ONSEMI BCW70LT1

BCW70LT1
General Purpose
Transistors
PNP Silicon
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MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Collector–Emitter Voltage
VCEO
–45
Vdc
Emitter–Base Voltage
VEBO
–5.0
Vdc
IC
–100
mAdc
Collector Current — Continuous
COLLECTOR
3
1
BASE
2
EMITTER
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
Total Device Dissipation FR-5 Board (1)
TA = 25°C
Derate above 25°C
PD
225
mW
1.8
mW/°C
RθJA
556
°C/W
PD
300
mW
2.4
mW/°C
RθJA
417
°C/W
TJ, Tstg
– 55 to
+150
°C
Thermal Resistance,
Junction to Ambient
Total Device Dissipation
Alumina Substrate, (2) TA = 25°C
Derate above 25°C
Thermal Resistance,
Junction to Ambient
Junction and Storage Temperature
3
1
2
SOT–23 (TO–236AB)
CASE 318
STYLE 6
DEVICE MARKING
1. FR–5 = 1.0 x 0.75 x 0.062 in.
2. Alumina = 0.4 x 0.3 x 0.024 in. 99.5% alumina
H2x
x = Monthly Date Code
ORDERING INFORMATION
Device
BCW70LT1
Package
Shipping
SOT–23
3000 Units/Reel
Preferred devices are recommended choices for future use
and best overall value.
 Semiconductor Components Industries, LLC, 1999
December, 1999 – Rev. 0
1
Publication Order Number:
BCW70LT1/D
BCW70LT1
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Symbol
Min
Max
Unit
Collector–Emitter Breakdown Voltage (IC = –2.0 mAdc, IB = 0)
V(BR)CEO
–45
—
Vdc
Collector–Emitter Breakdown Voltage (IC = –100 µAdc, VEB = 0)
V(BR)CES
–50
—
Vdc
Emitter–Base Breakdown Voltage (IE = –10 µAdc, IC = 0)
V(BR)EBO
–5.0
—
Vdc
—
—
–100
–10
nAdc
µAdc
hFE
215
500
—
Collector–Emitter Saturation Voltage (IC = –10 mAdc, IB = –0.5 mAdc)
VCE(sat)
—
–0.3
Vdc
Base–Emitter On Voltage (IC = –2.0 mAdc, VCE = –5.0 Vdc)
VBE(on)
–0.6
–0.75
Vdc
Cobo
—
7.0
pF
NF
—
10
dB
Characteristic
OFF CHARACTERISTICS
Collector Cutoff Current
(VCB = –20 Vdc, IE = 0)
(VCB = –20 Vdc, IE = 0, TA = 100°C)
ICBO
ON CHARACTERISTICS
DC Current Gain (IC = –2.0 mAdc, VCE = –5.0 Vdc)
SMALL–SIGNAL CHARACTERISTICS
Output Capacitance
(IE = 0, VCB = –10 Vdc, f = 1.0 MHz)
Noise Figure
(IC = –0.2 mAdc, VCE = –5.0 Vdc, RS = 2.0 kΩ, f = 1.0 kHz, BW = 200 Hz)
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BCW70LT1
TYPICAL NOISE CHARACTERISTICS
(VCE = – 5.0 Vdc, TA = 25°C)
10
7.0
IC = 10 µA
5.0
In, NOISE CURRENT (pA)
en, NOISE VOLTAGE (nV)
1.0
7.0
5.0
BANDWIDTH = 1.0 Hz
RS ≈ 0
30 µA
3.0
100 µA
300 µA
1.0 mA
