ATMEL AT52BR6408A

Stack Module Features
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•
•
•
64-Mbit Flash + 8-Mbit SRAM
Power Supply of 2.7V to 3.1V
Data I/O x16
66-ball CBGA Package
64-Mbit Flash Features
• 64-megabit (4M x 16) Flash Memory
• 2.7V - 3.1V Read/Write
• High Performance
•
•
•
•
•
•
•
•
•
•
•
•
– Asynchronous Access Time – 70, 85 ns
Sector Erase Architecture
– Eight 4K Word Sectors with Individual Write Lockout
– 32K Word Main Sectors with Individual Write Lockout
Typical Sector Erase Time: 32K Word Sectors – 500 ms; 4K Word Sectors – 100 ms
64M, Four Plane Organization, Permitting Concurrent Read in Any of Three Planes not
Being Programmed/Erased
– Memory Plane A: 16M of Memory Including Eight 4K Word Sectors
– Memory Plane B: 16M of Memory Consisting of 32K Word Sectors
– Memory Plane C: 16M of Memory Consisting of 32K Word Sectors
– Memory Plane D: 16M of Memory Consisting of 32K Word Sectors
Suspend/Resume Feature for Erase and Program
– Supports Reading and Programming Data from Any Sector by Suspending Erase
of a Different Sector
– Supports Reading Any Word by Suspending Programming of Any Other Word
Low-power Operation
– 30 mA Active
– 10 µA Standby
1.8V I/O Option Reduces Overall System Power
Data Polling and Toggle Bit for End of Program Detection
VPP Pin for Write Protection and Accelerated Program/Erase Operations
RESET Input for Device Initialization
Top or Bottom Boot Block Configuration Available
128-bit Protection Register
Common Flash Interface (CFI)
64-Mbit Flash,
8-Mbit SRAM
(x16 I/O)
AT52BR6408A
AT52BR6408AT
Preliminary
8-Mbit SRAM Features
•
•
•
•
8-Mbit (512K x 16)
2.7V to 3.1V VCC Operation
70 ns Access Time
Low-power
– 2 mA Typical (Active)
– 1 µA Typical (Standby)
• Industrial Temperature Range
Stack Module Description
The AT52BR6408A(T) consists of a 64-Mbit Flash stacked with an 8-Mbit SRAM in a
single CBGA package.
Stack Module Memory Contents
Device
Memory Combination
Flash Read Access
AT52BR6408A(T)
64M Flash + 8M SRAM
Asynchronous, Page Mode
Rev. 3425A–STKD–1/04
1
66C4 – CBGA
Top View
1
2
3
4
5
6
7
8
9
10
11
12
NC
NC
A20
A11
A15
A14
A13
A12
GND
NC
NC
NC
A16
A8
A10
A9
I/O15
SWE
I/O14
I/O7
I/O13
I/O6
I/O4
I/O5
I/O12
SCS
SVCC
VCC
I/O10
I/O2
I/O3
I/O9
I/O8
I/O0
I/O1
NC
NC
A
B
C
A21
WE
D
SGND RESET
E
I/O11
WP
VPP
A19
LB
UB
SOE
A18
A17
A7
A6
A3
A2
A1
SCE1
NC
A5
A4
A0
CE1
GND
OE
NC
F
G
H
NC
NC
Pin Configurations
2
Pin Name
Function
A0 - A21
Address
I/O0 - I/O15
Data Inputs/Outputs
CE1
Flash Chip Enable
SCE1
SRAM Chip Enable
SCS
SRAM Chip Select
OE/SOE
Output Enable/SRAM Output Enable
WE/SWE
Write Enable/SRAM Write Enable
LB
Lower Byte Control (SRAM)
UB
Upper Byte Control (SRAM)
RESET
Flash Reset
WP
Flash Write Protect
VPP
Flash Write Protection and Power Supply for Accelerated
Program/Erase Operation
VCC/SVCC
Flash Power Supply/SRAM Power Supply
NC
No Connect
GND/SGND
Device Ground/SRAM Ground
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
64-Mbit Flash
Description
The 64-Mbit Flash memory is divided into multiple sectors and planes for erase operations. The devices can be read or reprogrammed off a single 2.7V power supply, making
them ideally suited for in-system programming.
The 64-Mbit device is divided into four memory planes. A read operation can occur in
any of the three planes which is not being programmed or erased. This concurrent operation allows improved system performance by not requiring the system to wait for a
program or erase operation to complete before a read is performed. To further increase
the flexibility of the device, it contains an Erase Suspend and Program Suspend feature.
This feature will put the erase or program on hold for any amount of time and let the user
read data from or program data to any of the remaining sectors. There is no reason to
suspend the erase or program operation if the data to be read is in another memory
plane. The end of program or erase is detected by Data Polling or toggle bit.
The VPP pin provides data protection and faster programming and erase times. When
the VPP input is below 0.8V, the program and erase functions are inhibited. When VPP is
at 1.65V or above, normal program and erase operations can be performed. With VPP at
12.0V, the program and erase operations are accelerated.
With VPP at 12V, a six-byte command (Enter Single Pulse Program Mode) to remove the
requirement of entering the three-byte program sequence is offered to further improve
programming time. After entering the six-byte code, only single pulses on the write control lines are required for writing into the device. This mode (Single Pulse Word
Program) is exited by powering down the device, by taking the RESET pin to GND or by
a high-to-low transition on the VPP input. Erase, Erase Suspend/Resume, Program Suspend/Resume and Read Reset commands will not work while in this mode; if entered
they will result in data being programmed into the device. It is not recommended that the
six-byte code reside in the software of the final product but only exist in external programming code.
Device Operation
COMMAND SEQUENCES: The device powers on in the read mode. Command
sequences are used to place the device in other operating modes such as program and
erase. After the completion of a program or an erase cycle, the device enters the read
mode. The command sequences are written by applying a low pulse on the WE input
with CE low and OE high or by applying a low-going pulse on the CE input with WE low
and OE high. The address is latched on the falling edge of the WE or CE pulse whichever occurs first. Valid data is latched on the rising edge of the WE or the CE pulse,
whichever occurs first. The addresses used in the command sequences are not affected
by entering the command sequences.
ASYNCHRONOUS READ: The 64-Mbit Flash is accessed like an EPROM. When CE
and OE are low and WE is high, the data stored at the memory location determined by
the address pins are asserted on the outputs. The outputs are put in the high impedance
state whenever CE or OE is high. This dual-line control gives designers flexibility in preventing bus contention.
RESET: A RESET input pin is provided to ease some system applications. When
RESET is at a logic high level, the device is in its standard operating mode. A low level
on the RESET pin halts the present device operation and puts the outputs of the device
in a high-impedance state. When a high level is reasserted on the RESET pin, the
device returns to read or standby mode, depending upon the state of the control pins.
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ERASE: Before a word can be reprogrammed it must be erased. The erased state of
the memory bits is a logical “1”. The entire memory can be erased by using the Chip
Erase command or individual planes or sectors can be erased by using the Plane Erase
or Sector Erase commands.
CHIP ERASE: Chip Erase is a six-bus cycle operation. The automatic erase begins on
the rising edge of the last WE pulse. Chip Erase does not alter the data of the protected
sectors. After the full chip erase the device will return back to the read mode. The hardware reset during Chip Erase will stop the erase but the data will be of unknown state.
Any command during Chip Erase except Erase Suspend will be ignored.
PLANE ERASE: As a alternative to a full chip erase, the device is organized into four
planes that can be individually erased. The plane erase command is a six-bus cycle
operation. The plane whose address is valid at the sixth falling edge of WE will be
erased provided none of the sectors within the plane are protected.
SECTOR ERASE: As an alternative to a full chip erase or a plane erase, the device is
organized into multiple sectors that can be individually erased. The Sector Erase command is a six-bus cycle operation. The sector whose address is valid at the sixth falling
edge of WE will be erased provided the given sector has not been protected.
WORD PROGRAMMING: The device is programmed on a word-by-word basis. Programming is accomplished via the internal device command register and is a four-bus
cycle operation. The programming address and data are latched in the fourth cycle. The
device will automatically generate the required internal programming pulses. Please
note that a “0” cannot be programmed back to a “1”; only erase operations can convert
“0”s to “1”s.
FLEXIBLE SECTOR PROTECTION: The 64-Mbit device offers two sector protection
modes, the Softlock and the Hardlock. The Softlock mode is optimized as sector protection for sectors whose content changes frequently. The Hardlock protection mode is
recommended for sectors whose content changes infrequently. Once either of these two
modes is enabled, the contents of the selected sector is read-only and cannot be erased
or programmed. Each sector can be independently programmed for either the Softlock
or Hardlock sector protection mode. At power-up and reset, all sectors have their Softlock protection mode enabled.
