Cypress CY62167DV18L-55 16m (1024k x 16) static ram Datasheet

CY62167DV18
MoBL2™
PRELIMINARY
16M (1024K x 16) Static RAM
Features
• Very high speed: 55 ns and 70 ns
• Voltage range: 1.65V to 1.95V
• Ultra-low active power
— Typical active current: 1.5 mA @ f = 1 MHz
— Typical active current: 15 mA @ f = fMAX
• Ultra-low standby power
• Easy memory expansion with CE</>1</>, CE2</> and OE</>
Writing to the device is accomplished by taking Chip Enable 1
(CE1) LOW and Chip Enable 2 (CE2) HIGH and Write Enable
(WE) input LOW. If Byte Low Enable (BLE) is LOW, then das
pins (A0 through A19). If Byte High Enable (BHE) is LOW, then
data from I/O pins (I/O8 through I/O15) is written into the
location specified on the ad
features
• Automatic power-down when deselected
• CMOS for optimum speed/power
• Packages offered in a 48-ball FBGA
Functional Description[1]
The CY62167DV18 is a high-performance CMOS static RAM
organized as 1024K words by 16 bits. This device features
advanced circuit design to provide ultra-low active current.
This is ideal for providing More Battery Life (MoBL®) in
portable applications such as cellular telephones. The device
also has an automatic power-down feature that significantly
reduces power consumption by 99% when addresses are not
Reading from the device is accomplished by taking Chip
Enable 1 (CE1) LOW and Chip Enable 2 (CE2) HIGH and
Output Enable (OE) LOW while forcing the Write Enable (WE)
HIGH. If Byte Low Enable (<>O7. If Byte High Enable (BHE)
is LOW, then data from memory will appear on I/O8 to I/O15.
See the truth table at the back of this data sheet for a complete
description of read and write modes.
DATA IN DRIVERS
1024K x 16
RAM ARRAY
2048 x 512 x 16
SENSE AMPS
A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
ROW DECODER
Logic Block Diagram
toggling. The device can be put into standby mode reducing
power consumption by more than 99% when deselected Chip
Enable 1 (CE1) HIGH or Chip Enable 2 (CE2) LOW or both
BHE and BLE are HIGH. The input/output pins (I/O0 through
I/O15) are placed in a high-impedance state when: deselected
Chip Enable 1 (CE1) HIGH or Chip Enable 2 (CE2) LOW,
outputs are disabled (OE HIGH), both Byte High Enable and
Byte Low Enable are disabled (BHE, BLE HIGH) or during a
write operation (Chip Enable 1 (CE1) LOW and Chip Enable 2
(CE2) HIGH and WE LOW).
I/O0 –I/O7
I/O8 –I/O15
COLUMN DECODER
A11
A12
A13
A14
A15
A16
A17
A18
A19
BHE
WE
CE2
CE1
OE
BLE
Power-down
Circuit
CE2
BHE
BLE
CE1
Note:
1. For best practice recommendations, please refer to the Cypress application note “System Design Guidelines” on http://www.cypress.com.
Cypress Semiconductor Corporation
Document #: 38-05326 Rev. *A
•
3901 North First Street
•
San Jose, CA 95134
•
408-943-2600
Revised February 10, 2003
CY62167DV18
MoBL2™
PRELIMINARY
Pin Configuration[2]
FBGA
Top View
1
2
3
4
5
6
BLE
OE
A0
A1
A2
CE 2
A
I/O8
BH E
A3
A4
CE 1
I/O0
B
I/O9
I/O10
A5
A6
I/O1
I/O2
C
VSS
I/O11
A17
A7
I/O3
Vcc
D
VCC
I/O12 DNU
A16
I/O4
Vss
E
I/O14
I/O13
A14
A15
I/O5
I/O6
F
I/O15
A19
A12
A13
WE
I/O7
G
A18
A8
A9
A10
A11
DNU
H
Note:
2. DNU pins are to be connected to VSS or left open.
Document #: 38-05326 Rev. *A
Page 2 of 11
CY62167DV18
MoBL2™
PRELIMINARY
DC Input Voltage[3] ................................ −0.2V to VCC + 0.2V
Maximum Ratings
Output Current into Outputs (LOW)............................. 20 mA
(Above which the useful life may be impaired. For user guidelines, not tested.)
