CY7C1526KV18, CY7C1513KV18, CY7C1515KV18 72-Mbit QDR® II SRAM Four-Word Burst Architecture Datasheet.pdf

CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
72-Mbit QDR® II SRAM Four-Word
Burst Architecture
72-Mbit QDR® II SRAM Four-Word Burst Architecture
Features
Configurations
■
Separate independent read and write data ports
❐ Supports concurrent transactions
CY7C1526KV18 – 8M × 9
■
333 MHz clock for high bandwidth
CY7C1515KV18 – 2M × 36
■
Four-word burst for reducing address bus frequency
Functional Description
■
Double data rate (DDR) interfaces on both read and write ports
(data transferred at 666 MHz) at 333 MHz
■
Two input clocks (K and K) for precise DDR timing
❐ SRAM uses rising edges only
■
Two input clocks for output data (C and C) to minimize clock
skew and flight time mismatches
■
Echo clocks (CQ and CQ) simplify data capture in high speed
systems
■
Single multiplexed address input bus latches address inputs
for read and write ports
■
Separate port selects for depth expansion
■
Synchronous internally self-timed writes
■
QDR® II operates with 1.5 cycle read latency when DOFF is
asserted HIGH
■
Operates similar to QDR I device with one cycle read latency
when DOFF is asserted Low
■
Available in × 9, × 18, and × 36 configurations
■
Full data coherency, providing most current data
■
Core VDD = 1.8 V (±0.1 V); I/O VDDQ = 1.4 V to VDD
❐ Supports both 1.5 V and 1.8 V I/O supply
■
Available in 165-ball fine pitch ball grid array (FBGA) package
(13 × 15 × 1.4 mm)
All synchronous inputs pass through input registers controlled by
the K or K input clocks. All data outputs pass through output
registers controlled by the C or C (or K or K in a single clock
domain) input clocks. Writes are conducted with on-chip
synchronous self-timed write circuitry.
■
Offered in both Pb-free and non Pb-free packages
For a complete list of related documentation, click here.
■
Variable drive HSTL output buffers
■
JTAG 1149.1 compatible test access port
■
Phase-locked loop (PLL) for accurate data placement
CY7C1513KV18 – 4M × 18
The CY7C1526KV18, CY7C1513KV18, and CY7C1515KV18
are 1.8-V synchronous pipelined SRAMs, equipped with QDR II
architecture. QDR II architecture consists of two separate ports:
the read port and the write port to access the memory array. The
read port has dedicated data outputs to support read operations
and the write port has dedicated data inputs to support write
operations. QDR II architecture has separate data inputs and
data outputs to completely eliminate the need to “turnaround” the
data bus that exists with common I/O devices. Each port can be
accessed through a common address bus. Addresses for read
and write addresses are latched on alternate rising edges of the
input (K) clock. Accesses to the QDR II read and write ports are
independent of one another. To maximize data throughput, both
read and write ports are equipped with DDR interfaces. Each
address location is associated with four 9-bit words
(CY7C1526KV18), 18-bit words (CY7C1513KV18), or 36-bit
words (CY7C1515KV18) that burst sequentially into or out of the
device. Because data can be transferred into and out of the
device on every rising edge of both input clocks (K and K and C
and C), memory bandwidth is maximized while simplifying
system design by eliminating bus ‘turnarounds’.
Depth expansion is accomplished with port selects, which
enables each port to operate independently.
Selection Guide
Description
Maximum operating frequency
•
300 MHz
250 MHz
200 MHz
Unit
333
300
250
200
MHz
×9
600
560
490
Not Offered
mA
× 18
620
570
500
440
× 36
850
790
680
Not Offered
Maximum operating current
Cypress Semiconductor Corporation
Document Number: 001-00435 Rev. *V
333 MHz
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised January 19, 2016
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Logic Block Diagram – CY7C1526KV18
9
A(20:0)
21
Write
Reg
2M x 9 Array
DOFF
Write
Reg
2M x 9 Array
K
CLK
Gen.
Write
Reg
2M x 9 Array
K
2M x 9 Array
Address
Register
Write Add. Decode
Write
Reg
Address
Register
Read Add. Decode
D[8:0]
21
A(20:0)
RPS
Control
Logic
Read Data Reg.
C
C
CQ
36
VREF
WPS
18
Control
Logic
BWS[0]
Document Number: 001-00435 Rev. *V
18
Reg.
Reg.
Reg. 9
9
9
9
CQ
9
Q[8:0]
Page 2 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Logic Block Diagram – CY7C1513KV18
DOFF
Address
Register
Read Add. Decode
K
CLK
Gen.
Write
Reg
1M x 18 Array
K
Write
Reg
1M x 18 Array
Address
Register
Write
Reg
1M x 18 Array
20
Write
Reg
1M x 18 Array
A(19:0)
18
Write Add. Decode
D[17:0]
20
A(19:0)
RPS
Control
Logic
Read Data Reg.
C
C
CQ
72
VREF
WPS
36
Control
Logic
BWS[1:0]
Document Number: 001-00435 Rev. *V
36
Reg.
Reg.
Reg. 18
18
18
18
CQ
18
Q[17:0]
Page 3 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Logic Block Diagram – CY7C1515KV18
DOFF
Address
Register
Read Add. Decode
K
CLK
Gen.
Write
Reg
512K x 36 Array
K
Write
Reg
512K x 36 Array
Address
Register
Write
Reg
512K x 36 Array
19
Write
Reg
512K x 36 Array
A(18:0)
36
Write Add. Decode
D[35:0]
19
A(18:0)
RPS
Control
Logic
Read Data Reg.
C
C
CQ
144
VREF
WPS
72
Control
Logic
BWS[3:0]
Document Number: 001-00435 Rev. *V
72
Reg.
Reg.
Reg. 36
36
36
36
CQ
36
Q[35:0]
Page 4 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Contents
Pin Configurations ........................................................... 6
Pin Definitions .................................................................. 8
Functional Overview ........................................................ 9
Read Operations ......................................................... 9
Write Operations ....................................................... 10
Byte Write Operations ............................................... 10
Concurrent Transactions ........................................... 10
Depth Expansion ....................................................... 10
Programmable Impedance ........................................ 10
Echo Clocks .............................................................. 10
PLL ............................................................................ 10
Application Example ...................................................... 11
Truth Table ...................................................................... 12
Write Cycle Descriptions ............................................... 12
Write Cycle Descriptions ............................................... 13
Write Cycle Descriptions ............................................... 13
IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 14
Disabling the JTAG Feature ...................................... 14
Test Access Port ....................................................... 14
Performing a TAP Reset ........................................... 14
TAP Registers ........................................................... 14
TAP Instruction Set ................................................... 14
TAP Controller State Diagram ....................................... 16
TAP Controller Block Diagram ...................................... 17
TAP Electrical Characteristics ...................................... 17
TAP AC Switching Characteristics ............................... 18
TAP Timing and Test Conditions .................................. 19
Identification Register Definitions ................................ 20
Scan Register Sizes ....................................................... 20
Document Number: 001-00435 Rev. *V
Instruction Codes ........................................................... 20
Boundary Scan Order .................................................... 21
Power-Up Sequence in QDR II SRAM ........................... 22
Power-Up Sequence ................................................. 22
PLL Constraints ......................................................... 22
Maximum Ratings ........................................................... 23
Operating Range ............................................................. 23
Neutron Soft Error Immunity ......................................... 23
Electrical Characteristics ............................................... 23
DC Electrical Characteristics ..................................... 23
AC Electrical Characteristics ..................................... 25
Capacitance .................................................................... 25
Thermal Resistance ........................................................ 25
AC Test Loads and Waveforms ..................................... 25
Switching Characteristics .............................................. 26
Switching Waveforms .................................................... 28
Ordering Information ...................................................... 29
Ordering Code Definitions ......................................... 29
Package Diagram ............................................................ 30
Acronyms ........................................................................ 31
Document Conventions ................................................. 31
Units of Measure ....................................................... 31
Document History Page ................................................. 32
Sales, Solutions, and Legal Information ...................... 35
Worldwide Sales and Design Support ....................... 35
Products .................................................................... 35
PSoC® Solutions ...................................................... 35
Cypress Developer Community ................................. 35
Technical Support ..................................................... 35
Page 5 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Pin Configurations
The pin configurations for CY7C1526KV18, CY7C1513KV18, and CY7C1515KV18 follow. [1]
Figure 1. 165-ball FBGA (13 × 15 × 1.4 mm) pinout
CY7C1526KV18 (8M × 9)
1
2
3
4
5
6
7
8
9
10
11
A
CQ
A
A
WPS
NC
K
NC/144M
RPS
A
A
CQ
B
NC
NC
NC
A
NC/288M
K
BWS0
A
NC
NC
Q4
C
NC
NC
NC
VSS
A
NC
A
VSS
NC
NC
D4
D
NC
D5
NC
VSS
VSS
VSS
VSS
VSS
NC
NC
NC
E
NC
NC
Q5
VDDQ
VSS
VSS
VSS
VDDQ
NC
D3
Q3
F
NC
NC
NC
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
NC
G
NC
D6
Q6
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
NC
H
DOFF
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
NC
NC
NC
VDDQ
VDD
VSS
VDD
VDDQ
NC
Q2
D2
K
NC
NC
NC
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
NC
L
NC
Q7
D7
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
Q1
M
NC
NC
NC
VSS
VSS
VSS
VSS
VSS
NC
NC
D1
N
NC
D8
NC
VSS
A
A
A
VSS
NC
NC
NC
P
NC
NC
Q8
A
A
C
A
A
NC
D0
Q0
R
TDO
TCK
A
A
A
C
A
A
A
TMS
TDI
CY7C1513KV18 (4M × 18)
