Q3 - 1997

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 3, 1997
PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION
Marc Hartranft
QA Engineering Department Manager
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
TEV
High Temp Op Life, 150ºC, 5.75V
High Temp Op Life, 125ºC, 5.75V
High Temp Steady State Life, 150ºC, 5.75V
High Temp Steady State Life, 125ºC, 5.75V
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC, 85%RH, 5.5V Bias
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 165ºC, No Bias
Temperature Extreme Verification
Page 2 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
FR
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
MHS, France
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-K
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
ALPHA-Y
THLAND-Z
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
Aplus/USA
Toshiba/USA
Cypress Bangkok/Thailand
Alphatech/Thailand
Hana/Thailand
Page 3 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CPD
RISC CONTRL SRAM/LOGIC-L20
160
DRET
165C/NO BIAS
CY7C611A-NC
M72016 9708 349700966
VME
CMOS
TX
PQFP HK-B
336
1000
78
78
0
0
CY7C63101-SC
96514 9714 219703088 USB
USB
FAMOS-P26
CMOS
TX SOIC ALPHA-X
24 168
76
0
552
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------DRET2 250C/NO BIAS
CY7C63101-WC
96514 9714 219703142 USB
USB
FAMOS-P26
CMOS
TX WCER ALPHA-X
24
96
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
130C/5.5V
140C/5.5V
CY82C693-NC
CY2308ZC
97114
9713 619701790
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
128
256
48
48
0
0
97135
9713 619701790
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
128
256
48
48
0
0
97151
9720 349702279
TTECH
DELAY BUF.
SRAM/LOGIC-L28
CMOS
MN
TSOP PHIL-M
16
128
48
0
CY7C63101-SC
96514 9714 219703088 USB
USB
FAMOS-P26
CMOS
TX SOIC ALPHA-X
24 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.5V
150C/5.75V
CY7C63101-SC
96514
9714 219703088
USB
USB
FAMOS-P26
CMOS
TX
SOIC ALPHA-X
24
48
48
482
545
0 3 EOS
1 1 SINGLE BIT
9718 219704292
USB
USB
FAMOS-P26
CMOS
TX
SOIC ALPHA-X
24
48
80
500
476
114
114
0
0 2 EOS
0
9727 219706999
USB
USB
FAMOS-P26
CMOS
TX
SOIC ALPHA-X
24
48
48
478
545
0
0
CY7C63101-SC
96514
9718 219704292
USB
USB
FAMOS-P26
CMOS
TX
SOIC ALPHA-X
24
48
476
0
CY82C693-NC
97114
9713 619701790
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
48
80
500
122
78
78
0 3 EOS
0
0
619701791
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
48
124
0 1 EOS
80
78
0
500
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY2308ZC
97151
9720 349702279
TTECH
DELAY BUF.
SRAM/LOGIC-L28
CMOS
MN
TSOP PHIL-M
16
336
1000
48
48
0
0
CY82C693-NC
97135
9724 349703236
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
336
45
0
Page 5 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CPD
HTS
165C/NO BIAS
CY82C693-NC
97135
9724 349703236
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
500
45
0
1000
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/5.75V
CY7C63101-SC
96514
9714 219703088
USB
USB
FAMOS-P26
CMOS
TX
SOIC ALPHA-X
24
168
75
0 1 EOS
CY82C693-NC
97114
9713 619701790
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
80
80
168
168
168
48
75
30
48
74
0
0 1 EOS
0
0
0
619701791
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
160
80
76
0
168
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY7C611A-NC
M72017 9708 349700966
VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX
PQFP HK-B
96
79
4 4 TOPSIDE CRACKS
168
75
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY2308ZC
97151
9720 349702279
TTECH
DELAY BUF.
