Elpida EBJ21EE8BAWA-8C-E 2gb unbuffered ddr3 sdram dimm Datasheet

DATA SHEET
2GB Unbuffered DDR3 SDRAM DIMM
EBJ21EE8BAWA (256M words × 72 bits, 2 Ranks)
Specifications
Features
• Density: 2GB
• Organization
 256M words × 72 bits, 2 ranks
• Mounting 18 pieces of 1G bits DDR3 SDRAM sealed
in FBGA
• Package: 240-pin socket type dual in line memory
module (DIMM)
 PCB height: 30.0mm
 Lead pitch: 1.0mm
 Lead-free (RoHS compliant)
• Power supply: VDD = 1.5V ± 0.075V
• Data rate: 1333Mbps/1066Mbps/800Mbps (max.)
• Eight internal banks for concurrent operation
(components)
• Interface: SSTL_15
• Burst lengths (BL): 8 and 4 with Burst Chop (BC)
• /CAS Latency (CL): 6, 7, 8, 9
• /CAS write latency (CWL): 5, 6, 7
• Precharge: auto precharge option for each burst
access
• Refresh: auto-refresh, self-refresh
• Refresh cycles
 Average refresh period
7.8µs at 0°C ≤ TC ≤ +85°C
3.9µs at +85°C < TC ≤ +95°C
• Operating case temperature range
 TC = 0°C to +95°C
• Double-data-rate architecture; two data transfers per
clock cycle
• The high-speed data transfer is realized by the 8 bits
prefetch pipelined architecture
• Bi-directional differential data strobe (DQS and /DQS)
is transmitted/received with data for capturing data at
the receiver
• DQS is edge-aligned with data for READs; centeraligned with data for WRITEs
• Differential clock inputs (CK and /CK)
• DLL aligns DQ and DQS transitions with CK
transitions
• Commands entered on each positive CK edge; data
and data mask referenced to both edges of DQS
• Data mask (DM) for write data
• Posted /CAS by programmable additive latency for
better command and data bus efficiency
• On-Die-Termination (ODT) for better signal quality
 Synchronous ODT
 Dynamic ODT
 Asynchronous ODT
• Multi Purpose Register (MPR) for temperature read
out
• ZQ calibration for DQ drive and ODT
• Programmable Partial Array Self-Refresh (PASR)
• /RESET pin for Power-up sequence and reset
function
• SRT range:
 Normal/extended
 Auto/manual self-refresh
• Programmable Output driver impedance control
• Class B temperature sensor functionality with
EEPROM
Document No. E1367E30 (Ver. 3.0)
Date Published December 2008 (K) Japan
Printed in Japan
URL: http://www.elpida.com
Elpida Memory, Inc. 2008
EBJ21EE8BAWA
Ordering Information
Part number
Data rate
Mbps (max.)
Component
JEDEC speed bin
(CL-tRCD-tRP)
EBJ21EE8BAWA-DJ-E
1333
DDR3-1333H (9-9-9)
EBJ21EE8BAWA-AE-E 1066
DDR3-1066F (7-7-7)
EBJ21EE8BAWA-8C-E
DDR3-800E (6-6-6)
800
Package
240-pin DIMM
(lead-free)
Data Sheet E1367E30 (Ver. 3.0)
2
Contact
pad
Gold
Mounted devices
EDJ1108BABG-DG-E
EDJ1108BABG-DJ-E
EDJ1108BABG-DG-E
EDJ1108BABG-DJ-E
EDJ1108BABG-AC-E
EDJ1108BABG-AE-E
EDJ1108BABG-DG-E
EDJ1108BABG-DJ-E
EDJ1108BABG-AC-E
EDJ1108BABG-AE-E
EDJ1108BABG-AG-E
EDJ1108BABG-8A-E
EDJ1108BABG-8C-E
EBJ21EE8BAWA
Pin Configurations
Front side
1 pin
121 pin
48 pin 49 pin
120 pin
168 pin 169 pin
240 pin
Back side
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
1
VREFDQ
61
A2
121
VSS
181
A1
2
VSS
62
VDD
122
DQ4
182
VDD
3
DQ0
63
CK1
123
DQ5
183
VDD
4
DQ1
64
/CK1
124
VSS
184
CK0
5
VSS
65
VDD
125
DM0
185
/CK0
6
/DQS0
66
VDD
126
NC
186
VDD
7
DQS0
67
VREFCA
127
VSS
187
/EVENT
8
VSS
68
NC
128
DQ6
188
A0
9
DQ2
69
VDD
129
DQ7
189
VDD
10
DQ3
70
A10(AP)
130
VSS
190
BA1
11
VSS
71
BA0
131
DQ12
191
VDD
12
DQ8
72
VDD
132
DQ13
192
/RAS
13
DQ9
73
/WE
133
VSS
193
/CS0
14
VSS
74
/CAS
134
DM1
194
VDD
15
/DQS1
75
VDD
135
NC
195
ODT0
16
DQS1
76
/CS1
136
VSS
196
A13
17
VSS
77
ODT1
137
DQ14
197
VDD
18
DQ10
78
VDD
138
DQ15
198
NC
19
DQ11
79
NC
139
VSS
199
VSS
20
VSS
80
VSS
140
DQ20
200
DQ36
21
DQ16
81
DQ32
141
DQ21
201
DQ37
22
DQ17
82
DQ33
142
VSS
202
VSS
23
VSS
83
VSS
143
DM2
203
DM4
24
/DQS2
84
/DQS4
144
NC
204
NC
25
DQS2
85
DQS4
145
VSS
205
VSS
26
VSS
86
VSS
146
DQ22
206
DQ38
27
DQ18
87
DQ34
147
DQ23
207
DQ39
28
DQ19
88
DQ35
148
VSS
208
VSS
29
VSS
89
VSS
149
DQ28
209
DQ44
30
DQ24
90
DQ40
150
DQ29
210
DQ45
31
DQ25
91
DQ41
151
VSS
211
VSS
32
VSS
92
VSS
152
DM3
212
DM5
33
/DQS3
93
/DQS5
153
NC
213
NC
34
DQS3
94
DQS5
154
VSS
214
VSS
35
VSS
95
VSS
155
DQ30
215
DQ46
36
DQ26
96
DQ42
156
DQ31
216
DQ47
Data Sheet E1367E30 (Ver. 3.0)
3
EBJ21EE8BAWA
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
Pin No.
