Q1 - 2000

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 1, 2000
PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION
Ed Russell
Reliability Director
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued: 6/20/00
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
EFRA/LFRA
EFRA/LFRB
HTSSLA
HTSSLB
DRET
DRET2
PCT
HAST
TC1
TC2
TC3
HTS
High Temp Op Life, 150ºC, Dynamic 115% Vcc Nominal
High Temp Op Life, 125ºC, Dynamic 115% Vcc Nominal
High Temp Steady State Life, 150ºC, Static 115% Vcc Nominal
High Temp Steady State Life, 125ºC, Static 115% Vcc Nominal
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC/130ºC, 85%RH, Static 100% Vcc
Temp Cycle, 125ºC to -40ºC (Hermetic devices)
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 150ºC /165ºC, No Bias
Page 2 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued: 6/20/00
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
TW
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
TSMC, Taiwan
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-AK
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
CSPI-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
THLAND-Z
USA-AP
KOREA-GQ
PHIL-GW
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
VLSA/USA
Toshiba/USA
Alphatec/Thailand
Hana/Thailand
APLUS/USA
Anam-Khangju/Korea
Gateway Electronics/Philippines
Page 3 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued: 6/20/00
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Technology
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Fabrication process technology.
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued: 6/20/00
RELIABILITY DATA SUMMARY
(Q100)
LONG TERM FAILURE RATE SUMMARY
PROCESS
DEVICE HOURS
125C
0
FAILED
TOTAL @ 150C
78,960
0
E2PROM TOTAL
150C
78,960
CMOS-TSMC TOTAL
115,500
0
115,500
0
FAMOS TOTAL
0
0
0
0
FLASH TOTAL
0
0
0
0
1,379,068
0
1,379,068
5
0
0
0
0
1,573,528
0
1,573,528
5
SRAM/LOGIC TOTAL
BICMOS TOTAL
LFR TOTAL
FAILURE MODE
*
3 UNKNOWN/2 LOST DEVICE
3 UNKNOWN/2 LOST DEVICE
EARLY FAILURE RATE SUMMARY
PROCESS
UNITS TESTED
125C
0
FAILED
E2PROM TOTAL
150C
671
FAMOS TOTAL
0
0
0
0
FLASH TOTAL
0
0
0
0
46,203
0
46,203
6
0
0
0
0
46,874
0
46,874
6
SRAM/LOGIC TOTAL
BICMOS TOTAL
EFR TOTAL
TOTAL
671
0
FAILURE MODE
2 PARTICLES/2DESTROY DURING
ANALYSIS/2 POLY DEFECTS
2 PARTICLES/2DESTROY DURING
ANALYSIS/2 POLY DEFECTS
HTSSL FAILURE RATE SUMMARY
PROCESS
FAILED
TOTAL* @ 150C
0
0
FAMOS TOTAL
150C
0
FLASH TOTAL
0
0
0
0
12,936
0
12,936
0
0
0
0
0
12,936
0
12,936
0
SRAM/LOGIC TOTAL
BICMOS TOTAL
HTSSL TOTAL
*
DEVICE HOURS
125C
0
Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition.
Page 5 of 36
FAILURE MODE
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued: 6/20/00
RELIABILITY DATA SUMMARY
(Q100)
TEMP CYCLE FAILURE RATE SUMMARY
PROCESS
1000Cys
Condition C
587
UNITS TESTED
2000Cys Condition
B
392
CMOS-TSMC TOTAL
432
FAMOS TOTAL
FLASH TOTAL
E2PROM TOTAL
SRAM/LOGIC TOTAL
BICMOS TOTAL
TC TOTAL
FAILED
FAILURE MODE
TOTAL
979
0
0
432
0
90
0
90
0
975
0
975
0
3,875
565
4,440
14
87
0
87
0
6,046
957
7,003
14
2 OPEN BOND LIFT/8 TOPSIDE CRACK/2
OPEN HEEL/1 UNKNOWN/1 DESTROY
DURING ANALYSIS
FAILED
FAILURE MODE
2 OPEN BOND LIFT /8 TOPSIDE CRACK/2
OPEN HEEL/1 UNKNOWN/1 DESTROY
DURING ANALYSIS
HAST FAILURE RATE SUMMARY
PROCESS
140C
48
UNITS TESTED
130C
48
TOTAL
96
0
CMOS-TSMC TOTAL
0
96
96
0
FAMOS TOTAL
0
220
220
0
FLASH TOTAL
0
376
376
0
SRAM/LOGIC TOTAL
48
1,606
1,605
2
BICMOS TOTAL
0
45
45
0
96
2,391
2,487
2
E2PROM TOTAL
HAST TOTAL
Page 6 of
36
1 OPEN METAL/1 UNKNOWN
1 OPEN METAL/1 UNKNOWN
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued: 6/20/00
RELIABILITY DATA SUMMARY
(Q100)
PROCESS
E2PROM TOTAL
PCT FAILURE RATE SUMMARY
UNITS TESTED
FAILED
326
2
FAMOS TOTAL
313
0
FLASH TOTAL
629
0
2,128
3
45
0
3,115
5
SRAM/LOGIC TOTAL
BICMOS TOTAL
PCT TOTAL
Page 7 of
36
FAILURE MODE
2 SOLDERABILITY
2 UNKNOWN/1 DELAMINATION IN
TOPSIDE
2 SOLDERABILITY/2 UNKNOWN/1
DELAMINATION IN TOPSIDE
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: CMOS-TSMC
HAST
HTS
LFRA
T/C3
130C/5.5V
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
128
48
0
130C/5.5V
CPD
CLK
W49C65
99334
82703-800
TW
SSOP
CSPI-R
48
128
48
0
150C/N/A
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
500
48
0
150C/N/A
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
1000
48
0
150C/5.75V
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
80
77
0
150C/5.75V
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
500
77
0
150C/5.75V
CPD
CLK
W49C65
99334
82703-800
TW
SSOP
CSPI-R
48
80
77
0
150C/5.75V
CPD
CLK
W49C65
99334
82703-800
TW
SSOP
CSPI-R
48
500
77
0
150C/5.75V
CPD
CLK
W49C65
99334
82703-900
TW
SSOP
CSPI-R
48
80
77
0
150C/5.75V
CPD
CLK
W49C65
99334
82703-900
TW
SSOP
CSPI-R
48
500
77
0
150C/-65C
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
300
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
500
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-700
TW
SSOP
CSPI-R
48
1000
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-800
