Cypress CY7C1382D-200AXC 18-mbit (512 k ã 36/1 m ã 18) pipelined sram Datasheet

CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
18-Mbit (512 K × 36/1 M × 18)
Pipelined SRAM
18-Mbit (512 K × 36/1 M × 18) Pipelined SRAM
Features
Functional Description
The
CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F[1]
SRAM integrates 524,288 × 36 and 1,048,576 × 18 SRAM cells
with advanced synchronous peripheral circuitry and a two-bit
counter for internal burst operation. All synchronous inputs are
gated by registers controlled by a positive edge triggered clock
input (CLK). The synchronous inputs include all addresses, all
data inputs, address-pipelining chip enable (CE1),
depth-expansion chip enables (CE2 and CE3 [2]), burst control
inputs (ADSC, ADSP, and ADV), write enables (BWX, and BWE),
and global write (GW). Asynchronous inputs include the output
enable (OE) and the ZZ pin.
■
Supports bus operation up to 250 MHz
■
Available speed grades are 250, 200, and 167 MHz
■
Registered inputs and outputs for pipelined operation
■
3.3 V core power supply
■
2.5 V or 3.3 V I/O power supply
■
Fast clock-to-output times
❐ 2.6 ns (for 250 MHz device)
■
Provides high performance 3-1-1-1 access rate
■
User selectable burst counter supporting Intel Pentium®
interleaved or linear burst sequences
■
Separate processor and controller address strobes
■
Synchronous self-timed write
■
Asynchronous output enable
■
Single cycle chip deselect
■
CY7C1380D/CY7C1382D is available in JEDEC-standard
Pb-free 100-pin TQFP, Pb-free and non Pb-free 165-ball
FPBGA package; CY7C1380F/CY7C1382F is available in
JEDEC-standard Pb-free 100-pin TQFP, Pb-free and non
Pb-free 119-ball BGA and 165-ball FPBGA package
■
IEEE 1149.1 JTAG-Compatible Boundary Scan
■
ZZ sleep mode option
Addresses and chip enables are registered at rising edge of
clock when address strobe processor (ADSP) or address strobe
controller (ADSC) are active. Subsequent burst addresses can
be internally generated as they are controlled by the advance pin
(ADV).
Address, data inputs, and write controls are registered on-chip
to initiate a self-timed write cycle.This part supports byte write
operations (see Table 1 on page 7 and “Truth Table” on page 11
for further details). Write cycles can be one to two or four bytes
wide as controlled by the byte write control inputs. GW when
active LOW causes all bytes to be written.
The
CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F
operates from a +3.3 V core power supply while all outputs
operate with a +2.5 or +3.3 V power supply. All inputs and
outputs are JEDEC-standard and JESD8-5-compatible.
Selection Guide
250 MHz
200 MHz
167 MHz
Unit
Maximum Access Time
Description
2.6
3.0
3.4
ns
Maximum Operating Current
350
300
275
mA
Maximum CMOS Standby Current
70
70
70
mA
Notes
1. For best practices or recommendations, please refer to the Cypress application note AN1064, SRAM System Design Guidelines on www.cypress.com.
2. CE3, CE2 are for TQFP and 165 FPBGA packages only. 119 BGA is offered only in 1 chip enable.
Cypress Semiconductor Corporation
Document Number: 38-05543 Rev. *I
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised February 3, 2011
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Logic Block Diagram – CY7C1380D/CY7C1380F [3] (512 K × 36)
A0, A1, A
ADDRESS
REGISTER
2
A [1:0]
MODE
ADV
CLK
Q1
BURST
COUNTER
CLR AND
LOGIC
ADSC
Q0
ADSP
BW D
DQ D , DQP D
BYTE
WRITE REGISTER
DQ D ,DQP D
BYTE
WRITE DRIVER
BW C
DQ C , DQP C
BYTE
WRITE REGISTER
DQ C , DQP C
BYTE
WRITE DRIVER
DQ B , DQP B
BYTE
WRITE REGISTER
DQ B , DQP B
BYTE
WRITE DRIVER
BW B
BW A
BWE
ZZ
ENABLE
REGISTER
SENSE
AMPS
OUTPUT
REGISTERS
OUTPUT
BUFFERS
E
DQs
DQP A
DQP B
DQP C
DQP D
DQ A , DQP A
BYTE
WRITE DRIVER
DQ A , DQP A
BYTE
WRITE REGISTER
GW
CE 1
CE 2
CE 3
OE
MEMORY
ARRAY
INPUT
REGISTERS
PIPELINED
ENABLE
SLEEP
CONTROL
Logic Block Diagram – CY7C1382D/CY7C1382F [3] (1 M × 18)
A0, A1, A
ADDRESS
REGISTER
2
BURST Q1
COUNTER AND
LOGIC
ADV
CLK
ADSC
BW B
DQ B, DQP B
WRITE DRIVER
DQ B, DQP B
WRITE REGISTER
MEMORY
ARRAY
BW A
SENSE
OUTPUT
OUTPUT
BUFFERS
DQs
DQP A
DQP B
DQ A, DQP A
WRITE DRIVER
DQ A, DQP A
WRITE REGISTER
BWE
GW
CE 1
CE2
CE3
INPUT
ENABLE
REGISTER
PIPELINED
ENABLE
OE
ZZ
SLEEP
CONTROL
Note
3. CY7C1380F and CY7C1382F in 119-ball BGA package have only 1 chip enable (CE1).
Document Number: 38-05543 Rev. *I
Page 2 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Contents
Pin Configurations ........................................................... 4
100-pin TQFP Pinout (3-Chip Enable) ........................ 4
119-ball BGA Pinout .................................................... 5
165-ball FBGA Pinout (3-Chip Enable) ....................... 6
Functional Overview ........................................................ 9
Single Read Accesses ................................................ 9
Single Write Accesses Initiated by ADSP ................... 9
Single Write Accesses Initiated by ADSC ................... 9
Burst Sequences ....................................................... 10
Sleep Mode ............................................................... 10
Truth Table ...................................................................... 11
Truth Table for Read/Write ............................................ 12
Truth Table for Read/Write ............................................ 12
IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 13
Disabling the JTAG Feature ...................................... 13
TAP Controller State Diagram ....................................... 13
Test Access Port (TAP) ............................................. 13
TAP Controller Block Diagram ...................................... 13
PERFORMING A TAP RESET .................................. 13
TAP REGISTERS ...................................................... 13
TAP Instruction Set ................................................... 14
Reserved ................................................................... 15
TAP Timing ...................................................................... 15
TAP AC Switching Characteristics ............................... 15
3.3 V TAP AC Test Conditions ....................................... 16
2.5 V TAP AC Test Conditions ....................................... 16
Document Number: 38-05543 Rev. *I
TAP DC Electrical Characteristics and
Operating Conditions ..................................................... 16
Identification Register Definitions ................................ 17
Scan Register Sizes ....................................................... 17
Identification Codes ....................................................... 17
119-ball BGA Boundary Scan Order ............................ 18
165-ball BGA Boundary Scan Order ............................ 19
Maximum Ratings ........................................................... 20
Operating Range ............................................................. 20
Electrical Characteristics ............................................... 20
Capacitance .................................................................... 21
Thermal Resistance ........................................................ 21
Switching Characteristics .............................................. 22
Switching Waveforms .................................................... 23
Ordering Information ...................................................... 27
Ordering Code Definitions ......................................... 27
Package Diagrams .......................................................... 28
Acronyms ........................................................................ 31
Document Conventions ................................................. 31
