NPC CF5075AK-4 Vcxo module ic with built-in varicap Datasheet

5075 series
VCXO Module IC with Built-in Varicap
OVERVIEW
The 5075 series are miniature VCXO ICs that provide a wide frequency pulling range, even when using miniature crystal units for which a wide pulling range is difficult to provide. They employ a recently developed varicap diode fabrication process that provides a wide frequency pulling range and good linearity without any
external components. Also, they employ a regulated voltage drive oscillator circuit that significantly reduces
current consumption, crystal current, and oscillation characteristics supply voltage dependency. The 5075
series are ideal for miniature, wide pulling range, low power consumption, VCXO modules.
FEATURES
■
■
■
■
■
■
VCXO with recently developed varicap diode
built-in
New fabrication process that significantly reduces
parasitic capacitance and provides wide pulling
range even when using miniature crystal units
Regulated voltage drive oscillator circuit for
reduced power consumption, crystal drive current,
and oscillation characteristics voltage dependency
Wide frequency pulling range
• ± 190ppm (B1 version, f = 27MHz)
(Crystal: γ = 300, C0 = 1.5pF)
Operating supply voltage range: 2.25V to 3.63V
Oscillation frequency range (for fundamental oscillation): 20MHz to 55MHz (varies with version)
■
■
■
■
■
■
Low current consumption: 1.0mA
(B1 version, f = 27MHz, no load, VDD = 3.3V)
Frequency divider built-in
• Selectable by version: fO, fO/2, fO/4, fO/8, fO/16
• Frequency divider output for 1.3MHz (min) low
frequency output
VC pin input resistance: 10MΩ (min)
CMOS output
Two types of pad layout selectable by mounting
method
• A× version: for Flip Chip Bonding
• B× version: for Wire Bonding
Package: Wafer form (WF5075××)
Chip form (CF5075××)
APPLICATIONS
■
2.5 × 2.0mm, 3.2 × 2.5mm size miniature VCXO modules for digital mobile TV tuner, digital TV (PDP,
LCD), PND (Personal Navigation Device), etc.
ORDERING INFORMATION
Device
Package
WF5075××−4
Wafer form
CF5075××−4
Chip form
SEIKO NPC CORPORATION —1
5075 series
SERIES CONFIGURATION
Operating
supply voltage
range [V]
PAD layout
Output frequency and version name*2
Recommended
operating frequency
range*1 [MHz]
fO output
fO/2 output
fO/4 output
fO/8 output
fO/16 output
20 to 40
(5075A1)
(5075A2)
(5075A3)
(5075A4)
(5075A5)
40 to 55
(5075AJ)
(5075AK)
(5075AL)
(5075AM)
(5075AN)
20 to 40
5075B1
(5075B2)
(5075B3)
(5075B4)
(5075B5)
40 to 55
5075BJ
(5075BK)
(5075BL)
(5075BM)
(5075BN)
Flip Chip Bonding
2.25 to 3.63
Wire Bonding
*1. The recommended operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so
the oscillation characteristics of components must be carefully evaluated.
*2. Versions in parentheses ( ) are under development.
VERSION NAME
Device
Package
WF5075××–4
Wafer form
CF5075××–4
Chip form
Version name
WF5075
Form WF: Wafer form
CF: Chip (Die) form
−4
Oscillation frequency range, frequency divider function
Pad layout type A: for Flip Chip Bonding
B: for Wire Bonding
SEIKO NPC CORPORATION —2
5075 series
PAD LAYOUT
(Unit: µm)
■
5075A× (for Flip Chip Bonding)
■
5075B× (for Wire Bonding)
(420, 345)
Y
VSS
5
VC
6
(0,0)
1
(−420, −345)
4
Q
3
VDD
(420, 345)
Q
5
Y VDD
6
2
XT
(−420, −345)
XTN
X
2
XTN
XT
3
VC
Chip size: 0.84 × 0.69mm
Chip thickness: 130µm ± 15µm
PAD size: 90µm × 90µm
Chip base: VSS level
PIN DESCRIPTION
Pad dimensions [µm]
Pad No.