SOFTLOCK AND UNLOCK: The Softlock protection mode can be disabled by issuing a
two-bus cycle Unlock command to the selected sector. Once a sector is unlocked, its
contents can be erased or programmed. To enable the Softlock protection mode, a sixbus cycle Softlock command must be issued to the selected sector.
HARDLOCK AND WRITE PROTECT (WP): The Hardlock sector protection mode operates in conjunction with the Write Protection (WP) pin. The Hardlock sector protection
mode can be enabled by issuing a six-bus cycle Hardlock software command to the
selected sector. The state of the Write Protect pin affects whether the Hardlock protection mode can be overridden.
• When the WP pin is low and the Hardlock protection mode is enabled, the sector
cannot be unlocked and the contents of the sector is read-only.
• When the WP pin is high, the Hardlock protection mode is overridden and the sector
can be unlocked via the Unlock command.
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AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
To disable the Hardlock sector protection mode, the chip must be either reset or power
cycled.
Table 1. Hardlock and Softlock Protection Configurations in Conjunction with WP
WP
Hardlock
Softlock
Erase/
Prog
Allowed?
VCC/5V
0
0
0
Yes
No sector is locked
VCC/5V
0
0
1
No
Sector is Softlocked. The
Unlock command can unlock
the sector.
VCC/5V
0
1
1
No
Hardlock protection mode is
enabled. The sector cannot
be unlocked.
VCC/5V
1
0
0
Yes
No sector is locked.
VCC/5V
1
0
1
No
Sector is Softlocked. The
Unlock command can unlock
the sector.
VCC/5V
1
1
0
Yes
Hardlock protection mode is
overridden and the sector is
not locked.
VCC/5V
1
1
1
No
Hardlock protection mode is
overridden and the sector
can be unlocked via the
Unlock command.
VIL
x
x
x
No
Erase and Program
Operations cannot be
performed.
VPP
Comments
SECTOR PROTECTION DETECTION: A software method is available to determine if
the sector protection Softlock or Hardlock features are enabled. When the device is in
the software product identification mode (see Software Product Identification Entry and
Exit sections) a read from the I/O0 and I/O1 at address location 00002H within a sector
will show if the sector is unlocked, softlocked, or hardlocked.
Table 2. Sector Protection Status
I/O1
I/O0
Sector Protection Status
0
0
Sector Not Locked
0
1
Softlock Enabled
1
0
Hardlock Enabled
1
1
Both Hardlock and Softlock Enabled
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PROGRAM/ERASE STATUS: The device provides several bits to determine the status
of a program or erase operation: I/O2, I/O3, I/O5, I/O6, and I/O7. All other status bits are
don’t care. Table 3 on page 11 and the following four sections describe the function of
these bits. To provide greater flexibility for system designers, the 64-Mbit device contains a programmable configuration register. The configuration register allows the user
to specify the status bit operation. The configuration register can be set to one of two different values, “00” or “01”. If the configuration register is set to “00”, the part will
automatically return to the read mode after a successful program or erase operation. If
the configuration register is set to a “01”, a Product ID Exit command must be given after
a successful program or erase operation before the part will return to the read mode. It
is important to note that whether the configuration register is set to a “00” or to a “01”,
any unsuccessful program or erase operation requires using the Product ID Exit command to return the device to read mode. The default value (after power-up) for the
configuration register is “00”. Using the four-bus cycle set configuration register command as shown in the Command Definition table on page 12, the value of the
configuration register can be changed. Voltages applied to the reset pin will not alter the
value of the configuration register. The value of the configuration register will affect the
operation of the I/O7 status bit as described below.
DATA POLLING: The 64-Mbit device features Data Polling to indicate the end of a program cycle. If the status configuration register is set to a “00”, during a program cycle an
attempted read of the last word loaded will result in the complement of the loaded data
on I/O7. Once the program cycle has been completed, true data is valid on all outputs
and the next cycle may begin. During a chip or sector erase operation, an attempt to
read the device will give a “0” on I/O7. Once the program or erase cycle has completed,
true data will be read from the device. Data Polling may begin at any time during the program cycle. Please see Table 3 on page 11 for more details.
If the status bit configuration register is set to a “01”, the I/O7 status bit will be low while
the device is actively programming or erasing data. I/O7 will go high when the device
has completed a program or erase operation. Once I/O7 has gone high, status information on the other pins can be checked.
The Data Polling status bit must be used in conjunction with the erase/program and VPP
status bit as shown in the algorithm in Figures 2 and 3.
TOGGLE BIT: In addition to Data Polling, the 64-Mbit device provides another method
for determining the end of a program or erase cycle. During a program or erase operation, successive attempts to read data from the memory will result in I/O6 toggling
between one and zero. Once the program cycle has completed, I/O6 will stop toggling
and valid data will be read. Examining the toggle bit may begin at any time during a program cycle. Please see Table 3 on page 11 for more details.
The toggle bit status bit should be used in conjunction with the erase/program and VPP
status bit as shown in the algorithm in Figures 4 and 5 on page 10.
ERASE/PROGRAM STATUS BIT: The device offers a status bit on I/O5 that indicates
whether the program or erase operation has exceeded a specified internal pulse count
limit. If the status bit is a “1”, the device is unable to verify that an erase or a word program operation has been successfully performed. The device may also output a “1” on
I/O5 if the system tries to program a “1” to a location that was previously programmed to
a “0”. Only an erase operation can change a “0” back to a “1”. If a program (Sector
Erase) command is issued to a protected sector, the protected sector will not be programmed (erased). The device will go to a status read mode and the I/O5 status bit will
be set high, indicating the program (erase) operation did not complete as requested.
Once the erase/program status bit has been set to a “1”, the system must write the
Product ID Exit command to return to the read mode. The erase/program status bit is a
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AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
“0” while the erase or program operation is still in progress. Please see Table 3 on page
11 for more details.
VPP STATUS BIT: The 64-Mbit device provides a status bit on I/O3 that provides information regarding the voltage level of the VPP pin. During a program or erase operation,
if the voltage on the VPP pin is not high enough to perform the desired operation successfully, the I/O3 status bit will be a “1”. Once the VPP status bit has been set to a “1”,
the system must write the Product ID Exit command to return to the read mode. On the
other hand, if the voltage level is high enough to perform a program or erase operation
successfully, the VPP status bit will output a “0”. Please see Table 3 on page 11 for more
details.
ERASE SUSPEND/ERASE RESUME: The Erase Suspend command allows the system to interrupt a sector erase operation and then program or read data from a different
sector within the same plane. Since this device has a multiple plane architecture, there
is no need to use the erase suspend feature while erasing a sector when you want to
read data from a sector in another plane. After the Erase Suspend command is given,
the device requires a maximum time of 15 µs to suspend the erase operation. After the
erase operation has been suspended, the plane that contains the suspended sector
enters the erase-suspend-read mode. The system can then read data or program data
to any other sector within the device. An address is not required during the Erase Suspend command. During a sector erase suspend, another sector cannot be erased. To
resume the sector erase operation, the system must write the Erase Resume command.
The Erase Resume command is a one-bus cycle command, which does require the
plane address. The device also supports an erase suspend during a complete chip
erase. While the chip erase is suspended, the user can read from any sector within the
memory that is protected. The command sequence for a chip erase suspend and a sector erase suspend are the same.
PROGRAM SUSPEND/PROGRAM RESUME: The Program Suspend command allows
the system to interrupt a programming operation and then read data from a different
word within the memory. After the Program Suspend command is given, the device
requires a maximum of 10 µs to suspend the programming operation. After the programming operation has been suspended, the system can then read from any other word
within the device. An address is not required during the program suspend operation. To
resume the programming operation, the system must write the Program Resume command. The program suspend and resume are one-bus cycle commands. The command
sequence for the erase suspend and program suspend are the same, and the command
sequence for the erase resume and program resume are the same.
128-BIT PROTECTION REGISTER: The 64-Mbit device contains a 128-bit register that
can be used for security purposes in system design. The protection register is divided
into two 64-bit blocks. The two blocks are designated as block A and block B. The data
in block A is non-changeable and is programmed at the factory with a unique number.
The data in block B is programmed by the user and can be locked out such that data in
the block cannot be reprogrammed. To program block B in the protection register, the
four-bus cycle Program Protection Register command must be used as shown in the
Command Definition in Hex table on page 12. To lock out block B, the four-bus cycle
lock protection register command must be used as shown in the Command Definition in
Hex table. Data bit D1 must be zero during the fourth bus cycle. All other data bits during
the fourth bus cycle are don’t cares. To determine whether block B is locked out, the
Product ID Entry command is given followed by a read operation from address 80H. If
data bit D1 is zero, block B is locked. If data bit D1 is one, block B can be reprogrammed. Please see the Protection Register Addressing Table on page 13 for the
address locations in the protection register. To read the protection register, the Product
ID Entry command is given followed by a normal read operation from an address within
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3425A–STKD–1/04
the protection register. After determining whether block B is protected or not or reading
the protection register, the Product ID Exit command must be given prior to performing
any other operation.