TW
SSOP
CSPI-R
48
300
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-800
TW
SSOP
CSPI-R
48
500
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-800
TW
SSOP
CSPI-R
48
1000
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-900
TW
SSOP
CSPI-R
48
300
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-900
TW
SSOP
CSPI-R
48
500
48
0
150C/-65C
CPD
CLK
W49C65
99334
82703-900
TW
SSOP
CSPI-R
48
1000
48
0
Page 8 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: BICMOS-SM1
HAST
130C/3.63
DCD
CHNL
CY7B991-JC
MR001130
0001 619938492
TX
PLCC
ALPHA-X
32
128
45
0
HTS
150C/N/A
DCD
CHNL
CY7B991-JC
MR94043
9938 619926775
TX
PLCC
ALPHA-X
32
500
45
0
PCT
121C/100%RH
DCD
CHNL
CY7B991-JC
MR001128
0001 619938492
TX
PLCC
ALPHA-X
32
168
45
0
T/C3
150C/-65C
DCD
CHNL
CY7B991-JC
MR001129
0001 619938492
TX
PLCC
ALPHA-X
32
300
45
0
150C/-65C
DCD
CHNL
CY7B9910-SC
MR94035
9940 519915425
TX
SOIC
INDNS-O
24
300
42
0
Page 9 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: E2PROM-E3
EFRA
150C/5.75V
PLD
37K
CY37128P84-YMB
99455
9949 619936306
TW
CLCC
ALPHA-X
84
48
671
HAST
130C/3.63V
PLD
37K
CY37256VP256-BBC 99473
0001 619937560
TW
FBGA
TAIWN-G
256
128
48
0
140C/5.5V
PLD
37K
CY37512P208-NC
99234
9903 619817611
TW
PQFP
TAIWN-G
208
128
48
0
HTS
165C/N/A
PLD
37K
CY37256VP256-BBC 99473
9926 619915336
TW
FBGA
TAIWN-G
256
336
48
0
LFRA
150C/5.75C
PLD
37K
CY37064P44-YMB
99456
0002 610000497
TW
CLCC
ALPHA-X
44
80
524
0 5 EOS
150C/5.75V
PLD
37K
CY37256P160-UMB
99457
9948 619935553
TW
CQFP
USA-GA
160
80
374
0 4 EOS
150C/5.75V
PLD
37K
CY37512P208-UM
99461
9950 619935690
TW
CQFP
USA-GA
208
80
89
0 3 Bent Leads
121C/100%RH
PLD
37K
CY37032P44-JC
MR001147
9950 619935277
TW
PLCC
KOREA-A
44
168
45
0
121C/100%RH
PLD
37K
CY37032VP44-AC
MR001247
0005 610001062
TW
TQFP
TAIWN-G
44
168
45
0
121C/100%RH
PLD
37K
CY37064VP100-AC
MR001241
0005 610001831
TW
TQFP
TAIWN-G
100
168
45
0
121C/100%RH
PLD
37K
CY37128P84-JC
99455
9947 619935274
TW
PLCC
KOREA-A
84
168
48
0
121C/100%RH
PLD
37K
CY37128P84-JC
MR94281
9948 619932550
TW
PLCC
KOREA-A
84
168
50
0
121C/100%RH
PLD
37K
CY37256VP256-BBC 99473
9926 619915336
TW
FBGA
TAIWN-G
256
168
48
2 2 Solderability
121C/100%RH
PLD
37K
CY37512P258-BGC
99461
9949 619935818
TW
BGA
TAIWN-G
292
168
45
0
150C/-65C
PLD
37K
CY37064P44-YMB
000606
0001 610000497
TW
CLCC
ALPHA-X
44
100
52
0
150C/-65C
PLD
37K
CY37064P44-YMB
000606
0001 610000497
TW
CLCC
ALPHA-X
44
1000
50
0
125C/-55C
PLD
37K
CY37128VP100-BBC 99473
0002 619938111
TW
FBGA
TAIWN-G
100
500
48
0
125C/-55C
PLD
37K
CY37128VP100-BBC 99473
0002 619938111
TW
FBGA
TAIWN-G
100
1500
48
0
125C/-55C
PLD
37K
CY37256VP256-BBC 99473
0001 619937560
TW
FBGA
TAIWN-G
256
500
50
0
125C/-55C
PLD
37K
CY37256VP256-BBC 99473
0001 619937560
TW
FBGA
TAIWN-G
256
1500
50
0
125C/-55C
PLD
37K
CY37256VP256-BBC 99473
0001 619937561
TW
FBGA
TAIWN-G
256
500
50
0
125C/-55C
PLD
37K
CY37256VP256-BBC 99473
0001 619937561
TW
FBGA
TAIWN-G
256
1500
50
0
PCT
T/C1
T/C2
Page 10 of
36
0 5 EOS
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: E2PROM-E3
T/C2
T/C3
125C/-55C
PLD
37K
CY37256VP256-BBC 99473
9949 619937559
TW
FBGA
TAIWN-G
256
500
48
0
125C/-55C
PLD
37K
CY37256VP256-BBC 99473
9949 619937559
TW
FBGA
TAIWN-G
256
1500
48
0
150C/-65C
PLD
37K
CY37128P84-JC
99455
9947 619935274
TW
PLCC
KOREA-A
84
300
48
0
150C/-65C
PLD
37K
CY37128P84-JC
99455
9947 619935274
TW
PLCC
KOREA-A
84
500
48
0
150C/-65C
PLD
37K
CY37128P84-JC
99455
9947 619935274
TW
PLCC
KOREA-A
84
1000
48
0
150C/-65C
PLD
37K
CY37128P84-JC
MR94280
9948 619932550
TW
PLCC
KOREA-A
84
300
50
0
150C/-65C
PLD
37K
CY37256P208-NC
MR94082
9932 619921607
TW
PQFP
TAIWN-G
208
300
45
0
150C/-65C
PLD
37K
CY37256VP160-AC
99502
0002 619939025
TW
TQFP
TAIWN-G
160
300
50
0
150C/-65C
PLD
37K
CY37256VP160-AC
99502
0002 619939026
TW
TQFP
TAIWN-G
160
300
50
0
150C/-65C
PLD
37K
CY37256VP160-AC
99502
0002 619939027
TW
TQFP
TAIWN-G
160
300
50
0
150C/-65C
PLD
37K
CY37512P258-BGC
99461
9949 619935818
TW
BGA
TAIWN-G
292
300
48
0
150C/-65C
PLD
37K
CY37512P258-BGC
99461
9949 619935818
TW
BGA
TAIWN-G
292
500
48
0
Page 11 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: FAMOS-P20
HAST
PCT
130C/5.5V
PLD
PLD
PALC22V10-JC
MR001117
9950 619937875
TX
PLCC
ALPHA-X
28
128
44
0
130C/5.5V
PLD
PLD
PALC22V10B-15PC
MR94236
9942 519916341
TX
PDIP
INDNS-O
24
128
45
0
121C/100%RH
PLD
MAX
CY7C344-PC
MR001002
9952 619938203
TX
PDIP
ALPHA-X
28
168
45
0
121C/100%RH
PLD
PLD
PALC22V10-JC
MR001115
9950 619937875
TX
PLCC
ALPHA-X
28
168
45
0
Page 12 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: FAMOS-P26
HAST
HTS
PCT
T/C3
130C/5.5V
IPD
USB
CY7C63000A-SC
MR94114
9944 619928386
TX
SOIC
CSPI-R
20
128
45
0
130C/5.5V
IPD
USB
CY7C63001A-SC
MR001204
0001 610000412
TX
SOIC
CSPI-R
20
128
41
0
130C/5.5V
IPD
USB
CY7C634121C-OC
MR001124
9950 619938008
TX
SSOP
CSPI-R
48
128
45
0
150C/N/A
IPD
USB
CY7C63000A-SC
MR94115
9944 619928386
TX
SOIC
CSPI-R
20
500
45
0
150C/N/A
IPD
USB
CY7C63001A-SC
MR001205
0001 610000412
TX
SOIC
CSPI-R
20
500
