ATMEL ATA5577 Contactless power supply contactless read/write data transmission Datasheet

Features
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Contactless Power Supply
Contactless Read/Write Data Transmission
Radio Frequency fRF from 100 kHz to 150 kHz
Basic Mode or Extended Mode
Compatible with T5557, ATA5567
Replacement for e5551/T5551 in Most Common Operation Modes
Configurable for ISO/IEC 11784/785 Compatibility
Total 363 Bits EEPROM Memory: 11 Blocks (32 Bits + 1 Lock Bit)
High Q-antenna Tolerance Due to Build in Options
Adaptable to Different Applications: Access Control, Animal ID and Waste
Management
• On-chip Trimmed Antenna Capacitor
• Pad Options
– ATA5577M1
• 100 µm × 100 µm for Wire Bonding or Flip Chip
– ATA5577M2
• 200 µm × 400 µm for Direct Coil Bonding
Read/Write LF
RFID IDIC
100 to 150 kHz
ATA5577
Summary
1. Description
®
The ATA5577 is a contactless read/write identification IC (IDIC ) for applications in
the 125-kHz or 134-kHz frequency band. A single coil connected to the chip serves as
the IC’s power supply and bi-directional communication interface. The antenna and
chip together form a transponder or tag.
The on-chip 363-bit EEPROM (11 blocks with 33 bits each) can be read and written
block-wise from a base station (reader).
Data is transmitted from the IDIC (uplink) using load modulation. This is achieved by
damping the RF field with a resistive load between the two terminals Coil 1 and Coil 2.
The IC receives and decodes serial base station commands (downlink), which are
encoded as 100% amplitude modulated (OOK) pulse-interval-encoded bit streams.
A complete datasheet with further technical data is available on request. Please contact your local sales office.
NOTE: This is a summary document.
The complete document is available.
For more information, please contact
your local Atmel sales office.
4967DS–RFID–10/08
2. Compatibility
The ATA5577 is designed to be compatible with the T5557/ATA5567. The structure of the configuration register is identical. The two modes, Basic mode and Extended mode, are also
available. The ATA5577 is able to replace the e5551/T5551 in most common operation modes.
In all applications, the correct functionality of the replacements must be evaluated and proved.
For further details, refer to Atmel®’s web site for product-relevant application notes.
3. System Block Diagram
Figure 3-1.
RFID System Using ATA5577 Tag
Data
1)
Controller
Power
Reader
or
Base station
Coil interface
Transponder
Memory
ATA5577
1) Mask option
4. ATA5577 - Functional Blocks
Figure 4-1.
Block Diagram
Option register
POR
1)
Mode register
Write
decoder
Coil 1
Analog front end
Modulator
Memory
(363-bit EEPROM)
Data-rate
generator
Controller
Coil 2
Input register
Test logic
HV generator
1) Mask option
2
ATA5577
4967DS–RFID–10/08
ATA5577
4.1
Analog Front End (AFE)
The AFE includes all circuits that are directly connected to the coil terminals. It generates the
IC's power supply and handles the bi-directional data communication with the reader. It consists
of the following blocks:
• Rectifier to generate a DC supply voltage from the AC coil voltage
• Clock extractor
• Switchable load between Coil 1 and Coil 2 for data transmission from the tag to the reader
• Field-gap detector for data transmission from the base station to the tag
• ESD-protection circuitry
4.2
Data-rate Generator
The data rate is binary programmable to operate at any even-numbered data rate between RF/2
and RF/128 or to any of the fixed Basic mode data rates (RF/8, RF/16, RF/32, RF/40, RF/50,
RF/64, RF/100 and RF/128).
4.3
Write Decoder
The write decoder detects the write gaps and verifies the validity of the data stream according to
the Atmel e555x downlink protocol (pulse interval encoding).
4.4
HV Generator
This on-chip charge pump circuit generates the high voltage required to program the EEPROM.
4.5
DC Supply
Power is externally supplied to the IDIC via the two coil connections. The IC rectifies and regulates this RF source and uses it to generate its supply voltage.
4.6
Power-On Reset (POR)
The power-on reset circuit blocks the voltage supply to the IDIC until an acceptable voltage
threshold has been reached.
4.7
Clock Extraction
The clock extraction circuit uses the external RF signal as its internal clock source.
