ON NB100LVEP221FARG Differential hstl/ecl/pecl clock driver Datasheet

NB100LVEP221
2.5V/3.3V 2:1:20
Differential HSTL/ECL/PECL
Clock Driver
Description
The NB100LVEP221 is a low skew 2:1:20 differential clock driver,
designed with clock distribution in mind, accepting two clock sources
into an input multiplexer. The two clock inputs are differential
ECL/PECL; CLK1/CLK1 can also receive HSTL signal levels. The
LVPECL input signals can be either differential configuration or
single−ended (if the VBB output is used).
The LVEP221 specifically guarantees low output−to−output skew.
Optimal design, layout, and processing minimize skew within a device
and from device to device.
To ensure tightest skew, both sides of differential outputs should be
terminated identically into 50 W even if only one output is being used.
If an output pair is unused, both outputs may be left open
(unterminated) without affecting skew.
The NB100LVEP221, as with most other ECL devices, can be
operated from a positive VCC supply in LVPECL mode. This allows the
LVEP221 to be used for high performance clock distribution in +3.3 V or
+2.5 V systems. In a PECL environment, series or Thevenin line
terminations are typically used as they require no additional power
supplies. For more information on PECL terminations, designers should
refer to Application Note AND8020/D.
The VBB pin, an internally generated voltage supply, is available to this
device only. For single−ended LVPECL input conditions, the unused
differential input is connected to VBB as a switching reference voltage.
VBB may also rebias AC coupled inputs. When used, decouple VBB and
VCC via a 0.01 mF capacitor and limit current sourcing or sinking to
0.5 mA. When not used, VBB should be left open.
Single−ended CLK input operation is limited to a VCC ≥ 3.0 V in
LVPECL mode, or VEE ≤ −3.0 V in NECL mode.
www.onsemi.com
MARKING
DIAGRAMS*
52
1
NB100
LVEP221
AWLYYWWG
LQFP−52
FA SUFFIX
CASE 848H
52
1
1
NB100
LVEP221
AWLYYWWG
52
QFN−52
MN SUFFIX
CASE 485M
A
WL
YY
WW
G
= Assembly Location
= Wafer Lot
= Year
= Work Week
= Pb−Free Package
*For additional marking information, refer to
Application Note AND8002/D.
Features
•
•
•
•
•
•
•
•
•
•
•
•
15 ps Typical Output−to−Output Skew
40 ps Typical Device−to−Device Skew
Jitter Less than 2 ps RMS
Maximum Frequency > 1.0 GHz Typical
Thermally Enhanced 52−Lead LQFP and QFN
VBB Output
540 ps Typical Propagation Delay
LVPECL and HSTL Mode Operating Range:
VCC = 2.375 V to 3.8 V with VEE = 0 V
NECL Mode Operating Range:
VCC = 0 V with VEE = −2.375 V to −3.8 V
Q Output will Default Low with Inputs Open or at VEE
Pin Compatible with Motorola MC100EP221
These Devices are Pb−Free and are RoHS Compliant
© Semiconductor Components Industries, LLC, 2015
April, 2015 − Rev. 10
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 10 of this data sheet.
1
Publication Order Number:
NB100LVEP221/D
Q6
Q6
Q7
Q7
Q8
Q8
Q9
Q9
Q10
Q10
Q11
Q11
VCC0
NB100LVEP221
39
38
37
36
35
34
33
32
31
30
29
28
27
VCC0
40
26
Q12
Q5
41
25
Q12
Q5
42
24
Q13
Q4
43
23
Q13
Q4
44
22
Q14
Q3
45
21
Q14
Q3
46
20
Q15
Q2
47
19
Q15
Q2
48
18
Q16
Q1
49
17
Q16
Q1
50
16
Q17
Q0
51
15
Q17
Q0
52
14
VCC0
4
5
6
7
8
9
10
11
12
13
CLK0
VBB
CLK1
CLK1
VEE
Q19
Q19
Q18
Q18
VCC
3
CLK0
2
CLKSEL
1
VCC0
NB100LVEP221
All VCC, VCCO, and VEE pins must be externally connected to appropriate Power Supply to guarantee proper operation. The thermally
conductive exposed pad on package bottom (see package case drawing) must be attached to a heat−sinking conduit, capable of transferring 1.2 Watts. This exposed pad is electrically connected to VEE internally.
