Lattice ISPLSI1016E80LT44 High-density programmable logic Datasheet

ispLSI and pLSI 1016E
®
®
High-Density Programmable Logic
• HIGH-PERFORMANCE E2CMOS® TECHNOLOGY
— fmax = 125 MHz Maximum Operating Frequency
— tpd = 7.5 ns Propagation Delay
— TTL Compatible Inputs and Outputs
— Electrically Erasable and Reprogrammable
— Non-Volatile
— 100% Tested at Time of Manufacture
— Unused Product Term Shutdown Saves Power
• ispLSI OFFERS THE FOLLOWING ADDED FEATURES
— In-System Programmable™ (ISP™) 5-Volt Only
— Increased Manufacturing Yields, Reduced Time-toMarket and Improved Product Quality
— Reprogram Soldered Device for Faster Prototyping
• OFFERS THE EASE OF USE AND FAST SYSTEM
SPEED OF PLDs WITH THE DENSITY AND FLEXIBILITY
OF FIELD PROGRAMMABLE GATE ARRAYS
— Complete Programmable Device Can Combine Glue
Logic and Structured Designs
— Enhanced Pin Locking Capability
— Three Dedicated Clock Input Pins
— Synchronous and Asynchronous Clocks
— Programmable Output Slew Rate Control to
Minimize Switching Noise
— Flexible Pin Placement
— Optimized Global Routing Pool Provides Global
Interconnectivity
• pLSI/ispLSI DEVELOPMENT TOOLS
pDS® Software
— Easy to Use PC Windows™ Interface
— Boolean Logic Compiler
— Manual Partitioning
— Automatic Place and Route
— Static Timing Table
ispDS+™ Software
— Industry Standard, Third-Party Design
Environments
— Schematic Capture, State Machine, HDL
— Automatic Partitioning and Place and Route
— Comprehensive Logic and Timing Simulation
— PC and Workstation Platforms
B7
A0
D Q
A1
A2
Logic
A3
Array
B6
B5
D Q
D Q
GLB
B4
B3
A4
D Q
B2
A5
B1
A6
A7
Global Routing Pool (GRP)
Output Routing Pool
• HIGH-DENSITY PROGRAMMABLE LOGIC
— 2000 PLD Gates
— 32 I/O Pins, Four Dedicated Inputs
— 96 Registers
— High-Speed Global Interconnect
— Wide Input Gating for Fast Counters, State
Machines, Address Decoders, etc.
— Small Logic Block Size for Random Logic
Functional Block Diagram
Output Routing Pool
Features
B0
CLK
0139C1-isp
Description
The ispLSI and pLSI 1016E are High-Density
Programmable Logic Devices containing 96 Registers,
32 Universal I/O pins, four Dedicated Input pins, three
Dedicated Clock Input pins, one Global OE input pin and
a Global Routing Pool (GRP). The GRP provides complete
interconnectivity between all of these elements. The
ispLSI 1016E features 5-Volt in-system programming
and in-system diagnostic capabilities. The ispLSI 1016E
offers non-volatile “on-the-fly” reprogrammability of the
logic, as well as the interconnect to provide truly
reconfigurable systems. It is architecturally and
parametrically compatible to the pLSI 1016E device, but
multiplexes four input pins to control in-system
programming. A functional superset of the ispLSI and
pLSI 1016 architecture, the ispLSI and pLSI 1016E
devices add a new global output enable pin.
The basic unit of logic on the ispLSI and pLSI 1016E
devices is the Generic Logic Block (GLB). The GLBs are
labeled A0, A1...B7 (see figure 1). There are a total of 16
GLBs in the ispLSI and pLSI 1016E devices. Each GLB
has 18 inputs, a programmable AND/OR/Exclusive OR
array, and four outputs which can be configured to be
either combinatorial or registered. Inputs to the GLB
come from the GRP and dedicated inputs. All of the GLB
outputs are brought back into the GRP so that they can
be connected to the inputs of any other GLB on the
device.
Copyright © 1997 Lattice Semiconductor Corp. All brand or product names are trademarks or registered trademarks of their respective holders. The specifications and information herein are subject
to change without notice.
LATTICE SEMICONDUCTOR CORP., 5555 Northeast Moore Ct., Hillsboro, Oregon 97124, U.S.A.