45
0
150C/N/A
IPD
USB
CY7C63001A-SC
MR93018
9926 619918207
TX
SOIC
CSPI-R
20
500
45
0
150C/N/A
IPD
USB
CY7C63001A-SC
MR93018
9926 619918207
TX
SOIC
CSPI-R
20
1000
42
0
150C/N/A
IPD
USB
CY7C634121C-OC
MR001125
9950 619938008
TX
SSOP
CSPI-R
48
500
45
0
150C/N/A
IPD
USB
CY7C63413-OC
MR94104
9941 619927219
TX
SSOP
CSPI-R
48
500
45
0
150C/N/A
IPD
USB
CY7C63413-SC
MR001070
9952 619937138
TX
SOIC
ALPHA-X
24
500
45
0
150C/N/A
IPD
USB
CY7C634131C-SC
MR001052
9952 619940066
TX
SOIC
CSPI-R
24
500
45
0
150C/N/A
IPD
USB
CY7C65113-SC
MR94098
9935 619924810
TX
SOIC
ALPHA-X
28
500
45
0
121C/100%RH
IPD
USB
CY7C63001A-SC
MR001202
0001 610000412
TX
SOIC
CSPI-R
20
168
45
0
121C/100%RH
IPD
USB
CY7C634121C-OC
MR001122
9950 619938008
TX
SSOP
CSPI-R
48
168
43
0
121C/100%RH
IPD
USB
CY7C63413-SC
MR001067
9952 619937138
TX
SOIC
ALPHA-X
24
168
45
0
121C/100%RH
IPD
USB
CY7C634131C-SC
MR001049
9952 619940066
TX
SOIC
CSPI-R
24
168
45
0
121C/100%RH
IPD
USB
CY7C65113-SC
MR94096
9935 619924810
TX
SOIC
ALPHA-X
28
168
45
0
150C/-65C
IPD
USB
CY7C63000A-SC
MR94113
9944 619928386
TX
SOIC
CSPI-R
20
300
45
0
150C/-65C
IPD
USB
CY7C63413-OC
MR94102
9941 619927219
TX
SSOP
CSPI-R
48
300
45
0
Page 13 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: FLASH-FL28D
HAST
130C/5.5V
PLD
FLASH
CY7C371-JC
MR001028
9949 619937632
TX
PLCC
ALPHA-X
44
128
34
0
130C/5.5V
PLD
FLASH
CY7C371-JC
MR001033
9949 619937632
TX
PLCC
ALPHA-X
44
128
45
0
130C/5.5V
PLD
FLASH
CY7C373I-JC
000102
9936 619925111
TX
PLCC
PHIL-M
84
100
54
0
130C/5.5V
PLD
FLASH
CY7C373I-JC
MR001023
9936 619925111
TX
PLCC
PHIL-M
84
128
54
0
130C/5.5V
PLD
FLASH
CY7C373I-JC
MR94061
9927 619918706
TX
PLCC
PHIL-M
84
128
45
0
130C/5.5V
PLD
FLASH
CY7C374I-JC
000203
9952 619937601
TX
PLCC
ALPHA-X
84
94
50
0
130C/5.5V
PLD
FLASH
CY7C375I-AC
000303
9918 619909347
TX
TQFP
TAIWN-G
160
128
25
0
130C/5.5V
PLD
PLD
PALC22V10D-JC
MR001019
9952 519919372
TX
PLCC
INDNS-O
28
128
45
0
HTS
165C/N/A
PLD
FLASH
CY7C375I-AC
000303
9918 619909347
TX
TQFP
TAIWN-G
160
336
50
0
PCT
121C/100%RH
PLD
FLASH
CY7C371-JC
MR001026
9949 619937632
TX
PLCC
ALPHA-X
44
168
45
0
121C/100%RH
PLD
FLASH
CY7C371-JC
MR001031
9949 619937632
TX
PLCC
ALPHA-X
44
168
45
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
000102
9927 619918706
TX
PLCC
PHIL-M
84
168
50
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
000102
9935 619923963
TX
PLCC
PHIL-M
84
168
52
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
000102
9945 619931928
TX
PLCC
PHIL-M
84
168
50
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
000203
9952 619937599
TX
PLCC
ALPHA-X
84
168
50
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
MR001007
9949 619936176
TX
PLCC
PHIL-M
84
168
45
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
MR001012
9949 619936176
TX
PLCC
PHIL-M
84
168
45
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
MR001021
9935 619923963
TX
PLCC
PHIL-M
84
168
52
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
MR94278
9946 619931928
TX
PLCC
PHIL-M
84
168
50
0
121C/100%RH
PLD
FLASH
CY7C373I-JC
MR94284
9929 619918706
TX
PLCC
PHIL-M
84
168
50
0
121C/100%RH
PLD
FLASH
CY7C374I-JC
000203
9952 619937601
TX
PLCC
ALPHA-X
84
168
50
0
Page 14 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: FLASH-FL28D
PCT
121C/100%RH
PLD
PLD
PALC22V10D-JC
MR001017
9952 519919372
TX
PLCC
INDNS-O
28
168
45
0
T/C3
150C/-65C
PLD
FLASH
CY7C371-JC
MR001027
9949 619937632
TX
PLCC
ALPHA-X
44
300
45
0
150C/-65C
PLD
FLASH
CY7C371-JC
MR001032
9949 619937632
TX
PLCC
ALPHA-X
44
300
45
0
150C/-65C
PLD
FLASH
CY7C373I-JC
000102
9927 619918706
TX
PLCC
PHIL-M
84
300
50
0
150C/-65C
PLD
FLASH
CY7C373I-JC
000102
9945 619931928
TX
PLCC
PHIL-M
84
300
50
0
150C/-65C
PLD
FLASH
CY7C373I-JC
000203
9952 619937599
TX
PLCC
ALPHA-X
84
300
50
0
150C/-65C
PLD
FLASH
CY7C373I-JC
000203
9952 619937600
TX
PLCC
ALPHA-X
84
300
50
0
150C/-65C
PLD
FLASH
CY7C373I-JC
MR001013
9949 619936176
TX
PLCC
PHIL-M
84
300
45
0
150C/-65C
PLD
FLASH
CY7C373I-JC
MR94277
9946 619931928
TX
PLCC
PHIL-M
84
300
50
0
150C/-65C
PLD
FLASH
CY7C373I-JC
MR94283
9929 619918706
TX
PLCC
PHIL-M
84
300
50
0
150C/-65C
PLD
FLASH
CY7C374I-JC
000203
9952 619937601
TX
PLCC
ALPHA-X
84
300
50
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909347
TX
TQFP
TAIWN-G
160
300
50
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909347
TX
TQFP
TAIWN-G
160
500
48
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909347
TX
TQFP
TAIWN-G
160
1000
48
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909600
TX
TQFP
TAIWN-G
160
300
50
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909600
TX
TQFP
TAIWN-G
160
500
50
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909600
TX
TQFP
TAIWN-G
160
1000
49
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909601
TX
TQFP
TAIWN-G
160
300
50
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909601
TX
TQFP
TAIWN-G
160
500
50
0
150C/-65C
PLD
FLASH
CY7C375I-AC
000303
9918 619909601
TX
TQFP
TAIWN-G
160
1000
50
0
150C/-65C
PLD
FLASH
CY7C375I-AC
MR94247