1
2
3
4
5
6
7
8
9
10
11
A
CQ
NC/144M
A
WPS
BWS1
K
NC/288M
RPS
A
A
CQ
B
NC
Q9
D9
A
NC
K
BWS0
A
NC
NC
Q8
C
NC
NC
D10
VSS
A
NC
A
VSS
NC
Q7
D8
D
NC
D11
Q10
VSS
VSS
VSS
VSS
VSS
NC
NC
D7
E
NC
NC
Q11
VDDQ
VSS
VSS
VSS
VDDQ
NC
D6
Q6
F
NC
Q12
D12
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
Q5
G
NC
D13
Q13
VDDQ
VDD
VSS
VDD
VDDQ
NC
NC
D5
H
DOFF
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
NC
NC
D14
VDDQ
VDD
VSS
VDD
VDDQ
NC
Q4
D4
K
NC
NC
Q14
VDDQ
VDD
VSS
VDD
VDDQ
NC
D3
Q3
L
NC
Q15
D15
VDDQ
VSS
VSS
VSS
VDDQ
NC
NC
Q2
M
NC
NC
D16
VSS
VSS
VSS
VSS
VSS
NC
Q1
D2
N
NC
D17
Q16
VSS
A
A
A
VSS
NC
NC
D1
P
NC
NC
Q17
A
A
C
A
A
NC
D0
Q0
R
TDO
TCK
A
A
A
C
A
A
A
TMS
TDI
Note
1. NC/144M and NC/288M are not connected to the die and can be tied to any voltage level.
Document Number: 001-00435 Rev. *V
Page 6 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Pin Configurations (continued)
The pin configurations for CY7C1526KV18, CY7C1513KV18, and CY7C1515KV18 follow. [1]
Figure 1. 165-ball FBGA (13 × 15 × 1.4 mm) pinout
CY7C1515KV18 (2M × 36)
1
2
3
4
5
6
7
8
9
10
11
A
CQ
NC/288M
A
WPS
BWS2
K
BWS1
RPS
A
NC/144M
CQ
B
Q27
Q18
D18
A
BWS3
K
BWS0
A
D17
Q17
Q8
C
D27
Q28
D19
VSS
A
NC
A
VSS
D16
Q7
D8
D
D28
D20
Q19
VSS
VSS
VSS
VSS
VSS
Q16
D15
D7
E
Q29
D29
Q20
VDDQ
VSS
VSS
VSS
VDDQ
Q15
D6
Q6
F
Q30
Q21
D21
VDDQ
VDD
VSS
VDD
VDDQ
D14
Q14
Q5
G
D30
D22
Q22
VDDQ
VDD
VSS
VDD
VDDQ
Q13
D13
D5
H
DOFF
VREF
VDDQ
VDDQ
VDD
VSS
VDD
VDDQ
VDDQ
VREF
ZQ
J
D31
Q31
D23
VDDQ
VDD
VSS
VDD
VDDQ
D12
Q4
D4
K
Q32
D32
Q23
VDDQ
VDD
VSS
VDD
VDDQ
Q12
D3
Q3
L
Q33
Q24
D24
VDDQ
VSS
VSS
VSS
VDDQ
D11
Q11
Q2
M
D33
Q34
D25
VSS
VSS
VSS
VSS
VSS
D10
Q1
D2
N
D34
D26
Q25
VSS
A
A
A
VSS
Q10
D9
D1
P
Q35
D35
Q26
A
A
C
A
A
Q9
D0
Q0
R
TDO
TCK
A
A
A
C
A
A
A
TMS
TDI
Document Number: 001-00435 Rev. *V
Page 7 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Pin Definitions
Pin Name
I/O
Pin Description
D[x:0]
InputData input signals. Sampled on the rising edge of K and K clocks when valid write operations are active.
Synchronous CY7C1526KV18  D[8:0]
CY7C1513KV18  D[17:0]
CY7C1515KV18  D[35:0]
WPS
InputWrite port select  Active LOW. Sampled on the rising edge of the K clock. When asserted active, a write
Synchronous operation is initiated. Deasserting deselects the write port. Deselecting the write port ignores D[x:0].
NWS0,
NWS1
InputNibble write select 0, 1  Sampled on the rising edge of the K and K clocks when write operations are
Synchronous active. Used to select which nibble is written into the device during the current portion of the write
operations. NWS0 controls D[3:0] and NWS1 controls D[7:4].
All the Nibble Write Selects are sampled on the same edge as the data. Deselecting a Nibble Write Select
ignores the corresponding nibble of data and it is not written into the device.
BWS0,
BWS1,
BWS2,
BWS3
InputByte write select 0, 1, 2, and 3  Active LOW. Sampled on the rising edge of the K and K clocks when
Synchronous write operations are active. Used to select which byte is written into the device during the current portion
of the write operations. Bytes not written remain unaltered.
CY7C1526KV18 BWS0 controls D[8:0]
CY7C1513KV18  BWS0 controls D[8:0] and BWS1 controls D[17:9].
CY7C1515KV18  BWS0 controls D[8:0], BWS1 controls D[17:9],
BWS2 controls D[26:18] and BWS3 controls D[35:27].
All the Byte Write Selects are sampled on the same edge as the data. Deselecting a Byte Write Select
ignores the corresponding byte of data and it is not written into the device.
A
InputAddress inputs. Sampled on the rising edge of the K clock during active read and write operations. These
Synchronous address inputs are multiplexed for both read and write operations. Internally, the device is organized as
8M × 9 (4 arrays each of 2M × 9) for CY7C1526KV18, 4M × 18 (4 arrays each of 1M × 18) for
CY7C1513KV18 and 2M × 36 (4 arrays each of 512K × 36) for CY7C1515KV18. Therefore, only 21
address inputs are needed to access the entire memory array of CY7C1526KV18, 20 address inputs for
CY7C1513KV18 and 19 address inputs for CY7C1515KV18. These inputs are ignored when the
appropriate port is deselected.
Q[x:0]
OutputsData output signals. These pins drive out the requested data when the read operation is active. Valid data
Synchronous is driven out on the rising edge of the C and C clocks during read operations, or K and K when in single
clock mode. On deselecting the read port, Q[x:0] are automatically tristated.
CY7C1526KV18  Q[8:0]
CY7C1513KV18  Q[17:0]
CY7C1515KV18  Q[35:0]
RPS
InputRead port select  Active LOW. Sampled on the rising edge of positive input clock (K). When active, a
Synchronous read operation is initiated. Deasserting deselects the read port. When deselected, the pending access is
allowed to complete and the output drivers are automatically tristated following the next rising edge of the
C clock. Each read access consists of a burst of four sequential transfers.
C
Input Clock
Positive input clock for output data. C is used in conjunction with C to clock out the read data from the
device. C and C can be used together to deskew the flight times of various devices on the board back to
the controller. See Application Example on page 11 for further details.
C
Input Clock
Negative input clock for output data. C is used in conjunction with C to clock out the read data from the
device. C and C can be used together to deskew the flight times of various devices on the board back to
the controller. See Application Example on page 11 for further details.
K
Input Clock
Positive input clock input. The rising edge of K is used to capture synchronous inputs to the device and
to drive out data through Q[x:0] when in single clock mode. All accesses are initiated on the rising edge of K.
K
Input Clock
Negative input clock input. K is used to capture synchronous inputs being presented to the device and to
drive out data through Q[x:0] when in single clock mode.
CQ
Echo Clock
CQ referenced with respect to C. This is a free running clock and is synchronized to the input clock for
output data (C) of the QDR II. In the single clock mode, CQ is generated with respect to K. The timings
for the echo clocks are shown in the Switching Characteristics on page 26.
Document Number: 001-00435 Rev. *V
Page 8 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Pin Definitions (continued)
Pin Name
I/O
Pin Description
CQ
Echo Clock
CQ referenced with respect to C. This is a free running clock and is synchronized to the input clock for
output data (C) of the QDR II. In the single clock mode, CQ is generated with respect to K. The timings
for the echo clocks are shown in the Switching Characteristics on page 26.
ZQ
Input
Output impedance matching input. This input is used to tune the device outputs to the system data bus
impedance. CQ, CQ, and Q[x:0] output impedance are set to 0.2 × RQ, where RQ is a resistor connected
between ZQ and ground. Alternatively, this pin can be connected directly to VDDQ, which enables the
minimum impedance mode. This pin cannot be connected directly to GND or left unconnected.
