Q3 - 1999

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 3, 1999
PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION
Ed Russell
Reliability Director
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 11/6/99
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
High Temp Op Life, 150ºC, Dynamic 115% Vcc Nominal
High Temp Op Life, 125ºC, Dynamic 115% Vcc Nominal
High Temp Steady State Life, 150ºC, Static 115% Vcc Nominal
High Temp Steady State Life, 125ºC, Static 115% Vcc Nominal
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC/130ºC, 85%RH, Static 100% Vcc
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 150ºC, No Bias
Page 2 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 11/6/99
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
TW
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
TSMC, Taiwan
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-AK
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
THLAND-Z
USA-AP
KOREA-GQ
PHIL-GW
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
VLSA/USA
Toshiba/USA
Alphatec/Thailand
Hana/Thailand
APLUS/USA
Anam-Khangju/Korea
Gateway Electronics/Philippines
Page 3 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 11/6/99
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 11/6/99
RELIABILITY DATA SUMMARY
(Q399)
LONG TERM FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
125C
150C
FAILED
E2PROM TOTAL
0
TOTAL* @ 150C
0
0
FAMOS TOTAL
0
0
0
0
FLASH TOTAL
0
0
0
0
4,707,676
0
4,707,676
9
BICMOS TOTAL
0
0
0
0
LFR TOTAL
4,707,676
0
4,707,676
9
SRAM/LOGIC TOTAL
0
FAILURE MODE
1 PLASTIC PACKAGE DEFECT/1
SOLDERABILITY/1 EXCESS
INTERMETALLICS/3 UNKNOWN
CAUSE/2 GATE OXIDE RUPTURE/1
PARTICLE DEFECT/1 FA PENDING
1 PLASTIC PACKAGE DEFECT/1
SOLDERABILITY/1 EXCESS
INTERMETALLICS/3 UNKNOWN
CAUSE/2 GATE OXIDE RUPTURE/1
PARTICLE DEFECT/1 FA PENDING
EARLY FAILURE RATE SUMMARY
PROCESS
UNITS TESTED
125C
150C
E2PROM TOTAL
0
0
0
0
809
3,373
0
0
0
0
0
55,353
4,545
59,898
6
FLASH TOTAL
FAILURE MODE
TOTAL @ 150C
2,564
FAMOS TOTAL
SRAM/LOGIC TOTAL
FAILED
2 UNKOWN CAUSE/2 PARTICLE
DEFECTS/1 FAB DEFECT/1 FA PENDING
BICMOS TOTAL
0
0
0
0
EFR TOTAL
57,917
5,354
63,271
6
2 UNKOWN CAUSE/2 PARTICLE
DEFECTS/1 FAB DEFECT/1 FA PENDING
FAILED
FAILURE MODE
HTSSL FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
125C
150C
FAMOS TOTAL
0
TOTAL* @ 150C
0
0
FLASH TOTAL
0
0
0
0
26,800
0
26,800
0
0
0
0
0
26,800
0
26,800
0
SRAM/LOGIC TOTAL
BICMOS TOTAL
HTSSL TOTAL
Page 5 of
31
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 11/6/99
RELIABILITY DATA SUMMARY
(Q399)
TEMP CYCLE FAILURE RATE SUMMARY
PROCESS
E2PROM
150C
12,900
DEVICE CYCLE
125C
FAILED
TOTAL @ 150C
0
12,900
0
FAMOS TOTAL
141,600
0
141,600
0
FLASH TOTAL
67,500
0
67,500
0
821,800
216,000
877,960
2
BICMOS TOTAL
27,000
0
27,000
0
TC TOTAL
1,070,800
216,000
1,126,960
2
SRAM/LOGIC TOTAL
FAILURE MODE
∗
1 MISSING SOLDER BALL/1 UNKNOWN
CAUSE
1 MISSING SOLDER BALL/1 UNKNOWN
CAUSE
HAST FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
130C
140C
E2PROM
TOTAL* @ 140C
0
0
0
FAMOS TOTAL
23296
0
23296
0
FLASH TOTAL
5,760
0
5,760
0
128,128
12,160
134,585
1
11,392
0
11,392
0
168,576
12,160
175,033
1
SRAM/LOGIC TOTAL
BICMOS TOTAL
HAST TOTAL
PROCESS
FAMOS TOTAL
0
0
SRAM/LOGIC TOTAL
0
0
BICMOS TOTAL
0
0
0
0
PROCESS
E2PROM
0
FAMOS TOTAL
66,864
2
FLASH TOTAL
30,240
0
281,232
1
7,560
0
385,896
3
BICMOS TOTAL
PCT TOTAL
1 UNKNOWN CAUSE
1 UNKNOWN CAUSE
FAILURE MODE
PCT FAILURE RATE SUMMARY
DEVICE HOURS
FAILED
0
SRAM/LOGIC TOTAL
FAILURE MODE
LTOL FAILURE RATE SUMMARY
DEVICE HOURS
FAILED
0
0
FLASH TOTAL
LTOL TOTAL
∗
0
FAILED
FAILURE MODE
1 UNKNOWN CAUSE/1 BENT LEADS
1 OVER BOND/CRATERING
1 UNKNOWN CAUSE/1 BENT LEADS/1
OVER BOND/CRATERING
Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress conditions.
