Fairchild FCP11N60-G Design/process change notification Datasheet

PCN# : P315A
Issue Date : Feb. 04, 2013
DESIGN/PROCESS CHANGE NOTIFICATION
This is to inform you that a change is being made to the products listed below.
Unless otherwise indicated in the details of this notification, the identified change will have no impact on product
quality, reliability, electrical, visual or mechanical performance and affected products will remain fully compliant to all
published specifications. Products incorporating this change may be shipped interchangeably with existing unchanged
products.
This change is planned to take effect in 90 calendar days from the date of this notification. Please work with your local
Fairchild Sales Representative to manage your inventory of unchanged product if your evaluation of this change will
require more than 90 calendar days.
Please contact your local Customer Quality Engineer within 30 days of receipt of this notification if you require any
additional data or samples. Alternatively, you may send an email request for data, samples or other information to
[email protected].
Implementation of change:
Expected First Shipment Date for Changed Product : May. 05, 2013
Expected First Date Code of Changed Product :1327
Description of Change (From) :
5/6-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea.
Description of Change (To) :
8-in wafer fabrication line at Fairchild Semiconductor Bucheon Korea.
Reason for Change:
Fairchild Semiconductor is increasing wafer fabrication capacity by qualifying an 8-in wafer fabrication line at Fairchild
Semiconductor Bucheon Korea. Quality and reliability remain at the highest standards already demonstrated within
Fairchild's existing products. The reliability qualification results used to qualify the 8-in wafer fabrication line are
summarized below. The specific groups of products/MOSFET technologies are listed in the affected FSIDs list. Design,
die size and layout of the affected products will remain unchanged. There are no changes in the datasheet or electrical
performance.
1 of 14
Affected Product(s):
FCA20N60
FCA20N60S_F109
FCA47N60
FCA47N60_F109
FCB20N60TM
FCD5N60TM
FCD7N60TM_WS
FCH47N60_F133
FCP11N60F
FCP16N60_G
FCP20N60
FCP260N60E
FCP4N60
FCPF11N60F
FCPF11N65
FCPF190N60
FCPF20N60FS
FCPF20N60ST_G
FCPF380N60
FCPF7N60
FDA24N40F
FDA28N50
FDA38N30
FDA59N30
FDB12N50TM
FDB33N25TM
FDD3N50NZTM
FDD6N20TM
FDD8N50NZTM