SRAM/LOGIC-L28
CMOS
MN
TSOP PHIL-M
16
CY82C693-NC
97135
9713 619701790
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
100
200
48
48
0
0
100
48
0
200
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC
-40C TO 125C
CY7C611A-NC
M72015 9708 349700966 VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX PQFP HK-B
160 500
48
1 1 UNKNOWN
1500
47
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CY7C63101-WC
96514
9714 219703142
USB
USB
FAMOS-P26
CMOS
TX
WCER ALPHA-X
24
100
1000
45
45
0
0
-65C TO 150C
CY2308ZC
97151
9720 349702279
TTECH
DELAY BUF.
SRAM/LOGIC-L28
CMOS
MN
TSOP PHIL-M
16
300
300
300
300
48
48
48
48
0
0
0
0
CY7C63101-SC
96514
9714 219703088
USB
USB
FAMOS-P26
CMOS
TX
SOIC ALPHA-X
24
300
1000
45
45
0
0
CY82C693-NC
97114
9713 619701790
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
300
1000
47
47
0
0
619701791
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
300
1000
48
48
0
0
Page 6 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CPD
TC2
-65C TO 150C
CY82C693-NC
VIC068A-BC
97114
9724 349703236
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
300
48
0
97135
9713 619701790
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
300
1000
47
47
0
0
619701791
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
300
1000
48
48
0
0
9724 349703236
PCLOG
PC CHIPSET
SRAM/LOGIC-L27
CMOS
MN
PQFP MALAY-J
208
300
48
0
VME
VME INTERF. SRAM/LOGIC-C2AN
CMOS
MN
PPGA PHIL-M
144
M72018 9713 349701655
300
50
0
1000
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 7 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
DCD
HAST
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
130C/5.5V
CY7C4245-AC
M72059 9703 349700347
SPCM
4Kx18 FIFO
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
64
128
128
35
45
0
0
140C/5.5V
CY7C136-JC
M73047 9718 349702681
SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN
PLCC PHIL-M
52
128
128
22
55
0
0
CY7C4265-JC
96464 9706 349700756 SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
MN PLCC PHIL-M
68 128
91
0 2 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY7C0251-AC
97318
9728 619704595P SPCM
8K x 16 DP
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
100
48
398
0
9729 619704753P SPCM
8K x 16 DP
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
100
48
401
0
9730 619704752P SPCM
8K x 16 DP
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
100
48
48
360
400
0
0
MN
PLCC PHIL-M
68
CY7C4265-JC
96464
9706 349700756
SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
80
254
0 3 EOS
500
232
0 17 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------125C/5.75V
CY7B135-JC
M71053 9640 349612257
SPCM
4K x 8 DP
BiCMOS TX
PLCC KOREA-A
52
125C/6.50V
CY7C4265-JC
97062
9652 349616113
SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
CA
PLCC KOREA-A
68
150C/5.75V
CY7C4265-JC
96464
9706 349700756
SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
MN
PLCC PHIL-M
68
HTSSL2 125C/5.75V
CY7B135-JC
M71054 9640 349612257
SPCM
4K x 8 DP
BICMOS-SM2
BiCMOS TX
PLCC KOREA-A
52
PCT
CY7C136-JC
M73049 9718 349702681
SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN
PLCC PHIL-M
52
CY7C4245-AC
M73082 9715 619701765
SPCM
4Kx18 FIFO
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
64
HTOL2
BICMOS-SM2
96
500
1000
2000
119
119
119
119
0
0
0
0
48 1026
0
80
252
0 1 EOS
500
251
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
80
154
0 1 EOS
168
153
0 1 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------96
119
0
500
119
0
1000
119
0
2000
119
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------121C/100%RH
96
168
77
77
0
0
96
74
0
168
74
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 8 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
DCD
TC2
-65C TO 150C
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C136-JC
M73048 9718 349702681
SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN
PLCC PHIL-M
52
300
1000
48
48
0
0
CY7C4245-AC
M72058 9703 349700347
SPCM
4Kx18 FIFO
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
64
300
1000
50
50
0
0
M73083 9729 619704796
SPCM
4Kx18 FIFO
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
64
300
1000
50
50
0
0
CY7C4265-JC
96464 9706 349700756 SPCM