DOFF
Input
PLL turn off  Active LOW. Connecting this pin to ground turns off the PLL inside the device. The timings
in the PLL turned off operation differs from those listed in this datasheet. For normal operation, this pin is
connected to a pull-up through a 10 k or less pull-up resistor. The device behaves in QDR I mode when
the PLL is turned off. In this mode, the device can be operated at a frequency of up to 167 MHz with QDR
I timing.
TDO
Output
TCK
Input
Test clock (TCK) pin for JTAG.
TDI
Input
Test data in (TDI) pin for JTAG.
TMS
Input
Test mode select (TMS) pin for JTAG.
NC
N/A
Not connected to the die. Can be tied to any voltage level.
NC/144M
N/A
Not connected to the die. Can be tied to any voltage level.
NC/288M
N/A
Not connected to the die. Can be tied to any voltage level.
VREF
VDD
VSS
VDDQ
InputReference
Test data out (TDO) pin for JTAG.
Reference voltage input. Static input used to set the reference level for HSTL inputs, outputs, and AC
measurement points.
Power Supply Power supply inputs to the core of the device.
Ground
Ground for the device.
Power Supply Power supply inputs for the outputs of the device.
Functional Overview
The CY7C1526KV18, CY7C1513KV18, CY7C1515KV18 are
synchronous pipelined burst SRAMs with a read port and a write
port. The read port is dedicated to read operations and the write
port is dedicated to write operations. Data flows into the SRAM
through the write port and flows out through the read port. These
devices multiplex the address inputs to minimize the number of
address pins required. By having separate read and write ports,
the QDR II completely eliminates the need to turn around the
data bus and avoids any possible data contention, thereby
simplifying system design. Each access consists of four 9-bit
data transfers in the case of CY7C1526KV18, four 18-bit data
transfers in the case of CY7C1513KV18, and four 36-bit data
transfers in the case of CY7C1515KV18 in two clock cycles.
This device operates with a read latency of one and half cycles
when DOFF pin is tied HIGH. When DOFF pin is set LOW or
connected to VSS then device behaves in QDR I mode with a
read latency of one clock cycle.
Accesses for both ports are initiated on the positive input clock
(K). All synchronous input timing is referenced from the rising
edge of the input clocks (K and K) and all output timing is
referenced to the output clocks (C and C, or K and K when in
single clock mode).
All synchronous data inputs (D[x:0]) pass through input registers
controlled by the input clocks (K and K). All synchronous data
Document Number: 001-00435 Rev. *V
outputs (Q[x:0]) pass through output registers controlled by the
rising edge of the output clocks (C and C, or K and K when in
single clock mode).
All synchronous control (RPS, WPS, BWS[x:0]) inputs pass
through input registers controlled by the rising edge of the input
clocks (K and K).
CY7C1513KV18 is described in the following sections. The
same basic descriptions apply to CY7C1526KV18 and
CY7C1515KV18.
Read Operations
The CY7C1513KV18 is organized internally as four arrays of
1M × 18. Accesses are completed in a burst of four sequential
18-bit data words. Read operations are initiated by asserting
RPS active at the rising edge of the positive input clock (K). The
address presented to the address inputs is stored in the read
address register. Following the next K clock rise, the
corresponding lowest order 18-bit word of data is driven onto the
Q[17:0] using C as the output timing reference. On the
subsequent rising edge of C, the next 18-bit data word is driven
onto the Q[17:0]. This process continues until all four 18-bit data
words are driven out onto Q[17:0]. The requested data is valid
0.45 ns from the rising edge of the output clock (C or C, or K or
K when in single clock mode). To maintain the internal logic, each
read access must be enabled to complete. Each read access
consists of four 18-bit data words and takes two clock cycles to
complete. Therefore, read accesses to the device cannot be
Page 9 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
When the read port is deselected, the CY7C1513KV18 first
completes the pending read transactions. Synchronous internal
circuitry automatically tristates the outputs following the next
rising edge of the positive output clock (C). This enables a
seamless transition between devices without the insertion of wait
states in a depth expanded memory.
Read access and write access must be scheduled such that one
transaction is initiated on any clock cycle. If both ports are
selected on the same K clock rise, the arbitration depends on the
previous state of the SRAM. If both ports are deselected, the
read port takes priority. If a read was initiated on the previous
cycle, the write port takes priority (as read operations cannot be
initiated on consecutive cycles). If a write was initiated on the
previous cycle, the read port takes priority (as write operations
cannot be initiated on consecutive cycles). Therefore, asserting
both port selects active from a deselected state results in
alternating read or write operations being initiated, with the first
access being a read.
Write Operations
Depth Expansion
Write operations are initiated by asserting WPS active at the
rising edge of the positive input clock (K). On the following K
clock rise the data presented to D[17:0] is latched and stored into
the lower 18-bit write data register, provided BWS[1:0] are both
asserted active. On the subsequent rising edge of the negative
input clock (K) the information presented to D[17:0] is also stored
into the write data register, provided BWS[1:0] are both asserted
active. This process continues for one more cycle until four 18-bit
words (a total of 72 bits) of data are stored in the SRAM. The
72 bits of data are then written into the memory array at the
specified location. Therefore, write accesses to the device
cannot be initiated on two consecutive K clock rises. The internal
logic of the device ignores the second write request. Write
accesses can be initiated on every other rising edge of the
positive input clock (K). Doing so pipelines the data flow such
that 18 bits of data can be transferred into the device on every
rising edge of the input clocks (K and K).
The CY7C1513KV18 has a port select input for each port. This
enables for easy depth expansion. Both port selects are sampled
on the rising edge of the positive input clock only (K). Each port
select input can deselect the specified port. Deselecting a port
does not affect the other port. All pending transactions (read and
write) are completed before the device is deselected.
initiated on two consecutive K clock rises. The internal logic of
the device ignores the second read request. Read accesses can
be initiated on every other K clock rise. Doing so pipelines the
data flow such that data is transferred out of the device on every
rising edge of the output clocks (C and C, or K and K when in
single clock mode).
When deselected, the write port ignores all inputs after the
pending write operations are completed.
Byte Write Operations
Byte write operations are supported by the CY7C1513KV18. A
write operation is initiated as described in the Write Operations
section. The bytes that are written are determined by BWS0 and
BWS1, which are sampled with each set of 18-bit data words.
Asserting the appropriate Byte Write Select input during the data
portion of a write latches the data being presented and writes it
into the device. Deasserting the Byte Write Select input during
the data portion of a write enables the data stored in the device
for that byte to remain unaltered. This feature is used to simplify
read, modify, or write operations to a byte write operation.
Concurrent Transactions
The read and write ports on the CY7C1513KV18 operate
independently of one another. As each port latches the address
inputs on different clock edges, the user can read or write to any
location, regardless of the transaction on the other port. If the
ports access the same location when a read follows a write in
successive clock cycles, the SRAM delivers the most recent
information associated with the specified address location. This
includes forwarding data from a write cycle that was initiated on
the previous K clock rise.
Document Number: 001-00435 Rev. *V
Programmable Impedance
An external resistor, RQ, must be connected between the ZQ pin
on the SRAM and VSS to allow the SRAM to adjust its output
driver impedance. The value of RQ must be 5X the value of the
intended line impedance driven by the SRAM, the allowable
range of RQ to guarantee impedance matching with a tolerance
of ±15% is between 175  and 350 , with VDDQ = 1.5 V. The
output impedance is adjusted every 1024 cycles upon power up
to account for drifts in supply voltage and temperature.
Echo Clocks
Echo clocks are provided on the QDR II to simplify data capture
on high speed systems. Two echo clocks are generated by the
QDR II. CQ is referenced with respect to C and CQ is referenced
with respect to C. These are free running clocks and are
synchronized to the output clock of the QDR II. In the single clock
mode, CQ is generated with respect to K and CQ is generated
with respect to K. The timing for the echo clocks is shown in the
Switching Characteristics on page 26.
PLL
These chips use a PLL that is designed to function between
120 MHz and the specified maximum clock frequency. During
power up, when the DOFF is tied HIGH, the PLL is locked after
20 s of stable clock. The PLL can also be reset by slowing or
stopping the input clocks K and K for a minimum of 30 ns.
However, it is not necessary to reset the PLL to lock to the
desired frequency. The PLL automatically locks 20 s after a
stable clock is presented. The PLL may be disabled by applying
ground to the DOFF pin. When the PLL is turned off, the device
behaves in QDR I mode (with one cycle latency and a longer
access time).
Page 10 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Application Example
Figure 2 shows four QDR II used in an application.
