IDT IDT74FCT540CT Fast cmos octal buffer/line driver Datasheet

IDT74FCT540AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
IDT74FCT540AT/CT
FAST CMOS OCTAL
BUFFER/LINE DRIVER
FEATURES:
DESCRIPTION:
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The IDT octal buffer/line driver is built using an advanced dual metal
CMOS technology. The FCT540T is similar in function to the FCT240T,
except that the inputs and outputs are on opposite sides of the package. This
pinout arrangement makes these devices especially useful as output ports
for microprocessors and as backplane drivers, allowing ease of layout and
greater board density.
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A and C grades
Low input and output leakage ≤1µA (max.)
CMOS power levels
True TTL input and output compatibility:
– VOH = 3.3V (typ.)
– VOL = 0.3V (typ.)
High Drive outputs (-15mA IOH, 64mA IOL)
Meets or exceeds JEDEC standard 18 specifications
Power off disable outputs permit "live insertion"
Available in SOIC, SSOP, and QSOP packages
FUNCTIONAL BLOCK DIAGRAM
OE A
OE B
D0
O0
D1
O1
D2
O2
D3
O3
D4
O4
D5
O5
D6
O6
D7
O7
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
JUNE 2006
1
© 2006 Integrated Device Technology, Inc.
DSC-5588/5
IDT74FCT540AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS(1)
PIN CONFIGURATION
OEA
1
20
VCC
D0
2
3
19
18
OEB
O0
4
17
O1
D3
5
16
O2
D4
6
15
D5
7
14
O3
O4
D6
8
13
O5
9
12
O6
10
11
O7
D1
D2
D7
GND
Symbol
Description
VTERM(2)
Max
Unit
VTERM(3)
Terminal Voltage with Respect to GND
–0.5 to +7
V
Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current
–60 to +120
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Parameter(1)
Symbol
SOIC/ SSOP/ QSOP
TOP VIEW
Conditions
Typ.
Max.
CIN
Input Capacitance
VIN = 0V
6
10
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names
OEA, OEB
Description
3-State Output Enable Inputs (Active LOW)
Dx
Inputs
Ox
Outputs
FUNCTION TABLE(1)
OEA
L
L
H
Inputs
OEB
L
L
H
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
2
Unit
D
L
H
X
Outputs
H
L
Z
IDT74FCT540AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%
Symbol
Test Conditions(1)
Parameter
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
IIH
Input HIGH Current(4)
VCC = Max.
VI = 2.7V
—
—
±1
µA
IIL
Input LOW Current(4)
VCC = Max.
VI = 0.5V
—
—
±1
µA
IOZH
High Impedance Output Current(4)
VCC = Max.
VI = 2.7V
—
—
±1
µA
IOZL
(3-State Output pins)(4)
VI = 0.5V
—
—
±1
II
Input HIGH Current(4)
VCC = Max., VI = VCC (Max.)
—
—
±1
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
—
–0.7
–1.2
V
VH
Input Hysteresis
—
200
—
mV
ICC
Quiescent Power Supply Current
—
0.01
1
mA
Min.
2.4
2
—
Typ.(2)
3.3
3
0.3
Max.
—
—
0.55
Unit
V
–60
–120
–225
mA
—
VCC = Max.
VIN = GND or VCC
µA
OUTPUT DRIVE CHARACTERISTICS
Symbol
VOH
Parameter
Output HIGH Voltage
VOL
Output LOW Voltage
IOS
Short Circuit Current
VCC = Min
VIN = VIH or VIL
VCC = Min
VIN = VIH or VIL
Test Conditions(1)
IOH = –8mA
IOH = –15mA
IOL = 64mA
VCC = Max., VO = GND(3)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = –55°C.
3
V
IDT74FCT540AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
—
0.5
2
mA
VIN = VCC
VIN = GND
—
0.15
0.25
mA/
MHz
VCC = Max.
Outputs Open
fi = 10MHz
VIN = VCC
VIN = GND
—
1.5
3.5
mA
50% Duty Cycle
OEA = OEB = GND
One Bit Toggling
VIN = 3.4V
VIN = GND
—
1.8
4.5
VCC = Max.
Outputs Open
fi = 2.5MHz
VIN = VCC
VIN = GND
—
3
6(5)
50% Duty Cycle
OEA = OEB = GND
Four Bits Toggling
VIN = 3.4V
VIN = GND
—
5
14(5)
Symbol
Parameter
ΔICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V(3)
ICCD
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
OEA = OEB = GND
One Input Toggling
50% Duty Cycle
IC
Total Power Supply Current(6)
mA
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of ΔICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ΔICC DHNT + ICCD (fiNi)
ICC = Quiescent Current
ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Output Frequency
Ni = Number of Outputs at fO
All currents are in milliamps and all frequencies are in megahertz.
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT540AT
Symbol
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
Parameter
Condition(1)
Min.(2)
Propagation Delay
Dx to Ox
Output Enable Time
CL = 50pF
RL = 500Ω
1.5
Output Disable Time
FCT540CT
Max.
Min.(2)
Max.
Unit
4.8
1.5
4.3
ns
1.5
6.2
1.5
5.8
ns
1.5
5.6
1.5
5.2
ns
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
4
IDT74FCT540AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
V CC
SWITCH POSITION
7.0V
500W
V OUT
VIN
Pulse
Generator
D.U.T
.
50pF
RT
Test
Switch
Open Drain
Disable Low
Enable Low
Closed
All Other Tests
Open
500W
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
CL
Octal Link
Test Circuits for All Outputs
DATA
INPUT
tH
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
tREM
tSU
3V
1.5V
0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
3V
1.5V
0V
tH
Pulse Width
Octal Link
Octal Link
Set-Up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
VOH
1.5V
VOL
DISABLE
3V
CONTROL
INPUT
tPZL
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
SWITCH
CLOSED
tPLZ
3.5V
1.5V
tPZH
OUTPUT
NORMALLY
HIGH
SWITCH
OPEN
1.5V
0V
3.5V
0.3V
VOL
tPHZ
0.3V
VOH
1.5V
0V
Octal Link
0V
Octal Link
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
5
IDT74FCT540AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT
XX
Temperature
Range
FCT
X
X
Device
Type
Package
SO
SOG
PY
PYG
Q
QG
Small Outline IC
SOIC - Green
Shrink Small Outline Package
SSOP - Green
Quarter-size Small Outline Package
QSOP - Green
540AT Fast CMOS Octal Buffer/Line Driver
540CT
74
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6
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