9945 619929003
TX
TQFP
KOREA-Q
160
300
45
0
Page 15 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-L20
T/C2
125C/-55C
DCD
VME
CY7C611A-NC
M99362
9924 619916051
TX
PQFP
ASAT-B
160
500
49
0
125C/-55C
DCD
VME
CY7C611A-NC
M99362
9924 619916051
TX
PQFP
ASAT-B
160
1000
46
2 2 Open- Bond Lift (Die)/1 EOS
125C/-55C
DCD
VME
CY7C611A-NC
M99362
9924 619916051
TX
PQFP
ASAT-B
160
1500
44
8 8 Topside Crack
Page 16 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-L27
HTS
165C/N/A
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
336
48
0
PCT
121C/100%RH/
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
168
48
1 1 Delamination in Topside
T/C3
150C/-65C
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
300
48
0
150C/-65C
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
1000
48
0
150C/-65C
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
300
48
0
150C/-65C
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
1000
48
0
150C/-65C
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
300
48
0
150C/-65C
DCD
PCLOG
CY82C693-NC
99234
9915 619909669
MN
PQFP
TAIWN-G
208
1000
48
0
Page 17 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-L28
EFRA
HAST
HTS
LFRA
PCT
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
48
334
0 1 EOS
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9940 619928659
TW
SSOP
CSPI-R
48
48
234
0
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9940 619928659
TW
SSOP
CSPI-R
48
48
101
0
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9945 619933793
TW
SSOP
CSPI-R
48
48
343
0 7 EOS
150C/5.75V
CPD
CLK
CY22037AES
000402
0004 610003291
TX
SOIC
CSPI-R
20
48
500
0
150C/5.75V
CPD
CLK
CY22037AES
000402
0004 610003291
TX
SOIC
CSPI-R
20
48
500
0
150C/5.75V
CPD
CLK
CY22037AES
001103
0004 610003291
TW
SOIC
CSPI-R
20
48
500
0
150C/5.75V
CPD
CLK
CY22037AES
001103
0004 610003291
TW
SOIC
CSPI-R
20
48
500
0
130C/3.63V
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
128
50
0
130C/3.63V
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
128
50
0
130C/3.63V
CPD
CLK
CY2280PVC-OC
99285
9940 619928659
TW
SSOP
CSPI-R
48
128
50
0
150C/3.63V
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
80
77
0
150C/3.63V
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
168
77
0
150C/N/A
CPD
CLK
CY2210PVC
MR001046
9945 619933123
TX
SSOP
CSPI-R
56
500
45
0
150C/N/A
CPD
CLK
CY2287PVC
MR94109
9936 619925423
TX
SSOP
CSPI-R
56
500
45
0
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
80
120
0
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
500
120
0
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9940 619928659
TW
SSOP
CSPI-R
48
80
120
0
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9940 619928659
TW
SSOP
CSPI-R
48
500
120
0
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9945 619933793
TW
SSOP
CSPI-R
48
80
123
0 2 EOS
150C/3.8V
CPD
CLK
CY2280PVC-OC
99285
9945 619933793
TW
SSOP
CSPI-R
48
500
123
0
121C/100%RH
CPD
CLK
CY2210PVC
MR001043
9945 619933123
TX
SSOP
CSPI-R
56
168
44
0
Page 18 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-L28
PCT
T/C3
121C/100%RH
CPD
CLK
CY2254ASC
MR001037
9949 619937357
TX
SOIC
CSPI-R
28
168
43
0
121C/100%RH
CPD
CLK
CY2277APAC
MR001061
9952 619939685
TX
TSOP
CSPI-R
48
168
44
0
121C/100%RH
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
168
53
0
121C/100%RH
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
168
53
0
121C/100%RH
CPD
CLK
CY2280PVC-OC
99285
9940 619928659
TW
SSOP
CSPI-R
48
168
50
0
121C/100%RH
IPD
FCY
CY74FCT377*TQC
MR001190
0002 610000660
TX
SSOP
CSPI-R
20
168
38
0
150C/-65C
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
300
50
0
150C/-65C
CPD
CLK
CY2280PVC-OC
99285
9938 619927291
TW
SSOP
CSPI-R
48
300
50
0
150C/-65C
CPD
CLK
CY2280PVC-OC
99285
9940 619928659
TW
SSOP
CSPI-R
48
300
50
0
150C/-65C
CPD
CLK
CY2280PVC-OC
99285
9945 619933793
TW
SSOP
CSPI-R
48
300
45
0
Page 19 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-L31
PCT
121C/100%RH
IPD
FCT
CY74FCT163543*PA MR001196
9952 619939264
Page 20 of
MN
36
TSOP
CSPI-R
56
168
44
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R28
HAST
HTS
PCT
T/C3
130C/5.5V
DCD
DPORT
CY7C024-AC
MR001162
0002 619938224
TX
TQFP
TAIWN-G
100
128
45
0
130C/5.5V
DCD
FIFO
CY7C4245-JC
MR001136
0002 619938073
TX
PLCC
PHIL-M
68
128
45
0
130C/5.5V
DCD
FIFO
CY7C4801-AC
99423
9948 619932227
TX
TQFP
TAIWN-G
64
128
50
0
130C/5.5V
DCD
FIFO
CY7C4801-AC
99423
9948 619932227
TX
TQFP
TAIWN-G
64
256
50
0
130C/5.5V
MPD
SRAM
CY7C188-VC
MR94005
9932 619922430
TX
SOJ
CSPI-R
32
128
44
1 1 EOS /1 Open Metal (Due to
Void)
130C/5.5V
MPD
SRAM
CY7C192-VC
MR001210
0002 619938503
TX
SOJ
ALPHA-X
28
128
45
0
150C/N/A
DCD
FIFO
CY7C420-PC
MR94259
9946 519915899
TX
PDIP
INDNS-O
28
500
45
0
150C/N/A
DCD
FIFO
CY7C421-VC
MR94264
9944 619930419
TX
SOJ
CSPI-R
28
500
45
0
150C/N/A
DCD
FIFO
CY7C4801-AC
99423
9948 619932227
TX
TQFP
TAIWN-G
64
500
50
0
150C/N/A
DCD
FIFO
CY7C4801-AC
99423
9948 619932227
TX
TQFP
TAIWN-G
64
1000
50
0
150C/N/A
MPD
SRAM
CY7C192-VC
MR001211
0002 619938503