Figure 1. 52−Lead LQFP Pinout (Top View)
www.onsemi.com
2
Q1
Q2
Q2
Q
3
Q3
Q4
Q4
Q5
Q5
VCC0
49
48
47
46
44
43
42
41
40
45
Q1
50
51
Q
0
Q0
52
NB100LVEP221
Exposed Pad (EP)
VCC0
1
39
Q6
VCC
2
38
Q6
CLKSEL
3
37
Q7
CLK0
4
36
Q7
CLK0
5
35
Q8
VBB
6
34
Q8
CLK1
7
33
Q9
CLK1
8
32
Q9
VEE
9
31
Q10
Q19
10
30
Q10
Q19
11
29
Q11
Q18
12
28
Q11
Q18
13
27
VCC0
24
25
26
Q12
Q12
21
Q14
Q13
20
Q15
23
19
Q15
Q13
18
Q16
22
17
Q16
Q14
16
Q17
15
Q17
VCC0
14
NB100LVEP221
Figure 2. 52−Lead QFN Pinout (Top View)
Table 1. PIN DESCRIPTION
PIN
FUNCTION
CLK0*, CLK0**
ECL/PECL Differential Inputs
CLK1*, CLK1**
ECL/PECL or HSTL Differential Inputs
Q0:19, Q0:19
ECL/PECL Differential Outputs
CLK_SEL*
ECL/PECL Active Clock Select Input
VBB
Reference Voltage Output
VCC/VCCO
Positive Supply
VEE***
Negative Supply
CLK0
0
CLK0
20
Q0 − Q19
Q0 − Q19
CLK1
20
1
CLK1
VBB
* Pins will default LOW when left open.
** Pins will default HIGH when left open.
*** The thermally conductive exposed pad on the bottom of the
package is electrically connected to VEE internally.
CLK_SEL
VCC
Table 2. FUNCTION TABLE
VEE
CLK_SEL
Active Input
L
H
CLK0, CLK0
CLK1, CLK1
Figure 3. Logic Diagram
www.onsemi.com
3
NB100LVEP221
Table 3. ATTRIBUTES
Characteristics
Value
Internal Input Pulldown Resistor
75 kW
Internal Input Pullup Resistor
37.5 kW
ESD Protection
Human Body Model
Machine Model
Charged Device Model
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
LQFP−52
QFN−52
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count
> 2 kV
> 200 V
> 2 kV
Pb−Free Pkg
Level 3
Level 2
UL 94 V−0 @ 0.125 in
533 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, refer to Application Note AND8003/D.