Page 6 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
BICMOS-SM1
CY7B991-JC
HAST
140/5.5V
DCD
CHNL
MR92125 9903 219900322
PSCB
BiCMOS TX
PLCC ALPHA-X
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
128
44
0
140C/5.5V
DCD
CHNL
CY7B991-JC
MR93213 9932 619922425 PSCB
BiCMOS TX PLCC ALPHA-X
32 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
CHNL
CY7B991-JC
MR93211 9932 619922425 PSCB
BiCMOS TX PLCC ALPHA-X
32 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
CHNL
CY7B991-JC
MR91117 9907 619903134
PSCB
BiCMOS TX
PLCC ALPHA-X
32
300
45
0
CY7B991-VC
MR92110 9830 219805230 PSCB
BiCMOS TX PLCC ALPHA-X
32 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 7 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
E2PROM-E3
TC2
-65C TO 150C
PLD
37K
CY37256P256-BGC MR92135 9904 619900830 256 MCEL
CMOS
TW BGA TAIWAN-G 292 300
43
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 8 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FAMOS-P20
HAST
140C/5.5V
PLD
MAX
CY7C341-JC
MR92174 9915 619908941 REPROG.PAL CMOS
TX PLCC KOREA-A
84 128
42
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
PLD
MAX
CY7C346-JC
99211
9924 619915399
REPROG.PAL
CMOS
TX
PLCC ALPHA-X
84
96
296
0 1 EOS
9931 619920149 REPROG.PAL CMOS
TX PLCC ALPHA-X
84
96
193
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
PLD
PLD
PALC22V10B-15PC MR93023 9925 519911235
REPROG. PAL CMOS
TX
PDIP INDNS-O
24
500
41
0 4 EOS
1000
41
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
MAX
CY7C341-JC
MR92172 9915 619908941
REPROG.PAL
CMOS
TX
PLCC KOREA-A
84
168
45
1 1 Unknown Cause
CY7C344-JI
MR93058 9927 619918944
REPROG.PAL
CMOS
TX
PLCC ALPHA-X
28
168
45
0
PLD
PALC22V10B-15PC MR93021 9925 519911235 REPROG. PAL CMOS
TX PDIP INDNS-O
24 168
40
0 5 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
MAX
CY7C344-JI
MR93059 9927 619918944
REPROG.PAL
CMOS
TX
PLCC ALPHA-X
28
300
45
0
PLD
PALC22V10B-15PC MR93022 9925 519911235 REPROG. PAL CMOS
TX PDIP INDNS-O
24 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 9 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P26
CY7C63001A-SC
MR93017 9926 619918207
USB
CMOS
TX
SOIC CSPI-R
20
128
45
0
CY7C63613-SC
MR93080 9928 619919235
USB
CMOS
TX
SOIC CSPI-R
24
128
45
0
HAST
140C/5.5V
IPD
USB
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C66113-PVC
99241
9925 619916424 FULL SP USB CMOS
TX SSOP CSPI-R
56 128
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
IPD
PCTRL
CY7C69100
98352
9852 519816422
MICROCTRL
FAMOS
TX
PDIP INDNS-O
24
48
48
48
33
446
525
0
0
0
USB
CY7C65113-SC
99277
9925 619915318
USB HUB
CMOS
TX
SOIC ALPHA-X
28
48
520
0
9928 519912085
USB HUB
CMOS
TX
SOIC INDNS-O
28
48
495
0
48
545
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V
PLD
MAX
CY7C342B-RMB
99279
9929 619919783 REPROG.PAL CMOS
TX WPGA ALPHA-X
68
96
320
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
IPD
PCTRL
CY7C69100
98352
USB
CY7C63001A-SC
9852 519816422
MICROCTRL
FAMOS
TX
PDIP INDNS-O
24
168
288
49
49
0
0
MR93015 9926 619918207
USB
CMOS
TX
SOIC CSPI-R
20
168
44
0
CY7C65113-SC
MR92166 9916 619910306
USB HUB
CMOS
TX
SOIC ALPHA-X
28
168
44
1 1 Bent Leads
CY7C66013-PVC
99274
FULL SP USB CMOS
TX
SSOP CSPI-R
48
168
48
0
9928 619919239
CY7C66113-PVC
99241
9925 619916424 FULL SP USB CMOS
TX SSOP CSPI-R
56 168
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
IPD
USB
CY7C66113-PVC
99241
9925 619916424
FULL SP USB CMOS
TX
SSOP CSPI-R
56
100
50
0
200
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
IPD
PCTRL
CY7C69100
98352
9852 519816422
MICROCTRL
FAMOS
TX
PDIP INDNS-O
24
300
50
0
USB
CY7C63001A-SC
MR93016 9926 619918207
USB
CMOS
TX
SOIC CSPI-R
20
300
45
0
CY7C63101A-SC
MR92069 9912 619906570
USB
CMOS
TX
SOIC CSPI-R
24
300
45
0
CY7C65113-SC