Static Discharge Voltage.......................................... > 2001V
(per MIL-STD-883, Method 3015)
Storage Temperature .................................–65°C to +150°C
Latch-up Current..................................................... > 200 mA
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Operating Range
Supply Voltage to Ground
Potential .......................................... −0.2V to VCCMAX + 0.2V
DC Voltage Applied to Outputs
in High-Z State[3] ....................................−0.2V to VCC + 0.2V
Range
Ambient Temperature (TA)
VCC[4]
Industrial
−40°C to +85°C
1.65V to 1.95V
Product Portfolio
Power Dissipation
Operating, Icc (mA)
VCC Range(V)
Product
Min.
Typ.
Max.
Speed
(ns)
CY62167DV18L
1.65
1.8
1.95
55
CY62167DV18LL
1.65
1.8
1.95
f = 1 MHz
f = fMAX
Typ.
Max.
Typ.
Max.
Typ.
Max.
1.5
5
15
30
2.5
30
12
25
2.5
30
1.5
5
15
30
2.5
20
12
25
2.5
20
70
55
Standby, ISB2 (µA)
70
DC Electrical Characteristics (over the operating range)
CY62167DV18-55
Parameter
Description
Test Conditions
Min.
Typ.
Max.
VOH
Output HIGH Voltage
IOH = −0.1 mA
VCC = 1.65V
VOL
Output LOW Voltage
IOL = 0.1 mA
VCC = 1.65V
VIH
Input HIGH Voltage
1.4
VCC +
0.2
VIL
Input LOW Voltage
–0.2
IIX
Input Leakage Current GND < VI < VCC
–1
IOZ
Output Leakage
Current
–1
ICC
VCC Operating Supply f = fMAX = 1/tRC
Current
f = 1 MHz
ISB1
ISB2
GND < VO < VCC, Output
Disabled
Vcc = 1.95V,
IOUT = 0mA,
CMOS level
1.4
CY62167DV18-70
Min.
Typ.
Max.
1.4
Unit
V
0.2
0.2
V
1.4
VCC +
0.2
V
0.4
–0.2
0.4
V
+1
–1
+1
µA
+1
–1
+1
µA
mA
15
30
12
25
1.5
5
1.5
5
Automatic CE
Power-down Current
− CMOS Inputs
CE1 > VCC − 0.2V, CE2 < L
0.2V, VIN > VCC − 0.2V,
LL
VIN < 0.2V, f = fMAX
(Address and Data Only), f
= 0 (OE, WE, BHE and
BLE)
2.5
30
2.5
30
2.5
20
2.5
20
Automatic CE
Power-down Current
− CMOS Inputs
CE1 > VCC − 0.2V, CE2 < L
0.2V, VIN > VCC − 0.2V or LL
VIN < 0.2V, f = 0,
VCC=1.95V
2.5
30
2.5
30
2.5
20
2.5
20
µA
µA
Capacitance[5]
Parameter
Description
CIN
Input Capacitance
COUT
Output Capacitance
Document #: 38-05326 Rev. *A
Test Conditions
TA = 25°C, f = 1 MHz
VCC = VCC(typ)
Max.
Unit
6
pF
8
pF
Page 3 of 11
CY62167DV18
MoBL2™
PRELIMINARY
Capacitance[5]
Parameter
Description
Test Conditions
Max.
Unit
Notes:
3. VIL(min.) = −2.0V for pulse durations less than 20 ns.
4. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25°C.
5. Tested initially and after any design or proces changes that may affect these parameters.
Thermal Resistance
Parameter
Description
θJA
Thermal Resistance (Junction to
Ambient)[5]
θJC
Thermal Resistance (Junction to
Case)[5]
Test Conditions
BGA
Unit
Still Air, soldered on a 3 x 4.5 inch, two-layer
printed circuit board
55
C/W
16
C/W
AC Test Loads and Waveforms
R1
ALL INPUT PULSES
VCC
VCC Typ
UTPUT
10%
90%
10%
90%
GND
R2
CL = 30 pF
Rise Time:
1 V/ns
INCLUDING
JIG AND
SCOPE
Equivalent to:
OUTPUT
Fall Time:
1 V/ns
THÉVENIN EQUIVALENT
RTH
V
Parameters
1.8V
UNIT
R1
1350 0
Ω
R2
1080 0
Ω
R TH
6000
Ω
VT H
0.80
V
Data Retention Characteristics
Parameter
Description
VDR
VCC for Data Retention
ICCDR
Data Retention Current
tCDR[5]
Chip Deselect to Data
Retention Time
tR[6]
Operation Recovery Time
Document #: 38-05326 Rev. *A
Conditions
Min.
Max.
Unit
1.95
V
L
15
µA
LL
10
1.0
VCC=1.0V, CE1 > VCC − 0.2V, CE2
< 0.2V, VIN > VCC − 0.2V or VIN <
0.2V
Typ.