Table 4. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE = 0 V
6
V
VEE
NECL Mode Power Supply
VCC = 0 V
−6
V
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
VEE = 0 V
VCC = 0 V
6
−6
V
V
Iout
Output Current
Continuous
Surge
50
100
mA
mA
IBB
VBB Sink/Source
± 0.5
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient)
(See Application Information)
0 lfpm
500 lfpm
LQFP−52
LQFP−52
35.6
30
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
(See Application Information)
0 lfpm
500 lfpm
LQFP−52
LQFP−52
3.2
6.4
°C/W
°C/W
qJA
Thermal Resistance (Junction−to−Ambient)
(Note )
0 lfpm
500 lfpm
QFN−52
QFN−52
25
19.6
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case) (Note )
2S2P
QFN−52
21
°C/W
Tsol
Wave Solder
265
265
°C
Pb
Pb−Free
VI ≤ VCC
VI ≥ VEE
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
www.onsemi.com
4
NB100LVEP221
Table 5. LVPECL DC CHARACTERISTICS VCC = 2.5 V; VEE = 0 V (Note 2)
−40°C
25°C
85°C
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
IEE
Power Supply Current
100
125
150
104
130
156
116
145
174
mA
VOH
Output HIGH Voltage (Note 3)
1355
1480
1605
1355
1480
1605
1355
1480
1605
mV
VOL
Output LOW Voltage (Note 3)
555
680
900
555
680
900
555
680
900
mV
VIH
Input HIGH Voltage (Single−Ended) (Note 4)
1335
1620
1335
1620
1275
1620
mV
VIL
Input LOW Voltage (Single−Ended) (Note 4)
555
900
555
900
555
900
mV
VIHCMR
Input HIGH Voltage Common Mode Range
(Differential Configuration) (Note 5)
CLK0/CLK0
CLK1/CLK1
1.2
0.3
2.5
1.6
1.2
0.3
2.5
1.6
1.2
0.3
2.5
1.6
V
V
150
mA
Symbol
Characteristic
IIH
Input HIGH Current
IIL
Input LOW Current
150
CLK
CLK
0.5
−150
150
0.5
−150
mA
0.5
−150
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
2. Input and output parameters vary 1:1 with VCC. VEE can vary + 0.125 V to −1.3 V.
3. All outputs loaded with 50 W to VCC − 2.0 V.
4. Do not use VBB at VCC < 3.0 V.
5. VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differential input signal.
Table 6. LVPECL DC CHARACTERISTICS VCC = 3.3 V; VEE = 0 V (Note 6)
−40°C
Symbol
Characteristic
25°C
85°C
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
IEE
Power Supply Current
100
125
150
104
130
156
116
145
174
mA
VOH
Output HIGH Voltage (Note 7)
2155
2280
2405
2155
2280
2405
2155
2280
2405
mV
VOL
Output LOW Voltage (Note 7)
1355
1480
1700
1355
1480
1700
1355
1480
1700
mV
VIH
Input HIGH Voltage (Single−Ended)
2135
2420
2135
2420
2135
2420
mV
VIL
Input LOW Voltage (Single−Ended)
1355
1700
1355
1700
1355
1700
mV
VBB
Output Reference Voltage (Note 8)
1775
1975
1775
1975
1775
1975
mV
VIHCMR
Input HIGH Voltage Common Mode Range
(Differential Configuration) (Note 9)
CLK0/CLK0
CLK1/CLK1
3.3
1.6
1.2
0.3
3.3
1.6
1.2
0.3
3.3
1.6
V
V
150
mA
IIH
Input HIGH Current
IIL
Input LOW Current
1875
1.2
0.3
150
CLK
CLK
0.5
−150
1875
150
0.5
−150
0.5
−150
1875
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
6. Input and output parameters vary 1:1 with VCC. VEE can vary + 0.925 V to −0.5 V.
7. All outputs loaded with 50 W to VCC − 2.0 V.
8. Single−ended input operation is limited VCC ≥ 3.0 V in LVPECL mode.
9. VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differential
input signal.