16KX18 FIFO SRAM/LOGIC-R30
CMOS
MN PLCC PHIL-M
68 300
93
1 1 POPCORN
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 9 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HAST
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
140C/3.3V
CY7C1021V33-VC
97099
9721 619703242L COMDTY 64K x16
SRAM/LOGIC-R33
CMOS
MN
SOJ
TAIWN-G
44
128
48
0
140C/5.5V
CY62256-SNC
97111
9720 519705439
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
128
48
0
519705440
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
128
48
0
M72083 9721 519705680
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
128
76
2 1 METAL DEFECT/1 UNKNOWN
M72074 9708 349700919
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
128
128
9
71
0
0
M73015 9709 349701198
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
128
77
0
97101
COMDTY 64K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
128
48
1 1 LIFTING BOND/S
619703241L COMDTY 64K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
128
48
0
CY7C1009-VC
CY7C1021-VC
9721 619703241
CY7C1021-ZSC
97205
9730 619705050
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
44
128
48
2 2 UNKNOWN
CY7C1031-JC
97153
9716 519704270
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
128
44
0 2 EOS
M71046 9652 519615077
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
128
256
78
76
0
1 1 EOS/1 LIFTING BOND
CY7C1048-SC
97118
9724 619703660
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWN-G
32
128
48
0
CY7C1049-VC
97118
9720 619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
128
256
45
44
0
0
97183
9720 619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
128
45
0
97201
9732 519708433
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
INDNS-O
32
128
45
0 1 EOS
97253
9652 519615484
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
128
48
0
M73009 9722 519705873
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
128
77
0
M73042 9725 519706781
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
128
128
32
48
0
0
SRAM/LOGIC-R33
CMOS
MN
TQFP TAIWN-G
100
128
48
0
CY7C109-VC
CY7C1329-AC
97302
CY7C185-45PC
M72070 9717 219703823
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
128
78
0
M73024 9723 219705968
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
128
78
0
M72035 9715 219703326
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOIC ALPHA-X
28
128
78
CY7C199-SC
9720 619703196L SYNC
64K x 32
Page 10 of 23
16 16 TOP SIDE DEFECT
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
MPD
HAST
140C/5.5V
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C199-SC
M72043 9715 219703407
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOIC ALPHA-X
28
48
176
80
42
0
2 2 EOS/2 TOP SIDE DEFECT
CY7C199-VC
M72032 9715 219703386
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
ALPHA-X
28
128
128
21
56
0
0
M72063 9701 619601604
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
48
176
50
49
0
0
M72064 9701 619601604
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
128
45
5 5 TOP SIDE DEFECT
M72065 9706 349700898
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
48
176
70
70
0 1 EOS
0
M72077 9709 349701549
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
128
77
0
M73080 9721 349703035
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
TSOP PHIL-M
28
97277
9717 619702315
SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
48
513
9719 619702724
SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
48
48
513
1080
0
0
CY7C199-ZC
128
4
0
128
69
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.65V
150C/3.80V
150C/5.75V
CY7C1399-VC
1 1 OTHERS
9726 619703727
SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
48
520
0
CY7C1399-ZC
97277
9722 619702013
SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN
TSOP PHIL-M
28
48
494
0
CY62256V-ZC
97275
9720 349702852N COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
48
2823
0
9722 349702962N COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
48
2875
0
349703257N COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
48
2693
0
CY7C1020V33-VC
97298
9725 619704003L COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
48
650
0
CY7C1021V33-VC
97099
9721 619703242L COMDTY 64K x16
