IDT IDT54823BDSO High performance cmos bus interface register Datasheet

IDT54/74FCT823A/B/C
HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
HIGH PERFORMANCE
CMOS BUS INTERFACE
REGISTER
FEATURES:
IDT54/74FCT823A/B/C
DESCRIPTION:
• Equivalent to AMD's Am29823 bipolar registers in pinout/
function, speed, and output drive over full temperature and
voltage supply extremes
• IDT54/74FCT823A equivalent to FAST™ speed
• IDT54FCT823B 25% faster than FAST
• IDT74FCT823C 40% faster than FAST
• Buffered common Clock Enable (EN) and Asynchronous Clear
Input (CLR)
• IOL = 48mA (commercial) and 32mA (military)
• Clamp diodes on all inputs for ringing suppression
• CMOS power levels (1mW typ. static)
• TTL input and output compatibility
• CMOS output level compatible
• Substantially lower input current levels than AMD's bilopar
µA max.)
Am29800 series (5µ
• MIlitary product compliant to MIL-STD-883, Class B
• Available in the following packages:
– Commercial: SOIC
– Military: CERDIP, LCC
The FCT823 series is built using an advanced dual metal CMOS
technology. The FCT823 bus interface registers are designed to eliminate
the extra packages required to buffer existing registers and provide extra
data width for wider address/data paths or buses carrying parity. The
FCT823 is a 9-bit wide buffered register with Clock Enable (EN) and Clear
(CLR) – ideal for parity bus interfacing in high-performance microprogrammed systems.
The FCT823 high-performance interface family is designed for highcapacitance load drive capability, while providing low-capacitance bus
loading at both inputs and outputs. All inputs have clamp diodes and all
outputs are designed for low-capacitance bus loading in high-impedance
state.
FUNCTIONAL BLOCK DIAGRAM
D0
EN
CLR
DN
14
11
D
CL
CP
CP
OE
Q
D
CL
CP
Q
Q
Q
13
1
Y0
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
YN
JUNE 2002
1
© 2002 Integrated Device Technology, Inc.
DSC-5426/3
IDT54/74FCT823A/B/C
HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
D1
3
22
Y1
D2
4
21
Y2
D2
5
D3
5
20
Y3
D3
6
24
Y3
D4
7
23
Y4
NC
8
22
NC
8
17
Y6
D5
9
21
Y5
D7
9
16
Y7
D6
10
20
Y6
D8
10
15
Y8
D7
11
12
19
Y7
CLR
11
14
EN
GND
12
13
CP
13
CERDIP/ SOIC
TOP VIEW
VTERM(2)
Rating
Terminal Voltage
Terminal Voltage
Commercial
Military
–0.5 to +7
–0.5 to +7
V
–0.5 to VCC
–0.5 to VCC
V
18
0 to +70
–55 to +125
°C
D
D
Operating Temperature
TBIAS
Temperature under BIAS
–55 to +125
–65 to +135
°C
TSTG
Storage Temperature
–55 to +125
–65 to +150
°C
PT
Power Dissipation
0.5
0.5
W
IOUT
DC Output Current
120
120
mA
Conditions
Typ.
Max.
Unit
VIN = 0V
6
10
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
CLR
PIN DESCRIPTION
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Input Capacitance
EN
Y
CP
EN
CLR
OE
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Input and Vcc terminals only.
3. Output and I/O terminals only.
CIN
9
Q
CP
TA
Parameter(1)
17
9
Unit
with Respect to GND
Symbol
16
LOGIC SYMBOL
with Respect to GND
VTERM(3)
15
LCC
TOP VIEW
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
14
Y8
D6
EN
Y5
CP
18
26
Y2
NC
7
27
1
GND
D5
28
25
Y4
19
2
CLR
6
3
D8
D4
4
Y1
Y0
Y0
2
INDEX
VCC
D0
23
NC
VCC
OE
24
D0
1
OE
D1
PIN CONFIGURATION
NOTE:
1. This parameter is measured at characterization but not tested.
2
Pin Name
I/O
Description
Dx
I
D flip-flop data inputs
CLR
I
For both inverting and non-inverting registers, when
the clear input is LOW and OE is LOW, the Qx
outputs are LOW. When the clear input is HIGH, data
can be entered into the register.