1
VSS
X
Chip size: 0.84 × 0.69mm
Chip thickness: 130µm ± 15µm
PAD size: 90µm × 90µm
Chip base: VSS level
PAD DIMENSIONS
(0,0)
4
Pad No.
Pin
I/O
2
XT
I
Crystal connection pin (amplifier input)
2
1
XTN
O
Crystal connection pin (amplifier output)
–21
3
6
VDD
–
(+) supply pin
315
225
4
5
Q
O
Clock output pin
5
–315
225
5
4
VSS
–
(−) supply pin
6
–315
–21
6
3
VC
I
Oscillation frequency control voltage input pin (positive polarity)
(frequency increases with increasing voltage)
X
Y
5075A×
5075B×
1
–189
–240
1
2
189
–240
3
315
4
Description
BLOCK DIAGRAM
Voltage
Regulator
Rf
VDD
CIN
Oscillation
Detector
XT
RD
COUT
XTN
RVC2
VC
1
N *1
RVC1
CVC1
Level Shifter
CMOS ouput
Buffer
Q
CVC2
VSS
*1. N = 1, 2, 4, 8, 16
SEIKO NPC CORPORATION —3
5075 series
ABSOLUTE MAXIMUM RATINGS
VSS = 0V
Parameter
Symbol
Conditions
Rating
Unit
−0.5 to 7.0
V
Supply voltage range
VDD
Between VDD and VSS
Input voltage range
VIN
Input pins
−0.5 to VDD + 0.5
V
−0.5 to VDD + 0.5
V
−65 to +150
°C
20
mA
Output voltage range
VOUT
Output pins
Storage temperature range
TSTG
Wafer form, chip form
Output current
IOUT
Q pin
RECOMMENDED OPERATING CONDITIONS
VSS = 0V
Rating
Parameter
Symbol
Conditions
Unit
Min
Typ
Max
Operating supply voltage
VDD
CLOUT ≤ 15pF
2.25
–
3.63
V
Input voltage
VIN
Input pins
VSS
–
VDD
V
–40
–
+85
°C
5075×1 to 5075×5
20
–
40
MHz
5075×J to 5075×N
40
–
55
MHz
5075×1 to 5075×5
1.25
–
40
MHz
5075×J to 5075×N
2.5
–
55
MHz
Operating temperature
TOPR
Oscillation frequency*1
fO
Output frequency
fOUT
CLOUT ≤ 15pF
*1. The oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillation frequency
range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation
characteristics of components must be carefully evaluated.
SEIKO NPC CORPORATION —4
5075 series
ELECTRICAL CHARACTERISTICS
5075×1 to 5075×5
VDD = 2.25 to 3.63V, VC = 0.5VDD, VSS = 0V, Ta = –40 to +85°C unless otherwise noted.
