ONSEMI NSS30201MR6T1G

NSS30201MR6T1G
30 V, 3 A, Low VCE(sat)
NPN Transistor
ON Semiconductor’s e2 PowerEdge family of low VCE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (VCE(sat)) and high current gain capability. These
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
Typical application are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
cluster. The high current gain allows e2PowerEdge devices to be
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
• This is a Pb−Free Device
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30 VOLTS
3.0 AMPS
NPN LOW VCE(sat) TRANSISTOR
EQUIVALENT RDS(on) 100 mW
COLLECTOR
1, 2, 5, 6
3
BASE
MAXIMUM RATINGS (TA = 25°C)
Symbol
Max
Unit
Collector-Emitter Voltage
VCEO
30
V
Collector-Base Voltage
VCBO
50
V
Emitter-Base Voltage
VEBO
5.0
V
IC
2.0
A
ICM
3.0
A
Rating
Collector Current − Continuous
Collector Current − Peak
4
EMITTER
6
Total Device Dissipation
TA = 25°C
Derate above 25°C
Thermal Resistance,
Junction−to−Ambient
Total Device Dissipation
TA = 25°C
Derate above 25°C
Symbol
Max
Unit
PD (Note 1)
535
mW
4.3
mW/°C
RqJA (Note 1)
234
°C/W
PD (Note 2)
1.180
W
9.4
mW/°C
Thermal Resistance,
Junction−to−Ambient
RqJA (Note 2)
106
°C/W
Thermal Resistance,
Junction−to−Lead #1
RqJL (Note 1)
RqJL (Note 2)
110
50
°C/W
°C/W
PDsingle
(Notes 2 and 3)
1.75
W
TJ, Tstg
−55 to
+150
°C
Total Device Dissipation
(Single Pulse < 10 s)
Junction and Storage
Temperature Range
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. FR−4 with 1 oz and 3.9 mm2 of copper area.
2. FR−4 with 1 oz and 645 mm2 of copper area.
3. Refer to Figure 8.
© Semiconductor Components Industries, LLC, 2005
June, 2005 − Rev. 0
1
4
1
2
3
TSOP−6
CASE 318G
STYLE 6
THERMAL CHARACTERISTICS
Characteristic
5
DEVICE MARKING
VS7M
VS7 = Specific Device Code
M = Date Code
ORDERING INFORMATION
Device
NSS30201MR6T1G
Package
Shipping†
TSOP−6 3000/Tape & Reel
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Publication Order Number:
NSS30201MR6/D
NSS30201MR6T1G
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
30
−
−
50
−
−
5.0
−
−
−
−
0.1
−
−
0.1
Unit
OFF CHARACTERISTICS
Collector −Emitter Breakdown Voltage
(IC = 10 mA, IB = 0)
V(BR)CEO
Collector−Base Breakdown Voltage
(IC = 0.1 mA, IE = 0)
V(BR)CBO
Emitter −Base Breakdown Voltage
(IE = 0.1 mA, IC = 0)
V(BR)EBO
Collector Cutoff Current
(VCB = 30 V, IE = 0)
ICBO
Collector−Emitter Cutoff Current
(VCES = 30 V)
ICES
Emitter Cutoff Current
(VEB = 4.0 V)
IEBO
V
V
V
mA
mA
mA
−
0.1
ON CHARACTERISTICS
hFE
DC Current Gain (Note 4)
(IC = 1.0 mA, VCE = 5.0 V)
(IC = 0.5 A, VCE = 5.0 V)
(IC = 1.0 A, VCE = 5.0 V)
Collector −Emitter Saturation Voltage (Note 4)
(IC = 1.0 A, IB = 100 mA)
(IC = 0.5 A, IB = 50 mA)
(IC = 0.1 A, IB = 1.0 mA)
VCE(sat)
Base −Emitter Saturation Voltage (Note 4)
(IC = 1.0 A, IB = 0.1 A)
VBE(sat)
Base −Emitter Turn−on Voltage (Note 4)
(IC = 1.0 A, VCE = 2.0 V)
VBE(on)
Cutoff Frequency
(IC = 100 mA, VCE = 5.0 V, f = 100 MHz
fT
Output Capacitance (f = 1.0 MHz)
