AMD AM29LV800DB

Am29LV800D
Data Sheet
For new designs, S29AL008D supersedes Am29LV800D and is the factory-recommended migration
path. Please refer to the S29AL008D Data Sheet for specifications and ordering information.
July 2003
The following document specifies Spansion memory products that are now offered by both Advanced
Micro Devices and Fujitsu. Although the document is marked with the name of the company that originally developed the specification, these products will be offered to customers of both AMD and
Fujitsu.
Continuity of Specifications
There is no change to this datasheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal datasheet improvement and are noted in the
document revision summary, where supported. Future routine revisions will occur when appropriate,
and changes will be noted in a revision summary.
Continuity of Ordering Part Numbers
AMD and Fujitsu continue to support existing part numbers beginning with “Am” and “MBM”. To order
these products, please use only the Ordering Part Numbers listed in this document.
For More Information
Please contact your local AMD or Fujitsu sales office for additional information about Spansion
memory solutions.
Publication Number Am29LV800D_00 Revision A Amendment 4 Issue Date January 21, 2005
THIS PAGE LEFT INTENTIONALLY BLANK.
PRELIMINARY
Am29LV800D
8 Megabit (1 M x 8-Bit/512 K x 16-Bit)
CMOS 3.0 Volt-only Boot Sector Flash Memory
For new designs, S29AL008D supersedes Am29LV800D and is the factory-recommended migration
path. Please refer to the S29AL008D Data Sheet for specifications and ordering information.
Distinctive Characteristics
■ Single power supply operation
— 2.7 to 3.6 volt read and write operations
for battery-powered applications
■ Manufactured on 0.23 µm process
technology
— Compatible with 0.32 µm Am29LV800
device
■ High performance
— Access times as fast as 70 ns
■ Ultra low power consumption (typical
values at 5 MHz)
— 200 nA Automatic Sleep mode current
— 200 nA standby mode current
— 7 mA read current
— 15 mA program/erase current
■ Flexible sector architecture
— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and
fifteen 64 Kbyte sectors (byte mode)
— One 8 Kword, two 4 Kword, one 16 Kword, and
fifteen 32 Kword sectors (word mode)
— Supports full chip erase
— Sector Protection features:
A hardware method of locking a sector to prevent
any program or erase operations within that
sector
Sectors can be locked in-system or via
programming equipment
Temporary Sector Unprotect feature allows code
changes in previously locked sectors
■ Unlock Bypass Program Command
— Reduces overall programming time when
issuing multiple program command
sequences
■ Top or bottom boot block configurations
available
■ Embedded Algorithms
— Embedded Erase algorithm automatically
preprograms and erases the entire chip or any
combination of designated sectors
— Embedded Program algorithm
automatically writes and verifies data at
specified addresses
■ Minimum 1 million write cycle guarantee
per sector
■ 20-year data retention at 125°C
— Reliable operation for the life of the system
■ Package option
— 48-ball FBGA
— 48-pin TSOP
— 44-pin SO
■ Compatibility with JEDEC standards
— Pinout and software compatible with singlepower supply Flash
— Superior inadvertent write protection
■ Data# Polling and toggle bits
— Provides a software method of detecting
program or erase operation completion
■ Ready/Busy# pin (RY/BY#)
— Provides a hardware method of detecting
program or erase cycle completion
■ Erase Suspend/Erase Resume
— Suspends an erase operation to read data from,
or program data to, a sector that is not being
erased, then resumes the erase operation
■ Hardware reset pin (RESET#)
— Hardware method to reset the device to
reading array data
This document contains information on a product under development at FASL LLC. The information is intended to
help you evaluate this product. FASL LLC reserves the right to change or discontinue work on this proposed product
without notice.
Publication Am29LV800D_00 Rev. A Amend. 4
Issue Date: January 21, 2005
P R E L I M I N A R Y
General Description
The Am29LV800D is an 8 Mbit, 3.0 volt-only
Flash memory organized as 1,048,576 bytes or
524,288 words. The device is offered in 48-ball
FBGA, 44-pin SO, and 48-pin TSOP packages.
For more information, refer to publication
number 21536. The word-wide data (x16)
appears on DQ15–DQ0; the byte-wide (x8) data
appears on DQ7–DQ0. This device requires only
a single, 3.0 volt VCC supply to perform read,
program, and erase operations. A standard
EPROM programmer can also be used to program
and erase the device.
This device is manufactured using AMD’s 0.23
µm process technology, and offers all the features and benefits of the Am29LV800B, which
was manufactured using 0.32 µm process technology.
The standard device offers access times of 70,
90, and 120 ns, allowing high speed microprocessors to operate without wait states. To eliminate bus contention the device has separate
chip enable (CE#), write enable (WE#) and
output enable (OE#) controls.
The device requires only a single 3.0 volt
power supply for both read and write functions. Internally generated and regulated voltages are provided for the program and erase
operations.
The device is entirely command set compatible
with the JEDEC single-power-supply Flash
stan dard. C om mands are written to the
command register using standard microprocessor write timings. Register contents serve as
input to an internal state-machine that controls
the erase and programming circuitry. Write
cycles also internally latch addresses and data
needed for the programming and erase operations. Reading data out of the device is similar
to reading from other Flash or EPROM devices.
Device programming occurs by executing the
program command sequence. This initiates the
Embedded Program algorithm—an internal
algorithm that automatically times the program
pulse widths and verifies proper cell margin. The
Unlock Bypass mode facilitates faster programming times by requiring only two write
cycles to program data instead of four.
Device erasure occurs by executing the erase
command sequence. This initiates the
Embedded Erase algorithm—an internal algorithm that automatically preprograms the array
(if it is not already programmed) before exe-
2
cuting the erase operation. During erase, the
device automatically times the erase pulse
widths and verifies proper cell margin.
The host system can detect whether a program
or erase operation is complete by observing the
RY/BY# pin, or by reading the DQ7 (Data#
Polling) and DQ6 (toggle) status bits. After a
program or erase cycle has been completed, the
device is ready to read array data or accept
another command.
The sector erase architecture allows memory
sectors to be erased and reprogrammed without
affecting the data contents of other sectors. The
device is fully erased when shipped from the
factory.
Hardware data protection measures include
a low VCC detector that automatically inhibits
write operations during power transitions. The
hardware sector protection feature disables
both program and erase operations in any combination of the sectors of memory. This can be
achieved in-system or via programming equipment.
The Erase Suspend feature enables the user to
put erase on hold for any period of time to read
data from, or program data to, any sector that
is not selected for erasure. True background
erase can thus be achieved.
The hardware RESET# pin terminates any
operation in progress and resets the internal
state machine to reading array data. The
RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the
device, enabling the system microprocessor to
read the boot-up firmware from the Flash
memory.
The device offers two power-saving features.
When addresses have been stable for a specified
amount of time, the device enters the automatic sleep mode. The system can also place
the device into the standby mode. Power consumption is greatly reduced in both these
modes.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce
the highest levels of quality, reliability and cost
effectiveness. The device electrically erases
all bi ts wi thin a sec to r simultaneously via
Fowler-Nordheim tunneling. The data is programmed using hot electron injection.
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Table Of Contents
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 4
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . 5
Special Handling Instructions for FBGA Package .............. 7
Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 8
Standard Products ......................................................................8
Valid Combinations . . . . . . . . . . . . . . . . . . . . . . . . . 9
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . . 10
Table 1. Am29LV800D Device Bus Operations .10
Word/Byte Configuration ...................................................... 10
Requirements for Reading Array Data ............................... 10
Writing Commands/Command Sequences .........................11
Program and Erase Operation Status ...................................11
Standby Mode ..............................................................................11
Automatic Sleep Mode ..............................................................11
RESET#: Hardware Reset Pin .................................................11
Output Disable Mode ...............................................................12
Table 2. Am29LV800DT Top Boot Block
Sector Addresses ........................................12
Table 3. Am29LV800DB Bottom Boot Block
Sector Addresses ........................................13
Autoselect Mode ........................................................................13
Table 4. Am29LV800D Autoselect Codes
(High Voltage Method) ................................14
Sector Protection/Unprotection .......................................... 14
Temporary Sector Unprotect ............................................... 14
Figure 1. Temporary Sector Unprotect
Operation .................................................. 15
Figure 2. In-System Sector Protect/
Sector Unprotect Algorithms ........................ 16
Hardware Data Protection .....................................................17
Command Definitions . . . . . . . . . . . . . . . . . . . . . . 17
Reading Array Data ...................................................................17
Reset Command .........................................................................17
Autoselect Command Sequence .......................................... 18
Word/Byte Program Command Sequence ....................... 18
Figure 1. Program Operation ........................ 19
Chip Erase Command Sequence .......................................... 19
Sector Erase Command Sequence ...................................... 19
Erase Suspend/Erase Resume Commands ....................... 20
Figure 1. Erase Operation ............................ 21
Table 5. Am29LV800D Command Definitions ..21
Write Operation Status . . . . . . . . . . . . . . . . . . . . 22
DQ7: Data# Polling ..................................................................22
Figure 1. Data# Polling Algorithm ................. 23
RY/BY#: Ready/Busy# .............................................................23
DQ6: Toggle Bit I ......................................................................24
DQ2: Toggle Bit II .....................................................................24
Reading Toggle Bits DQ6/DQ2 ............................................24
DQ5: Exceeded Timing Limits ..............................................25
DQ3: Sector Erase Timer .......................................................25
Figure 1. Toggle Bit Algorithm ...................... 25
Table 6. Write Operation Status ....................26
January 21, 2005 Am29LV800D_00_A4_E
Absolute Maximum Ratings . . . . . . . . . . . . . . . . 27
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 27
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . .28
CMOS Compatible .................................................................. 28
Figure 1. ICC1 Current vs. Time (Showing Active
and Automatic Sleep Currents) .................... 29
Figure 1. Typical ICC1 vs. Frequency ............. 29
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . .30
Figure 1. Test Setup................................... 30
Table 7. Test Specifications ........................................30
Key to Switching Waveforms. . . . . . . . . . . . . . . . 30
Figure 1. Input Waveforms and
Measurement Levels................................... 30
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 31
Read Operations ........................................................................31
Figure 1. Read Operations Timings ............... 31
Hardware Reset (RESET#) ....................................................32
Figure 1. RESET# Timings........................... 32
Word/Byte Configuration (BYTE#) ..................................33
Figure 1. BYTE# Timings for Read
Operations ................................................ 34
Figure 1. BYTE# Timings for Write
Operations ................................................ 34
Erase/Program Operations ....................................................35
Figure 1. Program Operation Timings............
Figure 1. Chip/Sector Erase Operation
Timings ....................................................
Figure 1. Data# Polling Timings (During
Embedded Algorithms) ...............................