Rating
Parameter
Current consumption
Symbol
IDD
Conditions
Unit
Min
Typ
Max
5075×1 (fO), Measurement circuit 1,
no load, fO = 27MHz, fOUT = 27MHz
VDD = 2.5V
–
0.7
1.4
mA
VDD = 3.3V
–
1.0
2.0
mA
5075×2 (fO/2), Measurement circuit 1,
no load, fO = 27MHz, fOUT = 13.5MHz
VDD = 2.5V
–
0.6
1.2
mA
VDD = 3.3V
–
0.8
1.6
mA
5075×3 (fO/4), Measurement circuit 1,
no load, fO = 27MHz, fOUT = 6.75MHz
VDD = 2.5V
–
0.5
1.0
mA
VDD = 3.3V
–
0.7
1.4
mA
5075×4 (fO/8), Measurement circuit 1,
no load, fO = 27MHz, fOUT = 3.38MHz
VDD = 2.5V
–
0.5
1.0
mA
VDD = 3.3V
–
0.6
1.2
mA
5075×5 (fO/16), Measurement circuit 1,
no load, fO = 27MHz, fOUT = 1.69MHz
VDD = 2.5V
–
0.4
0.8
mA
VDD = 3.3V
–
0.6
1.2
mA
HIGH-level output voltage
VOH
Q pin, Measurement circuit 2, IOH = –2.8mA
VDD – 0.4
–
–
V
LOW-level output voltage
VOL
Q pin, Measurement circuit 2, IOL = 2.8mA
–
–
0.4
V
Oscillator block built-in
resistance
RVC1
210
420
840
kΩ
210
420
840
kΩ
VC = 0.3V
–
5.6
–
pF
VC = 1.65V
–
3.1
–
pF
VC = 3.0V
–
1.5
–
pF
VC = 0.3V
–
8.4
–
pF
VC = 1.65V
–
4.7
–
pF
VC = 3.0V
–
2.3
–
pF
Measurement circuit 3
RVC2
CVC1
Design value (a monitor pattern on a
wafer is tested), Excluding parasitic
capacitance.
Oscillator block built-in
capacitance
CVC2
VC input resistance
RVIN
Measurement circuit 4, Ta = 25°C
10
–
–
MΩ
VC input impedance
ZVIN
Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25°C
(a monitor pattern on a wafer is tested)
–
450
–
kΩ
VC input capacitance
CVIN
Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25°C
(a monitor pattern on a wafer is tested)
–
37
–
pF
fm
Measurement circuit 6, –3dB frequency, VDD = 3.3V,
VC = 3.3Vp-p, Ta = 25°C, fO = 27MHz
–
25
–
kHz
Modulation
characteristics*1
*1. The modulation characteristics may vary with the crystal used.
SEIKO NPC CORPORATION —5
5075 series
5075×J to 5075×N
VDD = 2.25 to 3.63V, VC = 0.5VDD, VSS = 0V, Ta = –40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Conditions
5075×J (fO), Measurement circuit 1,
no load, fO = 48MHz, fOUT = 48MHz
5075×K (fO/2), Measurement circuit 1,
no load, fO = 48MHz, fOUT = 24MHz
Current consumption
IDD
5075×L (fO/4), Measurement circuit 1,
no load, fO = 48MHz, fOUT = 12MHz
5075×M (fO/8), Measurement circuit 1,
no load, fO = 48MHz, fOUT = 6MHz
5075×N (fO/16), Measurement circuit 1,
no load, fO = 48MHz, fOUT = 3MHz
Unit
Min
Typ
Max
VDD = 2.5V
–
1.2
2.4
mA
VDD = 3.3V
–
1.6
3.2
mA
VDD = 2.5V
–
0.9
1.8
mA
VDD = 3.3V
–
1.3
2.6
mA
VDD = 2.5V
–
0.8
1.6
mA
VDD = 3.3V
–
1.0
2.0
mA
VDD = 2.5V
–
0.7
1.4
mA
VDD = 3.3V
–
0.9
1.8
mA
VDD = 2.5V
–
0.7
1.4
mA
VDD = 3.3V
–
0.9
1.8
mA
HIGH-level output voltage
VOH
Q pin, Measurement circuit 2, IOH = –2.8mA
VDD – 0.4
–
–
V
LOW-level output voltage
VOL
Q pin, Measurement circuit 2, IOL = 2.8mA
–
–
0.4
V
Oscillator block built-in
resistance
RVC1
210
420
840
kΩ
210
420
840
kΩ
VC = 0.3V
–
5.6
–
pF
VC = 1.65V
–
3.1
–
pF
VC = 3.0V
–
1.5
–
pF
VC = 0.3V
–
8.4
–
pF
VC = 1.65V
–
4.7
–
pF
VC = 3.0V
–
2.3
–
pF
Measurement circuit 3
RVC2
CVC1
Design value (a monitor pattern on a
wafer is tested), Excluding parasitic
capacitance.