FDL100N50F
FDP18N20F
FDP24N40
FDP39N20
FDP5N50NZ
FDPF12N50NZ
FDPF33N25T
FDPF39N20TLDTU
FDPF51N25
FDPF5N50NZ
FDPF5N50NZU
FCA20N60F
FCA20N60_F109
FCA47N60F
FCB11N60TM
FCBB20CH60SF
FCD5N60TM_WS
FCH35N60
FCI7N60
FCP11N60_G
FCP190N60
FCP20N60FS
FCP380N60
FCP7N60
FCPF11N60T
FCPF11N65_G
FCPF190N60E
FCPF20N60S
FCPF20N60T
FCPF380N60E
FCPF7N60YDTU
FDA24N50
FDA28N50F
FDA50N50
FDA69N25
FDB20N50F
FDB44N25TM
FDD5N50NZFTM
FDD6N25TM
FDH45N50F_F133
FDP12N50NZ
FDP19N40
FDP26N40
FDP51N25
FDP61N20
FDPF13N50NZ
FDPF33N25TRDTU
FDPF3N50NZ
FDPF51N25RDTU
FDPF5N50NZF
FDPF8N50NZ
2 of 14
FCA20N60FS
FCA35N60
FCA47N60F_SN00171
FCB20N60FTM
FCD4N60TM
FCD7N60TM
FCH47N60F_F133
FCP11N60
FCP16N60
FCP190N60E
FCP20N60_G
FCP380N60E
FCPF11N60
FCPF11N60_G
FCPF16N60
FCPF20N60
FCPF20N60ST
FCPF260N60E
FCPF400N60
FCU5N60TU
FDA24N50F
FDA33N25
FDA59N25
FDA70N20
FDB28N30TM
FDB52N20TM
FDD5N50NZTM
FDD6N50FTM
FDH50N50_F133
FDP15N40
FDP22N50N
FDP33N25
FDP52N20
FDP8N50NZ
FDPF18N20FT
FDPF39N20
FDPF44N25T
FDPF51N25YDTU
FDPF5N50NZFT
FDPF8N50NZF
Affected Product(s):
FDPF8N50NZU
FGD4536TM
FGH40N60SFDTU
FGH40N60SMDF
FGH40N60UFTU
FGH80N60FD2TU
FGPF4533RDTU
FGPF4536YDTU
FGPF4636YDTU
PCFC47N60FW
FDPF9N50NZ
FGH20N60SFDTU
FGH40N60SFTU
FGH40N60UFDTU
FGH40N60UFTU_SN00007
FGH80N60FDTU
FGPF4536
FGPF4633RDTU
PCFC11N60W
PCFC47N60FW_SN00201
3 of 14
FGA40N65SMD
FGH20N60UFDTU
FGH40N60SMD
FGH40N60UFDTU_SN00006
FGH40N65UFDTU
FGPF4533
FGPF4536JDTU
FGPF4633TU
PCFC20N60W
PCFG40N65SMW
Qualification Plan
Q20120257
Reliability
Test
HTGB
HTRB
HTSL
HAST
PRCL
Device
FDA59N25
Package
TT3P0003
Device
Name
Lot No.
Process
UniFET1 150~250V
FDA59N25
FDA59N25
No. of Lots
3
FDA59N25
Condition
Standard
Duration
Result/FA
Result/FA
Result/FA
100 % Rated
VGS, Tj
max=150C
80% of Rated
BV, Tj
max=150C
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A108
1000hrs
0/77
0/77
0/77
1000hrs
0/77
0/77
0/77
96hrs
0/77
0/77
0/77
6000
cycles
0/77
0/77
0/77
10sec
0/30
0/30
0/30
500
cycles
0/77
0/77
0/77
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 5
min on, 3.5 min
off
RSDH
260C
TMCL
-65 C to 150 C,
30 min/ cycles
JESD22A103
JESD22A110
MIL-STD750-1036
JESD22B106
JESD22A104
4 of 14
Q20120257AA Q20120257AB Q20120257AC
Qualification Plan
Q20120259
Reliability
Test
HTGB
HTRB
HTSL
HAST
PRCL
Device
FDH50N50_F133
Condition
100 %
Rated
VGS, Tj
max=150
C
80% of
Rated
BV, Tj
max=150
C
150 C
130 C,
85% RH,
Vds=42V
Delta
100C, 5
min on,
3.5 min
off
Package
TO247003
Device
Name
Lot No.
