Fairchild DM74ALS14SJ Hex inverter with schmitt trigger input Datasheet

Revised February 2000
DM74ALS14
Hex Inverter with Schmitt Trigger Inputs
General Description
Features
This device contains six independent gates, each of which
performs the logic INVERT function. Each input has hysteresis which increases the noise immunity and transforms a
slowly changing input signal to a fast changing, jitter-free
output.
■ Input hysteresis
■ Low output noise generation
■ High input noise immunity
■ Switching specification at 50 pF
■ Switching specifications guaranteed over full temperature and VCC range
■ Advanced oxide-isolated, ion-implanted Schottky TTL
process
■ Functionally and pin-for-pin compatible with Schottky
and low power Schottky TTL counterparts
■ Improved AC performance over low power Schottky
counterpart
Ordering Code:
Order Number
Package Number
Package Description
DM74ALS14M
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
DM74ALS14SJ
M14D
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
DM74ALS14N
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Function Table
Y=A
Input
Output
A
Y
L
H
H
L
H = HIGH Logic Level
L = LOW Logic Level
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DS008773
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DM74ALS14 Hex Inverter with Schmitt Trigger Inputs
March 1986
DM74ALS14
Absolute Maximum Ratings(Note 1)
Supply Voltage
7V
Input Voltage
7V
−65°C to +150°C
Storage Temperature Range
Operating Free Air Temperature Range
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
0°C to +70°C
Typical θJA
N Package
78.5°C/W
M Package
109.0°C/W
Recommended Operating Conditions
Symbol
Parameter
Min
Nom
Max
Units
4.5
5
5.5
V
VCC
Supply Voltage
VT+
Positive-Going Input
VCC = Min to Max
1.4
2
Threshold Voltage
VCC = 5V
1.55
1.85
VT−
HYS
Negative-Going Input
VCC = Min to Max
0.75
1.2
Threshold Voltage
VCC = 5V
0.85
1.1
Input Hysteresis
VCC = Min to Max
0.5
VCC = 5V
0.6
V
V
V
IOH
HIGH Level Output Current
−0.4
mA
IOL
LOW Level Output Current
8
mA
TA
Operating Free Air Temperature Range
70
°C
0
Electrical Characteristics
over recommended free air temperature range (unless otherwise noted)
Symbol
Parameter
Test Conditions
VIK
Input Clamp Voltage
VCC = Min, II = −18 mA
VOH
HIGH Level Output Voltage
VCC = 4.5V to 5.5V, IOH = Max
VOL
LOW Level Output Voltage
VCC = Min
IT+
Input Current at Positive-Going Threshold Voltage
VCC = 5V, VI = VT+
IT−
Input Current at Negative-Going Threshold Voltage VCC = 5V, VI = VT−
II
Input Current at Maximum Input Voltage
VCC = Max, VI = 7V
IIH
HIGH Level Input Current
IIL
Min
Typ
Max
Units
−1.5
V
V
VCC − 2
V
IOL = 4 mA
0.25
0.4
IOL = 8 mA
0.35
0.5
V
20
µA
−100
µA
100
µA
VCC = Max, VI = 2.7V
20
µA
LOW Level Input Current
VCC = Max, VI = 0.4V
−100
µA
IO
Output Drive Current
VCC = Max, VO = 2.25V
−112
mA
ICCH
Supply Current with Outputs HIGH
VCC = Max
12
mA
ICCL
Supply Current with Outputs LOW
VCC = Max
12
mA
VOLP
Quiet Output Maximum
VCC = 5.0V, TA = 25°C
Dynamic VOL
(Figures 1, 2); (Note 2)(Note 3)
VOLV
VIHD
VILD
Quiet Output Minimum
VCC = 5.0V, TA = 25°C
Dynamic VOL
(Figures 1, 2); (Note 2)(Note 3)
Minimum HIGH Level
VCC = 5.0V, TA = 25°C
Dynamic Input Voltage
(Note 2)(Note 4)
Maximum LOW Level
VCC = 5.0V, TA = 25°C
Dynamic Input Voltage
(Note 2)(Note 4)
−30
0.16
V
−0.27
V
1.44
V
1.15
V
Note 2: Plastic DIP package.
Note 3: n = number of device outputs, n − 1 outputs switching, each driven 0V to 3V one output @ GND.
Note 4: n = number of device outputs, n outputs switching, n − 1 inputs switching 0V to 3V. Input under test switching 3V to threshold (VILD); 0V to threshold
(VIHD); f = 1 MHz.
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2
Symbol
over recommended operating free air temperature range
Min
Max
Units
tPLH
Propagation Delay Time LOW-to-HIGH Level Output
Parameter
VCC = 4.5V to 5.5V
Conditions
2
12
ns
tPHL
Propagation Delay Time HIGH-to-LOW Level Output
RL = 500Ω, CL = 50 pF
2
10
ns
ALS Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of ALS.
• Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements.
Equipment:
• Monitor one of the switching outputs using a 50Ω coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
• First increase the input LOW voltage level, VIL, until the
output begins to oscillate. Oscillation is defined as noise
on the output LOW level that exceeds VIL limits, or on
output HIGH levels that exceed VIH limits. The input
LOW voltage level at which oscillation occurs is defined
as VILD.
VILD and VIHD:
Word Generator
Printed Circuit Board Test Fixture
scope
Dual Trace Oscillo-
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500Ω.
2. Deskew the word generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. Swap
out the channels that have more than 150 ps of skew
until all channels being used are within 150 ps. It is
important to deskew the word generator channels
before testing. This will ensure that the outputs switch
simultaneously.
• Next decrease the input HIGH voltage level on the word
generator, VIH until the output begins to oscillate. Oscillation is defined as noise on the output LOW level that
exceeds VIL limits, or on output HIGH levels that exceed
VIH limits. The input HIGH voltage level at which oscillation occurs is defined as VIHD.
3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the
correct voltage.
4. Set VCC to 5.0V.
• Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements.
5. Set the word generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and affect the results of the measurement.
6. Set the word generator input levels at 0V LOW and 3V
HIGH. Verify levels with a digital volt meter.
VOLP/VOLV and VOHP/VOHV:
• Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
VOHV and VOHP are measured with respect to VOH reference. VOLV and
VOLP are measured with respect to ground reference.
Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, t f =
3 ns, skew < 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
FIGURE 2. Simultaneous Switching Test Circuit
3
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DM74ALS14
Switching Characteristics
DM74ALS14
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow
Package Number M14A
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DM74ALS14
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
5
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DM74ALS14 Hex Inverter with Schmitt Trigger Inputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
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device or system whose failure to perform can be reasonably expected to cause the failure of the life support
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1. Life support devices or systems are devices or systems
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to perform when properly used in accordance with
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user.
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