Oscillator block built-in
capacitance
CVC2
VC input resistance
RVIN
Measurement circuit 4, Ta = 25°C
10
–
–
MΩ
VC input impedance
ZVIN
Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25°C
(a monitor pattern on a wafer is tested)
–
450
–
kΩ
VC input capacitance
CVIN
Measurement circuit 5, VC = 0V, f = 10kHz, Ta = 25°C
(a monitor pattern on a wafer is tested)
–
37
–
pF
fm
Measurement circuit 6, –3dB frequency, VDD = 3.3V,
VC = 3.3Vp-p, Ta = 25°C, fO = 48MHz
–
23
–
kHz
Modulation
characteristics*1
*1. The modulation characteristics may vary with the crystal used.
SEIKO NPC CORPORATION —6
5075 series
SWITCHING CHARACTERISTICS
VDD = 2.25 to 3.63V, VC = 0.5VDD, VSS = 0V, Ta = –40 to +85°C unless otherwise noted.
Rating
Parameter
Symbol
Conditions
Unit
Min
Typ
Max
Output rise time
tr
Measurement circuit 7, 0.2VDD → 0.8VDD,
CLOUT = 15pF
–
2.1
4.0
ns
Output fall time
tf
Measurement circuit 7, 0.8VDD → 0.2VDD,
CLOUT = 15pF
–
2.1
4.0
ns
Measurement circuit 7, Ta = 25°C,
CLOUT = 15pF, VDD = 3.3V
45
50
55
%
Output duty cycle
Duty
Switching Time Measurement Waveform
0.8VDD
TW
0.2VDD
0.2VDD
DUTY measurement
voltage (0.5VDD)
DUTY= TW/ T 100 (%)
T
tr
Q
0.8VDD
tf
SEIKO NPC CORPORATION —7
5075 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Measurement Circuit 4
Measurement parameter: IDD
Measurement parameter: RVIN
IDD A
VDD
XT
IVIN A
VDD
XT
Crystal
XTN
Q
IVIN
VC
VSS
VC
0.1µF
VDD
RVIN =
XTN
VSS
Measurement Circuit 5
Measurement parameter: CVIN, ZVIN
Measurement Circuit 2
Measurement parameter: VOH, VOL
VDD
XT
Signal
Generator
VDD
0.001µF
XT
XTN
0.1µF
50Ω
XTN
50Ω
Q
VOH
VOL V
VC
VSS
0.1µF
VS
Impedance
Analyzer
(HP 4194A)
Q
VC
VSS
VC input signal: 100Hz to 10kHz, 0.1Vp-p
∆V
VOH
VS
VS adjusted such that ∆V =
50 × IOH.
VS
VOL
∆V
Measurement Circuit 6
Measurement parameter: fm
VS adjusted such that ∆V =
50 × IOL.
VDD
XT input signal: 1Vp-p, sine wave
Gain-phase
Analyzer
(HP 4194A)
Measurement Circuit 3
Measurement parameter: RVC1, RVC2
IXT A
VDD
IXTN A
Modulaiton
Analyzer
(HP 8901B)
VDD
XT
XT
XTN
XTN
VC
RVC1 =
VSS
VDD
IXT
Modulation
signal
C1
0.1µF
XTN
Q
R1
VC
VSS
R2
CLOUT
= 15pF
Demodulation
signal
C1 = 33µF, R1 = R2 = 1MΩ
VC modulation signal: 100Hz to 100kHz, 0 to VDDp-p
Measurement Circuit 7
VC
VSS
XT
Crystal
RVC2 =
Measurement parameter: Duty, tr , tf
VDD
VDD
IXTN
Crystal
XT
XTN
Q
VC
0.1µF
VSS
CLOUT = 15pF
(Including probe
capacitance)
SEIKO NPC CORPORATION —8
5075 series
FUNCTIONAL DESCRIPTION
Oscillation Start-up Detector Function
The devices also feature an oscillation start-up detector circuit. This circuit functions to disable the outputs
until the oscillation starts. This prevents unstable oscillator output at oscillator start-up when power is applied.
