ISSI IS65C256AL-45TA3 32k x 8 low power cmos static ram Datasheet

IS65C256AL
IS62C256AL
32K x 8 LOW POWER CMOS STATIC RAM
MAY 2012
FEATURES
• Access time: 25 ns, 45 ns
• Low active power: 200 mW (typical)
• Low standby power
— 150 µW (typical) CMOS standby
— 15 mW (typical) operating
• Fully static operation: no clock or refresh
required
• TTL compatible inputs and outputs
• Single 5V power supply
• Lead-free available
• Industrial and Automotive temperatures available
DESCRIPTION
The ISSI IS62C256AL/IS65C256AL is a low power,
32,768 word by 8-bit CMOS static RAM. It is fabricated
using ISSI's high-performance, low power CMOS technology.
When CE is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be
reduced down to 150 µW (typical) at CMOS input levels.
Easy memory expansion is provided by using an active
LOW Chip Select (CE) input and an active LOW Output
Enable (OE) input. The active LOW Write Enable (WE)
controls both writing and reading of the memory.
The IS62C256AL/IS65C256AL is pin compatible with
other 32Kx8 SRAMs in plastic SOP or TSOP (Type I)
package.
FUNCTIONAL BLOCK DIAGRAM
A0-A14
DECODER
32K X 8
MEMORY ARRAY
I/O
DATA
CIRCUIT
COLUMN I/O
VDD
GND
I/O0-I/O7
CE
OE
WE
CONTROL
CIRCUIT
Copyright © 2006 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability
arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any
published information and before placing orders for products.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. D
05/09/12
1
IS65C256AL
IS62C256AL
PIN CONFIGURATION
PIN CONFIGURATION
28-Pin SOP
28-Pin TSOP
A14
1
28
VDD
A12
2
27
WE
A7
3
26
A13
A6
4
25
A8
A5
5
24
A9
A4
6
23
A11
A3
7
22
OE
A2
8
21
A10
A1
9
20
CE
A0
10
19
I/O7
I/O0
11
18
I/O6
I/O1
12
17
I/O5
I/O2
13
16
I/O4
GND
14
15
I/O3
PIN DESCRIPTIONS
OE
A11
A9
A8
A13
WE
VDD
A14
A12
A7
A6
A5
A4
A3
21
20
19
18
17
16
15
14
13
12
11
10
9
8
22
23
24
25
26
27
28
1
2
3
4
5
6
7
A10
CE
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A1
A2
TRUTH TABLE
A0-A14
Address Inputs
Mode
CE
Chip Select Input
OE
Output Enable Input
WE
Write Enable Input
I/O0-I/O7
Input/Output
Not Selected
(Power-down)
Output Disabled
Read
Write
VDD
Power
GND
Ground
WE
CE
OE
I/O Operation
VDD Current
X
H
X
High-Z
ISB1, ISB2
H
H
L
L
L
L
H
L
X
High-Z
DOUT
DIN
ICC1, ICC2
ICC1, ICC2
ICC1, ICC2
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
VTERM
TSTG
PT
IOUT
Parameter
Terminal Voltage with Respect to GND
Storage Temperature
Power Dissipation
DC Output Current (LOW)
Value
–0.5 to +7.0
–65 to +150
0.5
20
Unit
V
°C
W
mA
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
2
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
IS65C256AL
IS62C256AL
OPERATING RANGE
Part No.
IS62C256AL
IS62C256AL
Range
Commercial
Industrial
Ambient Temperature
0°C to +70°C
–40°C to +85°C
VDD
5V ± 10%
5V ± 10%
IS65C256AL
Automotive
–40°C to +125°C
5V ± 10%
DC ELECTRICAL CHARACTERISTICS
Symbol
VOH
VOL
VIH
VIL
ILI
ILO
Parameter
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage(1)
Input Leakage
Test Conditions
VDD = Min., IOH = –1.0 mA
VDD = Min., IOL = 2.1 mA
Output Leakage
GND ≤ VOUT ≤ VDD,
Outputs Disabled
GND ≤ VIN ≤ VDD
Com.
Ind.
Auto.
Com.
Ind.
Auto.
Min.
2.4
—
2.2
–0.3
–1
–2
–10
–1
–2
–10
Max.