Figure 2. Application Example
ZQ
ZQ
SRAM#1
CQ/CQ
Q[x:0]
RPS WPS BWS C C K K
D[x:0]
A
SRAM#2
RQ
CQ/CQ
Q[x:0]
RPS WPS BWS C C K K
D[x:0]
A
RQ
DATA IN[2x:0]
DATA OUT [2x:0]
ADDRESS
RPS
WPS
BWS
CLKIN1/CLKIN1
CLKIN2/CLKIN2
SOURCE K
SOURCE K
DELAYED K
DELAYED K
FPGA / ASIC
Document Number: 001-00435 Rev. *V
Page 11 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Truth Table
The truth table for CY7C1526KV18, CY7C1513KV18, and CY7C1515KV18 follows. [2, 3, 4, 5, 6, 7]
Operation
K
Write cycle:
Load address on the rising
edge of K; input write data
on two consecutive K and
K rising edges.
L–H
H[8]
Read cycle:
Load address on the rising
edge of K; wait one and a
half cycle; read data on
two consecutive C and C
rising edges.
L–H
L[9]
X
Q(A) at C(t + 1) Q(A + 1) at C(t + 2) Q(A + 2) at C(t + 2) Q(A + 3) at C(t + 3)
NOP: No operation
L–H
H
H
D=X
Q = High-Z
D=X
Q = High-Z
D=X
Q = High-Z
D=X
Q = High-Z
Stopped
X
X
Previous State
Previous State
Previous State
Previous State
Standby: Clock stopped
RPS WPS
DQ
DQ
DQ
DQ
L[9] D(A) at K(t + 1) D(A + 1) at K(t + 1) D(A + 2) at K(t + 2) D(A + 3) at K(t + 2)
Write Cycle Descriptions
The write cycle description table for CY7C1513KV18 follows. [2, 10]
BWS0/ BWS1/
K
K
L
L–H
–
L
L
–
L
H
L–H
L
H
–
H
L
L–H
H
L
–
H
H
L–H
H
H
–
NWS0
NWS1
L
Comments
During the data portion of a write sequence
CY7C1513KV18 both bytes (D[17:0]) are written into the device.
L–H During the data portion of a write sequence:
CY7C1513KV18 both bytes (D[17:0]) are written into the device.
–
During the data portion of a write sequence:
CY7C1513KV18 only the lower byte (D[8:0]) is written into the device, D[17:9] remains unaltered.
L–H During the data portion of a write sequence
CY7C1513KV18 only the lower byte (D[8:0]) is written into the device, D[17:9] remains unaltered.
–
During the data portion of a write sequence
CY7C1513KV18 only the upper byte (D[17:9]) is written into the device, D[8:0] remains unaltered.
L–H During the data portion of a write sequence
CY7C1513KV18 only the upper byte (D[17:9]) is written into the device, D[8:0] remains unaltered.
–
No data is written into the devices during this portion of a write operation.
L–H No data is written into the devices during this portion of a write operation.
Notes
2. X = “Don't Care,” H = Logic HIGH, L = Logic LOW, represents rising edge.
3. Device powers up deselected with the outputs in a tristate condition.
4. “A” represents address location latched by the devices when transaction was initiated. A + 1, A + 2, and A +3 represents the address sequence in the burst.
5. “t” represents the cycle at which a read/write operation is started. t + 1, t + 2, and t + 3 are the first, second and third clock cycles respectively succeeding the “t” clock
cycle.
6. Data inputs are registered at K and K rising edges. Data outputs are delivered on C and C rising edges, except when in single clock mode.
7. Ensure that when the clock is stopped K = K and C = C = HIGH. This is not essential, but permits most rapid restart by overcoming transmission line charging
symmetrically.
8. If this signal was LOW to initiate the previous cycle, this signal becomes a “Don’t Care” for this operation.
9. This signal was HIGH on previous K clock rise. Initiating consecutive read or write operations on consecutive K clock rises is not permitted. The device ignores the
second read or write request.
10. Is based on a write cycle that was initiated in accordance with the Truth Table. NWS0, NWS1, BWS0, BWS1, BWS2, and BWS3 can be altered on different portions
of a write cycle, as long as the setup and hold requirements are achieved.
Document Number: 001-00435 Rev. *V
Page 12 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Write Cycle Descriptions
The write cycle description table for CY7C1526KV18 follows. [11, 12]
BWS0
K
K
L
L–H
–
During the data portion of a write sequence, the single byte (D[8:0]) is written into the device.
L
–
L–H
During the data portion of a write sequence, the single byte (D[8:0]) is written into the device.
H
L–H
–
No data is written into the device during this portion of a write operation.
H
–
L–H
No data is written into the device during this portion of a write operation.
Write Cycle Descriptions
The write cycle description table for CY7C1515KV18 follows. [11, 12]
BWS0
BWS1
BWS2
BWS3
K
K
Comments
L
L
L
L
L–H
–
During the data portion of a write sequence, all four bytes (D[35:0]) are written into
the device.
L
L
L
L
–
L
H
H
H
L–H
L
H
H
H
–
H
L
H
H
L–H
H
L
H
H
–
H
H
L
H
L–H
H
H
L
H
–
H
H
H
L
L–H
H
H
H
L
–
H
H
H
H
L–H
H
H
H
H
–
L–H During the data portion of a write sequence, all four bytes (D[35:0]) are written into
the device.
–
During the data portion of a write sequence, only the lower byte (D[8:0]) is written
into the device. D[35:9] remains unaltered.
L–H During the data portion of a write sequence, only the lower byte (D[8:0]) is written
into the device. D[35:9] remains unaltered.
–
During the data portion of a write sequence, only the byte (D[17:9]) is written into
the device. D[8:0] and D[35:18] remains unaltered.
L–H During the data portion of a write sequence, only the byte (D[17:9]) is written into
the device. D[8:0] and D[35:18] remains unaltered.
–
During the data portion of a write sequence, only the byte (D[26:18]) is written into
the device. D[17:0] and D[35:27] remains unaltered.
L–H During the data portion of a write sequence, only the byte (D[26:18]) is written into
the device. D[17:0] and D[35:27] remains unaltered.
–
During the data portion of a write sequence, only the byte (D[35:27]) is written into
the device. D[26:0] remains unaltered.
L–H During the data portion of a write sequence, only the byte (D[35:27]) is written into
the device. D[26:0] remains unaltered.
–
No data is written into the device during this portion of a write operation.
L–H No data is written into the device during this portion of a write operation.
Notes
11. X = “Don't Care,” H = Logic HIGH, L = Logic LOW, represents rising edge.
12. Is based on a write cycle that was initiated in accordance with the Truth Table on page 12. NWS0, NWS1, BWS0, BWS1, BWS2, and BWS3 can be altered on different
portions of a write cycle, as long as the setup and hold requirements are achieved.
Document Number: 001-00435 Rev. *V
Page 13 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
IEEE 1149.1 Serial Boundary Scan (JTAG)
These SRAMs incorporate a serial boundary scan Test Access
Port (TAP) in the FBGA package. This part is fully compliant with
IEEE Standard #1149.1-2001. The TAP operates using JEDEC
standard 1.8 V I/O logic levels.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
(VSS) to prevent clocking of the device. TDI and TMS are
internally pulled up and may be unconnected. They may
alternatively be connected to VDD through a pull-up resistor. TDO
must be left unconnected. Upon power-up, the device comes up
in a reset state, which does not interfere with the operation of the
device.
Test Access Port
Test Clock
The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.
Test Mode Select (TMS)
The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. This pin may be left
unconnected if the TAP is not used. The pin is pulled up
internally, resulting in a logic HIGH level.
Test Data In (TDI)
The TDI pin is used to serially input information into the registers
and can be connected to the input of any of the registers. The
register between TDI and TDO is chosen by the instruction that
is loaded into the TAP instruction register. For information about
loading the instruction register, see the TAP Controller State
Diagram on page 16. TDI is internally pulled up and can be
unconnected if the TAP is unused in an application. TDI is
connected to the most significant bit (MSB) on any register.
Test Data Out (TDO)
The TDO output pin is used to serially clock data out from the
registers. The output is active, depending upon the current state
of the TAP state machine (see Instruction Codes on page 20).
The output changes on the falling edge of TCK. TDO is
connected to the least significant bit (LSB) of any register.
Performing a TAP Reset
A Reset is performed by forcing TMS HIGH (VDD) for five rising
edges of TCK. This Reset does not affect the operation of the
SRAM and can be performed when the SRAM is operating. At
power up, the TAP is reset internally to ensure that TDO comes
up in a high Z state.
TAP Registers
Registers are connected between the TDI and TDO pins to scan
the data in and out of the SRAM test circuitry. Only one register
can be selected at a time through the instruction registers. Data
is serially loaded into the TDI pin on the rising edge of TCK. Data
is output on the TDO pin on the falling edge of TCK.
Document Number: 001-00435 Rev. *V
Instruction Register
Three-bit instructions are serially loaded into the instruction
register. This register is loaded when it is placed between the TDI
and TDO pins, as shown in TAP Controller Block Diagram on
page 17. Upon power-up, the instruction register is loaded with
the IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state, as described
in the previous section.
When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded with a binary “01” pattern to allow for
fault isolation of the board level serial test path.