MR92167 9916 619910306
USB HUB
CMOS
TX
SOIC ALPHA-X
28
300
45
0
CY7C66013-PVC
99274
FULL SP USB CMOS
TX
SSOP CSPI-R
48
300
48
0
9928 619919239
Page 10 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P26
CY7C66113-PVC
TC2
-65C TO 150C
IPD
USB
99241
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9925 619916424
FULL SP USB CMOS
TX
SSOP CSPI-R
56
300
50
0
619916487
FULL SP USB CMOS
TX
SSOP CSPI-R
56
300
50
0
619916488 FULL SP USB CMOS
TX SSOP CSPI-R
56 300
49
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 11 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FLASH-FL28D
HAST
140C/5.5V
PLD
FLASH CY7C371-JC
MR92186 9916 619910273 32-MCEL FL CMOS
TX PLCC ALPHA-X
44 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
PLD
FLASH
CY7C371-AC
MR93047 9926 619917919
32-MCEL FL
CMOS
TX
TQFP KOREA-Q
44
500
1000
45
45
0
0
PLD
PALC22V10D-JC
MR93029 9924 619916273
FLASH ERAS. CMOS
TX
PLCC ALPHA-X
28
FLASH
CY7C371-AC
MR93044 9926 619917919
32-MCEL FL
CMOS
TX
TQFP KOREA-Q
44
168
45
0
CY7C375I-AC
MR93103 9927 619917921
128 MCEL FL CMOS
TX
TQFP KOREA-Q
160
168
45
0
PALC22V10D-7JC
MR93188 9930 519912784
FLASH ERAS. CMOS
TX
PLCC INDNS-O
28
168
45
0
500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
PLD
PALC22V10D-JC
MR93027 9924 619916273 FLASH ERAS. CMOS
TX PLCC ALPHA-X
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
FLASH
PLD
CY7C371-AC
MR93045 9926 619917919
32-MCEL FL
CMOS
TX
TQFP KOREA-Q
44
300
45
0
CY7C371-JC
MR92185 9916 619910273
32-MCEL FL
CMOS
TX
PLCC ALPHA-X
44
300
45
0
CY7C375I-AC
MR93104 9927 619917921
128 MCEL FL CMOS
TX
TQFP KOREA-Q
160
300
45
0
PALC22V10D-7JC
MR93189 9930 519912784
FLASH ERAS. CMOS
TX
PLCC INDNS-O
28
300
45
0
PALC22V10D-JC
MR93028 9924 619916273 FLASH ERAS. CMOS
TX PLCC ALPHA-X
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 12 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SMT
CYM1464PD
99307
9928 349900226
512K x 8 SM NA
NA
DIP
USA-AP
100
500
16
16
0
0
CYM1481LPS
99307
9928 349900221
2M x 8 SM
NA
NA
SIP
USA-AP
100
500
16
16
0
0
CYM1851PM
99307
9928 349900227
1M x 32 SM
NA
NA
SIM
USA-AP
TC
-40C TO 125C
MPD
MTI
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
100
16
0
500
16
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 13 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L27
PCT
121C/100%RH
IPD
FCT
CY74FCT2646ATQC MR92138 9917 619910754 8 BIT REG. CMOS
MN SSOP CSPI-R
24 168
42
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
IPD
FCT
CY74FCT162827TP MR92051 9915 619908472 10 BIT REG. CMOS
MN SSOP CSPI-R
56 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 14 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L28
HTOL
150C/3.8V
TTD
TTECH
CY2212PVC
PCT
121C/100%RH
IPD
FCT
TTD
TTECH
99057
9915 619909702
CMOS
TX
SOIC CSPI-R
48
48
118
0
48
298
0 1 EOS
48
299
0
48
299
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------CY74FCT2245ATPV MR91150 9906 619903166
8 BIT TRAN. CMOS
TX
SSOP MALAY-U
20
168
30
0
CY2212PVC
99057
CLOCK
CMOS
TX
SOIC CSPI-R
48
168
48
0
CY2277APAC
MR93039 9928 619918960
CLOCK SYN.
CMOS
TX
TSSO CSPI-R
48
168
45
0
CY2287PVC
MR93010 9927 619918212
CLOCK SYN.
CMOS
TX
SSOP CSPI-R
56
168
45
0
9915 619909702
CLOCK
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY2318PVC
MR93144 9930 619920598 CLOCK
CMOS
TX TSOP CSPI-R
48 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
IPD
TTD
FCT
TTECH
CY74FCT2245ATPV MR91151 9906 619903166
8 BIT TRAN. CMOS
TX
SSOP MALAY-U
20
300
43
0
CMOS
TX
SSOP MALAY-U
16
300
43
0
CMOS
TX
SOIC CSPI-R
48
300
48
0
CMOS
TX
TSSO CSPI-R
48
300
300
300
50
50
50
0
0
0
CMOS
TX
TSSO CSPI-R
48
300
45
0
CY74FCT257ATQC
MR91148 9904 619901722
CY2212PVC
99057
9915 619909702
CY2277APAC
99199
9918 619909832M CLOCK SYN.
MR93040 9928 619918960
CLOCK
CLOCK SYN.