300
300
200
−
500
−
−
900
−
−
−
−
0.10
0.06
0.05
0.200
0.125
0.075
−
−
1.1
−
−
1.1
200
300
−
−
−
15
V
V
V
MHz
Cobo
4. Pulsed Condition: Pulse Width ≤ 300 msec, Duty Cycle ≤ 2%.
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2
pF
NSS30201MR6T1G
1.0
1.0
0.9
0.8
0.7
0.8
0.7
IC = 1 A
0.6
VCE(sat) (V)
VCE(sat) (V)
0.9
IC = 2 A
0.5
0.4
0.3
0
0.5
Ic/Ib = 100
0.4
0.3
IC = 500 mA
0.2
0.1
0.6
Ic/Ib = 10
0.2
0.1
IC = 100 mA
0.001
0.01
Ib (A)
0.1
0
0.2
0.001
0.01
0.1
Figure 1. VCE (sat) versus Ib
1.2
VCE = 5 V
600
VCE = 5 V
+125°C
1.0
+25°C
0.8
VBE(on) (V)
hFE
500
400
300
2
Figure 2. VCE (sat) versus Ic
800
700
1
Ic (A)
−55°C
−55°C
+25°C
0.6
0.4
+125°C
200
0.2
100
0
0.001
0.01
1
0.1
0
2
0.001
Ic (A)
1
2
Figure 4. VBE(on) versus Ic
10.00
IC COLLECTOR CURRENT (A)
1.2
1.0
Ic/Ib = 10
VBE (sat) (V)
0.1
Ic (A)
Figure 3. hFE versus Ic
0.8
Ic/Ib = 100
0.6
0.4
0.2
0
0.01
0.001
0.01
0.1
1
3.0
1.00
1 ms
10 ms
100 ms
0.10
1s
SINGLE PULSE Tamb = 25°C
0.01
0.10
1.00
10.00
VCE(sat) (V)
2
Ic (A)
Figure 5. VBE(sat) versus Ic
Figure 6. Safe Operating Area
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3
dc
100.00
NSS30201MR6T1G
fT, CURRENT−GAIN BANDWIDTH
PRODUCT (MHz)
1000
100
10
1
10
100
1000
IC, COLLECTOR CURRENT (mA)
r(t), NORMALIZED TRANSIENT THERMAL
RESISTANCE
Figure 7. fT (MHZ) versus IC (mA)
VCE = 5.0 V
1.0
D = 0.5
0.2
0.1
0.1
0.05
0.02
0.01
0.01
0.001
SINGLE PULSE
0.00001
0.0001
0.001
0.01
0.1
t, TIME (sec)
1.0
Figure 8. Normalized Thermal Response
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4
10
100
1000
NSS30201MR6T1G
PACKAGE DIMENSIONS
TSOP−6
CASE 318G−02
ISSUE P
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD
FINISH THICKNESS. MINIMUM LEAD
THICKNESS IS THE MINIMUM THICKNESS OF
BASE MATERIAL.
4. DIMENSIONS A AND B DO NOT INCLUDE
MOLD FLASH, PROTRUSIONS, OR GATE
BURRS.
D
6
HE
1
5
4
2
3
E
b
DIM
A
A1
b
c
D
E
e
L
HE
q
e
q
c
A
0.05 (0.002)
L
A1
MIN
0.90
0.01
0.25
0.10
2.90
1.30
0.85
0.20
2.50
0°
MILLIMETERS
NOM
MAX
1.00
1.10
0.06
0.10
0.38
0.50
0.18
0.26
3.00
3.10
1.50
1.70
0.95
1.05
0.40
0.60
2.75
3.00
10°
−
STYLE 6:
PIN 1. COLLECTOR
2. COLLECTOR
3. BASE
4. EMITTER
5. COLLECTOR
6. COLLECTOR
SOLDERING FOOTPRINT*
2.4
0.094
1.9
0.075
0.95
0.037
0.95
0.037
0.7
0.028
1.0
0.039
SCALE 10:1
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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5
MIN
0.035
0.001
0.010
0.004
0.114
0.051
0.034
0.008
0.099
0°
INCHES
NOM
0.039
0.002
0.014
0.007
0.118
0.059
0.037
0.016
0.108
−
MAX
0.043
0.004
0.020
0.010
0.122
0.067
0.041
0.024
0.118
10°
NSS30201MR6T1G
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,
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NSS30201MR6/D