SRAM/LOGIC-R33
CMOS
MN
SOJ
TAIWN-G
44
80
500
118
118
0
0
CY62256-SNC
97111
9720 519705439
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
48
48
48
80
80
500
367
442
783
120
140
119
0
0 1 EOS
0
1 1 POLY DEFECT
0
0
COMDTY 32K x 8
Page 11 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HTOL
150C/5.75V
CY62256-SNC
CY62256V-PC
97111
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9720 519705439
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
500
140
1 1 UNKNOWN
519705440
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
48
48
80
500
783
810
120
120
0
1 1 PARTICLE/1 LASER FUSE
0
0
97232
9723 519705783
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
48
80
500
519
120
120
0
0
0
97232
519706088
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
PDIP INDNS-O
28
48
80
500
336
119
119
0
0
0
519706089
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
PDIP INDNS-O
28
48
336
0
519706090
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
PDIP INDNS-O
28
48
336
0
CY7C1021-VC
97101
9721 619703241
COMDTY 64K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
80
500
118
117
0
0 1 EOS
CY7C1031-JC
97153
9715 519703880
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
80
500
120
116
0
1 4 LATCH-UP/1 OTHERS
9716 519704270
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
80
500
117
116
0
0 9 LATCH-UP
CY7C1048-SC
97118
9724 619703660
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWN-G
32
80
500
116
116
0
1 1 UNKNOWN
CY7C1049-VC
97118
9720 619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
80
500
1000
113
111
111
0
0 2 EOS
0
9725 619704042
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
80
500
118
117
0
0
CY7C109-VC
9733 619705902
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
80
447
0
97201
9732 519708433
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
INDNS-O
32
48
80
500
538
535
535
0 1 EOS
0 2 EOS
0
97253
9713 519615486
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
80
500
260
259
0
0
Page 12 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HTOL
150C/5.75V
150C/6.50V
CY7C199-VC
CY7C1020-VC
97241
97298
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
619702208L COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
48
182
0
619702209L COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
619702212L COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
48
95
0
48
176
0
619702867
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
48
48
500
572
1 1 UNKNOWN
0
619702934
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
48
484
0
619702934L COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
48
546
0
9722 619701988L COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
48
80
810
810
0
0
619703197L COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
48
80
735
734
0 5 EOS
0
9730 619703505L COMDTY 32K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
48
749
0
80
749
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
CY7C1031-JC
CY7C199-VC
M71047 9652 519615077
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
96
500
1000
2000
120
112
88
73
1
1
1
0
4 LATCH-UP/1 UNKNOWN
14 LATCH-UP/1 UNKNOWN
9 EOS/1 TOP SIDE DEFECT
14 EOS
M72020 9718 519704043
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
96
500
1000
116
109
109
1 1 OTHERS
0 5 LATCH-UP
0 51 LATCH-UP
M71058 9704 619700148
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
96
500
1000
2000
119
119
118
117
0
0
0
0 1 EOS
M72002 9716 619702338
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
500
1000
2000
119
119
119
0
0
0
619702338/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN SOJ PHIL-M
28
96
120
1 1 PARTICLE
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY7C1021-ZSC
97205
9730 619705050
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
44
336
48
0
CY7C1048-SC
97184
9725 619703658
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWN-G
32
336
47
0
Page 13 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HTS
165C/NO BIAS
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C1048-SC
97184
9725 619703658
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWN-G
32 1000
47
0
CY7C1049-VC
97118
