TOSHIBA TC4027BP_07

TC4027BP/BF/BFN
TOSHIBA CMOS Digital Integrated Circuit
Silicon Monolithic
TC4027BP,TC4027BF,TC4027BFN
TC4027B Dual J-K Master-Slave Flip Flop
TC4027B is J-K master-slave flip-flop having RESET and SET
functions.
In the case of J-K made, when the clock input is given with
both RESET and SET at “L”, the output changes at rising edge of
the clock according to the states of J and K.
When SET input is placed at “H”, and RESET input is placed
at “L”, outputs become Q = “H”, and Q = “L”.
When RESET input is placed at “H”, and SET input is placed
at “L”, outputs become Q = “L”, and Q = “H”.
When both of RESET input and SET input are at “H”, outputs
become Q = “H” and Q = “H”.
Note: xxxFN (JEDEC SOP) is not available in
Japan.
TC4027BP
TC4027BF
Pin Assignment
TC4027BFN
Block Diagram
Weight
DIP16-P-300-2.54A
SOP16-P-300-1.27A
SOL16-P-150-1.27
1
: 1.00 g (typ.)
: 0.18 g (typ.)
: 0.13 g (typ.)
2007-10-01
TC4027BP/BF/BFN
Truth Table
Inputs
Outputs
RESET
SET
J
K
CLOCKΔ
Qn + 1
Qn + 1
L
H
*
*
*
H
L
H
L
*
*
*
L
H
H
H
*
*
*
H
H
L
L
L
L
Qn*
Qn*
L
L
L
H
L
H
L
L
H
L
H
L
L
L
H
H
Qn **
Qn**
L
L
*
*
Qn*
Qn *
*: Don’t care
Δ: Level change
*: No change
**: Change
Logic Diagram
1/2 TC4027B
Absolute Maximum Ratings (Note)
Characteristics
DC supply voltage
Symbol
Rating
Unit
VDD
VSS − 0.5 to VSS + 20
V
V
VIN
VSS − 0.5 to VDD + 0.5
VOUT
VSS − 0.5 to VDD + 0.5
V
IIN
±10
mA
Power dissipation
PD
300 (DIP)/180 (SOIC)
mW
Operating temperature range
Topr
−40 to 85
°C
Storage temperature range
Tstg
−65 to 150
°C
Input voltage
Output voltage
DC input current
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or
even destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
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TC4027BP/BF/BFN
Operating Ranges (VSS = 0 V) (Note)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
DC supply voltage
VDD
⎯
3
⎯
18
V
Input voltage
VIN
⎯
0
⎯
VDD
V
Note:
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VDD or VSS.
Static Electrical Characteristics (VSS = 0 V)
Characteristics
High-level output
voltage
Low-level output
voltage
Symbol
VOH
VOL
IOH
25°C
85°C
VDD
(V)
Min
Max
Min
Typ.
Max
Min
Max
5
4.95
⎯
4.95
5.00
⎯
4.95
⎯
10
9.95
⎯
9.95
10.00
⎯
9.95
⎯
15
14.95
⎯
14.95
15.00
⎯
14.95
⎯
5
⎯
0.05
⎯
0.00
0.05
⎯
0.05
10
⎯
0.05
⎯
0.00
0.05
⎯
0.05
15
⎯
0.05
⎯
0.00
0.05
⎯
0.05
5
−0.61
⎯
−0.51
−1.0
⎯
−0.42
⎯
VOH = 2.5 V
5
−2.50
⎯
−2.10
−4.0
⎯
−1.70
⎯
VOH = 9.5 V
10
−1.50
⎯
−1.30
−2.2
⎯
−1.10
⎯
VOH = 13.5 V
15
−4.00
⎯
−3.40
−9.0
⎯
−2.80
⎯
VOL = 0.4 V
5
0.61
⎯
0.51
1.2
⎯
0.42
⎯
VOL = 0.5 V
10
1.50
⎯
1.30
3.2
⎯
1.10
⎯
VOL = 1.5 V
15
4.00
⎯
3.40
12.0
⎯
2.80
⎯
VOUT = 0.5 V, 4.5 V
5
3.5
⎯
3.5
2.75
⎯
3.5
⎯
VOUT = 1.0 V, 9.0 V
10
7.0
⎯
7.0
5.50
⎯
7.0
⎯
VOUT = 1.5 V, 13.5 V
15
11.0
⎯
11.0
8.25
⎯
11.0
⎯
VOUT = 0.5 V, 4.5 V
5
⎯
1.5
⎯
2.25
1.5
⎯
1.5
VOUT = 1.0 V, 9.0 V
10
⎯
3.0
⎯
4.50
3.0
⎯
3.0
VOUT = 1.5 V, 13.5 V
15
⎯
