PRELIMINARY IDT70V9179L HIGH-SPEED 3.3V 32K x 9 SYNCHRONOUS PIPELINED DUAL-PORT STATIC RAM Features: ◆ ◆ ◆ ◆ ◆ ◆ True Dual-Ported memory cells which allow simultaneous access of the same memory location High-speed clock to data access – Commercial: 7.5/9/12ns (max.) Industrial: 9ns (max) Low-power operation – IDT70V9179L Active: 500mW (typ.) Standby: 1.5mW (typ.) Flow-Through or Pipelined output mode on either port via the FT/PIPE pins Counter enable and reset features Dual chip enables allow for depth expansion without ◆ ◆ ◆ ◆ additional logic Full synchronous operation on both ports – 4ns setup to clock and 0ns hold on all control, data, and address inputs – Data input, address, and control registers – Fast 7.5ns clock to data out in the Pipelined output mode – Self-timed write allows fast cycle time – 12ns cycle time, 83MHz operation in Pipelined output mode LVTTL- compatible, single 3.3V (±0.3V) power supply Industrial temperature range (–40°C to +85°C) is available for selected speeds Available in a 100-pin Thin Quad Flatpack (TQFP) Functional Block Diagram R/WR OER R/WL OEL CE0L CE1L FT/PIPEL 0/1 1 0 0 I/O0L - I/O8L 1 0/1 FT/PIPER I/O0R - I/O8R I/O Control I/O Control A14L A0L CLKL ADSL CNTENL CNTRSTL CE0R CE1R 1 0 0/1 1 0 0/1 A14R Counter/ Address Reg. MEMORY ARRAY Counter/ Address Reg. A0R CLKR ADSR CNTENR CNTRSTR 5645 drw 01 JANUARY 2002 1 ©2002 Integrated Device Technology, Inc. DSC-5645/1 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Description: The IDT70V9179 is a high-speed 32K x 9 bit synchronous DualPort RAM. The memory array utilizes Dual-Port memory cells to allow simultaneous access of any address from both ports. Registers on control, data, and address inputs provide minimal setup and hold times. The timing latitude provided by this approach allows systems to be designed with very short cycle times. With an input data register, the IDT70V9179 has been optimized for applications having unidirectional or bidirectional data flow in bursts. An automatic power down feature, controlled by CE0 and CE1, permits the on-chip circuitry of each port to enter a very low standby power mode. Fabricated using IDT’s CMOS high-performance technology, these devices typically operate on only 500mW of power. Index NC NC A7L A8L A9L A10L A11L A12L A13L A14L NC NC VDD NC NC NC NC CE0L CE1L CNTRSTL R/WL OEL FT/PIPEL NC NC ADSR CLKR CNTENR A0R A1R A2R A3R A4R A5R A6R NC NC NC A6L A5L A4L A3L A2L A1L A0L CNTENL CLKL ADSL Vss Vss Pin Configuration(1,2,3) 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 75 74 3 73 4 72 1 2 5 71 6 7 70 69 8 68 9 67 10 66 65 11 12 13 70V9179PF PN100-1(4) 14 15 100-Pin TQFP Top View(5) 64 63 62 61 17 60 59 18 58 19 57 20 56 21 22 55 23 53 52 16 54 24 51 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 NC NC A7R A8R A9R A10R A11R A12R A13R A14R NC NC Vss NC NC NC NC CE0R CE1R CNTRSTR R/WR OER FT/PIPER Vss NC Vss I/O8L I/O7L I/O6L I/O5L I/O4L I/O3L I/O2L Vss I/O1L I/O0L VDD Vss I/O0R I/O1R I/O2R VDD I/O3R I/O4R I/O5R I/O6R I/O7R I/O8R NC NC 5645 drw 02 NOTES: 1. All VDD pins must be connected to power supply. 2. All VSS pins must be connected to ground. 3. Package body is approximately 14mm x 14mm x 1.4mm. 4. This package code is used to reference the package diagram. 