ONSEMI MC74VHCT257ADR2

MC74VHCT257A
Quad 2-Channel Multiplexer
with 3-State Outputs
The MC74VHCT257A is an advanced high speed CMOS quad
2–channel multiplexer fabricated with silicon gate CMOS technology.
It achieves high speed operation similar to equivalent Bipolar
Schottky TTL while maintaining CMOS low power dissipation.
It consists of four 2–input digital multiplexers with common select
(S) and enable (OE) inputs. When (OE) is held High, selection of data
is inhibited and all the outputs go Low.
The select decoding determines whether the A or B inputs get routed
to the corresponding Y outputs.
The VHCT inputs are compatible with TTL levels. This device can be
used as a level converter for interfacing 3.3 V to 5.0 V because it has full
5 V CMOS level output swings.
The VHCT257A input structures provide protection when voltages
between 0 V and 5.5 V are applied, regardless of the supply voltage. The
output structures also provide protection when VCC = 0 V. These input and
output structures help prevent device destruction caused by supply
voltage—input/output voltage mismatch, battery backup, hot insertion, etc.
The internal circuit is composed of three stages, including a buffered
output which provides high noise immunity and stable output. The inputs
tolerate voltages up to 7 V, allowing the interface of 5 V systems to 3 V
systems.
•
•
•
•
•
•
•
•
•
•
High Speed: tPD = 4.1ns (Typ) at VCC = 5V
Low Power Dissipation: ICC = 4µA (Max) at TA = 25°C
TTL–Compatible Inputs: VIL = 0.8 V; VIH = 2.0 V
Power Down Protection Provided on Inputs and Outputs
Balanced Propagation Delays
Designed for 2V to 5.5V Operating Range
Low Noise: VOLP = 0.8V (Max)
Pin and Function Compatible with Other Standard Logic Families
Latchup Performance Exceeds 300mA
ESD Performance: HBM > 2000V; Machine Model > 200V
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MARKING DIAGRAMS
16
9
VHCT257A
AWLYWW
SO–16
D SUFFIX
CASE 751B
1
8
16
9
VHCT257A
ALYW
TSSOP–16
DT SUFFIX
CASE 948F
1
8
9
16
VHCT257A
ALYW
EIAJ SO–16
M SUFFIX
CASE 966
A
L, WL
Y
W, WW
8
1
=
=
=
=
Assembly Location
Wafer Lot
Year
Work Week
ORDERING INFORMATION
S
1
16
VCC
Device
Package
Shipping
A0
2
15
OE
MC74VHCT257AD
SO–16
48 Units/Rail
B0
3
14
A3
MC74VHCT257ADR2
SO–16
2500 Tape & Reel
Y0
4
13
B3
A1
5
12
Y3
TSSOP–16
96 Units/Rail
B1
6
11
A2
MC74VHCT257ADTR2 TSSOP–16 2500 Tape & Reel
Y1
7
10
B2
MC74VHCT257AM
GND
8
9
Y2
MC74VHCT257ADT
EIAJ–SO–16
50 Units/Rail
MC74VHCT257AMEL EIAJ–SO–16 2000 Tape & Reel
Figure 1. Pin Assignment
 Semiconductor Components Industries, LLC, 2001
April, 2001 – Rev. 1
1
Publication Order Number:
MC74VHCT257A/D
MC74VHCT257A
A0
B0
A1
NIBBLE
INPUTS
B1
A2
B2
A3
B3
OE
S
2
4
3
Y0
5
7
6
Y1
11
9 Y2
10
OE
S
DATA
OUTPUTS
14
A2
B2
12 Y3
13
A0
B0
A1
B1
A3
B3
15
15
1
2
3
5
6
EN
G1
1
1
MUX
11
10
14
13
4
7
9
12
1
Figure 2. Expanded Logic Diagram
Figure 3. IEC Logic Symbol
FUNCTION TABLE
Inputs
OE
S
Outputs
Y0 – Y3
H
L
L
X
L
H
L
A0–A3
B0–B3
This device contains protection
circuitry to guard against damage
due to high static voltages or electric
fields. However, precautions must
be taken to avoid applications of any
voltage higher than maximum rated
voltages to this high–impedance circuit. For proper operation, Vin and
Vout should be constrained to the
range GND (Vin or Vout) VCC.
Unused inputs must always be
tied to an appropriate logic voltage
level (e.g., either GND or V CC ).
Unused outputs must be left open.
A0 – A3, B0 – B3 = the levels
of the respective Data–Word
Inputs.
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2
Y0
Y1
Y2
Y3
MC74VHCT257A
MAXIMUM RATINGS (Note 1.)