Units of Measure ....................................................... 31
Document History Page ................................................. 32
Sales, Solutions, and Legal Information ...................... 33
Worldwide Sales and Design Support ....................... 33
Products .................................................................... 33
PSoC Solutions ......................................................... 33
Page 3 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Pin Configurations
100-pin TQFP Pinout (3-Chip Enable)
Figure 1. CY7C1380D, CY7C1380F (512 K × 36)
Document Number: 38-05543 Rev. *I
Figure 2. CY7C1382D, CY7C1382F (1 M × 18)
Page 4 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
119-ball BGA Pinout
1
Figure 3. CY7C1380F (512 K × 36)
2
3
4
5
A
A
A
ADSP
6
A
7
VDDQ
A
A
A
A
NC/576M
NC/1G
NC
CE1
VSS
VSS
DQPB
DQB
DQB
DQB
VSS
OE
VSS
DQB
VDDQ
DQC
DQC
VDD
DQD
BWC
VSS
NC
VSS
ADV
BWB
VSS
NC
VSS
DQB
DQB
VDD
DQA
DQB
DQB
VDDQ
DQA
DQD
DQD
NC
DQA
VDDQ
DQD
BWA
VSS
DQA
M
BWD
VSS
DQA
VDDQ
N
DQD
DQD
VSS
VSS
DQA
DQA
A
VDDQ
B
C
NC/288M
NC/144M
A
A
A
A
ADSC
VDD
D
E
DQC
DQC
DQPC
DQC
VSS
VSS
F
VDDQ
DQC
G
H
J
K
DQC
DQC
VDDQ
DQD
L
GW
VDD
CLK
BWE
A1
P
DQD
DQPD
VSS
A0
VSS
DQPA
DQA
R
NC
A
MODE
VDD
NC
A
NC
T
U
NC
VDDQ
NC/72M
TMS
A
TDI
A
TCK
A
TDO
NC/36M
NC
ZZ
VDDQ
Figure 4. CY7C1382F (1 M × 18)
1
2
3
4
5
6
7
A
VDDQ
A
A
ADSP
A
A
VDDQ
B
NC/288M
A
A
A
A
NC/576M
C
NC/144M
A
A
ADSC
VDD
A
A
NC/1G
D
DQB
NC
VSS
NC
VSS
DQPA
NC
E
NC
DQB
VSS
CE1
VSS
NC
DQA
VSS
OE
ADV
VSS
DQA
VDDQ
GW
VDD
NC
VSS
NC
NC
DQA
VDD
DQA
NC
VDDQ
F
VDDQ
NC
G
H
J
NC
DQB
VDDQ
DQB
NC
VDD
BWB
VSS
NC
K
NC
DQB
VSS
CLK
VSS
NC
DQA
L
M
DQB
VDDQ
NC
DQB
NC
VSS
NC
DQA
NC
NC
VDDQ
N
DQB
NC
VSS
BWE
A1
BWA
VSS
VSS
DQA
NC
P
NC
DQPB
VSS
A0
VSS
NC
DQA
R
T
U
NC
NC/72M
VDDQ
A
A
TMS
MODE
A
TDI
VDD
NC/36M
TCK
NC
A
TDO
A
A
NC
NC
ZZ
VDDQ
Document Number: 38-05543 Rev. *I
Page 5 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
165-ball FBGA Pinout (3-Chip Enable)
Figure 5. CY7C1380D/CY7C1380F (512 K × 36)
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
NC/288M
R
2
3
4
5
6
7
8
9
10
11
CE1
BWC
BWB
CE3
BWE
ADSC
ADV
A
NC
NC/144M
A
CE2
BWD
BWA
CLK
GW
OE
ADSP
A
NC/576M
DQPC
DQC
NC
DQC
VDDQ
VDDQ
VSS
VDD
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VDD
VDDQ
VDDQ
NC/1G
DQB
DQPB
DQB
DQC
DQC
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQB
DQB
DQC
DQC
NC
DQD
DQC
VDDQ
VDD
VSS
VSS
VSS
VDD
DQB
VDDQ
NC
VDDQ
VDD
VDD
VDD
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VDD
VDD
VDD
VDDQ
VDDQ
NC
VDDQ
DQB
DQC
NC
DQD
DQB
NC
DQA
DQB
ZZ
DQA
DQD
DQD
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
DQA
DQD
DQD
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
DQA
DQD
DQPD
DQD
NC
VDDQ
VDDQ
VDD
VSS
VSS
NC
VSS
A
VSS
NC
VDD
VSS
VDDQ
VDDQ
DQA
NC
DQA
DQPA
NC
NC/72M
A
A
TDI
A1
TDO
A
A
A
A
MODE
NC/36M
A
A
TMS
TCK
A
A
A
A
8
9
10
11
A
A0
Figure 6. CY7C1382D/CY7C1382F (1 M × 18)
1
2
A
B
C
D
E
F
G
H
J
K
L
M
N
P
NC/288M
A
3
4
5
6
NC
CE3
A
CE1
CE2
BWB
NC/144M
NC
BWA
NC
NC
NC
DQB
VDDQ
VDDQ
VSS
VDD
R
7
CLK
BWE
GW
ADSC
OE
ADV
ADSP
A
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VDD
VDDQ
VDDQ
NC/1G
NC
A
A NC/576M
DQPA
DQA
NC
DQB
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
NC
DQA
NC
NC
NC
DQB
DQB
VDDQ
VDD
VSS
VSS
VSS
VDD
NC
DQA
DQB
NC
NC
VDDQ
NC
VDDQ
VDD
VDD
VDD
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VDD
VDD
VDD
VDDQ
VDDQ
NC
VDDQ
NC
NC
DQA
DQA
ZZ
NC
DQB
NC
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
NC
DQB
NC
VDDQ
VDD
VSS
VSS
VSS
VDD
VDDQ
DQA
NC
DQB
DQPB
NC
NC
VDDQ
VDDQ
VDD
VSS
VSS
NC
VSS
A
VSS
NC
VDD
VSS
VDDQ
VDDQ
DQA
NC
NC
NC
NC
NC/72M
A
A
TDI
A1
TDO
A
A
A
A
MODE
NC/36M
A
A
TMS
A0
TCK
A
A
A
A
Document Number: 38-05543 Rev. *I
Page 6 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Table 1. Pin Definitions
Name
I/O
Description
A0, A1, A
InputAddress inputs used to select one of the address locations. Sampled at the rising edge of
Synchronous the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 [4]are sampled active. A1: A0
are fed to the two-bit counter..
BWA, BWB
BWC, BWD
InputByte write select inputs, active LOW. Qualified with BWE to conduct byte writes to the SRAM.
Synchronous Sampled on the rising edge of CLK.
GW
InputGlobal write enable input, active LOW. When asserted LOW on the rising edge of CLK, a
Synchronous global write is conducted (all bytes are written, regardless of the values on BWX and BWE).
BWE
InputByte write enable input, active LOW. Sampled on the rising edge of CLK. This signal must be
Synchronous asserted LOW to conduct a byte write.
CLK
InputClock
Clock input. Used to capture all synchronous inputs to the device. Also used to increment the
burst counter when ADV is asserted LOW, during a burst operation.
CE1
InputChip enable 1 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with
Synchronous CE2 and CE3 to select or deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled
only when a new external address is loaded.
CE2 [2]
InputChip enable 2 input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction
Synchronous with CE1 and CE3 to select or deselect the device. CE2 is sampled only when a new external
address is loaded.
CE3 [2]
InputChip enable 3 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with
Synchronous CE1 and CE2 to select or deselect the device. CE3 is sampled only when a new external address
is loaded.
OE
InputOutput enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When
Asynchronous LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are tri-stated, and act
as input data pins. OE is masked during the first clock of a read cycle when emerging from a
deselected state.
ADV
InputAdvance input signal, sampled on the rising edge of CLK, active LOW. When asserted, it
Synchronous automatically increments the address in a burst cycle.
ADSP
InputAddress strobe from processor, sampled on the rising edge of CLK, active LOW. When
Synchronous asserted LOW, addresses presented to the device are captured in the address registers. A1: A0
are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is
recognized. ASDP is ignored when CE1 is deasserted HIGH.
ADSC
InputAddress strobe from controller, sampled on the rising edge of CLK, active LOW. When
Synchronous asserted LOW, addresses presented to the device are captured in the address registers. A1: A0
are also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is
recognized.
ZZ
InputZZ sleep input. This active HIGH input places the device in a non-time critical sleep condition
Asynchronous with data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ pin
has an internal pull down.
DQs, DQPX
I/OBidirectional data I/O lines. As inputs, they feed into an on-chip data register that is triggered
Synchronous by the rising edge of CLK. As outputs, they deliver the data contained in the memory location
specified by the addresses presented during the previous clock rise of the read cycle. The
direction of the pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs.
When HIGH, DQs and DQPX are placed in a tri-state condition.
VDD
Power Supply Power supply inputs to the core of the device.
VSS
VSSQ
Ground
I/O Ground
Ground for the core of the device.
Ground for the I/O circuitry.
Note
4. CE3, CE2 are for TQFP and 165 FPBGA packages only. 119 BGA is offered only in 1 chip enable.
Document Number: 38-05543 Rev. *I
Page 7 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Table 1. Pin Definitions (continued)
VDDQ
I/O Power
Supply
Power supply for the I/O circuitry.
MODE
Input-Static
Selects burst order. When tied to GND selects linear burst sequence. When tied to VDD or left
floating selects interleaved burst sequence. This is a strap pin and must remain static during
device operation. Mode pin has an internal pull up.