5. This text does not indicate orientation of the actual part-marking. 6.42 2 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Pin Names Left Port Right Port Names CE0L, CE1L CE0R, CE1R Chip Enables R/WL R/WR Read/Write Enable OEL OER Output Enable A0L - A14L A0R - A14R Address I/O0L - I/O8L I/O0R - I/O8R Data Input/Output CLKL CLKR Clock ADSL ADSR Address Strobe Enable CNTENL CNTENR Counter Enable CNTRSTL CNTRSTR Counter Reset FT/PIPEL FT/PIPER Flow-Through / Pipeline VDD Power (3.3V) VSS Ground (0V) 5645 tbl 01 Truth Table IRead/Write and Enable Control(1,2,3) OE CLK CE0 CE1 R/W I/O0-8 X ↑ H X X High-Z Deselected–Power Down X ↑ X L X High-Z Deselected–Power Down X ↑ L H L DATAIN Write L ↑ L H H DATA OUT Read H X L H X High-Z MODE Outputs Disabled 5645 tbl 02 NOTES: 1. "H" = VIH, "L" = V IL, "X" = Don't Care. 2. ADS, CNTEN, CNTRST = X. 3. OE is an asynchronous input signal. Truth Table IIAddress Counter Control(1,2,6) Address An Previous Address X Addr Used CLK(6) An ↑ ADS (4) L CNTEN CNTRST I/O(3) X H DI/O (n) MODE External Address Used X An An + 1 ↑ H L H DI/O(n+1) Counter Enabled—Internal Address generation X An + 1 An + 1 ↑ H H H DI/O(n+1) External Addre ss Blocked—Counter disabled (An + 1 reused) Ao ↑ X (4) DI/O(0) X X X (5) L Counter Reset to Address 0 NOTES: 1. "H" = VIH, "L" = VIL, "X" = Don't Care. 2. CE0 and OE = VIL; CE1 and R/W = VIH. 3. Outputs configured in Flow-Through Output mode; if outputs are in Pipelined mode the data out will be delayed by one cycle. 4. ADS and CNTRST are independent of all other signals including CE0 and CE1. 5. The address counter advances if CNTEN = VIL on the rising edge of CLK, regardless of all other signals including CE0 and CE 1. 6. While an external address is being loaded (ADS = VIL), R/W = VIH is recommended to ensure data is not written arbitrarily. 6.42 3 5645 tbl 03 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Recommended DC Operating Conditions Recommended Operating Temperature and Supply Voltage Grade GND VDD 0OC to +70OC 0V 3.3V + 0.3V -40OC to +85OC 0V 3.3V + 0.3V Commercial Industrial Symbol Ambient Temperature(1) NOTES: 1. This is the parameter TA. This is the "instant on" case temperature. Parameter Min. Typ. Max. Unit 3.0 3.3 3.6 V 0 0 0 Input High Voltage 2.0V ____ Input Low Voltage (1) VDD Supply Voltage VSS Ground VIH 5645 tbl 04 VIL VDD+0.3V ____ -0.3 V (2) V 0.8 V 5645 tbl 05 NOTES: 1. VIL > -1.5V for pulse width less than 10 ns. 2. VTERM must not exceed VDD +0.3V. Absolute Maximum Ratings(1) Symbol Capacitance(1) Rating Commercial & Industrial Unit VTERM(2) Terminal Voltage with Respect to GND -0.5 to +4.6 V TBIAS Temperature Under Bias -55 to +125 o -65 to +150 o TSTG Storage Temperature IOUT DC Output Current (TA = +25°C, f = 1.0MHZ) Symbol CIN COUT(3) C Parameter Input Capacitance Output Capacitance Conditions(2) Max. Unit VIN = 3dV 9 pF VOUT = 3dV 10 pF 5645 tbl 07 50 C mA 5645 tbl 06 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. VTERM must not exceed VDD +0.3V for more than 25% of the cycle time or 10ns maximum, and is limited to < 20mA for the period of VTERM > VDD + 0.3V. NOTES: 1. These parameters are determined by device characterization, but are not production tested. 