TC74HC221AP/AF/AFN TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HC221AP,TC74HC221AF,TC74HC221AFN Dual Monostable Multivibrator The TC74HC221A is a high speed CMOS MONOSTABLE MULTIVIBRATOR fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. There are two trigger inputs, A input (negative edge), and B input (positive edge). These inputs are valid for a slow rise/fall time signal (tr = tf = 1 s) as they are schmitt trigger inputs. This device may also be triggered by using CLR input (positive edge). After triggering, the output stays in a MONOSTABLE state for a time period determined by the external resistor and capacitor (Rx, Cx ). A low level at the CLR input breaks this state. Limits for Cx and Rx are: External capacitor, Cx: No limit External resistor, Rx: VCC = 2.0 V more than 5 kΩ VCC ≥ 3.0 V more than 1 kΩ All inputs are equipped with protection circuits against static discharge or transient excess voltage. Features (Note) • High speed: tpd = 25 ns (typ.) at VCC = 5 V • Low power dissipation Note: xxxFN (JEDEC SOP) is not available in Japan. TC74HC221AP TC74HC221AF TC74HC221AFN Standy by State: ICC = 4 μA (max) at Ta = 25°C Active State: ICC = 700 μA (max) at Ta = 25°C • High noise immunity: VNIH = VNIL = 28% VCC (min) • Output drive capability: 10 LSTTL loads • • Symmetrical output impedance: |IOH| = IOL = 4 mA (min) ∼ tpHL Balanced propagation delays: tpLH − • Wide operating voltage range: VCC (opr) = 2 to 6 V • Pin and function compatible with 74LS221 Note: Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27 : 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.) In the case of using only one circuit, CLR should be tied to GND, Rx/Cx･Cx･Q･ Q should be tied to OPEN, the other inputs should be tied to VCC or GND. 1 2007-10-01 TC74HC221AP/AF/AFN Pin Assignment IEC Logic Symbol Block Diagram (Note 1)(Note 2) Note 1: Cx, Rx, Dx are external capacitor, resistor, and diode, respectively. Note 2: External clamping diode, Dx; The external capacitor is charged to VCC level in the wait state, i.e. when no trigger is applied. If the supply voltage is turned off, Cx is discharges mainly through the internal (parasitic) diode. If Cx is sufficiently large and VCC drops rapidly, there will be some possibility of damaging the IC through in rush current or latch-up. If the capacitance of the supply voltage filter is large enough and VCC drops slowly, the in rush current is automatically limited and damage to the IC is avoided. The maximum value of forward current through the parasitic diode is ±20 mA. In the case of a large Cx, the limit of fall time of the supply voltage is determined as follows: tf > = (VCC − 0.7) Cx/20 mA (tf is the time between the supply voltage turn off and the supply voltage reaching 0.4 VCC.) In the even a system does not satisfy the above condition, an external clamping diode (Dx) is needed to protect the IC from rush current. 2 2007-10-01 TC74HC221AP/AF/AFN Truth Table Inputs Outputs B CLR H H X L H L H H X H L H A L Q Q Output Enable H L H X X Function Inhibit Inhibit Output Enable Output Enable L L H Inhibit X: Don’t care System Diagram 3 2007-10-01 TC74HC221AP/AF/AFN Timing Chart Functional Description (1) (2) (3) Stand-by state The external capacitor (Cx) is fully charged to VCC in the stand-by state. That means, before triggering, the QP and QN transistors which are connected to the Rx/Cx node are in the off state. Two comparators that relate to the timing