CFI: Common Flash Interface (CFI) is a published, standardized data structure that
may be read from a Flash device. CFI allows system software to query the installed
device to determine the configurations, various electrical and timing parameters, and
functions supported by the device. CFI is used to allow the system to learn how to interface to the Flash device most optimally. The two primary benefits of using CFI are ease
of upgrading and second source availability. The command to enter the CFI Query
mode is a one-bus cycle command which requires writing data 98h to address 55h. The
CFI Query command can be written when the device is ready to read data or can also
be written when the part is in the product ID mode. Once in the CFI Query mode, the
system can read CFI data at the addresses given in Table 4 on page 25. To exit the CFI
Query mode, the product ID exit command must be given. If the CFI Query command is
given while the part is in the product ID mode, then the product ID exit command must
first be given to return the part to the product ID mode. Once in the product ID mode, it
will be necessary to give another product ID exit command to return the part to the read
mode.
HARDWARE DATA PROTECTION: Hardware features protect against inadvertent programs to the 64-Mbit device in the following ways: (a) VCC sense: if VCC is below 1.8V
(typical), the program function is inhibited. (b) V CC power-on delay: once VCC has
reached the V CC sense level, the device will automatically time-out 10 ms (typical)
before programming. (c) Program inhibit: holding any one of OE low, CE high or WE
high inhibits program cycles. (d) Noise filter: pulses of less than 15 ns (typical) on the
WE or CE inputs will not initiate a program cycle. (e) VPP is less than VILPP.
INPUT LEVELS: While operating with a 2.7V to 3.1V power supply, the address inputs
and control inputs (OE, CE and WE) may be driven from 0 to 5.5V without adversely
affecting the operation of the device. The I/O lines can be driven from 0 to VCCQ + 0.6V.
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AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Figure 1. Data Polling Algorithm
(Configuration Register = 00)
Figure 2. Data Polling Algorithm
(Configuration Register = 01)
START
START
Read I/O7 - I/O0
Addr = VA
Read I/O7 - I/O0
Addr = VA
NO
YES
I/O7 = 1?
I/O7 = Data?
YES
NO
NO
I/O3, I/O5 = 1?
I/O3, I/O5 = 1?
YES
YES
Read I/O7 - I/O0
Addr = VA
I/O7 = Data?
Notes:
Program/Erase
Operation Not
Successful, Write
Product ID
Exit Command
YES
NO
Program/Erase
Operation Not
Successful, Write
Product ID
Exit Command
NO
Note:
Program/Erase
Operation
Successful,
Device in
Read Mode
Program/Erase
Operation
Successful,
Write Product ID
Exit Command
1. VA = Valid address for programming. During a sector
erase operation, a valid address is any sector address
within the sector being erased. During chip erase, a
valid address is any non-protected sector address.
1. VA = Valid address for programming. During a sector erase operation, a valid address is any sector
address within the sector being erased. During
chip erase, a valid address is any non-protected
sector address.
2. I/O7 should be rechecked even if I/O5 = “1”
because I/O7 may change simultaneously with
I/O5.
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Figure 4. Toggle Bit Algorithm
(Configuration Register = 01)
Figure 3. Toggle Bit Algorithm
(Configuration Register = 00)
START
START
Read I/O7 - I/O0
Read I/O7 - I/O0
Read I/O7 - I/O0
Read I/O7 - I/O0
Toggle Bit =
Toggle?
Toggle Bit =
Toggle?
NO
YES
YES
NO
NO
I/O3, I/O5 = 1?
Read I/O7 - I/O0
Twice
Read I/O7 - I/O0
Twice
Toggle Bit =
Toggle?
NO
Note:
10
NO
YES
YES
Program/Erase
Operation Not
Successful, Write
Product ID
Exit Command
I/O3, I/O5 = 1?
YES
YES
Toggle Bit =
Toggle?
NO
Program/Erase
Operation Not
Successful, Write
Product ID
Exit Command
Program/Erase
Operation
Successful,
Device in
Read Mode
1. The system should recheck the toggle bit even if
I/O5 = “1” because the toggle bit may stop toggling
as I/O5 changes to “1”.
Note:
Program/Erase
Operation
Successful,
Write Product ID
Exit Command
1. The system should recheck the toggle bit even if I/O5 =
“1” because the toggle bit may stop toggling as I/O5
changes to “1”.
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Table 3. Status Bit Table
I/O7
Configuration
Register:
I/O6
I/O2
00/01
00/01
00/01
00/01
00/01
00/01
00/01
00/01
00/01
00/01
00/01
00/01
Plane A
Plane B
Plane C
Plane D
Plane A
Plane B
Plane C
Plane D
Plane A
Plane B
Plane C
Plane D
Programming
in Plane A
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
1
DATA
DATA
DATA
Programming
in Plane B
DATA
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
1
DATA
DATA
Programming
in Plane C
DATA
DATA
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
1
DATA
Programming
in Plane D
DATA
DATA
DATA
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
1
Erasing in
Plane A
0/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
Erasing in
Plane B
DATA
0/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
DATA
DATA
Erasing in
Plane C
DATA
DATA
0/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
DATA
Erasing in
Plane D
DATA
DATA
DATA
0/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
Erase
Suspended &
Read Erasing
Sector
1
1
1
1
1
1
1
1
TOGGLE
TOGGLE
TOGGLE
TOGGLE
Erase
Suspended &
Read Nonerasing Sector
DATA
DATA
DATA
DATA
DATA
DATA
DATA
DATA
DATA
DATA
DATA
DATA
Erase
Suspended &
Program Nonerasing Sector
in Plane A
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
Erase
Suspended &
Program Nonerasing Sector
in Plane B
DATA
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
DATA
DATA
Erase
Suspended &
Program Nonerasing Sector
in Plane C
DATA
DATA
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
DATA
Erase
Suspended &
Program Nonerasing Sector
in Plane D
DATA
DATA
DATA
I/O7/0
DATA
DATA
DATA
TOGGLE
DATA
DATA
DATA
TOGGLE
Read Address
In
While
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3425A–STKD–1/04
Command Definition in (Hex)(1)
1st Bus
Cycle
Bus
Cycles
Addr
Data
Read
1
Addr
DOUT
Chip Erase
6
555
AA
Command Sequence
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
5th Bus
Cycle
6th Bus
Cycle
Addr
Data
Addr
Data
Addr
Data
Addr
Data
Addr
Data
AAA(2)
55
555
80
555
AA
AAA
55
555
10
(6)
20
Plane Erase
6
555
AA
AAA
55
555
80
555
AA
AAA
55
PA
Sector Erase
6
555
AA
AAA
55
555
80
555
AA
AAA
55
SA(4)
30
Word Program
4
555
AA
AAA
55
555
A0
Addr
DIN
Enter Single-pulse Program
Mode
6
555
AA
AAA
55
555
80
555
AA
AAA
55
555
A0
Single-pulse Word Program
Mode
1
Addr
DIN
Sector Softlock
6
555
AA
AAA
55
555
80
555
AA
AAA
55
SA(4)
40
(4)
70
80
555
AA
AAA
55
SA(4)(5)
60
Sector Unlock
2
555
AA
SA
Sector Hardlock
6
555
AA
AAA
55
555
B0
Erase/Program Suspend
1
xxx
Erase/Program Resume
1
PA(6)
30
Product ID Entry
3
555
AA
AAA
55
xxx(7)
90
Product ID Exit(3)
3
555
AA
AAA
55
555
F0
Product ID Exit(3)
1
xxx
FX
Program Protection
Register – Block B
4
555
AA
AAA
55
555
C0
Addr
DIN
Lock Protection
Register – Block B
4
555
AA
AAA
55
555
C0
080
X0
Status of Block B
Protection
4
555
AA
AAA
55
555
90
80
DOUT(8)
Set Configuration Register
4
555
AA
AAA
55
555
E0
xxx
00/01(9)
CFI Query
1
X55
98
Notes:
12
1. The DATA FORMAT in each bus cycle is as follows: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex). The ADDRESS FORMAT in each bus cycle
is as follows: A11 - A0 (Hex), A11 - A21 (Don’t Care).
2. Since A11 is a Don’t Care, AAA can be replaced with 2AA.
3. Either one of the Product ID Exit commands can be used.
4. SA = sector address. Any word address within a sector can be used to designate the sector address (see pages 14 - 17 for details).