Figure 1. Toggle Bit Timings (During
Embedded Algorithms) ...............................
Figure 1. DQ2 vs. DQ6 ...............................
36
37
38
38
39
Temporary Sector Unprotect ...............................................39
Figure 1. Temporary Sector Unprotect
Timing Diagram ......................................... 39
Figure 1. Sector Protect/Unprotect
Timing Diagram ......................................... 40
Alternate CE# Controlled
Erase/Program Operations .................................................... 41
Figure 1. Alternate CE# Controlled Write
Operation Timings...................................... 42
Erase and Programming Performance . . . . . . . . . 43
Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 43
TSOP and SO Pin Capacitance . . . . . . . . . . . . . . 43
Data Retention . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Physical Dimensions* . . . . . . . . . . . . . . . . . . . . . . .44
TS 048—48-Pin Standard TSOP ........................................ 44
TSR048—48-Pin Reverse TSOP .........................................45
FBB 048—48-Ball Fine-Pitch Ball Grid Array
(FBGA) 6 x 9 mm ................................................................... 46
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . . 47
VBK 048 - 48 Ball Fine-Pitch Ball Grid Array
(FBGA) 6.15 x 8.15 mm .............................................................47
SO 044—44-Pin Small Outline Package .......................... 48
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . .49
Am29LV800D
3
P R E L I M I N A R Y
Product Selector Guide
Am29LV800D
Family Part Number
Speed Options
Full Voltage Range: VCC = 2.7–3.6 V
-70
-90
-120
Max access time, ns (tACC)
70
90
120
Max CE# access time, ns (tCE)
70
90
120
Max OE# access time, ns (tOE)
30
35
50
Note: See “AC Characteristics” for full specifications.
Block Diagram
VCC
DQ0–DQ15 (A-1)
RY/BY#
Sector Switches
VSS
Erase Voltage
Generator
RESET#
WE#
BYTE#
Input/Output
Buffers
State
Control
Command
Register
PGM Voltage
Generator
Chip Enable
Output Enable
CE#
OE#
VCC Detector
A0–
4
Timer
Address Latch
STB
Am29LV800D
STB
Data
Y-Decoder
Y-Gating
X-Decoder
Cell Matrix
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Connection Diagrams
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE#
RESET#
NC
NC
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
A16
BYTE#
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
Standard TSOP
Reverse TSOP
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
A16
BYTE#
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE#
RESET#
NC
NC
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
Am29LV800D_
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
5
P R E L I M I N A R Y
Connection Diagrams
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE#
VSS
OE#
DQ0
DQ8
DQ1
DQ9
DQ2
DQ10
DQ3
DQ11
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
SO
RESET#
WE#
A8
A9
A10
A11
A12
A13
A14
A15
A16
BYTE#
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
FBGA
Top View, Balls Facing Down
6
A6
B6
C6
D6
E6
F6
G6
A13
A12
A14
A15
A16
A5
B5
C5
D5
E5
F5
G5
H5
A9
A8
A10
A11
DQ7
DQ14
DQ13
DQ6
BYTE# DQ15/A-1
H6
VSS
A4
B4
C4
D4
E4
F4
G4
H4
WE#
RESET#
NC
NC
DQ5
DQ12
VCC
DQ4
A3
B3
C3
D3
E3
F3
G3
H3
RY/BY#
NC
A18
NC
DQ2
DQ10
DQ11
DQ3
A2
B2
C2
D2
E2
F2
G2
H2
A7
A17
A6
A5
DQ0
DQ8
DQ9
DQ1
A1
B1
C1
D1
E1
F1
G1
H1
A3
A4
A2
A1
A0
CE#
OE#
VSS
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Special Handling Instructions for FBGA
Package
Special handling is required for Flash Memory
products in FBGA packages.
Flash memory devices in FBGA packages may
be damaged if exposed to ultrasonic cleaning
methods. The package and/or data integrity
may be compromised if the package body is
exposed to temperatures above 150°C for prolonged periods of time.
VCC
speed
tolerances)
options and voltage supply
VSS
= Device ground
NC
= Pin not connected internally
Logic Symbol
19
Pin Configuration
A0–A18
= 3.0 volt-only single power supply
(see Product Selector Guide for
A0–A18
= 19 addresses
DQ0–DQ15
(A-1)
DQ0–DQ14= 15 data inputs/outputs
DQ15/A-1 = DQ15 (data input/output, word
CE#
mode),
OE#
A-1 (LSB address input, byte
WE#
mode)
RESET
BYTE#
BYTE#
= Selects 8-bit or 16-bit mode
CE#
= Chip enable
OE#
= Output enable
WE#
= Write enable
RESET#
= Hardware reset pin, active low
RY/BY#
= Ready/Busy# output
January 21, 2005 Am29LV800D_00_A4_E
16 or 8
Am29LV800D
RY/BY#
7
P R E L I M I N A R Y
Ordering Information
Standard Products
AMD standard products are available in several packages and operating ranges. The order number
(Valid Combination) is formed by a combination of the elements below.
Am29LV800D
T
-70
E
C
TEMPERATURE RANGE
C
= Commercial (0°C to +70°C)
D
= Commercial (0°C to +70°C) with Pb-Free Package
I
= Industrial (–40°C to +85°C)
F
= Industrial (–40°C to +85°C) with Pb-Free Package
PACKAGE TYPE
E
= 48-Pin Thin Small Outline Package (TSOP) Standard Pinout
(TS 048)
F
= 48-Pin Thin Small Outline Package (TSOP) Reverse Pinout
(TSR048)
S
= 44-Pin Small Outline Package (SO 044)
WB = 48-Ball Fine Pitch Ball Grid Array (FBGA)
0.80 mm pitch, 6 x 9 mm package (FBB048)
WC = 48-Ball Fine Pitch Ball Grid Array (FBGA)
= 0.80 mm pitch, 6.15 x 8.15 mm package (VBK 048)
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T
=
Top sector
B
=
Bottom sector
DEVICE NUMBER/DESCRIPTION
Am29LV800D
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS Flash Memory
3.0 Volt-only Read, Program, and Erase
Valid Combinations for TSOP and SO Packages
AM29LV800DT-70,
AM29LV800DB-70
AM29LV800DT-90,
AM29LV800DB-90
AM29LV800DT-120,
AM29LV800DB-120
8
EC, EI, ED, EF, FC, FD, FF, FI,
SC, SD, SF, SI
EC, EI, ED,EF,FD, FF,FC,
FI,SD, SFSC, SI
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Valid Combinations for FBGA Packages
Order Number
Package Marking
WBC
WBI
WBD
AM29LV800DT-70,
AM29LV800DB-70
WBF
WCC
L800DT70V,
L800DB70V
WCI
WCD
WCF
WCC
WCI
C, I,
D,F
WCD
AM29LV800DT-90,
AM29LV800DB-90
WCF
WBC
L800DT90V,
L800DB90V
WBI
WBD
WBF
WBC
AM29LV800DT-120,
AM29LV800DB-120
WBI
WBD
L800DT12V,
L800DB12V
WBF
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD
sales office to confirm availability of specific valid combinations and to check on newly released combinations.
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
9
P R E L I M I N A R Y
Device Bus Operations
This section describes the requirements and use
of the device bus operations, which are initiated
through the internal command register. The
command register itself does not occupy any
addressable memory location. The register is
composed of latches that store the commands,
along with the address and data information
needed to execute the command. The contents
Table 1.
of the register serve as inputs to the internal
state machine. The state machine outputs
dictate the function of the device. Table 1 lists
the device bus operations, the inputs and
control levels they require, and the resulting
output. The following subsections describe each
of these operations in further detail.
Am29LV800D Device Bus Operations
DQ8–DQ15
CE#
OE
#
WE
#
RESET
#
Addresses
(Note 1)
DQ0–
DQ7
BYTE
#
= VIH
Read
L
L
H
H
AIN
DOUT
DOUT
Write
L
H
L
H
AIN
DIN
DIN
VCC ±
0.3 V
X
X
VCC ±
0.3 V
X
High-Z High-Z
High-Z
Output Disable
L
H
H
H
X
High-Z High-Z
High-Z
Reset
X
X
X
L
X
High-Z High-Z
High-Z
DIN
X
X
Operation
Standby
BYTE#
= VIL
DQ8–DQ14 = HighZ, DQ15 = A-1
Sector Protect (Note 2)
L
H
L
VID
Sector Address,
A6 = L, A1 = H,
A0 = L
Sector Unprotect (Note 2)
L
H
L
VID
Sector Address,
A6 = H, A1 = H,
A0 = L
DIN
X
X
Temporary Sector Unprotect
X
X
X
VID
AIN
DIN
DIN
High-Z
Legend:
L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, DOUT = Data Out
Notes:
1. Addresses are A18:A0 in word mode (BYTE# = VIH), A18:A-1 in byte mode (BYTE# = VIL).
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See
the “Sector Protection/Unprotection” section.
Word/Byte Configuration
The BYTE# pin controls whether the device data
I/O pins DQ15–DQ0 operate in the byte or word
configuration. If the BYTE# pin is set at logic ‘1’,
the device is in word configuration, DQ15–DQ0
are active and controlled by CE# and OE#.
If the BYTE# pin is set at logic ‘0’, the device is
in byte configuration, and only data I/O pins
DQ0–DQ7 are active and controlled by CE# and
OE#. The data I/O pins DQ8–DQ14 are
tri-stated, and the DQ15 pin is used as an input
for the LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system
must drive the CE# and OE# pins to VIL. CE# is
the power control and selects the device. OE# is
the output control and gates array data to the
output pins. WE# should remain at VIH. The
10
BYTE# pin determines whether the device
outputs array data in words or bytes.
The internal state machine is set for reading
array data upon device power-up, or after a
hardware reset. This ensures that no spurious
alteration of the memory content occurs during
the power transition. No command is necessary
in this mode to obtain array data. Standard
microprocessor read cycles that assert valid
addresses on the device address inputs produce
valid data on the device data outputs. The
device remains enabled for read access until the
command register contents are altered.
See “Reading Array Data” for more information.
Refer to the AC Read Operations table for timing
specifications and to Figure 1 for the timing diagram. ICC1 in the DC Characteristics table represents the active current specification for reading
array data.
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Writing Commands/Command Sequences
To write a command or command sequence
(which includes programming data to the device
and erasing sectors of memory), the system
must drive WE# and CE# to VIL, and OE# to
VIH.
For program operations, the BYTE# pin determines whether the device accepts program data
in bytes or words. Refer to “Word/Byte Configuration” for more information.
