AD ADuM3210WARZ-RL7 Dual-channel digital isolators, enhanced system-level esd reliability Datasheet

Dual-Channel Digital Isolators,
Enhanced System-Level ESD Reliability
ADuM3210/ADuM3211
Data Sheet
FEATURES
GENERAL DESCRIPTION
Enhanced system-level ESD performance per IEC 61000-4-x
High temperature operation: 125°C
Default low output
Narrow body, RoHS-compliant, 8-lead SOIC
Low power operation
5 V operation
1.7 mA per channel maximum @ 0 Mbps to 2 Mbps
3.7 mA per channel maximum @ 10 Mbps
7.0 mA per channel maximum @ 25 Mbps
3 V operation
1.5 mA per channel maximum @ 0 Mbps to 2 Mbps
2.5 mA per channel maximum @ 10 Mbps
4.7 mA per channel maximum @ 25 Mbps
3 V/5 V level translation
High data rate: dc to 25 Mbps (NRZ)
Precise timing characteristics
3 ns maximum pulse-width distortion at 5 V operation
3 ns maximum channel-to-channel matching
High common-mode transient immunity: >25 kV/μs
Safety and regulatory approvals
UL recognition: 2500 V rms for 1 minute per UL 1577
CSA Component Acceptance Notice #5A
VDE Certificate of Conformity
DIN V VDE V 0884-10 (VDE V 0884-10): 2006-12
VIORM = 560 V peak
Qualified for automotive applications
The ADuM3210/ADuM3211 are dual-channel, digital isolators
based on Analog Devices, Inc., iCoupler® technology. Combining
high speed CMOS and monolithic transformer technology, this
isolation component provides outstanding performance characteristics superior to alternatives such as optocoupler devices.
APPLICATIONS
Size-critical multichannel isolation
SPI interface/data converter isolation
RS-232/RS-422/RS-485 transceiver isolation
Digital field bus isolation
Gate drive interfaces
Hybrid electric vehicles, battery monitor, and motor drive
By avoiding the use of LEDs and photodiodes, iCoupler devices
remove the design difficulties commonly associated with optocouplers. The typical optocoupler concerns regarding uncertain
current transfer ratios, nonlinear transfer functions, and temperature
and lifetime effects are eliminated with the simple iCoupler digital
interfaces and stable performance characteristics. The need for
external drivers and other discrete components is eliminated
with these iCoupler products. Furthermore, iCoupler devices
consume one-tenth to one-sixth the power of optocouplers at
comparable signal data rates.
The ADuM3210/ADuM3211 isolators provide two independent
isolation channels in two channel configurations with data rates
up to 25 Mbps (see the Ordering Guide). They operate with 3.3 V
or 5 V supply voltages on either side, providing compatibility
with lower voltage systems as well as enabling voltage translation
functionality across the isolation barrier. The ADuM3210/
ADuM3211 isolators have a default output low characteristic in
comparison to the ADuM3200/ ADuM3201 models that have a
default output high characteristic. ADuM3210W and ADuM3211W
are automotive grade versions qualified for 125°C operation.
In comparison to the ADuM120x isolator, the ADuM3210/
ADuM3211 isolators contain various circuit and layout changes
providing increased capability relative to system-level IEC 61000-4-x
testing (ESD, burst, and surge). The precise capability in these tests
for either the ADuM120x or ADuM3210/ADuM3211 products is
strongly determined by the design and layout of the user’s board or
module. For more information, see the AN-793 Application Note,
ESD/Latch-Up Considerations with iCoupler Isolation Products.
ADuM3210
VDD1 1
8
VDD2
VDD1 1
ADuM3211
8
VDD2
ENCODE
DECODE
7
VOA
VOA 2
ENCODE
DECODE
7
VIA
VIB 3
ENCODE
DECODE
6
VOB
VIB 3
ENCODE
DECODE
6
VOB
5
GND2
5
GND2
GND1 4
06866-001
VIA 2
Figure 1. ADuM3210 Functional Block Diagram
GND1 4
06866-017
FUNCTIONAL BLOCK DIAGRAMS
Figure 2. ADuM3211 Functional Block Diagram
Protected by U.S. Patents 5,952,849; 6,873,065; and 7,075,239.
Rev. E
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
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Tel: 781.329.4700
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Fax: 781.461.3113 ©2007–2011 Analog Devices, Inc. All rights reserved.
ADuM3210/ADuM3211
Data Sheet
TABLE OF CONTENTS
Features .............................................................................................. 1
Recommended Operating Conditions .................................... 12
Applications....................................................................................... 1
Absolute Maximum Ratings ......................................................... 13
General Description ......................................................................... 1
ESD Caution................................................................................ 13
Functional Block Diagrams............................................................. 1
Pin Configurations and Function Descriptions ......................... 14
Revision History ............................................................................... 2
Truth Tables................................................................................. 14
Specifications..................................................................................... 3
Typical Performance Characteristics ........................................... 15
Electrical Characteristics—5 V, 105° Operation....................... 3
Applications Information .............................................................. 16
Electrical Characteristics—3 V, 105°C Operation ................... 4
PC Board Layout ........................................................................ 16
Electrical Characteristics—Mixed 5 V/3 V, 105°C Operation 5
System-Level ESD Considerations and Enhancements ........ 16
Electrical Characteristics—Mixed 3 V/5 V, 105°C Operation 6
Propagation Delay-Related Parameters................................... 16
Electrical Characteristics—5 V, 125°C Operation ................... 7
DC Correctness and Magnetic Field Immunity........................... 16
Electrical Characteristics—3 V, 125°C Operation..................... 8
Power Consumption .................................................................. 17
Electrical Characteristics—Mixed 5 V/3 V, 125°C Operation 9
Insulation Lifetime ..................................................................... 18
Electrical Characteristics—Mixed 3 V/5 V, 125°C Operation
....................................................................................................... 10
Outline Dimensions ....................................................................... 19
Package Characteristics ............................................................. 11
Automotive Products ................................................................. 20
Ordering Guide .......................................................................... 20
Regulatory Information............................................................. 11
Insulation and Safety-Related Specifications.......................... 11
DIN V VDE V 0884-10 (VDE V 0884-10) Insulation
Characteristics ............................................................................ 12
REVISION HISTORY
11/11—Rev. D to Rev. E
Changes to Table 1, Pulse Width Parameter ................................. 3
Changes to Table 4, Pulse Width Parameter ................................. 4