2.0
BANDWIDTH = 1.0 Hz
RS ≈ ∞
IC = 1.0 mA
3.0
2.0
300 µA
1.0
0.7
0.5
100 µA
30 µA
0.3
0.2
1.0
10 µA
0.1
10
20
50
100 200
500 1.0 k
f, FREQUENCY (Hz)
2.0 k
5.0 k
10
10 k
20
50
Figure 1. Noise Voltage
100 200
500 1.0 k 2.0 k
f, FREQUENCY (Hz)
5.0 k
10 k
Figure 2. Noise Current
NOISE FIGURE CONTOURS
1.0 M
500 k
BANDWIDTH = 1.0 Hz
200 k
100 k
50 k
20 k
10 k
0.5 dB
5.0 k
1.0 dB
2.0 k
1.0 k
500
2.0 dB
3.0 dB
200
100
RS , SOURCE RESISTANCE (OHMS)
RS , SOURCE RESISTANCE (OHMS)
(VCE = – 5.0 Vdc, TA = 25°C)
20
30
50 70 100
200 300
IC, COLLECTOR CURRENT (µA)
BANDWIDTH = 1.0 Hz
200 k
100 k
50 k
20 k
10 k
0.5 dB
5.0 k
1.0 dB
2.0 k
1.0 k
500
2.0 dB
3.0 dB
200
100
5.0 dB
10
1.0 M
500 k
500 700 1.0 k
5.0 dB
10
20
RS , SOURCE RESISTANCE (OHMS)
Figure 3. Narrow Band, 100 Hz
1.0 M
500 k
30
50 70 100
200 300
IC, COLLECTOR CURRENT (µA)
500 700 1.0 k
Figure 4. Narrow Band, 1.0 kHz
10 Hz to 15.7 kHz
200 k
100 k
50 k
ƪ
Noise Figure is Defined as:
20 k
10 k
NF
0.5 dB
1.0 dB
2.0 dB
3.0 dB
5.0 dB
200
100
10
20
30
50 70 100
200 300
en2
ƫ
) 4KTRS ) In 2RS2 1ń2
4KTRS
en = Noise Voltage of the Transistor referred to the input. (Figure 3)
I = Noise Current of the Transistor referred to the input.
n (Figure 4)
K = Boltzman’s Constant (1.38 x 10–23 j/°K)
T = Temperature of the Source Resistance (°K)
R = Source Resistance (Ohms)
S
5.0 k
2.0 k
1.0 k
500
+ 20 log10
500 700 1.0 k
IC, COLLECTOR CURRENT (µA)
Figure 5. Wideband
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BCW70LT1
100
1.0
TA = 25°C
IC, COLLECTOR CURRENT (mA)
VCE , COLLECTOR–EMITTER VOLTAGE (VOLTS)
TYPICAL STATIC CHARACTERISTICS
0.8
IC = 1.0 mA
0.6
10 mA
50 mA
100 mA
0.4
0.2
0
0.002 0.005 0.01 0.02 0.05 0.1 0.2 0.5 1.0 2.0
IB, BASE CURRENT (mA)
TA = 25°C
PULSE WIDTH = 300 µs
80 DUTY CYCLE ≤ 2.0%
300 µA
150 µA
40
100 µA
50 µA
20
0
5.0 10
0
20
5.0
10
15
20
25
30
35
VCE, COLLECTOR–EMITTER VOLTAGE (VOLTS)
θV, TEMPERATURE COEFFICIENTS (mV/°C)
TJ = 25°C
V, VOLTAGE (VOLTS)
1.2
1.0
0.8
VBE(sat) @ IC/IB = 10
0.6
VBE(on) @ VCE = 1.0 V
0.4
0.2
VCE(sat) @ IC/IB = 10
0
0.5 1.0
2.0
5.0
10
20
IC, COLLECTOR CURRENT (mA)
40
Figure 7. Collector Characteristics
1.4
0.2
250 µA
200 µA
60
Figure 6. Collector Saturation Region
0.1
IB = 400 µA
350 µA
50
1.6
*APPLIES for IC/IB ≤ hFE/2
0.8
*qVC for VCE(sat)
– 55°C to 25°C
0.8
25°C to 125°C
1.6
2.4
0.1
100
25°C to 125°C
0