www.onsemi.com
5
NB100LVEP221
Table 7. LVNECL DC CHARACTERISTICS VCC = 0 V, VEE = −2.375 V to −3.8 V (Note 10)
−40°C
25°C
85°C
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
100
125
150
104
130
156
116
145
174
mA
Output HIGH Voltage (Note 11)
−1145
−1020
−895
−1145
−1020
−895
−1145
−1020
−895
mV
Output LOW Voltage (Note 11)
−1945
−1820
−1600
−1945
−1820
−1600
−1945
−1820
−1600
mV
VIH
Input HIGH Voltage (Single−Ended)
−1165
−880
−1165
−880
−1165
−880
mV
VIL
Input LOW Voltage (Single−Ended)
−1945
−1600
−1945
−1600
−1945
−1600
mV
VBB
Output Reference Voltage (Note 12)
−1525
−1325
−1525
−1325
−1525
−1325
mV
VIHCMR
Input HIGH Voltage Common Mode
Range (Differential Configuration)
(Note 13)
CLK0/CLK0
CLK1/CLK1
0.0
−0.9
V
V
150
mA
Symbol
Characteristic
IEE
Power Supply Current
VOH
VOL
IIH
Input HIGH Current
IIL
Input LOW Current
−1425
VEE + 1.2
VEE + 0.3
0.0
−0.9
−1425
VEE + 1.2
VEE + 0.3
150
CLK
CLK
0.0
−0.9
−1425
VEE + 1.2
VEE + 0.3
150
0.5
−150
0.5
−150
mA
0.5
−150
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
10. Input and output parameters vary 1:1 with VCC.
11. All outputs loaded with 50 W to VCC−2.0 V.
12. Single−ended input operation is limited VEE ≤ −3.0V in NECL mode.
13. VIHCMR min varies 1:1 with VEE, VIHCMR max varies 1:1 with VCC. The VIHCMR range is referenced to the most positive side of the differential
input signal.
Table 8. HSTL DC CHARACTERISTICS VCC = 3.3 V; VEE = 0 V
0°C
Symbol
VIH
VIL
Min
Characteristic
Typ
25°C
Max
Min
Typ
85°C
Max
Min
Typ
Max
Unit
Input HIGH Voltage
CLK1/CLK1
Vx+100
1600
Vx+100
1600
Vx+100
1600
mV
CLK1/CLK1
−300
Vx−100
−300
Vx−100
−300
Vx−100
mV
Input LOW Voltage
VX
Differential Configuration Cross
Point Voltage
680
900
680
900
680
900
mV
IIH
Input HIGH Current
−150
150
−150
150
−150
150
mA
IIL
Input LOW Current
CLK1
CLK1
−150
−250
−150
−250
−150
−250
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
www.onsemi.com
6
NB100LVEP221
Table 9. AC CHARACTERISTICS VCC = 0 V; VEE = −2.375 to −3.8 V or VCC = 2.375 to 3.8 V; VEE = 0 V (Note 14)
−40°C
Symbol
VOpp
tPLH/tPHL
Characteristic
Differential Output Voltage
(Figure 4)
fout < 50 MHz
fout < 0.8 GHz
fout < 1.0 GHz
Min
Typ
550
550
500
700
700
700
25°C
Max
Min
Typ
600
550
500
700
700
700
85°C
Max
Min
Typ
600
500
400
700
700
600
Max
Unit
mV
mV
mV
Propagation Delay (Differential Configuration)
CLK0−Qx
CLK1−Qx
540
590
600
640
540
590
660
710
540
590
750
800
ps
ps
tskew
Within−Device Skew (Note 15)
Device−to−Device Skew (Note 16)
15
40
50
200
15
40
50
200
15
40
50
200
ps
ps
tJITTER
Random Clock Jitter (RMS) (Figure 4)
1
2
1
2
1
2
ps
VPP
Input Swing (Differential Configuration)
(Note 17) (Figure 5)
CLK0
CLK1 HSTL
400
300
800
800
1200
1000
400
300
800
800
1200
1000
400
300
800
800
1200
1000
mV
mV
DCO
Output Duty Cycle
49.5
50
50.5
49.5
50
50.5
49.5
50
50.5
%
tr/tf
Output Rise/Fall Time (20%−80%)
100
200
300
100
200
300
150
250
350
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm.
14. Measured with 750 mV source (LVPECL) or 1 V (HSTL) source, 50% duty cycle clock source. All outputs loaded with 50 W to VCC−2 V.