Bypass Register
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that is placed between TDI and
TDO pins. This enables shifting of data through the SRAM with
minimal delay. The bypass register is set LOW (VSS) when the
BYPASS instruction is executed.
Boundary Scan Register
The boundary scan register is connected to all of the input and
output pins on the SRAM. Several No Connect (NC) pins are also
included in the scan register to reserve pins for higher density
devices.
The boundary scan register is loaded with the contents of the
RAM input and output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and TDO
pins when the controller is moved to the Shift-DR state. The
EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions are
used to capture the contents of the input and output ring.
The Boundary Scan Order on page 21 shows the order in which
the bits are connected. Each bit corresponds to one of the bumps
on the SRAM package. The MSB of the register is connected to
TDI, and the LSB is connected to TDO.
Identification (ID) Register
The ID register is loaded with a vendor-specific, 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired into
the SRAM and can be shifted out when the TAP controller is in
the Shift-DR state. The ID register has a vendor code and other
information described in Identification Register Definitions on
page 20.
TAP Instruction Set
Eight different instructions are possible with the three-bit
instruction register. All combinations are listed in Instruction
Codes on page 20. Three of these instructions are listed as
RESERVED and must not be used. The other five instructions
are described in this section in detail.
Instructions are loaded into the TAP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO pins. To execute
the instruction after it is shifted in, the TAP controller must be
moved into the Update-IR state.
Page 14 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
IDCODE
The IDCODE instruction loads a vendor-specific, 32-bit code into
the instruction register. It also places the instruction register
between the TDI and TDO pins and shifts the IDCODE out of the
device when the TAP controller enters the Shift-DR state. The
IDCODE instruction is loaded into the instruction register at
power up or whenever the TAP controller is supplied a
Test-Logic-Reset state.
SAMPLE Z
The SAMPLE Z instruction connects the boundary scan register
between the TDI and TDO pins when the TAP controller is in a
Shift-DR state. The SAMPLE Z command puts the output bus
into a High Z state until the next command is supplied during the
Update IR state.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register.
The TAP controller clock can only operate at a frequency up to
20 MHz, while the SRAM clock operates more than an order of
magnitude faster. Because there is a large difference in the clock
frequencies, it is possible that during the Capture-DR state, an
input or output undergoes a transition. The TAP may then try to
capture a signal while in transition (metastable state). This does
not harm the device, but there is no guarantee as to the value
that is captured. Repeatable results may not be possible.
To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller's capture setup plus hold
times (tCS and tCH). The SRAM clock input might not be captured
correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK captured in the boundary scan register.
After the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
PRELOAD places an initial data pattern at the latched parallel
outputs of the boundary scan register cells before the selection
of another boundary scan test operation.
The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required, that is, while the data
captured is shifted out, the preloaded data can be shifted in.
BYPASS
When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
EXTEST
The EXTEST instruction drives the preloaded data out through
the system output pins. This instruction also connects the
boundary scan register for serial access between the TDI and
TDO in the Shift-DR controller state.
EXTEST OUTPUT BUS TRISTATE
IEEE Standard 1149.1 mandates that the TAP controller be able
to put the output bus into a tristate mode.
The boundary scan register has a special bit located at bit #108.
When this scan cell, called the “extest output bus tristate,” is
latched into the preload register during the Update-DR state in
the TAP controller, it directly controls the state of the output
(Q-bus) pins, when the EXTEST is entered as the current
instruction. When HIGH, it enables the output buffers to drive the
output bus. When LOW, this bit places the output bus into a HI-Z
condition.
This bit is set by entering the SAMPLE/PRELOAD or EXTEST
command, and then shifting the desired bit into that cell, during
the Shift-DR state. During Update-DR, the value loaded into that
shift-register cell latches into the preload register. When the
EXTEST instruction is entered, this bit directly controls the output
Q-bus pins. Note that this bit is preset HIGH to enable the output
when the device is powered up, and also when the TAP controller
is in the Test-Logic-Reset state.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
Document Number: 001-00435 Rev. *V
Page 15 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
TAP Controller State Diagram
The state diagram for the TAP controller follows. [13]
1
TEST-LOGIC
RESET
0
0
TEST-LOGIC/
IDLE
1
SELECT
DR-SCAN
1
1
SELECT
IR-SCAN
0
0
1
1
CAPTURE-DR
CAPTURE-IR
0
0
SHIFT-DR
0
SHIFT-IR
1
1
EXIT1-DR
1
EXIT1-IR
0
1
0
PAUSE-DR
0
PAUSE-IR
1
0
1
0
EXIT2-DR
0
EXIT2-IR
1
1
UPDATE-IR
UPDATE-DR
1
0
0
1
0
Note
13. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.
Document Number: 001-00435 Rev. *V
Page 16 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
TAP Controller Block Diagram
0
Bypass Register
2
Selection
Circuitry
TDI
1
0
Selection
Circuitry
Instruction Register
31
30
29
.
.
2
1
0
1
0
TDO
Identification Register
108
.
.
.
.
2
Boundary Scan Register
TCK
TAP Controller
TMS
TAP Electrical Characteristics
Over the Operating Range
Parameter [14, 15, 16]
Description
Test Conditions
Min
Max
Unit
VOH1
Output HIGH voltage
IOH =–2.0 mA
1.4
–
V
VOH2
Output HIGH voltage
IOH =–100 A
1.6
–
V
VOL1
Output LOW voltage
IOL = 2.0 mA
–
0.4
V
VOL2
Output LOW voltage
IOL = 100 A
–
0.2
V
VIH
Input HIGH voltage
VIL
Input LOW voltage
IX
Input and output load current
0.65 × VDD VDD + 0.3
GND  VI  VDD
V
–0.3
0.35 × VDD
V
–5
5
A
Notes
14. These characteristics pertain to the TAP inputs (TMS, TCK, TDI, and TDO). Parallel load levels are specified in the Electrical Characteristics on page 23.
15. Overshoot: VIH(AC) < VDDQ + 0.85 V (Pulse width less than tCYC/2), Undershoot: VIL(AC) > 1.5 V (Pulse width less than tCYC/2).
16. All voltage referenced to ground.
Document Number: 001-00435 Rev. *V
Page 17 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
TAP AC Switching Characteristics
Over the Operating Range
Parameter [17, 18]
Description
Min
Max
Unit
50
–
ns
tTCYC
TCK clock cycle time
tTF
TCK clock frequency
–
20
MHz
tTH
TCK clock HIGH
20
–
ns
tTL
TCK clock LOW
20
–
ns
tTMSS
TMS setup to TCK clock rise
5
–
ns
tTDIS
TDI setup to TCK clock rise
5
–
ns
tCS
Capture setup to TCK rise
5
–
ns
tTMSH
TMS hold after TCK clock rise
5
–
ns
tTDIH
TDI hold after clock rise
5
–
ns
tCH
Capture hold after clock rise
5
–
ns
tTDOV
TCK clock LOW to TDO valid
–
10
ns
tTDOX
TCK clock LOW to TDO invalid
0
–
ns
Setup Times
Hold Times
Output Times
Notes
17. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
18. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.
Document Number: 001-00435 Rev. *V
Page 18 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
TAP Timing and Test Conditions
Figure 3 shows the TAP timing and test conditions. [19]
Figure 3. TAP Timing and Test Conditions
0.9 V
ALL INPUT PULSES
1.8 V
0.9 V
50 
TDO
0V
Z0 = 50 
(a)
CL = 20 pF
tTH
GND
tTL
Test Clock
TCK
tTMSH
tTMSS
tTCYC
Test Mode Select
TMS
tTDIS
tTDIH
Test Data In
TDI
Test Data Out
TDO
tTDOV
tTDOX
Note
19. Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.
Document Number: 001-00435 Rev. *V
Page 19 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Identification Register Definitions
Value
Instruction Field
Description
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
000
000
000
Cypress device ID
(28:12)
11010011011001100
11010011011010100
11010011011100100
Cypress JEDEC ID
(11:1)
00000110100
00000110100
00000110100
Allows unique identification of SRAM vendor.
1
1
1
Indicates the presence
of an ID register.
Revision number
(31:29)
ID register
presence (0)
Version number.
Defines the type of
SRAM.
Scan Register Sizes
Register Name
Bit Size
Instruction
3
Bypass
1
ID
32
Boundary Scan
109
Instruction Codes
Instruction
Code
Description
EXTEST
000
Captures the input and output ring contents.
IDCODE
001
Loads the ID register with the vendor ID code and places the register between TDI and TDO.
This operation does not affect SRAM operation.
SAMPLE Z
010
Captures the input and output contents. Places the boundary scan register between TDI and
TDO. Forces all SRAM output drivers to a High Z state.
RESERVED
011
Do Not Use: This instruction is reserved for future use.
SAMPLE/PRELOAD
100
Captures the input and output ring contents. Places the boundary scan register between TDI
and TDO. Does not affect the SRAM operation.
RESERVED
101
Do Not Use: This instruction is reserved for future use.