Value
Unit
VCC
Symbol
Positive DC Supply Voltage
Parameter
–0.5 to +7.0
V
VIN
Digital Input Voltage
–0.5 to +7.0
V
VOUT
DC Output Voltage
–0.5 to +7.0
–0.5 to VCC +0.5
V
IIK
Input Diode Current
–20
mA
IOK
Output Diode Current
20
mA
IOUT
DC Output Current, per Pin
25
mA
ICC
DC Supply Current, VCC and GND Pins
75
mA
PD
Power Dissipation in Still Air
200
180
mW
TSTG
Storage Temperature Range
–65 to +150
°C
VESD
ESD Withstand Voltage
Human Body Model (Note 2.)
Machine Model (Note 3.)
Charged Device Model (Note 4.)
>2000
>200
>2000
V
ILATCH–UP
Latch–Up Performance
Above VCC and Below GND at 125°C (Note 5.)
300
mA
JA
Thermal Resistance, Junction to Ambient
143
164
°C/W
Output in 3–State
High or Low State
SOIC Package
TSSOP
SOIC Package
TSSOP
1. Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the
Recommended Operating Conditions.
2. Tested to EIA/JESD22–A114–A
3. Tested to EIA/JESD22–A115–A
4. Tested to JESD22–C101–A
5. Tested to EIA/JESD78
RECOMMENDED OPERATING CONDITIONS
Symbol
Characteristics
VCC
DC Supply Voltage
VIN
DC Input Voltage
VOUT
DC Output Voltage
TA
Operating Temperature Range, all Package Types
tr, tf
Input Rise or Fall Time
VCC = 5.0 V + 0.5 V
Min
Max
Unit
4.5
5.5
V
0
5.5
V
0
VCC
V
–55
125
°C
0
20
ns/V
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
TJ = 80 ° C
117.8
TJ = 90 ° C
1,032,200
TJ = 100 ° C
80
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
TJ = 110° C
Time, Years
TJ = 120° C
Time, Hours
TJ = 130 ° C
Junction
Temperature °C
NORMALIZED FAILURE RATE
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
1
1
10
100
1000
TIME, YEARS
Figure 4. Failure Rate vs. Time Junction Temperature
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3
MC74VHCT257A
DC CHARACTERISTICS (Voltages Referenced to GND)
VCC
Symbol
Parameter
Condition
(V)
Min
2
VIH
Minimum High–Level
Input Voltage
4.5 to
5.5
VIL
Maximum Low–Level
Input Voltage
4.5 to
5.5
VOH
Maximum High–Level
Output
Ou
u Voltage
o age
VOL
Maximum Low–Level
Output
Ou
u Voltage
o age
TA ≤ 85°C
TA = 25°C
Typ
Max
Min
Max
2
0.8
–55°C ≤ TA ≤ 125°C
Min
Max
2
0.8
V
0.8
VIN = VIH or VIL
IOH = –50 µA
4.5
3.94
3.8
3.66
VIN = VIH or VIL
IOH = –8 mA
4.5
3.94
3.8
3.66
VIN = VIH or VIL
IOL = 50 µA
4.5
VIN = VIH or VIL
IOH = 8 mA
Unit
V
V
V
0
0.1
0.1
0.1
4.5
0.36
0.44
0.52
IIN
Input Leakage Current
VIN = 5.5 V or GND
0 to
5.5
±0.1
±1.0
±1.0
µA
IOZ
Maximum 3–State
Leakage Current
VIN = VIH or VIL
VOUT = VCC or GND
5.5
±0.25
±2.5
±2.5
µA
ICCT
Maximum Quiescent
Supply Current
VIN = VCC or GND
5.5
4.0
40.0
40.0
µA
ICC
Additional Quiescent
Supply Current
(per pin)
VIN = VCC or GND
5.5
1.35
1.5
1.5
µA
IOPD
Output Leakage
Current
VOUT = 5.5 V
0
0.5
5
5
µA
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AC ELECTRICAL CHARACTERISTICS (Input tr = tf = 3.0ns)
TA = ≤ 85°C
TA = 25°C
Symbol
Parameter
Typ
Max
Min
Max
Min
Max
Unit
tPLH,
tPHL
Maximum
Propagation
Delay,
g
y
A or B to Y
VCC = 3.3 ± 0.3V
CL = 15pF
CL = 50pF