Process
UniFET1 300~500V (Over 24A)
No. of Lots
3
FDH50N50_F133
FDH50N50_F133
FDH50N50_F133
Q20120259AA
Q20120259AB
Q20120259AC
Duration
Result/FA
Result/FA
Result/FA
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A103
1000hrs
0/77
0/77
0/77
JESD22A110
96hrs
0/77
0/77
0/77
MIL-STD750-1036
6000
cycles
0/77
0/77
0/77
Standard
RSDH
260C
JESD22B106
10sec
0/30
0/30
0/30
TMCL
-65 C to
150 C, 30
min/
cycles
JESD22A104
500
cycles
0/77
0/77
0/77
5 of 14
Qualification Plan
Q20120260
Reliability
Test
HTGB
HTRB
Device
FDP22N50N
Condition
Standard
100 % Rated VGS,
Tj max=150C
80% of Rated BV,
Tj max=150C
HTSL
150 C
HAST
130 C, 85% RH,
Vds=42V
PRCL
Delta 100C, 3.5
min on, 3.5 min off
RSDH
260C
TMCL
-65 C to 150 C, 30
min/ cycles
Qualification Plan
Q20120263
Reliability
Test
HTGB
HTRB
JESD22A108
JESD22A108
JESD22A103
JESD22A110
MILSTD7501036
JESD22B106
JESD22A104
Device
FCP20N60
Condition
100 % Rated VGS,
Tj max=150C
80% of Rated BV,
Tj max=150C
HTSL
150 C
HAST
130 C, 85% RH,
Vds=42V
PRCL
Delta 100C, 3.5
min on, 3.5 min off
RSDH
260C
TMCL
-65 C to 150 C, 30
min/ cycles
Standard
JESD22A108
JESD22A108
JESD22A103
JESD22A110
MILSTD7501036
JESD22B106
JESD22A104
Package
TO220003
Process
UniFET2 500V
No. of Lots
3
FDP22N50N
FDP22N50N
FDP22N50N
Q20120260AA
Q20120260AB
Q20120260AC
Duration
Result/FA
Result/FA
Result/FA
1000hrs
0/77
0/77
0/77
1000hrs
0/77
0/77
0/77
1000hrs
0/77
0/77
0/77
96hrs
0/77
0/77
0/77
8572
cycles
0/77
0/77
0/77
10 sec
0/30
0/30
0/30
500
cycles
0/77
0/77
0/77
Device
Name
Lot No.
Package
TO220003
Device
Name
Lot No.
Process
Super-FET 600V TO220
No. of Lots
3
FCP20N60
FCP20N60
FCP20N60
Q20120263AA
Q20120263AB
Q20120263AC
Duration
Result/FA
Result/FA
Result/FA
1000hrs
0/77
0/77
0/77
1000hrs
0/77
0/77
0/77
1000hrs
0/77
0/77
0/77
96hrs
0/77
0/77
0/77
8572
cycles
0/77
0/77
0/77
10 sec
0/30
0/30
0/30
500
cycles
0/77
0/77
0/77
6 of 14
Qualification Plan
Q20120265
Reliability Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Device
FCB20N60TM
Condition
L1 245C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj
max=150C
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 3.5 min on,
3.5 min off
260C
-65 C to 150 C, 30 min/
cycles
Package
TT263002
FCB20N60TM
Lot No.
Q20120265AA
Duration
Result/FA
JESD22-A113
5 Cycles 24 hrs
0/154
JESD22-A108
1000hrs
0/77
JESD22-A108
1000hrs
0/77
JESD22-A103
1000hrs
0/77
JESD22-A110
96hrs
0/77
Standard
MIL-STD-7501036
JESD22-B106
8572 cycles
0/77
10 sec
0/30
JESD22-A104
500 cycles
0/77
Device
Package
Q20120266
FDB52N20TM
TT263002
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
L1 245C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj
max=150C
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 3.5 min on,
3.5 min off
260C
-65 C to 150 C, 30 min/
cycles
No. of Lots
1
Device Name
Qualification Plan
Reliability Test
Process
Super-FET 600V D2pak
Process
UNIFET 200V(include 250V
/Dpak and D2 pak)
No. of Lots
1
Device Name
FDB52N20TM
Lot No.
Q20120266AA
Duration
Result/FA
JESD22-A113
5 Cycles 24 hrs
0/154
JESD22-A108
1000hrs
0/77
JESD22-A108
1000hrs
0/77
JESD22-A103
1000hrs
0/77
JESD22-A110
96hrs
0/77
Standard
MIL-STD-7501036
JESD22-B106
8572 cycles
0/77
15 sec
0/30
JESD22-A104
500 cycles
0/77
7 of 14
Qualification Plan
Q20120267
Reliability Test
Device
FDB12N50TM
Condition
PRECON
HTRB
HTSL
130 C, 85% RH,
Vds=42V
Delta 100C, 2 min on,
3.5 min off
260C
-65 C to 150 C, 30 min/
cycles
HAST
PRCL
RSDH
TMCL
Qualification Plan
Q20120268
Device
FCA47N60
Process
UNIFET1 300-500V_D2pak
No. of Lots
1
Device Name
FDB12N50TM
Lot No.