—
0.4
VDD + 0.5
0.8
1
2
10
1
2
10
Unit
V
V
V
V
µA
µA
Note: 1. VIL = –3.0V for pulse width less than 10 ns.
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
3
IS65C256AL
IS62C256AL
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
Symbol
ICC1
Parameter
VDD Operating
Supply Current
Test Conditions
VDD = Max., CE = VIL
IOUT = 0 mA, f = 0
ICC2
VDD Dynamic Operating
Supply Current
VDD = Max., CE = VIL
IOUT = 0 mA, f = fMAX
ISB1
TTL Standby Current
(TTL Inputs)
ISB2
CMOS Standby
Current (CMOS Inputs)
VDD = Max.,
VIN = VIH or VIL
CE ≥ VIH, f = 0
VDD = Max.,
CE ≥ VDD – 0.2V,
VIN ≥ VDD – 0.2V, or
VIN ≤ 0.2V, f = 0
Com.
Ind.
Auto.
Com.
Ind.
Auto.
typ. (2)
Com.
Ind.
Auto.
Com.
Ind.
Auto.
typ. (2)
-25 ns
Min. Max.
—
15
—
20
—
25
—
25
—
30
—
35
15
—
100
—
120
—
150
—
15
—
20
—
50
5
-45 ns
Min. Max.
—
15
—
20
—
25
—
20
—
25
—
30
12
—
100
—
120
—
150
—
15
—
20
—
50
5
Unit
mA
mA
µA
µA
Note:
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical values are measured at VDD = 5.0V, TA = 25oC and not 100% tested.
CAPACITANCE(1,2)
Symbol
CIN
COUT
Parameter
Input Capacitance
Output Capacitance
Conditions
VIN = 0V
VOUT = 0V
Max.
8
10
Unit
pF
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: TA = 25°C, f = 1 MHz, VDD = 5.0V.
4
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
IS65C256AL
IS62C256AL
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
Symbol
-25 ns
Min. Max.
Parameter
-45 ns
Min.
Max.
Unit
tRC
Read Cycle Time
25
—
45
—
ns
tAA
Address Access Time
—
25
—
45
ns
tOHA
Output Hold Time
2
—
2
—
ns
tACS
CE Access Time
—
25
—
45
ns
OE Access Time
—
13
—
25
ns
tLZOE
OE to Low-Z Output
0
—
0
—
ns
tHZOE(2)
OE to High-Z Output
0
12
0
20
ns
tLZCS(2)
CE to Low-Z Output
3
—
3
—
ns
tHZCS
CE to High-Z Output
0
12
0
20
ns
tPU
CE to Power-Up
0
—
0
—
ns
tPD(3)
CE to Power-Down
—
20
—
30
ns
tDOE
(2)
(2)
(3)
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and
output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. Not 100% tested.
AC TEST CONDITIONS
Parameter
Input Pulse Level
Input Rise and Fall Times
Input and Output Timing
and Reference Levels
Output Load
Unit
0V to 3.0V
3 ns
1.5V
See Figures 1 and 2
AC TEST LOADS
1838 Ω
5V
OUTPUT
OUTPUT
100 pF
Including
jig and
scope
Figure 1.
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
480 Ω
5V
993 Ω
5 pF
Including
jig and
scope
255 Ω
Figure 2.
5
IS65C256AL
IS62C256AL
AC WAVEFORMS
READ CYCLE NO. 1(1,2)
t RC
ADDRESS
t AA
t OHA
t OHA
DOUT
DATA VALID
PREVIOUS DATA VALID
READ1.eps
READ CYCLE NO. 2(1,3)
t RC
ADDRESS
t AA
t OHA
OE
t HZOE
t DOE
t LZOE
CE
t ACS
t HZCS
t LZCS
DOUT
HIGH-Z
DATA VALID
CS_RD2.eps
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE = VIL.
3. Address is valid prior to or coincident with CE LOW transitions.
6
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
IS65C256AL
IS62C256AL
WRITE CYCLE SWITCHING CHARACTERISTICS(1,3) (Over Operating Range)
Symbol
-25 ns
Min. Max.
Parameter
-45 ns
Min. Max.