4.8
Controller
The control logic module executes the following functions:
• Load mode register with configuration data from EEPROM block 0 after power-on and during
reading
• Load option register with the settings for the analog front end stored in EEPROM page 1
block 3 after power-on and during reading
• Control all EEPROM memory read/write access and data protection
• Handles the downlink command decoding detecting protocol violations and error conditions
3
4967DS–RFID–10/08
4.9
Mode Register
The mode register maintains a readable shadow copy of the configuration data held in block 0 of
the EEPROM. It is continually refreshed during read mode and (re-)loaded after every POR
event or reset command. On delivery, the mode register is pre-programmed with default values
(see full version of the datasheet).
4.10
Modulator
The modulator encodes the serialized EEPROM data for transmission to a tag reader or base
station. Several types of modulation are available including Manchester, bi-phase, FSK, PSK,
and NRZ.
4.11
Memory
Page 0
Page 1
Figure 4-2.
Memory Map
0
1.........................................................................................32
L
Analog front end option set-up
Block 3
1
Traceability data
Block 2
1
Traceability data
Block 1
L
Page 0 configuration data
Block 0
L
User data or password
Block 7
L
User data
Block 6
L
User data
Block 5
L
User data
Block 4
L
User data
Block 3
L
User data
Block 2
L
User data
Block 1
L
Configuration data
Block 0
32 bits
Not transmitted
The memory is a 363-bit EEPROM, which is arranged in 11 blocks of 33 bits each. Each block
includes a single Lock bit, which is responsible for write-protecting the associated block. Programming takes place on a block basis, so a complete block (including lock bit) can be
programmed with a single command. The memory is subdivided into two page areas. Page 0
contains 8 blocks and page 1 contains 4 blocks. All 33 bits of a block, including the lock bit, are
programmed simultaneously.
4
ATA5577
4967DS–RFID–10/08
ATA5577
Block 0 of page 0 contains the mode/configuration data, which is not transmitted during regular
read operations. Addressing block 0 will always affect block 0 of page 0 regardless of the page
selector. Block 7 of page 0 may be used as a write-protection password.
Block 3 of page 1 contains the option register, which is not transmitted during regular-read
operation.
Bit 0 of every block is the lock bit for that block. Once locked, the block (including the lock bit
itself) is not re-programmable via the RF field.
Blocks 1 and 2 of page 1 contain traceability data and are transmitted with the modulation
parameters defined in the configuration register after the opcode “11” is issued by the reader.
The traceability data blocks are programmed and locked by Atmel.
5. Absolute Maximum Ratings
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Parameters
Symbol
Value
Unit
Maximum DC current into Coil1/Coil2
Icoil
20 (TBD)
mA
Maximum AC current into Coil1/Coil2, f = 125 kHz
Icoil p
20 (TBD)
mA
Power dissipation (die) (free-air condition, time of
application: 1s)
Ptot
100 (TBD)
mW
Electrostatic discharge maximum to
ANSI/ESD-STM5.1-2001 standard (HBM)
Vmax
2000 (TBD)
V
Operating ambient temperature range
Tamb
–40 to +85
°C
Storage temperature range (data retention
reduced)
Tstg
–40 to +150
°C
5
4967DS–RFID–10/08
6. Electrical Characteristics
Tamb = +25°C; fcoil = 125 kHz; unless otherwise specified
No.
1
Parameters
RF frequency range
2.3
Supply current (without Read - full temperature
current consumed by the range
external LC tank circuit) Programming - full
temperature range
Coil voltage (AC supply) Read mode and write
command(2)
3.3
Program EEPROM(2)
Start-up time
Vcoil pp = 6V
5.1
5.3
5.4
3-mA current into
Clamp voltage (depends Coil1/Coil2
on settings in option
register)
20-mA current into
Coil1/Coil2
6.1
6.2
6.3
Modulation parameters
(depends on settings in
option register)
6.4
6.5
Thermal stability
7.1
Clock detection level
(depends on settings in
option register)
7.2
7.3
7.4
Typ.
Max.
Unit
fRF
100
125
150
kHz
1.5
TBD
µA
T
2
TBD
µA
Q
25
TBD
µA
Q
3.6
TBD
V
Q
Vclamp
V
Q
IDD
POR threshold (50-mV
hysteresis)
3.2
5.2
Min.