9720 619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
336
1000
46
46
0
0
97183
9720 619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
336
46
0
97201
9732 519708433
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
INDNS-O
32
336
500
46
46
0
0
CY7C109-VC
CY7C1329-AC
97302 9720 619703196L SYNC
64K x 32
SRAM/LOGIC-R33
CMOS
MN TQFP TAIWN-G 100 336
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/3.8V
CY7C1021V33-VC
97099
9721 619703242L COMDTY 64K x16
SRAM/LOGIC-R33
CMOS
MN
SOJ
TAIWN-G
44
80
168
78
78
0
1 1 OTHERS
150C/5.50V
CY7C109-VC
97201
9732 519708433
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
INDNS-O
32
80
168
78
78
0
0
150C/5.75V
CY62256-SNC
97111
9720 519705439
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
80
168
81
81
0
0
519705440
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
80
168
81
81
0
0
CY7C1021-VC
97101
9721 619703241
COMDTY 64K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
76
80
168
168
76
78
74
76
0
0
0
0
CY7C1031-JC
97153
9715 519703880
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
80
168
80
80
0
0
9716 519704270
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
80
80
168
168
76
76
75
76
0
1 1 LATCH-UP/1 PARTICLE
0
0
CY7C1048-SC
97118
9724 619703660
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWN-G
32
80
168
256
76
76
76
0
0
0
CY7C1049-VC
97118
9720 619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
80
168
76
76
0
0
9725 619704042
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
80
168
73
77
0
0
Page 14 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
MPD
HTSSL
150C/5.75V
CY7C109-VC
97253
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9652 519615484
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
80
168
80
80
0
0
9701 519615485
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
CY7C1031-JC
M71048 9652 519615077
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
96
500
1500
120
106
106
0 1 LATCH-UP
0 13 EOS
0 9 LATCH-UP
CY7C199-VC
M72003 9716 619702338
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
96
500
1000
2000
120
120
119
119
0
1 1 IONIC CONTAMINATION
0
0
M72007 9715 619702274
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
96
120
80
80
0
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.75V
3 2 TOPSIDE SCRATCHES
1 SPEED DEGRATION
500
117
2 1 TOP SIDE DEFECT
1 SPEED DEGRATION
1000
114
0
2000
114
4 4 TOP SIDE DEFECT
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL
-30C/6.5V
CY7C1049-VC
97118 9720 619702877/ COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN SOJ KOREA-L
36 500
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY62256-SNC
M72085 9721 519705680
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
96
168
78
78
0
0
M73014 9720 519705368
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
96
168
78
78
0
0
CY62256-ZC
M73041 9715 349701906
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
TSOP INDNS-O
28
96
168
80
80
0
0
CY62256V-ZC
M73064 9720 349702852
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
96
168
80
80
0
0
CY62256V-ZI
M73040 9720 349702855
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
96
168
85
85
0
0
M73063 9720 349702855
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
96
168
80
77
0
0
M72039 9710 349701371
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
32
96
168
50
45
5 5 TOPSIDE CRACKS
1 1 TOPSIDE CRACKS
CY7C1009-VC
Page 15 of 23
TAIWN-G
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
PCT
121C/100%RH
CY7C1009-VC
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
M72075 9708 349700919
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
96
168
80
80
0
0
M73017 9709 349701198
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
96
168
77
75
2 2 TOPSIDE CRACKS
0
CY7C109-VC
M73011 9722 519705873
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
96
168
78
78
0
0
CY7C1399-ZC
M73051 9617 349605229
SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
CA
TSOP KOREA-H
28
96
168
80
80
0
0
CY7C185-45PC
M72072 9717 219703823
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
96
168
78
74
0
0
M73026 9723 219705968
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
96
168
77
77
0
0
CY7C186-ZC
M73020 9723 619703886