Figure 8. “On” Voltages
qVB for VBE
0.2
– 55°C to 25°C
0.5
1.0 2.0
5.0
10 20
IC, COLLECTOR CURRENT (mA)
Figure 9. Temperature Coefficients
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50
100
BCW70LT1
TYPICAL DYNAMIC CHARACTERISTICS
500
300
200
200
100
70
50
30
tr
20
10
7.0
5.0
1.0
100
70
50
tf
30
td @ VBE(off) = 0.5 V
20
2.0
3.0
50 70
20 30
5.0 7.0 10
IC, COLLECTOR CURRENT (mA)
10
–1.0
100
– 2.0 – 3.0 – 5.0 – 7.0 –10
– 20 – 30
IC, COLLECTOR CURRENT (mA)
– 50 – 70 –100
Figure 11. Turn–Off Time
500
10
TJ = 25°C
TJ = 25°C
7.0
VCE = 20 V
300
Cib
C, CAPACITANCE (pF)
f T, CURRENT–GAIN — BANDWIDTH PRODUCT (MHz)
Figure 10. Turn–On Time
5.0 V
200
100
r(t) TRANSIENT THERMAL RESISTANCE
(NORMALIZED)
VCC = – 3.0 V
IC/IB = 10
IB1 = IB2
TJ = 25°C
ts
300
t, TIME (ns)
t, TIME (ns)
1000
700
500
VCC = 3.0 V
IC/IB = 10
TJ = 25°C
5.0
3.0
2.0
Cob
70
50
0.5 0.7 1.0
2.0
3.0
5.0 7.0
10
20
30
1.0
0.05
50
0.1
0.2
0.5
1.0
2.0
5.0
IC, COLLECTOR CURRENT (mA)
VR, REVERSE VOLTAGE (VOLTS)
Figure 12. Current–Gain — Bandwidth Product
Figure 13. Capacitance
1.0
0.7
0.5
10
20
50
D = 0.5
0.3
0.2
0.2
0.1
0.1
0.07
0.05
FIGURE 16
0.05
P(pk)
0.02
0.03
0.02
t1
0.01
0.01
0.01 0.02
SINGLE PULSE
0.05
0.1
0.2
0.5
1.0
DUTY CYCLE, D = t1/t2
D CURVES APPLY FOR POWER
PULSE TRAIN SHOWN
READ TIME AT t1 (SEE AN–569)
ZθJA(t) = r(t) • RθJA
TJ(pk) – TA = P(pk) ZθJA(t)
t2
2.0
5.0
10
20
50
t, TIME (ms)
100 200
Figure 14. Thermal Response
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500 1.0 k 2.0 k
5.0 k 10 k 20 k
50 k 100
BCW70LT1
104
DESIGN NOTE: USE OF THERMAL RESPONSE DATA
IC, COLLECTOR CURRENT (nA)
VCC = 30 V
A train of periodical power pulses can be represented by the model
as shown in Figure 16. Using the model and the device thermal
response the normalized effective transient thermal resistance of
Figure 14 was calculated for various duty cycles.
To find ZθJA(t), multiply the value obtained from Figure 14 by the
steady state value RθJA.
Example:
Dissipating 2.0 watts peak under the following conditions:
t1 = 1.0 ms, t2 = 5.0 ms (D = 0.2)
Using Figure 14 at a pulse width of 1.0 ms and D = 0.2, the reading
of r(t) is 0.22.
103
ICEO
102
101
ICBO
AND
ICEX @ VBE(off) = 3.0 V
100
10–1
10–2
–4
0
–2
0
0
The peak rise in junction temperature is therefore
∆T = r(t) x P(pk) x RθJA = 0.22 x 2.0 x 200 = 88°C.
For more information, see AN–569.