The device features an Unlock Bypass mode to
facilitate faster programming. Once the device
enters the Unlock Bypass mode, only two write
cycles are required to program a word or byte,
instead of four. The “Word/Byte Program
Command Sequence” section has details on programming data to the device using both standard and Unlock Bypass command sequences.
An erase operation can erase one sector, multiple sectors, or the entire device. Tables 2 and
3 indicate the address space that each sector
occupies. A “sector address” consists of the
address bits required to uniquely select a sector.
The “Command Definitions” section has details
on erasing a sector or the entire chip, or suspending/resuming the erase operation.
After the system writes the autoselect command
sequence, the device enters the autoselect
mode. The system can then read autoselect
codes from the internal register (which is separate from the memory array) on DQ7–DQ0.
Standard read cycle timings apply in this mode.
Refer to the “Autoselect Mode” and “Autoselect
Command Sequence” sections for more information.
ICC2 in the DC Characteristics table represents
the active current specification for the write
mode. The “AC Characteristics” section contains
timing specification tables and timing diagrams
for write operations.
Program and Erase Operation Status
During an erase or program operation, the
system may check the status of the operation by
reading the status bits on DQ7–DQ0. Standard
read cycle timings and ICC read specifications
apply. Refer to “Write Operation Status” for
more information, and to “AC Characteristics”
for timing diagrams.
Standby Mode
When the system is not reading or writing to the
device, it can place the device in the standby
mode. In this mode, current consumption is
greatly reduced, and the outputs are placed in
January 21, 2005 Am29LV800D_00_A4_E
the high impedance state, independent of the
OE# input.
The device enters the CMOS standby mode
when the CE# and RESET# pins are both held at
VCC ± 0.3 V. (Note that this is a more restricted
voltage range than VIH.) If CE# and RESET# are
held at VIH, but not within VCC ± 0.3 V, the device
will be in the standby mode, but the standby
current will be greater. The device requires standard access time (tCE) for read access when the
device is in either of these standby modes,
before it is ready to read data.
If the device is deselected during erasure or programming, the device draws active current until
the operation is completed.
In the DC Characteristics table, ICC3 and ICC4
represents the standby current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash
device energy consumption. The device automatically enables this mode when addresses
remain stable for tACC + 30 ns. The automatic
sleep mode is independent of the CE#, WE#,
and OE# control signals. Standard address
access timings provide new data when
addresses are changed. While in sleep mode,
output data is latched and always available to
the system. ICC4 in the DC Characteristics table
represents the automatic sleep mode current
specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of
resetting the device to reading array data. When
the RESET# pin is driven low for at least a
period of tRP, the device immediately terminates any operation in progress, tristates all
output pins, and ignores all read/write commands for the duration of the RESET# pulse.
The device also resets the internal state
machine to reading array data. The operation
that was interrupted should be reinitiated once
the device is ready to accept another command
sequence, to ensure data integrity.
Current is reduced for the duration of the
R E S ET # p u l s e . Wh e n R E S E T # i s h e l d a t
V SS ±0.3 V, the device draws CMOS standby
current (ICC4). If RESET# is held at VIL but not
within VSS±0.3 V, the standby current will be
greater.
The RESET# pin may be tied to the system reset
circuitry. A system reset would thus also reset
the Flash memory, enabling the system to read
the boot-up firmware from the Flash memory.
Am29LV800D
11
P R E L I M I N A R Y
If RESET# is asserted during a program or erase
operation, the RY/BY# pin remains a “0” (busy)
until the internal reset operation is complete,
w h i c h r e q u i re s a t i m e o f t R E A D Y (d u r in g
Embedded Algorithms). The system can thus
monitor RY/BY# to determine whether the reset
operation is complete. If RESET# is asserted
when a program or erase operation is not executing (RY/BY# pin is “1”), the reset operation
is completed within a time of tREADY (not during
Table 2.
Embedded Algorithms). The system can read
data tRH after the RESET# pin returns to VIH.
Refer to the AC Characteristics tables for
RESET# parameters and to Figure 1 for the
timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the
device is disabled. The output pins are placed in
the high impedance state.
Am29LV800DT Top Boot Block Sector Addresses
Sector Size Address Range (in hexadecimal)
(Kbytes/
(x8)
(x16)
Kwords)
Address Range Address Range
Sector
A18
A17
A16
A15
A14
A13
A12
SA0
0
0
0
0
X
X
X
64/32
00000h–0FFFFh
00000h–07FFFh
SA1
0
0
0
1
X
X
X
64/32
10000h–1FFFFh
08000h–0FFFFh
SA2
0
0
1
0
X
X
X
64/32
20000h–2FFFFh
10000h–17FFFh
SA3
0
0
1
1
X
X
X
64/32
30000h–3FFFFh
18000h–1FFFFh
SA4
0
1
0
0
X
X
X
64/32
40000h–4FFFFh
20000h–27FFFh
SA5
0
1
0
1
X
X
X
64/32
50000h–5FFFFh
28000h–2FFFFh
SA6
0
1
1
0
X
X
X
64/32
60000h–6FFFFh
30000h–37FFFh
SA7
0
1
1
1
X
X
X
64/32
70000h–7FFFFh
38000h–3FFFFh
SA8
1
0
0
0
X
X
X
64/32
80000h–8FFFFh
40000h–47FFFh
SA9
1
0
0
1
X
X
X
64/32
90000h–9FFFFh
48000h–4FFFFh
SA10
1
0
1
0
X
X
X
64/32
A0000h–AFFFFh
50000h–57FFFh
SA11
1
0
1
1
X
X
X
64/32
B0000h–BFFFFh
58000h–5FFFFh
SA12
1
1
0
0
X
X
X
64/32
C0000h–CFFFFh
60000h–67FFFh
SA13
1
1
0
1
X
X
X
64/32
D0000h–DFFFFh
68000h–6FFFFh
SA14
1
1
1
0
X
X
X
64/32
E0000h–EFFFFh
70000h–77FFFh
SA15
1
1
1
1
0
X
X
32/16
F0000h–F7FFFh
78000h–7BFFFh
SA16
1
1
1
1
1
0
0
8/4
F8000h–F9FFFh
7C000h–7CFFFh
SA17
1
1
1
1
1
0
1
8/4
FA000h–FBFFFh
7D000h–7DFFFh
SA18
1
1
1
1
1
1
X
16/8
FC000h–FFFFFh
7E000h–7FFFFh
12
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Table 3.
Am29LV800DB Bottom Boot Block Sector Addresses
Sector Size Address Range (in hexadecimal)
(Kbytes/
(x8)
(x16)
Kwords)
Address Range Address Range
Sector
A18
A17
A16
A15
A14
A13
A12
SA0
0
0
0
0
0
0
X
16/8
00000h–03FFFh
00000h–01FFFh
SA1
0
0
0
0
0
1
0
8/4
04000h–05FFFh
02000h–02FFFh
SA2
0
0
0
0
0
1
1
8/4
06000h–07FFFh
03000h–03FFFh
SA3
0
0
0
0
1
X
X
32/16
08000h–0FFFFh
04000h–07FFFh
SA4
0
0
0
1
X
X
X
64/32
10000h–1FFFFh
08000h–0FFFFh
SA5
0
0
1
0
X
X
X
64/32
20000h–2FFFFh
10000h–17FFFh
SA6
0
0
1
1
X
X
X
64/32
30000h–3FFFFh
18000h–1FFFFh
SA7
0
1
0
0
X
X
X
64/32
40000h–4FFFFh
20000h–27FFFh
SA8
0
1
0
1
X
X
X
64/32
50000h–5FFFFh
28000h–2FFFFh
SA9
0
1
1
0
X
X
X
64/32
60000h–6FFFFh
30000h–37FFFh
SA10
0
1
1
1
X
X
X
64/32
70000h–7FFFFh
38000h–3FFFFh
SA11
1
0
0
0
X
X
X
64/32
80000h–8FFFFh
40000h–47FFFh
SA12
1
0
0
1
X
X
X
64/32
90000h–9FFFFh
48000h–4FFFFh
SA13
1
0
1
0
X
X
X
64/32
A0000h–AFFFFh
50000h–57FFFh
SA14
1
0
1
1
X
X
X
64/32
B0000h–BFFFFh
58000h–5FFFFh
SA15
1
1
0
0
X
X
X
64/32
C0000h–CFFFFh
60000h–67FFFh
SA16
1
1
0
1
X
X
X
64/32
D0000h–DFFFFh
68000h–6FFFFh
SA17
1
1
1
0
X
X
X
64/32
E0000h–EFFFFh
70000h–77FFFh
SA18
1
1
1
1
X
X
X
64/32
F0000h–FFFFFh
78000h–7FFFFh
Note for Tables 2 and 3: Address range is A18:A-1 in byte mode and A18:A0 in word mode. See “Word/Byte
Configuration” section.
Autoselect Mode
The autoselect mode provides manufacturer
and device identification, and sector protection
verification, through identifier codes output on
DQ7–DQ0. This mode is primarily intended for
programming equipment to automatically
match a device to be programmed with its corresponding programming algorithm. However,
the autoselect codes can also be accessed insystem through the command register.
When using programming equipment, the
autoselect mode requires VID (11.5 V to 12.5 V)
on address pin A9. Address pins A6, A1, and A0
must be as shown in Table 4. In addition, when
January 21, 2005 Am29LV800D_00_A4_E
verifying sector protection, the sector address
must appear on the appropriate highest order
address bits (see Tables 2 and 3). Table 4 shows
the remaining address bits that are don’t care.
When all necessary bits have been set as
required, the programming equipment may
then read the corresponding identifier code on
DQ7–DQ0.
To access the autoselect codes in-system, the
host system can issue the autoselect command
via the command register, as shown in Table 5.
This method does not require VID. See “Command Definitions” for details on using the
autoselect mode.
Am29LV800D
13
P R E L I M I N A R Y
Table 4. Am29LV800D Autoselect Codes (High Voltage Method)
Description
Mode CE# OE#
WE
#
A1
8
to
A1
2
A1
1
to
A1
0
X
X
Manufacturer ID: AMD
L
L
H
Device ID:
Am29LV800B
(Top Boot Block)
Word
L
L
H
Byte
L
L
H
Device ID:
Am29LV800B
(Bottom Boot
Block)
Word
L
L
H
Byte
L
L
H
Sector Protection
Verification
L
L
H
X
SA
A9
A8
to
A7
X
VID
X
VID
X
X
VID
VID
A6
A5
to
A2
A1
X
L
X
X
L
X
X
X
L
L
X
X
A0
DQ8
to
DQ15
DQ7
to
DQ0
L
L
X
01h
22h
DAh
L
H
X
DAh
22h
5Bh
X
5Bh
X
01h
(protected)
X
00h
(unprotecte
d)
L
H
H
L
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Sector Protection/Unprotection
The hardware sector protection feature disables
both program and erase operations in any
sector. The hardware sector unprotection
feature re-enables both program and erase
operations in previously protected sectors.