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
96
168
77
77
0
0
CY7C199-SC
M72036 9715 219703326
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOIC ALPHA-X
28
96
168
78
55
0 1 LASER FUSE INC. SERVER
0
CY7C199-VC
M73005 9720 219704818
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
ALPHA-X
28
96
168
77
77
0
0
M73008 9724 619703780
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
96
168
78
78
0
0
M72078 9709 349701549
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
168
78
0
M73023 9720 619703287
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
28
96
168
77
77
0
0
M73078 9721 349703035
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
TSOP PHIL-M
28
CY7C1021-ZSC
97205
9730 619705050
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
44
100
200
48
48
0
0
CY7C1049-VC
97183
9720 619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
100
200
45
45
0
0
CY7C1329-AC
97302
9720 619703196L SYNC
SRAM/LOGIC-R33
CMOS
MN
TQFP TAIWN-G
100
100
200
48
48
0
0
CY7C199-ZC
96
76
0
168
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
64K x 32
Page 16 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MPD
TC2
-65C TO 150C
CY62256-SNC
9720 519705439
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
300
1000
47
47
0
1 1 TOPSIDE CRACKS
519705440
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
300
1000
48
48
0
0
M72082 9721 519705680
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
300
1000
48
48
0
0
M73013 9720 519705368
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
300
48
0
M72037 9710 349701371
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
300
1000
50
50
0
0
M72073 9708 349700919
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
300
1000
50
50
0
0
M73016 9709 349701198
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
300
47
0
CY7C1021-VC
97101
9721 619703241
COMDTY 64K x16
SRAM/LOGIC-R3
CMOS
MN
SOJ
TAIWN-G
44
300
1000
48
48
0
0
CY7C1021-ZSC
97205
9718 619702417
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
44
300
1000
48
48
0
0
9729 619705048
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
44
300
1000
48
48
0
0
9730 619705049
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
44 1000
48
0
619705050
COMDTY 64K x16
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
44
300
39
0
CY7C1009-VC
97111
CY7C1021V33-VC
97099
9721 619703242L COMDTY 64K x16
SRAM/LOGIC-R33
CMOS
MN
SOJ
TAIWN-G
44
300
703
1000
48
48
48
0
0
0
CY7C1031-JC
97153
9715 519703879
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
300
48
0
519703880
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
300
1000
50
50
0
0
9716 519704270
SYNCHR 64K x 18
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
300
47
0
9723 619702975
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWN-G
32
300
703
45
45
0
0
CY7C1048-SC
97118
Page 17 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
TC2
-65C TO 150C
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C1048-SC
97118
9723 619702975
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWN-G
32 1000
45
0
CY7C1049-VC
97118
9720 619702877
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
300
45
0
619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
300
1000
46
46
0
0
9725 619704042
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
300
1000
45
45
0
0
619703003
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
300
1000
45
45
0
0
9720 619702877
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
300
1000
45
45
0
0
619702951
COMDTY 512K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
KOREA-L
36
300
46
0
97072
9724 519706453
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
300
48
1 1 OTHERS
97201
9732 519708433
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
INDNS-O
32
300
1000
46
46
0
0
97253
9652 519615484
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
300
1000
48
48
0
0
519615487
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
300
48
0
9701 519615485
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
300
48
0
64K x 32
SRAM/LOGIC-R33
CMOS
MN
TQFP TAIWN-G
100
300
300
300
1000
1000
1000
45
48
48
43
48
48
0 1 BROKEN PIN
0
0
0
0
0
97183
CY7C109-VC
CY7C1329-AC
97302