+ 20 + 40 + 60 + 80 + 100 + 120 + 140 + 160
TJ, JUNCTION TEMPERATURE (°C)
Figure 15. Typical Collector Leakage Current
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BCW70LT1
INFORMATION FOR USING THE SOT–23 SURFACE MOUNT PACKAGE
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the
total design. The footprint for the semiconductor packages
must be the correct size to insure proper solder connection
interface between the board and the package. With the
correct pad geometry, the packages will self align when
subjected to a solder reflow process.
0.037
0.95
0.037
0.95
0.079
2.0
0.035
0.9
0.031
0.8
inches
mm
SOT–23
SOT–23 POWER DISSIPATION
SOLDERING PRECAUTIONS
The power dissipation of the SOT–23 is a function of the
pad size. This can vary from the minimum pad size for
soldering to a pad size given for maximum power
dissipation. Power dissipation for a surface mount device is
determined by TJ(max), the maximum rated junction
temperature of the die, RθJA, the thermal resistance from
the device junction to ambient, and the operating
temperature, TA. Using the values provided on the data
sheet for the SOT–23 package, PD can be calculated as
follows:
PD =
The melting temperature of solder is higher than the rated
temperature of the device. When the entire device is heated
to a high temperature, failure to complete soldering within
a short time could result in device failure. Therefore, the
following items should always be observed in order to
minimize the thermal stress to which the devices are
subjected.
• Always preheat the device.
• The delta temperature between the preheat and
soldering should be 100°C or less.*
• When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering
method, the difference shall be a maximum of 10°C.
• The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
• When shifting from preheating to soldering, the
maximum temperature gradient shall be 5°C or less.
• After soldering has been completed, the device should
be allowed to cool naturally for at least three minutes.
Gradual cooling should be used as the use of forced
cooling will increase the temperature gradient and
result in latent failure due to mechanical stress.
• Mechanical stress or shock should not be applied
during cooling.
TJ(max) – TA
RθJA
The values for the equation are found in the maximum
ratings table on the data sheet. Substituting these values
into the equation for an ambient temperature TA of 25°C,
one can calculate the power dissipation of the device which
in this case is 225 milliwatts.
PD =
150°C – 25°C
556°C/W
= 225 milliwatts
The 556°C/W for the SOT–23 package assumes the use
of the recommended footprint on a glass epoxy printed
circuit board to achieve a power dissipation of 225
milliwatts. There are other alternatives to achieving higher
power dissipation from the SOT–23 package. Another
alternative would be to use a ceramic substrate or an
aluminum core board such as Thermal Clad. Using a
board material such as Thermal Clad, an aluminum core
board, the power dissipation can be doubled using the same
footprint.
* Soldering a device without preheating can cause
excessive thermal shock and stress which can result in
damage to the device.
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BCW70LT1
PACKAGE DIMENSIONS
SOT–23 (TO–236AB)
CASE 318–08
ISSUE AF
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD
FINISH THICKNESS. MINIMUM LEAD THICKNESS
IS THE MINIMUM THICKNESS OF BASE
MATERIAL.
A
L
3
B S
1
V
DIM
A
B
C
D
G
H
J
K
L
S
V
2
G
C
D
H
J
K
INCHES
MIN
MAX
0.1102 0.1197
0.0472 0.0551
0.0350 0.0440
0.0150 0.0200
0.0701 0.0807
0.0005 0.0040
0.0034 0.0070
0.0140 0.0285
0.0350 0.0401
0.0830 0.1039
0.0177 0.0236
MILLIMETERS
MIN
MAX
2.80
3.04
1.20
1.40
0.89
1.11
0.37
0.50
1.78
2.04
0.013
0.100
0.085
0.177
0.35
0.69
0.89
1.02
2.10
2.64
0.45
0.60
STYLE 6:
PIN 1. BASE
2. EMITTER
3. COLLECTOR
Thermal Clad is a trademark of the Bergquist Company
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
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including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
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BCW70LT1/D