Hanbit HMS3224Z3-12 Sram module 768kbit (32k x 24-bit) Datasheet

HANBit
HMS3224M3/Z3
HAN
SRAM MODULE 768KBit (32K x 24-Bit)
BIT
Part No.
HMS3224M3, HMS3224Z3
GENERAL DESCRIPTION
The HMS3224M3/Z3 is a high-speed static random access memory (SRAM) module containing 32,768 words
organized in a x24-bit configuration. The module consists of three 32K x 8 SRAMs mounted on a 56-pin, singlesided, FR4-printed circuit board.
Writing to the device is accomplished when the chip enable (/CE) and write enable(/WE) inputs are both LOW.
Data on the input/output pins (DQ0 through DQ23) of the device is written into the memory location specified
on the address pins (A0 through A14).
Reading the device is accomplished by taking the chip enable (/CE) and output enable(/OE) LOW while write
enable(/WE) remains HIGH. Under these conditions, the contents of the memory location specified on the address
pins will appear on the input/output pins.
The input/output pins remains in a high-impedance state unless the module is selected, outputs are enabled, and
write enable is HIGH.
PIN ASSIGNMENT
FEATURES
Š Access times : 12, 15 and 20ns
Š High-density 768Kbit design
Š High-reliability, high-speed design
Š Single + 5V ±0.5V power supply
Š 56-pin, low-active power design
Š All inputs and outputs are TTL-compatible
Š Industry-standard pinout
Š FR4-PCB design
Š Part identification
Vcc
DQ1
DQ3
DQ5
DQ7
Vss
A1
A3
A5
A7
NC
Vss
DQ9
DQ11
DQ13
DQ15
NC
/OE
A9
A11
A13
NC
Vss
DQ17
DQ19
DQ21
DQ23
Vcc
HMS3224M3 : 56Pin SIMM Design
HMS3224Z3 : 56Pin ZIP Design
→Pin-compatible with the HMS3224M3
OPTIONS
MARKING
Š Timing
12ns access
-12
15ns access
-15
20ns access
-20
Š Packages
56-pin SIMM
M
56-pin ZIP
Z
1
3
5
7
9
11
13
15
17
19
21
23
25
27
29
31
33
35
37
39
41
43
45
47
49
51
53
55
2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
32
34
36
38
40
42
44
46
48
50
52
54
56
Vcc
DQ0
DQ2
DQ4
DQ6
Vss
A0
A2
A4
A6
/CE
NC
DQ8
DQ10
DQ12
DQ14
Vss
/WE
A8
A10
A12
A14
Vss
DQ16
DQ18
DQ20
DQ22
Vcc
ZIP
TOP VIEW
1
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
FUNCTIONAL BLOCK DIAGRAM
DQ0 - DQ23
A0 - A14
24
15
A0-14
DQ 0-7
/WE
U1
/OE
/CE
/CE1
A0-14
DQ 8-15
/WE
U2
/OE
/CE
/CE2
A0-14
DQ16-23
/WE
/OE
/WE
/OE
U3
/CE
/CE3
TRUTH TABLE
MODE
/OE
/CE
/WE
OUTPUT
POWER
STANDBY
X
H
X
HIGH-Z
STANDBY
NOT SELECTED
H
L
H
HIGH-Z
ACTIVE
READ
L
L
H
Dout
ACTIVE
WRITE
X
L
L
Din
ACTIVE
2
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
RATING
VIN,OUT
-0.5V to +7.0V
Voltage on Vcc Supply Relative to Vss
VCC
-0.5V to +7.0V
Power Dissipation
PD
3W
TSTG
-65oC to +150oC
Voltage on Any Pin Relative to Vss
Storage Temperature
Operating Temperature
TA
0oC to +70oC
Š Stresses greater than those listed under " Absolute Maximum Ratings" may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in
the operating section of this specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
RECOMMENDED DC OPERATING CONDITIONS
PARAMETER
*
( TA=0 to 70 o C )
SYMBOL
MIN
TYP.