CY2287PVC
MR93011 9927 619918212 CLOCK SYN. CMOS
TX SSOP CSPI-R
56 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 15 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L31
PCT
121C/100%RH
IPD
FCT
CY74FCT16244ATP MR92083 9804 349800047 16-BIT
CMOS
MN SSOP MALAY-U
48 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
IPD
FCT
CY74FCT16244ATP MR92084 9804 349800047 16-BIT
CMOS
MN SSOP MALAY-U
48 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 16 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
CY7C006-JC
MR93201 9929 619920470
16K x 8 DP
CMOS
TX
PLCC PHIL-M
68
CY7C024-JC
MR93195 9930 619919330
4K x 16 DP
CMOS
TX
PLCC KOREA-A
CY7C136-JC
MR93239 9929 519912467
2K x 8 DP
CMOS
TX
PLCC INDNS-O
CY7C136-JI
MR93067 9926 519910954
2K x 8 DP
CMOS
TX
COMDTY CY7C188-VC
MR92038 9914 619907801
32K x 9
CMOS
TX
HAST
140C/5.5V
DCD
MPD
DPORT
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------128
45
0
84
0
44
0
52
128
45
0
PLCC INDNS-O
52
128
45
0
SOJ
32
128
45
0
CSPI-R
CY7C195-VC
MR92193 9837 519807582 64K x 4
CMOS
MN SOJ INDNS-O
28 128
45
1 1 Unknown Cause
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
DCD
MPD
150C/6.5V
DCD
DPORT
CY7C136-JC
MR92204 9912 519903133
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
48
96
500
1000
150
150
150
150
0
0
0
0
FIFO
CY7C433-LM
99195
9918 619911057
4Kx9 FIFO
CMOS
TX
LCC
ALPHA-X
32
48
48
48
48
48
80
500
140
212
212
212
228
120
120
0
0
0
0
0
0
0
CY7C433-LMB
99195
9918 619911057
4Kx9 FIFO
CMOS
TX
LCC
ALPHA-X
32
184
48
0
CY7C454-LMB
99175
9919 619911754
4Kx9 FIFO
CMOS
TX
LCC
ALPHA-X
32
48
48
48
80
184
500
175
180
660
120
48
120
0
0
0
0
0
0
CY7C457-JC
99301
9907 519902406
2Kx18 FIFO
CMOS
TX
PLCC INDNS-O
52
48
48
299
584
0 6 EOS
0 6 EOS
COMDTY CY7C188-VC
99173
9914 619909331N 32K x 9
CMOS
TX
SOJ
CSPI-R
32
48
3156
0
9915 619909141N 32K x 9
CMOS
TX
SOJ
CSPI-R
32
48
3055
0
9923 619913693N 32K x 9
CMOS
TX
SOJ
CSPI-R
32
48
3125
0
9917 619910445Q 256x9 FIFO
CMOS
TX
PLCC ALPHA-X
32
48
623
0
FIFO
CY7C4201-JC
99172
Page 17 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
CY7C4241-JC
99172
9917 619910410Q 4Kx9 FIFO
CMOS
TX
PLCC USA-C
32
48
608
0
CY7C4245-JC
99172
9907 619902975
4Kx18 FIFO
CMOS
TX
PLCC PHIL-M
68
48
576
0
619902976
4Kx18 FIFO
CMOS
TX
PLCC PHIL-M
68
48
538
0 1 EOS
9917 619910524
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
430
1 1 EOS /1 Unknown Cause
619910524N 4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
118
0
619910525
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
240
0
619910525N 4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
48
108
228
0
0 1 EOS
619910526
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
311
0
619910526N 4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
287
0
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
144
0
619917340N 4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
48
48
48
421
432
481
0
0
0
9925 619916107N 8K x 16 DP
CMOS
TX
TQFP KOREA-Q
100
84
1055
0
619916108N 8K x 16 DP
CMOS
TX
TQFP KOREA-Q
100
84
84
421
638
0
0
619916300N 8K x 16 DP
CMOS
TX
TQFP KOREA-Q
100
HTOL
150C/6.5V
DCD
FIFO
CY7C4245V-ASC
99171
9926 619917340
150C/7.0V
DCD
DPORT
CY7C025-AC
99255
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
84
382
0
84
650
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
DCD
DPORT
CY7C136-JI
MR93068 9926 519910954
2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
DPORT
CY7C006-JC
MR93199 9929 619920470
16K x 8 DP
CMOS
TX
PLCC PHIL-M
68
168
45
0
CY7C024-JC
MR93193 9930 619919330
4K x 16 DP
CMOS
TX
PLCC KOREA-A
84
168
45
0
CY7C0251-AC
MR93171 9925 619915661
8K x 16 DP
CMOS
TX
TQFP TAIWAN-G 100
168
44
0
CY7C136-JI
MR93065 9926 519910954
2K x 8 DP
CMOS
TX
PLCC INDNS-O
168
45
0
Page 18 of
31
52
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
CY7C4211-AC
MR93205 9931 619919397
512x9 FIFO
CMOS
TX
TQFP KOREA-Q
32
168
43
0
CY7C433-AC
MR92207 9915 619908948
4Kx9 FIFO
CMOS
TX
TQFP KOREA-Q
32
168
45
0
PCT
121C/100%RH
DCD
FIFO
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MPD