TX
SOJ
ALPHA-X
28
500
45
0
121C/100%RH
DCD
DPORT
CY7C024-AC
MR001160
0002 619938224
TX
TQFP
TAIWN-G
100
168
45
0
121C/100%RH
DCD
DPORT
CY7C136-NC
MR001140
9950 619937010
TX
PQFP
ASAT-B
52
168
45
0
121C/100%RH
DCD
FIFO
CY7C421-VC
MR94262
9944 619930419
TX
SOJ
CSPI-R
28
168
45
0
121C/100%RH
DCD
FIFO
CY7C4245-JC
MR001134
0002 619938073
TX
PLCC
PHIL-M
68
168
45
1 1 Unknown
121C/100%RH
DCD
FIFO
CY7C4801-AC
99423
9948 619932227
TX
TQFP
TAIWN-G
64
168
50
0
121C/100%RH
MPD
SRAM
CY7C192-VC
MR001208
0002 619938503
TX
SOJ
ALPHA-X
28
168
45
0
150C/-65C
DCD
DPORT
CY7C024-AC
MR001161
0002 619938224
TX
TQFP
TAIWN-G
100
300
45
0
150C/-65C
DCD
DPORT
CY7C136-NC
99234
9946 619933453
CA
PQFP
ASAT-B
52
300
50
0
150C/-65C
DCD
DPORT
CY7C136-NC
99234
9947 619935705
CA
PQFP
TAIWN-G
52
300
50
0
150C/-65C
DCD
DPORT
CY7C136-NC
99234
9947 619935705
CA
PQFP
TAIWN-G
52
300
50
0
Page 21 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R28
T/C3
150C/-65C
DCD
DPORT
CY7C136-NC
99234
9947 619935705
CA
PQFP
TAIWN-G
52
300
50
0
150C/-65C
DCD
DPORT
CY7C136-NC
MR001141
9950 619937010
TX
PQFP
ASAT-B
52
300
45
0
150C/-65C
DCD
FIFO
CY7C420-PC
MR94258
9946 519915899
TX
PDIP
INDNS-O
28
300
45
0
150C/-65C
DCD
FIFO
CY7C421-VC
MR94263
9944 619930419
TX
SOJ
CSPI-R
28
300
45
0
150C/-65C
DCD
FIFO
CY7C4801-AC
99423
9948 619932226
TX
TQFP
TAIWN-G
64
300
49
0
150C/-65C
DCD
FIFO
CY7C4801-AC
99423
9948 619932227
TX
TQFP
TAIWN-G
64
300
50
0
150C/-65C
DCD
FIFO
CY7C4801-AC
99423
9948 619932228
TX
TQFP
TAIWN-G
64
300
50
0
150C/-65C
MPD
SRAM
CY7C188-VC
MR94004
9932 619922430
TX
SOJ
CSPI-R
32
300
45
0
150C/-65C
MPD
SRAM
CY7C192-VC
MR001209
0002 619938503
TX
SOJ
ALPHA-X
28
300
45
0
Page 22 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R32
EFRA
150C/5.75V
MPD
SRAM
CY62256-SNC
MR92106
9915 519906723
CA
SOIC
INDNS-O
28
48
149
0
HAST
130C/5.5V
MPD
SRAM
CY62128-ZI
MR94195
9940 619904071
MN
TSOP
TAIWN-G
32
128
39
0
LFRA
150C/5.75V
MPD
SRAM
CY62256-SNC
MR92106
9915 519906723
CA
SOIC
INDNS-O
28
96
148
1 1 Unknown Cause
150C/5.75V
MPD
SRAM
CY62256-SNC
MR92106
9915 519906723
CA
SOIC
INDNS-O
28
500
147
1 1 Unknown Cause
150C/-65C
MPD
SRAM
CY62256-SNC
MR94230
9942 619930304
CA
NSOIC CSPI-R
28
300
45
T/C3
Page 23 of
36
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42
HTS
PCT
T/C3
150C/N/A
MPD
SRAM
CY62127V-BAI
000204
619938873
MN
FPBGA CSPI-R
48
500
50
0
150C/N/A
MPD
SRAM
CY62127V-BAI
000204
619938873
MN
FPBGA CSPI-R
48
1000
50
0
121C/100%RH
MPD
SRAM
CY62127V-BAI
000204
619938675
MN
FPBGA CSPI-R
48
168
43
0
121C/100%RH
MPD
SRAM
CY62127V-BAI
000204
619938873
MN
FPBGA CSPI-R
48
168
46
0
150C/-65C
MPD
SRAM
CY62126V-ZSI
MR94140
9935 619922725
MN
TSOP II CSPI-R
44
300
50
0
150C/-65C
MPD
SRAM
CY62127V-BAI
000204
619938675
MN
FPBGA CSPI-R
48
300
45
0
150C/-65C
MPD
SRAM
CY62127V-BAI
000204
619938873
MN
FPBGA CSPI-R
48
300
47
0
Page 24 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42D
EFRA
HAST
HTS
LFRA
PCT
T/C3
150C/3.80
DCD
FIFO
CY7C4385-SI
MR93227
9933 619922486
MN
TQFP
150C/3.8V
MPD
SRAM
CY7C1020V33-ZSC
000501
0002 610001575
MN
150C/3.8V
MPD
SRAM
CY7C1049V33-VC
99358
9948 619934908
150C/3.8V
MPD
SRAM
CY7C1049V33-VC
99358
150C/3.8V
MPD
SRAM
CY7C1333-AC
130C/3.63
MPD
SRAM
130C/3.63V
MPD
130C/3.63V
64
48
143
0
TSOP II CSPI-R
44
48
6952
0
MN
SOJ
KOREA-L
36
48
3980
0
9948 619934909
MN
SOJ
KOREA-L
36
48
3387
0
MR92099
9901 619817590
MN
TQFP
CSPI-R
100
48
146
CY7C1021V33-VC
MR001185
0001 619938884
MN
SOJ
TAIWN-G
44
128
45
0
SRAM
CY7C1021V33-ZSC
MR001173
9950 619935798
MN
TSOP II KOREA-H
44
128
45
0
MPD
SRAM
CY7C1049V33-VC
MR001231
0003 619939542
MN
SOJ
CSPI-R
36
128
45
0
150C/N/A
MPD
SRAM
CY7C1021V33-VC
MR001186
0001 619938884
MN
SOJ
TAIWN-G
44
500
45
0
150C/N/A
MPD
SRAM
CY7C1021V33-ZSC
MR001174
9950 619935798
MN
TSOP II KOREA-H
44
500
45
0
150C/N/A
MPD
SRAM
CY7C1049V33-VC
MR001232
0003 619939542
MN
SOJ
CSPI-R
36
500
45
0
150C/N/A
MPD
SRAM
CY7C1049V33-VC
MR94243
9945 619929938
MN
SOJ
CSPI-R
36
500
45
0
150C/N/A
MPD
SRAM
CY7C1334-AC
MR94202
9941 619927329
MN
TQFP
CSPI-R
100
500
45
0
150C/3.80V
DCD
FIFO
CY7C4385-SI
MR93227
9933 619922486
MN
TQFP
KOREA-Q
64
500
143
0
150C/3.8V
MPD
SRAM
CY7C1333-AC
MR92099
9901 619817590
MN
TQFP
CSPI-R
100
96
143
0 3 EOS
150C/3.8V
MPD
SRAM
CY7C1333-AC
MR92099
9901 619817590
MN
TQFP
CSPI-R
100
500
142
0
121C/100%RH
MPD
SRAM
CY7C1021V33-VC
MR001183
0001 619938884
MN
SOJ
TAIWN-G
44
168
45
0
121C/100%RH
MPD
SRAM
CY7C1021V33-ZSC
MR001171
9950 619935798
MN
TSOP II KOREA-H
44
168
45
0
121C/100%RH
MPD
SRAM
CY7C1049V33-VC
MR001229
0003 619939542
MN
SOJ
CSPI-R
36
168
45
0
121C/100%RH
MPD
SRAM
CY7C1345-AC
MR001235
9952 619937704
MN
TQFP
CSPI-R
100
168
45
0
150C/-65C
MPD
SRAM
CY7C1021V33-VC
MR001184
0001 619938884
MN
SOJ
TAIWN-G
44
300
45
0
150C/-65C
MPD
SRAM
CY7C1021V33-ZSC
MR001172
9950 619935798
MN
TSOP II KOREA-H
44
300
45
0
Page 25 of
36
KOREA-Q
0 2 EOS
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42D
T/C3
150C/-65C
MPD
SRAM
CY7C1049V33-VC
MR001230
0003 619939542
MN
SOJ
CSPI-R
36
300
45
0
150C/-65C