TDO
JTAG serial Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. If the JTAG
output
feature is not being utilized, this pin must be disconnected. This pin is not available on TQFP
Synchronous packages.
TDI
JTAG serial Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is
not being utilized, this pin can be disconnected or connected to VDD. This pin is not available on
input
Synchronous TQFP packages.
TMS
JTAG serial Serial data-in to the JTAG circuit. Sampled on the rising edge of TCK. If the JTAG feature is
input
not being utilized, this pin can be disconnected or connected to VDD. This pin is not available on
Synchronous TQFP packages.
TCK
JTAGClock
NC
–
Clock input to the JTAG circuitry. If the JTAG feature is not being utilized, this pin must be
connected to VSS. This pin is not available on TQFP packages.
No Connects. 36M, 72M, 144M, 288M, 576M, and 1G are address expansion pins and are not
internally connected to the die.
Document Number: 38-05543 Rev. *I
Page 8 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Functional Overview
Single Write Accesses Initiated by ADSP
All synchronous inputs pass through input registers controlled by
the rising edge of the clock. All data outputs pass through output
registers controlled by the rising edge of the clock. Maximum
access delay from the clock rise (tCO) is 2.6 ns (250 MHz device).
This access is initiated when both the following conditions are
satisfied at clock rise: (1) ADSP is asserted LOW and (2) CE1,
CE2, and CE3 are all asserted active. The address presented to
A is loaded into the address register and the address
advancement logic while being delivered to the memory array.
The write signals (GW, BWE, and BWX) and ADV inputs are
ignored during this first cycle.
The
CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F
supports secondary cache in systems using a linear or
interleaved burst sequence. The interleaved burst order
supports Pentium and i486 processors. The linear burst
sequence suits processors that use a linear burst sequence. The
burst order is user selectable, and is determined by sampling the
MODE input. Accesses can be initiated with either the processor
address strobe (ADSP) or the controller address strobe (ADSC).
Address advancement through the burst sequence is controlled
by the ADV input. A two-bit on-chip wraparound burst counter
captures the first address in a burst sequence and automatically
increments the address for the rest of the burst access.
Byte write operations are qualified with the byte write enable
(BWE) and byte write select (BWX) inputs. A global write enable
(GW) overrides all byte write inputs and writes data to all four
bytes. All writes are simplified with on-chip synchronous
self-timed write circuitry.
Three synchronous chip selects (CE1, CE2, CE3) and an
asynchronous output enable (OE) provide for easy bank
selection and output tri-state control. ADSP is ignored if CE1 is
HIGH.
Single Read Accesses
This access is initiated when the following conditions are
satisfied at clock rise: (1) ADSP or ADSC is asserted LOW,
(2) CE1, CE2, CE3 are all asserted active, and (3) the write
signals (GW, BWE) are all deserted HIGH. ADSP is ignored if
CE1 is HIGH. The address presented to the address inputs (A)
is stored into the address advancement logic and the address
register while being presented to the memory array. The
corresponding data is enabled to propagate to the input of the
output registers. At the rising edge of the next clock, the data is
enabled to propagate through the output register and onto the
data bus within 2.6 ns (250 MHz device) if OE is active LOW. The
only exception occurs when the SRAM is emerging from a
deselected state to a selected state; its outputs are always
tri-stated during the first cycle of the access. After the first cycle
of the access, the outputs are controlled by the OE signal.
Consecutive single read cycles are supported. Once the SRAM
is deselected at clock rise by the chip select and either ADSP or
ADSC signals, its output tri-states immediately.
Document Number: 38-05543 Rev. *I
ADSP triggered write accesses require two clock cycles to
complete. If GW is asserted LOW on the second clock rise, the
data presented to the DQs inputs is written into the
corresponding address location in the memory array. If GW is
HIGH, then the write operation is controlled by BWE and BWX
signals.
The
CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F
provides byte write capability that is described in the write cycle
descriptions table. Asserting the byte write enable input (BWE)
with the selected byte write (BWX) input, selectively writes to only
the desired bytes. Bytes not selected during a byte write
operation remain unaltered. A synchronous self-timed write
mechanism has been provided to simplify the write operations.
The CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F is a
common I/O device, the output enable (OE) must be deserted
HIGH before presenting data to the DQs inputs. Doing so
tri-states the output drivers. As a safety precaution, DQs are
automatically tri-stated whenever a write cycle is detected,
regardless of the state of OE.
Single Write Accesses Initiated by ADSC
ADSC write accesses are initiated when the following conditions
are satisfied: (1) ADSC is asserted LOW, (2) ADSP is deserted
HIGH, (3) CE1, CE2, and CE3 are all asserted active, and (4) the
appropriate combination of the write inputs (GW, BWE, and
BWX) are asserted active to conduct a write to the desired
byte(s). ADSC-triggered Write accesses require a single clock
cycle to complete. The address presented to A is loaded into the
address register and the address advancement logic while being
delivered to the memory array. The ADV input is ignored during
this cycle. If a global write is conducted, the data presented to
the DQs is written into the corresponding address location in the
memory core. If a byte write is conducted, only the selected bytes
are written. Bytes not selected during a byte write operation
remain unaltered. A synchronous self-timed write mechanism
has been provided to simplify the write operations.
The CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F is a
common I/O device, the output enable (OE) must be deserted
HIGH before presenting data to the DQs inputs. Doing so
tri-states the output drivers. As a safety precaution, DQs are
automatically tri-stated whenever a write cycle is detected,
regardless of the state of OE.
Page 9 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Burst Sequences
The
CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F
provides a two-bit wraparound counter, fed by A1: A0, that
implements an interleaved or a linear burst sequence. The
interleaved burst sequence is designed specifically to support
Intel Pentium applications. The linear burst sequence is
designed to support processors that follow a linear burst
sequence. The burst sequence is user selectable through the
MODE input.
Asserting ADV LOW at clock rise automatically increments the
burst counter to the next address in the burst sequence. Both
read and write burst operations are supported.
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ places
the SRAM in a power conservation sleep mode. Two clock cycles
are required to enter into or exit from this sleep mode. While in
this mode, data integrity is guaranteed. Accesses pending when
entering the sleep mode are not considered valid nor is the
completion of the operation guaranteed. The device must be
deselected prior to entering the sleep mode. CE1, CE2, CE3,
ADSP, and ADSC must remain inactive for the duration of tZZREC
after the ZZ input returns LOW.
Table 2. Interleaved Burst Address Table (MODE = Floating
or VDD)
First
Address
A1: A0
00
01
10
11
Second
Address
A1: A0
01
00
11
10
Third
Address
A1: A0
10
11
00
01
Fourth
Address
A1: A0
11
10
01
00
Table 3. Linear Burst Address Table (MODE = GND)
First
Address
A1: A0
00
01
10
11
Second
Address
A1: A0
01
10
11
00
Third
Address
A1: A0
10
11
00
01
Fourth
Address
A1: A0
11
00
01
10
Table 4. ZZ Mode Electrical Characteristics
Parameter
IDDZZ
tZZS
tZZREC
tZZI
tRZZI
Description
Sleep mode standby current
Device operation to ZZ
ZZ recovery time
ZZ Active to sleep current
ZZ Inactive to exit sleep current
Document Number: 38-05543 Rev. *I
Test Conditions
ZZ > VDD– 0.2 V
ZZ > VDD – 0.2 V
ZZ < 0.2 V
This parameter is sampled
This parameter is sampled
Min
–
–
2tCYC
–
0
Max
80
2tCYC
–
2tCYC
–
Unit
mA
ns
ns
ns
ns
Page 10 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Truth Table
The Truth Table for this data sheet follows.[5, 6, 7, 8, 9]