MAX
Supply Voltage
VCC
4.5V
5.0V
5.5V
Ground
VSS
0
0
0
Input High Voltage
VIH
2.2
-
Vcc+0.5V**
Input Low Voltage
VIL
-0.5*
-
0.8V
VIL(Min.) = -2.0V (Pulse Width ≤ 10ns) for I ≤ 20 mA
** VIH(Min.) = Vcc+2.0V (Pulse Width ≤ 10ns) for I ≤ 20 mA
DC AND OPERATING CHARACTERISTICS (1)(0oC ≤ TA ≤ 70 oC ; Vcc = 5V ± 0.5V )
PARAMETER
Input Leakage Current
Output Leakage Current
TEST CONDITIONS
VIN = Vss to Vcc
CE=VIH or OE =VIH or WE=VIL
VOUT=Vss to VCC
SYMBO
L
MIN
MAX
UNITS
ILI
-6
6
µA
IL0
-6
6
µA
2.4
Output High Voltage
IOH = -4.0mA
VOH
Output Low Voltage
IOL = 8.0mA
VOL
V
0.4
V
* Vcc=5.0V, Temp=25 oC
3
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
DC AND OPERATING CHARACTERISTICS (2)
MAX
DESCRIPTION
TEST CONDITIONS
Min. Cycle, 100% Duty
/CE=VIL, VIN=VIH or VIL,
IOUT=0mA
Power Supply
Current: Operating
Power Supply
Current :Standby
SYMBOL
-12
-15
-20
UNIT
lCC
495
450
420
mA
Min. Cycle, /CE=VIH
lSB
120
120
120
mA
f=0MHZ, /CE≥VCC-0.2V,
VIN≥ VCC-0.2V or VIN≤0.2V
lSB1
6
6
6
mA
CAPACITANCE
DESCRIPTION
TEST CONDITIONS
SYMBOL
MAX
UNIT
Input /Output Capacitance
VI/O=0V
CI/O
24
pF
Input Capacitance
VIN=0V
CIN
21
pF
* NOTE : Capacitance is sampled and not 100% tested
AC CHARACTERISTICS (0oC ≤ TA ≤ 70 oC ; Vcc = 5V ± 0.5V, unless otherwise specified)
TEST CONDITIONS
PARAMETER
VALUE
Input Pulse Level
0 to 3V
Input Rise and Fall Time
3ns
Input and Output Timing Reference Levels
1.5V
Output Load
See below
Output
Load
Output Load (B)
for tHZ, tLZ, tWHZ, tOW, tOLZ & tOHZ
+5V
+5V
480Ω
DOUT
255Ω
30pF*
480Ω
DOUT
255Ω
4
5pF*
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
READ CYCLE
-12
PARAMETER
-15
-20
SYMBOL
UNIT
MIN
MAX
12
MIN
MAX
15
MIN
MAX
Read Cycle Time
tRC
ns
Address Access Time
tAA
12
15
20
ns
Chip Select to Output
tCO
12
15
20
ns
Output Enable to Output
tOE
6
7
9
ns
Output Enable to Low-Z Output
tOLZ
0
0
0
ns
Chip Enable to Low-Z Output
tLZ
3
3
3
ns
Output Disable to High-Z Output
tOHZ
0
6
0
7
0
10
ns
Chip Disable to High-Z Output
tHZ
0
6
0
7
0
10
ns
Output Hold from Address Change
tOH
3
3
3
ns
Chip Select to Power Up Time
tPU
0
0
0
ns
Chip Select to Power Down Time
tPD
20
12
15
20
ns
WRITE CYCLE
-12
PARAMETER
-15
-20
SYMBOL
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
Write Cycle Time
tWC
12
15
20
ns
Chip Select to End of Write
tCW
9
11
13
ns
Address Set-up Time
tAS
0
0
0
ns
Address Valid to End of Write
tAW
9
12
13
ns
Write Pulse Width
tWP
9
12
13
ns
Write Recovery Time
tWR
12
0
0
ns
Write to Output High-Z
tWHZ
0
Data to Write Time Overlap
tDW
7
8
10
ns
Data Hold from Write Time
tDH
0
0
0
ns
End of Write to Output Low-Z
tOW
0
0
0
ns
5
6
0
8
0
8
ns
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
TIMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE( Address Controlled) ( /CE =/OE = VIL , /WE = VIH)
tRC
Address
tAA
tOH
Data out
Previous Data Valid
Data Valid
TIMING WAVEFORM OF READ CYCLE ( /WE=VIH )
tRC
Address
tHZ(3,4,5)
tAA
tCO
/CE
tLZ(4,5)
tOHZ
tOE
/OE
tOH
tOLZ
Data Out
Vcc Supply
Current
High-Z
Valid Data
lCC
lSB
tPD
tPU
50%
50%
Notes (Read Cycle)
1. /WE is high for read cycle.