Pin name
37
DQ27
97
DQ43
157
VSS
217
VSS
38
VSS
98
VSS
158
CB4
218
DQ52
39
CB0
99
DQ48
159
CB5
219
DQ53
40
CB1
100
DQ49
160
VSS
220
VSS
41
VSS
101
VSS
161
DM8
221
DM6
42
/DQS8
102
/DQS6
162
NC
222
NC
43
DQS8
103
DQS6
163
VSS
223
VSS
44
VSS
104
VSS
164
CB6
224
DQ54
45
CB2
105
DQ50
165
CB7
225
DQ55
46
CB3
106
DQ51
166
VSS
226
VSS
47
VSS
107
VSS
167
NC
227
DQ60
48
NC
108
DQ56
168
/RESET
228
DQ61
49
NC
109
DQ57
169
CKE1
229
VSS
50
CKE0
110
VSS
170
VDD
230
DM7
51
VDD
111
/DQS7
171
NC
231
NC
52
BA2
112
DQS7
172
NC
232
VSS
53
NC
113
VSS
173
VDD
233
DQ62
54
VDD
114
DQ58
174
A12
234
DQ63
55
A11
115
DQ59
175
A9
235
VSS
56
A7
116
VSS
176
VDD
236
VDDSPD
57
VDD
117
SA0
177
A8
237
SA1
58
A5
118
SCL
178
A6
238
SDA
59
A4
119
SA2
179
VDD
239
VSS
60
VDD
120
VTT
180
A3
240
VTT
Data Sheet E1367E30 (Ver. 3.0)
4
EBJ21EE8BAWA
Pin Description
Pin name
Function
A0 to A13
Address input
Row address
Column address
A10 (AP)
Auto precharge
A0 to A13
A0 to A9
A12 (/BC)
Burst chop
BA0, BA1, BA2
Bank select address
DQ0 to DQ63
Data input/output
CB0 to CB7
Check bit (Data input/output)
/RAS
Row address strobe command
/CAS
Column address strobe command
/WE
Write enable
/CS0, /CS1
Chip select
CKE0, CKE1
Clock enable
CK0, CK1
Clock input
/CK0, /CK1
Differential clock input
DQS0 to DQS8, /DQS0 to /DQS8
Input and output data strobe
DM0 to DM7
Input mask
SCL
Clock input for serial PD
SDA
Data input/output for serial PD
SA0, SA1, SA2
Serial address input
VDD
Power for internal circuit
VDDSPD
Power for serial EEPROM
VREFCA
Reference voltage for CA
VREFDQ
Reference voltage for DQ
VSS
Ground
VTT
I/O termination supply for SDRAM
/RESET
Set DRAM to known state
ODT0, ODT1
ODT control
/EVENT
Temperature event pin
NC
No connection
Data Sheet E1367E30 (Ver. 3.0)
5
EBJ21EE8BAWA
Serial PD Matrix
Byte No. Function described
0
Number of serial PD bytes written/SPD
device size/CRC coverage
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
1
0
1
176/256/0-116
0
0
0
1
0
92H
1
SPD revision
0
0
0
1
0
0
0
0
10H
Revision 1.0
2
Key byte/DRAM device type
0
0
0
0
1
0
1
1
0BH
DDR3 SDRAM
3
Key byte/module type
0
0
0
0
0
0
1
0
02H
Unbuffered
4
SDRAM density and banks
0
0
0
0
0
0
1
0
02H
1G bits, 8 banks
5
SDRAM addressing
0
0
0
1
0
0
0
1
11H
14 rows, 10 columns
6
Module nominal voltage, VDD
0
0
0
0
0
0
0
0
00H
1.5V
7
Module organization
0
0
0
0
1
0
0
1
09H
2 ranks/×8 bits
8
Module memory bus width
0
0
0
0
1
0
1
1
0BH
72 bits/ECC
9
Fine timebase (FTB) dividend/divisor
0
1
0
1
0
0
1
0
52H
5/2
10
Medium timebase (MTB) dividend
0
0
0
0
0
0
0
1
01H
1
11
Medium timebase (MTB) divisor
0
0
0
0
1
0
0
0
08H
8
12
SDRAM minimum cycle time
(tCK (min.))
