ONSEMI MC74HCT244ANG

MC74HCT244A
Octal 3−State Noninverting
Buffer/Line Driver/
Line Receiver with
LSTTL−Compatible Inputs
High−Performance Silicon−Gate CMOS
The MC74HCT244A is identical in pinout to the LS244. This
device may be used as a level converter for interfacing TTL or NMOS
outputs to High−Speed CMOS inputs. The HCT244A is an octal
noninverting buffer line driver line receiver designed to be used with
3−state memory address drivers, clock drivers, and other bus−oriented
systems. The device has non−inverted outputs and two active−low
output enables.
The HCT244A is the non−inverting version of the HCT240. See
also HCT241.
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PDIP−20
N SUFFIX
CASE 738
1
SOIC−20W
DW SUFFIX
CASE 751D
1
Features
•
•
•
•
•
•
•
•
Output Drive Capability: 15 LSTTL Loads
TTL NMOS−Compatible Input Levels
Outputs Directly Interface to CMOS, NMOS, and TTL
Operating Voltage Range: 4.5 to 5.5 V
Low Input Current: 1 mA
In Compliance with the Requirements Defined by JEDEC Standard
No. 7A
Chip Complexity: 112 FETs or 28 Equivalent Gates
Pb−Free Packages are Available
A1
A2
A3
DATA INPUTS
A4
B1
B2
2
18
4
16
6
14
8
12
11
9
13
7
15
5
YA1
YA2
YA3
YA4
YB1
NONINVERTING
OUTPUTS
TSSOP−20
DT SUFFIX
CASE 948E
1
SOEIAJ−20
M SUFFIX
CASE 967
1
PIN ASSIGNMENT
ENABLE A
1
20
VCC
A1
2
19
ENABLE B
YB4
3
18
YA1
A2
4
17
B4
YB3
5
16
YA2
A3
6
15
B3
YB2
7
14
YA3
A4
8
13
B2
YB1
9
12
YA4
GND
10
11
B1
YB2
FUNCTION TABLE
B3
B4
17
3
1
OUTPUT ENABLE A
ENABLES ENABLE B 19
Inputs
YB3
YB4
PIN 20 = VCC
PIN 10 = GND
Outputs
Enable A,
Enable B
A, B
YA, YB
L
L
H
L
H
X
L
H
Z
Z = high impedance, X = don’t care
ORDERING AND MARKING INFORMATION
Figure 1. Logic Diagram
See detailed ordering, shipping, and marking information in
the package dimensions section on page 5 of this data sheet.
© Semiconductor Components Industries, LLC, 2006
December, 2006 − Rev. 11
1
Publication Order Number:
MC74HCT244A/D
MC74HCT244A
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MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
– 0.5 to + 7
V
V
VCC
DC Supply Voltage (Referenced to GND)
Vin
DC Input Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
Vout
DC Output Voltage (Referenced to GND)
– 0.5 to VCC + 0.5
V
Iin
DC Input Current, per Pin
± 20
mA
Iout
DC Output Current, per Pin
± 35
mA
ICC
DC Supply Current, VCC and GND Pins
± 75
mA
PD
Power Dissipation in Still Air,
750
500
450
mW
Tstg
Storage Temperature
– 65 to + 150
_C
TL
Lead Temperature, 1 mm from Case for 10 Seconds
(Plastic DIP, SOIC, SSOP or TSSOP Package)
Plastic DIP†
SOIC Package†
TSSOP Package†
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high−impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND v (Vin or Vout) v VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or VCC).
Unused outputs must be left open.
_C
260
†Derating − Plastic DIP: – 10 mW/_C from 65_ to 125_C
− SOIC Package: – 7 mW/_C from 65_ to 125_C
− TSSOP Package: − 6.1 mW/_C from 65_ to 125_C
For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).