2. 3dV references the interpolated capacitance when the input and output switch from 0V to 3V or from 3V to 0V. 3. COUT also references C I/O. DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range (VDD = 3.3V ± 0.3V) 70V9179L Symbol Parameter Test Conditions (1) Min. Max. Unit 5 µA |ILI| Input Leakage Current VDD = 3.6V, VIN = 0V to VDD ___ |ILO| Output Leakage Current CE = VIH or CE1 = VIL, VOUT = 0V to VDD ___ 5 µA IOL = +4mA ___ 0.4 V 2.4 ___ V VOL VOH Output Low Voltage Output High Voltage IOH = -4mA 5645 tbl 08 NOTE: 1. At VDD < 2.0V input leakages are undefined. 6.42 4 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM DC Electrical Characteristics Over the Operating Temperature Supply Voltage Range(3) (VDD = 3.3V ± 0.3V) 70V9179L7 Com'l Only Symbol IDD ISB1 ISB2 ISB3 ISB4 Parameter Test Condition 70V9179L9 Com'l & Ind 70V9179L12 Com'l Only Typ. (4) Max. Typ. (4) Max. Typ. (4) Max. Unit L 200 310 180 260 150 230 mA ____ 180 280 ____ ____ Version Dynamic Operating Current (Both Ports Active) CEL and CER= VIL , Outputs Disabled, f = fMAX(1) COM'L IND L ____ Standby Current (Both Ports - TTL Level Inputs) CEL = CER = VIH COM'L L 65 130 50 100 40 80 f = fMAX(1) IND L ____ ____ 50 120 ____ ____ Standby Current (One Port - TTL Level Inputs) CE"A" = VIL and CE"B" = VIH(5) Active Port Outputs Disabled, f=fMAX(1) COM'L L 140 245 110 190 100 175 IND L ____ ____ 110 205 ____ ____ Full Standby Current (Both Ports - CMOS Level Inputs) Both Ports CEL and CER > VDD - 0.2V, V IN > VDD - 0.2V or V IN < 0.2V, f = 0(2) COM'L L 0.4 3 0.4 3.0 0.4 3 IND L ____ ____ 0.4 6.0 ____ ____ Full Standby Current (One Port - CMOS Level Inputs) COM'L CE"A" < 0.2V and CE"B" > VDD - 0.2V(5) IND V IN > VDD - 0.2V or V IN < 0.2V, Active Port, Outputs Disabled, f = fMAX(1) L 130 235 100 180 90 165 L ____ ____ 195 ____ ____ 100 mA mA mA mA 5645 tbl 09 NOTES: 1. At f = f MAX, address and control lines (except Output Enable) are cycling at the maximum frequency clock cycle of 1/tCYC, using "AC TEST CONDITIONS" at input levels of GND to 3V. 2. f = 0 means no address, clock, or control lines change. Applies only to input at CMOS level standby. 3. Port "A" may be either left or right port. Port "B" is the opposite from port "A". 4. VDD = 3.3V, T A = 25°C for Typ, and are not production tested. I DD DC(f=0) = 90mA (Typ). 5. CE X = VIL means CE0X = VIL and CE1X = VIH CE X = VIH means CE0X = VIH or CE1X = V IL CE X < 0.2V means CE 0X < 0.2V and CE1X > VDD - 0.2V CE X > VDD - 0.2V means CE0X > VDD - 0.2V or CE1X < 0.2V "X" represents "L" for left port or "R" for right port. 6.42 5 IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Preliminary Industrial and Commercial Temperature Ranges AC Test Conditions Input Pulse Levels GND to 3.0V Input Rise/Fall Times 3ns Max. Input Timing Reference Levels 1.5V Output Reference Levels 1.5V Output Load Figures 1, 2, and 3 5645 tbl 10 3.3V 3.3V 590Ω 590Ω DATAOUT DATAOUT 30pF 435Ω 5pF* 435Ω 5645 drw 03 5645 drw 04 Figure 2. Output Test Load (For tCKLZ, tCKHZ, tOLZ, and tOHZ ). *Including scope and jig. Figure 1. AC Output Test load. 8 7 - 10pF is the I/O capacitance of this device, and 30pF is the AC Test Load Capacitance 6 tCD1, tCD2 (Typical, ns) 5 4 3 2 1 0 -1 20 40 60 80 100 120 140 160 180 200 Capacitance (pF) 5645 drw 05 Figure 3. Typical Output Derating (Lumped Capacitive Load). 