Tel. (503) 681-0118; 1-800-LATTICE; FAX (503) 681-3037; http://www.latticesemi.com
1016E_04
February 1997
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Functional Block Diagram
Figure 1. ispLSI and pLSI 1016E Functional Block Diagram
Generic
Logic Blocks
(GLBs)
GOE 0/IN 3
MODE*/IN 2
I/O 31
I/O 30
I/O 29
I/O 28
B7
I/O 12
I/O 13
I/O 14
I/O 15
B5
A2
A3
Global
Routing
Pool
(GRP)
A4
B4
B3
B2
A5
lnput Bus
Output Routing Pool (ORP)
I/O 8
I/O 9
I/O 10
I/O 11
B6
A1
Input Bus
I/O 4
I/O 5
I/O 6
I/O 7
A0
Output Routing Pool (ORP)
I/O 0
I/O 1
I/O 2
I/O 3
I/O 27
I/O 26
I/O 25
I/O 24
I/O 23
I/O 22
I/O 21
I/O 20
I/O 19
I/O 18
I/O 17
I/O 16
B1
A6
B0
A7
*SDI/IN 0
*SDO/IN 1
Clock
Distribution
Network
CLK 0
CLK 1
CLK 2
IOCLK 0
IOCLK 1
Megablock
Y0
Y1**
*SCLK/Y2
*ispEN/NC
* ispLSI 1016E Only
**Note: Y1 and RESET
are multiplexed
on the same pin
0139B(1a)-isp
The GRP has, as its inputs, the outputs from all of the
GLBs and all of the inputs from the bi-directional I/O cells.
All of these signals are made available to the inputs of the
GLBs. Delays through the GRP have been equalized to
minimize timing skew.
The devices also have 32 I/O cells, each of which is
directly connected to an I/O pin. Each I/O cell can be
individually programmed to be a combinatorial input,
registered input, latched input, output or bi-directional
I/O pin with 3-state control. The signal levels are TTL
compatible voltages and the output drivers can source
4 mA or sink 8 mA. Each output can be programmed
independently for fast or slow output slew rate to minimize overall output switching noise.
Clocks in the ispLSI and pLSI 1016E devices are selected using the Clock Distribution Network. Three
dedicated clock pins (Y0, Y1 and Y2) are brought into the
distribution network, and five clock outputs (CLK 0,
CLK 1, CLK 2, IOCLK 0 and IOCLK 1) are provided to
route clocks to the GLBs and I/O cells. The Clock Distribution Network can also be driven from a special clock
GLB (B0 on the ispLSI and pLSI 1016E devices). The
logic of this GLB allows the user to create an internal
clock from a combination of internal signals within the
device.
Eight GLBs, 16 I/O cells, two dedicated inputs and one
ORP are connected together to make a Megablock (see
figure 1). The outputs of the eight GLBs are connected to
a set of 16 universal I/O cells by the ORP. Each ispLSI
and pLSI 1016E device contains two Megablocks.
2
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Absolute Maximum Ratings 1
Supply Voltage VCC ................................. -0.5 to +7.0V
Input Voltage Applied ........................ -2.5 to VCC +1.0V
Off-State Output Voltage Applied ..... -2.5 to VCC +1.0V
Storage Temperature ................................ -65 to 150°C
Case Temp. with Power Applied .............. -55 to 125°C
Max. Junction Temp. (TJ) with Power Applied ... 150°C
1. Stresses above those listed under the “Absolute Maximum Ratings” may cause permanent damage to the device. Functional
operation of the device at these or at any other conditions above those indicated in the operational sections of this specifica tion
is not implied (while programming, follow the programming specifications).
DC Recommended Operating Conditions
PARAMETER
SYMBOL
MIN.
MAX.
UNITS
5.25
V
Commercial
TA = 0°C to + 70°C
4.75
Industrial
TA = -40°C to + 85°C
4.5
5.5
V
0
0.8
V
VCC
Supply Voltage
VIL
VIH
Input Low Voltage
Input High Voltage
2.0
Vcc+1
V
Table 2-0005/1016E
Capacitance (TA=25oC, f=1.0 MHz)
TYPICAL
UNITS
C1
Dedicated Input, I/O, Y1, Y2, Y3, Clock Capacitance
(Commercial/Industrial)
8
pf
VCC = 5.0V, VPIN = 2.0V
C2
Y0 Clock Capacitance
12
pf
VCC = 5.0V, VPIN = 2.0V
SYMBOL
PARAMETER
TEST CONDITIONS
Table 2-0006/1016E
Data Retention Specifications
PARAMETER
MINIMUM
MAXIMUM
UNITS
20
–
Years
10000
–
Cycles
100
–
Cycles
Data Retention
ispLSI Erase/Reprogram Cycles
pLSI Erase/Reprogram Cycles
Table 2-0008/1016E
3
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Switching Test Conditions
Figure 2. Test Load
GND to 3.0V
Input Pulse Levels
Input Rise and Fall Time
10% to 90%
-125
≤ 2 ns
-100, -80
≤ 3 ns
Input Timing Reference Levels
1.5V
Ouput Timing Reference Levels
1.5V
Output Load
+ 5V
R1
Device
Output
See figure 2
Table 2-0003/1016E
3-state levels are measured 0.5V from
steady-state active level.
