TOSHIBA TC74HCT541AP

TC74HCT540,541AP/AF
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC74HCT540AP,TC74HCT540AF
TC74HCT541AP,TC74HCT541AF
Octal Bus Buffer with TTL Input Level
TC74HCT540AP/AF
Inverting, 3-State
Outputs
TC74HCT541AP/AF
Non-Inverting,
3-State Outputs
The TC74HCT540A/TC74HCT541A are high speed CMOS
OCTAL BUS BUFFERs fabricated with silicon gate C2MOS
technology.
These devices may be used as a level converter for interfacing
TTL or NMOS to High Speed CMOS. The inputs are compatible
with TTL, NMOS and CMOS output voltage levels.
They achive the high speed operation similar to equivalent
LSTTL while maintaing the CMOS low power dissipation.
The TC74HCT540A is an inverting type, and the
TC74HCT541A is a non-inverting type.
When either G1 or G2 are high, the terminal outputs are in
the high-impedance state.
All inputs are equipped with protection circuits against static
discharge or transient excess voltage.
Features
TC74HCT540AP, TC74HCT541AP
TC74HCT540AF, TC74HCT541AF
Weight
DIP20-P-300-2.54A
SOP20-P-300-1.27A
•
High speed: tpd = 10 ns (typ.) at VCC = 5 V
•
Low power dissipation: ICC = 4 μA (max) at Ta = 25°C
•
Compatible with TTL outputs: VIL = 0.8 V (max)
VIH = 2.0 V (min)
•
Wide interfacing ability: LSTTL, NMOS, CMOS
•
Output drive capability: 15 LSTTL loads
•
•
Symmetrical output impedance: |IOH| = IOL = 6 mA (min)
Balanced propagation delays: tpLH ∼
− tpHL
•
Pin and function compatible with 74LS540/541
1
: 1.30 g (typ.)
: 0.22 g (typ.)
2007-10-01
TC74HCT540,541AP/AF
Pin Assignment
TC74HCT540A
TC74HCT541A
IEC Logic Symbol
TC74HCT540A
TC74HCT541A
Truth Table
Inputs
Outputs
G1
G2
An
Yn*
Yn *
H
X
X
Z
Z
X
H
X
Z
Z
L
L
H
H
L
L
L
L
L
H
X: Don’t care
Z: High impedance
*: Yn............. HCT541A
Yn ........... HCT540A
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TC74HCT540,541AP/AF
Absolute Maximum Ratings (Note 1)
Characteristics
Supply voltage range
Symbol
Rating
Unit
VCC
−0.5~7
V
VIN
−0.5~VCC + 0.5
V
VOUT
−0.5~VCC + 0.5
V
Input diode current
IIK
±20
mA
Output diode current
IOK
±20
mA
DC output current
IOUT
±35
mA
DC VCC/ground current
ICC
±75
mA
Power dissipation
PD
500 (DIP) (Note 2)/180 (SOP)
mW
Storage temperature
Tstg
−65~150
°C
DC input voltage
DC output voltage
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be
applied until 300 mW.
Operating Ranges (Note)
Characteristics
Supply voltage
Input voltage
Symbol
Rating
Unit
VCC
4.5~5.5
V
VIN
0~VCC
V
VOUT
0~VCC
V
Operating temperature
Topr
−40~85
°C
Input rise and fall time
tr, tf
0~500
ns
Output voltage
Note:
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Characteristics
Symbol
Ta = 25°C
Test Condition
Ta = −40~85°C
VCC (V)
Min
Typ.
Max
Min
Max
Unit
High-level input
voltage
VIH
⎯
4.5~5.5
2.0
⎯
⎯
2.0
⎯
V
Low-level input
voltage
VIL
⎯
4.5~5.5
⎯
⎯
0.8
⎯
0.8
V
High-level output
voltage
VOH
IOH = −20 μA
VIN
= VIH or VIL I
OH = −6 mA
Low-level output
voltage
VOL
IOL = 20 μA
VIN
= VIH or VIL I = 6 mA
OL
3-state output
off-state current
IOZ
Input leakage
current
IIN
Quiescent supply
current
ICC
IC
4.5
4.4
4.5
⎯
4.4
⎯
4.5
4.18
4.31
⎯
4.13
⎯
4.5
⎯
0.0
0.1
⎯
0.1
4.5
⎯
0.17
0.26
⎯
0.33
5.5
⎯
⎯
±0.5
⎯
±5.0
μA
VIN = VCC or GND
5.5
⎯
⎯
±0.1
⎯
±1.0
μA
VIN = VCC or GND
5.5
⎯
⎯
4.0
⎯
40.0
μA
Per input: VIN = 0.5 V or 2.4 V
Other input: VCC or GND
5.5
⎯
⎯
2.0
⎯
2.9
mA
VIN = VIH or VIL
VOUT = VCC or GND
3
V
V
2007-10-01
TC74HCT540,541AP/AF
AC Characteristics (input: tr = tf = 6 ns)
Characteristics
Output transition time
tTLH
tTHL
Propagation delay
time
tpLH
(TC74HCT540A)
tpHL
Propagation delay
time
tpLH
(TC74HCT541A)
tpHL
Output enable time
Output disable time
Input capacitance
Output capacitance
Power dissipation
capacitance
Note:
tpZL
tpZH
tpLZ
tpHZ
Ta = 25°C
Test Condition
Symbol
CL (pF) VCC (V)
⎯
50
50
⎯
150
50
⎯
150
50
RL = 1 kΩ
150
RL = 1 kΩ
50
Ta = −40~85°C
Min
Typ.
Max
Min
Max
4.5
⎯
7
12
⎯
15
5.5
⎯
6
11
⎯
14
4.5
⎯
12
20
⎯
25
5.5
⎯
9
18
⎯
23
4.5
⎯
17
26
⎯
33
5.5
⎯
14
24
⎯
30
4.5
⎯
14
23
⎯
29
5.5
⎯
11
21
⎯
27
4.5
⎯
19
29
⎯
36
5.5
⎯
16
27
⎯
33
4.5
⎯
18
30
⎯
38
5.5
⎯
16
27
⎯
35
4.5
⎯
23
36
⎯
45
5.5
⎯
21
33
⎯
41
4.5
⎯
18
30
⎯
38
5.5
⎯
16
27
⎯
35
Unit
ns
ns
ns
ns
ns
CIN
⎯
⎯
5
10
⎯
10
pF
COUT
⎯
⎯
10
⎯
⎯
⎯
pF
TC74HCT540A
⎯
35
⎯
⎯
⎯
(Note) TC74HCT541A
⎯
31
⎯
⎯
⎯
CPD
pF
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating
current consumption without load.
Average operating current can be obtained by the equation:
ICC (opr) = CPD・VCC・fIN + ICC/8 (per bit)
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TC74HCT540,541AP/AF
Package Dimensions
Weight: 1.30 g (typ.)
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TC74HCT540,541AP/AF
Package Dimensions
Weight: 0.22 g (typ.)
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TC74HCT540,541AP/AF
RESTRICTIONS ON PRODUCT USE
20070701-EN GENERAL
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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