Changes to Table 7, Pulse Width Parameter ................................. 5
Changes to Table 10, Pulse Width Parameter............................... 6
6/11—Rev. C to Rev. D
Changes to Features Section, Application Section, and General
Description Section .......................................................................... 1
Changes to Propagation Delay Skew Parameter, Table 1;
Opposing Direction Parameter, Table 1; and Quiescent Output
Supply Current Parameter, Table 3................................................. 3
Changes to Opposing-Direction Parameter, Table 4 ................... 4
Changes to Opposing-Direction Parameter, Table 7 and Logic
Low Input Threshold Parameter, Table 9 ...................................... 5
Changes to Propagation Delay Skew Parameter, Table 10 and
Changes to Table 12.......................................................................... 6
Changes to Table 13, Table 14, and Quiescent Output Supply
Current Parameter, Table 15............................................................ 7
Changes to Table 16 and Table 17 .................................................. 8
Changes to Table 19, Table 20, and Logic Low Input Threshold
Parameter, Table 21 .......................................................................... 9
Changes to Table 22, Table 23, and Table 24............................... 10
Changes to Side 1 Current Parameter, Table 28; Side 2 Current
Parameter, Table 28; and Table 29 ................................................ 12
Changes to Ambient Operating Temperature, Table 30 and
Average Output Current per Pin, Table 30.................................. 13
Changes to Figure 9 Caption, Figure 10 Caption, and Figure 11
Caption ............................................................................................ 15
Changes to Ordering Guide .......................................................... 20
Added Automotive Products Section .......................................... 20
9/09—Rev. B to Rev. C
Added ADuM3210A and ADuM3211A .................... Throughout
Changes to General Description Section .......................................1
Reformatted Electrical Characteristics Tables ...............................3
Moved Truth Tables Section ......................................................... 14
Changes to Ordering Guide .......................................................... 20
7/09—Rev. A to Rev. B
Added ADuM3211........................................................ Throughout
Changes to Specifications Section...................................................3
Added Table 16 ............................................................................... 19
Added Figure 5 and Table 18 ........................................................ 20
Added Figure 11 ............................................................................. 21
Changes to Power Consumption Section.................................... 23
Changes to Ordering Guide .......................................................... 25
9/08—Rev. Sp0 to Rev. A
Changes to Features and General Description Sections ..............1
Changes to Specifications Section...................................................3
Changes to Recommended Operating Conditions Section...... 11
Changes to Ordering Guide .......................................................... 18
7/07—Revision Sp0: Initial Version
Rev. E | Page 2 of 20
Data Sheet
ADuM3210/ADuM3211
SPECIFICATIONS
ELECTRICAL CHARACTERISTICS—5 V, 105° OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 5 V. Minimum/maximum specifications apply over the entire recommended
operation range: 4.5 V ≤ VDD1 ≤ 5.5 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications
are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted.
Table 1.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Pulse Width
ADuM3210
ADuM3211
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
Min
tPHL, tPLH
PWD
20
A Grade
Typ
Max
Min
1
50
5
B Grade
Typ
Max
10
50
3
20
6
5
Unit
Test Conditions
Mbps
ns
ns
ps/°C
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
PW
Within PWD limit
1000
1000
22
33
tPSK
20
18
tPSKCD
tPSKOD
tR/tF
5
20
3
18
2.5
2.5
ns
ns
ns
Between any two units
ns
ns
ns
10% to 90%
Table 2.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
Min
1 Mbps—A Grade, B Grade
Typ
Max
IDD1
IDD2
IDD1
IDD2
1.3
1.0
1.1
1.3
10 Mbps—B Grade
Min
Typ
Max
Unit
3.5
1.7
2.6
3.1
mA
mA
mA
mA
1.7
1.6
1.5
1.8
4.6
2.8
3.4
4.0
Test Conditions
Table 3. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Logic Low Output Voltages
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity 1
Refresh Rate
1
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
VDDX − 0.1
VDDX − 0.5
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
|CM|
fr
Max
0.3 VDDX
VOL
II
Typ
5.0
4.8
0.0
0.2
+0.01
0.4
0.4
0.19
0.05
25
0.1
0.4
+10
0.8
0.8
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.2
Mbps
VIx = VDDX, VCM = 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 3 of 20
ADuM3210/ADuM3211
Data Sheet
ELECTRICAL CHARACTERISTICS—3 V, 105°C OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 3.0 V. Minimum/maximum specifications apply over the entire recommended
operation range: ADuM3210 supply voltages 2.7 V ≤ VDD1 ≤ 3.6 V, 2.7 V ≤ VDD2 ≤ 3.6 V; ADuM3211 supply voltages 3.0 V ≤ VDD1 ≤ 3.6 V,
3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications are tested with CL = 15 pF and CMOS
signal levels, unless otherwise noted.
Table 4.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
ADuM3210
ADuM3211
Change vs. Temperature
Pulse Width
ADuM3210
ADuM3211
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
Min
tPHL, tPLH
PWD
20
A Grade
Typ
Max
Min
1
60
B Grade
Typ
Max
20
5
6
6
Unit
Test Conditions
10
60
Mbps
ns
Within PWD limit
50% input to 50% output
3
4
ns
ns
ps/°C
|tPLH − tPHL|
|tPLH − tPHL|
5
PW
Within PWD limit
1000
1000
22
33
tPSK
29
22
tPSKCD
tPSKOD
tR/tF
5
29
3
20
3.0
3.0
ns
ns
ns
Between any two units
ns
ns
ns
10% to 90%
Table 5.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
Min
1 Mbps—A Grade, B Grade
Typ
Max
IDD1
IDD2
IDD1
IDD2
0.8
0.7
0.7
0.8
10 Mbps—B Grade
Min
Typ
Max
Unit
2.0
1.1
1.5
1.9
mA
mA
mA
mA
1.3
1.0
1.3
1.6
3.2
1.7
2.1
2.4
Test Conditions
Table 6. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Logic Low Output Voltages
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity 1
Refresh Rate
1
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
VDDX − 0.1
VDDX − 0.5
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
|CM|
fr
Max
0.3 VDDX
VOL
II
Typ
3.0
2.8
0.0
0.2
+0.01
0.3
0.3
0.10
0.03
25
0.1
0.4
+10
0.5
0.5
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.1
Mbps
VIx = VDDX, VCM = 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 4 of 20
Data Sheet
ADuM3210/ADuM3211
ELECTRICAL CHARACTERISTICS—MIXED 5 V/3 V, 105°C OPERATION
All typical specifications are at TA = 25°C, VDD1 = 5 V, VDD2 = 3.0 V. Minimum/maximum specifications apply over the entire
recommended operation range: ADuM3210 supply voltages 4.5 V ≤ VDD1 ≤ 5.5 V, 2.7 V ≤ VDD2 ≤ 3.6 V; ADuM3211 supply voltages
4.5 V ≤ VDD1 ≤ 5.5 V, 3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications are tested with
CL = 15 pF, and CMOS signal levels, unless otherwise noted.