Test
Point
R2
CL*
Output Load Conditions (see figure 2)
TEST CONDITION
R1
R2
CL
470Ω
390Ω
35pF
Active High
∞
390Ω
35pF
Active Low
470Ω
390Ω
35pF
Active High to Z
at VOH -0.5V
∞
390Ω
5pF
Active Low to Z
at VOL +0.5V
470Ω
390Ω
5pF
A
B
C
*CL includes Test Fixture and Probe Capacitance.
0213a
Table 2-0004/1016E
DC Electrical Characteristics
Over Recommended Operating Conditions
SYMBOL
CONDITION
PARAMETER
3
MIN.
TYP.
MAX. UNITS
VOL
VOH
IIL
IIH
IIL-isp
IIL-PU
IOS1
Output Low Voltage
IOL= 8 mA
–
–
Output High Voltage
IOH = -4 mA
2.4
–
–
V
Input or I/O Low Leakage Current
0V ≤ VIN ≤ VIL (Max.)
–
–
-10
µA
Input or I/O High Leakage Current
3.5V ≤ VIN ≤ VCC
–
–
10
µA
ispEN Input Low Leakage Current
0V ≤ VIN ≤ VIL
–
–
-150
µA
I/O Active Pull-Up Current
0V ≤ VIN ≤ VIL
–
–
-150
µA
Output Short Circuit Current
VCC = 5V, VOUT = 0.5V
–
–
-200
mA
ICC2, 4
Operating Power Supply Current
VIL = 0.5V, VIH = 3.0V
Commercial
–
90
–
mA
fCLOCK = 1 MHz
Industrial
–
90
–
mA
0.4
V
Table 2-0007/1016E
1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test problems
by tester ground degradation. Guaranteed but not 100% tested.
2. Measured using four 16-bit counters.
3. Typical values are at VCC = 5V and TA= 25°C.
4. Maximum I CC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
section of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book to estimate maximum
I CC .
4
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
External Timing Parameters
Over Recommended Operating Conditions
4
PARAMETER
tpd1
tpd2
fmax
fmax (Ext.)
fmax (Tog.)
tsu1
tco1
th1
tsu2
tco2
th2
tr1
trw1
tptoeen
tptoedis
tgoeen
tgoedis
twh
twl
tsu3
th3
1.
2.
3.
4.
TEST
2
#
COND.
-80
-100
-125
DESCRIPTION1
MIN. MAX. MIN. MAX. MIN. MAX.
UNITS
A
1 Data Prop. Delay, 4PT Bypass, ORP Bypass
–
7.5
–
10.0
–
15.0
ns
A
2 Data Prop. Delay, Worst Case Path
–
10.0
–
13.0
–
18.5
ns
125
–
100
–
84.0
–
MHz
100
–
77
–
57.0
–
MHz
–
MHz
A
–
3 Clk. Frequency with Int. Feedback
3
4 Clk. Frequency with Ext. Feedback(
1
tsu2 + tco1
1
twh + tw1
)
–
5 Clk. Frequency, Max. Toggle(
–
6 GLB Reg. Setup Time before Clk., 4 PT Bypass
)
