AOSMD AOL1448 N-channel enhancement mode field effect transistor Datasheet

AOL1448
N-Channel Enhancement Mode Field Effect Transistor
General Description
Features
The AOL1448 uses advanced trench technology to
provide excellent RDS(ON) with low gate charge.
This device is suitable for high side switch in SMPS and
general purpose applications.
VDS (V) =30V
ID = 36A
(VGS = 10V)
RDS(ON) < 9.5mΩ
(VGS = 10V)
RDS(ON) < 14mΩ
(VGS = 4.5V)
- RoHS Compliant
- Halogen Free
100% UIS Tested!
100% R g Tested!
UltraSO-8TM Top View
D
D
Bottom tab
connected to
drain
S
G
G
S
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
Drain-Source Voltage
VDS
Gate-Source Voltage
VGS
TC=25°C
Continuous Drain
Current G
Pulsed Drain Current C
Avalanche Current C
Repetitive avalanche energy L=0.1mH
TC=25°C
Power Dissipation B
C
TA=25°C
Power Dissipation
A
Junction and Storage Temperature Range
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A D
Maximum Junction-to-Case
Alpha & Omega Semiconductor, Ltd.
A
9
IAR
20
A
EAR
20
mJ
30
2
W
1.3
TJ, TSTG
-55 to 175
Symbol
t ≤ 10s
Steady-State
Steady-State
W
15
PDSM
TA=70°C
A
11
PD
TC=100°C
V
90
IDSM
TA=70°C
±20
28
IDM
TA=25°C
Continuous Drain
Current
Units
V
36
ID
TC=100°C
Maximum
30
RθJA
RθJC
Typ
20
48
3.5
°C
Max
25
60
5
Units
°C/W
°C/W
°C/W
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AOL1448
Electrical Characteristics (TJ=25°C unless otherwise noted)
Parameter
Symbol
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
Conditions
Min
ID=250µA, VGS=0V
IGSS
VGS(th)
Gate-Body leakage current
VDS=0V, VGS= ±20V
Gate Threshold Voltage
On state drain current
VDS=VGS ID=250µA
1.2
VGS=10V, VDS=5V
90
TJ=55°C
5
VGS=10V, ID=20A
Static Drain-Source On-Resistance
TJ=125°C
VGS=4.5V, ID=20A
µA
±100
nA
1.7
2.2
V
7.5
9.5
11.5
14
11
14
mΩ
1
V
30
A
pF
A
gFS
Forward Transconductance
VDS=5V, ID=20A
43
VSD
Diode Forward Voltage
IS=1A,VGS=0V
0.7
IS
Maximum Body-Diode Continuous Current
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Units
V
1
Zero Gate Voltage Drain Current
RDS(ON)
Max
30
VDS=30V, VGS=0V
IDSS
ID(ON)
Typ
mΩ
S
600
750
980
200
245
365
pF
40
70
100
pF
0.4
0.8
1.4
Ω
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge
9
11.5
14
nC
Qg(4.5V) Total Gate Charge
4
5
6
nC
1.6
2
2.4
nC
1.5
2.5
3.5
nC
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
Qgs
Gate Source Charge
Qgd
Gate Drain Charge
tD(on)
Turn-On DelayTime
tr
Turn-On Rise Time
tD(off)
Turn-Off DelayTime
tf
trr
Turn-Off Fall Time
Qrr
VGS=0V, VDS=15V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
VGS=10V, VDS=15V, ID=20A
VGS=10V, VDS=15V, RL=0.75Ω,
RGEN=3Ω
IF=20A, dI/dt=500A/µs
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge IF=20A, dI/dt=500A/µs
5
ns
3
ns
18
ns
3
ns
9
11
13
18
23
28
ns
nC
A: The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The
Power dissipation PDSM is based on R θJA and the maximum allowed junction temperature of 150°C. The value in any given application depends
on the user's specific board design, and the maximum temperature of 175°C may be used if the PCB allow s it.
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C: Repetitive rating, pulse width limited by junction temperature TJ(MAX)=175°C. Ratings are based on low frequency and duty cycles to keep
initial TJ =25°C.
D. The RθJA is the sum of the thermal impedence from junction to case RθJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming
a maximum junction temperature of TJ(MAX)=175°C. The SOA curve provides a single pulse ratin g.
G. The maximum current rating is limited by bond-wires.
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.
Rev1 : Jan-09
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Alpha & Omega Semiconductor, Ltd.