2. All read cycle timing is referenced from the last valid address to the first transition address.
3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition are not referenced to VOH
or VOL levels.
4. At any given temperature and voltage condition, tHZ (max.) is less than tLZ (min.) both for a given device and from device
to device.
5. Transition is measured ± 200mV from steady state voltage with Load (B). This parameter is sampled and not 100%
tested.
6. Device is continuously selected with /CE = VIL.
7. Address valid prior to coincident with /CE transition low.
6
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
TIMING WAVEFORM OF WRITE CYCLE (/OE = Clock )
tWC
Address
tAW
tWR(5)
/OE
tCW(3)
/CE
tAS(4)
tWP(2)
/WE
tDW
tDH
High-Z
Data In
tOHZ(6)
tOW
Data Out
High-Z
TIMING WAVEFORM OF WRITE CYCLE (/OE Low Fixed )
tWC
Address
tAW
tWR(5)
tCW(3)
/CE
tAS(4)
tOH
tWP(2)
/ WE
tDW
tDH
High-Z
Data In
tWHZ(6,7)
tOW
(10)
(9)
High-Z(8)
Data Out
Notes(Write Cycle)
1. All write cycle timing is referenced from the last valid address to the first transition address.
2. A write occurs during the overlap of a low /CE and a low /WE. A write begins at the latest transition among
/CE going low and /WE going low: A write ends at the earliest transition among /CE going high and /WE going high.
tWP is measured from the beginning of write to the end of write.
7
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
3. tCW is measured from the later of /CE going low to the end of write.
4. tAS is measured from the address valid to the beginning of write.
5. tWR is measured from the end of write to the address change. tWR applied in case a write ends as /CE, or /WE going high.
6. If /OE,/CE and /WE are in the read mode during this period, the I/O pins are in the output low-Z state. Inputs of
opposite
phase of the output must not be applied because bus contention can occur.
7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and
write
cycle.
8. If /CE goes low simultaneously with /WE going low or after /WE going low, the outputs remain high impedance state.
9. DOUT is the read data of the new address.
10. When /CE is low: I/O pins are in the output state. The input signals in the opposite phase leading to the output should
not be applied.
FUNCTIONAL DESCRIPTION
/CE
/WE
/OE
MODE
I/O PIN
SUPPLY CURRENT
H
X*
X
Not Select
High-Z
l SB, l SB1
L
H
H
Output Disable
High-Z
lCC
L
H
L
Read
DOUT
lCC
L
L
X
Write
DIN
lCC
Note: X means Don't Care
8
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
PACKAGING INFORMATION
ZIP Design
73.50mm
CUT 1.5 mm
12.5 mm
56
1
6 mm
1.27 mm
69.85 mm
1.29±0.08mm
2.5 mm
9
HANBit Electronics Co.,Ltd.
HANBit
HMS3224M3/Z3
ODERING INFORMATION
1
2
3
HMS
4
5
6
7
8
32 24 M 3 - 15
15ns Access Time
HANBit
Component
Memory
Modules
SIMM
X24bit
SRAM
32K
1. - Product Line Identifier
HANBit Technology --------------------------------------- H
2. - Memory Modules
3. - SRAM
4. - Depth : 32K
5. - Width : x 24bit
6. - Package Code
SIMM ------------------------------------------------------- M
ZIP
------------------------------------------------------- Z
7. – Number of Memory Components
8. - Access time
10 ----------------------------------------------------------- 10ns
12 ----------------------------------------------------------- 12ns
15 ----------------------------------------------------------- 15ns
17 ----------------------------------------------------------- 17ns
20 ----------------------------------------------------------- 20ns
10
HANBit Electronics Co.,Ltd.
Similar pages