Operation
Add. Used
CE1
CE2
CE3
ZZ ADSP ADSC
ADV
WRITE OE CLK
DQ
Deselect Cycle, Power Down
None
H
X
X
L
X
L
X
X
X
L–H
Tri-state
Deselect Cycle, Power Down
None
L
L
X
L
L
X
X
X
X
L–H
Tri-state
Deselect Cycle, Power Down
None
L
X
H
L
L
X
X
X
X
L–H
Tri-state
Deselect Cycle, Power Down
None
L
L
X
L
H
L
X
X
X
L–H
Tri-state
Deselect Cycle, Power Down
None
L
X
H
L
H
L
X
X
X
L–H
Tri-state
Sleep Mode, Power Down
None
X
X
X
H
X
X
X
X
X
X
Tri-state
READ Cycle, Begin Burst
External
L
H
L
L
L
X
X
X
L
L–H
Q
READ Cycle, Begin Burst
External
L
H
L
L
L
X
X
X
H
L–H
Tri-state
WRITE Cycle, Begin Burst
External
L
H
L
L
H
L
X
L
X
L–H
D
READ Cycle, Begin Burst
External
L
H
L
L
H
L
X
H
L
L–H
Q
READ Cycle, Begin Burst
External
L
H
L
L
H
L
X
H
H
L–H
Tri-state
Next
X
X
X
L
H
H
L
H
L
L–H
Q
READ Cycle, Continue Burst
READ Cycle, Continue Burst
Next
X
X
X
L
H
H
L
H
H
L–H
Tri-state
READ Cycle, Continue Burst
Next
H
X
X
L
X
H
L
H
L
L–H
Q
READ Cycle, Continue Burst
Next
H
X
X
L
X
H
L
H
H
L–H
Tri-state
WRITE Cycle, Continue Burst
Next
X
X
X
L
H
H
L
L
X
L–H
D
WRITE Cycle, Continue Burst
Next
H
X
X
L
X
H
L
L
X
L–H
D
READ Cycle, Suspend Burst
Current
X
X
X
L
H
H
H
H
L
L–H
Q
READ Cycle, Suspend Burst
Current
X
X
X
L
H
H
H
H
H
L–H
Tri-state
READ Cycle, Suspend Burst
Current
H
X
X
L
X
H
H
H
L
L–H
Q
READ Cycle, Suspend Burst
Current
H
X
X
L
X
H
H
H
H
L–H
Tri-state
WRITE Cycle, Suspend Burst
Current
X
X
X
L
H
H
H
L
X
L–H
D
WRITE Cycle, Suspend Burst
Current
H
X
X
L
X
H
H
L
X
L–H
D
Notes
5. X = Don't Care, H = Logic HIGH, L = Logic LOW.
6. WRITE = L when any one or more byte write enable signals, and BWE = L or GW = L. WRITE = H when all byte write enable signals, BWE, GW = H.
7. The DQ pins are controlled by the current cycle and the OE signal. OE is asynchronous and is not sampled with the clock.
8. The SRAM always initiates a read cycle when ADSP is asserted, regardless of the state of GW, BWE, or BWX. Writes may occur only on subsequent clocks
after the ADSP or with the assertion of ADSC. As a result, OE must be driven HIGH prior to the start of the write cycle to allow the outputs to tri-state. OE is a
don't care for the remainder of the write cycle.
9. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle all data bits are tri-state when OE is
inactive or when the device is deselected, and all data bits behave as output when OE is active (LOW).
Document Number: 38-05543 Rev. *I
Page 11 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Truth Table for Read/Write [10, 11]
Function (CY7C1380D/CY7C1380F)
GW
BWE
BWD
BWC
BWB
BWA
Read
H
H
X
X
X
X
Read
H
L
H
H
H
H
Write Byte A – (DQA and DQPA)
Write Byte B – (DQB and DQPB)
H
L
H
H
H
L
H
L
H
H
L
H
Write Bytes B, A
H
L
H
H
L
L
Write Byte C – (DQC and DQPC)
H
L
H
L
H
H
Write Bytes C, A
H
L
H
L
H
L
Write Bytes C, B
H
L
H
L
L
H
Write Bytes C, B, A
H
L
H
L
L
L
Write Byte D – (DQD and DQPD)
H
L
L
H
H
H
Write Bytes D, A
H
L
L
H
H
L
Write Bytes D, B
H
L
L
H
L
H
Write Bytes D, B, A
H
L
L
H
L
L
Write Bytes D, C
H
L
L
L
H
H
Write Bytes D, C, A
H
L
L
L
H
L
Write Bytes D, C, B
H
L
L
L
L
H
Write All Bytes
H
L
L
L
L
L
Write All Bytes
L
X
X
X
X
X
Truth Table for Read/Write [10, 11]
Function (CY7C1382D/CY7C1382F)
GW
BWE
BWB
BWA
Read
H
H
X
X
Read
H
L
H
H
Write Byte A – (DQA and DQPA)
H
L
H
L
Write Byte B – (DQB and DQPB)
Write Bytes B, A
H
L
L
H
H
L
L
L
Write All Bytes
H
L
L
L
Write All Bytes
L
X
X
X
Notes
10. X = Don't Care, H = Logic HIGH, L = Logic LOW.
11. Table only lists a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write is done based on which byte write is active.
Document Number: 38-05543 Rev. *I
Page 12 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
IEEE 1149.1 Serial Boundary Scan (JTAG)
The CY7C1380D/CY7C1382D incorporates a serial boundary
scan test access port (TAP).This part is fully compliant with
1149.1. The TAP operates using JEDEC-standard 3.3 V or 2.5 V
I/O logic levels.
The CY7C1380D/CY7C1382D contains a TAP controller,
instruction register, boundary scan register, bypass register, and
ID register.
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG
feature. To disable the TAP controller, TCK must be tied LOW
(VSS) to prevent clocking of the device. TDI and TMS are
internally pulled up and may be unconnected. They may
alternately be connected to VDD through a pull up resistor. TDO
must be left unconnected. Upon power up, the device comes up
in a reset state which does not interfere with the operation of the
device.
Test Data-In (TDI)
The TDI ball is used to serially input information into the registers
and can be connected to the input of any of the registers. The
register between TDI and TDO is chosen by the instruction that
is loaded into the TAP instruction register. TDI is internally pulled
up and can be unconnected if the TAP is unused in an
application. TDI is connected to the most significant bit (MSB) of
any register. (See TAP Controller Block Diagram.)
Test Data-Out (TDO)
The TDO output ball is used to serially clock data-out from the
registers. The output is active depending upon the current state
of the TAP state machine. The output changes on the falling edge
of TCK. TDO is connected to the least significant bit (LSB) of any
register. (See TAP Controller State Diagram.)
TAP Controller Block Diagram
0
TAP Controller State Diagram
Bypass Register
2 1 0
1
TEST-LOGIC
RESET
TDI
0
0
RUN-TEST/
IDLE
1
SELECT
DR-SCAN
1
SELECT
IR-SCAN
0
1
Selection
Circuitry
Instruction Register
31 30 29 . . . 2 1 0
1
S election
TDO
Circuitr y
Identification Register
0
1
CAPTURE-DR
x . . . . . 2 1 0
CAPTURE-IR
Boundary Scan Register
0
0
SHIFT-DR
0
SHIFT-IR
1
EXIT1-DR
1
TCK
EXIT1-IR
0
0
PAUSE-IR
1
TMS
TAP CONTROLLER
0
Performing a TAP Reset
1
EXIT2-DR
0
EXIT2-IR
1
1
UPDATE-DR
UPDATE-IR
1
1
0
PAUSE-DR
0
0
1
0
1
0
A Reset is performed by forcing TMS HIGH (VDD) for five rising
edges of TCK. This Reset does not affect the operation of the
SRAM and may be performed while the SRAM is operating.
At power up, the TAP is reset internally to ensure that TDO
comes up in a high Z state.
TAP Registers
The 0 or 1 next to each state represents the value of TMS at the
rising edge of TCK.
Test Access Port (TAP)
Test Clock (TCK)
The test clock is used only with the TAP controller. All inputs are
captured on the rising edge of TCK. All outputs are driven from
the falling edge of TCK.
Test MODE SELECT (TMS)
The TMS input is used to give commands to the TAP controller
and is sampled on the rising edge of TCK. This pin may be left
unconnected if the TAP is not used. The ball is pulled up
internally, resulting in a logic HIGH level.
Document Number: 38-05543 Rev. *I
Registers are connected between the TDI and TDO balls and
enable data to be scanned in and out of the SRAM test circuitry.
Only one register can be selected at a time through the
instruction register. Data is serially loaded into the TDI ball on the
rising edge of TCK. Data is output on the TDO ball on the falling
edge of TCK.
Instruction Register
Three-bit instructions can be serially loaded into the instruction
register. This register is loaded when it is placed between the TDI
and TDO balls as shown in the TAP Controller Block Diagram.
Upon power up, the instruction register is loaded with the
IDCODE instruction. It is also loaded with the IDCODE
instruction if the controller is placed in a reset state as described
in the previous section.
Page 13 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
When the TAP controller is in the Capture-IR state, the two least
significant bits are loaded with a binary ‘01’ pattern to enable fault
isolation of the board-level serial test data path.