6.42 6 . Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM AC Electrical Characteristics Over the Operating Temperature Range (Read and Write Cycle Timing)(3) (VDD = 3.3V ± 0.3V, TA = 0°C to +70°C) 70V9179L7 Com'l Only Symbol tCYC1 Parameter Clock Cycle Time (Flow-Through) (2) (2) Min. Max. 22 ____ 70V9179L9 Com'l & Ind Min. Max. 25 ____ 70V9179L12 Com'l Only Min. Max. Unit 30 ____ ns ns tCYC2 Clock Cycle Time (Pipelined) 12 ____ 15 ____ 20 ____ tCH1 Clock High Time (Flow-Through)(2) 7.5 ____ 12 ____ 12 ____ ns tCL1 (2) 7.5 ____ 12 ____ 12 ____ ns 5 ____ 6 ____ 8 ____ ns 5 ____ 6 ____ 8 ____ ns tCH2 tCL2 tR tF tSA Clock Low Time (Flow-Through) (2) Clock High Time (Pipelined) (2) Clock Low Time (Pipelined) Clock Rise Time ____ 3 ____ 3 ____ 3 ns Clock Fall Time ____ 3 ____ 3 ____ 3 ns 4 ____ 4 ____ 4 ____ ns ns Address Setup Time tHA Address Hold Time 0 ____ 1 ____ 1 ____ tSC Chip Enable Setup Time 4 ____ 4 ____ 4 ____ ns tHC Chip Enable Hold Time 0 ____ 1 ____ 1 ____ ns 4 ____ 4 ____ 4 ____ ns 0 ____ 1 ____ 1 ____ ns 4 ____ 4 ____ 4 ____ ns 0 ____ 1 ____ 1 ____ ns 4 ____ 4 ____ 4 ____ ns 0 ____ 1 ____ 1 ____ ns 4 ____ 4 ____ 4 ____ ns 0 ____ 1 ____ 1 ____ ns 4 ____ 4 ____ 4 ____ ns 0 ____ 1 ____ 1 ____ ns ____ 9 ____ 12 ____ 12 ns 2 ____ 2 ____ 2 ____ ns 1 7 1 7 1 7 ns tSW tHW tSD R/W Setup Time R/W Hold Time Input Data Setup Time tHD Input Data Hold Time tSAD ADS Setup Time tHAD ADS Hold Time tSCN CNTEN Setup Time tHCN CNTEN Hold Time tSRST CNTRST Setup Time tHRST CNTRST Hold Time tOE Output Enable to Data Valid tOLZ Output Enable to Output Low-Z(1) tOHZ tCD1 tCD2 tDC tCKHZ tCKLZ (1) Output Enable to Output High-Z (2) ____ Clock to Data Valid (Flow-Through) (2) Clock to Data Valid (Pipelined) Data Output Hold After Clock High (1) Clock High to Output High-Z (1) Clock High to Output Low-Z 18 ____ 20 ____ 25 ns ____ 7.5 ____ 9 ____ 12 ns 2 ____ 2 ____ 2 ____ ns 2 9 2 9 2 9 ns 2 ____ 2 ____ 2 ____ ns Port-to-Port Delay tCWDD Write Port Clock High to Read Data Delay ____ 28 ____ 35 ____ 40 ns tCCS Clock-to-Clock Setup Time ____ 10 ____ 15 ____ 15 ns 5645 tbl 11 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). This parameter is guaranteed by device characteriza tion, but is not production tested. 2. The Pipelined output parameters (tCYC2, tCD2 ) apply to either or both the Left and Right ports when FT/PIPE = VIH. Flow-through parameters (tCYC1, tCD1) apply when FT/PIPE = VIL for that port. 3. All input signals are synchronous with respect to the clock except for the asynchronous Output Enable (OE), FT/PIPER, and FT/PIPEL. 