A
–
167
–
125
–
100
5.0
–
7.0
–
8.5
–
ns
7 GLB Reg. Clk. to Output Delay, ORP Bypass
–
4.5
–
5.0
–
8.0
ns
8 GLB Reg. Hold Time after Clk., 4 PT Bypass
0.0
–
0.0
–
0.0
–
ns
–
9 GLB Reg. Setup Time before Clk.
5.5
–
8.0
–
9.5
–
ns
–
10 GLB Reg. Clk. to Output Delay
–
5.5
–
6.0
–
9.5
ns
–
11 GLB Reg. Hold Time after Clk.
0.0
–
0.0
–
0.0
–
ns
13.5
–
17.0
ns
A
12 Ext. Reset Pin to Output Delay
–
10.0
–
–
13 Ext. Reset Pulse Duration
5.0
–
6.5
–
ns
14 Input to Output Enable
–
12.0
–
15.0
10.0
–
–
B
20.0
ns
C
15 Input to Output Disable
–
12.0
–
15.0
–
20.0
ns
B
16 Global OE Output Enable
–
7.0
–
9.0
–
10.5
ns
C
17 Global OE Output Disable
–
7.0
–
9.0
–
10.5
ns
–
18 Ext. Sync. Clk. Pulse Duration, High
3.0
–
4.0
–
5.0
–
ns
–
19 Ext. Sync. Clk. Pulse Duration, Low
3.0
–
4.0
–
5.0
–
ns
–
20 I/O Reg. Setup Time before Ext. Sync. Clk. (Y2, Y3) 3.0
–
3.5
–
4.5
–
ns
–
0.0
–
ns
–
21 I/O Reg. Hold Time after Ext. Sync. Clk. (Y2, Y3)
0.0
–
Unless noted otherwise, all parameters use the GRP, 20 PTXOR path, ORP and Y0 clock.
Refer to Timing Model in this data sheet for further details.
Standard 16-bit counter using GRP feedback.
Reference Switching Test Conditions Section.
5
0.0
Table 2-0030-16/125,100, 80
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Internal Timing Parameters1
PARAMETER
#
2
-125
DESCRIPTION
-100
-80
MIN. MAX. MIN. MAX. MIN. MAX.
UNITS
Inputs
tiobp
tiolat
tiosu
tioh
tioco
tior
tdin
22 I/O Register Bypass
–
0.3
–
0.4
–
0.6
ns
23 I/O Latch Delay
–
1.8
–
2.4
–
3.6
ns
ns
24 I/O Register Setup Time before Clock
3.0
–
3.5
–
4.5
–
25 I/O Register Hold Time after Clock
-0.3
–
-0.4
–
–
ns
–
4.0
–
5.0
-0.6
–
7.5
ns
5.0
–
7.5
ns
3.9
ns
26 I/O Register Clock to Out Delay
27 I/O Register Reset to Out Delay
–
4.0
–
28 Dedicated Input Delay
–
2.2
–
2.6
–
29 GRP Delay, 1 GLB Load
–
1.8
–
1.9
–
2.9
ns
30 GRP Delay, 4 GLB Loads
GRP
tgrp1
tgrp4
tgrp8
tgrp16
–
1.9
–
2.2
–
3.3
ns
31 GRP Delay, 8 GLB Loads
–
2.1
–
2.5
–
3.8
ns
32 GRP Delay, 16 GLB Loads
–
2.4
–
3.1
–
4.7
ns
34 4 Product Term Bypass Path Delay (Combinatorial)
–
3.9
–
5.7
–
8.1
ns
35 4 Product Term Bypass Path Delay (Registered)
–
3.9
–
5.6
–
7.3
ns
36 1 Product Term/XOR Path Delay
–
4.4
–
6.1
–
7.1
ns
37 20 Product Term/XOR Path Delay
–
4.4
–
6.1
–
8.2
ns
38 XOR Adjacent Path Delay 3
–
4.4
–
6.6
–
8.3
ns
39 GLB Register Bypass Delay
–
1.0
–
1.6
–
1.9
ns
40 GLB Register Setup Time before Clock
0.2
–
0.2
–
-0.6
–
ns
41 GLB Register Hold Time after Clock
1.5
–
2.5
–
4.3
–
ns
42 GLB Register Clock to Output Delay
–
1.8
–
1.9
–
2.9
ns
43 GLB Register Reset to Output Delay
–
4.4
–
6.3
–
7.0
ns
44 GLB Product Term Reset to Register Delay
–
3.5
–
5.1
–
7.2
ns
GLB
t4ptbpc
t4ptbpr
t1ptxor
t20ptxor
txoradj
tgbp
tgsu
tgh
tgco
tgro
tptre
tptoe
tptck
–
5.5
–
7.1
–
9.7
ns
3.2
3.5
4.8
5.3
6.8
7.5
ns
47 ORP Delay
–
1.0
–
1.0
–
1.5
ns
48 ORP Bypass Delay
–
0.0
–
0.0
–
0.0
ns
45 GLB Product Term Output Enable to I/O Cell Delay
46 GLB Product Term Clock Delay
ORP
torp
torpbp
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
3. The XOR Adjacent path can only be used by Lattice hard macros.
6
Table 2-0036-16/125,100, 80
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Internal Timing Parameters1
PARAMETER
2
#
-125
DESCRIPTION
-80
-100
MIN. MAX. MIN. MAX. MIN. MAX.