-DJ
0
0
0
0
1
1
0
0
0CH
1.5ns
0
0
0
0
1
1
1
1
0FH
1.875ns
-AE
0
0
0
1
0
1
0
0
14H
2.5ns
13
Reserved
-8C
0
0
0
0
0
0
0
0
00H
—
14
SDRAM /CAS latencies supported, LSB
-DJ
0
0
1
1
1
1
0
0
3CH
CL = 6, 7, 8, 9
-AE
0
0
0
1
1
1
0
0
1CH
CL = 6, 7, 8
-8C
0
0
0
0
0
1
0
0
04H
CL = 6
15
SDRAM /CAS latencies supported, MSB
0
0
0
0
0
0
0
0
00H
—
16
SDRAM minimum /CAS latencies time
(tAA (min.))
-DJ, -AE
0
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
1
1
0
0
0
78H
15ns
-8C
17
SDRAM write recovery time (tWR)
0
1
1
1
1
0
0
0
78H
15ns
18
SDRAM minimum /RAS to /CAS delay
(tRCD)
-DJ, -AE
0
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
1
1
0
0
0
78H
15ns
SDRAM minimum row active to row active
delay (tRRD)
0
-DJ
0
1
1
0
0
0
0
30H
6ns
-8C
19
20
-AE
0
0
1
1
1
1
0
0
3CH
7.5ns
-8C
0
1
0
1
0
0
0
0
50H
10ns
0
1
1
0
1
0
0
1
69H
13.125ns
0
1
1
1
1
0
0
0
78H
15ns
0
0
0
1
0
0
0
1
11H
SDRAM minimum row precharge time
(tRP)
-DJ, -AE
-8C
21
SDRAM upper nibbles for tRAS and tRC
Data Sheet E1367E30 (Ver. 3.0)
6
EBJ21EE8BAWA
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
Comments
0
1
0
0
0
0
0
20H
36ns
0
0
1
0
1
1
0
0
2CH
37.5ns
1
0
0
0
1
1
0
0
8CH
49.5ns
-AE
1
0
0
1
0
1
0
1
95H
50.625ns
-8C
1
0
1
0
0
1
0
0
A4H
52.5ns
0
1
1
1
0
0
0
0
70H
110ns
0
0
0
0
0
0
1
1
03H
110ns
0
0
1
1
1
1
0
0
3CH
7.5ns
0
0
1
1
1
1
0
0
3CH
7.5ns
0
0
0
0
0
0
0
0
00H
0
0
0
0
0
0
0
1
01H
1
1
1
1
0
0
0
0
F0H
30ns
0
0
1
0
1
1
0
0
2CH
37.5ns
Byte No. Function described
Bit7 Bit6
22
SDRAM minimum active to precharge time
(tRAS), LSB
0
-DJ
23
SDRAM minimum active to active /autorefresh time (tRC), LSB
-DJ
-AE, -8C
24
25
26
27
28
SDRAM minimum refresh recovery time
delay (tRFC), LSB
SDRAM minimum refresh recovery time
delay (tRFC), MSB
SDRAM minimum internal write to read
command delay (tWTR)
SDRAM minimum internal read to
precharge command delay (tRTP)
Upper nibble for tFAW
-DJ
-AE, -8C
29
Minimum four activate window delay time
(tFAW)
-DJ
-AE
0
1
0
0
0
0
0
0
40H
40ns
30
SDRAM output drivers supported
-8C
1
0
0
0
0
0
1
1
83H
DLL-off/RZQ/6, 7
31
SDRAM refresh options
1
0
0
0
0
0
0
1
81H
PASR/2X refresh at
+85C° to +95C°
32
Module thermal sensor
1
0
0
0
0
0
0
0
80H
Incorporated
33
SDRAM device type
0
0
0
0
0
0
0
0
00H
Standard
34 to 59 Reserved
0
0
0
0
0
0
0
0
00H
—
60
Module nominal height
0
0
0
0
1
1
1
1
0FH
29 < height ≤ 30mm
61
Module maximum thickness
0
0
0
1
0
0
0
1
11H
62
Reference raw card used
0
0
0
0
0
1
0
0
04H
Raw Card E
63
Address mapping from edge connecter to
0
DRAM
0
0
0
0
0
0
1
01H
Mirrored
64 to
116
Module specific section
0
0
0
0
0
0
0
0
00H
—
0
0
0
0
0
0
1
0
02H
Elpida Memory
1
1
1
1
1
1
1
0
FEH
Elpida Memory
117
118
Module ID: manufacturer’s JEDEC ID
code, LSB
Module ID: manufacturer’s JEDEC ID
code, MSB
119
Module ID: manufacturing location
×
×
×
×
×
×
×
×
××
120
Module ID: manufacturing date
×
×
×
×
×
×
×
×
××
Year code (BCD)
121
Module ID: manufacturing date
×
×
×
×
×
×
×
×
××
Week code (BCD)
122 to
125
Module ID: module serial number
×
×
×
×