The device is shipped with all sectors unprotected. AMD offers the option of programming
and protecting sectors at its factory prior to
shipping the device through AMD’s ExpressFlash™ Service. Contact an AMD representative
for details.
It is possible to determine whether a sector is
protected or unprotected. See “Autoselect
Mode” for details.
Sector Protection/unprotection can be implemented via two methods.
The prim ary method req uires V I D on the
RESET# pin only, and can be implemented
either in-system or via programming equipment. Figure 2 shows the algorithms and Figure
1 shows the timing diagram. This method uses
14
standard microprocessor bus cycle timing. For
sector unprotect, all unprotected sectors must
first be protected prior to the first sector unprotect write cycle.
The alternate method intended only for programming equipment requires VID on address
pin A9 and OE#. This method is compatible with
programmer routines written for earlier 3.0 voltonly AMD flash devices. Publication number
20536 contains further details; contact an AMD
representative to request a copy.
Temporary Sector Unprotect
This feature allows temporary unprotection of
previously protected sectors to change data
in-system. The Sector Unprotect mode is activated by setting the RESET# pin to VID. During
this mode, formerly protected sectors can be
programmed or erased by selecting the sector
addresses. Once V ID is removed from the
RESET# pin, all the previously protected sectors
are protected again. Figure 1 shows the algo-
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
rithm, and Figure 1 shows the timing diagrams,
for this feature.
START
RESET# = VID
(Note 1)
Perform Erase or
Program Operations
RESET# = VIH
Temporary Sector
Unprotect Completed
(Note 2)
Notes:
1. All protected sectors unprotected.
2. All previously protected sectors are protected
once again.
Figure 1.
Temporary Sector Unprotect
Operation
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
15
P R E L I M I N A R Y
START
START
Protect all sectors:
The indicated portion
of the sector protect
algorithm must be
performed for all
unprotected sectors
prior to issuing the
first sector
unprotect address
PLSCNT = 1
RESET# = VID
Wait 1 ms
Temporary Sector
Unprotect Mode
No
PLSCNT = 1
RESET# = VID
Wait 1 ms
First Write No
Cycle = 60h?
First Write
Cycle = 60h?
Yes
Yes
Set up sector
address
No
Sector Protect:
Write 60h to sector
address with
A6 = 0, A1 = 1,
A0 = 0
Wait 150
Increment
PLSCNT
Temporary Sector
Unprotect Mode
All sectors
protected?
Yes
Set up first sector
address
Sector Unprotect:
Write 60h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
s
Verify Sector
Protect: Write 40h
to sector address
with A6 = 0,
A1 = 1, A0 = 0
Reset
PLSCNT = 1
Read from
sector address
with A6 = 0,
A1 = 1, A0 = 0
Wait 15 ms
Verify Sector
Unprotect: Write
40h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
Increment
PLSCNT
No
No
PLSCNT
= 25?
Yes
Device failed
Read from
sector address
with A6 = 1,
A1 = 1, A0 = 0
Data = 01h?
Yes
No
Protect another
sector?
Yes
PLSCNT
= 1000?
No
Data = 00h?
Yes
Yes
Remove VID
from RESET#
Last sector
verified?
Device failed
Write reset
command
Sector Protect
Algorithm
Set up
next sector
address
No
No
Yes
Sector Protect
complete
Remove VID
from RESET#
Sector Unprotect
Algorithm
Write reset
command
Sector Unprotect
complete
Figure 2. In-System Sector Protect/
Sector Unprotect Algorithms
16
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Hardware Data Protection
The command sequence requirement of unlock
cycles for programming or erasing provides data
protection against inadvertent writes (refer to
Table 5 for command definitions). In addition,
the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by
spurious system level signals during V CC
power-up and power-down transitions, or from
system noise.
Low VCC Write Inhibit
When VCC is less than VLKO, the device does not
accept any write cycles. This protects data
during V CC power-up and power-down. The
command register and all internal program/erase circuits are disabled, and the device
resets. Subsequent writes are ignored until VCC
is greater than VLKO. The system must provide
the proper signals to the control pins to prevent
unintentional writes when VCC is greater than
VLKO.
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE#,
CE# or WE# do not initiate a write cycle.
Logical Inhibit
Write cycles are inhibited by holding any one of
OE# = VIL, CE# = VIH or WE# = VIH. To initiate
a write cycle, CE# and WE# must be a logical
zero while OE# is a logical one.
Power-Up Write Inhibit
If WE# = CE# = V IL and OE# = V IH during
power up, the device does not accept commands on the rising edge of WE#. The internal
state machine is automatically reset to reading
array data on power-up.
Command Definitions
Writing specific address and data commands or
sequences into the command register initiates
device operations. Table 5 defines the valid register command sequences. Writing incorrect
address and data values or writing them in
the improper sequence resets the device to
reading array data.
All addresses are latched on the falling edge of
WE# or CE#, whichever happens later. All data
is latched on the rising edge of WE# or CE#,
whichever happens first. Refer to the appropriate timing diagrams in the “AC Characteristics” section.
Reading Array Data
The device is automatically set to reading array
data after device power-up. No commands are
required to retrieve data. The device is also
ready to read array data after completing an
Embedded Program or Embedded Erase algorithm.
After the device accepts an Erase Suspend command, the device enters the Erase Suspend
mode. The system can read array data using the
standard read timings, except that if it reads at
an address within erase-suspended sectors, the
device outputs status data. After completing a
programming operation in the Erase Suspend
mode, the system may once again read array
data with the same exception. See “Erase Suspend/Erase Resume Commands” for more information on this mode.
The system must issue the reset command to
re-enable the device for reading array data if
January 21, 2005 Am29LV800D_00_A4_E
DQ5 goes high, or while in the autoselect mode.
See the “Reset Command” section, next.
See also “Requirements for Reading Array Data”
in the “Device Bus Operations” section for more
information. The Read Operations table provides
the read parameters, and Figure 1 shows the
timing diagram.
Reset Command
Writing the reset command to the device resets
the device to reading array data. Address bits
are don’t care for this command.
The reset command may be written between the
sequence cycles in an erase command sequence
before erasing begins. This resets the device to
reading array data. Once erasure begins, however, the device ignores reset commands until
the operation is complete.
The reset command may be written between the
s e q u e n c e c yc l e s i n a p ro g ram c om m a n d
sequence before programming begins. This
resets the device to reading array data (also
applies to programming in Erase Suspend
mode). Once programming begins, however, the
device ignores reset commands until the operation is complete.
The reset command may be written between the
sequence cycles in an autoselect command
sequence. Once in the autoselect mode, the
reset command must be written to return to
reading array data (also applies to autoselect
during Erase Suspend).
Am29LV800D
17
P R E L I M I N A R Y
If DQ5 goes high during a program or erase
operation, writing the reset command returns
the device to reading array data (also applies
during Erase Suspend).
Autoselect Command Sequence
The autoselect command sequence allows the
host system to access the manufacturer and
devices codes, and determine whether or not a
sector is protected. Table 5 shows the address
and data requirements. This method is an alternative to that shown in Table 4, which is
intended for PROM programmers and requires
VID on address bit A9.
The autoselect command sequence is initiated
by writing two unlock cycles, followed by the
autoselect command. The device then enters
the autoselect mode, and the system may read
at any address any number of times, without
initiating another command sequence.
A read cycle at address XX00h retrieves the
manufacturer code. A read cycle at address
XX01h in word mode (or 02h in byte mode)
returns the device code. A read cycle containing
a sector address (SA) and the address 02h in
word mode (or 04h in byte mode) returns 01h if
that sector is protected, or 00h if it is unprotected. Refer to Tables 2 and 3 for valid sector
addresses.
The system must write the reset command to
exit the autoselect mode and return to reading
array data.
Word/Byte Program Command Sequence
The system may program the device by word or
byte, depending on the state of the BYTE# pin.
Programming is a four-bus-cycle operation. The
program command sequence is initiated by
writing two unlock write cycles, followed by the
p ro g ra m s e t -u p c o m m an d . T h e p r o g ra m
address and data are written next, which in turn
initiate the Embedded Program algorithm. The
system is not required to provide further controls or timings. The device automatically provides internally generated program pulses and
verifies the programmed cell margin. Table 5
shows the address and data requirements for
the byte program command sequence.
When the Embedded Program algorithm is complete, the device then returns to reading array
data and addresses are no longer latched. The
system can determine the status of the program
operation by using DQ7, DQ6, or RY/BY#. See
18
“Write Operation Status” for information on
these status bits.
Any commands written to the device during the
Embedded Program Algorithm are ignored. Note
that a hardware reset immediately terminates
the programming operation. The program
command sequence should be reinitiated once
the device has reset to reading array data, to
ensure data integrity.
Programming is allowed in any sequence and
across sector boundaries. A bit cannot be programmed from a “0” back to a “1”.
Attempting to do so may halt the operation and
set DQ5 to “1”, or cause the Data# Polling algorithm to indicate the operation was successful.
However, a succeeding read will show that the
data is still “0”. Only erase operations can
convert a “0” to a “1”.
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to
program bytes or words to the device faster
than using the standard program command
sequence. The unlock bypass command
sequence is initiated by first writing two unlock
cycles. This is followed by a third write cycle
containing the unlock bypass command, 20h.
The device then enters the unlock bypass mode.
A two-cycle unlock bypass program command
sequence is all that is required to program in
this mode. The first cycle in this sequence contains the unlock bypass program command,
A0h; the second cycle contains the program
address and data. Additional data is programmed in the same manner. This mode dispenses with the initial two unlock cycles
required in the standard program command
sequence, resulting in faster total programming
time. Table 5 shows the requirements for the
command sequence.
During the unlock bypass mode, only the Unlock
Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass
mode, the system must issue the two-cycle
unlock bypass reset command sequence. The
first cycle must contain the data 90h; the
second cycle the data 00h. Addresses are don’t
care for both cycles. The device then returns to
reading array data.
Figure 1 illustrates the algorithm for the
program operation. See the Erase/Program
Operations table in “AC Characteristics” for
parameters, and to Figure 1 for timing diagrams.
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
tion. The Chip Erase command sequence should
be reinitiated once the device has returned to
reading array data, to ensure data integrity.
START
The system can determine the status of the
erase operation by using DQ7, DQ6, DQ2, or
RY/BY#. See “Write Operation Status” for information on these status bits. When the
Embedded Erase algorithm is complete, the
device returns to reading array data and
addresses are no longer latched.
Write Program
Command Sequence
Data Poll
from System
Embedded
Program
algorithm
in progress
Verify Data?