UNITS
Outputs
tob
tsl
toen
todis
tgoe
49 Output Buffer Delay
–
1.4
–
1.7
–
3.0
ns
50 Output Slew Limited Delay Adder
–
10.0
–
10.0
–
10.0
ns
51 I/O Cell OE to Output Enabled
–
4.3
–
5.3
–
6.4
ns
52 I/O Cell OE to Output Disabled
–
4.3
–
5.3
–
6.4
ns
53 Global Output Enable
–
2.7
–
3.7
–
4.1
ns
Clocks
tgy0
tgy1/2
tgcp
tioy1/2
tiocp
54 Clock Delay, Y0 to Global GLB Clock Line (Ref. clock)
1.3
1.3
1.4
1.4
2.1
2.1
ns
55 Clock Delay, Y1 or Y2 to Global GLB Clock Line
2.3
2.7
2.4
2.9
3.6
4.4
ns
56 Clock Delay, Clock GLB to Global GLB Clock Line
0.8
1.8
0.8
1.8
1.2
2.7
ns
57 Clock Delay, Y1 or Y2 to I/O Cell Global Clock Line
0.0
0.3
0.0
0.4
0.0
0.6
ns
58 Clock Delay, Clock GLB to I/O Cell Global Clock Line
0.8
1.8
0.8
1.8
1.2
2.7
ns
–
3.2
–
4.5
–
5.5
ns
Global Reset
tgr
59 Global Reset to GLB and I/O Registers
1. Internal Timing Parameters are not tested and are for reference only.
2. Refer to Timing Model in this data sheet for further details.
7
Table 2-0037-16/125,100,80
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
ispLSI and pLSI 1016E Timing Model
I/O Cell
GRP
GLB
ORP
I/O Cell
Feedback
Ded. In
I/O Pin
(Input)
#59
Comb 4 PT Bypass #34
#28
Reg 4 PT Bypass
GLB Reg Bypass
ORP Bypass
#35
#39
#48
GRP
Loading
Delay
20 PT
XOR Delays
GLB Reg
Delay
ORP
Delay
#29, 31, 32
#36-38
I/O Reg Bypass
#22
#30
Input
D Register Q
RST
#23 - 27
D
Q
#49, 50
I/O Pin
(Output)
#51, 52
#47
RST
#59
Reset
Clock
Distribution
Y1,2
#55-58
#40-43
Control RE
PTs
OE
#44-46 CK
#54
Y0
0491-16
#53
GOE 0
Derivations of tsu, th and tco from the Product Term Clock 1
tsu
=
=
=
1.4 ns =
Logic + Reg su - Clock (min)
(tiobp + tgrp4 + t20ptxor) + (tgsu) - (tiobp + tgrp4 + tptck(min))
(#22 + #30 + #37) + (#40) - (#22 + #30 + #46)
(0.3 + 1.9 + 4.4) + (0.2) - (0.3 + 1.9 + 3.2)
th
=
=
=
0.6 ns =
Clock (max) + Reg h - Logic
(tiobp + tgrp4 + tptck(max)) + (tgh) - (tiobp + tgrp4 + t20ptxor)
(#22 + #30 + #46) + (#41) - (#22 + #30 + #37)
(0.3 + 1.9 + 3.5) + (1.5) - (0.3 + 1.9 + 4.4)
tco
=
=
=
9.9 ns =
Clock (max) + Reg co + Output
(tiobp + tgrp4 + tptck(max)) + (tgco) + (torp + tob)
(#22 + #30 + #46) + (#42) + (#47 + #49)
(0.3 + 1.9 + 3.5) + (1.8) + (1.0 + 1.4)
Derivations of tsu, th and tco from the Clock GLB 1
tsu
=
=
=
2.9 ns =
Logic + Reg su - Clock (min)
(tiobp + tgrp4 + t20ptxor) + (tgsu) - (tgy0(min) + tgco + tgcp(min))
(#22 + #30 + #37) + (#40) - (#54 + #42 + #56)
(0.3 + 1.9 + 4.4) + (0.2) - (1.3 + 1.8 + 0.8)
th
=
=
=
-0.2 ns =
Clock (max) + Reg h - Logic
(tgy0(max) + tgco + tgcp(max)) + (tgh) - (tiobp + tgrp4 + t20ptxor)
(#54 + #42 + #56) + (#41) - (#22 + #30 + #37)
(1.3 + 1.8 + 1.8) + (1.5) - (0.3 + 1.9 + 4.4)
tco
=
=
=
9.1 ns =
Clock (max) + Reg co + Output
(tgy0(max) + tgco + tgcp(max)) + (tgco) + (torp + tob)
(#54 + #42 + #56) + (#42) + (#47 + #49)
(1.3 + 1.8 + 1.8) + (1.8) + (1.0 + 1.4)
Table 2-0042-16
1. Calculations are based upon timing specifications for the ispLSI and pLSI 1016E-125
8
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Maximum GRP Delay vs GLB Loads
ispLSI and pLSI 1016E-80
3
ispLSI and pLSI 1016E-100
GRP Delay (ns)
2
ispLSI and pLSI 1016E-125
1
1
8
4
12
16
GLB Load
16E GRP/GLB.eps
Power Consumption
used. Figure 3 shows the relationship between power
and operating speed.