Tamb = 25°C
3.1
4
Symbol
(1)
2.1
2.2
Test Conditions
TBD
Vcoil pp
6
8
tstartup
V
Q
TBD
ms
Q
TBD
11
TBD
V
Q
Vpp clamp med
TBD
13
TBD
V
Q
Vpp clamp hi
TBD
17
TBD
V
T
Vpp clamp med
TBD
15
TBD
V
T
3-mA current into
Coil1/Coil2 and
modulation ON
Vpp mod lo
TBD
3
TBD
V
T
Vpp mod med
TBD
5
TBD
V
Q
Vpp mod hi
TBD
7
TBD
V
Q
20 mA current into
Coil1/Coil2 and
modulation ON
Vpp mod med
TBD
7.5
TBD
V
T
mV/°C
Q
Vmod lo/Tamb
Vcoil pp = 8V
–1
Vclkdet lo
TBD
250
TBD
mV
Q
Vclkdet med
TBD
550
TBD
mV
T
Vclkdet hi
TBD
800
TBD
mV
Q
Vgapdet lo
TBD
250
TBD
mV
Q
Vgapdet med
TBD
550
TBD
mV
T
Vgapdet hi
TBD
850
TBD
mV
Q
5.7
6
ms
T
Cycles
Q
Vcoil pp = 8 V
8
Programming time
From last command gap
to re-enter read mode
(64 + 648 internal
clocks)
Tprog
5
9
Endurance
Erase all/Write all(3)
ncycle
100000
7.6
Vclamp
2.5
Vpp clamp lo
Gap detection level
(depends on settings in
option register)
7.5
Type*
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes:
1. IDD measurement set-up R = 100kΩ; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation
defeat. IDD = (VOUTmax – VCLK) / R
2. Current into Coil1/Coil2 is limited to 10 mA.
3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on
uncut wafer) delivery.
6
ATA5577
4967DS–RFID–10/08
ATA5577
6. Electrical Characteristics (Continued)
Tamb = +25°C; fcoil = 125 kHz; unless otherwise specified
No.
Parameters
Test Conditions
10.1
10.2
Top = 55°C
Data retention
(3)
Min.
Typ.
Max.
Unit
Type*
20
50
Years
Q
tretention
10
(3)
tretention
96
hrs
T
(3)
tretention
24
hrs
Q
Top = 150°C
10.3
Symbol
Top = 250°C
11.1
11.2
11.3
Resonance capacitor
11.4
Mask option
Vcoil pp = 1V
Cr
11.5
12.1
12.2
Micromodule capacitor
parameters
320
330
340
242
250
258
TBD
130
TBD
TBD
75
TBD
TBD
10
TBD
T
pF
Q
Capacitance tolerance
Tamb
Cr
320
330
340
pF
T
Temperature coefficient
TBD
TBD
TBD
TBD
TBD
TBD
*) Type means: T: directly or indirectly tested during production; Q: guaranteed based on initial product qualification data
Notes:
1. IDD measurement set-up R = 100kΩ; VCLK = Vcoil = 3V: EEPROM programmed to 00 ... 000 (erase all); chip in modulation
defeat. IDD = (VOUTmax – VCLK) / R
2. Current into Coil1/Coil2 is limited to 10 mA.
3. Since EEPROM performance is influenced by assembly processes, Atmel confirms the parameters for DOW (tested die on
uncut wafer) delivery.
7. Revision History
Please note that the following page numbers referred to in this section refer to the specific revision
mentioned, not to this document.
Revision No.
History
4967DS-RFID-10/08
• Features on page 1 changed
4967CS-RFID-01/08
• Features on page 1 changed
• Section 2 “Compatibility” on page 2 changed
• Section 4.9 “Mode Register” on page 4 changed
4967BS-RFID-09/07
•
•
•
•
Put datasheet in a new template
Section 4.2 “Data-rate Generator” on page 3 changed
Figure 4-2 “Memory Map” on page 5 changed
Section 6 “Electrical Characteristics” numbers 2.1, 2.2 and 2.3 on page 6
changed
7
4967DS–RFID–10/08
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4967DS–RFID–10/08
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