Q20120267AA
Duration
Result/FA
JESD22-A113
5 Cycles 24 hrs
0/154
JESD22-A108
1000hrs
0/77
JESD22-A108
1000hrs
0/77
JESD22-A103
1000hrs
0/77
JESD22-A110
96hrs
0/77
Standard
L1 245C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj
max=150C
150 C
HTGB
Reliability Test
Package
TT263002
MIL-STD-7501036
JESD22-B106
8572 cycles
0/77
10 sec
0/30
JESD22-A104
500 cycles
0/77
Package
TT3P0003
Process
SuperFET 600V TO3P/TO247
Condition
Standard
No. of Lots
1
Device Name
FCA47N60
Lot No.
Q20120268AA
Duration
Result/FA
HTGB
100 % Rated VGS, Tj max=150C
JESD22-A108
1000hrs
0/77
HTRB
80% of Rated BV, Tj max=150C
JESD22-A108
1000hrs
0/77
HTSL
150 C
JESD22-A103
1000hrs
0/77
HAST
130 C, 85% RH, Vds=42V
JESD22-A110
96hrs
0/77
PRCL
Delta 100C, 5 min on, 3.5 min off
MIL-STD-750-1036
6000 cycles
0/77
RSDH
260C
JESD22-B106
10 sec
0/30
TMCL
-65 C to 150 C, 30 min/ cycles
JESD22-A104
500 cycles
0/77
8 of 14
Qualification Plan
Q20120269
Reliability
Test
PRECON
Device
FGD4536TM
Package
TT252003
Condition
Process
PDP 4GEN Trench IGBT_360V Dpak
Standard
L1 260C
JESD22-A113
No. of Lots
1
Device Name
FGD4536TM
Lot No.
Q20120269AA
Duration
5 Cycles 24
hrs
Result/FA
0/154
JESD22-A108
1000hrs
0/77
HTRB
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj max=150C
JESD22-A108
1000hrs
0/77
HTSL
150 C
JESD22-A103
1000hrs
0/77
HAST
JESD22-A110
MIL-STD-7501036
JESD22-B106
96hrs
0/77
10000 cycles
0/77
RSDH
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min
off
260C
10 sec
0/30
TMCL
-65 C to 150 C, 30 min/ cycles
JESD22-A104
500 cycles
0/77
HTGB
PRCL
Qualification Plan
Q20120270
Reliability
Test
PRECON
Device
FCD7N60TM
Package
TT252002
Condition
L1 260C
Process
SuperFET_600V Dpak
Standard
JESD22-A113
No. of Lots
1
Device Name
FCD7N60TM
Lot No.
Q20120270AA
Duration
5 Cycles 24
hrs
Result/FA
0/154
JESD22-A108
1000hrs
0/77
HTRB
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj max=150C
JESD22-A108
1000hrs
0/77
HTSL
150 C
JESD22-A103
1000hrs
0/77
HAST
JESD22-A110
MIL-STD-7501036
JESD22-B106
96hrs
0/77
10000 cycles
0/77
RSDH
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min
off
260C
10 sec
0/30
TMCL
-65 C to 150 C, 30 min/ cycles
JESD22-A104
500 cycles
0/77
HTGB
PRCL
9 of 14
Qualification Plan
Q20120271
Device
FDD7N60NZTM
Package
TT252003
Process
UniFET2 600V Dpak
No. of Lots
1
Device Name
FDD7N60NZTM
Lot No.