MPD
SRAM
CY7C1049V33-VC
MR94241
9945 619929938
MN
SOJ
CSPI-R
36
300
45
0
150C/-65C
MPD
SRAM
CY7C1334-AC
MR94200
9941 619927329
MN
TQFP
CSPI-R
100
300
44
0
150C/-65C
MPD
SRAM
CY7C1345-AC
MR94136
9941 619924444
MN
TQFP
CSPI-R
100
300
50
0
150C/-65C
MPD
SRAM
CY7C1345-AC
MR94137
9941 619924444
MN
TQFP
CSPI-R
100
300
47
0
150C/-65C
MPD
SRAM
CY7C1352-AC
MR94134
9939 619913649
MN
TQFP
CSPI-R
100
300
46
0
Page 26 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42H
EFRA
150C/5.75
MPD
SRAM
CY62128-ZAC
MR91134
9829 619807930
MN
STSOP CSPI-R
32
48
148
HAST
130C/5.5V
MPD
SRAM
C62128A-ZAI
MR94273
9938 619926232
MN
STSOP CSPI-R
32
128
45
0
130C/5.5V
MPD
SRAM
CY62128-SC
MR001098
9952 619937646
MN
SOIC
CSPI-R
32
128
45
0
130C/5.5V
MPD
SRAM
CY62256-SNC
MR001167
9949 619935207
MN
NSOIC CSPI-R
28
128
38
0
130C/5.5V
MPD
SRAM
CY62256-SNI
MR94182
9942 519915797
MN
SOIC
28
128
30
0
150C/N/A
MPD
SRAM
C62128A-ZAI
MR94274
9938 619926232
MN
STSOP CSPI-R
32
500
45
0
150C/N/A
MPD
SRAM
CY62128-SC
MR001099
9952 619937646
MN
SOIC
CSPI-R
32
500
44
0
150C/N/A
MPD
SRAM
CY62128-ZAC
MR001076
0001 619938583
MN
STSOP CSPI-R
32
500
45
0
150C/N/A
MPD
SRAM
CY62256-SNC
MR001168
9949 619935207
MN
NSOIC CSPI-R
28
500
45
0
150C/N/A
MPD
SRAM
CY62256-SNC
MR001219
0005 510000798
MN
NSOIC INDNS-O
28
500
45
0
150C/N/A
MPD
SRAM
CY62256-ZC
MR001111
9952 619938545
MN
TSOP
CSPI-R
28
500
45
0
150C/5.75
MPD
SRAM
CY62128-ZAC
MR91134
9829 619807930
MN
STSOP CSPI-R
32
96
146
0
150C/5.75
MPD
SRAM
CY62128-ZAC
MR91134
9829 619807930
MN
STSOP CSPI-R
32
500
142
0
121C/100%RH
MPD
SRAM
C62128A-ZAI
MR94271
9938 619926232
MN
STSOP CSPI-R
32
168
45
0
121C/100%RH
MPD
SRAM
CY62128-SC
MR001096
9952 619937646
MN
SOIC
CSPI-R
32
168
44
0
121C/100%RH
MPD
SRAM
CY62128-ZAC
MR001073
0001 619938583
MN
STSOP CSPI-R
32
168
45
0
121C/100%RH
MPD
SRAM
CY62256-SNC
MR001165
9949 619935207
MN
NSOIC CSPI-R
28
168
38
0
121C/100%RH
MPD
SRAM
CY62256-SNC
MR001216
0005 510000798
MN
NSOIC INDNS-O
28
168
45
0
121C/100%RH
MPD
SRAM
CY62256-ZC
MR001108
9952 619938545
MN
TSOP
CSPI-R
28
168
45
0
150C/-65C
MPD
SRAM
C62128A-ZAI
MR94272
9938 619926232
MN
STSOP CSPI-R
32
300
45
0
150C/-65C
MPD
SRAM
CY62128-SC
MR001097
9952 619937646
MN
SOIC
CSPI-R
32
300
45
1 1 Unknown
150C/-65C
MPD
SRAM
CY62128-ZAC
MR001074
0001 619938583
MN
STSOP CSPI-R
32
300
45
0
HTS
LFRA
PCT
T/C3
Page 27 of
36
INDNS-O
0 1 EOS
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42H
T/C3
150C/-65C
MPD
SRAM
CY62256-SNC
MR001166
9949 619935207
MN
NSOIC CSPI-R
28
300
45
0
150C/-65C
MPD
SRAM
CY62256-SNC
MR001217
0005 510000798
MN
NSOIC INDNS-O
28
300
45
0
150C/-65C
MPD
SRAM
CY62256-SNI
MR94181
9942 519915797
MN
SOIC
INDNS-O
28
300
45
0
150C/-65C
MPD
SRAM
CY62256-ZC
MR001109
9952 619938545
MN
TSOP
CSPI-R
28
300
45
0
Page 28 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42HD
EFRA
HAST
HTS
150C/5.75
MPD
SRAM
CY7C199-VC
MR93075
9929 619920539
MN
SOJ
CSPI-R
28
48
150
0
150C/5.75V
MPD
SRAM
CY7C1049-VCB
99452
9946 619934257
MN
SOJ
CSPI-R
36
48
1099
0
150C/5.75V
MPD
SRAM
CY7C109-VC
99452
9947 519918323
MN
SOJ
INDNS-O
32
48
3073
0
150C/5.75V
MPD
SRAM
CY7C109-VC
99452
9947 519918324
MN
SOJ
INDNS-O
32
48
2945
1 1 Particle Defect
150C/5.75V
MPD
SRAM
CY7C109-VC
99452
9947 519918326
MN
SOJ
INDNS-O
32
48
1952
2 2 Destroyed During Analysis
130C/5.5V
MPD
SRAM
CY7C1009-VC
MR001082
9951 619936395
MN
SOJ
CSPI-R
32
128
45
0
130C/5.5V
MPD
SRAM
CY7C1020-VC
MR94091
9933 619922192
MN
SOJ
TAIWN-G
44
128
41
0
130C/5.5V
MPD
SRAM
CY7C1020-ZSC
MR001155
0002 610000702
MN
TSOP II CSPI-R
44
128
45
1 1 UNKNOWN
130C/5.5V
MPD
SRAM
CY7C1049-VCB
99452
9946 619934257
MN
SOJ
CSPI-R
36
128
47
0
130C/5.5V
MPD
SRAM
CY7C109-VIB
99112
9932 519913378
MN
SOJ
INDNS-O
32
128
50
0
130C/5.5V
MPD
SRAM
CY7C109-ZC
99511
9952 619939442
MN
TSOP
TAIWN-T
32
128
50
0
130C/5.5V
MPD
SRAM
CY7C199-VC
000405
9949 619936486
MN
SOJ
CSPI-R
28
128
45
0
130C/5.5V
MPD
SRAM
CY7C199-VC
000405
9949 619936849
MN
SOJ
CSPI-R
28
128
46
0
130C/5.5V
MPD
SRAM
CY7C199-VC
000405
9949 619936855
MN
SOJ
CSPI-R
28
128
45
0
130C/5.5V
MPD
SRAM
CY7C199-VC
MR94189
9942 619929685
MN
TSOP
CSPI-R
28
128
41
0 2-EOS
130C/5.5V
MPD
SRAM
CY7C199-VI
MR001255
0006 610004663
MN
SOJ
CSPI-R
28
128
45
0
140C/5.5V
MPD
SRAM
CY7C109-VC
99112
9915 619906538
MN
SOJ
INDNS-O
32
128
48
0
150C/N/A
DCD
DPORT
CY7C09379V-AC
MR94029
9932 619921143
MN
TQFP
TAIWN-G
100
500
43
0
150C/N/A
MPD
SRAM
CY7C1009-VC
MR001083
9951 619936395
MN
SOJ
CSPI-R
32
500
45
0
150C/N/A
MPD
SRAM
CY7C1020-ZSC
MR001156
0002 610000702
MN
TSOP II CSPI-R
44
500
45
0
150C/N/A
MPD
SRAM
CY7C109-VC
MR001105
9950 519919324
MN
SOJ
INDNS-O
32
500
45
0
150C/N/A
MPD
SRAM
CY7C109-VC
MR94176
9942 519916020
MN
SOJ
INDNS-O
32
500
45
0
Page 29 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42HD
HTS
150C/N/A
MPD
SRAM
CY7C109-ZC
99511
619939442
MN
TSOP
TAIWN-T
32
500
52
0
150C/N/A
MPD
SRAM
CY7C109-ZC
99511
619939442
MN
TSOP
TAIWN-T
32
1000
52
0
165C/N/A
MPD
SRAM
CY7C109-VC
99112
9915 619906538
MN
SOJ
INDNS-O
32
336
48
0
165C/N/A
MPD
SRAM
CY7C109-VIB
99112
