lane2,
lane3, to be converted from baseband to IF. The mixing frequency is adjusted via a
Serial Peripheral Interface (SPI) with 32-bit Numerically Controlled Oscillator (NCO) and
the phase is controlled by a 16-bit register. The Multiple Device Synchronization (MDS)
guarantees a maximum skew of one output clock period between several DAC devices.
MDS incorporates the modes Master/slave or All slave modes.
The DAC1627D1G25 is a 16-bit dual-channel digital-to-analog converter (DAC) with
selectable 2x, 4x and 8x interpolating filters optimized for multi-carrier and broad band
wireless transmitters at sample rates up to 1.25 Gsps. Supplied from 3.3 V and 1.8 V
power sources, it integrates a differential scalable output current up to 31.8 mA. The
mixer frequency is set by a high resolution 40-bit Numerically Controlled Oscillator
(NCO). High resolution internal gain, phase and offset control provide outstanding image
and LO rejection at the system analog modulator output. An inverse (sin x)/x function
ensures controlled flatness at the DAC output. The LVDS DDR receiver interface allows
a high data bandwidth (312.5 Msps) at the input.
When the system operation requires to keep the DC component of the complex spectrum
which is the case for the zero-IF (direct up conversion) transmitters, the interface
between DAC1408D650 or DAC1627D1G25 and BGX7100 must be DC coupled. In that
case, the offset compensation for LO cancellation can be handled by making use of the
digital offset control in the DAC without using AUXDAC outputs. However, if the complete
dynamic range of the signal path of the DAC is preferred to be preserved only for the
transmitted signal dynamic but not for the offset control, in that case the AUXDAC
outputs are available for this purpose.
7.1 DC Interface without AUXDAC utilization
(1) IOUTnP/IOUTnN (with n = A or B); Vo(cm) = 2.3 V; Vo(diff)(p-p) = 1 V.
(1) BBP/BBN; Vi(cm) = 2.3 V; Vo(diff)(p-p) = 1 V; offset correction via signal path (IOUTnP/IOUTnN (with n
= A or B)).
Fig 52. Example of DC interface with Vi(cm) of 2.3V
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7.2 DC Interface with AUXDAC utilization for DC offset compensation
(1) IOUTnP/IOUTnN (with n = A or B); Vo(cm) = 2.59 V; Vo(diff)(p-p) = 1 V.
(2) BBP/BBN; Vi(cm) = 2.59 V; Vo(diff)(p-p) = 1 V; offset correction up to 42 mV.
Fig 53. Example of DC interface with Vi(cm) of 2.59 V with DC offset compensation up
to 42 mV via AUXDAC
7.3 Recommendations about DC interface network:
In this chapter two different types of interface networks were proposed above as the
examples. As well as the JESD204A serial interface feature of the DAC1408D650, the
flexibility of the BGX7100 in terms of common mode I,Q input dc voltage levels (0.5 V
~3.3 V) and its finite input impedance (200 Ω) simplifies the complete transmit chain
application and enables the further integration.
Depending on the preference to control the common mode dc offset, there are two
different possibilities. The first possibility is to use the digital offset control in the DAC
(through the signal/modulation chain) which needs only a pull-up resistor (100 Ω)) per
DAC output (Fig.52). In that case, a small amount of DAC dynamic should be reserved
for the offset control purpose. The second possibility is to use the AUXDAC outputs
directly for differential offset control (LO cancellation) and combine these outputs with the
DAC outputs in a proper way as proposed in Fig.53.
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8. Legal information
8.1 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences
of use of such information.
8.2 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability
towards customer for the products described herein shall be limited in
accordance with the Terms and conditions of commercial sale of NXP
Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP
Semiconductors accepts no liability for any assistance with applications or
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customer product design. It is customer’s sole responsibility to determine
whether the NXP Semiconductors product is suitable and fit for the
customer’s applications and products planned, as well as for the planned
application and use of customer’s third party customer(s). Customers should
provide appropriate design and operating safeguards to minimize the risks
associated with their applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Evaluation products — This product is provided on an “as is” and “with all
faults” basis for evaluation purposes only. NXP Semiconductors, its affiliates
and their suppliers expressly disclaim all warranties, whether express,
implied or statutory, including but not limited to the implied warranties of noninfringement, merchantability and fitness for a particular purpose. The entire
risk as to the quality, or arising out of the use or performance, of this product
remains with customer.
In no event shall NXP Semiconductors, its affiliates or their suppliers be
liable to customer for any special, indirect, consequential, punitive or
incidental damages (including without limitation damages for loss of
business, business interruption, loss of use, loss of data or information, and
the like) arising out the use of or inability to use the product, whether or not
based on tort (including negligence), strict liability, breach of contract, breach
of warranty or any other theory, even if advised of the possibility of such
damages.
Notwithstanding any damages that customer might incur for any reason
whatsoever (including without limitation, all damages referenced above and
all direct or general damages), the entire liability of NXP Semiconductors, its
affiliates and their suppliers and customer’s exclusive remedy for all of the
foregoing shall be limited to actual damages incurred by customer based on
reasonable reliance up to the greater of the amount actually paid by
customer for the product or five dollars (US$5.00). The foregoing limitations,
exclusions and disclaimers shall apply to the maximum extent permitted by
applicable law, even if any remedy fails of its essential purpose.
8.3 Trademarks
Notice: All referenced brands, product names, service names and
trademarks are property of their respective owners.
All information provided in this document is subject to legal disclaimers.
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9. List of figures
Fig 1.
Fig 2.