5. Once a sector is in the Hardlock protection mode, it cannot be disabled unless the chip is reset or power cycled.
6. PA is the plane address (A21 - A20).
7. For the 64-Mbit Bottom Boot:
For the 64-Mbit Top Boot:
xxx = 0XX555 Status Read from Plane A
xxx = 3XX555 Status Read from Plane A
xxx = 1XX555 Status Read from Plane B
xxx = 2XX555 Status Read from Plane B
xxx = 2XX555 Status Read from Plane C
xxx = 1XX555 Status Read from Plane C
xxx = 3XX555 Status Read from Plane D
xxx = 0XX555 Status Read from Plane D
8. If data bit D1 is “0”, block B is locked. If data bit D1 is “1”, block B can be reprogrammed.
9. The default state (after power-up) of the configuration register is “00”.
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Absolute Maximum Ratings*
*NOTICE:
Temperature under Bias ................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages Except VPP
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
VPP Input Voltage
with Respect to Ground ......................................... 0V to 13.0V
All Output Voltages
with Respect to Ground ...........................-0.6V to VCCQ + 0.6V
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect device
reliability.
Protection Register Addressing Table
Word
Use
Block
A7
A6
A5
A4
A3
A2
A1
A0
0
Factory
A
1
0
0
0
0
0
0
1
1
Factory
A
1
0
0
0
0
0
1
0
2
Factory
A
1
0
0
0
0
0
1
1
3
Factory
A
1
0
0
0
0
1
0
0
4
User
B
1
0
0
0
0
1
0
1
5
User
B
1
0
0
0
0
1
1
0
6
User
B
1
0
0
0
0
1
1
1
7
User
B
1
0
0
0
1
0
0
0
Note:
1. All address lines not specified in the above table must be 0 when accessing the Protection Register, i.e., A21 - A8 = 0.
13
3425A–STKD–1/04
Memory Organization – 64-Mbit Bottom Boot
Memory Organization – 64-Mbit Bottom Boot (Continued)
x16
x16
Plane
A
SA0
Size
(Words)
Address Range
(A21 - A0)
4K
00000 - 00FFF
A
SA1
4K
01000 - 01FFF
A
SA2
4K
02000 - 02FFF
A
SA3
4K
03000 - 03FFF
A
SA4
4K
04000 - 04FFF
A
SA5
4K
05000 - 05FFF
A
SA6
4K
06000 - 06FFF
A
SA7
4K
07000 - 07FFF
A
SA8
32K
08000 - 0FFFF
A
SA9
32K
10000 - 17FFF
A
SA10
32K
18000 - 1FFFF
A
SA11
32K
20000 - 27FFF
A
SA12
32K
28000 - 2FFFF
A
SA13
32K
30000 - 37FFF
A
SA14
32K
38000 - 3FFFF
A
SA15
32K
40000 - 47FFF
A
SA16
32K
48000 - 4FFFF
A
SA17
32K
50000 - 57FFF
A
SA18
32K
58000 - 5FFFF
A
SA19
32K
60000 - 67FFF
A
SA20
32K
68000 - 6FFFF
A
SA21
32K
70000 - 77FFF
A
SA22
32K
78000 - 7FFFF
A
SA23
32K
80000 - 87FFF
A
SA24
32K
88000 - 8FFFF
A
SA25
32K
90000 - 97FFF
A
SA26
32K
98000 - 9FFFF
A
SA27
32K
A0000 - A7FFF
A
SA28
32K
A8000 - AFFFF
A
SA29
32K
B0000 - B7FFF
A
SA30
32K
B8000 - BFFFF
A
SA31
32K
C0000 - C7FFF
A
SA32
32K
C8000 - CFFFF
A
SA33
32K
D0000 - D7FFF
A
SA34
32K
D8000 - DFFFF
A
SA35
32K
E0000 - E7FFF
A
SA36
32K
E8000 - EFFFF
A
SA37
32K
F0000 - F7FFF
A
SA38
32K
F8000 - FFFFF
B
SA39
32K
100000 - 107FFF
B
SA40
32K
108000 - 10FFFF
B
SA41
32K
110000 - 117FFF
B
SA42
32K
118000 - 11FFFF
B
SA43
32K
120000 - 127FFF
B
14
Sector
SA44
32K
128000 - 12FFFF
Plane
Sector
Size
(Words)
Address Range
(A21 - A0)
B
SA45
32K
130000 - 137FFF
B
SA46
32K
138000 - 13FFFF
B
SA47
32K
140000 - 147FFF
B
SA48
32K
148000 - 14FFFF
B
SA49
32K
150000 - 157FFF
B
SA50
32K
158000 - 15FFFF
B
SA51
32K
160000 - 167FFF
B
SA52
32K
168000 - 16FFFF
B
SA53
32K
170000 - 177FFF
B
SA54
32K
178000 - 17FFFF
B
SA55
32K
180000 - 187FFF
B
SA56
32K
188000 - 18FFFF
B
SA57
32K
190000 - 197FFF
B
SA58
32K
198000 - 19FFFF
B
SA59
32K
1A0000 - 1A7FFF
B
SA60
32K
1A8000 - 1AFFFF
B
SA61
32K
1B0000 - 1B7FFF
B
SA62
32K
1B8000 - 1BFFFF
B
SA63
32K
1C0000 - 1C7FFF
B
SA64
32K
1C8000 - 1CFFFF
B
SA65
32K
1D0000 - 1D7FFF
B
SA66
32K
1D8000 - 1DFFFF
B
SA67
32K
1E0000 - 1E7FFF
B
SA68
32K
1E8000 - 1EFFFF
B
SA69
32K
1F0000 - 1F7FFF
B
SA70
32K
1F8000 - 1FFFFF
C
SA71
32K
200000 - 207FFF
C
SA72
32K
208000 - 20FFFF
C
SA73
32K
210000 - 217FFF
C
SA74
32K
218000 - 21FFFF
C
SA75
32K
220000 - 227FFF
C
SA76
32K
228000 - 22FFFF
C
SA77
32K
230000 - 237FFF
C
SA78
32K
238000 - 23FFFF
C
SA79
32K
240000 - 247FFF
C
SA80
32K
248000 - 24FFFF
C
SA81
32K
250000 - 257FFF
C
SA82
32K
258000 - 25FFFF
C
SA83
32K
260000 - 267FFF
C
SA84
32K
268000 - 26FFFF
C
SA85
32K
270000 - 277FFF
C
SA86
32K
278000 - 27FFFF
C
SA87
32K
280000 - 287FFF
C
SA88
32K
288000 - 28FFFF
C
SA89
32K
290000 - 297FFF
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Memory Organization – 64-Mbit Bottom Boot (Continued)
Memory Organization – 64-Mbit Bottom Boot (Continued)
x16
x16
Plane
Sector
Size
(Words)
Address Range
(A21 - A0)
Plane
Sector
Size
(Words)
Address Range
(A21 - A0)
C
SA90
32K
298000 - 29FFFF
D
SA113
32K
350000 - 357FFF
C
SA91
32K
2A0000 - 2A7FFF
D
SA114
32K
358000 - 35FFFF
C
SA92
32K
2A8000 - 2AFFFF
D
SA115
32K
360000 - 367FFF
368000 - 36FFFF
C
SA93
32K
2B0000 - 2B7FFF
D
SA116
32K
C
SA94
32K
2B8000 - 2BFFFF
D
SA117
32K
370000 - 377FFF
C
SA95
32K
2C0000 - 2C7FFF
D
SA118
32K
378000 - 37FFFF
C
SA96
32K
2C8000 - 2CFFFF
D
SA119
32K
380000 - 387FFF
C
SA97
32K
2D0000 - 2D7FFF
D
SA120
32K
388000 - 38FFFF
C
SA98
32K
2D8000 - 2DFFFF
D
SA121
32K
390000 - 397FFF
C
SA99
32K
2E0000 - 2E7FFF
D
SA122
32K
398000 - 39FFFF
C
SA100
32K
2E8000 - 2EFFFF
D
SA123
32K
3A0000 - 3A7FFF
C
SA101
32K
2F0000 - 2F7FFF
D
SA124
32K
3A8000 - 3AFFFF
D
SA102
32K
2F8000 - 2FFFFF
D
SA125
32K
3B0000 - 3B7FFF
D
SA103
32K
300000 - 307FFF
D
SA126
32K
3B8000 - 3BFFFF
D
SA104
32K
308000 - 30FFFF
D
SA127
32K
3C0000 - 3C7FFF
D