5.8
8.3
9.3
12.8
1.0
1.0
11.0
14.5
1.0
1.0
11.0
14.5
ns
VCC = 5.0 ± 0.5V
CL = 15pF
CL = 50pF
3.6
5.1
5.9
7.9
1.0
1.0
7.0
9.0
1.0
1.0
7.0
9.0
Maximum
Propagation
Delay,
g
y
S to Y
VCC = 3.3 ± 0.3V
CL = 15pF
CL = 50pF
7.0
9.5
11.0
14.5
1.0
1.0
13.0
16.5
1.0
1.0
13.0
16.5
VCC = 5.0 ± 0.5V
CL = 15pF
CL = 50pF
4.0
5.5
6.8
8.8
1.0
1.0
8.0
10.0
1.0
1.0
8.0
10.0
Maximum Output
Enable,
Time OE to Y
Time,
VCC = 3.3 ± 0.3V
RL = 1 k
CL = 15pF
CL = 50pF
6.7
9.2
10.5
14.0
1.0
1.0
12.5
16.0
1.0
1.0
12.5
16.0
VCC = 5.0 ± 0.5V
RL = 1 k
CL = 15pF
CL = 50pF
3.6
5.1
6.8
11.0
1.0
12.0
8.0
10.0
1.0
1.0
8.0
12.0
Maximum Output
Disable,
Time OE to Y
Time,
VCC = 3.3 ± 0.3V
RL = 1 k
CL = 50pF
10.5
14.0
1.0
15.0
1.0
15.0
VCC = 5.0 ± 0.5V
RL = 1 k
CL = 50pF
9.5
12.0
1.0
13.0
1.0
13.0
4
10
tPLH,
tPHL
tPZL,
tPZH
tPLZ,
tPHZ
CIN
Min
–55°C ≤ TA ≤ 125°C
Test Conditions
Maximum Input
Capacitance
10
10
ns
ns
ns
pF
Typical @ 25°C, VCC = 5.0 V
20
CPD
Power Dissipation Capacitance (Note 1.)
pF
1. CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.
Average operating current can be obtained by the equation: ICC(OPR) = CPD VCC fin + ICC. CPD is used to determine the no–load dynamic
power consumption; PD = CPD VCC2 fin + ICC VCC.
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4
MC74VHCT257A
NOISE CHARACTERISTICS (Input tr = tf = 3.0ns, CL = 50pF, VCC = 5.0V)
TA = 25°C
Symbol
Characteristic
Typ
Max
Unit
VOLP
Quiet Output Maximum Dynamic VOL
0.3
0.8
V
VOLV
Quiet Output Minimum Dynamic VOL
– 0.3
– 0.8
V
VIHD
Minimum High Level Dynamic Input Voltage
2.0
V
VILD
Maximum Low Level Dynamic Input Voltage
0.8
V
OE
VCC
50%
GND
VCC
A, B or S
50%
tPLH
Y
tPZL
GND
tPHL
tPLZ
Y
tPZH
50% VCC
VOH - 0.3V
HIGH
IMPEDANCE
Figure 6. Switching Waveform
TEST POINT
TEST POINT
OUTPUT
DEVICE
UNDER
TEST
VOL + 0.3V
tPHZ
50% VCC
Y
Figure 5. Switching Waveform
HIGH
IMPEDANCE
50% VCC
DEVICE
UNDER
TEST
CL*
*Includes all probe and jig capacitance
OUTPUT
1 kΩ
CL *
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 7. Test Circuit
Figure 8. Test Circuit
INPUT
Figure 9. Input Equivalent Circuit
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5
MC74VHCT257A
PACKAGE DIMENSIONS
SOIC–16
D SUFFIX
CASE 751B–05
ISSUE J
–A–
16
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
9
–B–
1
P
8 PL
0.25 (0.010)
8
M
B
S
G
R
K
DIM
A
B
C
D
F
G
J
K
M
P
R
F
X 45 C
–T–
SEATING
PLANE
J
M
D
16 PL
0.25 (0.010)
M
T B
S
A
S
MILLIMETERS
MIN
MAX
9.80
10.00
3.80
4.00
1.35
1.75
0.35
0.49
0.40
1.25
1.27 BSC
0.19
0.25
0.10
0.25
0
7
5.80
6.20
0.25
0.50
INCHES
MIN
MAX
0.386
0.393
0.150
0.157
0.054
0.068
0.014
0.019
0.016
0.049
0.050 BSC
0.008
0.009
0.004
0.009
0
7
0.229
0.244
0.010
0.019
TSSOP–16
DT SUFFIX
CASE 948F–01
ISSUE O
16X K REF
0.10 (0.004)
0.15 (0.006) T U
M
T U
V
S
S
S
K
ÉÉ
ÇÇÇ
ÇÇÇ
ÉÉ
K1
2X
L/2
16
9
J1
B
–U–
L
SECTION N–N
J
PIN 1
IDENT.
8
1
N
0.15 (0.006) T U
S
0.25 (0.010)
A
–V–
M
N
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD FLASH.