Fig 3.
Fig 4.
Fig 5.
Fig 6.
Fig 7.
Fig 8.
Fig 9.
Fig 10.
Fig 11.
Fig 12.
Fig 13.
Fig 14.
Fig 15.
Fig 16.
Fig 17.
Fig 18.
Fig 19.
Fig 20.
Fig 21.
Fig 22.
Fig 23.
Fig 24.
Fig 25.
Fig 26.
Fig 27.
Fig 28.
Fig 29.
Fig 30.
Fig 31.
Fig 32.
Fig 33.
Fig 34.
Fig 35.
Fig 36.
Fig 37.
Fig 38.
Fig 39.
Pin description .................................................. 3
Evaluation board ............................................... 4
Evaluation board schematic .............................. 5
Evaluation board component placement ........... 8
Evaluation board top layer PCB layout ............. 9
Evaluation board inner layer_1 PCB layout..... 10
Evaluation board inner layer_2 PCB layout..... 11
Evaluation board bottom layer PCB layout...... 12
Evaluation board PCB technology .................. 12
Test setup block diagram ................................ 13
LO port input matching single ended .............. 14
LO port input matching differential .................. 15
RF port output matching ................................. 15
I/Q input signal ................................................ 16
Current consumption....................................... 17
Voltage gain versus temperature .................... 18
Voltage gain versus common mode ................ 19
Output IP3O versus temperature ..................... 20
Output IP3O versus common mode ................. 21
1 dB compression point .................................. 21
I/Q frequency response ................................... 22
Harmonic emissions – one tone at 2 GHz ....... 22
Po and IM2 at 2 GHz ....................................... 23
IM2 versus Pi(lo) on all frequency band ............ 24
Unadjusted sideband suppression versus Pi(lo)
and temperature.............................................. 25
Unadjusted sideband suppression versus
frequency and temperature ............................. 26
Unadjusted carrier suppression versus
frequency and temperature ............................. 27
Unadjusted carrier suppression versus Pi(lo) and
temperature..................................................... 28
Adjusted sideband suppression ...................... 29
Adjusted carrier suppression........................... 29
Noise floor without signal – offset = 5 MHz ..... 31
Noise floor with signal – frequency = 1960 MHz
- offset = 10 MHz............................................. 31
IP3O, IM3, noise floor and output power.......... 32
Power OFF functionality .................................. 32
Power OFF functionality .................................. 33
Power OFF functionality .................................. 33
Power OFF/ON behavior single ended LO port
input matching................................................. 34
Power OFF/ON behavior differential LO port
input matching................................................. 35
Sideband and carrier suppression versus single
ended and differential LO input matching ....... 36
AN11014
Application note
Fig 40.
Fig 41.
Fig 42.
Fig 43.
Fig 44.
Fig 45.
Fig 46.
Fig 47.
Fig 48.
Fig 49.
Fig 50.
Fig 51.
Fig 52.
Fig 53.
IM2 versus single ended and differential LO
input matching .................................................36
One carrier GMSK Po = 0dBm.........................37
One carrier GMSK Po = -5dBm .......................38
One carrier EDGE Po = -1.5dBm .....................39
One carrier EDGE Po = -5dBm ........................40
Six carrier GMSK Po = -10dBm .......................41
One carrier WCDMA Po = -8dBm ....................42
One carrier WCDMA - ACLR...........................43
One carrier WCDMA - EVM ............................43
Two carriers WCDMA......................................44
Two carriers WCDMA ACLR ...........................45
Two carriers WCDMA EVM .............................45
Example of DC interface with Vi(cm) of 2.3V .....46
Example of DC interface with Vi(cm) of 2.59 V
with DC offset compensation up to 42 mV via
AUXDAC .........................................................47
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10. List of tables
Bill Of Material (BOM) of BGX7100 EVB – LO differential .. 6
Bill Of Material (BOM) of BGX7100 EVB – LO single ......... 7
DC offset, phase and gain unbalance and on different
devices after adjustment ................................. 30
DC offset, phase and gain unbalance at different frequency
for the same device......................................... 30
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11. Contents
1.
2.
3.
4.
5.
6.
6.1
6.2
6.3
6.3.1
6.3.2
6.3.3
6.3.4
6.3.5
7.
7.1
7.2
7.3
8.
8.1
8.2
8.3
9.
10.
11.
Introduction ......................................................... 3
Product Description ............................................ 3
EVB Circuit Description ...................................... 3
Test Setup .......................................................... 13
Quick Start ......................................................... 13
Typical Operating Characteristics ................... 14
RF measurements:........................................... 14
Comparison between differential and single
ended LO input:................................................ 34
System measurement: ..................................... 37
One carrier GMSK ............................................ 37
One carrier Edge .............................................. 39
Six carriers GMSK ............................................ 41
One carrier WCDMA ........................................ 42
Two carriers WCDMA ...................................... 44
DC Interface between DAC1408D650 or
DAC1627D1G25 and BGX7100 ......................... 45
DC Interface without AUXDAC utilization ......... 46
DC Interface with AUXDAC utilization for DC
offset compensation ......................................... 47
Recommendations about DC interface network:
......................................................................... 47
Legal information .............................................. 48
Definitions ........................................................ 48
Disclaimers....................................................... 48
Trademarks ...................................................... 48
List of figures..................................................... 49
List of tables ...................................................... 50
Contents ............................................................. 51
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in the section 'Legal information'.
© NXP B.V. 2012.
All rights reserved.
For more information, visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 13 April 2012
Document identifier: AN11014