CP
I
Clock Pulse for the Register; enters data into the
register on the LOW-to-HIGH transition.
Yx
O
Register 3-state outputs
EN
I
Clock Enable. When the clock enable is LOW, data
on the DI input is transferred to the QI output on the
LOW-to-HIGH clock transition. When the clock enable
is HIGH, the QI outputs do not change state,
regardless of the data or clock input transitions.
OE
I
Output Control. When the OE input is HIGH, the Yx
outputs are in the high impedance state. When the OE
input is LOW, the TRUE register data is present at the
Yx outputs.
IDT54/74FCT823A/B/C
HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
FUNCTION TABLE(1)
Inputs
OE
H
H
H
L
H
L
H
H
L
L
CLR
H
H
L
L
H
H
H
H
H
H
EN
L
L
X
X
H
H
L
L
L
L
Dx
L
H
X
X
X
X
L
H
L
H
CP
↑
↑
X
X
X
X
↑
↑
↑
↑
Internal/
Outputs
Qx
Yx
L
Z
H
Z
L
Z
L
L
NC
Z
NC NC
L
Z
H
Z
L
L
H
H
Function
High Z
Clear
Hold
Load
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High Impedance
↑ = LOW-to-HIGH Transition
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC - 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ±5%, Military: TA = -55°C to +125°C, VCC = 5.0V ±10%
Symbol
Test Conditions(1)
Parameter
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
IIH
Input HIGH Current
VI = VCC
—
—
5
VI = 2.7V
—
—
5(4)
VI = 0.5V
—
—
–5(4)
VI = GND
—
—
–5
VO = VCC
VO = 2.7V
VO = 0.5V
VO = GND
—
—
—
—
—
—
—
—
—
–0.7
10
10(4)
–10(4)
–10
–1.2
–75
VHC
VHC
2.4
2.4
—
—
—
—
–120
VCC
VCC
4.3
4.3
GND
GND
0.3
0.3
—
—
—
—
—
VLC
VLC(4)
0.5
0.5
VCC = Max.
IIL
Input LOW Current
IOZH
VCC = Max.
IOZL
Off State (High Impedance)
Output Current
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
IOS
VOH
VOL
Short Circuit Current
Output HIGH Voltage
Output LOW Voltage
GND(3)
VCC = Max., VO =
VCC = 3V, VIN = VLC or VHC, IOH = –32µA
VCC = Min
IOH = –300µA
VIN = VIH or VIL
IOH = –15mA MIL
IOH = –24mA COM'L
VCC = 3V, VIN = VLC or VHC, IOL = 300µA
VCC = Min
IOL = 300µA
VIN = VIH or VIL
IOL = 32mA MIL
IOL = 48mA COM'L
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. This parameter is guaranteed but not ttested.
3
µA
µA
V
mA
V
V
IDT54/74FCT823A/B/C
HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
VLC = 0.2V; VHC = VCC - 0.2V
Min.
Typ.(2)
Max.
Unit
VCC = Max.
VIN ≥ VHC; VIN ≤ VLC
—
0.2
1.5
mA
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V(3)
—
0.5
2
mA
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
OE = EN = GND
One Input Toggling
50% Duty Cycle
VIN ≥ VHC
VIN ≤ VLC
—
0.15
0.25
mA/
MHz
Total Power Supply Current(6)
VCC = Max.
Outputs Open
fCP = 10MHz
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
1.7
4
mA
VIN = 3.4V
VIN = GND
—
2.2
6
VCC = Max.
Outputs Open
fCP = 10MHz
VIN ≥ VHC
VIN ≤ VLC
(FCT)
—
4
7.8(5)
50% Duty Cycle
OE = EN = GND
at fi = 2.5MHz
Eight Bits Toggling
VIN = 3.4V
VIN = GND
—
6.2
16.8(5)
Symbol
Parameter
ICC
Quiescent Power Supply Current
∆ICC
ICCD
IC
Test Conditions(1)
50% Duty Cycle
OE = EN = GND
One Bit Toggling
at fi = 5MHz
50% Duty Cycle
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of ∆ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for register devices (zero for non-register devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
4
IDT54/74FCT823A/B/C
HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
54/74FCT823A
Com'l.