0
ns
tRC
ns
Page 4 of 11
CY62167DV18
MoBL2™
PRELIMINARY
Data Retention Waveform[7]
VCC
VCC(min.)
tCDR
DATA RETENTION MODE
VDR > 1.0V
VCC(min.)
tR
CE1 or
BHE . BLE
or
CE2
Notes:
6. Full device operation requires linear VCC ramp from VDR to VCC(min.) > 100 µs or stable at VCC(min.) > 100 µs.
7. 7. BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.
Switching Characteristics (over the operating range)[8]
Parameter
Description
CY62167DV18-55
CY62167DV18-70
Min.
Min.
Max.
Max.
Unit
Read Cycle
tRC
Read Cycle Time
tAA
Address to Data Valid
tOHA
Data Hold from Address Change
tACE
CE1 LOW or CE2 HIGH to Data Valid
55
70
ns
tDOE
OE LOW to Data Valid
25
35
ns
tLZOE
OE LOW to Low
55
70
55
Z[9]
10
10
5
Z[9, 11]
ns
70
ns
5
ns
tHZOE
OE HIGH to High
tLZCE
CE1 LOW or CE2 HIGH to Low Z[9]
tHZCE
CE1 HIGH or CE2 LOW to High Z[9, 11]
tPU
CE1 LOW or CE2 HIGH to Power-up
tPD
CE1 HIGH or CE2 LOW to Power-down
55
70
ns
tDBE
BLE/BHE LOW to Data Valid
55
70
ns
tLZBE[10]
BLE/BHE LOW to Low
tHZBE
BLE/BHE HIGH to High-Z[9, 11]
Z[9]
20
ns
10
25
10
20
0
ns
25
0
5
ns
ns
5
20
ns
ns
25
ns
Write Cycle[12]
tWC
Write Cycle Time
55
70
ns
tSCE
CE1 LOW or CE2 HIGH to Write End
40
60
ns
tAW
Address Set-up to Write End
40
60
ns
tHA
Address Hold from Write End
0
0
ns
tSA
Address Set-up to Write Start
0
0
ns
tPWE
WE Pulse Width
40
45
ns
tBW
BLE/BHE LOW to Write End
45
60
ns
tSD
Data Set-up to Write End
25
30
ns
tHD
Data Hold from Write End
0
0
ns
Z[9, 11]
tHZWE
WE LOW to High
tLZWE
WE HIGH to Low Z[9]
Document #: 38-05326 Rev. *A
20
10
25
10
ns
ns
Page 5 of 11
CY62167DV18
MoBL2™
PRELIMINARY
Switching Waveforms
Read Cycle No. 1 (Address Transition Controlled)[13, 14]
tRC
ADDRESS
tAA
tOHA
ATA OUT
PREVIOUS DATA VALID
DATA VALID
Notes:
8. Test conditions assume signal transition time of 3 ns or less, timing reference levels of VCC(typ.)/2, input pulse levels of 0 to VCC(typ.), and output loading of the
specified IOL
9. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZBE is less than tLZBE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any
given device.
10. If both byte enables are toggled together, this value is 10 ns.
11. tHZOE, tHZCE, tHZBE, and tHZWE transitions are measured when the outputs enter a high-impedance state.
12. The internal Write time of the memory is defined by the overlap of WE, CE1 = VIL, BHE and/or BLE = VIL.
13. Device is continuously selected. OE, CE1 = VIL, BHE and/or BLE = VIL, CE2<Def>
14. WE is HIGH for Read cycle.
Read Cycle No. 2 (OE Controlled)[14, 15]
ADDRESS
t RC
CE 1
t PD
t HZCE
CE2
tACE
BHE /BLE
t DBE
t HZBE
t LZBE
OE
t HZOE
t DOE
DATA OUT
tLZOE
HIGH IMPEDANCE
HIGH
IMPEDANCE
DATA VALID
t LZCE
VCC
SUPPLY
CURRENT
tPU
Document #: 38-05326 Rev. *A
50%
50%
I CC
I SB
Page 6 of 11
CY62167DV18
MoBL2™
PRELIMINARY
Switching Waveforms (continued)
Write Cycle No. 1 (WE Controlled)[12, 16, 17, 18]
t WC
ADDRESS
tSCE
CE1
CE2
tAW
t HA
t SA
t PWE
WE
tBW
BHE /BLE
OE
tSD
ATA I/O
t HD
DATAIN VALID
DON’T CARE
t HZOE
Note:
