LIGITEK LFD495-62-XX-PF Four digit led display (0.4 lnch) Datasheet

LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
FOUR DIGIT LED DISPLAY (0.4 lnch)
Pb
Lead-Free Parts
LFD495/62-XX-PF
DATA SHEET
DOC. NO
: QW0905-LFD495/62-XX-PF
REV.
:
DATE
: 18 - Mar. - 2006
A
LIGITEK ELECTRONICS CO.,LTD.
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Page 1/8
PART NO. LFD495/62-XX-PF
Package Dimensions
39.2(1.543")
DIG.1
DIG.2
DIG.3
10.16
(0.4")
6.4(0.252")
DIG.4
10.28
(0.405")
12.9
(0.508")
ψ1.4(0.055")
A
LFD495/62-XX-PF
LIGITEK
F
B
G
E
C
D
Ø 0.45
TYP
PIN NO.1
7.4±0.5
2.54X5=12.7
(0.5")
Note : 1.All dimension are in millimeters and (lnch) tolerance is ±0.25mm unless otherwise noted.
2.Specifications are subject to change without notice.
DP
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PART NO. LFD495/62-XX-PF
Page 2/8
Internal Circuit Diagram
LFD4962-XX-PF
LFD4952-XX-PF
11
7
4
2
1
10
5
3
A
B
C
D
E
F
G
DP
A
B
C
D
E
F
G
DP
A
B
C
D
E
F
G
DP
A
B
C
D
E
F
G
DP
DIG. 1
12
DIG. 2
9
DIG. 3
8
DIG. 4
6
11
7
4
2
1
10
5
3
A
B
C
D
E
F
G
DP
A
B
C
D
E
F
G
DP
A
B
C
D
E
F
G
DP
A
B
C
D
E
F
G
DP
DIG. 1
12
DIG. 2
9
DIG. 3
8
DIG. 4
6
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page 3/8
PART NO. LFD495/62-XX-PF
Electrical Connection
PIN NO.
LFD4952-XX-PF
PIN NO.
LFD4962-XX-PF
1
Anode E
1
Cathode E
2
Anode D
2
Cathode D
3
Anode DP
3
Cathode DP
4
Anode C
4
Cathode C
5
Anode G
5
Cathode G
6
Common Cathode Dig.4
6
Common Anode Dig.4
7
Anode B
7
Cathode B
8
Common Cathode Dig.3
8
Common Anode Dig.3
9
Common Cathode Dig.2
9
Common Anode Dig.2
10
Anode F
10
Cathode F
11
Anode A
11
Cathode A
12
Common Cathode Dig.1
12
Common Anode Dig.1
LIGITEK ELECTRONICS CO.,LTD.
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Page 4/8
PART NO. LFD495/62-XX-PF
Absolute Maximum Ratings at Ta=25 ℃
Ratings
Symbol
Parameter
UNIT
G
Forward Current Per Chip
IF
30
mA
Peak Forward Current Per
Chip (Duty 1/10,0.1ms
Pulse Width)
IFP
120
mA
Power Dissipation Per Chip
PD
100
mW
Ir
10
μA
Operating Temperature
Topr
-25 ~ +85
℃
Storage Temperature
Tstg
-25 ~ +85
℃
Reverse Current Per Any Chip
Part Selection And Application Information(Ratings at 25℃)
common
cathode
or
anode
Material Emitted
CHIP
PART NO
△λ
(nm)
(nm)
Vf(v)
Iv(mcd)
IV-M
Min. Typ. Max. Min. Typ.
Common
Cathode
LFD4952-XX-PF
GaP
LFD4962-XX-PF
Electrical
λP
565
Green
30
1.7
Common
Anode
Note : 1.The forward voltage data did not including ± 0.1V testing tolerance.
2. The luminous intensity data did not including ±15% testing tolerance.
2.1
2.6
2.35
4.0
2:1
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Page 5/8
PART NO. LFD495/62-XX-PF
Test Condition For Each Parameter
Symbol
Unit
Test Condition
Forward Voltage Per Chip
Vf
volt
If=20mA
Luminous Intensity Per Chip
Iv
mcd
If=10mA
Peak Wavelength
λP
nm
If=20mA
△λ
nm
If=20mA
Ir
μA
Vr=5V
Parameter
Spectral Line Half-Width
Reverse Current Any Chip
Luminous Intensity Matching Ratio
IV-M
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Page 6/8
PART NO. LFD495/62-XX-PF
Typical Electro-Optical Characteristics Curve
G CHIP
Fig.1 Forward current vs. Forward Voltage
Fig.2 Relative Intensity vs. Forward Current
3.5
Relative Intensity
Normalize @20mA
Forward Current(mA)
1000
100
10
1.0
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0.1
1.0
2.0
3.0
4.0
5.0
1.0
10
1.2
1.1
1.0
0.9
0.8
0
20
40
60
80
100
Fig.5 Relative Intensity vs. Wavelength
1.0
0.5
0.0
500
550
600
Wavelength (nm)
3.0
2.5
2.0
1.5
1.0
0.5
0.0
-40
-20
0
20
40
60
Ambient Temperature( ℃)
Ambient Temperature( ℃)
Relative Intensity@20mA
Fig.4 Relative Intensity vs. Temperature
Relative Intensity@20mA
Normalize @25℃
Forward Voltage@20mA
Normalize @25℃
Fig.3 Forward Voltage vs. Temperature
-20
1000
Forward Current(mA)
Forward Voltage(V)
-40
100
650
80
100
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LFD495/62-XX-PF
Page 7/8
Soldering Condition(Pb-Free)
1.Iron:
Soldering Iron:30W Max
Temperature 350°C Max
Soldering Time:3 Seconds Max(One Time)
Distance:Solder Temperature 1/16 Inch Below Seating
Plane For 3 Seconds At 260°C
2.Wave Soldering Profile
Dip Soldering
Preheat: 120°C Max
Preheat time: 60seconds Max
Ramp-up
2° C/sec(max)
Ramp-Down:-5°C/sec(max)
Solder Bath:260°C Max
Dipping Time:3 seconds Max
Distance:Solder Temperature 1/16 Inch Below Seating
Plane For 10 Seconds At 260° C
Temp(°C)
260° C3sec Max
260°
5° /sec
max
120°
25°
0° 0
2° /sec
max
Preheat
60 Seconds Max
50
100
150
Time(sec)
LIGITEK ELECTRONICS CO.,LTD.
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Page 8/8
PART NO. LFD495/62-XX-PF
Reliability Test:
Test Item
Test Condition
Description
Reference
Standard
Operating Life Test
1.Under Room Temperature
2.If=10mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
High Temperature
Storage Test
1.Ta=105 ℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-883:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40 ℃±5 ℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
High Temperature
High Humidity Test
1.Ta=65 ℃±5 ℃
2.RH=90 %~95%
3.t=240hrs ±2hrs
The purpose of this test is the resistance
of the device under tropical for hours.
1.Ta=105 ℃±5℃&-40 ℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
Solder Resistance
Test
1.T.Sol=260 ℃±5 ℃
2.Dwell time= 10 ±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
Solderability Test
1.T.Sol=230 ℃±5 ℃
2.Dwell time=5 ±1sec
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
Thermal Shock Test
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11
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