Bypass Register
To save time when serially shifting data through registers, it is
sometimes advantageous to skip certain chips. The bypass
register is a single-bit register that can be placed between the
TDI and TDO balls. This enables data to be shifted through the
SRAM with minimal delay. The bypass register is set LOW (VSS)
when the BYPASS instruction is executed.
Boundary Scan Register
The boundary scan register is connected to all the input and
bidirectional balls on the SRAM.
The boundary scan register is loaded with the contents of the
RAM input and output ring when the TAP controller is in the
Capture-DR state and is then placed between the TDI and TDO
balls when the controller is moved to the Shift-DR state. The
EXTEST, SAMPLE/PRELOAD, and SAMPLE Z instructions can
be used to capture the contents of the input and output ring.
The boundary scan order tables show the order in which the bits
are connected. Each bit corresponds to one of the bumps on the
SRAM package. The MSB of the register is connected to TDI,
and the LSB is connected to TDO.
Identification (ID) Register
The ID register is loaded with a vendor-specific 32-bit code
during the Capture-DR state when the IDCODE command is
loaded in the instruction register. The IDCODE is hardwired into
the SRAM and can be shifted out when the TAP controller is in
the Shift-DR state. The ID register has a vendor code and other
information described in the “Identification Register Definitions”
on page 17.
TAP Instruction Set
Overview
Eight different instructions are possible with the three bit
instruction register. All combinations are listed in “Identification
Codes” on page 17. Three of these instructions are listed as
RESERVED and must not be used. The other five instructions
are described in detail in this section.
Instructions are loaded into the TAP controller during the Shift-IR
state when the instruction register is placed between TDI and
TDO. During this state, instructions are shifted through the
instruction register through the TDI and TDO balls. To execute
the instruction once it is shifted in, the TAP controller must be
moved into the Update-IR state.
EXTEST
The EXTEST instruction enables the preloaded data to be driven
out through the system output pins. This instruction also selects
the boundary scan register to be connected for serial access
between the TDI and TDO in the Shift-DR controller state.
IDCODE
The IDCODE instruction causes a vendor-specific 32-bit code to
be loaded into the instruction register. It also places the
instruction register between the TDI and TDO balls and enables
Document Number: 38-05543 Rev. *I
the IDCODE to be shifted out of the device when the TAP
controller enters the Shift-DR state.
The IDCODE instruction is loaded into the instruction register
upon power up or whenever the TAP controller is given a test
logic reset state.
SAMPLE Z
The SAMPLE Z instruction causes the boundary scan register to
be connected between the TDI and TDO balls when the TAP
controller is in a Shift-DR state. The SAMPLE Z command places
all SRAM outputs into a high Z state.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the
instruction register and the TAP controller is in the Capture-DR
state, a snapshot of data on the input and output pins is captured
in the boundary scan register.
The TAP controller clock can only operate at a frequency up to
20 MHz, while the SRAM clock operates more than an order of
magnitude faster. As there is a large difference in the clock
frequencies, it is possible that during the Capture-DR state, an
input or output undergoes a transition. The TAP may then try to
capture a signal while in transition (metastable state). This does
not harm the device, but there is no guarantee as to the value
that is captured. Repeatable results may not be possible.
To guarantee that the boundary scan register captures the
correct value of a signal, the SRAM signal must be stabilized
long enough to meet the TAP controller's capture setup plus hold
times (tCS and tCH). The SRAM clock input might not be captured
correctly if there is no way in a design to stop (or slow) the clock
during a SAMPLE/PRELOAD instruction. If this is an issue, it is
still possible to capture all other signals and simply ignore the
value of the CK and CK# captured in the boundary scan register.
Once the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
PRELOAD enables an initial data pattern to be placed at the
latched parallel outputs of the boundary scan register cells prior
to the selection of another boundary scan test operation.
The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required; that is, while data captured is
shifted out, the preloaded data is shifted in.
BYPASS
When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO balls. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
EXTEST Output Bus Tri-State
IEEE Standard 1149.1 mandates that the TAP controller be able
to put the output bus into a tri-state mode.
The boundary scan register has a special bit located at Bit #85
(for 119-BGA package) or Bit #89 (for 165-fBGA package). When
this scan cell, called the “extest output bus tri-state,” is latched
into the preload register during the Update-DR state in the TAP
controller, it directly controls the state of the output (Q-bus) pins,
Page 14 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
when the EXTEST is entered as the current instruction. When
HIGH, it enables the output buffers to drive the output bus. When
LOW, this bit places the output bus into a high Z condition.
output Q-bus pins. Note that this bit is preset HIGH to enable the
output when the device is powered up, and also when the TAP
controller is in the Test-Logic-Reset state.
This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that cell,
during the Shift-DR state. During Update-DR, the value loaded
into that shift-register cell latches into the preload register. When
the EXTEST instruction is entered, this bit directly controls the
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
TAP Timing
Test Clock
(TCK)
t
t TH
t TMSS
t TMSH
t TDIS
t TDIH
TL
t CYC
Test Mode Select
(TMS)
Test Data-In
(TDI)
t TDOV
t TDOX
Test Data-Out
(TDO)
DON’T CARE
UNDEFINED
TAP AC Switching Characteristics
Over the Operating Range [12, 13]
Parameter
Description
Clock
TCK Clock Cycle Time
tTCYC
TCK Clock Frequency
tTF
tTH
TCK Clock HIGH time
TCK Clock LOW time
tTL
Output Times
TCK Clock LOW to TDO Valid
tTDOV
TCK Clock LOW to TDO Invalid
tTDOX
Setup Times
TMS Setup to TCK Clock Rise
tTMSS
TDI Setup to TCK Clock Rise
tTDIS
Capture Setup to TCK Rise
tCS
Hold Times
TMS Hold after TCK Clock Rise
tTMSH
TDI Hold after Clock Rise
tTDIH
tCH
Capture Hold after Clock Rise
Min
Max
Unit
50
–
20
20
–
20
–
–
ns
MHz
ns
ns
–
0
10
–
ns
ns
5
5
5
–
–
–
ns
ns
ns
5
5
5
–
–
–
ns
ns
ns
Notes
12. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
13. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns.
Document Number: 38-05543 Rev. *I
Page 15 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
3.3 V TAP AC Test Conditions
2.5 V TAP AC Test Conditions
Input pulse levels................................................VSS to 3.3 V
Input pulse levels................................................ VSS to 2.5 V
Input rise and fall times....................................................1 ns
Input rise and fall time .....................................................1 ns
Input timing reference levels.................. ........................1.5 V
Input timing reference levels.................. ......................1.25 V
Output reference levels .................. ...............................1.5 V
Output reference levels ................. ..............................1.25 V
Test load termination supply voltage ................ .............1.5 V
Test load termination supply voltage ................... ........1.25 V
Figure 7. 3.3 V TAP AC Output Load Equivalent
Figure 8. 2.5 V TAP AC Output Load Equivalent
1.5V
1.25V
50Ω
50Ω
TDO
TDO
Z O= 50 Ω
Z O= 50 Ω
20pF
20pF
TAP DC Electrical Characteristics and Operating Conditions
(0 °C < TA < +70 °C; VDD = 3.3 V ± 0.165 V unless otherwise noted) [14]
Parameter
Description
Test Conditions
Min
Max
Unit
2.4
–
V
VOH1
Output HIGH Voltage
IOH = –4.0 mA, VDDQ = 3.3 V
IOH = –1.0 mA, VDDQ = 2.5 V
2.0
–
V
VOH2
Output HIGH Voltage
IOH = –100 µA
VDDQ = 3.3 V
2.9
–
V
VDDQ = 2.5 V
2.1
–
V
VOL1
Output LOW Voltage
IOL = 8.0 mA
VDDQ = 3.3 V
–
0.4
V
VDDQ = 2.5 V
–
0.4
V
VOL2
Output LOW Voltage
IOL = 100 µA
VDDQ = 3.3 V
–
0.2
V
VDDQ = 2.5 V
–
0.2
V
VIH
Input HIGH Voltage
VDDQ = 3.3 V
2.0
VDD + 0.3
V
VDDQ = 2.5 V
1.7
VDD + 0.3
V
VIL
Input LOW Voltage
VDDQ = 3.3 V
–0.3
0.8
V
VDDQ = 2.5 V
–0.3
0.7
V
IX
Input Load Current
–5
5
µA
GND < VIN < VDDQ
Note
14. All voltages referenced to VSS (GND).
Document Number: 38-05543 Rev. *I
Page 16 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Identification Register Definitions
CY7C1380D/CY7C1380F CY7C1382D/CY7C1382F
(512 K × 36)
(1 Mbit × 18)
Instruction Field
Description
Revision Number (31:29)
000
000
Device Depth (28:24) [15]
01011
01011
Device Width (23:18) 119-BGA
101000
101000
Defines the memory type and
architecture.