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AOL1448
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
60
90
10V
6V
80
70
7V
40
4V
50
ID(A)
ID (A)
60
VDS=5V
50
4.5V
40
3.5
30
20
30
125°C
20
10
VGS=3V
10
25°C
0
0
0
1
2
3
4
0
5
1
16
4
5
Normalized On-Resistance
2
14
RDS(ON) (mΩ )
3
VGS(Volts)
Figure 2: Transfer Characteristics (Note E)
VDS (Volts)
Fig 1: On-Region Characteristics (Note E)
VGS=4.5V
12
10
8
6
VGS=10V
1.8
VGS=10V
ID=20A
1.6
17
5
2
10
VGS=4.5V
1.4
1.2
ID=20A
1
0.8
4
0
5
0
10
15
20
25
30
ID (A)
Figure 3: On-Resistance vs. Drain Current and
Gate Voltage (Note E)
25
50
75
100
125
150
175
200
0
Temperature (°C)
Figure 4: On-Resistance vs. Junction
18
Temperature (Note E)
35
1.0E+02
ID=20A
30
1.0E+01
40
25
1.0E+00
20
1.0E-01
IS (A)
RDS(ON) (mΩ )
2
15
1.0E-02
125°C
125°C
25°C
1.0E-03
10
1.0E-04
25°C
5
1.0E-05
0
2
4
6
8
10
VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
Alpha & Omega Semiconductor, Ltd.
0.0
0.2
0.4
0.6
0.8
1.0
1.2
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
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AOL1448
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
1200
10
VDS=15V
ID=20A
1000
Ciss
Capacitance (pF)
VGS (Volts)
8
6
4
2
400
Coss
Crss
0
0
2
4
6
8
10
Qg (nC)
Figure 7: Gate-Charge Characteristics
12
0
RDS(ON)
limited
10
15
20
25
VDS (Volts)
Figure 8: Capacitance Characteristics
100µs
1ms
10ms
DC
1
TJ(Max)=175°C
TC=25°C
0.1
0.01
0.01
0.1
160
10µs
Power (W)
10µs
100
10
5
30
200
1000
ID (Amps)
600
200
0
TJ(Max)=175°C
TC=25°C
17
5
2
10
120
80
40
1
VDS (Volts)
10
100
10
D=Ton/T
TJ,PK=TC+PDM.ZθJC.RθJC
0
0.0001
0.001
0.01
0.1
1
0
10
Pulse Width (s)
18
Figure 10: Single Pulse Power Rating Junction-toCase (Note F)
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
Zθ JC Normalized Transient
Thermal Resistance
800
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
40
RθJC=5°C/W
1
PD
0.1
Ton
T
Single Pulse
0.01
0.00001
0.0001
0.001
0.01
0.1
1
10
100
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Alpha & Omega Semiconductor, Ltd.
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AOL1448
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
35
TA=25°C
30
80
60
Power Dissipation (W)
IAR(A) Peak Avalanche Current
100
TA=100°C
TA=150°C
40
TA=125°C
20
25
20
15
10
5
0
0
0.000001
0
0.00001
0.0001
0.001
Time in avalanche, tA (s)
Figure 12: Single Pulse Avalanche capability
(Note C)
25
50
75
100
125
175
TCASE (°C)
Figure 13: Power De-rating (Note F)
10000
40
35
TA=25°C
1000
30
25
Power (W)
Current rating ID(A)
150
20
15
17
5
2
10
100
10
10
5
1
0
0
25
50
75
100
125
150
0
175
Zθ JA Normalized Transient
Thermal Resistance
10
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
1
0
0
0.01
0.1
1
10
100 1000
0
Pulse Width (s)
18
Figure 15: Single Pulse Power Rating Junction-toAmbient (Note H)
TCASE (°C)
Figure 14: Current De-rating (Note F)
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
40
RθJA=60°C/W
0.1
PD
0.01
Single Pulse
Ton
0.001
0.00001
0.0001
0.001
0.01
0.1
1
T
10
100
1000
Pulse Width (s)
Figure 16: Normalized Maximum Transient Thermal Impedance (Note H)
Alpha & Omega Semiconductor, Ltd.
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AOL1448
Gate Charge Test Circuit & Waveform
Vgs
Qg
10V
+
+ Vds
VDC
-
Qgs
Qgd
VDC
-
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & Waveforms
RL
Vds
Vds
Vgs
90%
+ Vdd
DUT
VDC
-
Rg
10%
Vgs
Vgs
t d(on)
tr
t d(off)
t on
tf
t off
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
2
EAR= 1/2 LIAR
Vds
BVDSS
Vds
Id
+ Vdd
Vgs
Vgs
I AR
VDC
-
Rg
Id
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q rr = - Idt
Vds +
DUT
Vgs
Vds Isd
L
Vgs
Ig
Alpha & Omega Semiconductor, Ltd.
Isd
+ Vdd
t rr
dI/dt
I RM
Vdd
VDC
-
IF
Vds
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