SSM6N15FE TOSHIBA Field Effect Transistor Silicon N Channel MOS Type SSM6N15FE High Speed Switching Applications Analog Switching Applications • • Unit: mm Small package Low ON resistance : Ron = 4.0 Ω (max) (@VGS = 4 V) : Ron = 7.0 Ω (max) (@VGS = 2.5 V) Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common) Characteristics Drain-Source voltage Rating Unit VDS 30 V V VGSS ±20 DC ID 100 Pulse IDP 200 Gate-Source voltage Drain current Symbol Drain power dissipation (Ta = 25°C) PD (Note 1) mA 150 mW Channel temperature Tch 150 °C Storage temperature range Tstg −55~150 °C Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Total rating, mounted on FR4 board 2 (25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 0.135 mm × 6) 1: Source1 2: Gate1 3: Drain2 4: Source2 5: Gate2 6: Drain1 Note: JEDEC ― JEITA ― TOSHIBA 2-2N1D Weight: 3mg (typ.) 0.45 mm 0.3 mm Marking 6 Equivalent Circuit (top view) 5 4 6 2 4 Q1 DP 1 5 Q2 3 1 2 3 Handling Precaution When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment is protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other objects that come into direct contact with devices should be made of anti-static materials. 1 2007-11-01 SSM6N15FE Electrical Characteristics (Ta = 25°C) (Q1, Q2 Common) Characteristics Symbol Gate leakage current Drain-Source breakdown voltage Drain cut-off current Test Condition Min Typ. Max Unit IGSS VGS = ±16 V, VDS = 0 ⎯ ⎯ ±1 μA V (BR) DSS ID = 0.1 mA, VGS = 0 30 ⎯ ⎯ V IDSS VDS = 30 V, VGS = 0 ⎯ ⎯ 1 μA Vth VDS = 3 V, ID = 0.1 mA 0.8 ⎯ 1.5 V Forward transfer admittance ⎪Yfs⎪ VDS = 3 V, ID = 10 mA 25 ⎯ ⎯ mS Drain-Source ON resistance RDS (ON) ID = 10 mA, VGS = 4 V ⎯ 2.2 4.0 ID = 10 mA, VGS = 2.5 V ⎯ 4.0 7.0 ⎯ 7.8 ⎯ pF ⎯ 3.6 ⎯ pF ⎯ 8.8 ⎯ pF Gate threshold voltage Input capacitance Ciss Reverse transfer capacitance Crss Output capacitance Coss Switching time VDS = 3 V, VGS = 0, f = 1 MHz Turn-on time ton VDD = 5 V, ID = 10 mA, ⎯ 50 ⎯ Turn-off time toff VGS = 0~5 V ⎯ 180 ⎯ Ω ns Switching Time Test Circuit (b) VIN (a) Test circuit 5V OUT 5V 90% 0 10 μs RL 50 Ω IN VDD 0V (c) VOUT VDD = 5 V Duty < = 1% VIN: tr, tf < 5 ns (Zout = 50 Ω) Common Source Ta = 25°C 10% VDD VDS (ON) 10% 90% tr ton tf toff Precaution Vth can be expressed as voltage between gate and source when low operating current value is ID = 100 μA for this product. For normal switching operation, VGS (on) requires higher voltage than Vth and VGS (off) requires lower voltage than Vth. (Relationship can be established as follows: VGS (off) < Vth < VGS (on) ) Please take this into consideration for using the device. 2 2007-11-01 SSM6N15FE (Q1, Q2 Common) ID – VDS ID – VGS 250 1000 Common Source 10 4 3 100 Drain current ID (mA) Drain current ID (mA) 200 Ta = 25°C 2.7 150 2.5 100 2.3 50 Common Source VDS = 3 V Ta = 100°C 10 −25°C 25°C 1 0.1 VGS = 2.1 V 0 0 0.5 1 1.5 Drain-source voltage 0.01 0 2 1 VDS (V) 2 3 Gate-source voltage RDS (ON) – ID VGS (V) RDS (ON) – VGS 10 6 Common Source Common Source ID = 10 mA 5 8 Drain-source on resistance RDS (ON) (Ω) Drain-source on resistance RDS (ON) (Ω) Ta = 25°C 6 VGS = 2.5 V 4 4V 2 4 Ta = 100°C 3 25°C 2 −25°C 1 0 0 40 80 120 160 0 0 200 2 Drain current ID (mA) 4 Common Source ID = 10 mA Vth (V) 1.8 6 5 VGS = 2.5 V 4 3 4V 2 1 0 −25 8 10 VGS (V) Vth – Ta 2 Gate threshold voltage Drain-source on resistance RDS (ON) (Ω) 7 6 Gate-source voltage RDS (ON) – Ta 8 4 1.6 Common Source ID = 0.1 mA VDS = 3 V 1.4 1.2 1 0.8 0.6 0.4 0.2 0 25 50 75 100 125 0 −25 150 Ambient temperature Ta (°C) 0 25 50 75 100 125 150 Ambient temperature Ta (°C) 3 2007-11-01 SSM6N15FE (Q1, Q2 Common) ⎪Yfs⎪ – ID IDR – VDS 1000 250 (mA) Drain reverse current IDR Forward transfer admittance ⏐Yfs⏐ (mS) Common Source 500 V DS = 3 V 300 Ta = 25°C 100 50 30 10 5 3 1 0 10 100 200 Common Source VGS = 0 V Ta = 25°C D 150 S 100 50 0 0 1000 IDR G −0.2 Drain current ID (mA) −0.4 −0.6 Drain-source voltage t – ID toff 3000 tf 500 300 100 10 0.1 ton toff 1000 500 tf 300 ton 100 tr 50 30 tr 1 10 10 0.1 100 Drain current ID (mA) 1 Power dissipation PD* (mW) (pF) 30 Capacitance C 250 Common Source VGS = 0 V f = 1 MHz Ta = 25°C 10 Ciss Coss 5 3 Crss 1 0.5 0.3 Drain-source voltage 100 PD* – Ta 50 1 10 Drain current ID (mA) C – VDS 100 0.1 0.1 −1.4 Common Source VDD = 3 V VGS = 0~2.5 V Ta = 25°C 5000 Switching time t (ns) Switching time t (ns) 3000 30 −1.2 VDS (V) 10000 Common Source VDD = 5 V VGS = 0~5 V Ta = 25°C 5000 50 −1 t – ID 10000 1000 −0.8 10 200 150 100 50 0 0 100 Mounted on FR4 board. (25.4 mm × 25.4 mm × 1.6 t Cu Pad: 0.135 mm2 × 6) *: Total Rating VDS (V) 40 80 120 160 Ambient temperature Ta (°C) *: Total rating 4 2007-11-01 SSM6N15FE RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 5 2007-11-01