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RECOMMENDED OPERATING CONDITIONS
Symbol
VCC
Vin, Vout
Parameter
DC Supply Voltage (Referenced to GND)
DC Input Voltage, Output Voltage (Referenced to GND)
TA
Operating Temperature, All Package Types
tr, tf
Input Rise and Fall Time (Figure 1)
Min
Max
Unit
4.5
5.5
V
0
VCC
V
– 55
+ 125
_C
0
500
ns
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Guaranteed Limit
VCC
V
– 55 to
25_C
v 85_C
v 125_C
Unit
Vout = 0.1 V or VCC – 0.1 V
|Iout| v 20 mA
4.5
5.5
2
2
2
2
2
2
V
Maximum Low−Level Input
Voltage
Vout = 0.1 V or VCC – 0.1 V
|Iout| v 20 mA
4.5
5.5
0.8
0.8
0.8
0.8
0.8
0.8
V
Minimum High−Level Output
Voltage
Vin = VIH or VIL
|Iout| v 20 mA
4.5
5.5
4.4
5.4
4.4
5.4
4.4
5.4
V
Vin = VIH or VIL
|Iout| v 6 mA
4.5
3.98
3.84
3.7
Vin = VIH or VIL
|Iout| v 20 mA
4.5
5.5
0.1
0.1
0.1
0.1
0.1
0.1
Vin = VIH or VIL
|Iout| v 6 mA
4.5
0.26
0.33
0.4
Symbol
Parameter
VIH
Minimum High−Level Input Voltage
VIL
VOH
VOL
Maximum Low−Level Output
Voltage
Test Conditions
V
Iin
Maximum Input Leakage Current
Vin = VCC or GND
5.5
± 0.1
± 1.0
± 1.0
mA
IOZ
Maximum Three−State Leakage
Current
Output in High−Impedance State
Vin = VIL or VIH; Vout = VCC or GND
5.5
± 0.5
± 5.0
± 10
mA
ICC
Maximum Quiescent Supply
Current (per Package)
Vin = VCC or GND Iout = 0 mA
5.5
4
40
160
mA
DICC
Additional Quiescent Supply
Current
Vin = 2.4 V, Any One Input
Vin = VCC or GND, Other Inputs
lout = 0 mA
5.5
≥ −55_C
25_C to 125_C
2.9
2.4
mA
1. Information on typical parametric values along with frequency or heavy load considerations can be found in Chapter 2 of the ON
Semiconductor High−Speed CMOS Data Book (DL129/D).
2. Total Supply Current = ICC + ΣDICC.
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2
MC74HCT244A
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AC ELECTRICAL CHARACTERISTICS (VCC = 5.0 V ± 10%, CL = 50 pF, Input tr = tf = 6 ns)
Guaranteed Limit
Symbol
Parameter
– 55 to 25_C
v 85_C
v 125_C
Unit
tPLH,
tPHL
Maximum Propagation Delay, A to YA or B to YB
(Figures 1 and 3)
20
25
30
ns
tPLZ,
tPHZ
Maximum Propagation Delay, Output Enable to YA or YB
(Figures 2 and 4)
26
33
39
ns
tPZL,
tPZH
Maximum Propagation Delay, Output Enable to YA or YB
(Figures 2 and 4)
22
28
33
ns
tTLH,
tTHL
Maximum Output Transition Time, Any Output
(Figures 1 and 3)
12
15
18
ns
Cin
Maximum Input Capacitance
10
10
10
pF
Cout
Maximum Three−State Output Capacitance
(Output in High−Impedance State)
15
15
15
pF
NOTE: For propagation delays with loads other than 50 pF, and information on typical parametric values, see Chapter 2 of the ON
Semiconductor High−Speed CMOS Data Book (DL129/D).
Typical @ 25°C, VCC = 5.0 V
CPD
55
Power Dissipation Capacitance (Per Enabled Output)*
pF
* Used to determine the no−load dynamic power consumption: PD = CPD VCC2 f + ICC VCC . For load considerations, see Chapter 2 of the
ON Semiconductor High−Speed CMOS Data Book (DL129/D).
