TPD1008SA TOSHIBA Intelligent Power Device Silicon Monolithic Power MOS Integrated Circuit TPD1008SA High-side Power Switch for Motors, Solenoids, and Lamp Drivers The TPD1008SA is a monolithic power IC for high-side switches. The IC has a vertical MOS FET output which can be directly driven from a CMOS or TTL logic circuit (e.g., an MPU). The device offers intelligent self-protection and diagnostic functions. Features z A monolithic power IC with a new structure combining a control block (Bi–CMOS) and a vertical power MOS FET (π–MOS) on a single chip z One side of load can be grounded to a high-side switch. z Can directly drive a power load from a microprocessor. z Built–in protection against thermal shutdown and load short circuiting z Incorporates a diagnosis function that allows diagnosis output to be read externally at load short-circuiting, opening, or overtemperature. z Up to −10V of counter-electromotive force from an L load can be applied. z Low on-resistance : RDS (ON) = 200mΩ (max) z Low operating current : IDD = 1mA (typ.) (@VDD = 12V, VIN = 0V) z 5-pin TO−220 insulated package z Three standard lead configurations Pin Assignment Weight SSIP5–P–1.70C : 2.1g (typ.) ZIP5–P–1.70L : 2.1g (typ.) ZIP5–P–1.70K : 2.1g (typ.) Note: Due to its MOS structure, this product is sensitive to static electricity. 1 2006-10-31 TPD1008SA Marking Lot No. TPD 1008SA A line indicates lead (Pb)-free package or lead (Pb)-free finish. Part No. (or abbreviation code) Block Diagram Pin Description Pin No. Symbol Function 1 IN 2 DIAG Self−diagnosis detection pin. Goes low when overheating is detected or when output is short-circuited with input on (high). n−channel open drain. 3 GND Ground pin. 4 OUT When the load is short-circuited and current in excess of the detection current flows to the output pin, the output automatically turns on or off. 5 VDD Power pin. Input is CMOS−compatible, with pull–down resistor connected. Even if the input is open, output will not accidentally turn on. 2 2006-10-31 TPD1008SA Timing Chart INPUT SIGNAL OVERHEATING DETECTION OVERCURRENT DETECTION OUTPUT SIGNAL OFF CURRENT LIMIT DIAGNOSIS OUTPUT Truth Table Input Signal Output Signal Diagnosis Output H H H L L L H L L L L L H H H L H H H L L L L L 3 State Normal Load short circuited Load open Overtemperature 2006-10-31 TPD1008SA Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Drain-source Voltage Supply Voltage Input Voltage Unit VDS 60 V DC VDD (1) 25 V Pulse VDD (2) 60 (Rs = 1Ω, τ = 250ms) V DC VIN (1) −0.5~12 V Pulse VIN (2) VDD (1) + 1.5 (t = 100ms) V VDIAG −0.5~25 V IO Internally Limited A Diagnosis Output Voltage Output Current Input Current IIN ±10 mA IDIAG 5 mA Tc = 25°C PD (1) 30 W Ta = 25°C PD (2) 2 W Topr −40~110 °C Tj 150 °C Diagnosis Output Current Power Dissipation Rating Operating Temperature Junction Temperature Storage Temperature Tstg −55~150 °C Lead Temperature/Time TSOL 275 (5s), 260 (10s) °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Electrical Characteristics (TC = −40~110°C, VDD = 8~18V) Characteristics Operating Supply Voltage Supply Current Input Voltage Symbol Test Condition Typ. Max Unit ― 5 12 18 V IDD ― VDD = 12V, VIN = 0V ― 1 5 mA VIH ― VDD = 12V, IO = 2A 3.5 ― ― V VIL ― VDD = 12V, IO = 1.2mA ― ― 1.5 V VDD = 12V, VIN = 5V ― 50 200 μA VDD = 12V, VIN = 0V −0.2 ― 0.2 μA ― ― 0.4 V IIN (2) ― ― Min VDD (opr) IIN (1) Input Current Test Circuit On Voltage VDS (ON) ― VDD = 12V, IO = 2A, TC = 25°C On Resistance RDS (ON) ― VDD = 12V, IO = 2A, TC = 25°C ― ― 0.2 Ω Output Leakage Current IOL ― VDD = 18V, VIN = 0V ― ― 1.2 mA Diagnosis Output Voltage “L” Level VDL ― VDD = 12V, IDL = 2mA ― ― 0.4 V Diagnosis Output Current “H” Level IDH ― VDD = 18V, VDH = 18V ― ― 10 μA IS (1) (Note 1) 1 4 6 8 A IS (2) (Note 2) 2 4 8 12 A ― 150 160 200 °C ― ― 10 ― °C Overcurrent Protection Thermal Shutdown Temperature Hysteresis Open Detection Resistance Switching Time TS ΔTS Rops tON tOFF VDD = 12V, TC = 25°C ― ― VDD = 8V 1 20 100 kΩ 3 VDD = 12V, RL = 5Ω TC = 25°C 10 100 ― μs 10 30 ― μs Note 1: Overcurrent detection value when load is short-circuited and VIN = “L” → “H” Note 2: Overcurrent detection value when load current is increased while VIN = “H” 4 2006-10-31 TPD1008SA Test Circuit 1 Overcurrent Detection Test Circuit 2 Overcurrent Detection Test Circuit 3 Switching Time 5 2006-10-31 TPD1008SA TC=25℃ TC=25℃ RDS(ON) - TC TC=25℃ CASE TEMPERATURE IS - TC (℃) TC TC=25℃ CASE TEMPERATURE TC (℃) 6 2006-10-31 TPD1008SA VDL - TC TC=25℃ CASE TEMPERATURE ROPS - TC (℃) TC CASE TEMPERATURE TC (℃) TC=25℃ Precaution 1. Since there is no built-in protection against reverse connection of batteries, etc., provide such protection using external circuits. 7 2006-10-31 TPD1008SA Package Dimensions Weight: 2.1g (typ.) 8 2006-10-31 TPD1008SA Package Dimensions Weight: 2.1g (typ.) 9 2006-10-31 TPD1008SA Package Dimensions Weight: 2.1g (typ.) 10 2006-10-31 TPD1008SA RESTRICTIONS ON PRODUCT USE 20070701-EN • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 11 2006-10-31