RESERVED
110
Do Not Use: This instruction is reserved for future use.
BYPASS
111
Places the bypass register between TDI and TDO. This operation does not affect SRAM
operation.
Document Number: 001-00435 Rev. *V
Page 20 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Boundary Scan Order
Bit #
Bump ID
Bit #
Bump ID
Bit #
Bump ID
Bit #
Bump ID
0
6R
28
10G
56
6A
84
1J
1
6P
29
9G
57
5B
85
2J
2
6N
30
11F
58
5A
86
3K
3
7P
31
11G
59
4A
87
3J
4
7N
32
9F
60
5C
88
2K
5
7R
33
10F
61
4B
89
1K
6
8R
34
11E
62
3A
90
2L
7
8P
35
10E
63
2A
91
3L
8
9R
36
10D
64
1A
92
1M
9
11P
37
9E
65
2B
93
1L
10
10P
38
10C
66
3B
94
3N
11
10N
39
11D
67
1C
95
3M
12
9P
40
9C
68
1B
96
1N
13
10M
41
9D
69
3D
97
2M
14
11N
42
11B
70
3C
98
3P
15
9M
43
11C
71
1D
99
2N
16
9N
44
9B
72
2C
100
2P
17
11L
45
10B
73
3E
101
1P
18
11M
46
11A
74
2D
102
3R
19
9L
47
10A
75
2E
103
4R
20
10L
48
9A
76
1E
104
4P
21
11K
49
8B
77
2F
105
5P
22
10K
50
7C
78
3F
106
5N
23
9J
51
6C
79
1G
107
5R
24
9K
52
8A
80
1F
108
Internal
25
10J
53
7A
81
3G
26
11J
54
7B
82
2G
27
11H
55
6B
83
1H
Document Number: 001-00435 Rev. *V
Page 21 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Power-Up Sequence in QDR II SRAM
QDR II SRAMs must be powered up and initialized in a
predefined manner to prevent undefined operations.
Power-Up Sequence
■
Apply power and drive DOFF either HIGH or LOW (All other
inputs can be HIGH or LOW).
❐ Apply VDD before VDDQ.
❐ Apply VDDQ before VREF or at the same time as VREF.
❐ Drive DOFF HIGH.
■
Provide stable DOFF (HIGH), power and clock (K, K) for 20 s
to lock the PLL.
PLL Constraints
■
PLL uses K clock as its synchronizing input. The input must
have low phase jitter, which is specified as tKC Var.
■
The PLL functions at frequencies down to 120 MHz.
■
If the input clock is unstable and the PLL is enabled, then the
PLL may lock onto an incorrect frequency, causing unstable
SRAM behavior. To avoid this, provide 20 s of stable clock to
relock to the desired clock frequency.
~
~
Figure 4. Power Up Waveforms
K
K
~
~
Unstable Clock
> 20μs Stable clock
Start Normal
Operation
Clock Start (Clock Starts after V DD / V DDQ Stable)
VDD / VDDQ
DOFF
Document Number: 001-00435 Rev. *V
V DD / V DDQ Stable (< +/- 0.1V DC per 50ns )
Fix HIGH (or tie to VDDQ)
Page 22 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Maximum Ratings
Operating Range
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Range
Storage temperature ................................ –65 C to +150 C
Commercial
Ambient temperature
with power applied ................................... –55 C to +125 C
Industrial
Ambient
Temperature (TA)
VDD[21]
VDDQ[21]
0 C to +70 C
1.8 ± 0.1 V
1.4 V to
VDD
–40 C to +85 C
Supply voltage on VDD Relative to GND ......–0.5 V to +2.9 V
Supply Voltage on VDDQ Relative to GND .... –0.5 V to +VDD
Neutron Soft Error Immunity
DC applied to outputs in High Z ........ –0.5 V to VDDQ + 0.3 V
DC input voltage [20] ............................ –0.5 V to VDD + 0.3 V
Current into outputs (LOW) ........................................ 20 mA
Static discharge voltage
(MIL-STD-883, M. 3015) ........................................ > 2001 V
Latch up current .................................................... > 200 mA
Parameter Description
Test
Conditions Typ
Max*
Unit
LSBU
Logical
single-bit
upsets
25 °C
197
216
FIT/
Mb
LMBU
Logical
multi-bit
upsets
25 °C
0
0.01
FIT/
Mb
Single-event
latch up
85 °C
0
0.1
FIT/
Dev
SEL
* No LMBU or SEL events occurred during testing; this column represents a
statistical 2, 95% confidence limit calculation. For more details see Application
Note AN54908 “Accelerated Neutron SER Testing and Calculation of Terrestrial
Failure Rates”.
Electrical Characteristics
Over the Operating Range
DC Electrical Characteristics
Over the Operating Range
Parameter [22]
Description
VDD
Power supply voltage
Test Conditions
Min
Typ
Max
Unit
1.7
1.8
1.9
V
VDDQ
I/O supply voltage
1.4
1.5
VDD
V
VOH
Output HIGH voltage[23]
VDDQ/2 – 0.12
–
VDDQ/2 + 0.12
V
VOL
Output LOW voltage[24]
VDDQ/2 – 0.12
–
VDDQ/2 + 0.12
V
VOH(LOW)
Output HIGH voltage
IOH =–0.1 mA, Nominal Impedance
VDDQ – 0.2
–
VDDQ
V
IOL = 0.1 mA, Nominal Impedance
VOL(LOW)
Output LOW voltage
VSS
–
0.2
V
VIH
Input HIGH voltage
VREF + 0.1
–
VDDQ + 0.3
V
VIL
Input LOW voltage
–0.3
–
VREF – 0.1
V
IX
Input leakage current
GND  VI  VDDQ
–5
–
5
A
IOZ
Output leakage current
GND  VI  VDDQ, Output disabled
VREF
Input reference voltage[25]
Typical Value = 0.75 V
–5
–
5
A
0.68
0.75
0.95
V
Notes
20. Overshoot: VIH(AC) < VDDQ + 0.85 V (Pulse width less than tCYC/2), Undershoot: VIL(AC) > 1.5 V (Pulse width less than tCYC/2).
21. Power up: Assumes a linear ramp from 0 V to VDD(min) within 200 ms. During this time VIH < VDD and VDDQ VDD.
22. All voltage referenced to ground.
23.Output are impedance controlled. IOH = (VDDQ/2)/(RQ/5) for values of 175  RQ 350 
24.Output are impedance controlled. IOL = (VDDQ/2)/(RQ/5) for values of 175   RQ  350 
25. VREF (min) = 0.68 V or 0.46VDDQ, whichever is larger, VREF (max) = 0.95 V or 0.54VDDQ, whichever is smaller.
Document Number: 001-00435 Rev. *V
Page 23 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Electrical Characteristics (continued)
Over the Operating Range
DC Electrical Characteristics (continued)
Over the Operating Range
Parameter [22]
IDD [26]
ISB1
Description
VDD operating supply
Automatic power down
current
Test Conditions
VDD = Max,
IOUT = 0 mA,
f = fMAX = 1/tCYC
Min
Typ
Max
Unit
333 MHz (× 9)
–
–
600
mA
(× 18)
–
–
620
(× 36)
–
–
850
300 MHz (× 9)
–
–
560
(× 18)
–
–
570
(× 36)
–
–
790
250 MHz (× 9)
–
–
490
(× 18)
–
–
500
(× 36)
–
–
680
200 MHz (× 18)
–
–
440
mA
(× 9)
–
–
290
mA
(× 18)
–
–
290
(× 36)
–
–
290
(× 9)
–
–
280
(× 18)
–
–
280
Max VDD,
333 MHz
Both Ports Deselected,
VIN  VIH or VIN  VIL,
f = fMAX = 1/tCYC,
Inputs Static
300 MHz
(× 36)
–
–
280
250 MHz (× 9)
–
–
270
(× 18)
–
–
270
(× 36)
–
–
270
200 MHz (× 18)
–
–
250
mA
mA
mA
mA
mA
Note
26. The operation current is calculated with 50% read cycle and 50% write cycle.
Document Number: 001-00435 Rev. *V
Page 24 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
AC Electrical Characteristics
Over the Operating Range
Parameter [27]
Description
Test Conditions
Min
Typ
Max
Unit
VIH
Input HIGH voltage
VREF + 0.2
–
–
V
VIL
Input LOW voltage
–
–
VREF – 0.2
V
Max
Unit
4
pF
4
pF
Capacitance
Parameter [28]
Description
CIN
Input capacitance
CO
Output capacitance
Test Conditions
TA = 25 C, f = 1 MHz, VDD = 1.8 V, VDDQ = 1.5 V
Thermal Resistance
Parameter [28]
JA (0 m/s)
Description
Thermal resistance
(junction to ambient)
JA (1 m/s)
165-ball FBGA Unit
Package
Test Conditions
Socketed on a 170 × 220 × 2.35 mm, eight-layer printed
circuit board
JA (3 m/s)
14.43
°C/W
13.40
°C/W
12.66
°C/W
JB
Thermal resistance
(junction to board)
11.38
°C/W
JC
Thermal resistance
(junction to case)
3.30
°C/W
AC Test Loads and Waveforms
Figure 5. AC Test Loads and Waveforms
VREF = 0.75 V
VREF
0.75 V
VREF
OUTPUT
Z0 = 50 
Device
Under
Test
RL = 50 
RQ =
250 
(a)
R = 50 
ALL INPUT PULSES
1.25 V
0.75 V
OUTPUT
Device
Under
VREF = 0.75 V Test ZQ
ZQ
0.75 V
INCLUDING
JIG AND
SCOPE
5 pF
[29]
0.25 V
Slew Rate = 2 V/ns
RQ =
250 
(b)
Notes
27. Overshoot: VIH(AC) < VDDQ + 0.85 V (Pulse width less than tCYC/2), Undershoot: VIL(AC) > 1.5 V (Pulse width less than tCYC/2).