PROTRUSIONS OR GATE BURRS. MOLD FLASH
OR GATE BURRS SHALL NOT EXCEED 0.15
(0.006) PER SIDE.
4. DIMENSION B DOES NOT INCLUDE INTERLEAD
FLASH OR PROTRUSION. INTERLEAD FLASH OR
PROTRUSION SHALL NOT EXCEED
0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN
EXCESS OF THE K DIMENSION AT MAXIMUM
MATERIAL CONDITION.
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
7. DIMENSION A AND B ARE TO BE DETERMINED
AT DATUM PLANE -W-.
F
DETAIL E
–W–
C
0.10 (0.004)
–T– SEATING
PLANE
DETAIL E
H
D
G
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6
DIM
A
B
C
D
F
G
H
J
J1
K
K1
L
M
MILLIMETERS
MIN
MAX
4.90
5.10
4.30
4.50
--1.20
0.05
0.15
0.50
0.75
0.65 BSC
0.18
0.28
0.09
0.20
0.09
0.16
0.19
0.30
0.19
0.25
6.40 BSC
0
8
INCHES
MIN
MAX
0.193
0.200
0.169
0.177
--0.047
0.002
0.006
0.020
0.030
0.026 BSC
0.007
0.011
0.004
0.008
0.004
0.006
0.007
0.012
0.007
0.010
0.252 BSC
0
8
MC74VHCT257A
PACKAGE DIMENSIONS
SOIC EIAJ–16
M SUFFIX
CASE 966–01
ISSUE O
16
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH OR PROTRUSIONS AND ARE MEASURED
AT THE PARTING LINE. MOLD FLASH OR
PROTRUSIONS SHALL NOT EXCEED 0.15 (0.006)
PER SIDE.
4. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
5. THE LEAD WIDTH DIMENSION (b) DOES NOT
INCLUDE DAMBAR PROTRUSION. ALLOWABLE
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)
TOTAL IN EXCESS OF THE LEAD WIDTH
DIMENSION AT MAXIMUM MATERIAL CONDITION.
DAMBAR CANNOT BE LOCATED ON THE LOWER
RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSIONS AND ADJACENT LEAD
TO BE 0.46 ( 0.018).
LE
9
Q1
M
E HE
1
8
L
DETAIL P
Z
D
e
VIEW P
A
A1
b
0.13 (0.005)
c
M
0.10 (0.004)
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7
DIM
A
A1
b
c
D
E
e
HE
L
LE
M
Q1
Z
MILLIMETERS
MIN
MAX
--2.05
0.05
0.20
0.35
0.50
0.18
0.27
9.90
10.50
5.10
5.45
1.27 BSC
7.40
8.20
0.50
0.85
1.10
1.50
10 0
0.70
0.90
--0.78
INCHES
MIN
MAX
--0.081
0.002
0.008
0.014
0.020
0.007
0.011
0.390
0.413
0.201
0.215
0.050 BSC
0.291
0.323
0.020
0.033
0.043
0.059
10 0
0.028
0.035
--0.031
MC74VHCT257A
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes
without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular
purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,
including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
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SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable
attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim
alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer.
PUBLICATION ORDERING INFORMATION
NORTH AMERICA Literature Fulfillment:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303–675–2175 or 800–344–3860 Toll Free USA/Canada
Fax: 303–675–2176 or 800–344–3867 Toll Free USA/Canada
Email: [email protected]
Fax Response Line: 303–675–2167 or 800–344–3810 Toll Free USA/Canada
N. American Technical Support: 800–282–9855 Toll Free USA/Canada
EUROPE: LDC for ON Semiconductor – European Support
German Phone: (+1) 303–308–7140 (Mon–Fri 2:30pm to 7:00pm CET)
Email: ONlit–[email protected]
French Phone: (+1) 303–308–7141 (Mon–Fri 2:00pm to 7:00pm CET)
Email: ONlit–[email protected]
English Phone: (+1) 303–308–7142 (Mon–Fri 12:00pm to 5:00pm GMT)
Email: [email protected]
CENTRAL/SOUTH AMERICA:
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Toll–Free from Mexico: Dial 01–800–288–2872 for Access –
then Dial 866–297–9322
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Phone: 1–303–675–2121 (Tue–Fri 9:00am to 1:00pm, Hong Kong Time)
Toll Free from Hong Kong & Singapore:
001–800–4422–3781
Email: ONlit–[email protected]
JAPAN: ON Semiconductor, Japan Customer Focus Center
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Phone: 81–3–5740–2700
Email: [email protected]
ON Semiconductor Website: http://onsemi.com
EUROPEAN TOLL–FREE ACCESS*: 00–800–4422–3781
*Available from Germany, France, Italy, UK, Ireland
For additional information, please contact your local
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http://onsemi.com
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