Table 7.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Pulse Width
ADuM3210
ADuM3211
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
Min
tPHL, tPLH
PWD
15
A Grade
Typ
Max
1
55
5
Min
B Grade
Typ
Max
10
55
3
15
6
5
Unit
Test Conditions
Mbps
ns
ns
ps/°C
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
PW
Within PWD limit
1000
1000
22
33
tPSK
29
22
tPSKCD
tPSKOD
tR/tF
5
29
3
20
3.0
3.0
ns
ns
ns
Between any two units
ns
ns
ns
10% to 90%
Table 8.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
Min
1 Mbps—A Grade, B Grade
Typ
Max
IDD1
IDD2
IDD1
IDD2
1.3
0.7
1.1
0.8
10 Mbps—B Grade
Min
Typ
Max
Unit
3.5
1.1
2.6
1.9
mA
mA
mA
mA
1.7
1.0
1.5
1.6
4.6
1.7
3.4
2.4
Test Conditions
Table 9. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
Logic Low Output Voltages
VOL
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity1
Refresh Rate
1
II
fr
Max
0.3 VDDX
VDDX − 0.1
VDDX − 0.5
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
|CM|
Typ
VDDX
VDDX − 0.2
0.0
0.2
+0.01
0.4
0.3
0.19
0.03
25
0.1
0.4
+10
0.8
0.5
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.2
Mbps
VIx = VDDX, VCM = 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 5 of 20
ADuM3210/ADuM3211
Data Sheet
ELECTRICAL CHARACTERISTICS—MIXED 3 V/5 V, 105°C OPERATION
All typical specifications are at TA = 25°C, VDD1 = 3 V, VDD2 = 5.0 V. Minimum/maximum specifications apply over the entire
recommended operation range: ADuM3210 supply voltages 2.7 V ≤ VDD1 ≤ 3.6 V, 4.5 V ≤ VDD2 ≤ 5.5 V; ADuM3211 supply voltages
3.0 V ≤ VDD1 ≤ 3.6 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +105°C, unless otherwise noted. Switching specifications are tested with
CL = 15 pF and CMOS signal levels, unless otherwise noted.
Table 10.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
ADuM3210
ADuM3211
Change vs. Temperature
Pulse Width
ADuM3210
ADuM3211
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
Min
tPHL, tPLH
PWD
15
A Grade
Typ
Max
1
55
Min
B Grade
Typ
Max
15
5
6
6
Unit
Test Conditions
10
55
Mbps
ns
Within PWD limit
50% input to 50% output
3
4
ns
ns
ps/°C
|tPLH − tPHL|
|tPLH − tPHL|
5
PW
Within PWD limit
1000
1000
22
33
tPSK
29
20
tPSKCD
tPSKOD
tR/tF
15
29
3
22
2.5
2.5
ns
ns
ns
Between any two units
ns
ns
ns
10% to 90%
Table 11.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
Min
1 Mbps—A Grade, B Grade
Typ
Max
IDD1
IDD2
IDD1
IDD2
0.8
1.0
0.7
1.3
10 Mbps—B Grade
Min
Typ
Max
Unit
2.0
1.7
1.5
3.1
mA
mA
mA
mA
1.3
1.6
1.3
1.8
3.2
2.8
2.1
4.0
Test Conditions
Table 12. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Logic Low Output Voltages
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity 1
Refresh Rate
1
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
VDDX − 0. 1
VDDX − 0.5
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
|CM|
fr
Max
0.3 VDDX
VOL
II
Typ
VDDX
VDDX − 0.2
0.0
0.2
+0.01
0.4
0.5
0.10
0.05
25
0.1
0.4
+10
0.8
0.8
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.1
Mbps
VIx = VDDX, VCM = 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 6 of 20
Data Sheet
ADuM3210/ADuM3211
ELECTRICAL CHARACTERISTICS—5 V, 125°C OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 5 V. Minimum/maximum specifications apply over the entire recommended
operation range: 4.5 V ≤ VDD1 ≤ 5.5 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted.
Table 13.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Pulse Width
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
A Grade
Min
Typ Max
1
50
5
tPHL, tPLH
PWD
20
PW
tPSK
1000
B Grade and
T Grade
Min Typ Max
6
tPSKCD
tPSKOD
tR/tF
10
50
3
20
C Grade
Min Typ Max
25
50
3
20
5
5
100
40
20
18
18
5
20
3
18
3
18
2.5
2.5
2.5
Unit
Test Conditions
Mbps
ns
ns
ps/°C
ns
ns
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
Within PWD limit
Between any two units
ns
ns
ns
10% to 90%
Table 14.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
1 Mbps—A Grade,
B Grade, and C Grade
Min
Typ
Max
IDD1
IDD2
IDD1
IDD2
1.3
1.0
1.1
1.3
10 Mbps—B Grade,
C Grade, and T Grade
Min
Typ
Max
1.7
1.6
1.5
1.8
3.5
1.7
2.6
3.1
25 Mbps—C Grade
Min
Typ
Max
4.6
2.8
3.4
4.0
6.6
3.7
5.3
5.9
9.0
4.5
7.5
8.0
Unit
Test Conditions
mA
mA
mA
mA
Table 15. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Logic Low Output Voltages
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
|CM|
Refresh Rate
fr
1
II
Max
0.3 VDDX
VDDX − 0.1
VDDX − 0.5
VOL
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity 1
Typ
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
5.0
4.8
0.0
0.2
+0.01
0.4
0.4
0.19
0.05
25
0.1
0.4
+10
0.8
0.8
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.2
Mbps
VIx = VDDX, VCM = 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 7 of 20
ADuM3210/ADuM3211
Data Sheet
ELECTRICAL CHARACTERISTICS—3 V, 125°C OPERATION
All typical specifications are at TA = 25°C, VDD1 = VDD2 = 3.0 V. Minimum/maximum specifications apply over the entire recommended
operation range: 3.0 V ≤ VDD1 ≤ 3.6 V, 3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications
are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted.