6.42 7 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Timing Waveform of Read Cycle for Flow-Through Output (FT/PIPE"X" = VIL)(3,6) tCYC1 tCH1 tCL1 CLK CE0 tSC tSC tHC tHC CE1 R/W tSW tHW tSA (5) ADDRESS tHA An An + 1 tCD1 tCKLZ An + 3 tCKHZ (1) Qn DATAOUT OE An + 2 tDC Qn + 1 Qn + 2 (1) (1) tOHZ tDC tOLZ (1) (2) tOE 5645 drw 06 Timing Waveform of Read Cycle for Pipelined Operation (FT/PIPE"X" = VIH)(3,6) tCYC2 tCH2 tCL2 CLK CE0 tSC tSC tHC tHC (4) CE1 R/W ADDRESS(5) tSW tHW tSA tHA An An + 1 (1 Latency) An + 2 tDC tCD2 DATAOUT Qn (1) tCKLZ OE An + 3 Qn + 2(6) Qn + 1 tOHZ(1) tOLZ(1) (2) tOE 5645 drw 07 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 2. OE is asynchronously controlled; all other inputs are synchronous to the rising clock edge. 3. ADS = VIL, CNTEN and CNTRST = VIH. 4. The output is disabled (High-Impedance state) by CE 0 = V IH or CE 1 = V IL following the next rising edge of the clock. Refer to Truth Table 1. 5. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 6. "X' here denotes Left or Right port. The diagram is with respect to that port. 6.42 8 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Timing Waveform of a Bank Select Pipelined Read(1,2) tCH2 tCYC2 tCL2 CLK tSA tHA A0 ADDRESS(B1) tSC tHC CE0(B1) tSC tHC Q0 DATAOUT(B1) tDC tCD2 Q3 Q1 tDC tCKLZ (3) tCKHZ (3) tHA A0 ADDRESS(B2) tCKHZ(3) tCD2 tCD2 tSA A6 A5 A4 A3 A2 A1 A6 A5 A4 A3 A2 A1 tSC tHC CE0(B2) tSC tHC tCD2 DATAOUT(B2) tCKHZ (3) tCD2 Q2 tCKLZ(3) tCKLZ (3) Q4 5645 drw 08 Timing Waveform with Port-to-Port Flow-Through Read(4,5,7) CLK "A" tSW tHW R/W "A" tSA ADDRESS "A" tHA tSD DATAIN "A" NO MATCH MATCH tHD VALID tCCS (6) CLK "B" tCD1 R/W "B" ADDRESS "B" tSW tHW tSA tHA NO MATCH MATCH tCWDD (6) tCD1 DATAOUT "B" VALID VALID tDC tDC 5645 drw 09 NOTES: 1. B1 Represents Bank #1; B2 Represents Bank #2. Each Bank consists of one IDT70V9179 for this waveform, and are setup for depth expansion in this example. ADDRESS(B1) = ADDRESS (B2) in this situation. 2. OE, and ADS = VIL; CE1(B1) , CE1(B2) , R/W, CNTEN, and CNTRST = V IH. 3. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 4. CE 0 and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. 5. OE = V IL for the Right Port, which is being read from. OE = VIH for the Left Port, which is being written to. 6. If t CCS < maximum specified, then data from right port READ is not valid until the maximum specified for tCWDD. If t CCS > maximum specified, then data from right port READ is not valid until tCCS + t CD1. tCWDD does not apply in this case. 7. All timing is the same for both Left and Right ports. Port "A" may be either Left or Right port. Port "B" is the opposite from Port "A". 6.42 9 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Timing Waveform of Pipelined Read-to-Write-to-Read (OE = VIL)(3) tCYC2 tCH2 tCL2 CLK CE0 tSC tHC CE1 tSW tHW R/W (4) ADDRESS tSW tHW An tSA tHA An +1 An + 2 An + 4 An + 3 An + 2 tSD tHD DATAIN Dn + 2 tCD2 (2) tCKHZ (1) tCKLZ (1) tCD2 Qn + 3 Qn DATAOUT READ NOP (5) WRITE READ 5645 drw 10 Timing Waveform of Pipelined Read-to-Write-to-Read (OE Controlled)(3) tCH2 tCYC2 tCL2 CLK CE0 tSC tHC CE1 tSW tHW R/W (4) ADDRESS tSW tHW An tSA tHA An +1 An + 2 An + 3 An + 4 An + 5 tSD tHD DATAIN Dn + 3 Dn + 2 tCD2 (2) tCKLZ(1) tCD2 Qn DATAOUT Qn + 4 tOHZ(1) OE READ WRITE READ 5645 drw 11 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 2. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 3. CE0 and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. "NOP" is "No Operation". 