Q20120271AA
Duration
5 Cycles 24
hrs
Result/FA
JESD22-A108
1000hrs
0/77
JESD22-A108
1000hrs
0/77
JESD22-A103
1000hrs
0/77
JESD22-A110
MIL-STD-7501036
JESD22-B106
96hrs
0/77
10000 cycles
0/77
RSDH
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min
off
260C
10sec
0/30
TMCL
-65 C to 150 C, 30 min/ cycles
JESD22-A104
500 cycles
0/77
Reliability
Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
Condition
Standard
L1 260’C
JESD22-A113
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj
max=150C
150 C
0/154
Qualification Plan
Device
Package
Process
No. of Lots
Q20120272
FCP190N60
TT220003
Super-FET2 600V
3
Reliability
Test
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
100 % Rated
VGS, Tj
max=150C
80% of Rated
BV, Tj
max=150C
150 C
Device
Name
Lot No.
FCP190N60
FCP190N60
FCP190N60
Q20120272AA
Q20120272AB
Q20120272AC
Duration
Result/FA
Result/FA
Result/FA
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A108
1000hrs
0/77
0/77
0/77
1000hrs
0/77
0/77
0/77
96hrs
0/77
0/77
0/77
8572
cycles
0/77
0/77
0/77
10 sec
0/30
0/30
0/30
500
cycles
0/77
0/77
0/77
Standard
JESD22A103
JESD22A110
130 C, 85%
RH, Vds=42V
Delta 100C, 2
MIL-STDmin on, 3.5 min
750-1036
off
JESD22260C
B106
-65 C to 150 C, JESD2230 min/ cycles A104
10 of 14
Qualification Plan
Q20120273
Reliability Test
Device
FCPF190N60
Package
TF22S003
Condition
Process
SuperFET2 600V TO220F
Standard
No. of Lots
1
Device Name
FCPF190N60
Lot No.
Q20120273AA
Duration
Result/FA
HTGB
100 % Rated VGS, Tj max=150C
JESD22-A108
1000hrs
0/77
HTRB
80% of Rated BV, Tj max=150C
JESD22-A108
1000hrs
0/77
HTSL
150 C
JESD22-A103
1000hrs
0/77
HAST
130 C, 85% RH, Vds=42V
JESD22-A110
96hrs
0/77
PRCL
Delta 100C, 2 min on, 3.5 min off
MIL-STD-750-1036
8572 cycles
0/77
RSDH
260C
JESD22-B106
10 sec
0/30
TMCL
-65 C to 150 C, 30 min/ cycles
JESD22-A104
500 cycles
0/77
Qualification Plan
Q20120277
Reliability
Test
PRECON
Device
FDD6N50TM
Package
TT252002
Condition
L1 260’C
Process
UniFET1 300-500V/Dpak Ipak
Standard
JESD22-A113
No. of Lots
1
Device Name
FDD6N50TM
Lot No.
Q20120277AA
Duration
5 Cycles 24
hrs
Result/FA
0/154
JESD22-A108
1000hrs
0/77
HTRB
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj max=150C
JESD22-A108
1000hrs
0/77
HTSL
150 C
JESD22-A103
1000hrs
0/77
HAST
JESD22-A110
MIL-STD-7501036
JESD22-B106
96hrs
0/77
10000 cycles
0/77
RSDH
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min
off
260C
10 sec
0/30
TMCL
-65 C to 150 C, 30 min/ cycles
JESD22-A104
500 cycles
0/77
HTGB
PRCL
11 of 14
Qualification Plan
Q20130022A
Reliability
Test
PRECON
HTGB
HTRB
Device
FCB20N60FTM
FCH47N60F_F133
Condition
L1 245’C
100 %
Rated VGS,
Tj
max=150C
80% of
Rated BV,
Tj
max=150C
Standard
Device
Name
Lot No.
