Cypress Semiconductor Qualification Report QTP# 96295 VERSION 1.0 May, 1997 SST™ SONET/SDH Serial Transceiver CY7B952 SST™ is a trademark of Cypress Semiconductor Corporation Cypress Semiconductor SST™SONET/SDH Serial Transceiver Device: CYB952 Package: SOIC QTP# 96295, V. 1.0 Page 2 of 7 May, 1997 PRODUCT DESCRIPTION (for qualification) Information provided in this document is intended for generic qualification and technically describes the Cypress part supplied: Marketing Part #: CY7B952 Package: 24 pins SOIC Device Description: SST™ SONET/SDH Serial Transceiver Cypress Division: Cypress Semiconductor Corporation - DCD Division Overall Die (or Mask) REV Level (pre-requisite for qualification): Die Size (stepping): 92 mils x 126 mils Rev. A What ID markings on Die: 7B952A TECHNOLOGY/FAB PROCESS DESCRIPTION Number of Metal Layers: 2 Metal Composition: Passivation Type and Materials: 3,000 Å TEOS + 15,000 Å Oxynitride Free Phosphorus contents in top glass layer(%): Die Coating(s), if used: Metal 1: 500 Å Ti/1,200 Å TiW/6,000Å Al, 500 Å Ti Metal 2: 1,500K ÅTi/10,000 Å Al 0% PSG Polyimide Number of Transistors in device: 5,044 Number of Gates in device: 2,522 Generic Process Technology/Design Rule (µ-drawn): Gate Oxide Material/Thickness (MOS): Name/Location of Die Fab (prime) Facility: Die Fab Line ID/Wafer Process ID: BiCMOS, Single Poly, Double Metal /0.8 µm SiO2 / 195 Å Cypress Semiconductor - Round Rock, TX Fab 2/SM1 Cypress Semiconductor SST™SONET/SDH Serial Transceiver Device: CYB952 Package: SOIC QTP# 96295, V. 1.0 Page 3 of 7 May, 1997 PLASTIC PACKAGE/ASSEMBLY DESCRIPTION Package Outline, Type, or Name: 24-pin SOIC Mold Compound Name/Manufacturer: Lead Frame material: Sumitomo EME-6300 Copper Alloy Lead Finish, composition: Solder Plated, 85%Sn, 15%Pb Die Attach Area Plating: Silver Spot Die Attach Method: Epoxy Die Attach Material: Ablestik 84-1MISR4 Wire Bond Method: Thermosonic Wire Material/Size: Gold / 1.3 mil JESD22-A112 Moisture Sensitivity Level Level 1 Assembly Line ID and Process ID: Cypress Bangkok, Thailand Note: Please contact a Cypress Representative for other packages availability. Cypress Semiconductor SST™SONET/SDH Serial Transceiver Device: CYB952 Package: SOIC QTP# 96295, V. 1.0 Page 4 of 7 May, 1997 RELIABILITY TESTS PERFORMED Stress/Test Test Condition (Temp/Bias) Result P/F High Temperature Operating Life Early Failure Rate Dynamic Operating Condition, Vcc = 6.0V, 140°C P High Temperature Operating Life Latent Failure Rate Dynamic Operating Condition, Vcc = 6.0V, 140°/150°C P Read and Record Life Test Dynamic Operating Condition, Vcc = 6.0V, 140°C P High Temperature Steady State Life Static Operating Condition, Vcc = 6.0V, 140°C P High Accelerated Saturation Test (HAST) 130°C, 85%RH, 5.5V Precondition: JESD22 Moisture Sensitivity Level 1 (168 Hrs 85/85% RH ) P Temperature Cycle MIL-STD-883C, Method 1010, Condition C, -65°C to 150°C Precondition: JESD22 Moisture Sensitivity Level 1 (168 Hrs 85/85% RH ) P Electrostatic Discharge Human Body Model (ESD-HBM) MIL-STD-883, Method 3015.7 Electrostatic Discharge Charge Device Model (ESD-CDM) Cypress Spec. 25-00020 Latchup Sensitivity In accordance with JEDEC 17. Cypress Spec. 01-00081 2,200V 2,000V P Cypress Semiconductor SST™SONET/SDH Serial Transceiver Device: CYB952 Package: SOIC QTP# 96295, V. 1.0 Page 5 of 7 May, 1997 RELIABILITY FAILURE RATE SUMMARY Stress/Test Device Tested/ Device Hours # Fails Activation Energy Thermal AF4 Failure Rate High Temperature Operating Life Early Failure Rate 2,924 Devices 0 N/A N/A 0 PPM High Temperature Operating Life1,2,3 Long Term Failure Rate 143,060 DHRs 0 0.6 82 79 FIT 1 2 3 4 Assuming an ambient temperature of 55°C and a junction temperature rise of 15°C. Chi-squared 60% estimations used to calculate the failure rate. Failure Rate is based on Sonet/SDH Serial Transceiver, SM1 technology (QTP #94112 and 96295). Thermal Acceleration Factor is calculated from the Arrhenius equation E 1 1 AF = exp A - k T 2 T1 where: EA =The Activation Energy of the defect mechanism. k = Boltzmann's constant = 8.62x10-5 eV/Kelvin. T1 is the junction temperature of the device under stress and T2 is the junction temperature of the device at use conditions. Cypress Semiconductor SST™SONET/SDH Serial Transceiver Device: CYB952 Package: SOIC QTP# 96295, V. 1.0 Page 6 of 7 May, 1997 