Table 16.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Pulse Width
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
A Grade
Min
Typ Max
1
60
6
tPHL, tPLH
PWD
20
PW
tPSK
1000
B Grade and
T Grade
Min Typ Max
6
tPSKCD
tPSKOD
tR/tF
10
60
4
20
C Grade
Min Typ Max
25
60
4
20
5
5
100
40
29
22
22
5
29
3
20
3
20
3.0
3.0
3.0
Unit
Test Conditions
Mbps
ns
ns
ps/°C
ns
ns
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
Within PWD limit
Between any two units
ns
ns
ns
10% to 90%
Table 17.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
1 Mbps—A Grade,
B Grade, and C Grade
Min
Typ
Max
IDD1
IDD2
IDD1
IDD2
0.8
0.7
0.7
0.8
10 Mbps—B Grade,
C Grade, and T Grade
Min
Typ
Max
1.3
1.0
1.3
1.6
2.0
1.1
1.5
1.9
25 Mbps—C Grade
Min
Typ
Max
3.2
1.7
2.1
2.4
3.9
2.4
3.1
3.5
5.5
3.0
4.5
5.0
Unit
Test Conditions
mA
mA
mA
mA
Table 18. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Logic Low Output Voltages
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity 1
Refresh Rate
1
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
VDDX − 0.1
VDDX − 0.5
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
|CM|
fr
Max
0.3 VDDX
VOL
II
Typ
3.0
2.8
0.0
0.2
+0.01
0.3
0.3
0.10
0.03
25
0.1
0.4
+10
0.5
0.5
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.1
Mbps
VIx = VDDX, VCM = 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 8 of 20
Data Sheet
ADuM3210/ADuM3211
ELECTRICAL CHARACTERISTICS—MIXED 5 V/3 V, 125°C OPERATION
All typical specifications are at TA = 25°C, VDD1 = 5 V, VDD2 = 3.0 V. Minimum/maximum specifications apply over the entire
recommended operation range: 4.5 V ≤ VDD1 ≤ 5.5 V, 3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching
specifications are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted.
Table 19.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Pulse Width
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
B Grade and
T Grade
Min Typ Max
A Grade
Min
Typ Max
1
55
5
tPHL, tPLH
PWD
15
PW
tPSK
1000
6
tPSKCD
tPSKOD
tR/tF
10
55
3
15
C Grade
Min Typ Max
25
55
3
15
5
5
100
40
29
22
22
5
29
3
20
3
20
3.0
3.0
3.0
Unit
Test Conditions
Mbps
ns
ns
ps/°C
ns
ns
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
Within PWD limit
Between any two units
ns
ns
ns
10% to 90%
Table 20.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
1 Mbps—A Grade,
B Grade, and C Grade
Min
Typ
Max
IDD1
IDD2
IDD1
IDD2
1.3
0.7
1.1
0.8
10 Mbps—B Grade,
C Grade, and T Grade
Min
Typ
Max
1.7
1.0
1.5
1.6
3.5
1.1
2.6
1.9
25 Mbps—C Grade
Min
Typ
Max
4.6
1.7
3.4
2.4
6.6
2.4
5.3
3.5
9.0
3.0
7.5
5.0
Unit
Test Conditions
mA
mA
mA
mA
Table 21. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Logic Low Output Voltages
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity 1
Refresh Rate
1
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
VDDX − 0.1
VDDX − 0.5
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
|CM|
fr
Max
0.3 VDDX
VOL
II
Typ
VDDX
VDDX − 0.2
0.0
0.2
+0.01
0.4
0.3
0.19
0.03
25
0.1
0.4
+10
0.8
0.5
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.2
Mbps
VIx = VDDX, VCM = 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 9 of 20
ADuM3210/ADuM3211
Data Sheet
ELECTRICAL CHARACTERISTICS—MIXED 3 V/5 V, 125°C OPERATION
All typical specifications are at TA = 25°C, VDD1 = 3 V, VDD2 = 5.0 V. Minimum/maximum specifications apply over the entire
recommended operation range: 3.0 V ≤ VDD1 ≤ 3.6 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching
specifications are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted.
Table 22.
Parameter
SWITCHING SPECIFICATIONS
Data Rate
Propagation Delay
Pulse Width Distortion
Change vs. Temperature
Pulse Width
Propagation Delay Skew
Channel Matching
Codirectional
Opposing-Direction
Output Rise/Fall Time
Symbol
A Grade
Min
Typ Max
1
55
6
tPHL, tPLH
PWD
15
PW
tPSK
1000
B Grade and
T Grade
Min Typ Max
6
tPSKCD
tPSKOD
tR/tF
10
55
4
15
C Grade
Min Typ Max
25
55
4
15
5
5
100
40
29
22
22
15
29
3
20
3
20
2.5
2.5
2.5
Unit
Test Conditions
Mbps
ns
ns
ps/°C
ns
ns
Within PWD limit
50% input to 50% output
|tPLH − tPHL|
Within PWD limit
Between any two units
ns
ns
ns
10% to 90%
Table 23.
Parameter
SUPPLY CURRENT
ADuM3210
ADuM3211
Symbol
1 Mbps—A Grade,
B Grade, and C Grade
Min
Typ
Max
IDD1
IDD2
IDD1
IDD2
0.8
1.0
0.7
1.3
10 Mbps—B Grade,
C Grade, and T Grade
Min
Typ
Max
1.3
1.6
1.3
1.8
2.0
1.7
1.5
3.1
25 Mbps—C Grade
Min
Typ
Max
3.2
2.8
2.1
4.0
3.9
3.7
3.1
5.9
5.5
4.5
4.5
8.0
Unit
Test Conditions
mA
mA
mA
mA
Table 24. For All Models
Parameter
DC SPECIFICATIONS
Logic High Input Threshold
Logic Low Input Threshold
Logic High Output Voltages
Logic Low Output Voltages
Input Current per Channel
Supply Current per Channel
Quiescent Input Supply Current
Quiescent Output Supply Current
Dynamic Input Supply Current
Dynamic Output Supply Current
AC SPECIFICATIONS
Common-Mode Transient Immunity 1
Refresh Rate
1
Symbol
Min
VIH
VIL
VOH
0.7 VDDX
VDDX − 0.1
VDDX − 0.5
−10
IDDI(Q)
IDDO(Q)
IDDI(D)
IDDO(D)
|CM|
fr
Max
0.3 VDDX
VOL
II
Typ
VDDX
VDDX − 0.2
0.0
0.2
+0.01
0.4
0.5
0.10
0.05
25
0.1
0.4
+10
0.8
0.8
Unit
Test Conditions
V
V
V
V
V
V
μA
IOx = −20 μA, VIx = VIxH
IOx = −4 mA, VIx = VIxH
IOx = 20 μA, VIx = VIxL
IOx = 4 mA, VIx = VIxL
0 V ≤ VIx ≤ VDDX
mA
mA
mA/Mbps
mA/Mbps
35
kV/μs
1.1
Mbps
VIx = VDDX, VCM= 1000 V,
transient magnitude = 800 V
|CM| is the maximum common-mode voltage slew rate that can be sustained while maintaining VO > 0.8 VDD. The common-mode voltage slew rates apply to both
rising and falling common-mode voltage edges.