Figure 1 illustrates the algorithm for the erase
operation. See the Erase/Program Operations
tables in “AC Characteristics” for parameters,
and to Figure 1 for timing diagrams.
No
Yes
Increment Address
No
Last Address?
Yes
Programming
Completed
Note: See Table 5 for program command sequence.
Figure 1.
Program Operation
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip
erase command sequence is initiated by writing
two unlock cycles, followed by a set-up command. Two additional unlock write cycles are
then followed by the chip erase command,
which in turn invokes the Embedded Erase algorithm. The device does not require the system
to preprogram prior to erase. The Embedded
Erase algorithm automatically preprograms and
verifies the entire memory for an all zero data
pattern prior to electrical erase. The system is
not required to provide any controls or timings
during these operations. Table 5 shows the
address and data requirements for the chip
erase command sequence.
Any commands written to the chip during the
Embedded Erase algorithm are ignored. Note
that a hardware reset during the chip erase
operation immediately terminates the opera-
January 21, 2005 Am29LV800D_00_A4_E
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The
sector erase command sequence is initiated by
writing two unlock cycles, followed by a set-up
command. Two additional unlock write cycles
are then followed by the address of the sector to
be erased, and the sector erase command. Table
5 shows the address and data requirements for
the sector erase command sequence.
The device does not require the system to preprogram the memory prior to erase. The
Embedded Erase algorithm automatically programs and verifies the sector for an all zero data
pattern prior to electrical erase. The system is
not required to provide any controls or timings
during these operations.
After the command sequence is written, a sector
erase time-out of 50 µs begins. During the timeout period, additional sector addresses and
s ec tor e ra se com m a n ds m ay b e wri tte n.
Loading the sector erase buffer may be done in
any sequence, and the number of sectors may
be from one sector to all sectors. The time
between these additional cycles must be less
than 50 µs, otherwise the last address and
command might not be accepted, and erasure
may begin. It is recommended that processor
interrupts be disabled during this time to ensure
all commands are accepted. The interrupts can
be re-enabled after the last Sector Erase
command is written. If the time between additional sector erase commands can be assumed
to be less than 50 µs, the system need not
monitor DQ3. Any command other than
Sector Erase or Erase Suspend during the
t im e- o u t p e r io d r es et s th e d e v ic e t o
reading array data. The system must rewrite
the command sequence and any additional
sector addresses and commands.
Am29LV800D
19
P R E L I M I N A R Y
The system can monitor DQ3 to determine if the
sector erase timer has timed out. (See the
“DQ3: Sector Erase Timer” section.) The timeout begins from the rising edge of the final WE#
pulse in the command sequence.
Once the sector erase operation has begun, only
the Erase Suspend command is valid. All other
commands are ignored. Note that a hardware
reset during the sector erase operation immediately terminates the operation. The Sector
Erase command sequence should be reinitiated
once the device has returned to reading array
data, to ensure data integrity.
When the Embedded Erase algorithm is complete, the device returns to reading array data
and addresses are no longer latched. The
system can determine the status of the erase
operation by using DQ7, DQ6, DQ2, or RY/BY#.
Refer to “Write Operation Status” for information on these status bits.
Figure 1 illustrates the algorithm for the erase
operation. Refer to the Erase/Program Operations tables in the “AC Characteristics” section
for parameters, and to Figure 1 for timing diagrams.
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system
to interrupt a sector erase operation and then
read data from, or program data to, any sector
not selected for erasure. This command is valid
only during the sector erase operation, including
the 50 µs time-out period during the sector
erase command sequence. The Erase Suspend
command is ignored if written during the chip
erase operation or Embedded Program algorithm. Writing the Erase Suspend command
during the Sector Erase time-out immediately
terminates the time-out period and suspends
the erase operation. Addresses are
“don’t-cares” when writing the Erase Suspend
command.
20
When the Erase Suspend command is written
during a sector erase operation, the device
requires a maximum of 20 µs to suspend the
erase operation. However, when the Erase
Suspend command is written during the sector
erase time-out, the device immediately terminates the time-out period and suspends the
erase operation.
After the erase operation has been suspended,
the system can read array data from or program
data to any sector not selected for erasure. (The
device “erase suspends” all sectors selected for
erasure.) Normal read and write timings and
command definitions apply. Reading at any
address within erase-suspended sectors produces status data on DQ7–DQ0. The system can
use DQ7, or DQ6 and DQ2 together, to determine if a sector is actively erasing or is erasesuspended. See “Write Operation Status” for
information on these status bits.
After an erase-suspended program operation is
complete, the system can once again read array
data within non-suspended sectors. The system
can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in
the standard program operation. See “Write
Operation Status” for more information.
The system may also write the autoselect
command sequence when the device is in the
Erase Suspend mode. The device allows reading
autoselect codes even at addresses within
erasing sectors, since the codes are not stored
in the memory array. When the device exits the
autoselect mode, the device reverts to the Erase
Suspend mode, and is ready for another valid
o p e r a t i o n . S e e “A u t o s e l e c t C o m m a n d
Sequence” for more information.
The system must write the Erase Resume
command (address bits are “don’t care”) to exit
the erase suspend mode and continue the sector
erase operation. Further writes of the Resume
command are ignored. Another Erase Suspend
command can be written after the device has
resumed erasing.
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
START
Write Erase
Command Sequence
Data Poll
from System
Embedded
Erase
algorithm
in progress
No
Data = FFh?
Yes
Erasure Completed
Notes:
1. See Table 5 for erase command sequence.
2. See “DQ3: Sector Erase Timer” for more information.
Figure 1.
Erase Operation
Cycles
Table 5.
Command
Sequence
(Note 1)
Am29LV800D Command Definitions
Bus Cycles (Notes 2-5)
First
Second
Addr
Data
Read (Note 6)
1
RA
RD
Reset (Note 7)
1
XXX
F0
Autoselect (Note
Manufacturer ID
Word
Byte
Device ID,
Top Boot Block
Word
Device ID,
Bottom Boot Block
Word
Sector Protect Verify
(Note 9)
Program
Unlock Bypass
Byte
Byte
4
4
4
Word
555
AAA
555
AAA
555
AAA
AA
AA
AA
555
4
Addr
2AA
555
2AA
555
2AA
555
Data
55
55
55
2AA
AA
Third
Addr
555
AAA
555
AAA
555
AAA
55
555
AAA
Word
555
2AA
555
Word
Byte
Unlock Bypass Program (Note
10)
Unlock Bypass Reset (Note
11)
AAA
AA
555
55
3
555
AAA
AA
2
XXX
A0
PA
PD
2
XXX
90
XXX
00
January 21, 2005 Am29LV800D_00_A4_E
2AA
555
90
90
90
AAA
4
90
555
Byte
Byte
Fourth
Data Addr
55
AAA
555
AAA
Am29LV800D
A0
Data
X00
01
X01
22DA
X02
DA
X01
225B
X02
5B
(SA)
X02
XX00
(SA)
X04
00
PA
PD
Fifth
Addr Data
Sixth
Addr
Data
XX01
01
20
21
P R E L I M I N A R Y
Chip Erase
Sector Erase
Word
Byte
Word
Byte
6
6
555
AAA
555
AAA
AA
AA
Erase Suspend (Note 12)
1
XXX
B0
Erase Resume (Note 13)
1
XXX
30
2AA
555
2AA
555
55
55
555
AAA
555
AAA
80
80
555
AAA
555
AAA
AA
AA
2AA
555
2AA
555
55
55
555
AAA
SA
10
30
Legend:
X = Don’t care
RA = Address of the memory location to be read.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed. Addresses latch on the falling edge of the WE# or CE# pulse,
whichever happens later.
PD = Data to be programmed at location PA. Data latches on the rising edge of WE# or CE# pulse, whichever happens
first.
SA = Address of the sector to be verified (in autoselect mode) or erased. Address bits A18–A12 uniquely select any
sector.
Notes:
1. See Table 1 for description of bus operations.
2. All values are in hexadecimal.
3. Except when reading array or autoselect data, all bus cycles are write operations.
4. Data bits DQ15–DQ8 are don’t cares for unlock and command cycles.
5. Address bits A18–A11 are don’t cares for unlock and command cycles, unless PA or SA required.
6. No unlock or command cycles required when reading array data.
7. The Reset command is required to return to reading array data when device is in the autoselect mode, or if DQ5
goes high (while the device is providing status data).
8. The fourth cycle of the autoselect command sequence is a read cycle.
9. The data is 00h for an unprotected sector and 01h for a protected sector. See “Autoselect Command Sequence” for
more information.
10.The Unlock Bypass command is required prior to the Unlock Bypass Program command.
11.The Unlock Bypass Reset command is required to return to reading array data when the device is in the unlock
bypass mode.
12.The system may read and program in non-erasing sectors, or enter the autoselect mode, when in the Erase Suspend
mode. The Erase Suspend command is valid only during a sector erase operation.
13.The Erase Resume command is valid only during the Erase Suspend mode.
Write Operation Status
The device provides several bits to determine
the status of a write operation: DQ2, DQ3, DQ5,
DQ6, DQ7, and RY/BY#. Table 6 and the following subsections describe the functions of
these bits. DQ7, RY/BY#, and DQ6 each offer a
method for determining whether a program or
erase operation is complete or in progress.
These three bits are discussed first.
DQ7: Data# Polling
The Data# Polling bit, DQ7, indicates to the host
system whether an Embedded Algorithm is in
progress or completed, or whether the device is
in Erase Suspend. Data# Polling is valid after
the rising edge of the final WE# pulse in the
program or erase command sequence.
During the Embedded Program algorithm, the
device outputs on DQ7 the complement of the
22
datum programmed to DQ7. This DQ7 status
also applies to programming during Erase Suspend. When the Embedded Program algorithm
is complete, the device outputs the datum programmed to DQ7. The system must provide the
program address to read valid status information on DQ7. If a program address falls within a
protected sector, Data# Polling on DQ7 is active
for approximately 1 µs, then the device returns
to reading array data.
During the Embedded Erase algorithm, Data#
Polling produces a “0” on DQ7. When the
Embedded Erase algorithm is complete, or if the
device enters the Erase Suspend mode, Data#
Polling produces a “1” on DQ7. This is analogous
to the complement/true datum output described
for the Embedded Program algorithm: the erase
function changes all the bits in a sector to “1”;
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
prior to this, the device outputs the “complement,” or “0.” The system must provide an
address within any of the sectors selected for
erasure to read valid status information on DQ7.
START
After an erase command sequence is written, if
all sectors selected for erasing are protected,
Data# Polling on DQ7 is active for approximately 100 µs, then the device returns to
reading array data. If not all selected sectors are
protected, the Embedded Erase algorithm
erases the unprotected sectors, and ignores the
selected sectors that are protected.