SWITCHING WAVEFORMS
INPUT
A OR B
OUTPUT
YA OR YB
tr
tf
3V
2.7 V
1.3 V
0.3 V
tPLH
tPHL
90%
1.3 V
10%
tTLH
GND
tTHL
Figure 2.
3V
ENABLE
A OR B
OUTPUT Y
1.3 V
tPZL
1.3 V
tPZH
OUTPUT Y
GND
tPLZ
tPHZ
1.3 V
HIGH
IMPEDANCE
10%
VOL
90%
VOH
HIGH
IMPEDANCE
Figure 3.
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3
MC74HCT244A
TEST CIRCUITS
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
C L*
*Includes all probe and jig capacitance
Figure 4.
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
1 kW
C L*
*Includes all probe and jig capacitance
Figure 5.
LOGIC DETAIL
TO THREE OTHER
A OR B INVERTERS
ONE OF 8
BUFFERS
VCC
DATA INPUT
A OR B
YA
OR
YB
ENABLE A OR ENABLE B
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4
MC74HCT244A
ORDERING INFORMATION
Device
Shipping †
Package
MC74HCT244AN
PDIP−20
MC74HCT244ANG
PDIP−20
(Pb−Free)
MC74HCT244ADW
SOIC−20
MC74HCT244ADWG
SOIC−20
(Pb−Free)
MC74HCT244ADWR2
SOIC−20
MC74HCT244ADWR2G
SOIC−20
(Pb−Free)
18 Units / Rail
38 Units / Rail
MC74HCT244ADTR2
TSSOP−20*
MC74HCT244ADTR2G
TSSOP−20*
MC74HCT244AF
SOEIAJ−20
MC74HCT244AFG
SOEIAJ−20
(Pb−Free)
MC74HCT244AFEL
SOEIAJ−20
MC74HCT244AFELG
SOEIAJ−20
(Pb−Free)
1000 / Tape & Reel
2500 / Tape & Reel
40 Units / Rail
2000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*These packages are inherently Pb−Free.
MARKING DIAGRAMS
PDIP−20
SOIC−20W
TSSOP−20
20
20
20
20
HCT
244A
ALYWG
G
HCT244A
AWLYYWWG
MC74HCT244AN
AWLYYWWG
SOEIAJ−20
1
1
1
A
= Assembly Location
WL, L = Wafer Lot
YY, Y
= Year
WW, W = Work Week
G or G = Pb−Free Package
(Note: Microdot may be in either location)
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5
74HCT244A
AWLYWWG
1
MC74HCT244A
PACKAGE DIMENSIONS
PDIP−20
N SUFFIX
PLASTIC DIP PACKAGE
CASE 738−03
ISSUE E
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DIMENSION L TO CENTER OF LEAD WHEN
FORMED PARALLEL.
4. DIMENSION B DOES NOT INCLUDE MOLD
FLASH.
−A−
20
11
1
10
B
L
C
−T−
K
SEATING
PLANE
M
N
E
G
F
J
D
20 PL
0.25 (0.010)
20 PL
0.25 (0.010)
M
T A
M
T B
M
DIM
A
B
C
D
E
F
G
J
K
L
M
N
INCHES
MIN
MAX
1.010
1.070
0.240
0.260
0.150
0.180
0.015
0.022
0.050 BSC
0.050
0.070
0.100 BSC
0.008
0.015
0.110
0.140
0.300 BSC
0_
15 _
0.020
0.040
MILLIMETERS
MIN
MAX
25.66
27.17
6.10
6.60
3.81
4.57
0.39
0.55
1.27 BSC
1.27
1.77
2.54 BSC
0.21
0.38
2.80
3.55
7.62 BSC
0_
15_
0.51
1.01
M
SOIC−20W
DW SUFFIX
CASE 751D−05
ISSUE G
20
11
X 45 _
h
1
10
20X
B
B
0.25
M
T A
S
B
S
A
L
H
M
E
0.25
10X
NOTES:
1. DIMENSIONS ARE IN MILLIMETERS.
2. INTERPRET DIMENSIONS AND TOLERANCES
PER ASME Y14.5M, 1994.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.