9720 619703196L SYNC
CY7C1335-AC
M72040 9710 619701129
SYNCHR 32K x 32
SRAM/LOGIC-R33
CMOS
MN
TQFP TAIWAN-G 100
300
1000
50
50
0
0
CY7C1399-ZC
M73002 9645 349613772
SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
CA
TSOP PHIL-M
28
300
1000
50
50
0
0
CY7C185-45PC
M73025 9723 219705968
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
300
1000
48
48
0
0
CY7C186-ZC
M72028 9713 619701453
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
300
50
0
Page 18 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
TC2
-65C TO 150C
CY7C186-ZC
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
M72028 9713 619701453
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32 1000
50
0
M73018 9723 619703886
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
300
1000
48
48
0
0
97072
9706 619700374
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
300
1000
48
48
0
0
619700375
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
300
1000
48
48
0
1 1 UNKNOWN
CY7C199-SC
M72034 9715 219703326
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOIC ALPHA-X
28
300
1000
50
50
0
0
CY7C199-VC
M72031 9715 219703386
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
ALPHA-X
28
300
1000
46
46
0
0
M73004 9720 219704818
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
ALPHA-X
28
300
48
0
M73007 9724 619703780
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
300
1000
48
48
0
0
M72076 9709 349701549
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
300
1000
50
50
0
0
M73022 9720 619703287
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
28
CY62256-SNC
M73037 9720 519705368
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
-5
25
85
120
120
120
0
0
0
CY7C1009-VC
M74014 9732 619705971
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
CSPI-R
32
-5
25
85
116
116
116
0
0
0
CY7C109-VC
M73036 9722 519705873
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
-5
25
85
120
120
120
0
0
0
CY7C1399-VC
M74038 9727 619704667
SYNCHR 32K x 8
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
-5
25
85
116
116
116
0
0
0
CY7C185-45PC
M72067 9717 219703823
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
-5
25
120
120
0
0
CY7C199-12VC
CY7C199-ZC
300
48
0
1000
47
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
Page 19 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
TEV
0 READ POINT
CY7C185-45PC
CY7C199-VC
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
M72067 9717 219703823
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
85
120
0
M73027 9723 219705968
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
-5
25
85
119
119
119
0
0
0
M73031 9724 619703780
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
-5
25
85
120
120
120
0
0
0
M74044 9729 619705121
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
-5
25
85
116
116
116
0
0
0
CY7C199-ZC
M73075 9721 349703035 COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN TSOP PHIL-M
28
25
117
0
85
116
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 20 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
NMD
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
DRET
165C/NO BIAS
CY27C010-PC
M72011 9707 349700791
PROM
128K x 8
FAMOS-P26
CMOS
TX
PDIP KOREA-H
32
168
78
0
1000
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------DRET2
250C/NO BIAS
CY27H010-WC
M73067 9727 219706861
PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
32
HAST
140C/5.5V
CY27C010-PC
M72012 9707 349700791
PROM
128K x 8
FAMOS-P26
CMOS
TX
PDIP KOREA-H
32
HTOL2
125C/5.75V
CY27H512-JC
M71015 9651 219615860
PROM
64K x 8
FAMOS-P26
CMOS
TX
PLCC ALPHA-X
32
TC2
-65 TO 150C
CY27H010-WC
M72062 9704 219700663
PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
32
100
1000
50
50
0
0
M73057 9726 219706752
PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
32
100
1000
48
48
0
0
M73066 9727 219706861
PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
32
100
48
0
168
78
0
1000
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------128
30
0
128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------96
118
1 2 LATCH-UP/1 UNKNOWN
500
115
0
1000
115
0
2000
115
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
219706861/ PROM
128K x 8