of the output pulse, and two reference voltage supplies turn off. The total supply current is only leakage current. Trigger operation Trigger operation is effective in any of the following three cases. First the condition where the A input is low, and the B input has a rising signal; second, where the B input is high, and the A input has a falling signal; and third, where the A input is low and the B input is high, and the CLR input has a rising signal. After a trigger becomes effective, comparators C1 and C2 start operating, and QN is turned on. The external capacitor discharges through QN. The voltage level at the Rx/Cx node drops. If the Rx/Cx voltage level falls to the internal reference voltage Vref L, the output of C1 becomes low. The flip-flop is then reset and QN turns off. At that moment C1 stops but C2 continues operating. After QN turns off, the voltage at the Rx/Cx node starts rising at a rate determined by the time constant of external capacitor Cx and resistor Rx. Upon the triggering, output Q becomes high, following some delay time of the internal F/F and gates. It stays high even if the voltage of Rx/Cx changes from falling to rising. When Rx/Cx reaches the internal reference voltage Vref H, the output of C2 becomes low, the output Q goes low and C2 stops its operation. That means, after triggering, when the voltage level of the Rx/Cx node reaches Vref H, the IC returns to its MONOSTABLE state. With large values of Cx and Rx, and ignoring the discharge time of the capacitor and internal delays of the IC, the width of the output pulse, tw (OUT), is as follows: tw (OUT) = 1.0 Cx Rx Reset operation In normal operation, CLR input is held high. If CLR is low, a trigger has no effect because the Q output is held low and trigger control F/F is reset. Also, QP turns on and Cx is charge rapidly to VCC. This means if CLR input is set low, the IC goes into a wait state. 4 2007-10-01 TC74HC221AP/AF/AFN Absolute Maximum Ratings (Note 1) Characteristics Symbol Rating Unit Supply voltage range VCC −0.5 to 7 V DC input voltage VIN −0.5 to VCC + 0.5 V VOUT −0.5 to VCC + 0.5 V Input diode current IIK ±20 mA Output diode current IOK ±20 mA DC output current IOUT ±25 mA DC VCC/ground current ICC ±50 mA Power dissipation PD 500 (DIP) (Note 2)/180 (SOP) mW Storage temperature Tstg −65 to 150 °C DC output voltage Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be applied until 300 mW. Operating Ranges (Note 1) Characteristics Symbol Rating Unit Supply voltage VCC 2 to 6 V Input voltage VIN 0 to VCC V VOUT 0 to VCC V Topr −40 to 85 °C Output voltage Operating temperature Input rise and fall time ( CLR only) External capacitor External resistor 0 to 1000 (VCC = 2.0 V) tr, tf 0 to 500 (VCC = 4.5 V) ns 0 to 400 (VCC = 6.0 V) Cx No limitation Rx > = 5 k (Note 5) (VCC = 2.0 V) > = 1 k (Note 5) (VCC > = 3.0 V) (Note 2) F Ω Note 1: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Note 2 The maximum allowable values of Cx and Rx are a function of leakage of capacitor Cx, the leakage of TC74HC221A, and leakage due to board layout and surface resistance. Susceptibility to externally induced noise signals may occur for Rx > 1 MΩ. 5 2007-10-01 TC74HC221AP/AF/AFN Electrical Characteristics DC Characteristics Ta = 25°C Characteristics High-level input voltage Low-level input voltage High-level output voltage Symbol VOH VOL (Q, Q ) Min Typ. Max Min Max 2.0 1.50 ⎯ ⎯ 1.50 ⎯ 4.5 3.15 ⎯ ⎯ 3.15 ⎯ 6.0 4.20 ⎯ ⎯ 4.20 ⎯ 