When the system detects DQ7 has changed
from the complement to true data, it can read
valid data at DQ7–DQ0 on the following read
cycles. This is because DQ7 may change asynchronously with DQ0–DQ6 while Output Enable
(OE#) is asserted low. Figure 1, Data# Polling
Timings (During Embedded Algorithms), in the
“AC Characteristics” section illustrates this.
Read DQ7–DQ0
Addr = VA
DQ7 = Data?
Yes
No
No
Table 6 shows the outputs for Data# Polling on
DQ7. Figure 1 shows the Data# Polling algorithm.
DQ5 = 1?
Yes
Read DQ7–DQ0
Addr = VA
DQ7 = Data?
Yes
No
FAIL
PASS
Notes:
1. VA = Valid address for programming. During a
sector erase operation, a valid address is an
address within any sector selected for erasure.
During chip erase, a valid address is any
non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = “1” because DQ7 may change simultaneously with DQ5.
Figure 1.
Data# Polling Algorithm
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output
pin that indicates whether an Embedded Algorithm is in progress or complete. The RY/BY#
status is valid after the rising edge of the final
WE# pulse in the command sequence. Since
RY/B Y# is an open -d rain outpu t, se veral
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
23
P R E L I M I N A R Y
RY/BY# pins can be tied together in parallel with
a pull-up resistor to VCC.
If the output is low (Busy), the device is actively
erasing or programming. (This includes programming in the Erase Suspend mode.) If the
output is high (Ready), the device is ready to
read array data (including during the Erase
Suspend mode), or is in the standby mode.
Table 6 shows the outputs for RY/BY#. Figures
1, 1, 1 and 1 shows RY/BY# for read, reset, program, and erase operations, respectively.
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an
Embedded Program or Erase algorithm is in
progress or complete, or whether the device has
entered the Erase Suspend mode. Toggle Bit I
may be read at any address, and is valid after
the rising edge of the final WE# pulse in the
command sequence (prior to the program or
erase operation), and during the sector erase
time-out.
During an Embedded Program or Erase algorithm operation, successive read cycles to any
address cause DQ6 to toggle. (The system may
use either OE# or CE# to control the read
cycles.) When the operation is complete, DQ6
stops toggling.
After an erase command sequence is written, if
all sectors selected for erasing are protected,
DQ6 toggles for approximately 100 µs, then
returns to reading array data. If not all selected
sectors are protected, the Embedded Erase
algorithm erases the unprotected sectors, and
ignores the selected sectors that are protected.
The system can use DQ6 and DQ2 together to
determine whether a sector is actively erasing
or is erase-suspended. When the device is
actively erasing (that is, the Embedded Erase
algorithm is in progress), DQ6 toggles. When
the device enters the Erase Suspend mode, DQ6
stops toggling. However, the system must also
use DQ2 to determine which sectors are erasing
or erase-suspended. Alternatively, the system
can use DQ7 (see the subsection on “DQ7:
Data# Polling”).
If a program address falls within a protected
sector, DQ6 toggles for approximately 1 µs after
the program command sequence is written,
then returns to reading array data.
DQ6 also toggles during the erase-suspendprogram mode, and stops toggling once the
Embedded Program algorithm is complete.
24
Table 6 shows the outputs for Toggle Bit I on
DQ6. Figure 1 shows the toggle bit algorithm.
Figure 1 in the “AC Characteristics” section
shows the toggle bit timing diagrams. Figure 1
shows the differences between DQ2 and DQ6 in
graphical form. See also the subsection on
“DQ2: Toggle Bit II”.
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2, when used with
DQ6, indicates whether a particular sector is
actively erasing (that is, the Embedded Erase
algorithm is in progress), or whether that sector
is erase-suspended. Toggle Bit II is valid after
the rising edge of the final WE# pulse in the
command sequence.
DQ2 toggles when the system reads at
addresses within those sectors that have been
selected for erasure. (The system may use
either OE# or CE# to control the read cycles.)
But DQ2 cannot distinguish whether the sector
is actively erasing or is erase-suspended. DQ6,
by comparison, indicates whether the device is
actively erasing, or is in Erase Suspend, but
cannot distinguish which sectors are selected for
erasure. Thus, both status bits are required for
sector and mode information. Refer to Table 6 to
compare outputs for DQ2 and DQ6.
Figure 1 shows the toggle bit algorithm in flowchart form, and the section “DQ2: Toggle Bit II”
explains the algorithm. See also the “DQ6:
Toggle Bit I” subsection. Figure 1 shows the
toggle bit timing diagram. Figure 1 shows the
differences between DQ2 and DQ6 in graphical
form.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 1 for the following discussion.
Whenever the system initially begins reading
toggle bit status, it must read DQ7–DQ0 at least
twice in a row to determine whether a toggle bit
is toggling. Typically, the system would note and
store the value of the toggle bit after the first
read. After the second read, the system would
compare the new value of the toggle bit with the
first. If the toggle bit is not toggling, the device
has completed the program or erase operation.
The system can read array data on DQ7–DQ0 on
the following read cycle.
However, if after the initial two read cycles, the
system determines that the toggle bit is still
toggling, the system also should note whether
the value of DQ5 is high (see the section on
DQ5). If it is, the system should then determine
again whether the toggle bit is toggling, since
the toggle bit may have stopped toggling just as
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the
program or erase operation. If it is still toggling,
the device did not completed the operation successfully, and the system must write the reset
command to return to reading array data.
START
The remaining scenario is that the system initially determines that the toggle bit is toggling
and DQ5 has not gone high. The system may
continue to monitor the toggle bit and DQ5
through successive read cycles, determining the
status as described in the previous paragraph.
Alternatively, it may choose to perform other
system tasks. In this case, the system must
start at the beginning of the algorithm when it
returns to determine the status of the operation
(top of Figure 1).
Read DQ7–DQ0
(Note 1)
Read DQ7–DQ0
Toggle Bit
= Toggle?
Yes
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase
time has exceeded a specified internal pulse
count limit. Under these conditions DQ5 produces a “1.” This is a failure condition that indicates the program or erase cycle was not
successfully completed.
No
Under both these conditions, the system must
issue the reset command to return the device to
reading array data.
After the sector erase command sequence is
written, the system should read the status on
DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to
ensure the device has accepted the command
sequence, and then read DQ3. If DQ3 is “1”, the
internally controlled erase cycle has begun; all
Read DQ7–DQ0
Twice
(Notes
1, 2)
Toggle Bit
= Toggle?
No
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
DQ3: Sector Erase Timer
After writing a sector erase command sequence,
the system may read DQ3 to determine whether
or not an erase operation has begun. (The
sector erase timer does not apply to the chip
erase command.) If additional sectors are
selected for erasure, the entire time-out also
applies after each additional sector erase command. When the time-out is complete, DQ3
switches from “0” to “1.” The system may
ignore DQ3 if the system can guarantee that
the time between additional sector erase commands will always be less than 50 µs. See also
the “Sector Erase Command Sequence” section.
DQ5 = 1?
Yes
The DQ5 failure condition may appear if the
system tries to program a “1” to a location that
is previously programmed to “0.” Only an
erase operation can change a “0” back to a
“1.” Under this condition, the device halts the
o p e ra t i o n , a n d w h e n t h e o p e ra t i o n h a s
exceeded the timing limits, DQ5 produces a “1.”
January 21, 2005 Am29LV800D_00_A4_E
No
Program/Erase
Operation Complete
Notes:
1. Read toggle bit twice to determine whether or not
it is toggling. See text.
2. Recheck toggle bit because it may stop toggling
as DQ5 changes to “1”. See text.
Figure 1.
Toggle Bit Algorithm
further commands (other than Erase Suspend)
are ignored until the erase operation is complete. If DQ3 is “0”, the device will accept additional sector erase commands. To ensure the
command has been accepted, the system software should check the status of DQ3 prior to
and following each subsequent sector erase
command. If DQ3 is high on the second status
check, the last command might not have been
accepted. Table 6 shows the outputs for DQ3.
Am29LV800D
25
P R E L I M I N A R Y
Table 6.
Operation
Embedded Program
Standard Algorithm
Mode
Embedded Erase Algorithm
Reading within Erase
Suspended Sector
Erase
Suspend
Reading within Non-Erase
Mode
Suspended Sector
Erase-Suspend-Program
Write Operation Status
DQ7
(Note
2)
DQ6
DQ5
(Note 1)
DQ3
DQ2
(Note 2)
RY/BY
#
DQ7#
Toggle
0
N/A
No toggle
0
0
Toggle
0
1
Toggle
0
1
No toggle
0
N/A
Toggle
1
Data
Data
Data
Data
Data
1
DQ7#
Toggle
0
N/A
N/A
0
Notes:
1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum
timing limits. See “DQ5: Exceeded Timing Limits” for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection
for further details.
26
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
ABSOLUTE MAXIMUM RATINGS
VCC (Note 1) . . . . . . . . . . . . . . . . –0.5 V to +4.0 V
Storage Temperature
Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C
A9, OE#, and
RESET# (Note 2) . . . . . . . . . . . –0.5 V to +12.5 V
Ambient Temperature
with Power Applied . . . . . . . . . . . . . . –65°C to +85°C
All other pins (Note 1). . . . . . –0.5 V to VCC+0.5 V
Output Short Circuit Current (Note 3) . . . . . . . 200 mA
Notes:
1. Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions, input or I/O pins may
undershoot VSS to –2.0 V for periods of up to 20 ns. See Figure 2. Maximum DC voltage on input or I/O pins
is VCC +0.5 V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20
ns. See Figure 3.
Voltage with Respect to Ground
2. Minimum DC input voltage on pins A9, OE#, and
RESET# is –0.5 V. During voltage transitions, A9,
OE#, and RESET# may undershoot VSS to –2.0 V for
periods of up to 20 ns. See Figure 2. Maximum DC
input voltage on pin A9 is +12.5 V which may
overshoot to 14.0 V for periods up to 20 ns.
Operating Ranges
3. No more than one output may be shorted to ground
at a time. Duration of the short circuit should not be
greater than one second.
Industrial (I) Devices
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This
is a stress rating only; functional operation of the device at
these or any other conditions above those indicated in the
operational sections of this data sheet is not implied.
20 ns
Exposure of the device to absolute maximum rating
conditions for extended periods may affect device reliability.
Commercial (C) Devices
Ambient Temperature (TA) . . . . . . . . . . .0°C to +70°C
Ambient Temperature (TA) . . . . . . . . .–40°C to +85°C
VCC Supply Voltages
VCC for regulated voltage range . . . . +3.0 V to +3.6 V
VCC for full voltage range . . . . . . . . . +2.7 V to +3.6 V
Operating ranges define those limits between which the
functionality of the device is guaranteed
20 ns
+0.8 V
20 ns
VCC
+2.0 V
VCC
+0.5 V
–0.5 V
–2.0 V
2.0 V
20 ns
Figure 2.
