FAIRCHILD 74F544MSA

Revised August 1999
74F544
Octal Registered Transceiver
General Description
Features
The 74F544 octal transceiver contains two sets of D-type
latches for temporary storage of data flowing in either
direction. Separate Latch Enable and Output Enable inputs
are provided for each register to permit independent control of inputting and outputting in either direction of data
flow. The A outputs are guaranteed to sink 24 mA while the
B outputs are rated for 64 mA. The 74F544 inverts data in
both directions.
■ 8-bit octal transceiver
■ Back-to-back registers for storage
■ Separate controls for data flow in each direction
■ A outputs sink 24 mA, B outputs sink 64 mA
Ordering Code:
Order Number
74F544SC
Package Number
M24B
Package Description
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
74F544MSA
MSA24
24-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide
74F544SPC
N24C
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
© 1999 Fairchild Semiconductor Corporation
DS009555
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74F544 Octal Registered Transceiver
April 1988
74F544
Unit Loading/Fan Out
Pin Names
U.L.
Input IIH/IIL
Description
HIGH/LOW
Output IOH/IOL
OEAB
A-to-B Output Enable Input (Active LOW)
1.0/1.0
20 µA/−0.6 mA
OEBA
B-to-A Output Enable Input (Active LOW)
1.0/1.0
20 µA/−0.6 mA
CEAB
A-to-B Enable Input (Active LOW)
1.0/2.0
20 µA/−1.2 mA
CEBA
B-to-A Enable Input (Active LOW)
1.0/2.0
20 µA/−1.2 mA
LEAB
A-to-B Latch Enable Input (Active LOW)
1.0/1.0
20 µA/−0.6 mA
LEBA
B-to-A Latch Enable Input (Active LOW)
1.0/1.0
20 µA/−0.6 mA
A0–A7
A-to-B Data Inputs or
B-to-A 3-STATE Outputs
B0–B7
70 µA/−650 µA
−3 mA/24 mA (20 mA)
3.5/1.083
70 µA/−650 µA
600/106.6(80)
−12 mA/64 mA (48 mA)
B-to-A Data Inputs or
A-to-B 3-STATE Outputs
3.5/1.083
150/40(33.3)
Data I/O Control Table
Functional Description
The 74F544 contains two sets of eight D-type latches, with
separate input and output controls for each set. For data
flow from A to B, for example, the A-to-B Enable (CEAB)
input must be LOW in order to enter data from A0–A7 or
take data from B0–B7, as indicated in the Data I/O Control
Table. With CEAB LOW, a LOW signal on the A-to-B Latch
Enable (LEAB) input makes the A-to-B latches transparent;
a subsequent LOW-to-HIGH transition of the LEAB signal
puts the A latches in the storage mode and their outputs no
longer change with the A inputs. With CEAB and OEAB
both LOW, the 3-STATE B output buffers are active and
reflect the data present at the output of the A latches. Control of data flow from B to A is similar, but using the CEBA,
LEBA and OEBA inputs.
Inputs
CEAB
LEAB
OEAB
Latch
Status
Output
Buffers
H
X
X
Latched
High Z
X
H
X
Latched
—
L
L
X
Transparent
—
X
X
H
—
High Z
L
X
L
—
Driving
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Note: A-to-B data flow shown; B-to-A flow control is the same, except using
CEBA, LEBA and OEBA
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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Recommended Operating
Conditions
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Free Air Ambient Temperature
Junction Temperature under Bias
−55°C to +150°C
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
−0.5V to +7.0V
VCC Pin Potential to Ground Pin
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Standard Output
−0.5V to VCC
3-STATE Output