Power Consumption in the ispLSI and pLSI 1016E device
depends on two primary factors: the speed at which the
device is operating and the number of Product Terms
Figure 3. Typical Device Power Consumption vs fmax
130
ispLSI and pLSI 1016E
120
ICC (mA)
110
100
90
80
0
20
40
60
80
100 120 140
fmax (MHz)
Notes: Configuration of four 16-bit counters
Typical current at 5V, 25°C
ICC can be estimated for the ispLSI and pLSI 1016E using the following equation:
ICC(mA) = 23 + (# of PTs * 0.52) + (# of nets * max freq * 0.004)
Where:
# of PTs = Number of product terms used in design
# of nets = Number of signals used in device
Max freq = Highest clock frequency to the device (in MHz)
The ICC estimate is based on typical conditions (VCC = 5.0V, room temperature) and an assumption of four GLB loads
on average exists and the device is filled with four 16-bit counters. These values are for estimates only. Since the
value of ICC is sensitive to operating conditions and the program in the device, the actual ICC should be verified.
0127B-16-80-isp/1016
9
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
In-System Programmability
The ispLSI devices are the in-system programmable
versions of the Lattice Semiconductor High-Density Programmable Large Scale Integration (pLSI) devices. By
integrating all the high voltage programming circuitry onchip, programming can be accomplished by simply shifting
data into the device. Once the function is programmed,
the non-volatile E2CMOS cells will not lose the pattern
even when the power is turned off.
interface include isp Enable (ispEN), Serial Data In (SDI),
Serial Data Out (SDO), Serial Clock (SCLK) and Mode
(MODE) control. Figure 4 illustrates the block diagram of
one possible scheme for programming the ispLSI devices. For details on the operation of the internal state
machine and programming of the device, please refer to
the ISP Architecture and Programming section of the
1996 Lattice Data Book.
All necessary programming is done via five TTL level
logic interface signals. These five signals are fed into the
on-chip programming circuitry where a state machine
controls the programming. The simple signals for the
The device identifier for the ispLSI 1016E is 0000 1011
(0B hex). This code is the unique device identifier which
is generated when a read ID command is performed.
Figure 4. ISP Programming Interface
SDO
SDI
MODE
SCLK
ispEN
5-wire ISP
Programming
Interface
ispEN
SCLK
MODE
SCLK
MODE
ispLSI
SDI
ispGAL
SDO
SDI
ispEN
SCLK
MODE
SCLK
MODE
ispGDS
SDO
SDI
SDO
ispLSI
SDI
SDO
0294B
10
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
ispLSI 1016E Shift Register Layout
D
A
T
A
Data In
(SDI)
79...
159...
D
A
T
A
High Order Shift Register
Low Order Shift Register
...0
...80
SDO
SDI
Address Shift Register
109
.
.
.
E2CMOS Cell Array
.
.
.
0
0182B-16
SDO
Note: A logic “1” in the Address Shift Register bit position enables the row for programming or verification.
A logic “0” disables it.
11
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Pin Description
NAME
PLCC
PIN NUMBERS
18,
22,
28,
32,
40,
44,
6,
10
TQFP
PIN NUMBERS
9,
13,
19,
23,
31,
35,
41,
1,
10,
14,
20,
24,
32,
36,
42,
2,
11,
15,
21,
25,
33,
37,
43,
3,
12,
16,
22,
26,
34,
38,
44,
4
DESCRIPTION
I/O 0 - I/O 3
I/O 4 - I/O 7
I/O 8 - I/O 11
I/O 12 - I/O 15
I/O 16 - I/O 19
I/O 20 - I/O 23
I/O 24 - I/O 27
I/O 28 - I/O 31
15,
19,
25,
29,
37,
41,
3,
7,
GOE 0/IN 3
2
40
This is a dual function pin. It can be used either as Global Output Enable for
all I/O cells or it can be used as a dedicated input pin.
ispEN**/NC
13
7
Input - Dedicated in-system programming enable input pin. This pin is
brought low to enable the programming mode. The MODE, SDI, SDO and
SCLK controls become active.