20 ns
Maximum Negative Overshoot
Waveform
January 21, 2005 Am29LV800D_00_A4_E
Figure 3.
Am29LV800D
20 ns
Maximum Positive Overshoot
Waveform
27
P R E L I M I N A R Y
DC Characteristics
CMOS Compatible
Paramete
r
Description
Test Conditions
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9 Input Load Current
VCC = VCC max; A9 = 12.5 V
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC max
ICC1
VCC Active Read Current
(Notes 1, 2)
Min
Typ
Max
Unit
±1.0
µA
35
µA
±1.0
µA
CE# = VIL, OE# =
VIH,
Byte Mode
5 MHz
7
15
1 MHz
2
4
CE# = VIL, OE# =
VIH,
Word Mode
5 MHz
7
15
1 MHz
2
4
mA
ICC2
VCC Active Write Current
(Notes 2, 3, 5)
CE# = VIL, OE# = VIH
15
30
mA
ICC3
VCC Standby Current (Note
2)
CE#, RESET# = VCC±0.3 V
0.2
5
µA
ICC4
VCC Reset Current (Note 2)
RESET# = VSS ± 0.3 V
0.2
5
µA
ICC5
Automatic Sleep Mode
(Notes 2, 4)
VIH = VCC ± 0.3 V;
VIL = VSS ± 0.3 V
0.2
5
µA
VIL
Input Low Voltage
–0.5
0.8
V
VIH
Input High Voltage
0.7 x VCC
VCC + 0.3
V
VID
Voltage for Autoselect and
V = 3.3 V
Temporary Sector Unprotect CC
11.5
12.5
V
VOL
Output Low Voltage
0.45
V
VOH1
VOH2
VLKO
Output High Voltage
IOL = 4.0 mA, VCC = VCC min
IOH = –2.0 mA, VCC = VCC min
0.85 VCC
IOH = –100 µA, VCC = VCC min
VCC–0.4
Low VCC Lock-Out Voltage
(Note 4)
2.3
V
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. Typical VCC is 3.0 V.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns.
5. Not 100% tested.
28
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
DC Characteristics (Continued)
Zero Power Flash
Supply Current in mA
20
15
10
5
0
0
500
1000
1500
2000
2500
3000
3500
4000
Time in ns
Note: Addresses are switching at 1 MHz
Figure 1.
ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents)
10
Supply Current in mA
8
3.6 V
6
2.7 V
4
2
0
1
2
3
4
5
Frequency in MHz
Note: T = 25 °C
Figure 1.
January 21, 2005 Am29LV800D_00_A4_E
Typical ICC1 vs. Frequency
Am29LV800D
29
P R E L I M I N A R Y
Test Conditions
Table 7. Test Specifications
3.3
Test Condition
2.7 kΩ
Device
Under
Test
CL
Output Load
30
Input Rise and Fall Times
Figure 1.
Test Setup
100
pF
5
ns
0.0–3.0
V
Input timing
measurement reference
levels
1.5
V
Output timing
measurement reference
levels
1.5
V
Input Pulse Levels
Note: Diodes are IN3064 or
Unit
1 TTL gate
Output Load Capacitance,
CL
(including jig capacitance)
6.2 kΩ
-90,
-120
-70
Key to Switching Waveforms
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
3.0 V
Input
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
1.5 V
1.5 V
Measurement Level
Output
0.0 V
Figure 1. Input Waveforms and
Measurement Levels
30
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
AC Characteristics
Read Operations
Parameter
Speed Options
JEDEC
Std
tAVAV
tRC
Read Cycle Time (Note 1)
tAVQV
tACC
Address to Output Delay
tELQV
tCE
Chip Enable to Output Delay
tGLQV
tOE
tEHQZ
tGHQZ
tAXQX
Description
Test Setup
-70
-90
-120 Unit
Min
70
90
120
ns
CE# = VIL
OE# = VIL
Max
70
90
120
ns
OE# = VIL
Max
70
90
120
ns
Output Enable to Output Delay
Max
30
35
50
ns
tDF
Chip Enable to Output High Z (Note 1)
Max
25
30
30
ns
tDF
Output Enable to Output High Z (Note 1)
Max
25
30
30
ns
Read
Min
0
ns
Toggle and
Data# Polling
Min
10
ns
Min
0
ns
tOEH
Output Enable
Hold Time (Note 1)
tOH
Output Hold Time From Addresses, CE# or
OE#, Whichever Occurs First (Note 1)
Notes:
1. Not 100% tested.
2. See Figure 1 and Table 7 for test specifications.
tRC
Addresses Stable
Addresses
tACC
CE#
tDF
tOE
OE#
tOEH
WE#
tCE
tOH
HIGH Z
HIGH Z
Output Valid
Outputs
RESET#
RY/BY#
0V
Figure 1.
January 21, 2005 Am29LV800D_00_A4_E
Read Operations Timings
Am29LV800D
31
P R E L I M I N A R Y
AC Characteristics
Hardware Reset (RESET#)
Parameter
JEDEC
Std
Description
Test Setup
All Speed Options
Unit
tREADY
RESET# Pin Low (During Embedded
Algorithms) to Read or Write (See Note)
Max
20
µs
tREADY
RESET# Pin Low (NOT During Embedded
Algorithms) to Read or Write (See Note)
Max
500
ns
tRP
RESET# Pulse Width
Min
500
ns
tRH
RESET# High Time Before Read (See
Note)
Min
50
ns
tRPD
RESET# Low to Standby Mode
Min
20
µs
tRB
RY/BY# Recovery Time
Min
0
ns
Note: Not 100% tested.
RY/BY#
CE#, OE#
tRH
RESET#
tRP
tReady
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
tReady
RY/BY#
tRB
CE#, OE#
RESET#
tRP
Figure 1.
32
RESET# Timings
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
AC Characteristics
Word/Byte Configuration (BYTE#)
Parameter
JEDEC
Std
Speed Options
Description
-70
-90
-120
tELFL/tELFH
CE# to BYTE# Switching Low or High
Max
tFLQZ
BYTE# Switching Low to Output HIGH
Z
Max
25
30
30
ns
tFHQV
BYTE# Switching High to Output
Active
Min
70
90
120
ns
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
5
Unit
ns
33
P R E L I M I N A R Y
CE#
OE#
BYTE#
BYTE#
Switching
from word
to byte
mode
tELFL
Data Output
(DQ0–DQ14)
DQ0–DQ14
DQ15
Output
DQ15/A-1
Data
Output
Address
Input
tFLQ
tELFH
BYTE#
BYTE#
Switching
from byte
to word
mode
DQ0–DQ14
Data
Output
DQ15/A-1
Address
Input
Data Output
(DQ0–DQ14)
DQ15
Output
tFHQ
Figure 1.
BYTE# Timings for Read Operations
CE#
The falling edge of the last WE#
WE#
BYTE#
tSET
(tAS)
tHOLD
Note: Refer to the Erase/Program Operations table for tAS and tAH specifications.
Figure 1.
34
BYTE# Timings for Write Operations
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
AC Characteristics
Erase/Program Operations
Parameter
Speed Options
JEDEC
Std
Description
-70
-90
-120
Unit
tAVAV
tWC
Write Cycle Time (Note 1)
Min
70
90
120
ns
tAVWL
tAS
Address Setup Time
Min
tWLAX
tAH
Address Hold Time
Min
45
45
50
ns
tDVWH
tDS
Data Setup Time
Min
35
45
50
ns
tWHDX
tDH
Data Hold Time
Min
0
ns
tOES
Output Enable Setup Time
Min
0
ns
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
0
ns
tGHWL
tGHWL
tELWL
tCS
CE# Setup Time
Min
0
ns
tWHEH
tCH
CE# Hold Time
Min
0
ns
tWLWH
tWP
Write Pulse Width
Min
tWHWL
tWPH
Write Pulse Width High
Min
30
Byte
Typ
8
Word
Typ
16
Typ
1
sec
tWHWH1
tWHWH1 Programming Operation (Note 2)
tWHWH2
tWHWH2 Sector Erase Operation (Note 2)
35
35
50
ns
ns
µs
tVCS
VCC Setup Time (Note 1)
Min
50
µs
tRB
Recovery Time from RY/BY#
Min
0
ns
Program/Erase Valid to RY/BY# Delay
Min
90
ns
tBUSY
Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” section for more information.
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
35
P R E L I M I N A R Y
AC Characteristics
Program Command Sequence (last two cycles)
tAS
tWC
Addresses
Read Status Data (last two cycles)
555h
PA
PA
PA
tAH
CE#
tCH
OE#
tWHWH1
tWP
WE#
tWPH
tCS
tDS
tDH
A0h
Data
PD
Status
tBUSY
DOUT
tRB
RY/BY#
VCC
tVCS
Notes:
1. PA = program address, PD = program data, DOUT is the true data at the program address.
2. Illustration shows device in word mode.
Figure 1.
36
Program Operation Timings
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
AC Characteristics
Erase Command Sequence (last two cycles)
tAS
tWC
2AAh
Addresses
Read Status Data
VA
SA
VA
555h for chip erase
tAH
CE#
tCH
OE#
tWP
WE#
tWPH
tCS
tWHWH2
tDS
tDH
Data
55h
In
Progress
30h
Complete
10 for Chip Erase
tBUSY
tRB
RY/BY#
tVCS
VCC
Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation
Status”).
2. Illustration shows device in word mode.
Figure 1.
January 21, 2005 Am29LV800D_00_A4_E
Chip/Sector Erase Operation Timings
Am29LV800D
37
P R E L I M I N A R Y
AC Characteristics
tRC
Addresses
VA
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
tOEH
tDF
WE#
tOH
High Z
DQ7
Complement
Complement
Status Data
Status Data
Valid Data
True
High Z
DQ0–DQ6
Valid Data
True
tBUSY
RY/BY#
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data
read cycle.
Figure 1.
Data# Polling Timings (During Embedded Algorithms)
tRC
Addresses
VA
VA
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
tOEH
tDF
WE#
tOH
High Z
DQ6/DQ2
tBUSY
Valid Status
Valid Status
(first read)
(second read)
Valid Status
Valid Data
(stops toggling)
RY/BY#
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read
cycle, and array data read cycle.
Figure 1.