COMDTY CY7C187-PC
MR93177 9929 619919172 SML/64K
CMOS
TX PDIP ALPHA-X
22 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
-65C TO 150C
DCD
DCD
FIFO
DPORT
99195
9918 619911057
4Kx9 FIFO
CMOS
TX
LCC
ALPHA-X
32
100
1000
50
48
0
0
CY7C433-LMB
99195
9918 619911057
4Kx9 FIFO
CMOS
TX
LCC
ALPHA-X
32
100
46
0
CY7C454-LMB
99175
9919 619911754
4Kx9 FIFO
CMOS
TX
LCC
ALPHA-X
32
100
1000
48
48
0
0
CY7C024-JC
MR93194 9930 619919330
4K x 16 DP
CMOS
TX
PLCC KOREA-A
84
300
45
0
CY7C0251-AC
MR93172 9925 619915661
8K x 16 DP
CMOS
TX
TQFP TAIWAN-G 100
300
45
0
CY7C136-JC
MR92201 9912 519903133
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
300
45
0
CY7C136-JI
MR93066 9926 519910954
2K x 8 DP
CMOS
TX
PLCC INDNS-O
52
300
45
0
CY7C433-AC
MR92208 9915 619908948
4Kx9 FIFO
CMOS
TX
TQFP KOREA-Q
32
300
45
0
COMDTY CY7C185-VI
MR92063 9909 619903571
SML/64K
CMOS
TX
SOJ
28
300
44
0
CY7C187-PC
MR93178 9929 619919172
SML/64K
CMOS
TX
PDIP ALPHA-X
22
300
45
0
FIFO
MPD
CY7C433-LM
CSPI-R
CY7C195-VC
MR92192 9827 519807582 64K x 4
CMOS
MN SOJ INDNS-O
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 19 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R31
TC2
-65C TO 150C
MPD
SYNC
CY7C1399-VI
MR91217 9910 619904878 32K x 8
CMOS
MN SOJ CSPI-R
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 20 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R32
HAST
140C/5.5V
MPD
COMDTY CY62256-SNC
MR92104 9915 519906723 32K x 8
CMOS
CA NSOI INDNS-O
28 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
MPD
COMDTY CY62256-SNC
MR84060 9837 519811387
32K x 8
CMOS
CA
NSOI INDNS-O
28
MR91101 9853 519900063
32K x 8
CMOS
CA
NSOI INDNS-O
28
48
96
500
1000
150
149
149
149
0
0
0
0
48
150
0
96
150
0
500
150
0
1000
150
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/6.5V
MPD
COMDTY CY62256-SNC
99309
9927 519911667 32K x 8
CMOS
CA NSOI INDNS-O
28
48 1530
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62256-SNC
MR92102 9915 519906723
32K x 8
CMOS
CA
NSOI INDNS-O
28
168
45
1 1 Overbond / Cratering
CY62256-SNI
MR93150 9929 519912201 32K x 8
CMOS
MN NSOI INDNS-O
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62256-SNC
99309
9927 519911667
32K x 8
CMOS
CA
NSOI INDNS-O
28
300
48
0
CY62256-SNI
MR93151 9929 519912201 32K x 8
CMOS
MN NSOI INDNS-O
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 21 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R32D HAST
140C/5.5V
MPD
COMDTY CY7C199-ZC
MR92005 9912 619906781 32K x 8(5V) CMOS
MN TSOP CSPI-R
28 128
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75
DCD
FIFO
CY7C466A-LM
99197
9917 619910469
64Kx9 FIFO
CMOS
MN
LCC
ALPHA-X
32
48
351
0
150C/5.75V
DCD
FIFO
CY7C466A-LM
99197
9917 619910469
64Kx9 FIFO
CMOS
MN
LCC
ALPHA-X
32
48
48
80
500
10
646
120
120
0
0
0
0
CY7C466A-LMB
99197
9917 619910469
64Kx9 FIFO
CMOS
MN
LCC
ALPHA-X
32
184
48
0
CSPI-R
28
48
150
0
96
150
0
500
130
1 1 Plastic Package Defect
1000
128
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C199-VC
MR91080 9903 619900012
32K x 8(5V) CMOS
MN
SOJ
DCD
FIFO
MR93157 9930 619919829
64Kx18 FIFO CMOS
MN
TQFP KOREA-Q
CY7C4285-ASC
64
168
45
0
MPD
COMDTY CY7C199-ZC
MR92003 9912 619906781 32K x 8(5V) CMOS
MN TSOP CSPI-R
28 168
44
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
-65C TO 150C
DCD
FIFO
CY7C466A-LM
99197
9917 619910469
64Kx9 FIFO
CMOS
MN
LCC
ALPHA-X
32
100
1000
50
50
0
0
CY7C466A-LMB
99197
9917 619910469
64Kx9 FIFO
CMOS
MN
LCC
ALPHA-X
32
100
47
0
DCD
FIFO
MPD
COMDTY CY7C199-ZC
CY7C4285-ASC
MR93158 9930 619919829
64Kx18 FIFO CMOS
MN
TQFP KOREA-Q
64
300
45
0
MR92004 9912 619906781
32K x 8(5V) CMOS
MN
TSOP CSPI-R
28
300
45
0
SYNC
CY7C1399-VC
MR91193 9911 619905946 32K x 8
CMOS
MN SOJ CSPI-R
28 300
41
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 22 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-R42
HAST
140C/3.63V
MPD
COMDTY CY7C62127V-BAI 99156
9915 619907694 1 MEG SRAM CMOS
MN SBGA TAIWAN-T 48 128
47
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
MPD
COMDTY CY7C62127V-BAI
99156
9917 619907693