TYPICAL PERFORMANCE (5075B1)
The following characteristics measured using the crystal below. Note that the characteristics will vary with the
crystal used.
■
Crystal used for measurement
■
Parameter
fO = 27MHz
C0 [pF]
1.5
γ (= C0/C1)
300
Crystal parameters
C1
L1
R1
C0
250
250
200
200
150
150
Pulling range [ppm]
Pulling range [ppm]
Frequency Pulling Range
100
50
0
−50
−100
100
50
0
−50
−100
−150
−150
−200
−200
−250
0.00 0.25 0.50 0.75 1.00 1.25 1.50 1.75 2.00 2.25 2.50
−250
0.00 0.30 0.60 0.90 1.20 1.50 1.65 1.80 2.10 2.40 2.70 3.00 3.30
VC [V]
VC [V]
VDD = 2.5V, fOUT = 27MHz, Ta = R.T.
Pulling Sensitivity
VDD = 3.3V, fOUT = 27MHz, Ta = R.T.
Measurement circuit
250
VDD
Sensitivity [ppm/V]
200
Crystal
VDD = 2.5V
150
XT
XTN
Q
VC
100
VDD = 3.3V
0.1µF
VSS
CLOUT = 15pF
(Including probe
capacitance)
50
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VC [V]
VDD = 2.5V, 3.3V, fOUT = 27MHz, Ta = R.T.
SEIKO NPC CORPORATION —9
5075 series
Current Consumption
Measurement circuit
5
IDD A
4
IDD [mA]
VDD
Crystal
3
VC = 0V
VC = 0.5VDD
VC = VDD
CLOUT = 15pF
XT
XTN
Q
2
VC
1
0
0.1µF
VC = 0V
VC = 0.5VDD
VC = VDD
VSS
CLOUT = No load
2.5
2.8
3.0
3.3
3.6
VDD [V]
fOUT = 27MHz, Ta = R.T.
Frequency Stability by Supply Voltage Change
3.0
3.0
2.0
2.0
VC = 0V
VC = 2.5V
VC = 1.25V
0.0
1.0
∆f/f [ppm]
∆f/f [ppm]
1.0
−1.0
−1.0
−2.0
−2.0
−3.0
2.0
2.5
3.0
3.5
4.0
VDD [V]
VC = 3.3V
VC = 0V
VC = 1.65V
0.0
−3.0
2.0
2.5
3.0
3.5
4.0
VDD [V]
fOUT = 27MHz, ± 0ppm at VDD = 2.5V
fOUT = 27MHz, ± 0ppm at VDD = 3.3V
Measurement circuit
VDD
Crystal
XT
XTN
Q
0.1µF
VC
VSS
CLOUT = 15pF
(Including probe
capacitance)
SEIKO NPC CORPORATION —10
5075 series
Drive Level
Measurement circuit
30
25
VDD
Drive level [µW]
Crystal
20
Tektronix CT-6
Current Probe
15
0.1µF
XT
XTN
Q
IX'tal
VC
CLOUT = 15pF
VSS
10
VDD = 3.3V
5
VDD = 2.5V
0
0.0 0.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3
VC [V]
DL = (IX’tal)2 × Re
DL: drive level
IX’tal: current flowing to crystal (RMS value)
Re: crystal effective resistance
VDD = 2.5V, 3.3V, fOUT = 27MHz, Ta = R.T.
Negative Resistance
15
Frequency [MHz]
25
30
35
20
40
45
15
0
0
20
Frequency [MHz]
25
30
35
40
VC = 1.25V
VC = 2.5V
−400
−600
VC = 0V
Negative resistance [Ω]
Negative resistance [Ω]
VC = 0V
−200
45
−200
VC = 1.65V
VC = 3.3V
−400
−600
−800
−800
VDD = 2.5V, C0 = 2pF, Ta = R.T.