×
×
×
×
××
126
Cyclical redundancy code (CRC)
-DJ
1
1
1
1
0
0
0
0
F0H
-AE
1
1
0
0
0
1
0
1
C5H
-8C
0
1
0
1
1
1
0
1
5DH
Data Sheet E1367E30 (Ver. 3.0)
7
EBJ21EE8BAWA
Bit7 Bit6
Bit5
Hex
Bit4 Bit3 Bit2 Bit1 Bit0 value
1
1
1
1
1
0
0
1
F9H
-AE
1
1
1
0
1
0
0
0
E8H
-8C
1
0
1
1
0
0
0
1
B1H
Byte No. Function described
127
Cyclical redundancy code (CRC)
-DJ
Comments
128
Module part number
0
1
0
0
0
1
0
1
45H
E
129
Module part number
0
1
0
0
0
0
1
0
42H
B
130
Module part number
0
1
0
0
1
0
1
0
4AH
J
131
Module part number
0
0
1
1
0
0
1
0
32H
2
132
Module part number
0
0
1
1
0
0
0
1
31H
1
133
Module part number
0
1
0
0
0
1
0
1
45H
E
134
Module part number
0
1
0
0
0
1
0
1
45H
E
135
Module part number
0
0
1
1
1
0
0
0
38H
8
137
Module part number
0
1
0
0
0
0
0
1
41H
A
138
Module part number
0
1
0
1
0
1
1
1
57H
W
139
Module part number
0
1
0
0
0
0
0
1
41H
A
140
Module part number
0
0
1
0
1
1
0
1
2DH
—
141
Module part number
-DJ
0
1
0
0
0
1
0
0
44H
D
-AE
0
1
0
0
0
0
0
1
41H
A
-8C
0
0
1
1
1
0
0
0
38H
8
0
1
0
0
1
0
1
0
4AH
J
-AE
0
1
0
0
0
1
0
1
45H
E
-8C
0
1
0
0
0
0
1
1
43H
C
0
0
1
0
1
1
0
1
2DH
—
142
143
Module part number
-DJ
Module part number
144
Module part number
0
1
0
0
0
1
0
1
45H
E
145
Module part number
0
0
1
0
0
0
0
0
20H
(Space)
146
Module revision code
0
0
1
1
0
0
0
0
30H
Initial
Module revision code
0
0
1
0
0
0
0
0
20H
(Space)
0
0
0
0
0
0
1
0
02H
Elpida Memory
1
1
1
1
1
1
1
0
FEH
Elpida Memory
0
0
0
0
0
0
0
0
00H
147
148
149
150 to
175
176 to
255
SDRAM manufacturer’s JEDEC ID code,
LSB
SDRAM manufacturer’s JEDEC ID code,
MSB
Manufacturer's specific data
Open for customer use
Data Sheet E1367E30 (Ver. 3.0)
8
EBJ21EE8BAWA
Block Diagram
VDD
VDD
Rs3
Rs3
Rs2
Rs2
Rs2
Rs2
Rs2
Rs3
Rs4
/CK
CK
/CS
ODT
CKE
Address
BA
Command
Rs4
/CK
CK
ZQ
Rs4
ZQ
/CK
DQ0
to DQ7
CK
DM
Rs4
/CK
CK
ZQ
D15
/CS
ODT
CKE
Address
BA
Command
/DQS
Rs1
DQ0
to DQ7
ZQ
Rs4
DM
/CK
ZQ
D14
CK
DQ0
to DQ7
Rs4
DM
8 Rs1
/DQS
/CK
DM5
DQ40
to DQ47
DQS
D5
/DQS
/CS
ODT
CKE
Address
BA
Command
DQS
/CS
ODT
CKE
Address
BA
Command
ZQ
Rs3
Rs2
Rs3
/CS
ODT
CKE
Address
BA
Command
Rs4
/CK
DQ0
to DQ7
Rs1
Rs4
DQ0
to DQ7
DQ0
to DQ7
DQS
Rs1
/CK
DM
8 Rs1
/DQS5
CK
ZQ
DM
DM6
DQ48
to DQ55
DQS5
/CS
ODT
CKE
Address
BA
Command
DQ0
to DQ7
Rs4
DM
DM1
8 Rs1
DQ8
to DQ15
Rs1
ZQ
DM
DQ0
to DQ7
ZQ
Rs4
DQ0
to DQ7
/CK
8 Rs1
CK
DM
DM4
DQ32
to DQ39
D13
/CS
ODT
CKE
Address
BA
Command
ZQ
Rs4
DQ0
to DQ7
/CK
DM
/DQS
CK
ZQ
Rs4
DQ0
to DQ7
DQS
D4
/DQS
Rs1
/CK
8 Rs1
DQS
Rs1
/DQS4
CK
DM
DM2
D11
/DQS
/CS
ODT
CKE
Address
BA
Command
Rs1
D2
Rs4
/DQS
/CK
Rs1
DQS4
DQS
CK
DQS
/CS
ODT
CKE
Address
BA
Command
Rs1
/DQS2
Rs1
/RESET:SDRAMs (D0 to D17)
SCL
SCL
SA0
SA1
SA2
A0
V1
V4
D11
V3
V2
D0
D1
SDA
/EVENT
V5
D12
V4
D2
V6
V5
D3
D13
D17
V6
D8
V7
D14
V7
D4
V8
D15
D16
V9
V8
D5
V9
D6
D7
Address and Control lines
Data Sheet E1367E30 (Ver. 3.0)
9
Rs4
/CK
CK
SDA
U1
* D0 to D17: 1G bits DDR3 SDRAM
Address, BA: A0 to A13, BA0 to BA2
Command: /RAS, /CAS, /WE
U1: 256 bytes EEPROM
Rs1: 15Ω
Rs2: 39Ω
Rs3: 36Ω
Rs4: 240Ω
V3
D10
ZQ
/EVENT
Notes :