1 MEG SRAM
CMOS
MN
SBGA TAIWAN-G
TAIWAN-T
48
48
500
800
120
120
0
0
619907695
1 MEG SRAM
CMOS
MN
SBGA TAIWAN-T
48
500
119
0
150C/5.75V
MPD
COMDTY CY7C62127V-BAI 99156
9917 619907695 1 MEG SRAM CMOS
MN SBGA TAIWAN-T 48 800
118
1 1 Solderability
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/6.5V
MPD
COMDTY CY62148-SC
99283
9917 619910358
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
723
0
9924 619915603
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
604
0
619915603L 512K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
1290
0
9927 619918072 512K x 8
CMOS
MN SOIC TAIWAN-G 32
48
398
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY7C62127V-BAI 99156
9917 619907695 1 MEG SRAM CMOS
MN SBGA TAIWAN-T 48 336
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C62127V-BAI
99156
9917 619907693
1 MEG SRAM
CMOS
MN
SBGA TAIWAN-T
48
168
48
0
TTD
TTECH CY2212SC
M99307
4916159-20 RAMBUS
CMOS
MN SOIC KOREA-A
16 168
100
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
MPD
COMDTY CY7C62127V-BAI 99156
9917 619907695 1 MEG SRAM CMOS
MN SBGA TAIWAN-T 48 100
48
0
200
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC
-40C TO 125C
MPD
COMDTY CY7C62127V-BAI
99156
9915 619907694
1 MEG SRAM
CMOS
MN
SBGA TAIWAN-T
48
500
1500
48
48
0
0
9917 619907693
1 MEG SRAM
CMOS
MN
SBGA TAIWAN-T
48
500
1500
48
48
0
0
619907695
1 MEG SRAM
CMOS
MN
SBGA TAIWAN-T
48
500
48
0
1500
48
1 1 Missing Solder Ball
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 23 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42D
HAST
140C/3.63V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1021V33-ZSC MR93138 9927 619916650
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
64K x16
CMOS
MN
TSOP KOREA-H
44
128
128
3
45
0
0
CY7C1333-AC
MR92097 9901 619817590
64K x 32
CMOS
MN
TQFP CSPI-R
100
128
44
0
CY7C1338-AC
MR93086 9928 619918771
128K x 32
CMOS
MN
TQFP CSPI-R
100
128
45
0
CY7C1353-AC
MR93099 9927 619917277
256K x 18
CMOS
MN
TQFP CSPI-R
100
128
45
0
SYNC
CY7C1334-AC
MR93092 9926 619917220 64K x 32
CMOS
MN TQFP CSPI-R
100 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
DCD
MPD
DPORT
CY7C028V-AC
COMDTY CY7C1021V33-VC
CY7C1049V33-VC
99243
9916 619909588
64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
349
0
9922 619913309
64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
349
0
9923 619914239
64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
349
0
MR84082 9845 619811706
64K x16
CMOS
MN
SOJ
CSPI-R
44
48
96
500
1000
150
150
126
126
0
0
0
1 1 Excess Intermetallics
99332
512K x 8
CMOS
MN
SOJ
CSPI-R
36
48
3334
9936 619923872
0
619923872N 512K x 8
CMOS
MN SOJ CSPI-R
36
48
960
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
MPD
COMDTY CY7C1325-AC
MR93035 9923 619908541 256K x 18
CMOS
MN TQFP CSPI-R
100 500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C1021V33-ZSC MR93136 9927 619916650
64K x16
CMOS
MN
TSOP KOREA-H
44
168
45
0
CY7C1325-AC
MR93033 9923 619908541
256K x 18
CMOS
MN
TQFP CSPI-R
100
168
44
0
CY7C1333-AC
MR92095 9901 619817590
64K x 32
CMOS
MN
TQFP CSPI-R
100
168
45
0
CY7C1338-AC
MR93084 9928 619918771
128K x 32
CMOS
MN
TQFP CSPI-R
100
168
45
0
CY7C1353-AC
MR93097 9927 619917277
256K x 18
CMOS
MN
TQFP CSPI-R
100
168
45
0
SYNC
CY7C1334-AC
MR93090 9926 619917220 64K x 32
CMOS
MN TQFP CSPI-R
100 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1021V33-ZSI MR91105 9842 619811676
Page 24 of
64K x16
31
CMOS
MN
TSOP KOREA-H
44
300
45
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R42D
TC2
-65C TO 150C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1021V33-ZSI MR92017 9909 619904569
SYNC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
64K x16
CMOS
MN
TSOP CSPI-R
44
300
45
0
CY7C1325-AC
MR93034 9923 619908541
256K x 18
CMOS
MN
TQFP CSPI-R
100
300
45
0
CY7C1333-AC
MR92096 9901 619817590
64K x 32
CMOS
MN
TQFP CSPI-R
100
300
45
0
CY7C1338-AC
MR93085 9928 619918771
128K x 32
CMOS
MN
TQFP CSPI-R
100
300
45
0
CY7C1353-AC
MR93098 9927 619917277
256K x 18
CMOS
MN
TQFP CSPI-R
100
300
45
0