Unit
tWC
Write Cycle Time
25
—
45
—
ns
tSCS
CE to Write End
15
—
35
—
ns
tAW
Address Setup Time to Write End
15
—
25
—
ns
tHA
Address Hold from Write End
0
—
0
—
ns
tSA
Address Setup Time
0
—
0
—
ns
tPWE1,
tPWE2(4)
WE Pulse Width
15
—
25
—
ns
tSD
Data Setup to Write End
12
—
20
—
ns
tHD
Data Hold from Write End
0
—
0
—
ns
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and
output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write,
but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling
edge of the signal that terminates the write.
4. Tested with OE HIGH.
AC WAVEFORMS
WRITE CYCLE NO. 1 (CE Controlled, OE is HIGH or LOW) (1 )
t WC
VALID ADDRESS
ADDRESS
t SA
t SCS
t HA
CE
t AW
t PWE1
t PWE2
WE
t HZWE
DOUT
DATA UNDEFINED
t LZWE
HIGH-Z
t SD
DIN
t HD
DATAIN VALID
CS_WR1.eps
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
7
IS65C256AL
IS62C256AL
AC WAVEFORMS
WRITE CYCLE NO. 2 (OE is HIGH During Write Cycle) (1,2)
t WC
ADDRESS
VALID ADDRESS
t HA
OE
CE
LOW
t AW
t PWE1
WE
t SA
DOUT
t HZWE
t LZWE
HIGH-Z
DATA UNDEFINED
t SD
t HD
DATAIN VALID
DIN
CS_WR2.eps
WRITE CYCLE NO. 3 (OE is LOW During Write Cycle) (1)
t WC
ADDRESS
OE
CE
VALID ADDRESS
t HA
LOW
LOW
t AW
t PWE2
WE
t SA
DOUT
DATA UNDEFINED
t HZWE
t LZWE
HIGH-Z
t SD
DIN
t HD
DATAIN VALID
CS_WR3.eps
Notes:
1. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write,
but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling
edge of the signal that terminates the write.
2. I/O will assume the High-Z state if OE = VIH.
8
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
IS65C256AL
IS62C256AL
DATA RETENTION SWITCHING CHARACTERISTICS
Symbol Parameter
Test Condition
Min.
2.0
VDR
VDD for Data Retention
See Data Retention Waveform
IDR
Data Retention Current
VDD = 2.0V, CE ≥ VDD – 0.2V
VIN ≥ VDD – 0.2V, or VIN ≤ VSS + 0.2V
tSDR
Data Retention Setup Time See Data Retention Waveform
tRDR
Recovery Time
Com.
Ind.
Auto.
See Data Retention Waveform
Max.
Unit
5.5
V
15
20
50
µA
0
—
ns
tRC
—
ns
—
—
—
Typ.
—
—
—
Note:
1. Typical Values are measured at VDD = 5V, TA = 25oC and not 100% tested.
CE Controlled)
DATA RETENTION WAVEFORM (CE
tSDR
Data Retention Mode
tRDR
VDD
4.5V
2.2V
VDR
CE1
GND
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
CE1 ≥ VDD - 0.2V
9
IS65C256AL
IS62C256AL
ORDERING INFORMATION
Commercial Range: 0°C to +70°C
Speed
(ns)
45
Order Part No.
Package
IS62C256AL-45T
IS62C256AL-45TL
IS62C256AL-45UL
TSOP
TSOP, Lead-free
Plastic SOP, Lead-free
ORDERING INFORMATION
Industrial Range: –40°C to +85°C
Speed
(ns)
Order Part No.
Package
25
IS62C256AL-25TI
IS62C256AL-25ULI
TSOP
Plastic SOP, Lead-free
45
IS62C256AL-45TI
IS62C256AL-45TLI
IS62C256AL-45ULI
TSOP
TSOP, Lead-free
Plastic SOP, Lead-free
ORDERING INFORMATION
Automotive Range: –40°C to +125°C
Speed
(ns)
10
Order Part No.
Package
25
IS65C256AL-25TA3
IS65C256AL-25TLA3
IS65C256AL-25ULA3
TSOP
TSOP, Lead-free
Plastic SOP, Lead-free
45
IS65C256AL-45TA3
IS65C256AL-45TLA3
IS65C256AL-45ULA3
TSOP
TSOP, Lead-free
Plastic SOP, Lead-free
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
IS65C256AL
IS62C256AL
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
11
IS65C256AL
IS62C256AL
12
Integrated Silicon Solution, Inc.
Rev. D
05/09/12
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