38
Toggle Bit Timings (During Embedded Algorithms)
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
AC Characteristics
Enter
Embedded
Erasing
Erase
Suspend
Erase
WE#
Enter Erase
Suspend Program
Erase Suspend
Read
Erase
Resume
Erase
Suspend
Program
Erase Suspend
Read
Erase
Complete
Erase
DQ6
DQ2
Note: The system may use CE# or OE# to toggle DQ2 and DQ6. DQ2 toggles only when read at an address within an
erase-suspended sector.
Figure 1.
DQ2 vs. DQ6
Temporary Sector Unprotect
Parameter
JEDEC
Std
Description
All Speed Options
Unit
tVIDR
VID Rise and Fall Time (See Note)
Min
500
ns
tRSP
RESET# Setup Time for Temporary
Sector Unprotect
Min
4
µs
Note: Not 100% tested.
12 V
RESET#
0 or 3 V
0 or 3 V
tVIDR
tVIDR
Program or Erase Command Sequence
CE#
WE#
tRSP
RY/BY#
Figure 1.
January 21, 2005 Am29LV800D_00_A4_E
Temporary Sector Unprotect
Timing Diagram
Am29LV800D
39
P R E L I M I N A R Y
AC Characteristics
VID
VIH
RESET#
SA, A6,
A1, A0
Valid*
Valid*
Sector Protect/Unprotect
Data
60h
Valid*
Verify
60h
40h
Status
Sector Protect: 150 µs
Sector Unprotect: 15 ms
1 µs
CE#
WE#
OE#
* For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0.
Figure 1.
40
Sector Protect/Unprotect
Timing Diagram
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
AC Characteristics
Alternate CE# Controlled
Erase/Program Operations
Parameter
Speed Options
JEDEC
Std
Description
-70
-90
-120
Unit
tAVAV
tWC
Write Cycle Time (Note 1)
Min
70
90
120
ns
tAVEL
tAS
Address Setup Time
Min
tELAX
tAH
Address Hold Time
Min
45
45
50
ns
tDVEH
tDS
Data Setup Time
Min
35
45
50
ns
tEHDX
tDH
Data Hold Time
Min
0
ns
tOES
Output Enable Setup Time
Min
0
ns
tGHEL
tGHEL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
tWLEL
tWS
WE# Setup Time
Min
0
ns
tEHWH
tWH
WE# Hold Time
Min
0
ns
tELEH
tCP
CE# Pulse Width
Min
tEHEL
tCPH
CE# Pulse Width High
Min
30
tWHWH1
tWHWH1
Programming Operation
(Note 2)
Byte
Typ
8
Word
Typ
16
tWHWH2
tWHWH2
Sector Erase Operation (Note 2)
Typ
1
0
35
35
ns
50
ns
ns
µs
sec
Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance”
section for more information.
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
41
P R E L I M I N A R Y
AC Characteristics
555 for program
2AA for erase
PA for program
SA for sector erase
555 for chip erase
Data# Polling
Addresses
PA
tWC
tAS
tAH
tWH
WE#
tGHEL
OE#
tWHWH1 or 2
tCP
CE#
tWS
tCPH
tBUSY
tDS
tDH
DQ7#
Data
tRH
A0 for program
55 for erase
DOUT
PD for program
30 for sector erase
10 for chip erase
RESET#
RY/BY#
Notes:
1. PA = program address, PD = program data, DQ7# = complement of the data written to the device, DOUT =
data written to the device.
2. Figure indicates the last two bus cycles of command
sequence.
3. Word mode address used as an example.
Figure 1.
42
Alternate CE# Controlled Write Operation Timings
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Erase and Programming Performance
Parameter
Typ (Note
1)
Max (Note 2)
Unit
Comments
1
10
s
Excludes 00h programming
prior to erasure
Sector Erase Time
Chip Erase Time
14
s
Byte Programming Time
8
300
µs
Word Programming Time
16
360
µs
Byte Mode
8.4
25
s
Word Mode
5.8
17
s
Chip Programming
Time
(Note 3)
Excludes system level
overhead (Note 5)
Notes:
1. Typical program and erase times assume the following conditions: 25°C, 3.0 V VCC, 1,000,000 cycles.
Additionally, programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 2.7 V, 1,000,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most
bytes program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program
command. See Table 5 for further information on command definitions.
6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles.
Latchup Characteristics
Description
Min
Max
Input voltage with respect to VSS on all pins except I/O pins
(including A9, OE#, and RESET#)
–1.0 V
12.5 V
Input voltage with respect to VSS on all I/O pins
–1.0 V
VCC + 1.0 V
–100 mA
+100 mA
VCC Current
Includes all pins except VCC. Test conditions: VCC =
3.0 V, one pin at a time.
TSOP and SO Pin Capacitance
Parameter
Symbol
Parameter Description
Test Setup
Typ
Max
Unit
CIN
Input Capacitance
VIN = 0
6
7.5
pF
COUT
Output Capacitance
VOUT = 0
8.5
12
pF
CIN2
Control Pin Capacitance
VIN = 0
7.5
9
pF
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
Data Retention
Parameter
Test
Conditions
Min
Unit
150°C
10
Years
125°C
20
Years
Minimum Pattern Data Retention Time
43
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Physical Dimensions*
TS 048—48-Pin Standard TSOP
Dwg rev AA; 10/99
* For reference only. BSC is an ANSI standard for
January 21, 2005 Am29LV800D_00_A4_E
Basic Space Centering.
Am29LV800D
44
P R E L I M I N A R Y
Physical Dimensions
TSR048—48-Pin Reverse TSOP
Dwg rev AA; 10/99
* For reference only. BSC is an ANSI standard for
Basic Space Centering.
45
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Physical Dimensions
FBB 048—48-Ball Fine-Pitch Ball Grid Array (FBGA) 6 x 9 mm
Dwg rev AF; 10/99
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
46
P R E L I M I N A R Y
Physical Dimensions
VBK 048 - 48 Ball Fine-Pitch Ball Grid Array (FBGA) 6.15 x 8.15 mm
0.10 (4X)
D
D1
A
6
5
e
7
4
E
SE
E1
3
2
1
H
PIN A1
CORNER
INDEX MARK
10
6
B
G
F
fb
E
D
C
SD
B
A
A1 CORNER
7
f 0.08 M C
TOP VIEW
f 0.15 M C A B
BOTTOM VIEW
A
0.10 C
A2
SEATING PLANE
A1
C
0.08 C
SIDE VIEW
NOTES:
PACKAGE
VBK 048
JEDEC
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994.
N/A
2. ALL DIMENSIONS ARE IN MILLIMETERS.
6.15 mm x 8.15 mm NOM
PACKAGE
SYMBOL
MIN
NOM
MAX
A
---
---
1.00
A1
0.18
---
---
A2
0.62
---
0.76
3. BALL POSITION DESIGNATION PER JESD 95-1, SPP-010 (EXCEPT
AS NOTED).
NOTE
4.
OVERALL THICKNESS
BALL HEIGHT
8.15 BSC.
BODY SIZE
E
6.15 BSC.
BODY SIZE
N IS THE TOTAL NUMBER OF SOLDER BALLS.
D1
5.60 BSC.
BALL FOOTPRINT
E1
4.00 BSC.
BALL FOOTPRINT
MD
8
ROW MATRIX SIZE D DIRECTION
ME
6
ROW MATRIX SIZE E DIRECTION
N
48
fb
0.33
---
TOTAL BALL COUNT
0.43
BALL DIAMETER
e
0.80 BSC.
BALL PITCH
SD / SE
0.40 BSC.
SOLDER BALL PLACEMENT
---
REPRESENTS THE SOLDER BALL GRID PITCH.
SYMBOL "ME" IS THE BALL COLUMN MATRIX SIZE IN THE
"E" DIRECTION.
BODY THICKNESS
D
e
5. SYMBOL "MD" IS THE BALL ROW MATRIX SIZE IN THE
"D" DIRECTION.
DEPOPULATED SOLDER BALLS
6
DIMENSION "b" IS MEASURED AT THE MAXIMUM BALL
DIAMETER IN A PLANE PARALLEL TO DATUM C.
7
SD AND SE ARE MEASURED WITH RESPECT TO DATUMS
A AND B AND DEFINE THE POSITION OF THE CENTER
SOLDER BALL IN THE OUTER ROW.
WHEN THERE IS AN ODD NUMBER OF SOLDER BALLS IN
THE OUTER ROW PARALLEL TO THE D OR E DIMENSION,
RESPECTIVELY, SD OR SE = 0.000.
WHEN THERE IS AN EVEN NUMBER OF SOLDER BALLS IN
THE OUTER ROW, SD OR SE = e/2
8. NOT USED.
9. "+" INDICATES THE THEORETICAL CENTER OF DEPOPULATED
BALLS.
10 A1 CORNER TO BE IDENTIFIED BY CHAMFER, LASER OR INK
MARK, METALLIZED MARK INDENTATION OR OTHER MEANS.
3338 \ 16-038.25b
47
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005
P R E L I M I N A R Y
Physical Dimensions
SO 044—44-Pin Small Outline Package
Dwg rev AC; 10/99
January 21, 2005 Am29LV800D_00_A4_E
Am29LV800D
48
P R E L I M I N A R Y
Revision Summary
Global
Converted datasheet to Preliminary.
Revision A (January 19, 2004)
Changed data sheet status to Advance Information to indicate new 0.23 µm process technology. The base device part number has
changed from Am29LV800B to Am29LV800D.
Specifications for ICC1, tWHWH1, t WHWH2 have
changed. Extended temperature is no longer
available. All other specifications in the data
sheet remain unchanged. Deleted references to
KGD option in Connection Diagrams section.
(This document was formerly released as publication 21490, revision H.)
Ordering Information
Added Pb-Free packages and updated Valid
Combinations tables to include changes.
Absolute Maximum Rating
Changed ambient with power applied from
125°C to 85°C.
Revision A+3 (June 23, 2004)
Global change
Changed all Helvetica/Times Roman fonts to Gill
Sans For AMD or Verdana.
Revision A+1 (February 3, 2004)
“Physical Dimensions” on page 47
Distinctive Characteristics, General Description,
Ordering Information
Added VBK048 Package Drawing.
Deleted references to KGD option. (This document was formerly released as publication
21490, revision H1.)
Added “WC =...” to Standard Products table.
“Ordering Information” on page 8
Revision A+2 (April 2, 2004)
Added “WCC, WCI, WCD, WCF” to Valid combinations table.
General Description
Added Colophon.
Removed unlock bypass section.
Revision A+4 (January 21, 2005)
Added migration statement.
Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the
public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility,
aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for
any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that FASL will not be liable to you
and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices
have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures
into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior
authorization by the respective government entity will be required for export of those products.
Trademarks
Copyright © 2000–2005 Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.
ExpressFlash is a trademark of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
49
Am29LV800D
Am29LV800D_00_A4_E January 21, 2005