SDI*/IN 0
14
8
Input - This pin performs two functions. When ispEN is logic low, it functions
as an input pin to load programming data into the device. It is a dedicated
input pin when ispEN is logic high.SDI/IN0 also is used as one of the two
control pins for the isp state machine.
MODE*/IN 2
36
30
Input - This pin performs two functions. When ispEN is logic low, it functions
as a pin to control the operation of the isp state machine. It is a dedicated
input pin when ispEN is logic high.
SDO*/IN 1
24
18
Output/Input - This pin performs two functions. When ispEN is logic low, it
functions as an ouput pin to read serial shift register data. It is a dedicated
input pin when ispEN is logic high.
SCLK*/Y2
33
27
Input - This pin performs two functions. When ispEN is logic low, it
functions as a clock pin for the Serial Shift Register. It is a dedicated clock
input when ispEN is logic high. This clock input is brought into the Clock
Distribution Network, and can optionally be routed to any GLB and/or I/O
cell on the device.
Y0
11
5
Dedicated Clock input. This clock input is connected to one of the clock
inputs of all the GLBs on the device.
Y1/RESET
35
29
This pin performs two functions:
- Dedicated clock input. This clock input is brought into the Clock
Distribution Network, and can optionally be routed to any GLB and/or
I/O cell on the device.
- Active Low (0) Reset pin which resets all of the GLB and I/O registers
in the device.
16,
20,
26,
30,
38,
42,
4,
8,
GND
1,
VCC
12, 34
23
17,
21,
27,
31,
39,
43,
5,
9,
17, 39
6,
28
Input/Output Pins - These are the general purpose I/O pins used by the logic
array.
Ground (GND)
Vcc
* ispLSI 1016E only
** ispEN for ispLSI 1016E; NC for pLSI 1016E must be left floating or tied to Vcc, must not be grounded or tied
to any other signal.
12
Table 2-0002C-16-isp
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Pin Configurations
I/O 19
I/O 21
I/O 20
I/O 22
**GOE 0/IN 3
GND
I/O 23
I/O 24
I/O 26
I/O 25
I/O 27
ispLSI and pLSI 1016E 44-pin PLCC Pinout Diagram
6 5 4 3 2 1 44 43 42 41 40
I/O 28
I/O 29
I/O 30
I/O 31
7
8
9
10
11
39
I/O 18
38
37
I/O 17
I/O 16
36
*MODE/IN 2
35
34
Y1/RESET
VCC
12
ispLSI 1016E
pLSI 1016E
*ispEN/NC
13
Top View
33
*SCLK/Y2
*SDI/IN 0
14
32
I/O 15
I/O 0
I/O 1
I/O 2
15
16
17
31
30
29
I/O 14
I/O 13
I/O 12
Y0
VCC
I/O 11
I/O 9
I/O 10
I/O 8
GND
*SDO/IN 1
I/O 7
I/O 6
I/O 4
I/O 5
I/O 3
18 19 20 21 22 23 24 25 26 27 28
* Pins have dual function capability for ispLSI 1016E only (except pin 13, which is ispEN only).
** Pins have dual function capability which is software selectable.
0123A-isp1016
I/O 21
I/O 20
I/O 19
I/O 22
GND
I/O 23
**GOE 0/IN 3
I/O 24
I/O 26
I/O 25
I/O 27
ispLSI 1016E 44-pin TQFP Pinout Diagram
44 43 42 41 40 39 38 37 36 35 34
I/O 28
I/O 29
I/O 30
I/O 31
Y0
VCC
1
2
3
4
5
ispLSI 1016E
6
Top View
33
I/O 18
32
31
I/O 17
I/O 16
30
*MODE/IN 2
29
28
Y1/RESET
VCC
ispEN
7
27
*SCLK/Y2
*SDI/IN 0
8
26
I/O 15
9
10
11
25
24
23
I/O 14
I/O 13
I/O 12
I/O 0
I/O 1
I/O 2
I/O 9
I/O 10
I/O 11
I/O 8
GND
*SDO/IN 1
I/O 7
I/O 6
I/O 4
I/O 5
I/O 3
12 13 14 15 16 17 18 19 20 21 22
* Pins have dual function capability.