1. DQ wiring may be changed within a byte.
2. DQ, DQS, /DQS, ODT, DM, CKE, /CS relationships
must be maintained as shown.
V2
DQ0
to DQ7
A1
A2
SDRAMs (D0 to D17), SPD
D9
DM
Serial PD
SPD
SDRAMs (D0 to D17)
SDRAMs (D0 to D17)
SDRAMs (D0 to D17)
V1
ZQ
D17
/CS
ODT
CKE
Address
BA
Command
DQ0
to DQ7
Rs4
8 Rs1
/DQS
/CK
DM
DM8
CB0
to CB7
/CS
ODT
CKE
Address
BA
Command
ZQ
Rs4
DQ0
to DQ7
VTT
VSS
DM
VTT
/RESET
VTT
VDDSPD
VREFCA
VREFDQ
VDD
ZQ
D8
/DQS
Rs1
/CK
DQ0
to DQ7
DQS
DQS
Rs1
/DQS8
CK
8 Rs1
/CS
ODT
CKE
Address
BA
Command
DM
DM3
Rs4
Rs1
D12
/DQS
/CK
/DQS
/DQS3
DQS8
DQS
D3
CK
DQS
CK
Rs1
Rs1
DQ24
to DQ31
ZQ
D10
/DQS
/CK
/DQS
Rs1
DQS3
DQ0
to DQ7
DQS
D1
CK
DQS
/DQS1
DQ16
to DQ23
DM
DM
D6
/DQS
Rs1
Rs1
Rs1
DQS2
ZQ
ZQ
DQS
Rs1
/DQS6
CK
DQ0
to DQ7
/CS
ODT
CKE
Address
BA
Command
DQS1
8 Rs1
/CS
ODT
CKE
Address
BA
Command
DM
DM0
Rs4
Rs1
DQ0
to DQ7
D16
Rs1
DQS6
D9
/DQS
/CK
/DQS
CK
/DQS0
DQS
D0
/CS
ODT
CKE
Address
BA
Command
DQS
DM
8 Rs1
/DQS
CK
Rs1
Rs1
DQS
D7
/DQS
/CS
ODT
CKE
Address
BA
Command
DM7
Rs1
DQ0
to DQ7
DQS
Rs1
DQ56
to DQ63
VTT
Rs1
/DQS7
3
17
/CS
ODT
CKE
Address
BA
Command
DQS0
DQS7
/CS
ODT
CKE
Address
BA
Command
/CK1
CK1
/CS1
ODT1
CKE1
/CK0
CK0
Command
Address, BA
/CS0
ODT0
CKE0
Rs2
Rs2
Rs2
VTT
EBJ21EE8BAWA
Electrical Specifications
• All voltages are referenced to VSS (GND).
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Notes
Power supply voltage
VDD
−0.4 to +1.975
V
1, 3, 4
Input voltage
VIN
−0.4 to +1.975
V
1, 4
Output voltage
VOUT
−0.4 to +1.975
V
1, 4
Reference voltage
VREFCA
−0.4 to 0.6 × VDD
V
3, 4
Reference voltage for DQ
VREFDQ
−0.4 to 0.6 × VDDQ
V
3, 4
Storage temperature
Tstg
−55 to +100
°C
1, 2, 4
Power dissipation
PD
9
W
Short circuit output current
IOUT
50
mA
1, 4
Notes: 1. Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to
the device. This is a stress rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect reliability.
2. Storage temperature is the case surface temperature on the center/top side of the DRAM.
3. VDD and VDDQ must be within 300mV of each other at all times; and VREF must be not greater than
0.6 × VDDQ, When VDD and VDDQ are less than 500mV; VREF may be equal to or less than 300mV.
4. DDR3 SDRAM component specification.
Caution
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Operating Temperature Condition
Parameter
Symbol
Rating
Unit
Notes
Operating case temperature
TC
0 to +95
°C
1, 2, 3
Notes: 1. Operating temperature is the case surface temperature on the center/top side of the DRAM.
2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be
supported. During operation, the DRAM case temperature must be maintained between 0°C to +85°C
under all operating conditions.