15. Skew is measured between outputs under identical transitions and conditions on any one device.
16. Device−to−Device skew for identical transitions, outputs and VCC levels.
17. VPP is the differential configuration input voltage swing required to maintain AC characteristics.
www.onsemi.com
7
NB100LVEP221
900
10
9
800
7
6
600
5
500
4
tJITTER ps (RMS)
VOPP (mV)
8
700
3
400
2
300
1
200
0
0.1
0.2
0.4
0.6
0.8
1.0
fIN, INPUT FREQUENCY (GHz)
Figure 4. Output Voltage (VOPP)/Jitter versus Input Frequency (VCC − VEE = 3.3 V @ 255C)
VCC(LVPECL)
VIH(DIFF)
VPP
VPP
VIHCMR
VIL(DIFF)
VIL(DIFF)
VEE
VEE
Figure 5. LVPECL Differential Input Levels
Q
VCCO(HSTL)
VIH(DIFF)
VX
Figure 6. HSTL Differential Input Levels
Zo = 50 W
D
Receiver
Device
Driver
Device
Q
Zo = 50 W
D
50 W
50 W
VTT
VTT = VCC − 2.0 V
Figure 7. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8020/D − Termination of ECL Logic Devices.)
www.onsemi.com
8
NB100LVEP221
APPLICATIONS INFORMATION
Using the thermally enhanced package of the
NB100LVEP221
supply enough solder paste to fill those vias and not starve
the solder joints. The attachment process for the exposed pad
package is equivalent to standard surface mount packages.
Figure 9, “Recommended solder mask openings”, shows a
recommended solder mask opening with respect to a 4 X 4
thermal via array. Because a large solder mask opening may
result in a poor rework release, the opening should be
subdivided as shown in Figure 9. For the nominal package
standoff of 0.1 mm, a stencil thickness of 5 to 8 mils should
be considered.
The NB100LVEP221 uses a thermally enhanced 52−lead
LQFP package. The package is molded so that a portion of
the leadframe is exposed at the surface of the package
bottom side. This exposed metal pad will provide the low
thermal impedance that supports the power consumption of
the NB100LVEP221 high−speed bipolar integrated circuit
and will ease the power management task for the system
design. In multilayer board designs, a thermal land pattern
on the printed circuit board and thermal vias are
recommended to maximize both the removal of heat from
the package and electrical performance of the
NB100LVEP221. The size of the land pattern can be larger,
smaller, or even take on a different shape than the exposed
pad on the package. However, the solderable area should be
at least the same size and shape as the exposed pad on the
package. Direct soldering of the exposed pad to the thermal
land will provide an efficient thermal conduit. The thermal
vias will connect the exposed pad of the package to internal
copper planes of the board. The number of vias, spacing, via
diameters and land pattern design depend on the application
and the amount of heat to be removed from the package.
Maximum thermal and electrical performance is achieved
when an array of vias is incorporated in the land pattern.
The recommended thermal land design for
NB100LVEP221 applications on multi−layer boards
comprises a 4 X 4 thermal via array using a 1.2 mm pitch as
shown in Figure 8 providing an efficient heat removal path.
All Units mm
0.2
1.0
1.0
4.6
0.2
4.6
Thermal Via Array (4 X 4)
1.2 mm Pitch
0.3 mm Diameter
Exposed Pad
Land Pattern
Figure 9. Recommended Solder Mask Openings
All Units mm
Proper thermal management is critical for reliable system
operation. This is especially true for high−fanout and high
output drive capability products.
For thermal system analysis and junction temperature
calculation, the thermal resistance parameters of the
package are provided:
4.6
Table 10. Thermal Resistance *
4.6
Thermal Via Array (4 X 4)
1.2 mm Pitch
0.3 mm Diameter
lfpm
qJA 5C/W
qJC 5C/W
0
35.6
3.2
100
32.8
4.9
500
30.0
6.4
* Junction to ambient and Junction to board, four−conductor
layer test board (2S2P) per JESD 51−8
These recommendations are to be used as a guideline,
only. It is therefore recommended that users employ
sufficient thermal modeling analysis to assist in applying the
general recommendations to their particular application to
assure adequate thermal performance. The exposed pad of
the NB100LVEP221 package is electrically shorted to the
substrate of the integrated circuit and VEE. The thermal land
should be electrically connected to VEE.