SA105
32K
310000 - 317FFF
D
SA128
32K
3C8000 - 3CFFFF
318000 - 31FFFF
D
SA129
32K
3D0000 - 3D7FFF
3D8000 - 3DFFFF
D
SA106
32K
D
SA107
32K
320000 - 327FFF
D
SA130
32K
D
SA108
32K
328000 - 32FFFF
D
SA131
32K
3E0000 - 3E7FFF
D
SA109
32K
330000 - 337FFF
D
SA132
32K
3E8000 - 3EFFFF
D
SA110
32K
338000 - 33FFFF
D
SA133
32K
3F0000 - 3F7FFF
D
SA111
32K
340000 - 347FFF
D
SA134
32K
3F8000 - 3FFFFF
D
SA112
32K
348000 - 34FFFF
15
3425A–STKD–1/04
Memory Organization – 64-Mbit Top Boot
Memory Organization – 64-Mbit Top Boot (Continued)
x16
x16
Plane
16
Sector
Size
(Words)
Address Range
(A21 - A0)
Plane
Sector
Size
(Words)
Address Range
(A21 - A0)
168000 - 16FFFF
D
SA0
32K
00000 - 07FFF
C
SA45
32K
D
SA1
32K
08000 - 0FFFF
C
SA46
32K
170000 - 177FFF
SA47
32K
178000 - 17FFFF
D
SA2
32K
10000 - 17FFF
C
D
SA3
32K
18000 - 1FFFF
C
SA48
32K
180000 - 187FFF
D
SA4
32K
20000 - 27FFF
C
SA49
32K
188000 - 18FFFF
D
SA5
32K
28000 - 2FFFF
C
SA50
32K
190000 - 197FFF
SA51
32K
198000 - 19FFFF
D
SA6
32K
30000 - 37FFF
C
D
SA7
32K
38000 - 3FFFF
C
SA52
32K
1A0000 - 1A7FFF
D
SA8
32K
40000 - 47FFF
C
SA53
32K
1A8000 - 1AFFFF
D
SA9
32K
48000 - 4FFFF
C
SA54
32K
1B0000 - 1B7FFF
D
SA10
32K
50000 - 57FFF
C
SA55
32K
1B8000 - 1BFFFF
D
SA11
32K
58000 - 5FFFF
C
SA56
32K
1C0000 - 1C7FFF
D
SA12
32K
60000 - 67FFF
C
SA57
32K
1C8000 - 1CFFFF
68000 - 6FFFF
C
SA58
32K
1D0000 - 1D7FFF
1D8000 - 1DFFFF
D
SA13
32K
D
SA14
32K
70000 - 77FFF
C
SA59
32K
D
SA15
32K
78000 - 7FFFF
C
SA60
32K
1E0000 - 1E7FFF
SA61
32K
1E8000 - 1EFFFF
D
SA16
32K
80000 - 87FFF
C
D
SA17
32K
88000 - 8FFFF
C
SA62
32K
1F0000 - 1F7FFF
D
SA18
32K
90000 - 97FFF
C
SA63
32K
1F8000 - 1FFFFF
D
SA19
32K
98000 - 9FFFF
B
SA64
32K
200000 - 207FFF
D
SA20
32K
A0000 - A7FFF
B
SA65
32K
208000 - 20FFFF
D
SA21
32K
A8000 - AFFFF
B
SA66
32K
210000 - 217FFF
SA67
32K
218000 - 21FFFF
D
SA22
32K
B0000 - B7FFF
B
D
SA23
32K
B8000 - BFFFF
B
SA68
32K
220000 - 227FFF
D
SA24
32K
C0000 - C7FFF
B
SA69
32K
228000 - 22FFFF
D
SA25
32K
C8000 - CFFFF
B
SA70
32K
230000 - 237FFF
SA71
32K
238000 - 23FFFF
D
SA26
32K
D0000 - D7FFF
B
D
SA27
32K
D8000 - DFFFF
B
SA72
32K
240000 - 247FFF
D
SA28
32K
E0000 - E7FFF
B
SA73
32K
248000 - 24FFFF
D
SA29
32K
E8000 - EFFFF
B
SA74
32K
250000 - 257FFF
D
SA30
32K
F0000 - F7FFF
B
SA75
32K
258000 - 25FFFF
D
SA31
32K
F8000 - FFFFF
B
SA76
32K
260000 - 267FFF
SA77
32K
268000 - 26FFFF
C
SA32
32K
100000 - 107FFF
B
C
SA33
32K
108000 - 10FFFF
B
SA78
32K
270000 - 277FFF
C
SA34
32K
110000 - 117FFF
B
SA79
32K
278000 - 27FFFF
C
SA35
32K
118000 - 11FFFF
B
SA80
32K
280000 - 287FFF
SA81
32K
288000 - 28FFFF
290000 - 297FFF
C
SA36
32K
120000 - 127FFF
B
C
SA37
32K
128000 - 12FFFF
B
SA82
32K
C
SA38
32K
130000 - 137FFF
B
SA83
32K
298000 -29FFFF
SA84
32K
2A0000 - 2A7FFF
2A8000 - 2AFFFF
C
SA39
32K
138000 - 13FFFF
B
C
SA40
32K
140000 - 147FFF
B
SA85
32K
C
SA41
32K
148000 - 14FFFF
B
SA86
32K
2B0000 - 2B7FFF
SA87
32K
2B8000 - 2BFFFF
C
SA42
32K
150000 - 157FFF
B
C
SA43
32K
158000 - 15FFFF
B
SA88
32K
2C0000 - 2C7FFF
C
SA44
32K
160000 - 167FFF
B
SA89
32K
2C8000 - 2CFFFF
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Memory Organization – 64-Mbit Top Boot (Continued)
Memory Organization – 64-Mbit Top Boot (Continued)
x16
x16
Plane
Sector
Size
(Words)
Address Range
(A21 - A0)
Plane
Sector
Size
(Words)
Address Range
(A21 - A0)
388000 - 38FFFF
B
SA90
32K
2D0000 - 2D7FFF
A
SA113
32K
B
SA91
32K
2D8000 - 2DFFFF
A
SA114
32K
390000 - 397FFF
B
SA92
32K
2E0000 - 2E7FFF
A
SA115
32K
398000 - 39FFFF
B
SA93
32K
2E8000 - 2EFFFF
A
SA116
32K
3A0000 - 3A7FFF
B
SA94
32K
2F0000 - 2F7FFF
A
SA117
32K
3A8000 - 3AFFFF
B
SA95
32K
2F8000 - 2FFFFF
A
SA118
32K
3B0000 - 3B7FFF
SA119
32K
3B8000 - 3BFFFF
A
SA96
32K
300000 - 307FFF
A
A
SA97
32K
308000 - 30FFFF
A
SA120
32K
3C0000 - 3C7FFF
A
SA98
32K
310000 - 317FFF
A
SA121
32K
3C8000 - 3CFFFF
A
SA99
32K
318000 - 31FFFF
A
SA122
32K
3D0000 - 3D7FFF
A
SA100
32K
320000 - 327FFF
A
SA123
32K
3D8000 - 3DFFFF
A
SA101
32K
328000 - 32FFFF
A
SA124
32K
3E0000 - 3E7FFF
A
SA102
32K
330000 - 337FFF
A
SA125
32K
3E8000 - 3EFFFF
A
SA103
32K
338000 - 33FFFF
A
SA126
32K
3F0000 - 3F7FFF
A
SA104
32K
340000 - 347FFF
A
SA127
4K
3F8000 - 3F8FFF
A
SA105
32K
348000 - 34FFFF
A
SA128
4K
3F9000 - 3F9FFF
SA129
4K
3FA000 - 3FAFFF
A
SA106
32K
350000 - 357FFF
A
A
SA107
32K
358000 - 35FFFF
A
SA130
4K
3FB000 - 3FBFFF
A
SA108
32K
360000 - 367FFF
A
SA131
4K
3FC000 - 3FCFFF
A
SA109
32K
368000 - 36FFFF
A
SA132
4K
3FD000 - 3FDFFF
A
SA110
32K
370000 - 377FFF
A
SA133
4K
3FE000 - 3FEFFF
A
SA111
32K
378000 - 37FFFF
A
SA134
4K
3FF000 - 3FFFFF
A
SA112
32K
380000 - 387FFF
17
3425A–STKD–1/04
DC and AC Operating Range
64-Mbit Device – 70, 85 ns
Operating Temperature (Case)
Industrial
-40°C - 85°C
VCC Power Supply
2.7V - 3.6V
Operating Modes
Mode
CE
Read
VIL
VIL
Burst Read
(3)
Program/Erase
Standby/Program Inhibit
VIL
WE
RESET
VPP(5)
Ai
I/O
VIL
VIH
VIH
X
Ai
DOUT
VIL
VIH
VIH
X
Ai
DOUT
VIL
VIH
VIHPP(6)
Ai
DIN
X
High Z
OE
VIH
(1)
VIH
X
X
VIH
X
X
X
VIH
VIH
X
X
VIL
X
VIH
X
X
X
X
X
VILPP(7)
Output Disable
X
VIH
X
VIH
X
Reset
X
X
X
VIL
X
Program Inhibit
High Z
X
High Z
A0 = VIL, A1 - A21 = VIL
Manufacturer Code(3)
A0 = VIH, A1 - A21 = VIL
Device Code(3)
Product Identification
Software(4)
Notes:
1. X can be VIL or VIH.
2.
3.
4.
5.
6.
7.
18
VIH
Refer to AC programming waveforms.
Manufacturer Code: 001FH; Device Code: 00D6H – Bottom Boot; 00D2H – Top Boot.
