FAIRCHILD SFWI9540

SFW/I9540
Advanced Power MOSFET
FEATURES
BVDSS = -100 V
n Avalanche Rugged Technology
RDS(on) = 0.2 Ω
n Rugged Gate Oxide Technology
n Lower Input Capacitance
ID = -17 A
n Improved Gate Charge
n Extended Safe Operating Area
D2-PAK
o
n 175 C Operating Temperature
n Lower Leakage Current : 10 µA (Max.) @ VDS = -100V
I2-PAK
2
n Low RDS(ON) : 0.161 Ω (Typ.)
1
1
2
3
3
1. Gate 2. Drain 3. Source
Absolute Maximum Ratings
Symbol
VDSS
Characteristic
Value
Drain-to-Source Voltage
Continuous Drain Current (TC=25 C)
-17
o
Continuous Drain Current (TC=100 C)
IDM
Drain Current-Pulsed
VGS
Gate-to-Source Voltage
EAS
Single Pulsed Avalanche Energy
IAR
Avalanche Current
EAR
Repetitive Avalanche Energy
dv/dt
Peak Diode Recovery dv/dt
TJ , TSTG
TL
A
-12
1
O
O
1
O
1
O
O3
2
o
Total Power Dissipation (TA=25 C) *
PD
V
-100
o
ID
Units
o
-68
A
±30
V
578
mJ
-17
A
13.2
mJ
-6.5
V/ns
3.8
W
Total Power Dissipation (TC=25 C)
132
W
Linear Derating Factor
0.88
W/ C
Operating Junction and
o
- 55 to +175
Storage Temperature Range
o
Maximum Lead Temp. for Soldering
C
300
Purposes, 1/8” from case for 5-seconds
Thermal Resistance
Symbol
Characteristic
Typ.
Max.
RθJC
Junction-to-Case
--
1.14
RθJA
Junction-to-Ambient *
--
40
RθJA
Junction-to-Ambient
--
62.5
Units
o
C/W
* When mounted on the minimum pad size recommended (PCB Mount).
Rev. C
P-CHANNEL
POWER MOSFET
SFW/I9540
Electrical Characteristics (TC=25oC unless otherwise specified)
Symbol
Characteristic
BVDSS
Drain-Source Breakdown Voltage
∆BV/∆TJ
VGS(th)
IGSS
IDSS
RDS(on)
Min. Typ. Max. Units
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
Static Drain-Source
On-State Resistance
-100
--
--
--
-0.11
--
-2.0
--
-4.0
--
--
-100
V
nA
See Fig 7
VDS=-5V,ID=-250µA
VGS=-20V
VGS=20V
--
100
--
-10
--
--
-100
--
--
0.2
Ω
VGS=-10V,ID=-8.5A
4
O
9.5
--
S
VDS=-40V,ID=-8.5A
4
O
Forward Transconductance
--
Input Capacitance
--
1180 1535
Coss
Output Capacitance
--
240
360
Crss
Reverse Transfer Capacitance
--
83
125
td(on)
Turn-On Delay Time
--
14
40
Rise Time
--
22
55
Turn-Off Delay Time
--
45
100
Fall Time
--
26
60
tf
V/ C ID=-250µA
--
gfs
td(off)
VGS=0V,ID=-250µA
o
--
Ciss
tr
V
Test Condition
Qg
Total Gate Charge
--
43
54
Qgs
Gate-Source Charge
--
7.4
--
Qgd
Gate-Drain( “Miller” ) Charge
--
17.8
--
µA
pF
VDS=-100V
o
VDS=-80V,TC=150 C
VGS=0V,VDS=-25V,f =1MHz
See Fig 5
VDD=-50V,ID=-17A,
ns
RG=12 Ω
See Fig 13
4 O
5
O
VDS=-80V,VGS=-10V,
nC
ID=-17A
See Fig 6 & Fig 12
4 O
5
O
Source-Drain Diode Ratings and Characteristics
Symbol
Characteristic
IS
Continuous Source Current
Min. Typ. Max. Units
1
O
4
O
-17
Test Condition
--
--
--
--
-68
--
--
-4.0
V
TJ=25 C,IS=-17A,VGS=0V
A
Integral reverse pn-diode
ISM
Pulsed-Source Current
VSD
Diode Forward Voltage
trr
Reverse Recovery Time
--
135
--
ns
TJ=25 C,IF=-17A
Qrr
Reverse Recovery Charge
--
0.7
--
µC
diF/dt=100A/µs
Notes ;
Temperature
O1 Repetitive Rating : Pulse Width Limited by Maximum Junction
o
2
*
=-17A,
V
=-25V,
R
=27Ω
,
Starting
T
=25
C
L=3.0mH,
I
O
AS
DD
G
J
O3 ISD <_-17A, di/dt <_450A/µs, VDD <_BVDSS , Starting TJ =25oC
4 Pulse Test : Pulse Width = 250µs, Duty Cycle <
_ 2%
O
5 Essentially Independent of Operating Temperature
O
in the MOSFET
o
o
4
O
P-CHANNEL
POWER MOSFET
SFW/I9540
Fig 1. Output Characteristics
Fig 2. Transfer Characteristics
VGS
101
- 15 V
- 10 V
- 8.0 V
- 7.0 V
- 6.0 V
- 5.5 V
- 5.0 V
Bottom : - 4.5 V