4.0
⎯
6.75
4.0
⎯
4.0
18
⎯
0.1
⎯
10−
5
0.1
⎯
1.0
−5
−0.1
⎯
−1.0
30
⎪IOUT⎪ < 1 μA
VIN = VSS, VDD
⎪IOUT⎪ < 1 μA
VIN = VSS, VDD
VOH = 4.6 V
Output high current
−40°C
Test Condition
Unit
V
V
mA
VIN = VSS, VDD
Output low current
IOL
mA
VIN = VSS, VDD
Input high voltage
VIH
V
⎪IOUT⎪ < 1 μA
Input low voltage
VIL
V
⎪IOUT⎪ < 1 μA
Input
current
“H” level
“L” level
Quiescent supply
current
IIH
IIL
IDD
VIH = 18 V
VIL = 0 V
VIN = VSS, VDD
(Note)
18
⎯
−0.1
⎯
−10
5
⎯
1
⎯
0.002
1
⎯
10
⎯
2
⎯
0.004
2
⎯
60
15
⎯
4
⎯
0.008
4
⎯
120
μA
μA
Note: All valid input combinations.
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TC4027BP/BF/BFN
Dynamic Electrical Characteristics (Ta = 25°C, VSS = 0 V, CL = 50 pF)
Characteristics
Output transition time
(low to high)
Output transition time
(high to low)
(CLOCK-Q, Q )
tpHL
Propagation delay time
tpLH
(SET, RESET-Q, Q )
tpHL
trCL
Max clock input fall time
tfCL
Min clock pulse width
Min set-up time
(J, K-CLOCK)
Min hold time
(J, K-CLOCK)
Min removal time
(SET, RESET-CLOCK)
Input capacitance
⎯
⎯
⎯
⎯
fCL
Max clock input rise time
(SET, RESET)
⎯
tTHL
tpLH
Min pulse width
VDD (V)
tTLH
Propagation delay time
Max clock frequency
Test Condition
Symbol
Min
Typ.
Max
5
⎯
70
200
10
⎯
35
100
15
⎯
30
80
5
⎯
70
200
10
⎯
35
100
15
⎯
30
80
5
⎯
150
300
10
⎯
75
130
15
⎯
60
90
5
⎯
120
300
10
⎯
60
130
15
⎯
45
90
5
3.5
8
⎯
10
8.0
16
⎯
15
12.0
20
⎯
Unit
ns
ns
ns
ns
MHz
5
⎯
10
μs
No limit
15
⎯
tW
⎯
tW
⎯
tSU
⎯
tH
⎯
trem
⎯
CIN
4
5
⎯
60
180
10
⎯
35
80
15
⎯
25
50
5
⎯
60
140
10
⎯
35
60
15
⎯
25
40
5
⎯
30
140
10
⎯
10
50
15
⎯
5
35
5
⎯
⎯
140
10
⎯
⎯
50
15
⎯
⎯
35
5
⎯
⎯
40
10
⎯
⎯
20
15
⎯
⎯
15
⎯
5
7.5
ns
ns
ns
ns
ns
pF
2007-10-01
TC4027BP/BF/BFN
Waveforms for Measurement of Dynamic Characteristics
Waveform 1
Waveform 2
Waveform 3
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TC4027BP/BF/BFN
Package Dimensions
Weight: 1.00 g (typ.)
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TC4027BP/BF/BFN
Package Dimensions
Weight: 0.18 g (typ.)
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TC4027BP/BF/BFN
Package Dimensions (Note)
Note: This package is not available in Japan.
Weight: 0.13 g (typ.)
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TC4027BP/BF/BFN
RESTRICTIONS ON PRODUCT USE
20070701-EN GENERAL
• The information contained herein is subject to change without notice.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
• The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
TOSHIBA or the third parties.
• Please contact your sales representative for product-by-product details in this document regarding RoHS
compatibility. Please use these products in this document in compliance with all applicable laws and regulations
that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses
occurring as a result of noncompliance with applicable laws and regulations.
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2007-10-01