Rev. E | Page 10 of 20
Data Sheet
ADuM3210/ADuM3211
PACKAGE CHARACTERISTICS
Table 25.
Parameter
Resistance (Input-to-Output) 1
Capacitance (Input-to-Output)1
Input Capacitance
IC Junction-to-Case Thermal Resistance, Side 1
Symbol
RI-O
CI-O
CI
θJCI
IC Junction-to-Case Thermal Resistance, Side 2
θJCO
1
Min
Typ
1012
1.0
4.0
46
Max
41
Unit
Ω
pF
pF
°C/W
Test Conditions
f = 1 MHz
Thermocouple located at center
of package underside
°C/W
The device is considered a 2-terminal device; Pin 1 through Pin 4 are shorted together, and Pin 5 through Pin 8 are shorted together.
REGULATORY INFORMATION
The ADuM3210/ADuM3211 are approved by the organizations listed in Table 26.
Table 26.
UL
Recognized under UL 1577
Component Recognition
Program 1
Single/basic 2500 V rms
isolation voltage
File E214100
1
2
CSA
Approved under CSA Component Acceptance Notice #5A
VDE
Certified according to DIN V VDE V 0884-10
(VDE V 0884-10): 2006-12 2
Basic insulation per CSA 60950-1-03 and IEC 60950-1,
400 V rms (566 V peak) maximum working voltage
Functional insulation per CSA 60950-1-03 and IEC 60950-1,
800 V rms(1131 V peak) maximum working voltage
File 205078
Reinforced insulation, 560 V peak
File 2471900-4880-0001
In accordance with UL 1577, each ADuM3210/ADuM3211 is proof tested by applying an insulation test voltage ≥ 3000 V rms for 1 second (current leakage detection
limit = 5 μA).
In accordance with DIN V VDE V 0884-10, each ADuM3210/ADuM3211 is proof tested by applying an insulation test voltage ≥ 1050 V peak for 1 second (partial
discharge detection limit = 5 pC). An asterisk (*) marking on the component designates DIN V VDE V 0884-10 approval.
INSULATION AND SAFETY-RELATED SPECIFICATIONS
Table 27.
Parameter
Rated Dielectric Insulation Voltage
Minimum External Air Gap (Clearance)
Symbol
L(I01)
Value
2500
4.90 min
Unit
V rms
mm
Minimum External Tracking (Creepage)
L(I02)
4.01 min
mm
Minimum Internal Gap (Internal Clearance)
Tracking Resistance (Comparative Tracking Index)
Isolation Group
CTI
0.017 min
>175
IIIa
mm
V
Rev. E | Page 11 of 20
Conditions
1-minute duration
Measured from input terminals to output terminals,
shortest distance through air
Measured from input terminals to output terminals,
shortest distance path along body
Insulation distance through insulation
DIN IEC 112/VDE 0303 Part 1
Material Group (DIN VDE 0110, 1/89, Table 1)
ADuM3210/ADuM3211
Data Sheet
DIN V VDE V 0884-10 (VDE V 0884-10) INSULATION CHARACTERISTICS
These isolators are suitable for reinforced isolation only within the safety limit data. Maintenance of the safety data is ensured by
protective circuits. The asterisk (*) marking on the package denotes DIN V VDE V 0884-10 approval for a 560 V peak working voltage.
Table 28.
Description
Installation Classification per DIN VDE 0110
For Rated Mains Voltage ≤ 150 V rms
For Rated Mains Voltage ≤ 300 V rms
For Rated Mains Voltage ≤ 400 V rms
Climatic Classification
Pollution Degree per DIN VDE 0110, Table 1
Maximum Working Insulation Voltage
Input-to-Output Test Voltage, Method B1
Input-to-Output Test Voltage, Method A
After Environmental Tests Subgroup 1
After Input and/or Safety Test Subgroup 2
and Subgroup 3
Highest Allowable Overvoltage
Safety-Limiting Values
Case Temperature
Side 1 Current
Side 2 Current
Insulation Resistance at TS
Conditions
Symbol Characteristic
VIORM × 1.875 = VPR, 100% production test, tm = 1 sec,
partial discharge < 5 pC
VIORM × 1.6 = VPR, tm = 60 sec, partial discharge < 5 pC
I to IV
I to III
I to II
40/105/21
2
560
1050
V peak
V peak
896
672
V peak
V peak
VTR
4000
V peak
TS
IS1
IS2
RS
150
160
170
>109
°C
mA
mA
Ω
VIORM
VPR
VPR
VIORM × 1.2 = VPR, tm = 60 sec, partial discharge < 5 pC
Transient overvoltage, tTR = 10 sec
Maximum value allowed in the event of a failure
(see Figure 3)
VIO = 500 V
200
Unit
RECOMMENDED OPERATING CONDITIONS
Table 29.
160
140
SIDE #2
SIDE #1
120
100
80
60
40
20
0
0
50
100
150
CASE TEMPERATURE (°C)
200
Figure 3. Thermal Derating Curve, Dependence of Safety-Limiting
Values on Case Temperature per DIN V VDE V 0884-10
06866-002
SAFETY-LIMITING CURRENT (mA)
180
Parameter
Operating Temperature
ADuM3210A/ADuM3211A
ADuM3210B/ADuM3211B
ADuM3210T/ADuM3211T
ADuM3210WA/ADuM3211WA
ADuM3210WB/ADuM3211WB
ADuM3210WC/ADuM3211WC
Supply Voltages1
ADuM3210A/ADuM3211A
ADuM3210B/ADuM3211B
ADuM3210T/ADuM3211T
ADuM3210WA/ADuM3211WA
ADuM3210WB/ADuM3211WB
ADuM3210WC/ADuM3211WC
Maximum Input Signal Rise and
Fall Times
1
Symbol
TA
Rating
−40°C to +105°C
−40°C to +105°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
VDD1, VDD2
2.7 V to 5.5 V
2.7 V to 5.5 V
3 V to 5.5 V
3 V to 5.5 V
3 V to 5.5 V
3 V to 5.5 V
1 ms
All voltages are relative to their respective ground. See the DC Correctness
and Magnetic Field Immunity section for information on immunity to external
magnetic fields.
Rev. E | Page 12 of 20
Data Sheet
ADuM3210/ADuM3211
ABSOLUTE MAXIMUM RATINGS
Ambient temperature = 25°C, unless otherwise noted.
Table 31. Maximum Continuous Working Voltage1
Table 30.