4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity. 6.42 10 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Timing Waveform of Flow-Through Read-to-Write-to-Read (OE = VIL)(3) tCH1 tCYC1 tCL1 CLK CE0 tSC tHC CE1 tSW tHW R/W tSW tHW (4) ADDRESS tSA An tHA An +1 An + 2 An + 4 An + 3 An + 2 tSD tHD DATAIN Dn + 2 tCD1 (2) tCD1 Qn DATAOUT tCD1 tCD1 Qn + 1 tDC tCKHZ (1) NOP (5) READ tCKLZ Qn + 3 tDC (1) READ WRITE 5645 drw 12 Timing Waveform of Flow-Through Read-to-Write-to-Read (OE Controlled)(3) tCYC1 tCH1 tCL1 CLK CE0 tSC tHC CE1 tSW tHW tSW tHW R/W (4) An tSA tHA ADDRESS An +1 DATAIN (2) DATAOUT An + 2 tSD tHD An + 3 Dn + 2 Dn + 3 tDC tCD1 Qn An + 4 tOE tCD1 (1) tCKLZ tOHZ (1) An + 5 tCD1 Qn + 4 tDC OE READ WRITE READ 5645 drw 13 NOTES: 1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2). 2. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 3. CE 0 and ADS = VIL; CE1, CNTEN, and CNTRST = VIH. "NOP" is "No Operation". 4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 5. "NOP" is "No Operation." Data in memory at the selected address may be corrupted and should be re-written to guarantee data integrity. 6.42 11 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Timing Waveform of Pipelined Read with Address Counter Advance (1) tCH2 tCYC2 tCL2 CLK tSA ADDRESS tHA An tSAD tHAD ADS tSAD tHAD CNTEN tSCN tHCN tCD2 DATAOUT Qx - 1(2) Qn + 2(2) Qn + 1 Qn Qx Qn + 3 tDC READ EXTERNAL ADDRESS READ WITH COUNTER COUNTER HOLD READ WITH COUNTER 5645 drw 14 Timing Waveform of Flow-Through Read with Address Counter Advance(1) tCH1 tCYC1 tCL1 CLK tSA ADDRESS tHA An tSAD tHAD tSAD tHAD ADS tSCN tHCN CNTEN tCD1 DATAOUT Qx(2) Qn Qn + 1 Qn + 2 Qn + 3(2) Qn + 4 tDC READ EXTERNAL ADDRESS READ WITH COUNTER COUNTER HOLD READ WITH COUNTER 5645 drw 15 NOTES: 1. CE0 and OE = VIL; CE1, R/W, and CNTRST = VIH. 2. If there is no address change via ADS = VIL (loading a new address) or CNTEN = VIL (advancing the address), i.e. ADS = VIH and CNTEN = VIH, then the data output remains constant for subsequent clocks. 6.42 12 Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Timing Waveform of Write with Address Counter Advance (Flow-Through or Pipelined Outputs)(1) tCH2 tCYC2 tCL2 CLK tSA tHA An ADDRESS INTERNAL(3) ADDRESS An(7) An + 2 An + 1 An + 4 An + 3 tSAD tHAD ADS CNTEN(7) tSD tHD Dn + 1 Dn DATAIN WRITE EXTERNAL ADDRESS Dn + 1 Dn + 4 Dn + 3 Dn + 2 WRITE WRITE WITH COUNTER COUNTER HOLD WRITE WITH COUNTER 5645 drw 16 Timing Waveform of Counter Reset (Pipelined Outputs)(2) tCH2 tCYC2 tCL2 CLK tSA tHA An ADDRESS(4) INTERNAL(3) ADDRESS Ax (6) 0 1 An + 2 An + 1 An An + 1 tSW tHW R/W ADS tSAD tHAD CNTEN tSCN tHCN tSRST tHRST CNTRST tSD tHD D0 DATAIN DATAOUT(5) Q1 Q0 COUNTER RESET (6) WRITE ADDRESS 0 READ ADDRESS 0 READ ADDRESS 1 READ ADDRESS n Qn READ ADDRESS n+1 NOTES: 5645 drw 17 1. CE 0 and R/W = VIL; CE1 and CNTRST = VIH. 2. CE 0 = VIL; CE1 = VIH. 3. The "Internal Address" is equal to the "External Address" when ADS = VIL and equals the counter output when ADS = VIH. 4. Addresses do not have to be accessed sequentially since ADS = VIL constantly loads the address on the rising edge of the CLK; numbers are for reference use only. 5. Output state (High, Low, or High-impedance) is determined by the previous cycle control signals. 6. No dead cycle exists during counter reset. A READ or WRITE cycle may be coincidental with the counter reset cycle. ADDR 0 will be accessed. Extra cycles are shown here simply for clarification. 