CY7C1334-AC
M99239
64K x 32
CMOS
MN
TQFP CSPI-R
100
300
200
0
9909 619901398
MR93091 9926 619917220 64K x 32
CMOS
MN TQFP CSPI-R
100 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 25 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HAST
140C/5.5V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
COMDTY CY7C1009-VC
MR93005 9926 619916573
256K x 4
CMOS
MN
SOJ
CSPI-R
32
128
45
0
CY7C1021-VI
MR93125 9930 619919776
64K x16
CMOS
MN
SOJ
CSPI-R
44
128
45
0
CY7C1049-VCB
MR92076 9914 619905722
512K x 8
CMOS
MN
SOJ
CSPI-R
36
128
45
0
MR93118 9930 619918414
512K x 8
CMOS
MN
SOJ
CSPI-R
36
128
45
0
CY7C199-VC
MR93073 9929 619920539 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
DCD
DPORT
CY7C038-AC
MPD
COMDTY CY7C1009-VC
48
48
403
599
0
0
32
48
500
150
150
0
0
CSPI-R
44
48
1818
0
SOJ
CSPI-R
44
48
96
500
1000
150
150
150
150
0
0
0
0
MN
SOJ
INDNS-O
32
48
3290
0
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
48
96
500
1000
150
150
149
149
0
0
0
0
MR92120 9912 519905501
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
48
96
500
1000
150
150
149
1000
0
0
0
0
CY7C009-AC
99246
9922 619913312
128K x 8 DP CMOS
MN
TQFP TAIWAN-G 100
48
353
0
CY7C028-AC
99246
9919 619911166
64K x 16 DP CMOS
MN
TQFP TAIWAN-G 100
48
360
0
CY7C1021-VC
CY7C109-VC
150C/6.5V
DCD
DPORT
99182
9920 619912281
64K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
MR93007 9926 619916573
256K x 4
CMOS
MN
SOJ
CSPI-R
99194
9925 619913720
64K x16
CMOS
MN
SOJ
MR92047 9911 619816998
64K x16
CMOS
MN
99194
9928 519912164
128K x 8(5) CMOS
MR91073 9904 519901259
CY7C038-AC
99246
9915 619908933 64K x 18 DP CMOS
MN TQFP TAIWAN-G 100
48
354
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS2
150C/NO BIAS
MPD
COMDTY CY7C1009-VC
MR93006 9926 619916573
Page 26 of
256K x 4
31
CMOS
MN
SOJ
CSPI-R
32
500
1000
45
44
0
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HTS2
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
500
45
0
1000
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
150C/NO BIAS
MPD
COMDTY CY7C199-VC
MR93074 9929 619920539
32K x 8(5V) CMOS
MN
SOJ
CSPI-R
28
121C/100%RH
MPD
COMDTY CY7C1009-VC
MR93003 9926 619916573
256K x 4
CMOS
MN
SOJ
CSPI-R
32
168
45
0
CY7C1021-VI
MR93123 9930 619919776
64K x16
CMOS
MN
SOJ
CSPI-R
44
168
45
0
CY7C1049-VCB
MR93116 9930 619918414
512K x 8
CMOS
MN
SOJ
CSPI-R
36
168
45
0
CY7C109-ZC
MR93217 9928 619918244
128K x 8(5) CMOS
MN
SOJ
KOREA-GQ
32
168
44
0
CY7C199-VC
MR93071 9929 619920539 32K x 8(5V) CMOS
MN SOJ CSPI-R
28 168
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1009-VC
MR93004 9926 619916573
256K x 4
CMOS
MN
SOJ
CSPI-R
32
300
45
0
CY7C1021-VC
MR92044 9911 619816998
64K x16
CMOS
MN
SOJ
CSPI-R
44
300
44
0
CY7C1021-ZSC
99275
9905 619902605
64K x16
CMOS
MN
TSOP KOREA-H
44
300
50
0
619902799
64K x16
CMOS
MN
TSOP KOREA-H
44
300
49
0
9906 619903217
64K x16
CMOS
MN
TSOP KOREA-H
44
300
50
0
128K x 8(5) CMOS
MN
SOJ
32
300
50
0
CY7C109-VC
MR91071 9904 519901259
INDNS-O
MR92117 9912 519905501
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
45
0
CY7C109-ZC
MR92011 9908 619903670
128K x 8(5) CMOS
MN
SOJ
PHIL-GW
32
300
45
0
CY7C199-VC
MR91244 9908 619901753 32K x 8(5V) CMOS
MN SOJ ALPHA-X
28 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 27 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R52D
DPORT
CY7C057V-AC
DCD
DPORT
CY7C057V-AC
99202
9920 619912249
16/32K x 36 CMOS
MN
TQFP TAIWAN-G 144
128
47
0
MPD
COMDTY CY7C1329-AC
99311
9906 619902690
64K x 32
MN
TQFP CSPI-R
128
256
48
48
0
0
HAST
130/3.63V
130C/3.63V
DCD
99202
9930 619920052
16/32K x 36 CMOS
CMOS
MN
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
TQFP TAIWAN-G 144
100
128
48
0
9910 619903817 64K x 32
CMOS
MN TQFP CSPI-R
100 128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
DCD
MPD
DPORT
CY7C057V-AC
COMDTY CY7C1329-AC
99202
99311
150C/4.0V
DCD
DPORT
CY7C057V-AC
99202
150C/4.5V
MPD
COMDTY CY7C1329-AC
99311
9920 619912249
16/32K x 36 CMOS
MN
TQFP TAIWAN-G 144
80
500
389
385
0
1 1 Particle Defect
9930 619920052
16/32K x 36 CMOS