Parameter
Storage Temperature
Ambient Operating
Temperature
Supply Voltages1
Input Voltage1, 2
Output Voltage1, 2
Average Output Current
per Pin3
Common-Mode
Transients4
Parameter
AC Voltage,
Bipolar Waveform
AC Voltage,
Unipolar Waveform
Functional Insulation
Symbol
TST
TA
Rating
−55°C to +150°C
−40°C to +125°C
VDD1, VDD2
VIA, VIB
VOA, VOB
IO
−0.5 V to +7.0 V
−0.5 V to VDDI + 0.5 V
−0.5 V to VDDO + 0.5 V
−22 mA to +22 mA
CMH, CML
−100 kV/μs to +100 kV/μs
Basic Insulation
1
All voltages are relative to their respective ground.
VDDI and VDDO refer to the supply voltages on the input and output sides of a
given channel, respectively.
3
See Figure 3 for information on maximum allowable current for various
temperatures.
4
Refers to common-mode transients across the insulation barrier. Commonmode transients exceeding the Absolute Maximum Rating can cause
latch-up or permanent damage.
2
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
DC Voltage
Functional Insulation
Basic Insulation
1
Max
565
Unit
V peak
Constraint
50-year minimum
lifetime
1131
V peak
560
V peak
Maximum approved
working voltage per
IEC 60950-1
Maximum approved
working voltage per
IEC 60950-1 and
VDE V 0884-10
1131
V peak
560
V peak
Maximum approved
working voltage per
IEC 60950-1
Maximum approved
working voltage per
IEC 60950-1 and
VDE V 0884-10
Refers to continuous voltage magnitude imposed across the isolation
barrier. See the Insulation Lifetime for more details.
ESD CAUTION
Rev. E | Page 13 of 20
ADuM3210/ADuM3211
Data Sheet
VIA 2
ADuM3210
8
VDD2
VDD1 1
7
VOA
VOA 2
VIB 3
6 VOB
TOP VIEW
GND1 4 (Not to Scale) 5 GND2
ADuM3211
VIB 3
8
VDD2
7
VIA
6 VOB
TOP VIEW
GND1 4 (Not to Scale) 5 GND2
06866-003
VDD1 1
Figure 4. ADuM3210 Pin Configuration
06866-016
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 5. ADuM3211 Pin Configuration
Table 32. ADuM3210 Pin Function Descriptions
Table 33. ADuM3211 Pin Function Descriptions
Pin No.
1
Mnemonic
VDD1
Pin No.
1
Mnemonic
VDD1
2
3
4
VIA
VIB
GND1
2
3
4
VOA
VIB
GND1
5
GND2
5
GND2
6
7
8
VOB
VOA
VDD2
6
7
8
VOB
VIA
VDD2
Description
Supply Voltage for Isolator Side 1,
2.7 V to 5.5 V.
Logic Input A.
Logic Input B.
Ground 1. Ground reference for
Isolator Side 1.
Ground 2. Ground reference for
Isolator Side 2.
Logic Output B.
Logic Output A.
Supply Voltage for Isolator Side 2,
2.7 V to 5.5 V.
Description
Supply Voltage for Isolator Side 1,
2.7 V to 5.5 V.
Logic Output A.
Logic Input B.
Ground 1. Ground reference for
Isolator Side 1.
Ground 2. Ground reference for
Isolator Side 2.
Logic Output B.
Logic Input A.
Supply Voltage for Isolator Side 2,
2.7 V to 5.5 V.
TRUTH TABLES
Table 34. ADuM3210 Truth Table (Positive Logic)
VIA Input 1
H
L
H
L
X
VIB Input1
H
L
L
H
X
VDD1 State
Powered
Powered
Powered
Powered
Unpowered
VDD2 State
Powered
Powered
Powered
Powered
Powered
VOA Output1
H
L
H
L
L
VOB Output1
H
L
L
H
L
X
X
Powered
Unpowered
Indeterminate
Indeterminate
1
Notes
Outputs return to the input state within
1 μs of VDDI power restoration
Outputs return to the input state within
1 μs of VDDO power restoration
H refers to a high logic, and L refers to a low logic.
Table 35. ADuM3211 Truth Table (Positive Logic)
VIA Input 1
H
L
H
L
X
VIB Input1
H
L
L
H
X
VDD1 State
Powered
Powered
Powered
Powered
Unpowered
VDD2 State
Powered
Powered
Powered
Powered
Powered
VOA Output1
H
L
H
L
Indeterminate
VOB Output1
H
L
L
H
L
X
X
Powered
Unpowered
L
Indeterminate
1
H refers to a high logic, L refers to a low logic, and X refers to high or low logic, don’t care.
Rev. E | Page 14 of 20
Notes
Outputs return to the input state within
1 μs of VDDI power restoration
Outputs return to the input state within
1 μs of VDDO power restoration
Data Sheet
ADuM3210/ADuM3211
TYPICAL PERFORMANCE CHARACTERISTICS
10
20
15
CURRENT (mA)
CURRENT/CHANNEL (mA)
8
6
4
10
5V
5V
5
2
3V
0
10
20
DATA RATE (Mbps)
30
0
06866-004
0
0
30
Figure 9. ADuM3210 Typical IDD1 Supply Current vs.
Data Rate for 5 V and 3 V Operation
Figure 6. Typical Input Supply Current per Channel vs.
Data Rate for 5 V and 3 V Operation
4
4
3
3
CURRENT (mA)
CURRENT/CHANNEL (mA)
10
20
DATA RATE (Mbps)
06866-007
3V
2
5V
5V
2
3V
1
1
0
10
20
DATA RATE (Mbps)
30
0
06866-005
0
0
10
20
DATA RATE (Mbps)
30
06866-008
3V
Figure 10. ADuM3210 Typical IDD2 Supply Current vs.
Data Rate for 5 V and 3 V Operation
Figure 7. Typical Output Supply Current per Channel vs.
Data Rate for 5 V and 3 V Operation (No Output Load)
10
4
CURRENT (mA)
2
5V
6
4
5V
1
2
3V
0
0
10
20
DATA RATE (Mbps)
30
0
0
10
20
DATA RATE (Mbps)
Figure 11. ADuM3211 Typical IDD1 or IDD2 Supply Current vs.
Data Rate for 5 V and 3 V Operation
Figure 8. Typical Output Supply Current per Channel vs.
Data Rate for 5 V and 3 V Operation (15 pF Output Load)
Rev. E | Page 15 of 20
30
06866--015
3V
06866-006
CURRENT/CHANNEL (mA)
8
3
ADuM3210/ADuM3211
Data Sheet
APPLICATIONS INFORMATION
PC BOARD LAYOUT
DC CORRECTNESS AND MAGNETIC FIELD IMMUNITY
The ADuM3210/ADuM3211 digital isolators require no external
interface circuitry for the logic interfaces. Power supply bypassing
is strongly recommended at the input and output supply pins.