9932 519913378
MN
SOJ
INDNS-O
32
336
50
0
165C/N/A
MPD
SRAM
CY7C109-VIB
99112
9932 519913378
MN
SOJ
INDNS-O
32
1000
50
0
LFRA
150C/5.75
MPD
SRAM
CY7C199-VC
MR93075
9929 619920539
MN
SOJ
CSPI-R
28
500
150
PCT
121C/100%RH
MPD
SRAM
CY7C1009-VC
MR001080
9951 619936395
MN
SOJ
CSPI-R
32
168
45
0
121C/100%RH
MPD
SRAM
CY7C1020-ZSC
MR001153
0002 610000702
MN
TSOP II CSPI-R
44
168
45
1 1 Unknown Cause
121C/100%RH
MPD
SRAM
CY7C1049-VCB
99452
9946 619934257
MN
SOJ
CSPI-R
36
168
47
0
121C/100%RH
MPD
SRAM
CY7C109-VC
MR001102
9950 519919324
MN
SOJ
INDNS-O
32
168
45
0
121C/100%RH
MPD
SRAM
CY7C109-ZC
99511
0002 619939441
MN
TSOP
TAIWN-T
32
168
48
0
121C/100%RH
MPD
SRAM
CY7C109-ZC
99511
0002 619939442
MN
TSOP
TAIWN-T
32
168
50
0
121C/100%RH
MPD
SRAM
CY7C109-ZC
99511
0002 619939443
MN
TSOP
TAIWN-T
32
168
50
0
121C/100%RH
MPD
SRAM
CY7C199-VC
000405
9949 619936955
MN
SOJ
CSPI-R
28
168
50
0
121C/100%RH
MPD
SRAM
CY7C199-VC
000405
9949 619936957
MN
SOJ
CSPI-R
28
168
50
0
121C/100%RH
MPD
SRAM
CY7C199-VC
000405
9952 619939305
MN
SOJ
CSPI-R
28
168
50
0
150C/-65C
DCD
DPORT
CY7C09379V-AC
MR94028
9932 619921143
MN
TQFP
TAIWN-G
100
300
43
0
150C/-65C
MPD
SRAM
CY7C1009-VC
MR001081
9951 619936395
MN
SOJ
CSPI-R
32
300
45
0
150C/-65C
MPD
SRAM
CY7C1020-VC
MR94090
9933 619922192
MN
SOJ
TAIWN-G
44
300
45
0
150C/-65C
MPD
SRAM
CY7C1021-VI
MR93124
9930 619919776
MN
SOJ
CSPI-R
44
300
45
0
150C/-65C
MPD
SRAM
CY7C1041-VC
MR94146
9939 619927406
MN
SOJ
CSPI-R
44
300
47
0
150C/-65C
MPD
SRAM
CY7C1049-VCB
99452
9946 619934257
MN
SOJ
CSPI-R
36
300
48
0
T/C3
Page 30 of
36
1 1 Unknown Cause
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42HD
T/C3
150C/-65C
MPD
SRAM
CY7C1049-VCB
99452
9946 619934257
MN
SOJ
CSPI-R
36
500
48
0
150C/-65C
MPD
SRAM
CY7C1049-VCB
99452
9946 619934257
MN
SOJ
CSPI-R
36
1000
47
0
150C/-65C
MPD
SRAM
CY7C109-VC
99112
9915 619906538
MN
SOJ
INDNS-O
32
300
46
0
150C/-65C
MPD
SRAM
CY7C109-VC
99112
9915 619906538
MN
SOJ
INDNS-O
32
1000
46
0
150C/-65C
MPD
SRAM
CY7C109-VC
MR001103
9950 519919324
MN
SOJ
INDNS-O
32
300
45
0
150C/-65C
MPD
SRAM
CY7C109-VC
MR94174
9942 519916020
MN
SOJ
INDNS-O
32
300
45
0
150C/-65C
MPD
SRAM
CY7C109-VIB
99112
9916 619906498
MN
SOJ
INDNS-O
32
300
46
0
150C/-65C
MPD
SRAM
CY7C109-VIB
99112
9932 519913378
MN
SOJ
INDNS-O
32
300
50
0
150C/-65C
MPD
SRAM
CY7C109-VIB
99112
9932 519913378
MN
SOJ
INDNS-O
32
500
50
0
150C/-65C
MPD
SRAM
CY7C109-VIB
99112
9932 519913378
MN
SOJ
INDNS-O
32
1000
50
0
150C/-65C
MPD
SRAM
CY7C109-ZC
99511
0002 619939441
MN
TSOP
TAIWN-T
32
300
48
0
150C/-65C
MPD
SRAM
CY7C109-ZC
99511
0002 619939442
MN
TSOP
TAIWN-T
32
300
50
0
150C/-65C
MPD
SRAM
CY7C109-ZC
99511
0002 619939443
MN
TSOP
TAIWN-T
32
300
50
0
150C/-65C
MPD
SRAM
CY7C1351-AC
MR94131
9932 619919041
MN
TQFP
CSPI-R
100
300
47
2 2 Open- Heel or Neck Break
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936486
MN
SOJ
CSPI-R
28
300
48
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936849
MN
SOJ
CSPI-R
28
300
50
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936855
MN
SOJ
CSPI-R
28
300
50
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936859
MN
SOJ
CSPI-R
28
300
50
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936895
MN
SOJ
CSPI-R
28
300
50
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936955
MN
SOJ
CSPI-R
28
300
47
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936956
MN
SOJ
CSPI-R
28
300
50
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936957
MN
SOJ
CSPI-R
28
300
50
0
Page 31 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R42HD
T/C3
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619936966
MN
SOJ
CSPI-R
28
300
50
0
150C/-65C
MPD
SRAM
CY7C199-VC
000405
9949 619937048
MN
SOJ
CSPI-R
28
300
49
0
Page 32 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R52D-3
EFRA
HAST
LFRA
PCT
T/C3
150C/3.8V
DCD
DPORT
CY7C056V-ACB
99491
9946 619932870
MN
TQFP
TAIWN-G
100
48
80
0
150C/3.8V
MPD
SRAM
CY7C1325B-ACB
99503
619927801
MN
TQFP
CSPI-R
100
48
1799
0
150C/3.8V
MPD
SRAM
CY7C1338B-AC
99503
9946 619934137
MN
TQFP
CSPI-R
100
48
1500
0
130C/3.63V
MPD
SRAM
CY7C1049BV33-VC
000305
9936 619925327
MN
SOJ
CSPI-R
36
128
50
0
130C/3.63V
MPD
SRAM
CY7C1325B-ACB
99503
9918 619910139
MN
TQFP
CSPI-R
100
128
47
0
150C/3.8V
MPD
SRAM
CY7C1049BV33-VC
000305
9949 619937741
MN
SOJ
CSPI-R
36
80
530
0
150C/3.8V
MPD
SRAM
CY7C1049BV33-VC
000305
9949 619937741
MN
SOJ
CSPI-R
36
500
530
0
150C/3.8V
MPD
SRAM
CY7C1325B-ACB
99503
619927801
MN
TQFP
CSPI-R
100
80
400
0
150C/3.8V
MPD
SRAM
CY7C1325B-ACB
99503
619927801
MN
TQFP
CSPI-R
100
500
400
2 2 Lost Device
150C/3.8V
MPD
SRAM
CY7C1338B-AC
99503
9946 619934137
MN
TQFP
CSPI-R
100
80
400
0
150C/3.8V
MPD
SRAM
CY7C1338B-AC
99503
9946 619934137
MN
TQFP
CSPI-R
100
500
400
0
121C/100%RH
MPD
SRAM
CY7C1049BV33-VC
000305
9936 619925327
MN
SOJ
CSPI-R
36
168
48
0
121C/100%RH
MPD
SRAM
CY7C1325B-ACB
99503
9914 619907775
MN
TQFP
CSPI-R
100
168
47
0
121C/100%RH
MPD
SRAM
CY7C1329-AC
MR001222
0004 610000079
MN
TQFP
TAIWN-G
100
168
45
0
150C/-65C
MPD
SRAM
CY7C1049BV33-VC