3. Some applications require operation of the DRAM in the Extended Temperature Range between +85°C
and +95°C case temperature. Full specifications are guaranteed in this range, but the following additional
conditions apply:
a)
Refresh commands must be doubled in frequency, therefore reducing the refresh interval tREFI to
3.9µs. (This double refresh requirement may not apply for some devices.)
b)
If Self-refresh operation is required in the Extended Temperature Range, then it is mandatory to
either use the Manual Self-Refresh mode with Extended Temperature Range capability (MR2 bit
[A6, A7] = [0, 1]) or enable the optional Auto Self-Refresh mode (MR2 bit [A6, A7] = [1, 0]).
Data Sheet E1367E30 (Ver. 3.0)
10
EBJ21EE8BAWA
Recommended DC Operating Conditions (TC = 0°C to +85°C)
(DDR3 SDRAM Component Specification)
Parameter
Symbol
min.
typ.
max.
Unit
Notes
Supply voltage
VDD, VDDQ
1.425
1.5
1.575
V
1, 2, 3
VSS
0
0
0
V
1
3.6
VDDSPD
3.0
3.3
Input reference voltage
VREFCA (DC)
0.49 × VDDQ
0.50 × VDDQ 0.51 × VDDQ
V
1, 4, 5
Input reference voltage for DQ
VREFDQ (DC)
0.49 × VDDQ
0.50 × VDDQ 0.51 × VDDQ
V
1, 4, 5
Termination voltage
VTT
VDDQ/2 – TBD
TBD
V
Notes: 1.
2.
3.
4.
VDDQ/2 + TBD
V
DDR3 SDRAM component specification.
Under all conditions VDDQ must be less than or equal to VDD.
VDDQ tracks with VDD. AC parameters are measured with VDD and VDDQ tied together.
The AC peak noise on VREF may not allow VREF to deviate from VREF(DC) by more than ±1% VDD (for
reference: approx ±15 mV).
5. For reference: approx. VDD/2 ±15 mV.
Data Sheet E1367E30 (Ver. 3.0)
11
EBJ21EE8BAWA
DC Characteristics 1 (TC = 0°C to +85°C, VDD = 1.5V ± 0.075V, VSS = 0V)
Parameter
Symbol
Data rate (Mbps)
max.
Unit
Operating current
(ACT-PRE)
(Another rank is in IDD2PF)
IDD0
1333
1066
800
1440
1305
1170
mA
Operating current
(ACT-PRE)
(Another rank is in IDD3N)
IDD0
1333
1066
800
1845
1665
1485
mA
Operating current
(ACT-READ-PRE)
(Another rank is in IDD2PF)
IDD1
1333
1066
800
1620
1440
1305
mA
Operating current
(ACT-READ-PRE)
(Another rank is in IDD3N)
IDD1
1333
1066
800
2025
1800
1620
mA
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
1333
1066
800
720
630
540
252
234
216
1260
1080
900
1350
1170
990
810
720
630
1530
1350
1170
2340
1935
1530
2745
2295
1845
2520
2115
1710
2925
2475
2025
3375
3150
2925
3780
3510
3240
3465
2880
2610
3870
3240
2925
IDD2PF
Precharge power-down standby current
IDD2PS
Precharge quiet standby current
IDD2Q
Precharge standby current
IDD2N
Active power-down current
(Always fast exit)
IDD3P
Active standby current
IDD3N
Operating current
(Burst read operating)
(Another rank is in IDD2PF)
Operating current
(Burst read operating)
(Another rank is in IDD3N)
Operating current
(Burst write operating)
(Another rank is in IDD2PF)
Operating current
(Burst write operating)
(Another rank is in IDD3N)
IDD4R
IDD4R
IDD4W
IDD4W
Burst refresh current
(Another rank is in IDD2PF)
IDD5B
Burst refresh current
(Another rank is in IDD3N)
IDD5B
All bank interleave read current
(Another rank is in IDD2PF)
IDD7R
All bank interleave read current
(Another rank is in IDD3N)
IDD7R
Data Sheet E1367E30 (Ver. 3.0)
12
Notes
mA
Fast PD Exit
mA
Slow PD Exit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
EBJ21EE8BAWA
Self-Refresh Current (TC = 0°C to +85°C, VDD = 1.5V ± 0.075V)
Parameter
Self-refresh current
normal temperature range
Self-refresh current
extended temperature range
Auto self-refresh current
Symbol
max.
Unit
IDD6
180
mA
IDD6ET
324
mA
IDD6TC
324
mA
Notes
AC Timing for IDD Test Conditions
For purposes of IDD testing, the following parameters are to be utilized.
Parameter
DDR3-1333
DDR3-1066
DDR3-800
9-9-9
7-7-7
6-6-6
Unit
CL (IDD)
9
7
6
tCK
tCK min.(IDD)
1.5
1.875
2.5
ns
tRCD min. (IDD)
13.5
13.13
15
ns
tRC min. (IDD)
49.5
50.63
52.5
ns
tRAS min.(IDD)
36
37.5
37.5
ns
tRP min. (IDD)
13.5
13.13
15
ns
tFAW (IDD)
30
37.5
40
ns
tRRD (IDD)
6.0
7.5
10
ns
tRFC (IDD)
110
110
110
ns
DC Characteristics 2 (TC = 0°C to +85°C, VDD, VDDQ = 1.5V ± 0.075V)
(DDR3 SDRAM Component Specification)
Parameter
Symbol
Value
Input leakage current
ILI
2
µA
VDD ≥ VIN ≥ VSS
Output leakage current
ILO
5
µA
DDQ ≥ VOUT ≥ VSS
Data Sheet E1367E30 (Ver. 3.0)
13
Unit
Notes
EBJ21EE8BAWA
Pin Functions
CK, /CK (input pin)
CK and /CK are differential clock inputs. All address and control input signals are sampled on the crossing of the
positive edge of CK and negative edge of /CK. Output (read) data is referenced to the crossings of CK and /CK
(both directions of crossing).