−0.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
Current Applied to Output
twice the rated IOL (mA)
in LOW State (Max)
DC Electrical Characteristics
Symbol
Parameter
Min
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VCD
Input Clamp Diode Voltage
VOH
Output HIGH
10% VCC
2.5
Voltage
10% VCC
2.4
10% VCC
2.0
5% VCC
2.7
5% VCC
2.7
VOL
IIH
IBVI
Typ
Recognized as a LOW Signal
−1.2
V
Voltage
10% VCC
0.55
Input HIGH Current
Input HIGH Current
Output HIGH
VIN = 2.7V (except An, Bn)
7.0
µA
Max
VIN = 7.0V (except An, Bn)
0.5
mA
Max
VIN = 5.5V (An, Bn)
250
µA
Max
VOUT = VCC (An, Bn)
V
0.0
µA
0.0
mA
Max
70
µA
Max
VOUT = 2.7V (An, Bn)
−650
µA
Max
VOUT = 0.5V (An, Bn)
mA
Max
500
µA
0.0V
VOUT = 5.25V (An, Bn)
4.75
Output Leakage
3.75
−0.6
Input LOW Current
−1.2
Output Short-Circuit Current
IOL = 24 mA (An)
Max
5.0
Output Leakage Current
IOH = −15 mA (Bn)
µA
Current
IOS
Min
Min
20.0
IIL + IOZL
(except An, Bn)
V
Input HIGH
Output Leakage Current
IIN = −18 mA,
IOH = −3 mA (An, Bn)
0.5
IIH + IOZH
Min
IOH = −1 mA (An)
Circuit Current
IIL
V
10% VCC
Test
IOD
0.8
Output LOW
Input Leakage
Conditions
Recognized as a HIGH Signal
IOH = −3 mA (An, Bn)
Leakage Current
VID
VCC
V
V
Breakdown (I/O)
ICEX
Units
IOH = −1 mA (An)
Breakdown Test
IBVIT
Max
2.0
−60
−150
−100
−225
IOL = 64 mA (Bn)
IID = 1.9 µA
All Other Pins Grounded
VIOD = 150 mV
All Other Pins Grounded
VIN = 0.5V (OEAB, OEBA)
VIN = 0.5V (CEAB, CEBA)
VOUT = 0V (An)
VOUT = 0V (Bn)
IZZ
Bus Drainage Test
ICCH
Power Supply Current
70
105
mA
Max
VO = HIGH
ICCL
Power Supply Current
85
130
mA
Max
VO = LOW
ICCZ
Power Supply Current
83
125
mA
Max
VO = HIGH Z
3
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74F544
Absolute Maximum Ratings(Note 1)
74F544
AC Electrical Characteristics
Symbol
Parameter
TA = +25°C
TA = −55°C to +125°C
TA = 0°C to +70°C
VCC = +5.0V
VCC = +5.0V
VCC = +5.0V
CL = 50 pF
CL = 50 pF
CL = 50 pF
Min
Typ
Max
Min
Max
Min
Max
tPLH
Propagation Delay
3.0
7.0
9.5
3.0
12.0
3.0
10.5
tPHL
Transparent Mode
3.0
5.0
6.5
2.5
8.5
3.0
7.5
Units
ns
An to Bn or Bnto An
tPLH
Propagation Delay
6.0
10.0
13.0
6.0
18.0
6.0
14.5
tPHL
LEBA to An
4.0
7.0
9.5
4.0
11.5
4.0
10.5
tPLH
Propagation Delay
6.0
10.0
13.0
6.0
18.0
6.0
14.5
tPHL
LEAB to Bn
4.0
7.0
9.5
4.0
11.5
4.0
10.5
tPZH
Output Enable Time
3.0
7.0
9.0
3.0
11.0
3.0
10.0
tPZL
OEBA or OEAB to An or Bn
4.0
7.5
10.5
4.0
13.0
4.0
12.0
tPHZ
Output Disable Time
1.0
6.0
8.0
2.0
10.0
1.0
9.0
tPLZ
OEBA or OEAB to An or Bn
2.5
5.5
10.5
2.0
9.5
2.5
11.5
CEBA or CEAB to An or Bn
ns
ns
ns
CEBA or CEAB to An or Bn
AC Operating Requirements
Symbol
Parameter
TA = +25°C
TA = −55°C to +125°C
VCC = +5.0V
VCC = +5.0V
Min
Max
Min
Max
TA = 0°C to +70°C
VCC = +5.0V
Min
tS(H)
Setup Time, HIGH or LOW
3.0
3.0
3.0
tS(L)
An or Bn to LEBA or LEAB
3.0
3.0
3.0
tH(H)
Hold Time, HIGH or LOW
3.0
3.0
3.0
tH(L)
An or Bn to LEBA or LEAB
3.0
3.0
3.0
tW(L)
Latch Enable, B to A
6.0
9.0
7.5
Pulse Width, LOW
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Units
Max
ns
ns
74F544
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M24B
24-Lead Shrink Small Outline Package (SSOP), EIAJ TYPE II, 5.3mm Wide
Package Number MSA24
5
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74F544 Octal Registered Transceiver
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300 Wide
Package Number N24C
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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