FAMOS-P26
CMOS
TX WCER ALPHA-X
32 1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY27H010-WC
M73068 9727 219706861
PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
32
25
120
0
219706861/ PROM
128K x 8
FAMOS-P26
CMOS
TX WCER ALPHA-X
32
85
119
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 21 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
PPD
DRET
165C/NO BIAS
CY7C374I-JC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
M71075 9643 349613266
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
PLCC KOREA-A
84
168
1000
77
77
0
1 1 UNKNOWN
M72050 9715 219703283
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
PLCC ALPHA-X
84
M71090 9652 349615541
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
TQFP KOREA-Q
160
128
49
1 1 BROKEN BOND NECK
FCT
16 BIT REG. SRAM/LOGIC-R3
CMOS
MN
SSOP MALAY-U
56
128
46
0 1 EOS
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
PLCC ALPHA-X
84
128
128
128
128
15
16
27
27
0
0
0
0
168
78
0
1000
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
130C/5.5V
CY7C375U-AC
140C/3.6V
CY74FCT163952TP 96494
140C/5.5V
CY7C374I-JC
9709 349701564
M72047 9715 219703283
CY7C375U-AC
M71090 9652 349615541 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX TQFP KOREA-Q 160 128
26
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
140C/5.75V
150C/3.6V
CY7C342B-JC
97254
9720 219704671
MAX
REPROG.PAL
FAMOS-P26
CMOS
TX
PLCC ALPHA-X
68
24
48
166
166
0
0
219704672
MAX
REPROG.PAL
FAMOS-P26
CMOS
TX
PLCC ALPHA-X
68
24
48
167
167
0
0
219704945
MAX
REPROG.PAL
FAMOS-P26
CMOS
TX
PLCC ALPHA-X
68
24
48
167
163
0
0
9729 21970600V1 MAX
REPROG.PAL
FAMOS-P26
CMOS
TX
PLCC ALPHA-X
68
72
192
0
CY7C346-HMB
97316
9731 219708428
MAX
REPROG.PAL
FAMOS-P20
CMOS
TX
CERQ ALPHA-X
84
72
132
0
CY7C346-RMB
97316
9731 219708195P MAX
REPROG.PAL
FAMOS-P20
CMOS
TX
WPGA ALPHA-X
100
72
185
0
9732 219708446P MAX
REPROG.PAL
FAMOS-P20
CMOS
TX
WPGA ALPHA-X
100
72
178
0
9709 349701564
16 BIT REG. SRAM/LOGIC-R3
CMOS
MN
SSOP MALAY-U
56
48
894
0
CY74FCT163952TP 96494
FCT
150C/3.8V
CY74FCT163952TP 96494 9709 349701564 FCT
16 BIT REG. SRAM/LOGIC-R3
CMOS
MN SSOP MALAY-U
56
80
128
0
500
128
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75
CY7C372-JC
97267
9722 349703281
FLASH
64-MCEL FL
FLASH-FL22D
CMOS
CA
PLCC PHIL-M
44
48
96
203
203
0
0
125C/5.75V
CY7C372-JC
97267
9722 349703282P FLASH
64-MCEL FL
FLASH-FL22D
CMOS
CA
PLCC PHIL-M
44
48
96
221
221
0
0
Page 22 of 23
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 10/16/97
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
PPD
HTOL2
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
125C/5.75V
CY7C372-JC
97267
9724 349703499P FLASH
64-MCEL FL
FLASH-FL22D
CMOS
CA
PLCC PHIL-M
44
48
96
282
282
0
0
125C/6.50V
CY7C372I-JC
97268
917
219703611P FLASH
64-MCEL FL
FLASH-FL24D
CMOS
TX
PLCC ALPHA-X
44
48
199
0
219703612P FLASH
64-MCEL FL
FLASH-FL24D
CMOS
TX
PLCC ALPHA-X
44
48
230
0
9705 219701008
FLASH
64-MCEL FL
FLASH-FL24D
CMOS
TX
PLCC ALPHA-X
44
48
503
0
48
501
1 1 PARTICLE
CY7C373I-JC
97268
9645 349613900
FLASH
64-MCEL FL
FLASH-FL24D
CMOS
TX
PLCC KOREA-L
44
125C/6.5V
CY7C374I-JC
97305
9722 219705498
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
PLCC ALPHA-X
84
HTSSL
150C/3.6V
CY74FCT163952TP 96494
9709 349701564
FCT
16 BIT REG. SRAM/LOGIC-R3
CMOS
MN
SSOP MALAY-U
56
PCT
121C/100%RH
CY7C374I-JC
M72049 9715 219703283
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
PLCC ALPHA-X
84
CY7C375U-AC
M71092 9652 349615541
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
TQFP KOREA-Q
160
9709 349701564
FCT
16 BIT REG. SRAM/LOGIC-R3
CMOS
MN
SSOP MALAY-U
56
300
1000
48
48
0
0
M73060 9724 619703645
MAX
REPROG.PAL
CMOS
TX
PLCC KOREA-A
84 1000
40
0
48
502
0
80
80
0
500
74
0 6 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------80
78
0
168
78
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------96
168
78
77
0 1 EXTERNAL CONTAMINATION
0
96
84
0
168
79
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY74FCT163952TP 96494
CY7C341-25JI
FAMOS-P20
CY7C374I-JC
M72048 9715 219703283 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC ALPHA-X
84 300
44
2 2 CRACKED DIE
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 23 of 23