28. Tested initially and after any design or process change that may affect these parameters.
29. Unless otherwise noted, test conditions are based on signal transition time of 2V/ns, timing reference levels of 0.75 V, Vref = 0.75 V, RQ = 250 , VDDQ = 1.5 V, input
pulse levels of 0.25 V to 1.25 V, and output loading of the specified IOL/IOH and load capacitance shown in (a) of Figure 5.
Document Number: 001-00435 Rev. *V
Page 25 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Switching Characteristics
Over the Operating Range [30, 31]
Cypress Consortium
Parameter Parameter
Description
VDD(typical) to the first access [32]
tPOWER
333 MHz
300 MHz
250 MHz
200 MHz
Min
Max
Min
Max
Min
Max
Min
1
–
1
–
1
–
1
Max
Unit
ms
tCYC
tKHKH
K clock and C clock cycle time
3.0
8.4
3.3
8.4
4.0
8.4
5.0
8.4
ns
tKH
tKHKL
Input clock (K/K; C/C) HIGH
1.20
–
1.32
–
1.6
–
2.0
–
ns
tKL
tKLKH
Input clock (K/K; C/C) LOW
1.20
–
1.32
–
1.6
–
2.0
–
ns
tKHKH
tKHKH
K clock rise to K clock rise and C to C
rise (rising edge to rising edge)
1.35
–
1.49
–
1.8
–
2.2
–
ns
tKHCH
tKHCH
K/K clock rise to C/C clock rise (rising
edge to rising edge)
0
1.30
0
1.45
0
1.8
0
2.2
ns
Setup Times
tSA
tAVKH
Address setup to K clock rise
0.4
–
0.4
–
0.5
–
0.6
–
ns
tSC
tIVKH
Control setup to K clock rise (RPS,
WPS)
0.4
–
0.4
–
0.5
–
0.6
–
ns
tSCDDR
tIVKH
Double data rate control setup to
Clock (K/K) rise (BWS0, BWS1,
BWS2, BWS3)
0.3
–
0.3
–
0.35
–
0.4
–
ns
tSD
tDVKH
D[X:0] setup to clock (K/K) rise
0.3
–
0.3
–
0.35
–
0.4
–
ns
tHA
tKHAX
Address hold after K clock rise
0.4
–
0.4
–
0.5
–
0.6
–
ns
tHC
tKHIX
Control hold after K clock rise (RPS,
WPS)
0.4
–
0.4
–
0.5
–
0.6
–
ns
tHCDDR
tKHIX
Double data rate control hold after
clock (K/K) rise (BWS0, BWS1,
BWS2, BWS3)
0.3
–
0.3
–
0.35
–
0.4
–
ns
tHD
tKHDX
D[X:0] hold after clock (K/K) rise
0.3
–
0.3
–
0.35
–
0.4
–
ns
Hold Times
Notes
30. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, Vref = 0.75 V, RQ = 250 , VDDQ = 1.5 V, input
pulse levels of 0.25 V to 1.25 V, and output loading of the specified IOL/IOH and load capacitance shown in (a) of Figure 5 on page 25.
31. When a part with a maximum frequency above 167 MHz is operating at a lower clock frequency, it requires the input timings of the frequency range in which it is
operated and outputs data with the output timings of that frequency range.
32. This part has a voltage regulator internally; tPOWER is the time that the power must be supplied above VDD minimum initially before a read or write operation is initiated.
Document Number: 001-00435 Rev. *V
Page 26 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Switching Characteristics (continued)
Over the Operating Range [30, 31]
Cypress Consortium
Parameter Parameter
333 MHz
Description
300 MHz
250 MHz
200 MHz
Unit
Min
Max
Min
Max
Min
Max
Min
Max
–
0.45
–
0.45
–
0.45
–
0.45
ns
Output Times
tCO
tCHQV
C/C clock rise (or K/K in single clock
mode) to data valid
tDOH
tCHQX
Data output hold after output C/C
clock rise (Active to Active)
–0.45
–
–0.45
–
–0.45
–
-0.45
–
ns
tCCQO
tCHCQV
C/C clock rise to echo clock valid
–
0.45
–
0.45
–
0.45
–
0.45
ns
tCQOH
tCHCQX
Echo clock hold after C/C clock rise
–0.45
–
–0.45
–
–0.45
–
-0.45
–
ns
tCQD
tCQHQV
Echo clock high to data valid
0.35
ns
tCQDOH
tCQHQX
Echo clock high to data invalid
0.25
[33]
0.27
0.30
–0.25
–
–0.27
–
–0.30
–
-0.35
–
ns
1.25
–
1.4
–
1.75
–
2.25
–
ns
tCQH
tCQHCQL
Output clock (CQ/CQ) HIGH
tCQHCQH
tCQHCQH
CQ clock rise to CQ clock rise (rising
edge to rising edge) [33]
1.25
–
1.4
–
1.75
–
2.25
–
ns
tCHZ
tCHQZ
Clock (C/C) Rise to High Z (Active to
High Z) [34, 35]
–
0.45
–
0.45
–
0.45
–
0.45
ns
tCLZ
tCHQX1
Clock (C/C) rise to Low Z [34, 35]
–0.45
–
–0.45
–
–0.45
–
-0.45
–
ns
tKC Var
tKC Var
Clock phase jitter
–
0.20
–
0.20
–
0.20
–
0.20
ns
tKC lock
tKC lock
PLL lock time (K, C)
20
–
20
–
20
–
20
–
s
tKC Reset
tKC Reset
K static to PLL reset
30
–
30
–
30
–
30
–
ns
PLL Timing
Notes
33. These parameters are extrapolated from the input timing parameters (tCYC/2 - 250 ps, where 250 ps is the internal jitter). These parameters are only guaranteed by
design and are not tested in production.
34. tCHZ, tCLZ, are specified with a load capacitance of 5 pF as in (b) of Figure 5 on page 25. Transition is measured ± 100 mV from steady-state voltage.
35. At any voltage and temperature tCHZ is less than tCLZ and tCHZ less than tCO.
Document Number: 001-00435 Rev. *V
Page 27 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Switching Waveforms
Figure 6. Read/Write/Deselect Sequence [36, 37, 38]
NOP
1
WRITE
3
READ
2
READ
4
NOP
6
WRITE
5
7
K
t KH
t
tKL
t KHKH
CYC
K
RPS
t SC
tHC
t SC
t HC
WPS
A0
A
tSA
A1
A3
A2
t HD
t HA
t
t SD
SD
D
D10
D11
Q00
Q
t KHCH
t KHCH
t HD
D13
D12
Q01
Q02
tCO
Q03
D30
D31
Q20
D33
D32
Q22
Q21
Q23
t CHZ
tCQDOH
t CLZ
t DOH
t CQD
C
t CYC
t KHKH
t KH
t KL
C
t CCQO
t CQOH
CQ
t CQH
t CQHCQH
t CQOH
t CCQO
CQ
DON’T CARE
UNDEFINED
Notes
36. Q00 refers to output from address A0. Q01 refers to output from the next internal burst address following A0, that is, A0 + 1.
37. Outputs are disabled (High Z) one clock cycle after a NOP.
38. In this example, if address A2 = A1, then data Q20 = D10, Q21 = D11, Q22 = D12, and Q23 = D13. Write data is forwarded immediately as read results. This note
applies to the whole diagram.
Document Number: 001-00435 Rev. *V
Page 28 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Ordering Information
Cypress offers other versions of this type of product in many different configurations and features. The following table contains only
the list of parts that are currently available. For a complete listing of all options, visit the Cypress website at www.cypress.com and
refer to the product summary page at http://www.cypress.com/products or contact your local sales representative.
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives and distributors. To find the office
closest to you, visit us at http://www.cypress.com/go/datasheet/offices.