The capacitor value should be between 0.01 μF and 0.1 μF. The
total lead length between both ends of the capacitor and the
input power supply pin should not exceed 20 mm.
Positive and negative logic transitions at the isolator input cause
narrow (~1 ns) pulses to be sent to the decoder via the transformer.
The decoder is bistable and is, therefore, either set or reset by
the pulses, indicating input logic transitions. In the absence of
logic transitions of more than 2 μs at the input, a periodic set of
refresh pulses indicative of the correct input state are sent to
ensure dc correctness at the output. If the decoder receives
no internal pulses for more than approximately 5 μs, the input
side is assumed to be unpowered or nonfunctional, in which
case, the isolator output is forced to a default state (see Table 34
and Table 35) by the watchdog timer circuit.
SYSTEM-LEVEL ESD CONSIDERATIONS AND
ENHANCEMENTS
System-level ESD reliability (for example, per IEC 61000-4-x)
is highly dependent on system design, which varies widely by
application. The ADuM3210/ADuM3211 incorporate many
enhancements to make ESD reliability less dependent on system
design. The enhancements include:
•
•
•
•
•
ESD protection cells were added to all input/output interfaces.
Key metal trace resistances reduced using wider geometry
and paralleling of lines with vias.
The SCR effect inherent in CMOS devices is minimized
by use of a guarding and isolation technique between the
PMOS and NMOS devices.
Areas of high electric field concentration are eliminated
using 45° corners on metal traces.
Supply pin overvoltage is prevented with larger ESD
clamps between each supply pin and its respective ground.
The ADuM3210/ADuM3211 are immune to external magnetic
fields. The limitation on the ADuM3210/ADuM3211 magnetic
field immunity is set by the condition in which induced voltage
in the transformer receiving coil is sufficiently large to either
falsely set or reset the decoder. The following analysis defines
the conditions under which this can occur. The 3 V operating
condition of the ADuM3210/ADuM3211 is examined because
it represents the most susceptible mode of operation.
The pulses at the transformer output have an amplitude greater
than 1.0 V. The decoder has a sensing threshold at about 0.5 V,
therefore establishing a 0.5 V margin in which induced voltages
can be tolerated. The voltage induced across the receiving coil is
given by
V = (−dβ/dt) ∑π rn2, n = 1, 2, ... , N
While the ADuM3210/ADuM3211 improve system-level ESD
reliability, they are no substitute for a robust system-level
design. For detailed recommendations on board layout and
system-level design, see the AN-793 Application Note,
ESD/Latch-Up Considerations with iCoupler Isolation Products.
where:
β is the magnetic flux density (gauss).
N is the number of turns in the receiving coil.
rn is the radius of the nth turn in the receiving coil (cm).
PROPAGATION DELAY-RELATED PARAMETERS
Propagation delay is a parameter that describes the time it takes
a logic signal to propagate through a component. The propagation
delay to a logic low output can differ from the propagation
delay to a logic high output.
Given the geometry of the receiving coil in the ADuM3210/
ADuM3211 and an imposed requirement that the induced
voltage is at most 50% of the 0.5 V margin at the decoder, a
maximum allowable magnetic field is calculated as shown in
Figure 13.
OUTPUT (VOx)
tPHL
06866-009
tPLH
50%
Figure 12. Propagation Delay Parameters
Pulse width distortion is the maximum difference between
these two propagation delay values and is an indication of
how accurately the input signal timing is preserved.
Channel-to-channel matching refers to the maximum amount
that the propagation delay differs between channels within a
single ADuM3210/ADuM3211 component.
Propagation delay skew refers to the maximum amount that
the propagation delay differs between multiple ADuM3210/
ADuM3211 components operating under the same conditions.
Rev. E | Page 16 of 20
10
1
0.1
0.01
0.001
1k
10k
100k
1M
10M
MAGNETIC FIELD FREQUENCY (Hz)
100M
Figure 13. Maximum Allowable External Magnetic Flux Density
06866-010
50%
MAXIMUM ALLOWABLE MAGNETIC FLUX
DENSITY (kgauss)
100
INPUT (VIx)
Data Sheet
ADuM3210/ADuM3211
For example, at a magnetic field frequency of 1 MHz, the
maximum allowable magnetic field of 0.2 kgauss induces a
voltage of 0.25 V at the receiving coil. This is about 50% of the
sensing threshold and does not cause a faulty output transition.
Similarly, if such an event were to occur during a transmitted
pulse (and had the worst-case polarity), it would reduce the
received pulse from >1.0 V to 0.75 V, which is still well above
the 0.5 V sensing threshold of the decoder.
POWER CONSUMPTION
The preceding magnetic flux density values correspond to
specific current magnitudes at given distances away from the
ADuM3210/ADuM3211 transformers. Figure 14 expresses
these allowable current magnitudes as a function of frequency
for selected distances. As shown, the ADuM3210/ADuM3211
are immune and can be affected only by extremely large currents
operated at a high frequency and very close to the component.
For the 1 MHz example, a 0.5 kA current would have to be placed
5 mm away from the ADuM3210/ADuM3211 to affect the
operation of the component.
For each output channel, the supply current is given by
DISTANCE = 1m
100
10
1
DISTANCE = 5mm
0.1
0.01
1k
10k
100k
For each input channel, the supply current is given by
IDDI = IDDI (Q)
f ≤ 0.5fr
IDDI = IDDI (D) × (2f – fr) + IDDI (Q)
f > 0.5fr
IDDO = IDDO (Q)
f ≤ 0.5fr
−3
IDDO = (IDDO (D) + (0.5 × 10 ) × CLVDDO) × (2f – fr) + IDDO (Q)
f > 0.5fr
where:
IDDI (D), IDDO (D) are the input and output dynamic supply currents
per channel (mA/Mbps).
IDDI (Q), IDDO (Q) are the specified input and output quiescent
supply currents (mA).
CL is the output load capacitance (pF).
VDDO is the output supply voltage (V).
f is the input logic signal frequency (MHz, half of the input data
rate, NRZ signaling).
fr is the input stage refresh rate (Mbps).
To calculate the total IDD1 and IDD2 supply current, the supply
currents for each input and output channel corresponding to
IDD1 and IDD2 are calculated and totaled.
DISTANCE = 100mm
1M
10M
MAGNETIC FIELD FREQUENCY (Hz)
100M
06866-011
MAXIMUM ALLOWABLE CURRENT (kA)
1000
The supply current at a given channel of the ADuM3210/
ADuM3211 isolator is a function of the supply voltage, channel
data rate, and channel output load.