VDD = 3.3V, C0 = 2pF, Ta = R.T.
Measurement circuit
Network Analyzer
(Agilent 4396B)
S-Parameter Test Set
(Agilent 85046A)
C0 = 2pF
VDD
0.1µF
XT
XTN
Q
VC
VSS
Note. "C0" value is set, concerning the actual crystal characteristics connected between XT and XTN. The data is measured with Agilent 4396B using
NPC’s original measurement jig. The values may vary with measurement jig and conditions.
SEIKO NPC CORPORATION —11
5075 series
−60
−60
−80
−80
Phase noise [dBc/Hz]
Phase noise [dBc/Hz]
Phase Noise
−100
−120
−140
−160
10
VC = 2.5V
VC = 1.25V
VC = 0V
100
1,000
10,000 100,000 1,000,000 10,000,000
Offset Frequency [Hz]
VDD = 2.5V, fOUT = 27MHz, Ta = R.T.
−100
−120
−140
−160
10
VC = 3.3V
VC = 1.65V
VC = 0V
100
1,000
10,000 100,000 1,000,000 10,000,000
Offset Frequency [Hz]
VDD = 3.3V, fOUT = 27MHz, Ta = R.T.
Measurement circuit
VDD
Crystal
XT
0.1µF
200Ω
XTN
Q
0.01µF
Signal Source
Analyzer
(Agilent E5052A)
VC
VSS
CLOUT = 15pF
SEIKO NPC CORPORATION —12
5075 series
3
3
0
0
−3
−3
fm [dB]
fm [dB]
Modulation Characteristics
−6
−6
−9
−9
−12
0
1
10
Frequency [kHz]
100
−12
1000
0
VDD = 2.5V, fOUT = 27MHz, Ta = R.T.
1
10
Frequency [kHz]
100
1000
VDD = 3.3V, fOUT = 27MHz, Ta = R.T.
Measurement circuit
VDD
Crystal
Gain-phase
Analyzer
(HP 4194A)
Modulaiton
Analyzer
(HP 8901B)
Modulation
signal
C1
XT
0.1µF
XTN
Q
R1
VC
R2
VSS
CLOUT
= 15pF
Demodulation
signal
C1 = 33µF, R1 = R2 = 1MΩ
VC modulation signal: 100Hz to 100kHz, 0 to VDDp-p
Output Waveform
Measurement equipment: Oscilloscope; DSO80604B (Agilent)
Measurement circuit
VDD = 3.3V
VDD = 2.5V
VDD
Crystal
XT
XTN
Q
VC
0.1µF
VSS
CLOUT = 15pF
(Including probe
capacitance)
VDD = 2.5V, 3.3V, fOUT = 27MHz, VC = 0.5VDD,
CLOUT = 15pF, Ta = R.T.
SEIKO NPC CORPORATION —13
5075 series
Please pay your attention to the following points at time of using the products shown in this document.
The products shown in this document (hereinafter “Products”) are not intended to be used for the apparatus that exerts harmful influence on
human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such
use from SEIKO NPC CORPORATION (hereinafter “NPC”). Customers shall be solely responsible for, and indemnify and hold NPC free and
harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right
to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that
the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties.
Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document.
Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products,
and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or
modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in
compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are requested
appropriately take steps to obtain required permissions or approvals from appropriate government agencies.
SEIKO NPC CORPORATION
15-6, Nihombashi-kabutocho, Chuo-ku,
Tokyo 103-0026, Japan
Telephone: +81-3-6667-6601
Facsimile: +81-3-6667-6611
http://www.npc.co.jp/
Email: [email protected]
NC0810AE
2009.02
SEIKO NPC CORPORATION —14
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