Symbol
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
tSU
tH
tH
tPHL
tREM
tW
tW
Parameter
Propagation Delay
CP to Yx (OE = LOW)
Output Enable Time,
OE to Yx
Output Disable Time,
OE to Yx
Set-up Time HIGH or LOW, Dx to CP
Set-up Time HIGH or LOW, EN to CP
Hold Time HIGH or LOW, Dx to CP
Hold Time HIGH or LOW, EN to CP
Propagation Delay, CLR to Yx
Recovery Time, CLR to CP
CP Pulse Width HIGH or LOW
CLR Pulse Width HIGH or LOW
Mil.
54FCT823B
Mil.
Min.(2)
Max.
—
8.5
74FCT823C
Com'l.
Min.(2) Max.
—
6
Condition(1)
CL = 50pF
RL = 500Ω
Min.(2)
—
Max.
10
Min.(2)
—
Max.
11.5
CL = 300pF(3)
RL = 500Ω
CL = 50pF
RL = 500Ω
CL = 300pF(3)
RL = 500Ω
CL = 5pF(3)
RL = 500Ω
CL = 50pF
RL = 500Ω
CL = 50pF
RL = 500Ω
—
20
—
20
—
16
—
12.5
—
12
—
13
—
9
—
7
—
23
—
25
—
16
—
12.5
—
7
—
8
—
7
—
6.2
—
8
—
9
—
8
—
6.5
4
—
4
—
3
—
3
—
ns
2
2
—
6
7
6
—
—
14
—
—
—
2
2
—
7
7
7
—
—
15
—
—
—
1.5
0
—
6
6
6
—
—
9.5
—
—
—
1.5
0
—
6
6
6
—
—
8
—
—
—
ns
ns
ns
ns
ns
ns
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. These parameters are guaranteed but not tested.
5
Unit
ns
ns
ns
IDT54/74FCT823A/B/C
HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
V CC
SWITCH POSITION
7.0V
500Ω
V OUT
VIN
Pulse
Generator
D.U.T
.
50pF
RT
500Ω
CL
Test
Switch
Open Drain
Disable Low
Enable Low
Closed
All Other Tests
Open
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Octal link
Test Circuits for All Outputs
DATA
INPUT
tH
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
3V
1.5V
0V
3V
1.5V
0V
tREM
tSU
LOW-HIGH-LOW
PULSE
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
3V
1.5V
0V
tH
1.5V
1.5V
Octal link
Pulse Width
Octal link
Set-Up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
VOH
1.5V
VOL
DISABLE
3V
1.5V
0V
CONTROL
INPUT
tPZL
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
OUTPUT
NORMALLY
HIGH
Octal link
Propagation Delay
SWITCH
CLOSED
tPZH
SWITCH
OPEN
tPLZ
3.5V
3.5V
1.5V
0.3V
VOL
tPHZ
0.3V
1.5V
0V
Enable and Disable Times
VOH
0V
Octal link
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; ZO ≤ 50Ω; tF ≤ 2.5ns; tR ≤ 2.5ns.
6
IDT54/74FCT823A/B/C
HIGH-PERFORMANCECMOSBUFFER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT
XX
FCT
XXXX
Temp. Range
Device Type
XX
Package
X
Process
Blank
B
Commercial
MIL-STD-883, Class B
SO
Commercial Options
Small Outline IC
D
L
Military Options
CERDIP
Leadless Chip Carrier
823A
823B
823C
High Performance CMOS Bus
Interface Register, 9-Bit
54
74
– 55°C to +125°C
– 40°C to +85°C
DATA SHEET DOCUMENT HISTORY
6/27/2002
Updated according to PDNs Logic-00-07 and Logic-01-04
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7
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