7. CNTEN = VIL advances Internal Address from ‘An’ to ‘An +1’. The transition shown indicates the time required for the counter to advance. The ‘An +1’ Address is written to during this cycle. 6.42 13 IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Preliminary Industrial and Commercial Temperature Ranges Functional Description Depth and Width Expansion The IDT70V9179 provides a true synchronous Dual-Port Static RAM interface. Registered inputs provide minimal set-up and hold times on address, data, and all critical control inputs. All internal registers are clocked on the rising edge of the clock signal, however, the self-timed internal write pulse is independent of the LOW to HIGH transition of the clock signal. An asynchronous output enable is provided to ease asynchronous bus interfacing. Counter enable inputs are also provided to staff the operation of the address counters for fast interleaved memory applications. CE0 = VIH or CE1 = VIL for one clock cycle will power down the internal circuitry to reduce static power consumption. Multiple chip enables allow easier banking of multiple IDT70V9179's for depth expansion configurations. When the Pipelined output mode is enabled, two cycles are required with CE0 = VIL and CE1 = VIH to re-activate the outputs. The IDT70V9179 features dual chip enables (refer to Truth Table I) in order to facilitate rapid and simple depth expansion with no requirements for external logic. Figure 4 illustrates how to control the varioius chip enables in order to expand two devices in depth. The IDT70V9179 can also be used in applications requiring expanded width, as indicated in Figure 4. Since the banks are allocated at the discretion of the user, the external controller can be set up to drive the input signals for the various devices as required to allow for 18-bit or wider applications. A15 IDT70V9179 CE0 CE1 CE1 CE1 IDT70V9179 V DD CE1 CE0 CE0 Control Inputs CE0 Control Inputs Control Inputs IDT70V9179 IDT70V9179 VDD Control Inputs 5645 drw 18 Figure 4. Depth and Width Expansion with IDT70V9179 6.42 14 CNTRST CLK ADS CNTEN R/W OE Preliminary Industrial and Commercial Temperature Ranges IDT70V9179L High-Speed 3.3V 32K x 9 Dual-Port Synchronous Pipelined Static RAM Ordering Information IDT XXXXX A 99 A A Device Type Power Speed Package Process/ Temperature Range Blank I(1) Commercial (0°C to +70°C) Industrial (-40°C to +85°C) PF 100-pin TQFP (PN100-1) 7 9 12 Commercial Only Commercial & Industrial Commercial Only L Speed in nanoseconds Low Power 70V9179 288K (32K x 9-Bit) 3.3V Synchronous Dual-Port RAM 5645 drw 19 NOTE: 1. Contact your local sales office for Industrial temp range for other speeds, packages and powers. Preliminary Datasheet: Definition "PRELIMINARY" datasheets contain descriptions for products that are in early release. Datasheet Document History 01/02/02: Initial Data Sheet CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054 for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com The IDT logo is a registered trademark of Integrated Device Technology, Inc. 6.42 15 for Tech Support: 831-754-4613 [email protected]