JESD22A113
Duration
5 Cycles
24 hrs
Package
TT263002
TO247003
Process
No. of Lots
2
1
SuperFET FR FET
FCB20N60FTM
FCB20N60FTM
FCH47N60F_F133
Q20130022AA
Q20130022AB
Q20130022BA
Result/FA
Result/FA
Result/FA
0/154
0/154
-
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A108
1000hrs
0/77
0/77
0/77
HTSL
150 C
JESD22A103
1000hrs
0/77
0/77
0/77
HAST
130 C, 85%
RH,
Vds=42V
JESD22A110
96hrs
0/77
0/77
0/77
PRCL
Delta 100C,
2 min on,
3.5 min off
0/77
0/77
0/77
RSDH
260C
0/30
0/30
0/30
TMCL
-65 C to
150 C, 30
min/ cycles
0/77
0/77
0/77
8572
MIL-STD- cycles
750-1036 5000
cycles
JESD2210 sec
B106
JESD22A104
500
cycles
12 of 14
Qualification
Plan
Device
Q20130023
FGPF4633TU TF22S003
Reliability
Test
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
Package
PDP 4GEN Trench IGBT 330V_360V
TO220F
3
FGPF4633TU
FGPF4633TU
FGPF4633TU
Q20130023AA
Q20130023AB
Q20130023AC
Duration
Result/FA
Result/FA
Result/FA
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A108
1000hrs
0/77
0/77
0/77
1000hrs
0/77
0/77
0/77
96hrs
0/77
0/77
0/77
8572
cycles
0/77
0/77
0/77
10 sec
0/30
0/30
0/30
500
cycles
0/77
0/77
0/77
JESD22A103
JESD22A110
150 C
No. of
Lots
Device
Name
Lot No.
Standard
100 % Rated
VGS, Tj
max=150C
80% of Rated
BV, Tj
max=150C
Process
130 C, 85%
RH, Vds=42V
Delta 100C, 2
MIL-STDmin on, 3.5 min
750-1036
off
JESD22260C
B106
-65 C to 150 C, JESD2230 min/ cycles A104
Qualification Plan
Device
Package
Process
No. of Lots
Q20130024
FCP20N60
TO220003
Super-FET 600V TO220
1
Reliability Test
Condition
Standard
Device Name
FCP20N60
Lot No.
Q20130024AA
Duration
Result/FA
HTGB
100 % Rated VGS, Tj max=150C
JESD22-A108
1000hrs
0/77
HTRB
80% of Rated BV, Tj max=150C
JESD22-A108
1000hrs
0/77
HTSL
150 C
JESD22-A103
1000hrs
0/77
HAST
130 C, 85% RH, Vds=42V
JESD22-A110
96hrs
0/77
PRCL
Delta 100C, 2 min on, 3.5 min off
MIL-STD-750-1036
8572 cycles
0/77
RSDH
260C
JESD22-B106
10 sec
0/30
TMCL
-65 C to 150 C, 30 min/ cycles
JESD22-A104
500 cycles
0/77
13 of 14
Qualification Plan
Q20130020
Reliability
Test
HTGB
HTRB
HTSL
HAST
PRCL
TMCL
Condition
100 % Rated
VGS, Tj
max=175C
80% of
Rated BV, Tj
max=175C
150 C
130 C, 85%
RH,
Vds=42V
Delta 100C,
5 min on, 5
min off
-65 C to 150
C, 30 min/
cycles
Device
FGH40N60SMD
Package
TO247003
Process
FS IGBT 600V
No. of Lots
3
Device
Name
Lot No.
FGH40N60SMD
FGH40N60SMD
FGH40N60SMD
Q20130020AA
Q20130020AB
Q20130020AC
Duration
Result/FA
Result/FA
Result/FA
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A108
1000hrs
0/77
0/77
0/77
JESD22A103
1000hrs
0/77
0/77
0/77
JESD22A110
96hrs
0/77
0/77
0/77
MIL-STD750-1036
6000
cycles
0/77
0/77
0/77
JESD22A104
500
cycles
0/77
0/77
0/77
Standard
14 of 14
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