Device Width (23:18) 165-FBGA
000000
000000
Defines the memory type and
architecture.
Cypress Device ID (17:12)
Cypress JEDEC ID Code (11:1)
Describes the version number.
Reserved for internal use.
100101
010101
Defines the width and density.
00000110100
00000110100
Allows unique identification of
SRAM vendor.
1
1
ID Register Presence Indicator (0)
Indicates the presence of an ID
register.
Scan Register Sizes
Register Name
Bit Size (×36)
Bit Size (×18)
Instruction
3
3
Bypass
1
1
ID
32
32
Boundary Scan Order (119-ball BGA package)
85
85
Boundary Scan Order (165-ball FPBGA package)
89
89
Identification Codes
Instruction
Code
Description
EXTEST
000
Captures I/O ring contents. Places the boundary scan register between TDI and TDO.
Forces all SRAM outputs to high Z state.
IDCODE
001
Loads the ID register with the vendor ID code and places the register between TDI and TDO.
This operation does not affect SRAM operations.
SAMPLE Z
010
Captures I/O ring contents. Places the boundary scan register between TDI and TDO.
Forces all SRAM output drivers to a high Z state.
RESERVED
011
Do Not Use. This instruction is reserved for future use.
SAMPLE/PRELOAD
100
Captures I/O ring contents. Places the boundary scan register between TDI and TDO.
Does not affect SRAM operation.
RESERVED
101
Do Not Use. This instruction is reserved for future use.
RESERVED
110
Do Not Use. This instruction is reserved for future use.
BYPASS
111
Places the bypass register between TDI and TDO. This operation does not affect SRAM
operations.
Note
15. Bit #24 is 1 in the register definitions for both 2.5 V and 3.3 V versions of this device.
Document Number: 38-05543 Rev. *I
Page 17 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
119-ball BGA Boundary Scan Order [16, 17]
Bit #
Ball ID
Bit #
Ball ID
Bit #
Ball ID
1
H4
T4
23
2
24
3
T5
25
4
T6
26
5
R5
27
G6
49
6
L5
28
E6
50
7
R6
29
D6
51
8
U6
30
C7
52
9
R7
31
B7
53
10
T7
32
C6
54
Bit #
Ball ID
F6
45
G4
67
L1
E7
46
A4
68
M2
D7
47
G3
69
N1
H7
48
C3
70
P1
B2
71
K1
B3
72
L2
A3
73
C2
74
N2
P2
A2
75
R3
B1
76
T1
11
P6
33
A6
55
C1
77
R1
12
N7
34
C5
56
D2
78
T2
13
M6
35
B5
57
E1
79
L3
14
L7
36
G5
58
F2
80
R2
15
K6
37
B6
59
G1
81
T3
16
P7
38
D4
60
H2
82
L4
17
N6
39
B4
61
D1
83
N4
18
L6
40
F4
62
E2
84
P4
19
K7
41
M4
63
G2
85
Internal
20
J5
42
A5
64
H1
21
H6
43
K4
65
J3
22
G7
44
E4
66
2K
Notes
16. Balls which are NC (No Connect) are pre-set LOW.
17. Bit# 85 is pre-set HIGH.
Document Number: 38-05543 Rev. *I
Page 18 of 33
[+] Feedback
CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
165-ball BGA Boundary Scan Order [18, 19]
Bit #
Ball ID
Bit #
Ball ID
1
2
3
N10
4
P11
Bit #
Ball ID
N6
31
N7
32
D10
61
G1
C11
62
D2
33
A11
63
E2
34
B11
64
F2
5
P8
35
A10
65
G2
6
R8
36
B10
66
H1
7
R9
37
A9
67
H3
8
P9
38
B9
68
J1
9
P10
39
C10
69
K1
10
R10
40
A8
70
L1
11
R11
41
B8
71
M1
12
H11
42
A7
72
J2
13
N11
43
B7
73
K2
14
M11
44
B6
74
L2
15
L11
45
A6
75
M2
16
K11
46
B5
76
N1
17
J11
47
A5
77
N2
18
M10
48
A4
78
P1
19
L10
49
B4
79
R1
20
K10
50
B3
80
R2
21
J10
51
A3
81
P3
22
H9
52
A2
82
R3
23
H10
53
B2
83
P2
24
G11
54
C2
84
R4
25
F11
55
B1
85
P4
26
E11
56
A1
86
N5
27
D11
57
C1
87
P6
28
G10
58
D1
88
R6
89
Internal
29
F10
59
E1
30
E10
60
F1
Note
18. Balls which are NC (No Connect) are pre-set LOW.
19. Bit# 89 is pre-set HIGH.
Document Number: 38-05543 Rev. *I
Page 19 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Maximum Ratings
DC Input Voltage ................................. –0.5 V to VDD + 0.5 V
Exceeding the maximum ratings may impair the useful life of the
device. For user guidelines, not tested.
Storage Temperature ............................... –65 °C to +150 °C
Ambient Temperature with
Power Applied .......................................... –55 °C to +125 °C
Supply Voltage on VDD Relative to GND ......–0.3 V to +4.6 V
Supply Voltage on VDDQ Relative to GND ..... –0.3 V to +VDD
DC Voltage Applied to Outputs
in tri-state...........................................–0.5 V to VDDQ + 0.5 V
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage......................................... > 2001 V
(per MIL-STD-883, Method 3015)
Latch-up Current.................................................... > 200 mA
Operating Range
Ambient
VDD
VDDQ
Temperature
Commercial 0 °C to +70 °C 3.3 V–5%/+10% 2.5 V – 5%
to VDD
Industrial
–40 °C to +85 °C
Range
Electrical Characteristics
Over the Operating Range [20, 21]
Parameter
Description
Power Supply Voltage
VDD
I/O Supply Voltage
VDDQ
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VIH
Input HIGH Voltage [20]
VIL
Input LOW Voltage [20]
IX
Input Leakage Current
except ZZ and MODE
Input Current of MODE
Input Current of ZZ
Test Conditions
for 3.3 V I/O
for 2.5 V I/O
for 3.3 V I/O, IOH = –4.0 mA
for 2.5 V I/O, IOH = –1.0 mA
for 3.3 V I/O, IOL = 8.0 mA
for 2.5 V I/O, IOL = 1.0 mA
for 3.3 V I/O
for 2.5 V I/O
for 3.3 V I/O
for 2.5 V I/O
GND  VI  VDDQ
Input = VSS
Input = VDD
Input = VSS
Input = VDD
GND  VI  VDDQ, Output Disabled
VDD = Max., IOUT = 0 mA,
f = fMAX = 1/tCYC
IOZ
IDD
Output Leakage Current
VDD Operating Supply
Current
ISB1
Automatic CE Power Down VDD = Max, Device Deselected,
Current—TTL Inputs
VIN  VIH or VIN  VIL
f = fMAX = 1/tCYC
ISB2
Automatic CE Power Down
Current—CMOS Inputs
Automatic CE Power Down
Current—CMOS Inputs
ISB3
ISB4
Min
3.135
3.135
2.375
2.4
2.0
–
–
2.0
1.7
–0.3
–0.3
–5
–5
–
–
–
–
–
–
–
–
5
–
30
5
350
300
275
160
150
140
70
A
A
A
A
A
mA
mA
mA
mA
mA
mA
mA
–
–
–
–
135
130
125
80
mA
mA
mA
mA
–30
–5
4.0-ns cycle, 250 MHz
5.0-ns cycle, 200 MHz
6.0-ns cycle, 167 MHz
4.0-ns cycle, 250 MHz
5.0-ns cycle, 200 MHz
6.0-ns cycle, 167 MHz
All speeds
VDD = Max, Device Deselected,
VIN  0.3 V or VIN > VDDQ – 0.3 V, f = 0
VDD = Max, Device Deselected, or
4.0-ns cycle, 250 MHz
VIN  0.3 V or VIN > VDDQ – 0.3 V
5.0-ns cycle, 200 MHz
f = fMAX = 1/tCYC
6.0-ns cycle, 167 MHz
All speeds
Automatic CE Power Down VDD = Max, Device Deselected,
Current—TTL Inputs
VIN  VIH or VIN  VIL, f = 0
Max
Unit
3.6
V
VDD
V
2.625
V
–
V
–
V
0.4
V
0.4
V
VDD + 0.3V V
VDD + 0.3V V
0.8
V
0.7
V
5
A
Notes
20. Overshoot: VIH(AC) < VDD +1.5 V (pulse width less than tCYC/2), undershoot: VIL(AC) > –2 V (pulse width less than tCYC/2).