15. Address valid prior to or coincident with CE1, BHE, BLE transition LOW and CE2 transition HIGH.
Write Cycle No. 2 (CE</>1</> or CE</>2</> Controlled)[12, 16, 17, 18]
t WC
ADDRESS
t SCE
CE 1
CE 2
t SA
t AW
t HA
t PWE
WE
t BW
BHE /BLE
OE
t SD
DATA I/O
t HD
DATA IN VALID
DON’T CARE
t HZOE
Document #: 38-05326 Rev. *A
Page 7 of 11
CY62167DV18
MoBL2™
PRELIMINARY
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled, OE LOW)[17, 18]
tWC
ADDRESS
tSCE
CE1
CE2
tAW
tHA
tSA
tPWE
WE
tHD
tSD
DATA I/O
DATAIN VALID
DON’T CARE
tLZWE
tHZWE
Write Cycle No. 4 (BHE</>/BLE</> Controlled, OE</> LOW)</>[17]
t WC
ADDRESS
CE 1
CE 2
t SCE
t AW
t HA
t BW
BHE /BLE
t SA
t PWE
WE
t SD
DATA I/O
DON’T CARE
t HD
DATAIN VALID
Notes:
16. Data I/O is high-impedance if OE = VIH.
17. If CE1 goes HIGH or CE2 goes LOW simultaneously with WE HIGH, the output remains in a high-impedance state.
18. During the DON’T CARE period in the DATA I/O waveform, the I/Os are in output state and input signals should not be applied.
Document #: 38-05326 Rev. *A
Page 8 of 11
CY62167DV18
MoBL2™
PRELIMINARY
Truth Table
CE 1
CE 2
WE
OE
BHE
BLE
H
X
X
X
X
X
High Z
Deselect/Power-down
Standby(I SB )
X
L
X
X
X
X
High Z
Deselect/Power-down
Standby(I SB )
X
X
X
X
H
H
High Z
Deselect/Power-down
Standby(I SB )
L
H
H
L
L
L
Data Out(I/O0– I/O15)
Read
Active(I CC)
L
H
H
L
H
L
Data Out(I/O0– I/O7);
High Z (I/O8– I/O15)
Read
Active(I CC)
L
H
H
L
L
H
High Z (I/O0– I/O7);
Data Out(I/O8– I/O15)
Read
Active(I CC)
L
H
H
H
L
H
High Z
Output Disabled
Active(I CC)
L
H
H
H
H
L
High Z
Output Disabled
Active(I CC)
L
H
H
H
L
L
High Z
Output Disabled
Active(I CC)
L
H
L
X
L
L
Data In (I/O0– I/O15)
Write
Active(I CC)
L
H
L
X
H
L
Data In (I/O0– I/O7);
High Z (I/O8– I/O15)
Write
Active(I CC)
L
H
L
X
L
H
High Z (I/O0– I/O7);
Data In (I/O8– I/O15)
Write
Active(I CC)
Document #: 38-05326 Rev. *A
Input / Outputs
Mode
Power
Page 9 of 11
CY62167DV18
MoBL2™
PRELIMINARY
Ordering Information
Speed
(ns)
55
70
Ordering Code
Package
Name
Package Type
Operating
Range
Industrial
CY62167DV18L-55**I
TBD
48-ball Fine Pitch BGA (8.0 x 9.5 x 1.0 mm)
CY62167DV18LL-55**I
TBD
48-ball Fine Pitch BGA (8.0 x 9.5 x 1.0 mm)
CY62167DV18L-70**I
TBD
48-ball Fine Pitch BGA (8.0 x 9.5 x 1.0 mm)
CY62167DV18LL-70**I
TBD
48-ball Fine Pitch BGA (8.0 x 9.5 x 1.0 mm)
Industrial
Package Diagram
48-lead VFBGA (8 x 9.5 x 1 mm) BV48B
51-85178-**
MoBL is a registered trademark, and MoBL2 and More Battery Life are trademarks of Cypress Semiconductor. All product and
company names mentioned in this document are the trademarks of their respective holders.
Document #: 38-05326 Rev. *A
Page 10 of 11
© Cypress Semiconductor Corporation, 2003. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize
its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges.
CY62167DV18
MoBL2™
PRELIMINARY
Document History Page
Document Title: CY62167DV18MoBL2™ 16M (1024K x 16) Static RAM
Document Number: 38-05326
ECN NO.
Issue
Date
Orig. of
Change
**
118406
09/30/02
GUG
New Data Sheet
*A
123690
02/11/03
DPM
Changed Advance to Preliminary
Added package diagram
REV.
Document #: 38-05326 Rev. *A
Description of Change
Page 11 of 11
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