MN
TQFP TAIWAN-G 144
48
80
500
784
390
369
0
1 1 Fa Pending, 99202-2L1
1 1 Gate Oxide Rupture
(CDM)
9916 619909761
64K x 32
CMOS
MN
TQFP CSPI-R
100
80
500
1196
799
0
0
9918 619911324
64K x 32
CMOS
MN
TQFP CSPI-R
100
80
500
1491
1199
1 1 Unkown Cause
1 3 EOS/1 Unknown Cause
619911327
64K x 32
CMOS
MN
TQFP CSPI-R
100
80
500
1640
1451
0
1 1 EOS/ 1 Unkown Cause
16/32K x 36 CMOS
MN
TQFP TAIWAN-G 144
48
773
0
64K x 32
CMOS
MN
TQFP CSPI-R
100
48
48
997
1991
0
0
9916 619909761
64K x 32
CMOS
MN
TQFP CSPI-R
100
48
1205
0
9917 619909776
64K x 32
CMOS
MN
TQFP CSPI-R
100
48
871
0
9918 619911324
64K x 32
CMOS
MN
TQFP CSPI-R
100
48
1584
619911327
64K x 32
CMOS
MN
TQFP CSPI-R
100
48
1669
9849 619815465
64K x 32
CMOS
MN
TQFP CSPI-R
100
336
48
9920 619912249
1 1 Particle Defect
1 1 Fa Pending, FA993114BE1
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY7C1329-AC
99311
0
9851 619815797 64K x 32
CMOS
MN TQFP CSPI-R
100 336
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 28 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R52D
HTSSL
150C/3.63V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1329-AC
99311
9849 619815465
64K x 32
CMOS
MN
TQFP CSPI-R
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------100
80
168
80
80
0
0
9851 619815797 64K x 32
CMOS
MN TQFP CSPI-R
100
80
80
0
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
MPD
DPORT
CY7C057V-AC
COMDTY CY7C1329-AC
99202
99311
9920 619912249
16/32K x 36 CMOS
MN
TQFP TAIWAN-G 144
168
48
0
9930 619920052
16/32K x 36 CMOS
MN
TQFP TAIWAN-G 144
168
50
0
9906 619902690
64K x 32
MN
TQFP CSPI-R
168
48
0
CMOS
100
9910 619903817 64K x 32
CMOS
MN TQFP CSPI-R
100 168
46
0 2 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
DPORT
CY7C057V-AC
99202
9920 619912249
16/32K x 36 CMOS
MN
TQFP TAIWAN-G 144
300
48
1 1 Unknown Cause
MPD
COMDTY CY7C1329-AC
99311
9849 619815465
64K x 32
MN
TQFP CSPI-R
300
48
0
CMOS
100
9851 619815797 64K x 32
CMOS
MN TQFP CSPI-R
100 300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 29 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R52H
HTOL
150C/3.8V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY62128V-ZIB
99321
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
619912362/ 128K x 8
CMOS
MN
TSOP CSPI-R
32
48
80
1414
1411
1 1 Particle Defect
0
9924 619915039/ 128K x 8
CMOS
MN
TSOP CSPI-R
32
48
80
1433
1427
0
0
9926 619915042L 128K x 8
CMOS
MN
TSOP CSPI-R
32
48
467
0
80
466
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62128V-ZAIB
99302
9932 619921794 128K x 8
CMOS
MN STSO CSPI-R
32 168
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62128V-ZAIB
99302
9916 619906905
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
619906918
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
619907024
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
619907025
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
619907216
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
619907217
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
9917 619907218
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
619909463
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
9926 619916931
128K x 8
CMOS
MN
STSO CSPI-R
32
300
15
0
619917084 128K x 8
CMOS
MN STSO CSPI-R
32 300
15
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 30 of
31
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1999
Issued: 12/6/99
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1999
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R52LD HTOL
150C/3.8V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY62137VL-ZSIB
99261
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9923 619913469
128K x 16
CMOS
MN
TSOP CSPI-R
44
48
1783
0
619913470
128K x 16
CMOS
MN
TSOP CSPI-R
44
48
2456
0
9924 619913465
128K x 16
CMOS
MN
TSOP CSPI-R
44
48
2195
0
619913467
128K x 16
CMOS
MN
TSOP CSPI-R
44
48
2073
1 1 Fab Defect
619913696 128K x 16
CMOS
MN TSOP CSPI-R
44
48
709
1 1 Unknown Cause
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 31 of
31