See details under “Software Product Identification Entry/Exit” on page 24.
The VPP pin can be tied to VCC. For faster program/erase operations, VPP can be set to 12.0V ± 0.5V.
VIHPP (min) = 1.65V.
VILPP (max) = 0.8V.
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
DC Characteristics
Symbol
Parameter
Condition
ILI
Input Load Current
ILO
Max
Units
VIN = 0V to VCC
1
µA
Output Leakage Current
VI/O = 0V to VCC
1
µA
ISB1
VCC Standby Current CMOS
CE = VCCQ - 0.3V to VCC
10
µA
ICC(1)
VCC Active Current
f = 66 MHz; IOUT = 0 mA
30
mA
ICCRE
VCC Read While Erase Current
f = 66 MHz; IOUT = 0 mA
50
mA
ICCRW
VCC Read While Write Current
f = 66 MHz; IOUT = 0 mA
50
mA
VIL
Input Low Voltage
0.6
V
VIH
Input High Voltage
VOL
Output Low Voltage
VOH
Output High Voltage
Note:
Min
2.0
IOL = 2.1 mA
V
0.45
IOH = -100 µA
2.5
IOH = -400 µA
2.4
V
V
1. In the erase mode, ICC is 50 mA.
Input Test Waveforms and Measurement Level
2.0V
AC
DRIVING
LEVELS
1.5V
AC
MEASUREMENT
LEVEL
0.6V
tR, tF < 5 ns
Output Test Load
V CC
1.8K
OUTPUT
PIN
1.3K
30 pF
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Typ
Max
Units
Conditions
CIN
4
6
pF
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note:
1. This parameter is characterized and is not 100% tested.
19
3425A–STKD–1/04
AC Asynchronous Read Timing Characteristics
64-Mbit-70
Symbol
Parameter
Min
tACC
Access, Address to Data Valid
tCE
Access, CE to Data Valid
64-Mbit-85
Max
Min
Max
Units
70
85
ns
70
85
ns
tOE
OE to Data Valid
20
20
ns
tDF
CE, OE High to Data Float
25
25
ns
tRO
RESET to Output Delay
150
150
ns
Asynchronous Read Cycle Waveform(1)(2)(3)
tRC
A0 - A21
ADDRESS VALID
CE
tCE
tOE
OE
tDF
tOH
tACC
tRO
RESET
I/O0 - I/O15
Notes:
20
HIGH Z
OUTPUT
VALID
1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE, whichever occurs first (CL = 5 pF).
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
AC Word Load Characteristics
Symbol
Parameter
Min
Max
Units
tAS
Address Setup Time to WE and CE Low
0
ns
tAH
Address Hold Time
20
ns
tDS
Data Setup Time
20
ns
tDH
Data Hold Time
0
ns
tWP
CE or WE Low Pulse Width
35
ns
tWPH
CE or WE High Pulse Width
25
ns
AC Word Load Waveforms
WE Controlled
CE
I/O0-I/O15
DATA VALID
A0 -A21
tDS
tDH
tAH
tAS
tWP
WE
CE Controlled
WE
I/O0-I/O15
DATA VALID
A0 -A21
tDS
tAS
CE
tDH
tAH
tWP
21
3425A–STKD–1/04
Program Cycle Characteristics
Symbol
Parameter
Min
Typ
Max
Units
tBP
Word Programming Time (Vpp = VCC)
22
µs
tBPVPP
Word Programming Time (VPP > 11.5V)
10
µs
tSEC1
Sector Erase Cycle Time (4K word sectors)
100
ms
tSEC2
Sector Erase Cycle Time (32K word sectors)
500
ms
tES
Erase Suspend Time
15
µs
tPS
Program Suspend Time
10
µs
Program Cycle Waveforms
OE(1)
CE
XXAA
I/O0 -I/O15
XX55
555
A0 -A21
AAA
INPUT
DATA
XXA0
555
ADDR
WE
Sector, Plane or Chip Erase Cycle Waveforms
OE(1)
CE
XXAA
I/O0 -I/O15
A0 -A21
555
XX55
AAA
555
555
Note3
XX55
XXAA
XX80
AAA
Note2
WE
Notes:
22
1. OE must be high only when WE and CE are both low.
2. For chip erase, the address should be 555. For plane or sector erase, the address depends on what plane or sector is to be
erased. (See note 4 and 6 under Command Definitions on page 12.)
3. For chip erase, the data should be XX10H, for plane erase, the data should be XX20H, and for sector erase, the data should
be XX30H
4. The waveforms shown above use the WE controlled AC Word Load Waveforms.
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Data Polling Characteristics
Symbol
Parameter
Min
tDH
Data Hold Time
10
ns
tOEH
OE Hold Time
10
ns
Max
(2)
tOE
OE to Output Delay
tWR
Write Recovery Time
Notes:
Typ
Units
ns
0
ns
1. These parameters are characterized and not 100% tested.
2. See tOE spec on page 20.
Data Polling Waveforms
WE
CE
OE
I/O7
A0-A21
Toggle Bit Characteristics(1)
Symbol
Parameter
tDH
Data Hold Time
tOEH
OE Hold Time
Min
Typ
Max
Units
10
ns
10
ns
(2)
tOE
OE to Output Delay
tOEHP
OE High Pulse
50
ns
Write Recovery Time
0
ns
tWR
Notes:
ns
1. These parameters are characterized and not 100% tested.
2. See tOE spec on page 20.
Toggle Bit Waveforms(1)(2)(3)
Notes:
1. Toggling either OE or CE or both OE and CE will operate toggle bit.
The tOEHP specification must be met by the toggling input(s).
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
23
3425A–STKD–1/04
Software Product Identification
Entry(1)
LOAD DATA AA
TO
ADDRESS 555
LOAD DATA 55
TO
ADDRESS AAA
Software Product Identification Exit(1)(6)
LOAD DATA AA
TO
ADDRESS 555
LOAD DATA 55
TO
ADDRESS AAA
OR
LOAD DATA F0
TO
ANY ADDRESS
EXIT PRODUCT
IDENTIFICATION
MODE(4)
LOAD DATA F0
TO
ADDRESS 555
LOAD DATA 90
TO
ADDRESS xxx(7)
EXIT PRODUCT
IDENTIFICATION
MODE(4)
ENTER PRODUCT
IDENTIFICATION
MODE(2)(3)(5)
Notes:
1. Data Format: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex) Address Format: A11 - A0 (Hex); A12 - A21 (Don’t Care).
2. A1 - A21 = VIL.
Manufacturer Code is read for A0 = VIL;
Device Code is read for A0 = VIH.
3. The device does not remain in identification mode if powered down.
4. The device returns to standard operation mode.
5. Manufacturer Code: 001FH
Device Code: 00D6H – Bottom Boot; 00D2H – Top Boot.
6. Either one of the Product ID Exit commands can be used.
For the 64-Mbit Top Boot:
7. For the 64-Mbit Bottom Boot:
xxx = 0XX555 Status Read from Plane A
xxx = 1XX555 Status Read from Plane B
xxx = 2XX555 Status Read from Plane C
xxx = 3XX555 Status Read from Plane D
xxx = 3XX555 Status Read from Plane A
xxx = 2XX555 Status Read from Plane B
xxx = 1XX555 Status Read from Plane C
xxx = 0XX555 Status Read from Plane D
If a read status has been entered for a plane, any read from this plane will be a status read while any read of another plane
will be a memory read, either random or burst. Program or erase operations cannot be performed while one of the planes is
in the read status mode.