21. TPower up: Assumes a linear ramp from 0v to VDD(min.) within 200 ms. During this time VIH < VDD and VDDQ < VDD.
Document Number: 38-05543 Rev. *I
Page 20 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Capacitance [22]
Parameter
100 TQFP
Package
119 BGA
Package
165 FBGA
Package
Unit
5
8
9
pF
5
8
9
pF
5
8
9
pF
Test Conditions
100 TQFP
Package
119 BGA
Package
165 FBGA
Package
Unit
Test conditions follow standard
test methods and procedures
for measuring thermal
impedance, in accordance with
EIA/JESD51.
28.66
23.8
20.7
°C/W
4.08
6.2
4.0
°C/W
Description
CIN
Input Capacitance
CCLK
Clock Input Capacitance
CIO
Input/Output Capacitance
Test Conditions
TA = 25 °C, f = 1 MHz,
VDD = 3.3 V.
VDDQ = 2.5 V
Thermal Resistance [22]
Parameter
Description
JA
Thermal Resistance
(Junction to Ambient)
JC
Thermal Resistance
(Junction to Case)
Figure 9. AC Test Loads and Waveforms
3.3 V I/O Test Load
R = 317 
3.3 V
OUTPUT
OUTPUT
RL = 50 
Z0 = 50 
GND
5 pF
R = 351 
VT = 1.5 V
INCLUDING
JIG AND
SCOPE
(a)
2.5 V I/O Test Load
OUTPUT
RL = 50 
Z0 = 50 
VT = 1.25 V
(a)
10%
(c)
ALL INPUT PULSES
VDDQ
INCLUDING
JIG AND
SCOPE
 1 ns
(b)
GND
5 pF
90%
10%
90%
 1 ns
R = 1667 
2.5 V
OUTPUT
ALL INPUT PULSES
VDDQ
R = 1538 
(b)
10%
90%
10%
90%
 1 ns
 1 ns
(c)
Note
22. Tested initially and after any design or process change that may affect these parameters.
Document Number: 38-05543 Rev. *I
Page 21 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Switching Characteristics
Over the Operating Range [23, 24]
Description
Parameter
tPOWER
VDD(Typical) to the first Access [25]
250 MHz
200 MHz
167 MHz
Unit
Min
Max
Min
Max
Min
Max
1
–
1
–
1
–
ms
Clock
tCYC
Clock Cycle Time
4.0
–
5
–
6
–
ns
tCH
Clock HIGH
1.7
–
2.0
–
2.2
–
ns
tCL
Clock LOW
1.7
–
2.0
–
2.2
–
ns
Output Times
tCO
Data Output Valid After CLK Rise
–
2.6
–
3.0
–
3.4
ns
tDOH
Data Output Hold After CLK Rise
1.0
–
1.3
–
1.3
–
ns
[26, 27, 28]
tCLZ
Clock to Low-Z
1.0
–
1.3
–
1.3
–
ns
tCHZ
Clock to High-Z [26, 27, 28]
–
2.6
–
3.0
–
3.4
ns
tOEV
OE LOW to Output Valid
–
2.6
–
3.0
–
3.4
ns
tOELZ
OE LOW to Output Low-Z [26, 27, 28]
0
–
0
–
0
–
ns
–
2.6
–
3.0
–
3.4
ns
tOEHZ
OE HIGH to Output High-Z
[26, 27, 28]
Setup Times
tAS
Address Setup Before CLK Rise
1.2
–
1.4
–
1.5
–
ns
tADS
ADSC, ADSP Setup Before CLK Rise
1.2
–
1.4
–
1.5
–
ns
tADVS
ADV Setup Before CLK Rise
1.2
–
1.4
–
1.5
–
ns
tWES
GW, BWE, BWX Setup Before CLK Rise
1.2
–
1.4
–
1.5
–
ns
tDS
Data Input Setup Before CLK Rise
1.2
–
1.4
–
1.5
–
ns
tCES
Chip Enable SetUp Before CLK Rise
1.2
–
1.4
–
1.5
–
ns
tAH
Address Hold After CLK Rise
0.3
–
0.4
–
0.5
–
ns
tADH
ADSP, ADSC Hold After CLK Rise
0.3
–
0.4
–
0.5
–
ns
tADVH
ADV Hold After CLK Rise
0.3
–
0.4
–
0.5
–
ns
tWEH
GW, BWE, BWX Hold After CLK Rise
0.3
–
0.4
–
0.5
–
ns
tDH
Data Input Hold After CLK Rise
0.3
–
0.4
–
0.5
–
ns
tCEH
Chip Enable Hold After CLK Rise
0.3
–
0.4
–
0.5
–
ns
Hold Times
Notes
23. Timing reference level is 1.5 V when VDDQ = 3.3 V and is 1.25 V when VDDQ = 2.5 V.
24. Test conditions shown in (a) of AC Test Loads unless otherwise noted.
25. This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially before a read or write operation
can be initiated.
26. tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of “AC Test Loads and Waveforms” on page 21. Transition is measured ± 200 mV
from steady-state voltage.
27. At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve high Z prior to low Z under the same system conditions.
28. This parameter is sampled and not 100% tested.
Document Number: 38-05543 Rev. *I
Page 22 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Switching Waveforms
Figure 10. Read Cycle Timing [29]
t CYC
CLK
t
t
ADS
CH
t
CL
t
ADH
ADSP
t ADS
tADH
ADSC
t AS
tAH
A1
ADDRESS
A2
t WES
A3
Burst continued with
new base address
tWEH
GW, BWE,
BWx
t CES
Deselect
cycle
tCEH
CE
t ADVS
tADVH
ADV
ADV
suspends
burst.
OE
t OEHZ
t CLZ
Data Out (Q)
High-Z
Q(A1)
t OEV
t CO
t OELZ
t DOH
Q(A2)
t CHZ
Q(A2 + 1)
Q(A2 + 2)
Q(A2 + 3)
Q(A2)
Q(A2 + 1)
t CO
Burst wraps around
to its initial state
Single READ
BURST READ
DON’T CARE
UNDEFINED
Note
29. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH.
Document Number: 38-05543 Rev. *I
Page 23 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Switching Waveforms
(continued)
Figure 11. Write Cycle Timing [30, 31]
t CYC
CLK
tCH
t ADS
tCL
tADH
ADSP
t ADS
ADSC extends burst
tADH
t ADS
tADH
ADSC
t AS
tAH
A1
ADDRESS
A2
A3
Byte write signals are
ignored for first cycle when
ADSP initiates burst
t WES tWEH
BWE,
BW X
t WES tWEH
GW
t CES
tCEH
CE
t
t
ADVS ADVH
ADV
ADV suspends burst
OE
t DS
Data In (D)
High-Z
t
OEHZ
tDH
D(A1)
D(A2)
D(A2 + 1)
D(A2 + 1)
D(A2 + 2)
D(A2 + 3)
D(A3)
D(A3 + 1)
D(A3 + 2)
ata Out (Q)
BURST READ
Single WRITE
BURST WRITE
DON’T CARE
Extended BURST WRITE
UNDEFINED
Notes
30. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH.
31. Full width write can be initiated by either GW LOW; or by GW HIGH, BWE LOW and BWX LOW.
Document Number: 38-05543 Rev. *I
Page 24 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Switching Waveforms
(continued)
Figure 12. Read/Write Cycle Timing [32, 33, 34]
tCYC
CLK
tCL
tCH
t ADS
tADH
t AS
tAH
ADSP
ADSC
ADDRESS
A1
A2
A3
A4
A5
A6
t WES tWEH
BWE,
BW X
t CES
tCEH
CE
ADV
OE
t DS
tCO
tDH
t OELZ
Data In (D)
High-Z
tOEHZ
tCLZ
Data Out (Q)
High-Z
Q(A1)
D(A5)
D(A3)
Q(A2)
Back-to-Back READs
Q(A4)
Single WRITE
Q(A4+1)
BURST READ
DON’T CARE
Q(A4+2)
D(A6)
Q(A4+3)
Back-to-Back
WRITEs
UNDEFINED
Notes
32. On this diagram, when CE is LOW: CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH: CE1 is HIGH or CE2 is LOW or CE3 is HIGH.