Figure 14. Maximum Allowable Current for Various
Current-to-ADuM3210/-ADuM3211 Spacings
Figure 6 provides the input supply currents per channel as a
function of data rate. Figure 7 and Figure 8 provide the output
supply currents per channel as a function of data rate for an
unloaded output condition and for a 15 pF output condition,
respectively. Figure 9 through Figure 11 provide total IDD1 and
IDD2 supply current as a function of data rate for the ADuM3210
and ADuM3211 channel configurations.
Note that at combinations of strong magnetic fields and high
frequencies, any loops formed by the printed circuit board
(PCB) traces may induce sufficiently large error voltages to
trigger the threshold of succeeding circuitry. Care should be
taken in the layout of such traces to avoid this possibility.
Rev. E | Page 17 of 20
ADuM3210/ADuM3211
Data Sheet
Analog Devices performs accelerated life testing using voltage
levels higher than the rated continuous working voltage.
Acceleration factors for several operating conditions are
determined. These factors allow calculation of the time to
failure at the actual working voltage.
The values shown in Table 31 summarize the peak voltage for
50 years of service life for a bipolar ac operating condition and
the maximum CSA/VDE approved working voltages. In many
cases, the approved working voltage is higher than the 50-year
service life voltage. Operation at these high working voltages
can lead to shortened insulation life in some cases.
Note that the voltage presented in Figure 16 is shown as sinusoidal
for illustration purposes only. It is meant to represent any voltage
waveform varying between 0 V and some limiting value. The
limiting value can be positive or negative, but the voltage cannot
cross 0 V.
The insulation lifetime of the ADuM3210/ADuM3211 depends
on the voltage waveform type imposed across the isolation barrier.
The iCoupler insulation structure degrades at different rates
depending on whether the waveform is bipolar ac, unipolar ac, or
dc. Figure 15, Figure 16, and Figure 17 illustrate these different
isolation voltage waveforms.
A bipolar ac voltage environment is the most stringent. The
goal of a 50-year operating lifetime under the ac bipolar
condition determines the Analog Devices recommended
maximum working voltage.
RATED PEAK VOLTAGE
06866-012
All insulation structures eventually break down when subjected to
voltage stress over a sufficiently long period. The rate of insulation
degradation is dependent on the characteristics of the voltage
waveform applied across the insulation. In addition to the testing
performed by the regulatory agencies, Analog Devices carries
out an extensive set of evaluations to determine the lifetime of
the insulation structure within the ADuM3210/ADuM3211.
In the case of unipolar ac or dc voltage, the stress on the insulation
is significantly lower. This allows operation at higher working
voltages while still achieving a 50-year service life. The working
voltages listed in Table 31 can be applied while maintaining the
50-year minimum lifetime provided that the voltage conforms
to either the unipolar ac or dc voltage cases. Any cross-insulation
voltage waveform that does not conform to Figure 16 or Figure 17
should be treated as a bipolar ac waveform, and its peak voltage
should be limited to the 50-year lifetime voltage value listed
in Table 31.
0V
Figure 15. Bipolar AC Waveform
RATED PEAK VOLTAGE
06866-013
INSULATION LIFETIME
0V
Figure 16. Unipolar AC Waveform
06866-014
RATED PEAK VOLTAGE
0V
Figure 17. DC Waveform
Rev. E | Page 18 of 20
Data Sheet
ADuM3210/ADuM3211
OUTLINE DIMENSIONS
5.00 (0.1968)
4.80 (0.1890)
1
5
6.20 (0.2441)
5.80 (0.2284)
4
1.27 (0.0500)
BSC
0.25 (0.0098)
0.10 (0.0040)
COPLANARITY
0.10
SEATING
PLANE
1.75 (0.0688)
1.35 (0.0532)
0.51 (0.0201)
0.31 (0.0122)
0.50 (0.0196)
0.25 (0.0099)
45°
8°
0°
0.25 (0.0098)
0.17 (0.0067)
1.27 (0.0500)
0.40 (0.0157)
COMPLIANT TO JEDEC STANDARDS MS-012-AA
CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS
(IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR
REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN.
Figure 18. 8-Lead Standard Small Outline Package [SOIC_N]
Narrow Body (R-8)
Dimensions shown in millimeters and (inches)
Rev. E | Page 19 of 20
012407-A
8
4.00 (0.1574)
3.80 (0.1497)
ADuM3210/ADuM3211
Data Sheet
ORDERING GUIDE
Model 1, 2
ADuM3210ARZ
ADuM3210ARZ-RL7
ADuM3210BRZ
ADuM3210BRZ-RL7
ADuM3210TRZ
ADuM3210TRZ-RL7
ADuM3210WARZ
ADuM3210WARZ-RL7
ADuM3210WBRZ
ADuM3210WBRZ-RL7
ADuM3210WCRZ
ADuM3210WCRZ-RL7
ADuM3211ARZ
ADuM3211ARZ-RL7
ADuM3211BRZ
ADuM3211BRZ-RL7
ADuM3211TRZ
ADuM3211TRZ-RL7
ADuM3211WARZ
ADuM3211WARZ-RL7
ADuM3211WBRZ
ADuM3211WBRZ-RL7
ADuM3211WCRZ
ADuM3211WCRZ-RL7
Number
of Inputs,
VDD1 Side
2
2
2
2
2
2
2
2
2
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
Number
of Inputs,
VDD2 Side
0
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
1
1
1
1
Maximum
Data Rate
(Mbps)
1
1
10
10
10
10
1
1
10
10
25
25
1
1
10
10
10
10
1
1
10
10
25
25
Maximum
Propagation
Delay, 5 V (ns)
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
50
Maximum
Pulse Width
Distortion (ns)
5
5
3
3
3
3
5
5
3
3
3
3
6
6
4
4
4
4
6
6
4
4
4
4
Temperature Range
−40°C to +105°C
−40°C to +105°C
−40°C to +105°C
−40°C to +105°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +105°C
−40°C to +105°C
−40°C to +105°C
−40°C to +105°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
−40°C to +125°C
Package
Option 3
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
R-8
1
Z = RoHS Compliant Part.
W = Qualified for Automotive Application.
3
R-8 = 8-lead, narrow body SOIC_N.
2
AUTOMOTIVE PRODUCTS
The ADuM3210W/ADuM3211W models are available with controlled manufacturing to support the quality and reliability requirements
of automotive applications. Note that these automotive models may have specifications that differ from the commercial models; therefore,
designers should review the Specifications section of this data sheet carefully. Only the automotive grade products shown are available for
use in automotive applications. Contact your local Analog Devices account representative for specific product ordering information and
to obtain the specific Automotive Reliability reports for these models.
©2007–2011 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D06866-0-11/11(E)
Rev. E | Page 20 of 20
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