24
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Table 4. Common Flash Interface Definition for 64-Mbit Device
Address
64-Mbit Device
Comments
10h
0051h
“Q”
11h
0052h
“R”
12h
0059h
“Y”
13h
0002h
14h
0000h
15h
0041h
16h
0000h
17h
0000h
18h
0000h
19h
0000h
1Ah
0000h
1Bh
0027h
VCC min write/erase
1Ch
0031h
VCC max write/erase
1Dh
00B5h
VPP min voltage
1Eh
00C5h
VPP max voltage
1Fh
0004h
Typ word write – 16 µs
20h
0000h
21h
0009h
Typ block erase – 500 ms
22h
0010h
Typ chip erase, 64,300 ms
23h
0004h
Max word write/typ time
24h
0000h
n/a
25h
0003h
Max block erase/typ block erase
26h
0003h
Max chip erase/ typ chip erase
27h
0017h
Device size
28h
0001h
x16 device
29h
0000h
x16 device
2Ah
0000h
Multiple byte write not supported
2Bh
0000h
Multiple byte write not supported
2Ch
0002h
2 regions, x = 2
2Dh
007Eh
64K bytes, Y = 126
2Eh
0000h
64K bytes, Y = 126
2Fh
0000h
64K bytes, Z = 256
30h
0001h
64K bytes, Z = 256
31h
0007h
8K bytes, Y = 7
32h
0000h
8K bytes, Y = 7
33h
0020h
8K bytes, Z = 32
34h
0000h
8K bytes, Z = 32
25
3425A–STKD–1/04
Table 4. Common Flash Interface Definition for 64-Mbit Device (Continued)
Address
64-Mbit Device
Comments
VENDOR SPECIFIC EXTENDED QUERY
26
41h
0050h
“P”
42h
0052h
“R”
43h
0049h
“I”
44h
0031h
Major version number, ASCII
45h
0030h
Minor version number, ASCII
46h
008Fh
Bit 0 – chip erase supported, 0 – no, 1 – yes
Bit 1 – erase suspend supported, 0 – no, 1 – yes
Bit 2 – program suspend supported, 0 – no, 1 – yes
Bit 3 – simultaneous operations supported, 0 – no, 1 – yes
Bit 4 – burst mode read supported, 0 – no, 1 – yes
Bit 5 – page mode read supported, 0 – no, 1 – yes
Bit 6 – queued erase supported, 0 – no, 1 – yes
Bit 7 – protection bits supported, 0 – no, 1 – yes
47h
0000h Top Boot or 0001h
Bottom Boot
48h
0000h
Bit 0 – 4 word linear burst with wrap around, 0 – no, 1 – yes
Bit 1 – 8 word linear burst with wrap around, 0 – no, 1 – yes
Bit 2 – continuos burst, 0 – no, 1 – yes
Undefined bits are “0”
49h
0000h
Bit 0 – 4 word page, 0 – no, 1 – yes
Bit 1 – 8 word page, 0 – no, 1 – yes
Undefined bits are “0”
4Ah
0080h
Location of protection register lock byte, the section's first byte
4Bh
0003h
# of bytes in the factory prog section of prot register – 2*n
4Ch
0003h
# of bytes in the user prog section of prot register – 2*n
Bit 0 – top (“0”) or bottom (“1”) boot block device
Undefined bits are “0”
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
8-megabit SRAM
Description
The 8-megabit SRAM is a high-speed, super low-power CMOS SRAM organized as
512K words by 16 bits. The SRAM uses high-performance full CMOS process technology and is designed for high-speed and low-power circuit technology. It is particularly
well-suited for the high-density low-power system application. This device has a data
retention mode that guarantees data to remain valid at a minimum power supply voltage
of 1.2V.
Features
• Fully Static Operation and Tri-state Output
• TTL Compatible Inputs and Outputs
• Battery Backup
– 1.2V (Min) Data Retention
Voltage (V)
Speed (ns)
Operation
Current/ICC (mA)
(Max)
2.7 - 3.1
70
3
Standby
Current (µA)
(Max)
Temperature
(° C)
15
-40 - 85
Block Diagram
ROW DECODER
A0
MEMORY ARRAY
512K X 16
WRITE DRIVER
COLUMN
DECODER
DATA I/O BUFFER
SENSE AMP
BLOCK
DECODER
PRE DECODER
ADD INPUT BUFFER
A18
I/O0
I/O7
I/O8
I/O15
SCS1
SCS2
SOE
SLB
SUB
SWE
27
3425A–STKD–1/04
Absolute Maximum Ratings(1)
Symbol
Parameter
Rating
Unit
VIN, VOUT
Input/Output Voltage
-0.3 to 3.6
V
VCC
Power Supply
-0.3 to 3.6
V
TA
Operating Temperature
-40 to 85
°C
TSTG
Storage Temperature
-55 to 150
°C
1.0
W
PD
Power Dissipation
Note:
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is
stress rating only and the functional operation of the device under these or any other conditions above those indicated in the
operation of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may
affect reliability.
Truth Table
I/O Pin
SCS1
SCS2
(1)
X
(1)
L
H
X
X
SWE
SOE
X
X
X
L(1)
H
L
H
H
L
H
SLB(2)
SUB(2)
X
X
H
H
L
H
H
L
L
L
L
H
H
L
H
H
I/O8 - I/O15
Power
Deselected
High-Z
High-Z
Standby
Output Disabled
High-Z
High-Z
Active
DIN
High-Z
High-Z
DIN
DIN
DIN
DIN
High-Z
DOUT
High-Z
High-Z
DOUT
DOUT
DOUT
DOUT
High-Z
Write
L
L
H
H
L
L
Read
L
Notes:
I/O0 - I/O7
X
L
L
Mode
L
Active
Active
1. H = VIH, L = VIL, X = Don't Care (VIL or VIH)
2. SUB, SLB (Upper, Lower Byte Enable). These active LOW inputs allow individual bytes to be written or read. When SLB is
LOW, data is written or read to the lower byte, I/O0 - I/O7. When SUB is LOW, data is written or read to the upper byte, I/O8
- I/O15.
Recommended DC Operating Condition
Symbol
Parameter
Min
Typ
Max
Unit
VCC
Supply Voltage
2.7
3.0
3.1
V
VSS
Ground
0
0
0
V
VIH
Input High Voltage
VCC + 0.3
V
0.6
V
VIL
(1)
Note:
28
Input Low Voltage
2.2
(1)
-0.3
1. Undershoot: VIL = -1.5V for pulse width less than 30 ns. Undershoot is sampled, not 100% tested.
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
DC Electrical Characteristics
TA = -40° C to 85° C
Symbol
Parameter
Test Condition
Min
Max
Unit
ILI
Input Leakage Current
VSS < VIN < VCC
-1
1
µA
ILO
Output Leakage Current
VSS < VOUT < VCC,
SCS1 = VIH or SCS2=VIL or
SOE = VIH or SWE = VIL or
SUB = VIH, SLB = VIH
-1
1
µA
ICC
Operating Power Supply Current
SCS1 = VIL, SCS2=VIH,
VIN = VIH or VIL, II/O = 0 mA
3
mA
ICC1
Average Operating Current
SCS1 = VIL, SCS2 = VIH,
VIN = VIH or VIL, Cycle Time = Min
100% Duty, II/O = 0 mA
15
mA
SCS1 < 0.2V, SCS2 > VCC - 0.2V
VIN < 0.2V or VIN > VCC - 0.2V,
Cycle Time = 1 µs
100% Duty, II/O = 0 mA
2
mA
ISB
Standby Current (TTL Input)
SCS1 = VIH or SCS2 = VIL or
SUB, SLB = VIH
VIN = VIH or VIL
0.3
mA
ISB1
Standby Current (CMOS Input)
SCS1 > VCC - 0.2V or
SCS2 < VSS + 0.2V or
SUB, SLB > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < VSS + 0.2V
15
µA
VOL
Output Low
IOL = 2.1 mA
0.4
V
VOH
Output High
IOH = -1.0 mA
2.4
V
Capacitance(1)
(Temp = 25° C, f = 1.0 MHz)
Symbol
Parameter
CIN
COUT
Note:
Condition
Max
Unit
Input Capacitance (Add, SCS1,
SCS2, SLB, SUB, SWE, SOE)
VIN = 0 V
8
pF
Output Capacitance (I/O)
VI/O = 0 V
10
pF
1. These parameters are sampled and not 100% tested.
29
3425A–STKD–1/04
AC Characteristics
TA = -40° C to 85° C, Unless Otherwise Specified
70 ns
#
Symbol
Parameter
Min
Max
1
tRC
Read Cycle Time
2
tAA
Address Access Time
70
ns
3
tACS
Chip Select Access Time
70
ns
4
tOE
Output Enable to Output Valid
35
ns
5
tBA
SLB, SUB Access Time
70
ns
6
tCLZ
Chip Select to Output in Low Z
10
ns
7
tOLZ
Output Enable to Output in Low Z
5
ns
8
tBLZ
SLB, SUB Enable to Output in Low Z
10
ns
9
tCHZ
Chip Deselection to Output in High Z
0
25
ns
10
tOHZ
Out Disable to Output in High Z
0
25
ns
11
tBHZ
SLB, SUB Disable to Output in High Z
0
25
ns
12
tOH
Output Hold from Address Change
10
ns
13
tWC
Write Cycle Time
70
ns
14
tCW
Chip Selection to End of Write
60
ns
15
tAW
Address Valid to End of Write
60
ns
16
tBW
SLB, SUB Valid to End of Write
60
ns
17
tAS
Address Setup Time
0
ns
18
tWP
Write Pulse Width
50
ns
19
tWR
Write Recovery Time
0
ns
20
tWHZ
Write to Output in High Z
0
21
tDW
Data to Write Time Overlap
30
ns
22
tDH
Data Hold from Write Time
0
ns
23
tOW
Output Active from End of Write
5
ns
70
Unit
ns
20
ns
AC Test Conditions
TA = -40° C to 85° C, Unless Otherwise Specified
Parameter
Value
Input Pulse Level
0.4V to 2.2V
Input Rise and Fall Time
5 ns
Input and Output Timing Reference Level
1.5V
Output Load
tCLZ, tOLZ, tBLZ, tCHZ, tOHZ, tBHZ, tWHZ, tOW
CL = 5 pF + 1 TTL Load
Others
CL = 30 pF + 1 TTL Load
30
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
AC Test Loads
VTM = 2.8V
1029 Ohm
DOUT
(1)
CL
Note:
1728 Ohm
Including jig and scope capacitance.