RELIABILITY TEST DATA QTP#: 962951 DEVICE ASSY-LOC FABLOT# ASSYLOT# DURATION S/S REJ ==================== ======== ======== ============== ======== ==== === STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 5.75V) CY7B952-SC CY7B952-SC ALPHA-X ALPHA-X 2614689 2614689 219609418 219609418 48 48 92 916 FAIL MODE ================================ 0 0 CY7B952-SC ALPHA-X 2632033 219613230/1 48 1018 0 --------------------------------------------------------------------------------------------------------------STRESS: ESD-CHARGE DEVICE MODEL (2,000V) CY7B952-SC ALPHA-X 2614689 219609418 COMP 3 0 CY7B952-SC ALPHA-X 2632033 219613230/1 COMP 3 0 CY7B952-SC ALPHA-X 2704576 219702881 COMP 3 0 --------------------------------------------------------------------------------------------------------------STRESS: ESD-HUMAN BODY CIRCUIT PER MIL STD 883, METHOD 3015 (2,200V) CY7B952-SC ALPHA-X 2614689 219609418 COMP 3 0 CY7B952-SC ALPHA-X 2632033 219613230/1 COMP 3 0 CY7B952-SC ALPHA-X 2704576 219702881 COMP 3 0 --------------------------------------------------------------------------------------------------------------STRESS: HI-ACCEL SATURATION TEST (140C, 5.5V), PRECOND. 168 HRS 85C/85%RH CY7B952-SC ALPHA-X 2614689 219609418 128 48 0 --------------------------------------------------------------------------------------------------------------STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 5.75V) CY7B952-SC ALPHA-X 2614689 219609418 80 80 0 CY7B952-SC ALPHA-X 2614689 219609418 168 80 0 --------------------------------------------------------------------------------------------------------------STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 5.75V) CY7B952-SC ALPHA-X 2614689 219609418 80 130 0 CY7B952-SC ALPHA-X 2614689 219609418 500 130 0 --------------------------------------------------------------------------------------------------------------STRESS: TC COND. C, -65 TO 150C, PRECOND. 168 HRS 85C/85%RH CY7B952-SC ALPHA-X 2614689 219609418 300 48 0 CY7B952-SC ALPHA-X 2614689 219609418 1000 48 0 --------------------------------------------------------------------------------------------------------------- 1 SST (tm) SONET/SDH Serial Transceiver, CY7B951 with Receive Plase-Locked-Loop changed. Cypress Semiconductor SST™SONET/SDH Serial Transceiver Device: CYB952 Package: SOIC QTP# 96295, V. 1.0 Page 7 of 7 May, 1997 DEVICE RELATED RELIABILITY TEST DATA QTP#: 941122 DEVICE ASSY-LOC FABLOT# ASSYLOT# DURATION S/S REJ ==================== ======== ======== ============== ======== ==== === STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 5.75V) CY7B951-SC INDNS-O 2404788 49403198 48 116 0 CY7B951-SC INDNS-O 2404788 49404692 48 167 0 FAIL MODE ================================ CY7B951-SC INDNS-O 2415730 49405533 48 615 0 --------------------------------------------------------------------------------------------------------------STRESS: HI-ACCEL SATURATION TEST (140C, 85%RH, 5.5V), PRECONDITION 48 Hrs. PCT + Solder Reflow CY7B951-SC INDNS-O 2404788 49403198 128 46 0 1 EOS CY7B951-SC INDNS-O 2415730 49405533 128 47 0 --------------------------------------------------------------------------------------------------------------STRESS: HIGH TEMP STEADY STATE LIFE TEST (150C, 5.75V) CY7B951-SC INDNS-O 2404788 49403198 80 80 0 CY7B951-SC INDNS-O 2404788 49403198 168 80 0 --------------------------------------------------------------------------------------------------------------STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 5.75V) CY7B951-SC INDNS-O 2404788 49403198 80 116 0 CY7B951-SC INDNS-O 2404788 49404692 80 116 0 CY7B951-SC INDNS-O 2415730 49405533 80 119 0 CY7B951-SC INDNS-O 2415730 49405533 500 119 0 1 EOS --------------------------------------------------------------------------------------------------------------STRESS: PRESSURE COOKER TEST (121C, 100%RH) CY7B951-SC INDNS-O 2404788 49403198 168 47 0 --------------------------------------------------------------------------------------------------------------STRESS: TC COND. C, -65 TO 150C, Precondition 48 Hrs. PCT + Solder Reflow CY7B951-SC INDNS-O 2404788 49403198 300 47 0 CY7B951-SC INDNS-O 2349133 10470 300 51 0 --------------------------------------------------------------------------------------------------------------- 2 SST (tm) SONET/SDH Serial Transceiver, CY7B951 qualified in Fab2, SM1 Technology.