33. The data bus (Q) remains in high Z following a WRITE cycle, unless a new read access is initiated by ADSP or ADSC.
34. GW is HIGH.
Document Number: 38-05543 Rev. *I
Page 25 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Switching Waveforms
(continued)
Figure 13. ZZ Mode Timing [35, 36]
CLK
t
ZZ
I
t
t
ZZ
ZZREC
ZZI
SUPPLY
I
t RZZI
DDZZ
ALL INPUTS
DESELECT or READ Only
(except ZZ)
Outputs (Q)
High-Z
DON’T CARE
Notes
35. Device must be deselected when entering ZZ mode. See “Truth Table” on page 11 for all possible signal conditions to deselect the device.
36. DQs are in high Z when exiting ZZ sleep mode.
Document Number: 38-05543 Rev. *I
Page 26 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Ordering Information
Table 5 lists the key package features and ordering codes. The table contains only the parts that are currently available. If you do not
see what you are looking for, contact your local sales representative. For more information, visit the Cypress website at
www.cypress.com and refer to the product summary page at http://www.cypress.com/products.
Table 5. Key Features and Ordering Information
Speed
(MHz)
Package
Diagram
Ordering Code
Part and Package Type
Operating
Range
250
CY7C1380D-250AXC
51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free
Commercial
200
CY7C1380D-200AXC
51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free
Commercial
51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free
Commercial
CY7C1382D-200AXC
167
CY7C1380D-167AXC
CY7C1382D-167AXC
CY7C1380D-167BZC
51-85180 165-ball Fine-Pitch Ball Grid Array (13 × 15 × 1.4 mm)
CY7C1380D-167AXI
51-85050 100-pin Thin Quad Flat Pack (14 × 20 × 1.4 mm) Pb-free
CY7C1380F-167BZI
51-85180 165-ball Fine-Pitch Ball Grid Array (13 × 15 × 1.4 mm)
Industrial
Ordering Code Definitions
CY 7C 138X
X -
XXX
XX
X
Temperature Range: X = C or I
C = Commercial; I = Industrial
Package Type: XX = AX or BZ
AX = 100-pin TQFP (Pb-free)
BZ = 165-ball FPBGA
Frequency Range: XXX = 250 MHz or 200 MHz or 167 MHz
Die Revision: X = D or F
D  90 nm
F  90nm errata fix PCN084636
Part Identifier: 138X = 1380 or 1382
1380 = SCD, 512 K × 36 (18 Mb)
1382 = SCD, 1 Mb × 18 (18 Mb)
Marketing Code: 7C = SRAM
Company ID: CY = Cypress
Document Number: 38-05543 Rev. *I
Page 27 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Package Diagrams
Figure 14. 100-pin Thin Plastic Quad Flat Pack (14 × 20 × 1.4 mm), 51-85050
51-85050 *D
Document Number: 38-05543 Rev. *I
Page 28 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Package Diagrams
(continued)
Figure 15. 119-ball BGA (14 × 22 × 2.4 mm), 51-85115
51-85115 *C
Document Number: 38-05543 Rev. *I
Page 29 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Package Diagrams
(continued)
Figure 16. 165-ball FBGA (13 × 15 × 1.4 mm), 51-85180
51-85180 *C
Document Number: 38-05543 Rev. *I
Page 30 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Acronyms
Document Conventions
Acronym
Description
Units of Measure
BGA
ball grid array
CMOS
complementary metal oxide semiconductor
ns
nano seconds
CE
chip enable
V
Volts
CEN
clock enable
µA
micro Amperes
FPBGA
fine-pitch ball grid array
mA
milli Amperes
I/O
input/output
mm
milli meter
JTAG
Joint Test Action Group
ms
milli seconds
LSB
least significant bit
MHz
Mega Hertz
MSB
most significant bit
pF
pico Farad
OE
output enable
W
Watts
SRAM
static random access memory
°C
degree Celcius
TCK
test clock
%
percent
TMS
test mode select
TDI
test data-in
TDO
test data-out
TQFP
thin quad flat pack
WE
write enable
TTL
transistor–transistor logic
Document Number: 38-05543 Rev. *I
Symbol
Unit of Measure
Page 31 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Document History Page
Document Title: CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F, 18-Mbit (512 K × 36/1 M × 18) Pipelined SRAM
Document Number: 38-05543
REV.
ECN NO. Submission
Date
Orig. of
Change
Description of Change
**
254515
See ECN
RKF
New data sheet
*A
288531
See ECN
SYT
Edited description under “IEEE 1149.1 Serial Boundary Scan (JTAG)” for
non-compliance with 1149.1
Removed 225MHz and 133 MHz Speed Bins
Added Pb-free information for 100-Pin TQFP, 119 BGA and 165 FBGA Packages
Added comment of ‘Pb-free BG packages availability’ below the Ordering Information
*B
326078
See ECN
PCI
Address expansion pins/balls in the pinouts for all packages are modified as per
JEDEC standard
Added description on EXTEST Output Bus Tri-State
Changed description on the Tap Instruction Set Overview and Extest
Changed Device Width (23:18) for 119-BGA from 000000 to 101000
Added separate row for 165 -FBGA Device Width (23:18)
Changed JA and JC for TQFP Package from 31 and 6 C/W to 28.66 and 4.08
C/W respectively
Changed JA and JC for BGA Package from 45 and 7 C/W to 23.8 and 6.2 C/W
respectively
Changed JA and JC for FBGA Package from 46 and 3 C/W to 20.7 and 4.0 C/W
respectively
Modified VOL, VOH test conditions
Removed comment of ‘Pb-free BG packages availability’ below the Ordering Information
Updated Ordering Information Table
*C
416321
See ECN
NXR
Converted from Preliminary to Final
Changed address of Cypress Semiconductor Corporation on Page# 1 from “3901
North First Street” to “198 Champion Court”
Changed the description of IX from Input Load Current to Input Leakage Current on
page# 18
Changed the IX current values of MODE on page # 18 from –5 A and 30 A
to –30 A and 5 A
Changed the IX current values of ZZ on page # 18 from –30 A and 5 A
to –5 A and 30 A
Changed VIH < VDD to VIH < VDDon page # 18
Replaced Package Name column with Package Diagram in the Ordering
Information table
Updated Ordering Information Table
*D
475009
See ECN
VKN
Added the Maximum Rating for Supply Voltage on VDDQ Relative to GND
Changed tTH, tTL from 25 ns to 20 ns and tTDOV from 5 ns to 10 ns in TAP AC
Switching Characteristics table.
Updated the Ordering Information table.
*E
776456
See ECN
VKN
Added Part numbers CY7C1380F and CY7C1382F and its related information
Added footnote# 3 regarding Chip Enable
Updated Ordering Information table
*F
2648065
01/27/09
*G
2897120
03/22/2010
NJY
Removed inactive parts from Ordering Information table; Updated package diagram.
*H
3067398
10/20/10
NJY
The part CY7C1380F-167BGC is found to be in “EOL-Prune” state in Oracle PLM
and therefore, it has been removed from the Ordering information table.
Added Ordering code definitions.
VKN/PYRS Modified note on top of the Ordering information table
Updated Ordering Information table to include CY7C1380F/CY7C1382F in 100-Pin
TSOP and 165 BGA package
Document Number: 38-05543 Rev. *I
Page 32 of 33
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CY7C1380D, CY7C1382D
CY7C1380F, CY7C1382F
Document History Page
Document Title: CY7C1380D/CY7C1382D/CY7C1380F/CY7C1382F, 18-Mbit (512 K × 36/1 M × 18) Pipelined SRAM
Document Number: 38-05543
REV.
*I
ECN NO. Submission
Date
3159479
Orig. of
Change
02/01/2011
NJY
Description of Change
Added Acronyms and Units of Measure.
Minor edits and updated in new template.
Updated Package Diagrams.
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at cypress.com/sales.
Products
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Lighting & Power Control
PSoC Solutions
cypress.com/go/automotive
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cypress.com/go/clocks
psoc.cypress.com/solutions
cypress.com/go/interface
PSoC 1 | PSoC 3 | PSoC 5
cypress.com/go/powerpsoc
cypress.com/go/plc
Memory
cypress.com/go/memory
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USB Controllers
Wireless/RF
cypress.com/go/USB
cypress.com/go/wireless
© Cypress Semiconductor Corporation, 2004-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05543 Rev. *I
Revised February 3, 2011
Page 33 of 33
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