31
3425A–STKD–1/04
Timing Diagrams
Read Cycle 1(1),(4)
tRC
ADDRESS
tAA
tOH
tACS
SCS1
SCS2
tCHZ(3)
tBA
SUB, SLB
tBHZ(3)
tOE
SOE
tOLZ(3)
tOHZ (3)
tBLZ(3)
DATA OUT
HIGH-Z
tCLZ(3)
DATA VALID
Read Cycle 2(1),(2),(4)
tRC
ADDRESS
tAA
tOH
tOH
DATA OUT
PREVIOUS DATA
DATA VALID
Read Cycle 3(1),(2),(4)
SCS1
SUB, SLB
SCS2
DATA OUT
Notes:
32
tACS
tCLZ (3)
tCHZ (3)
DATA VALID
1. Read Cycle occurs whenever a high on the SWE and SOE is low, while SUB and/or SLB and SCS1 and SCS2 are in active
status.
2. SOE = VIL.
3. Transition is measured ± 200 mV from steady state voltage. This parameter is sampled and not 100% tested.
4. SCS1 in high for the standby, low for active. SCS2 in low for the standby, high for active. SUB and SLB in high for the
standby, low for active.
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Write Cycle 1 (SWE Controlled)(1),(4),(8)
tWC
ADDRESS
tWR(2)
tCW
SCS1
SCS2
tAW
tBW
SUB, SLB
tWP
SWE
tAS
DATA IN
tDW
tDH
tAS
HIGH-Z
DATA VALID
tWHZ(3)(7)
tOW
(5)
(5)
DATA OUT
Write Cycle 2 (SCS1, SCS2 Controlled)(1),(4),(8)
tWC
ADDRESS
tWR(2)
tCW
tAS
SCS1
tAW
SCS2
tBW
SUB, SLB
tWP
SWE
tDW
DATA IN
DATA OUT
Notes:
HIGH-Z
tDH
DATA VALID
HIGH-Z
1. A write occurs during the overlap of a low SWE, a low SCS1, a high SCS2 and a low SUB and/or SLB.
2. tWR is measured from the earlier of SCS1, SLB, SUB, or SWE going high or SCS2 going low to the end of write cycle.
3. During this period, I/O pins are in the output state so that the input signals of opposite phase to the output must not be
applied.
4. If the SCS1, SLB and SUB low transition and SCS2 high transition occur simultaneously with the SWE low transition or after
the SWE transition, outputs remain in a high impedance state.
5. Q (data out) is the same phase with the write data of this write cycle.
6. Q (data out) is the read data of the next address.
7. Transition is measured ± 200 mV from steady state. This parameter is sampled and not 100% tested.
8. SCS1 in high for the standby, low for active SCS2 in low for the standby, high for active. SUB and SLB in high for the standby,
low for active.
33
3425A–STKD–1/04
Data Retention Electric Characteristic
TA = -40° C to 85° C
Symbol
Parameter
Test Condition
Min
VDR
VCC for Data Retention
SCS1 > VCC - 0.2V or
SCS2 < VSS + 0.2V or
SUB, SLB > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < VSS + 0.2V
1.2
ICCDR
Data Retention Current
VCC = 3V,
SCS1 > VCC - 0.2V or
SCS2 < VSS + 0.2V or
SUB, SLB > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < VSS + 0.2V
tCDR
Chip Deselect to Data
Retention Time
See Data Retention Timing Diagram
tR
Operating Recovery Time
Notes:
Typ
1
Max
Unit
3.3
V
8
µA
0
ns
tRC
ns
1. Typical values are under the condition of TA = 25° C. Typical values are sampled and not 100% tested.
2. tRC is read cycle time.
Data Retention Timing Diagram 1
DATA RETENTION MODE
VCC
2.7V
tCDR
tR
IH
VDR
SCS1 > VCC - 0.2V
SCS1
VSS
Data Retention Timing Diagram 2
DATA RETENTION MODE
VCC
2.7V
tCDR
tR
SCS2
VDR
0.4V
VSS
34
SCS2 < 0.2V
AT52BR6408A(T)
3425A–STKD–1/04
AT52BR6408A(T)
Ordering Information
tACC
(ns)
70
85
Flash Boot
Block
SRAM
Package
Operation Range
AT52BR6408A-70CI
Bottom
512K x 16
66C4
Industrial
(-40° to 85° C)
AT52BR6408AT-70CI
Top
512K x 16
66C4
Industrial
(-40° to 85° C)
AT52BR6408A-85CI
Bottom
512K x 16
66C4
Industrial
(-40° to 85° C)
AT52BR6408AT-85CI
Top
512K x 16
66C4
Industrial
(-40° to 85° C)
Ordering Code
Package Type
66C4
66-ball, Plastic Chip-size Ball Grid Array Package (CBGA)
35
3425A–STKD–1/04
Packaging Information
66C4 – CBGA
0.12 C
D
C Seating Plane
Marked A1 Identifier
Side View
E
A1
Top View
1.10 REF
A
D1
12 11
10
9
8
7
6
A1 Ball Corner
4
5
3
2
1
A
e
B
C
D
E1
E
F
G
COMMON DIMENSIONS
(Unit of Measure = mm)
H
1.20 REF
e
Øb
Bottom View
MIN
NOM
MAX
A
–
–
1.20
A1
0.25
–
–
D
10.90
11.00
11.10
SYMBOL
D1
E
NOTE
8.80 TYP
7.90
8.00
8.10
E1
5.60 TYP
e
0.80 TYP
Øb
0.40 TYP
08/29/01
R
36
2325 Orchard Parkway
San Jose, CA 95131
TITLE
66C4, 66-ball (12 x 8 Array), 11 x 8 x 1.2 mm Body, 0.8 mm Ball
Pitch Chip-scale Ball Grid Array Package (CBGA)
DRAWING NO.
66C4
REV.
A
AT52BR6408A(T)
3425A–STKD–1/04
Atmel Corporation
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 487-2600
Regional Headquarters
Europe
Atmel Sarl
Route des Arsenaux 41
Case Postale 80
CH-1705 Fribourg
Switzerland
Tel: (41) 26-426-5555
Fax: (41) 26-426-5500
Asia
Room 1219
Chinachem Golden Plaza
77 Mody Road Tsimshatsui
East Kowloon
Hong Kong
Tel: (852) 2721-9778
Fax: (852) 2722-1369
Japan
9F, Tonetsu Shinkawa Bldg.
1-24-8 Shinkawa
Chuo-ku, Tokyo 104-0033
Japan
Tel: (81) 3-3523-3551
Fax: (81) 3-3523-7581
Atmel Operations
Memory
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 436-4314
RF/Automotive
Theresienstrasse 2
Postfach 3535
74025 Heilbronn, Germany
Tel: (49) 71-31-67-0
Fax: (49) 71-31-67-2340
Microcontrollers
2325 Orchard Parkway
San Jose, CA 95131, USA
Tel: 1(408) 441-0311
Fax: 1(408) 436-4314
La Chantrerie
BP 70602
44306 Nantes Cedex 3, France
Tel: (33) 2-40-18-18-18
Fax: (33) 2-40-18-19-60
ASIC/ASSP/Smart Cards
1150 East Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906, USA
Tel: 1(719) 576-3300
Fax: 1(719) 540-1759
Biometrics/Imaging/Hi-Rel MPU/
High Speed Converters/RF Datacom
Avenue de Rochepleine
BP 123
38521 Saint-Egreve Cedex, France
Tel: (33) 4-76-58-30-00
Fax: (33) 4-76-58-34-80
Zone Industrielle
13106 Rousset Cedex, France
Tel: (33) 4-42-53-60-00
Fax: (33) 4-42-53-60-01
1150 East Cheyenne Mtn. Blvd.
Colorado Springs, CO 80906, USA
Tel: 1(719) 576-3300
Fax: 1(719) 540-1759
Scottish Enterprise Technology Park
Maxwell Building
East Kilbride G75 0QR, Scotland
Tel: (44) 1355-803-000
Fax: (44) 1355-242-743
Literature Requests
www.atmel.com/literature
Disclaimer: Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard
warranty which is detailed in Atmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for any
errors which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and
does not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are
granted by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are not authorized for use
as critical components in life support devices or systems.
© Atmel Corporation 2004. All rights reserved. Atmel ® and combinations thereof are the registered trademarks of Atmel Corporation or its
subsidiaries. Other terms and product names may be the trademarks of others.
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