5. DIMENSION B DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE PROTRUSION
SHALL BE 0.13 TOTAL IN EXCESS OF B
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
q
A
B
M
D
18X
e
A1
SEATING
PLANE
C
T
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6
DIM
A
A1
B
C
D
E
e
H
h
L
q
MILLIMETERS
MIN
MAX
2.35
2.65
0.10
0.25
0.35
0.49
0.23
0.32
12.65
12.95
7.40
7.60
1.27 BSC
10.05
10.55
0.25
0.75
0.50
0.90
0_
7_
MC74HCT244A
PACKAGE DIMENSIONS
TSSOP−20
DT SUFFIX
CASE 948E−02
ISSUE C
20X
0.15 (0.006) T U
2X
K REF
0.10 (0.004)
S
L/2
20
M
T U
S
V
K
K1
ÍÍÍÍ
ÍÍÍÍ
ÍÍÍÍ
S
J J1
11
B
−U−
L
PIN 1
IDENT
SECTION N−N
0.25 (0.010)
N
1
10
M
0.15 (0.006) T U
S
A
−V−
N
F
DETAIL E
C
G
D
H
DETAIL E
0.100 (0.004)
−T− SEATING
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION:
MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE
MOLD FLASH, PROTRUSIONS OR GATE
BURRS. MOLD FLASH OR GATE BURRS
SHALL NOT EXCEED 0.15 (0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE
INTERLEAD FLASH OR PROTRUSION.
INTERLEAD FLASH OR PROTRUSION
SHALL NOT EXCEED 0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE
DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08
(0.003) TOTAL IN EXCESS OF THE K
DIMENSION AT MAXIMUM MATERIAL
CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE
DETERMINED AT DATUM PLANE −W−.
MILLIMETERS
INCHES
DIM MIN
MAX
MIN
MAX
A
6.40
6.60
0.252
0.260
B
4.30
4.50
0.169
0.177
−−−
−−− 0.047
C
1.20
D
0.05
0.15
0.002
0.006
F
0.50
0.75
0.020
0.030
G
0.65 BSC
0.026 BSC
−W−
H
0.27
0.37
0.011
0.015
J
0.09
0.20
0.004
0.008
J1
0.09
0.16
0.004
0.006
K
0.19
0.30
0.007
0.012
K1
0.19
0.25
0.007
0.010
L
6.40 BSC
0.252 BSC
M
0_
8_
0_
8_
PLANE
SOLDERING FOOTPRINT*
7.06
1
0.65
PITCH
16X
0.36
16X
1.26
DIMENSIONS: MILLIMETERS
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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7
MC74HCT244A
PACKAGE DIMENSIONS
SOEIAJ−20
F SUFFIX
CASE 967−01
ISSUE A
20
LE
11
Q1
E HE
1
M_
L
10
DETAIL P
Z
D
VIEW P
e
A
c
DIM
A
A1
b
c
D
E
e
HE
L
LE
M
Q1
Z
A1
b
0.13 (0.005)
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE
MOLD FLASH OR PROTRUSIONS AND ARE
MEASURED AT THE PARTING LINE. MOLD FLASH
OR PROTRUSIONS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
M
0.10 (0.004)
MILLIMETERS
MIN
MAX
−−−
2.05
0.05
0.20
0.35
0.50
0.15
0.25
12.35
12.80
5.10
5.45
1.27 BSC
7.40
8.20
0.50
0.85
1.10
1.50
10 _
0_
0.70
0.90
−−−
0.81
INCHES
MIN
MAX
−−− 0.081
0.002
0.008
0.014
0.020
0.006
0.010
0.486
0.504
0.201
0.215
0.050 BSC
0.291
0.323
0.020
0.033
0.043
0.059
10 _
0_
0.028
0.035
−−− 0.032
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MC74HCT244A/D