2.0 ⎯ ⎯ 0.50 ⎯ 0.50 4.5 ⎯ ⎯ 1.35 ⎯ 1.35 6.0 ⎯ ⎯ 1.80 ⎯ 1.80 2.0 1.9 2.0 ⎯ 1.9 ⎯ 4.5 4.4 4.5 ⎯ 4.4 ⎯ 6.0 5.9 6.0 ⎯ 5.9 ⎯ IOH = −4 mA 4.5 4.18 4.31 ⎯ 4.13 ⎯ IOH = −5.2 mA 6.0 5.68 5.80 ⎯ 5.63 ⎯ 2.0 ⎯ 0.0 0.1 ⎯ 0.1 4.5 ⎯ 0.0 0.1 ⎯ 0.1 6.0 ⎯ 0.0 0.1 ⎯ 0.1 IOL = 4 mA 4.5 ⎯ 0.17 0.26 ⎯ 0.33 IOL = 5.2 mA 6.0 ⎯ 0.18 0.26 ⎯ 0.33 ⎯ VIL VIN = VIH or VIL VIN = VIH or VIL Ta = −40 to 85°C VCC (V) ⎯ VIH (Q, Q ) Low-level output voltage Test Condition IOH = −20 μA IOL = 20 μA Unit V V V V Input leakage current IIN VIN = VCC or GND 6.0 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA Rx/Cx terminal off-state current IIN VIN = VCC or GND 6.0 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA Quiescent supply current ICC VIN = VCC or GND 6.0 ⎯ ⎯ 4.0 ⎯ 40.0 μA 2.0 ⎯ 45 200 ⎯ 260 μA 4.5 ⎯ 400 500 ⎯ 650 μA 6.0 ⎯ 0.7 1.0 ⎯ 1.3 mA Ta = −40 to 85°C Unit Active-state supply current (Note) Note: ICC VIN = VCC or GND Rx/Cx = 0.5 VCC Per circuit Timing Requirements (input: tr = tf = 6 ns) Characteristics Minimum pulse width Minimum clear width Symbol Ta = 25°C Test Condition tW (L) ⎯ tW (H) ⎯ tW (L) 6 VCC (V) Typ. Limit Limit 2.0 ⎯ 75 95 4.5 ⎯ 15 19 6.0 ⎯ 13 16 2.0 ⎯ 75 95 4.5 ⎯ 15 19 6.0 ⎯ 13 16 ns ns 2007-10-01 TC74HC221AP/AF/AFN AC Characteristics (CL = 15 pF, VCC = 5 V, Ta = 25°C, input: tr = tf = 6 ns) Characteristics Output transition time Symbol tTLH tTHL Propagation delay time tpLH ( A , B-Q, Q ) tpHL Propagation delay time tpLH ( CLR TRIGGER-Q, Q ) tpHL Propagation delay time tpLH ( CLR -Q, Q ) tpHL 7 Test Condition Min Typ. Max Unit ⎯ ⎯ 4 8 ns ⎯ ⎯ 25 36 ns ⎯ ⎯ 25 41 ns ⎯ ⎯ 16 27 ns 2007-10-01 TC74HC221AP/AF/AFN AC Characteristics (CL = 50 pF, input: tr = tf = 6 ns) Ta = 25°C Characteristics Output transition time Symbol ( A , B-Q, Q ) tpHL Propagation delay time tpLH ( CLR TRIGGER-Q, Q) tpHL Propagation delay time tpLH ( CLR -Q, Q ) tpHL twOUT Typ. Max Min Max 2.0 ⎯ 30 75 ⎯ 95 4.5 ⎯ 8 15 ⎯ 19 6.0 ⎯ 7 13 ⎯ 16 2.0 ⎯ 102 210 ⎯ 265 4.5 ⎯ 30 42 ⎯ 53 6.0 ⎯ 24 36 ⎯ 45 2.0 ⎯ 102 235 ⎯ 295 4.5 ⎯ 30 47 ⎯ 59 6.0 ⎯ 24 40 ⎯ 50 2.0 ⎯ 67 160 ⎯ 200 4.5 ⎯ 20 32 ⎯ 40 6.0 ⎯ 16 27 ⎯ 34 Cx = 28 pF 2.0 ⎯ 700 2000 ⎯ 2500 Rx = 6 kΩ (VCC = 2 V) 4.5 ⎯ 250 400 ⎯ 500 Rx = 2 kΩ (VCC = 4.5 V, 6 V) 6.0 ⎯ 210 340 ⎯ 425 2.0 90 110 130 90 130 4.5 95 105 115 95 115 6.0 95 105 115 95 115 2.0 0.9 1.0 1.2 0.9 1.2 4.5 0.9 1.0 1.1 0.9 1.1 6.0 0.9 1.0 1.1 0.9 1.1 ⎯ ⎯ ±1 ⎯ ⎯ ⎯ % ⎯ ⎯ 5 10 ⎯ 10 pF ⎯ ⎯ 174 ⎯ ⎯ ⎯ pF ⎯ ⎯ ⎯ ⎯ Cx = 0.01 μF Rx = 10 kΩ Cx = 0.1 μF Rx = 10 kΩ Output pulse width error between circuits Unit Min tTHL tpLH Ta = −40 to 85°C VCC (V) tTLH Propagation delay time Output pulse width Test Condition ΔtwOUT ⎯ ns ns ns ns ns μs ms (in same package) Input capacitance CIN Power dissipation capacitance CPD Note: (Note) CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC’･duty/100 + ICC/2 (per circuit) (ICC’: active supply current) (duty: %) 8 2007-10-01 TC74HC221AP/AF/AFN Output Pulse Width Constant K – Supply Voltage (typical) tWOUT – Cx Characteristics (typ.) 9 2007-10-01 TC74HC221AP/AF/AFN Package Dimensions Weight: 1.00 g (typ.) 10 2007-10-01 TC74HC221AP/AF/AFN Package Dimensions Weight: 0.18 g (typ.) 11 2007-10-01 TC74HC221AP/AF/AFN Package Dimensions (Note) Note: This package is not available in Japan. Weight: 0.13 g (typ.) 12 2007-10-01 TC74HC221AP/AF/AFN RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. 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Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 13 2007-10-01