-ID , Drain Current [A]
-ID , Drain Current [A]
Top :
100
@ Notes :
1. 250 µs Pulse Test
2. TC = 25 oC
10-1
101
175 oC
25 oC
100
@ Notes :
1. VGS = 0 V
2. VDS = -40 V
3. 250 µs Pulse Test
- 55 oC
100
10-1
101
2
4
6
8
10
-VDS , Drain-Source Voltage [V]
-VGS , Gate-Source Voltage [V]
Fig 3. On-Resistance vs. Drain Current
Fig 4. Source-Drain Diode Forward Voltage
0.5
0.4
VGS = -10 V
0.3
0.2
0.1
VGS = -20 V
0.0
0
8
16
24
32
40
@ Note : TJ = 25 oC
48
56
-IDR , Reverse Drain Current [A]
RDS(on) , [ Ω ]
Drain-Source On-Resistance
0.6
101
100
175 oC
10-1
64
@ Notes :
1. VGS = 0 V
2. 250 µs Pulse Test
25 oC
-ID , Drain Current [A]
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
-VSD , Source-Drain Voltage [V]
Fig 5. Capacitance vs. Drain-Source Voltage
Fig 6. Gate Charge vs. Gate-Source Voltage
2000
1000
C iss
C oss
@ Notes :
1. VGS = 0 V
2. f = 1 MHz
500
00
10
C rss
101
-VDS , Drain-Source Voltage [V]
VDS = -20 V
VDS = -50 V
VDS = -80 V
10
-VGS , Gate-Source Voltage [V]
Capacitance [pF]
1500
Ciss= Cgs+ Cgd ( Cds= shorted )
Coss= Cds+ Cgd
Crss= Cgd
5
@ Notes : ID =-17 A
0
0
10
20
30
QG , Total Gate Charge [nC]
40
50
P-CHANNEL
POWER MOSFET
SFW/I9540
Fig 7. Breakdown Voltage vs. Temperature
Fig 8. On-Resistance vs. Temperature
2.5
RDS(on) , (Normalized)
Drain-Source On-Resistance
-BVDSS , (Normalized)
Drain-Source Breakdown Voltage
1.2
1.1
1.0
0.9
0.8
-75
@ Notes :
1. VGS = 0 V
2. ID = -250 µA
-50
-25
0
25
50
75
100
125
150
175
2.0
1.5
1.0
0.0
-75
200
@ Notes :
1. VGS = -10 V
2. ID = -8.5 A
0.5
-50
-25
o
0
25
50
75
100
125
150
175
200
TJ , Junction Temperature [oC]
TJ , Junction Temperature [ C]
Fig 9. Max. Safe Operating Area
Fig 10. Max. Drain Current vs. Case Temperature
-ID , Drain Current [A]
Operation in This Area
is Limited by R DS(on)
2
10
0.1 ms
1 ms
101
10 ms
DC
100
@ Notes :
1. TC = 25 oC
2. TJ = 175 oC
3. Single Pulse
10-1 0
10
101
16
12
8
4
0
25
102
50
75
100
125
Tc , Case Temperature [oC]
-VDS , Drain-Source Voltage [V]
Thermal Response
Fig 11. Thermal Response
100
D=0.5
@ Notes :
1. Zθ J C (t)=1.14 o C/W Max.
2. Duty Factor, D=t1 /t2
3. TJ M -TC =PD M *Zθ J C (t)
0.2
10- 1
0.1
P.DM
0.05
0.02
t1.
t2.
0.01
θ JC
Z (t) ,
-ID , Drain Current [A]
20
single pulse
10- 2 - 5
10
10- 4
10- 3
10- 2
10- 1
t 1 , Square Wave Pulse Duration
100
[sec]
101
150
175
P-CHANNEL
POWER MOSFET
SFW/I9540
Fig 12. Gate Charge Test Circuit & Waveform
“ Current Regulator ”
VGS
Same Type
as DUT
50KΩ
Qg
200nF
12V
-10V
300nF
VDS
Qgs
VGS
Qgd
DUT
-3mA
R1
R2
Current Sampling (IG)
Resistor
Current Sampling (ID)
Resistor
Charge
Fig 13. Resistive Switching Test Circuit & Waveforms
RL
t on
Vout
td(on)
VDD
Vin
( 0.5 rated VDS )
RG
Vin
t off
tr
td(off)
tf
10%
DUT
-10V
Vout
90%
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms
BVDSS
1
EAS = ---- LL IAS2 -------------------2
BVDSS -- VDD
LL
VDS
Vary tp to obtain
required peak ID
tp
ID
VDD
RG
C
VDD
-10V
IAS
tp
VDS (t)
ID (t)
DUT
BVDSS
Time
P-CHANNEL
POWER MOSFET
SFW/I9540
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
+
VDS
DUT
-IS
L
Driver
VGS
RG
VGS
VGS
( Driver )
Compliment of DUT
(N-Channel)
VDD
• dv/dt controlled by “RG”
• IS controlled by Duty Factor “D”
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
Body Diode Reverse Current
IRM
IS
( DUT )
di/dt
IFM , Body Diode Forward Current
Vf
VDS
( DUT )
Body Diode
Forward Voltage Drop
Body Diode Recovery dv/dt
VDD