/CS (input pin)
All commands are masked when /CS is registered high. /CS provides for external rank selection on systems with
multiple ranks. /CS is considered part of the command code.
/RAS, /CAS, and /WE (input pins)
/RAS, /CAS and /WE (along with /CS) define the command being entered.
A0 to A13 (input pins)
Provided the row address for active commands and the column address for read/write commands to select one
location out of the memory array in the respective bank. (A10(AP) and A12(/BC) have additional functions, see
below) The address inputs also provide the op-code during mode register set commands.
[Address Pins Table]
Address (A0 to A13)
Row address (RA)
Column address (CA)
AX0 to AX13
AY0 to AY9
Notes
A10(AP) (input pin)
A10 is sampled during read/write commands to determine whether auto-precharge should be performed to the
accessed bank after the read/write operation. (high: auto-precharge; low: no auto-precharge)
A10 is sampled during a precharge command to determine whether the precharge applies to one bank (A10 = low)
or all banks (A10 = high). If only one bank is to be precharged, the bank is selected by bank addresses (BA).
A12 (/BC) (input pin)
A12 is sampled during read and write commands to determine if burst chop (on-the-fly) will be performed.
(A12 = high: no burst chop, A12 = low: burst chopped.)
BA0 to BA2 (input pins)
BA0, BA1 and BA2 define to which bank an active, read, write or precharge command is being applied. BA0 and
BA1 also determine if a mode register is to be accessed during a MRS cycle.
[Bank Select Signal Table]
BA0
BA1
BA2
Bank 0
L
L
L
Bank 1
H
L
L
Bank 2
L
H
L
Bank 3
H
H
L
Bank 4
L
L
H
Bank 5
H
L
H
Bank 6
L
H
H
Bank 7
H
H
H
Remark: H: VIH. L: VIL.
Data Sheet E1367E30 (Ver. 3.0)
14
EBJ21EE8BAWA
CKE (input pin)
CKE high activates, and CKE low deactivates, internal clock signals and device input buffers and output drivers.
Taking CKE low provides precharge power-down and self-refresh operation (all banks idle), or active power-down
(row active in any bank). CKE is asynchronous for self-refresh exit. After VREF has become stable during the
power-on and initialization sequence, it must be maintained for proper operation of the CKE receiver. For proper
self-refresh entry and exit, VREF must be maintained to this input. CKE must be maintained high throughout read
and write accesses. Input buffers, excluding CK, /CK, ODT and CKE are disabled during power-down. Input
buffers, excluding CKE, are disabled during self-refresh.
DQ and CB (input and output pins)
Bi-directional data bus.
DQS and /DQS (input and output pin)
Output with read data, input with write data. Edge-aligned with read data, centered in write data.
The data strobe DQS is paired with differential signals /DQS to provide differential pair signaling to the system during
READs and WRITEs.
ODT (input pins)
ODT (registered high) enables termination resistance internal to the DDR3 SDRAM. When enabled, ODT is only
applied to each DQ, DQS, /DQS, DM. The ODT pin will be ignored if the mode register (MR1) is programmed to
disable ODT.
DM (input pins)
DM is the reference signal of the data input mask function. DMs are sampled at the cross point of DQS and /DQS.
VDD (power supply pins)
1.5V is applied. (VDD is for the internal circuit.)
VDDSPD (power supply pin)
3.3V is applied (For serial EEPROM).
VSS (power supply pin)
Ground is connected.
VTT (power supply pin)
I/O termination supply for SDRAM.
VREFDQ (power supply)
Reference voltage for DQ.
VREFCA (power supply)
Reference voltage for CA.
/RESET (input pin)
/RESET is negative active signal (active low) and is referred to GND.
/EVENT (output pin)
Temperature alert output.
Detailed Operation Part, Electrical Characteristics and Timing Waveforms
Refer to the EDJ1108BABG, EDJ1116BABG datasheet (E1248E).
Data Sheet E1367E30 (Ver. 3.0)
15
EBJ21EE8BAWA
Physical Outline
Unit: mm
Front side
4.00 max
0.5 min
(DATUM -A-)
4.00 min
Component area
(Front)
1
120
B
A
47.00
1.27 ± 0.10
71.00
133.35
Component area
(Back)
2.80 min
C
±
±
± 30.00
240
17.30
121
9.50
Back side
± ±
ECA-TS2-0192-03
Data Sheet E1367E30 (Ver. 3.0)
16
EBJ21EE8BAWA
CAUTION FOR HANDLING MEMORY MODULES
When handling or inserting memory modules, be sure not to touch any components on the modules, such as
the memory ICs, chip capacitors and chip resistors. It is necessary to avoid undue mechanical stress on
these components to prevent damaging them.