000305
9936 619925327
MN
SOJ
CSPI-R
36
300
48
0
150C/-65C
MPD
SRAM
CY7C1049BV33-VC
000305
9936 619925327
MN
SOJ
CSPI-R
36
500
48
0
150C/-65C
MPD
SRAM
CY7C1049BV33-VC
000305
9936 619925327
MN
SOJ
CSPI-R
36
1000
48
0
150C/-65C
MPD
SRAM
CY7C1325B-ACB
99503
9914 619907775
MN
TQFP
CSPI-R
100
300
40
0 7 EOS
150C/-65C
MPD
SRAM
CY7C1325B-ACB
99503
9918 619910139
MN
TQFP
CSPI-R
100
300
47
0
150C/-65C
MPD
SRAM
CY7C1325B-ACB
99503
9918 619910139
MN
TQFP
CSPI-R
100
500
47
0
150C/-65C
MPD
SRAM
CY7C1325B-ACB
99503
9918 619910139
MN
TQFP
CSPI-R
100
1000
47
0
Page 33 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R52H
EFRA
150C/3.8V
MPD
SRAM
CY62128B-SC
001102
0009 610006394
MN
SOIC
TAIWN-G
32
48
1090
0 1 Good Device
150C/3.8V
MPD
SRAM
CY62128B-SC
001102
0009 610006395
MN
SOIC
TAIWN-G
32
48
1074
0
150C/3.8V
MPD
SRAM
CY62128B-SC
001102
0009 610007711
MN
SOIC
TAIWN-G
32
48
1088
0
150C/3.8V
MPD
SRAM
CY62128B-SC
001102
9947 619933589
MN
SOIC
TAIWN-G
32
48
1098
0
150C/3.8V
MPD
SRAM
CY62128B-SC
001102
9947 619933593
MN
SOIC
TAIWN-G
32
48
2186
2 2 Poly Defect
150C/3.8V
MPD
SRAM
CY62128B-SC
001102
9947 619933598
MN
SOIC
TAIWN-G
32
48
1097
0
Page 34 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R52LD-3
EFRA
HAST
HTS
LFRA
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
610002413
MN
FPBGA CSPI-R
48
48
544
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938755
MN
FPBGA CSPI-R
48
48
339
1 1 Particle Defect
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938874
MN
FPBGA CSPI-R
48
48
402
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938875
MN
FPBGA CSPI-R
48
48
281
0
150C/3.8V
MPD
SRAM
CY62137VL-ZSIB
99357
9949 619935917
MN
TSOP II CSPI-R
44
48
3176
0
150C/3.8V
MPD
SRAM
CY62137VL-ZSIB
99357
9949 619935918
MN
TSOP II CSPI-R
44
48
3313
0
130C/3.63V
MPD
SRAM
CY62137VL-BAI
000204
0001 619938755
MN
FPBGA CSPI-R
48
128
50
0
130C/3.63V
MPD
SRAM
CY62137VL-BAI
000204
0001 619938755
MN
FPBGA CSPI-R
48
128
48
0
130C/3.63V
MPD
SRAM
CY62137VL-BAI
000204
0001 619938875
MN
FPBGA CSPI-R
48
128
47
0
130C/3.63V
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925644
MN
FPBGA TAIWN-G
48
128
54
0
150C/N/A
MPD
SRAM
CY62137VL-BAI
000204
619938755
MN
FPBGA CSPI-R
48
500
50
0
150C/N/A
MPD
SRAM
CY62137VL-BAI
000204
619938755
MN
FPBGA CSPI-R
48
1000
50
0
150C/N/A
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925644
MN
FPBGA TAIWN-G
48
336
48
0
150C/N/A
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925644
MN
FPBGA TAIWN-G
48
500
48
0
150C/N/A
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925644
MN
FPBGA TAIWN-G
48
1000
48
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938755
MN
FPBGA CSPI-R
48
80
120
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938755
MN
FPBGA CSPI-R
48
500
120
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938874
MN
FPBGA CSPI-R
48
80
120
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938874
MN
FPBGA CSPI-R
48
500
118
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938875
MN
FPBGA CSPI-R
48
80
120
0
150C/3.8V
MPD
SRAM
CY62137VL-BAI
000204
619938875
MN
FPBGA CSPI-R
48
500
120
0
Page 35 of
36
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 1, 2000
Issued 6/20/00
Quarterly Reliability Monitor Data - 00Q1
STRESS
TEST COND
DIV
FUNCTION DEVICE
EVAL #
DC
ASSY LOT
FAB
PKG
PKG
# PINs
DURATION
SAMP
REJ FAILURE MODE
***Wfr Process ID***: SRAM/LOGIC-R52LD-3
PCT
T/C2
T/C3
121C/100%RH
MPD
SRAM
CY62137VL-BAI
000204
619938755
MN
FPBGA CSPI-R
48
168
50
0
121C/100%RH
MPD
SRAM
CY62137VL-BAI
000204
619938875
MN
FPBGA CSPI-R
48
168
50
0
121C/100%RH
MPD
SRAM
CY62137VL-BAI
MR001087
9949 619937534
MN
FPBGA TAIWN-G
48
168
45
0
121C/100%RH
MPD
SRAM
CY62137VL-BAI
MR001091
9949 619937436
MN
FPBGA TAIWN-T
48
168
45
0
121C/100%RH
MPD
SRAM
CY62137VL-BAI
MR94267
9941 619929591
MN
FPBGA TAIWN-T
48
168
45
0
121C/100%RH
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925642
MN
FPBGA TAIWN-G
48
168
50
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925642
MN
FPBGA TAIWN-G
48
500
48
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925642
MN
FPBGA TAIWN-G
48
1000
47
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925642
MN
FPBGA TAIWN-G
48
1500
47
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925643
MN
FPBGA TAIWN-G
48
500
47
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925643
MN
FPBGA TAIWN-G
48
1000
47
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925643
MN
FPBGA TAIWN-G
48
1500
47
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925644
MN
FPBGA TAIWN-G
48
500
48
1 1 Destroyed During Analysis
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925644
MN
FPBGA TAIWN-G
48
1000
48
0
125C/-55C
MPD
SRAM
CY62146VLL-BAIB
99331
9938 619925644
MN
FPBGA TAIWN-G
48
1500
47
0
150C/-65C
MPD
SRAM
CY62137VL-BAI
000204
619938755
MN
FPBGA CSPI-R
48
300
47
0
150C/-65C
MPD
SRAM
CY62137VL-BAI
000204
619938874
MN
FPBGA CSPI-R
48
300
50
0
150C/-65C
MPD
SRAM
CY62137VL-BAI
000204
619938875
MN
FPBGA CSPI-R
48
300
47
0
Page 36 of
36