Table 1. Ordering Information
Speed
(MHz)
333
Ordering Code
CY7C1513KV18-333BZXC
Package
Diagram
Package Type
51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
Operating
Range
Commercial
CY7C1515KV18-333BZXC
300
CY7C1515KV18-333BZXI
51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C1513KV18-300BZC
51-85180 165-ball FBGA (13 × 15 × 1.4 mm)
Industrial
Commercial
CY7C1515KV18-300BZC
CY7C1513KV18-300BZXC
51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C1515KV18-300BZXC
250
CY7C1515KV18-300BZI
51-85180 165-ball FBGA (13 × 15 × 1.4 mm)
CY7C1515KV18-300BZXI
51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C1513KV18-250BZC
51-85180 165-ball FBGA (13 × 15 × 1.4 mm)
Industrial
Commercial
CY7C1515KV18-250BZC
CY7C1513KV18-250BZXC
51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C1515KV18-250BZXC
CY7C1513KV18-250BZI
51-85180 165-ball FBGA (13 × 15 × 1.4 mm)
Industrial
CY7C1515KV18-250BZI
CY7C1513KV18-250BZXI
51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
CY7C1515KV18-250BZXI
200
CY7C1513KV18-200BZXI
51-85180 165-ball FBGA (13 × 15 × 1.4 mm) Pb-free
Industrial
Ordering Code Definitions
CY 7 C 15XX
K V18 - XXX BZ
X
X
Temperature Range: X = C or I
C = Commercial; I = Industrial
Pb-free
Package Type:
BZ = 165-ball FBGA
Frequency Range: XXX = 333 MHz or 300 MHz or 250 MHz or 200 MHz
Voltage: V18 = 1.8 V
Die revision
Part Number: 15XX = 1526 or 1513 or 1515
Technology Code: C = CMOS
Marketing Code: 7 = SRAM
Company ID: CY = Cypress
Document Number: 001-00435 Rev. *V
Page 29 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Package Diagram
Figure 7. 165-ball FBGA (13 × 15 × 1.4 mm) BB165D/BW165D (0.5 Ball Diameter) Package Outline, 51-85180
51-85180 *G
Document Number: 001-00435 Rev. *V
Page 30 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Acronyms
Acronym
Document Conventions
Description
Units of Measure
BWS
Byte Write Select
CMOS
Complementary Metal Oxide Semiconductor
°C
degree Celsius
DDR
Double Data Rate
FIT/Dev
failure in time/device
DLL
Delay Lock Loop
FIT/Mb
failure in time/mega bit
FBGA
Fine-Pitch Ball Grid Array
µA
microampere
HSTL
High Speed Transceiver Logic
µs
microsecond
mA
milliampere
ms
millisecond
ns
nanosecond

ohm
pF
picofarad
V
volt
W
watt
I/O
Input/Output
PLL
Phase-Locked Loop
QDR
Quad Data Rate
SEL
Single Event Latch-up
SRAM
Static Random Access Memory
TCK
Test Clock
TDI
Test Data In
TDO
Test Data Out
TMS
Test Mode Select
Document Number: 001-00435 Rev. *V
Symbol
Unit of Measure
Page 31 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Document History Page
Document Title: CY7C1526KV18/CY7C1513KV18/CY7C1515KV18, 72-Mbit QDR® II SRAM Four-Word Burst Architecture
Document Number: 001-00435
Rev.
ECN No.
Orig. of
Change
Submission
Date
**
374703
SYT
See ECN
New data sheet.
*A
1103823
NXR
See ECN
Updated Electrical Characteristics:
Updated DC Electrical Characteristics:
Updated values of IDD parameter.
*B
1699083
VKN /
AESA
See ECN
Changed status from Advance Information to Preliminary
*C
2148307
VKN /
AESA
See ECN
Updated Electrical Characteristics:
Updated DC Electrical Characteristics:
Added Note 26 and referred the same note in IDD parameter.
Description of change
Updated Ordering Information.
Updated Switching Characteristics:
Updated Note 33 (Corrected typo).
Changed minimum value of PLL lock time from 1024 cycles to 20 s.
*D
2606839
VKN /
PYRS
11/13/08
Updated Identification Register Definitions:
Changed Revision number [31:29] from 001 to 000.
Updated Power-Up Sequence in QDR II SRAM:
Updated description.
Updated Figure 4.
Updated Maximum Ratings:
Changed Ambient Temperature with Power Applied from “–10 °C to +85 °C” to
“–55 °C to +125 °C”.
Updated Thermal Resistance:
Included values.
Updated Package Diagram:
Changed the package size from 15 × 17 × 1.4 mm to 3 × 15 × 1.4 mm.
*E
2681899
VKN /
PYRS
04/01/2009
Changed status from Preliminary to Final.
Updated Ordering Information:
No change in part numbers.
Added note on top of the Ordering Information table.
Post to external web.
*F
2747635
VKN /
AESA
08/03/2009
Added Neutron Soft Error Immunity.
Updated Ordering Information:
Included parts that are available only.
Modified the disclaimer for the Ordering information.
*G
2767155
VKN /
AESA
09/23/2009
Updated Capacitance:
Changed Input Capacitance (CIN) from 2 pF to 4 pF.
Changed Output Capacitance (CO) from 3 pF to 4 pF.
Updated Ordering Information:
Modified Ordering code disclaimer.
Included CY7C1513KV18-200BZXI part.
Document Number: 001-00435 Rev. *V
Page 32 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Document History Page (continued)
Document Title: CY7C1526KV18/CY7C1513KV18/CY7C1515KV18, 72-Mbit QDR® II SRAM Four-Word Burst Architecture
Document Number: 001-00435
Rev.
ECN No.
Orig. of
Change
Submission
Date
*H
2797196
VKN /
AESA
11/03/09
Description of change
Updated Ordering Information:
Included CY7C1526KV18-333BZXC/300BZXC part.
Updated Package Diagram.
*I
2870201
NJY
02/01/2010
No technical updates.
*J
2899815
NJY
03/26/2010
Updated Ordering Information:
Removed inactive parts.
Updated Note.
*K
2905661
VKN
04/06/2010
Updated Ordering Information:
Removed inactive part CY7C1513KV18-200BZXI.
*L
2933906
VKN
06/01/2010
Updated Ordering Information:
Included “CY7C1513KV18-250BZXI” part.
Added Acronyms.
*M
3037153
NJY
09/23/2010
Updated Ordering Information:
Removed inactive parts.
Added Ordering Code Definitions.
*N
3216622
NJY
04/05/2011
Updated to new template.
*O
3410256
VIDB
10/18/2011
Updated Ordering Information (Removed prune part number
CY7C1515KV18-333BZI).
Added Units of Measure.
Updated to new template.
*P
3492343
PRIT
01/23/2012
Removed part number CY7C1511KV18 related information across the
document.
Updated Package Diagram.
*Q
3841412
YHB / PRIT
12/14/2012
Updated Ordering Information (Updated part numbers).
*R
4238693
PRIT
01/07/2014
Included 200 MHz frequency related information across the document.
Updated Package Diagram (spec 51-85180 (Changed revision from *E to *F)).
Updated Ordering Information (Updated part numbers).
Updated to new template.
Completing Sunset Review.
*S
4371693
PRIT
05/06/2014
Updated Application Example:
Updated Figure 2.
Updated Thermal Resistance:
Updated values of JA parameter.
Included JB parameter and its details.
*T
4569232
PRIT
11/14/2014
Updated Functional Description:
Added “For a complete list of related documentation, click here.” at the end.
Updated Ordering Information:
Removed pruned part CY7C1513KV18-300BZI.
Document Number: 001-00435 Rev. *V
Page 33 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Document History Page (continued)
Document Title: CY7C1526KV18/CY7C1513KV18/CY7C1515KV18, 72-Mbit QDR® II SRAM Four-Word Burst Architecture
Document Number: 001-00435
Rev.
ECN No.
Orig. of
Change
Submission
Date
*U
4634215
PRIT
01/21/2015
Updated Ordering Information (Updated part numbers).
*V
5092777
PRIT
01/19/2016
Updated Package Diagram:
spec 51-85180 – Changed revision from *F to *G.
Updated to new template.
Completing Sunset Review.
Description of change
Completing Sunset Review.
Document Number: 001-00435 Rev. *V
Page 34 of 35
CY7C1526KV18
CY7C1513KV18
CY7C1515KV18
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
PSoC® Solutions
Products
Automotive
Clocks & Buffers
Interface
Lighting & Power Control
Memory
PSoC
Touch Sensing
cypress.com/go/automotive
cypress.com/go/clocks
cypress.com/go/interface
cypress.com/go/powerpsoc
PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP
Cypress Developer Community
Community | Forums | Blogs | Video | Training
cypress.com/go/memory
cypress.com/go/psoc
cypress.com/go/touch
USB Controllers
Wireless/RF
psoc.cypress.com/solutions
Technical Support
cypress.com/go/support
cypress.com/go/USB
cypress.com/go/wireless
© Cypress Semiconductor Corporation, 2005-2016. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 001-00435 Rev. *V
Revised January 19, 2016
Page 35 of 35
QDR RAMs and Quad Data Rate RAMs comprise a new family of products developed by Cypress, IDT, NEC, Renesas, and Samsung. All products and company names mentioned in this document
may be the trademarks of their respective holders.
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