In particular, do not push module cover or drop the modules in order to protect from mechanical defects,
which would be electrical defects.
When re-packing memory modules, be sure the modules are not touching each other.
Modules in contact with other modules may cause excessive mechanical stress, which may damage the
modules.
MDE0202
NOTES FOR CMOS DEVICES
1
PRECAUTION AGAINST ESD FOR MOS DEVICES
Exposing the MOS devices to a strong electric field can cause destruction of the gate
oxide and ultimately degrade the MOS devices operation. Steps must be taken to stop
generation of static electricity as much as possible, and quickly dissipate it, when once
it has occurred. Environmental control must be adequate. When it is dry, humidifier
should be used. It is recommended to avoid using insulators that easily build static
electricity. MOS devices must be stored and transported in an anti-static container,
static shielding bag or conductive material. All test and measurement tools including
work bench and floor should be grounded. The operator should be grounded using
wrist strap. MOS devices must not be touched with bare hands. Similar precautions
need to be taken for PW boards with semiconductor MOS devices on it.
2
HANDLING OF UNUSED INPUT PINS FOR CMOS DEVICES
No connection for CMOS devices input pins can be a cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input level may be
generated due to noise, etc., hence causing malfunction. CMOS devices behave
differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed
high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected
to VDD or GND with a resistor, if it is considered to have a possibility of being an output
pin. The unused pins must be handled in accordance with the related specifications.
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES
Power-on does not necessarily define initial status of MOS devices. Production process
of MOS does not define the initial operation status of the device. Immediately after the
power source is turned ON, the MOS devices with reset function have not yet been
initialized. Hence, power-on does not guarantee output pin levels, I/O settings or
contents of registers. MOS devices are not initialized until the reset signal is received.
Reset operation must be executed immediately after power-on for MOS devices having
reset function.
CME0107
Data Sheet E1367E30 (Ver. 3.0)
17
EBJ21EE8BAWA
The information in this document is subject to change without notice. Before using this document, confirm that this is the latest version.
No part of this document may be copied or reproduced in any form or by any means without the prior
written consent of Elpida Memory, Inc.
Elpida Memory, Inc. does not assume any liability for infringement of any intellectual property rights
(including but not limited to patents, copyrights, and circuit layout licenses) of Elpida Memory, Inc. or
third parties by or arising from the use of the products or information listed in this document. No license,
express, implied or otherwise, is granted under any patents, copyrights or other intellectual property
rights of Elpida Memory, Inc. or others.
Descriptions of circuits, software and other related information in this document are provided for
illustrative purposes in semiconductor product operation and application examples. The incorporation of
these circuits, software and information in the design of the customer's equipment shall be done under
the full responsibility of the customer. Elpida Memory, Inc. assumes no responsibility for any losses
incurred by customers or third parties arising from the use of these circuits, software and information.
[Product applications]
Be aware that this product is for use in typical electronic equipment for general-purpose applications.
Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability.
However, users are instructed to contact Elpida Memory's sales office before using the product in
aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment,
medical equipment for life support, or other such application in which especially high quality and
reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury.
[Product usage]
Design your application so that the product is used within the ranges and conditions guaranteed by
Elpida Memory, Inc., including the maximum ratings, operating supply voltage range, heat radiation
characteristics, installation conditions and other related characteristics. Elpida Memory, Inc. bears no
responsibility for failure or damage when the product is used beyond the guaranteed ranges and
conditions. Even within the guaranteed ranges and conditions, consider normally foreseeable failure
rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so
that the equipment incorporating Elpida Memory, Inc. products does not cause bodily injury, fire or other
consequential damage due to the operation of the Elpida Memory, Inc. product.
[Usage environment]
Usage in environments with special characteristics as listed below was not considered in the design.
Accordingly, our company assumes no responsibility for loss of a customer or a third party when used in
environments with the special characteristics listed below.
Example:
1) Usage in liquids, including water, oils, chemicals and organic solvents.
2) Usage in exposure to direct sunlight or the outdoors, or in dusty places.
3) Usage involving exposure to significant amounts of corrosive gas, including sea air, CL 2 , H 2 S, NH 3 ,
SO 2 , and NO x .
4) Usage in environments with static electricity, or strong electromagnetic waves or radiation.
5) Usage in places where dew forms.
6) Usage in environments with mechanical vibration, impact, or stress.
7) Usage near heating elements, igniters, or flammable items.
If you export the products or technology described in this document that are controlled by the Foreign
Exchange and Foreign Trade Law of Japan, you must follow the necessary procedures in accordance
with the relevant laws and regulations of Japan. Also, if you export products/technology controlled by
U.S. export control regulations, or another country's export control laws or regulations, you must follow
the necessary procedures in accordance with such laws or regulations.
If these products/technology are sold, leased, or transferred to a third party, or a third party is granted
license to use these products, that third party must be made aware that they are responsible for
compliance with the relevant laws and regulations.
M01E0706
Data Sheet E1367E30 (Ver. 3.0)
18
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