** Pins have dual function capability which is software selectable.
0851-16E/TQFP
13
1996 ISP Encyclopedia
Specifications ispLSI and pLSI 1016E
Part Number Description
(is)pLSI
1016E – XXX
X
XXX
X
Device Family
ispLSI
pLSI
Grade
Blank = Commercial
I = Industrial
Device Number
Package
J = PLCC
T44 = TQFP
Speed
125 = 125 MHz fmax
100 = 100 MHz fmax
80 = 84 MHz fmax
Power
L = Low
0212/1016E
ispLSI and pLSI 1016E Ordering Information
COMMERCIAL
FAMILY
ispLSI
pLSI
fmax (MHz)
tpd (ns)
ORDERING NUMBER
PACKAGE
125
7.5
ispLSI 1016E-125LJ
44-Pin PLCC
125
7.5
ispLSI 1016E-125LT44
44-Pin TQFP
100
10
ispLSI 1016E-100LJ
44-Pin PLCC
100
10
ispLSI 1016E-100LT44
44-Pin TQFP
84
15
ispLSI 1016E-80LJ
44-Pin PLCC
84
15
ispLSI 1016E-80LT44
44-Pin TQFP
125
7.5
pLSI 1016E-125LJ
44-Pin PLCC
100
10
pLSI 1016E-100LJ
44-Pin PLCC
84
15
pLSI 1016E-80LJ
44-Pin PLCC
Table 2-0041A/1016E
INDUSTRIAL
FAMILY
ispLSI
fmax (MHz)
tpd (ns)
84
84
ORDERING NUMBER
PACKAGE
15
ispLSI 1016E-80LJI
44-Pin PLCC
15
ispLSI 1016E-80LT44I
44-Pin TQFP
Table 2-0041B/1016E
14
1996 ISP Encyclopedia
Copyright © 1997 Lattice Semiconductor Corporation.
E2CMOS, GAL, ispGAL, ispLSI, pLSI, pDS, Silicon Forest, UltraMOS, Lattice Semiconductor, L (stylized) Lattice
Semiconductor Corp., L (stylized) and Lattice (design) are registered trademarks of Lattice Semiconductor Corporation.
Generic Array Logic, ISP, ispATE, ispCODE, ispDOWNLOAD, ispGDS, ispDS, ispDS+, ispStarter, ispSTREAM, ispTEST,
ispTURBO, Latch-Lock, pDS+, RFT, Total ISP and Twin GLB are trademarks of Lattice Semiconductor Corporation. ISP is a
service mark of Lattice Semiconductor Corporation. All brand names or product names mentioned are trademarks or
registered trademarks of their respective holders.
Lattice Semiconductor Corporation (LSC) products are made under one or more of the following U.S. and international
patents: 4,761,768 US, 4,766,569 US, 4,833,646 US, 4,852,044 US, 4,855,954 US, 4,879,688 US, 4,887,239 US, 4,896,296
US, 5,130,574 US, 5,138,198 US, 5,162,679 US, 5,191,243 US, 5,204,556 US, 5,231,315 US, 5,231,316 US, 5,237,218 US,
5,245,226 US, 5,251,169 US, 5,272,666 US, 5,281,906 US, 5,295,095 US, 5,329,179 US, 5,331,590 US, 5,336,951 US,
5,353,246 US, 5,357,156 US, 5,359,573 US, 5,394,033 US, 5,394,037 US, 5,404,055 US, 5,418,390 US, 5,493,205 US,
0194091 EP, 0196771B1 EP, 0267271 EP, 0196771 UK, 0194091 GB, 0196771 WG, P3686070.0-08 WG. LSC does not
represent that products described herein are free from patent infringement or from any third-party right.
The specifications and information herein are subject to change without notice. Lattice Semiconductor Corporation (LSC)
reserves the right to discontinue any product or service without notice and assumes no obligation to correct any errors
contained herein or to advise any user of this document of any correction if such be made. LSC recommends its customers
obtain the latest version of the relevant information to establish, before ordering, that the information being relied upon is
current.
LSC warrants performance of its products to current and applicable specifications in accordance with LSC’s standard
warranty. Testing and other quality control procedures are performed to the extent LSC deems necessary. Specific testing of
all parameters of each product is not necessarily performed, unless mandated by government requirements.
LSC assumes no liability for applications assistance, customer’s product design, software performance, or infringements of
patents or services arising from the use of the products and services described herein.
LSC products are not authorized for use in life-support applications, devices or systems. Inclusion of LSC products in such
applications is prohibited.
LATTICE SEMICONDUCTOR CORPORATION
5555 Northeast Moore Court
Hillsboro, Oregon 97124 U.S.A.
Tel.: (503) 681-0118
FAX: (503) 681-3037
http://www.latticesemi.com
February 1997
Similar pages