Exposed Pad
Land Pattern
Figure 8. Recommended Thermal Land Pattern
The via diameter should be approximately 0.3 mm with
1 oz. copper via barrel plating. Solder wicking inside the via
may result in voiding during the solder process and must be
avoided. If the copper plating does not plug the vias, stencil
print solder paste onto the printed circuit pad. This will
www.onsemi.com
9
NB100LVEP221
ORDERING INFORMATION
Package
Shipping†
NB100LVEP221FAG
LQFP−52
(Pb−Free)
160 Units / Tray
NB100LVEP221FARG
LQFP−52
(Pb−Free)
1500 / Tape & Reel
NB100LVEP221MNG
QFN−52
(Pb−Free)
260 Units / Tray
NB100LVEP221MNR2G
QFN−52
(Pb−Free)
2000 / Tape & Reel
Device
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
Resource Reference of Application Notes
AN1405/D
− ECL Clock Distribution Techniques
AN1406/D
− Designing with PECL (ECL at +5.0 V)
AN1503/D
− ECLinPSt I/O SPiCE Modeling Kit
AN1504/D
− Metastability and the ECLinPS Family
AN1568/D
− Interfacing Between LVDS and ECL
AN1672/D
− The ECL Translator Guide
AND8001/D
− Odd Number Counters Design
AND8002/D
− Marking and Date Codes
AND8020/D
− Termination of ECL Logic Devices
AND8066/D
− Interfacing with ECLinPS
AND8090/D
− AC Characteristics of ECL Devices
www.onsemi.com
10
NB100LVEP221
PACKAGE DIMENSIONS
LQFP 52 EXPOSED PAD
CASE 848H
ISSUE B
SCALE 1:1
4 PL
M
M/2
−Z−
0.20 (0.008) T X-Y Z
AJ AJ
52
40
1
39
ÇÇÇÇ
ÉÉÉÉ
ÉÉÉÉ
ÇÇÇÇ
ÉÉÉÉ
ÇÇÇÇ
PLATING
−X−
AA
−Y−
L
B
J
AB
B/2
L/2
D
REF
13
27
0.08 (0.003)
26
14
M
Y T-U
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MM.
3. DATUM PLANE “E" IS LOCATED AT BOTTOM OF
LEAD AND IS COINCIDENT WITH THE LEAD
WHERE THE LEAD EXITS THE PLASTIC BODY AT
THE BOTTOM OF THE PARTING PLANE.
4. DATUM “X", “Y" AND “Z" TO BE DETERMINED AT
DATUM PLANE DATUM “E".
5. DIMENSIONS M AND L TO BE DETERMINED AT
SEATING PLANE DATUM “T".
6. DIMENSIONS A AND B DO NOT INCLUDE MOLD
PROTRUSION. ALLOWABLE PROTRUSION IS 0.25
(0.010) PER SIDE. DIMENSIONS A AND B DO
BASE
METAL
INCLUDE MOLD MISMATCH AND ARE
DETERMINED AT DATUM PLAND “E".
7. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL NOT CAUSE THE LEAD
WIDTH TO EXCEED THE MAXIMUM D DIMENSION
BY MORE THAN 0.08 (0.003). DAMBAR CANNOT
BE LOCATED ON THE LOWER RADIUS OR THE
FOOT. MINIMUM SPACE BETWEEN PROTRUSION
AND ADJACENT LEAD OR PROTRUSION 0.07
(0.003).
Z
DIM
A
B
C
D
F
G
H
J
K
L
M
N
P
R
S
V
W
AA
AB
AC
AD
AE
DETAIL AJ−AJ
A/2
0.20 (0.008) E X-Y Z
A
DETAIL AH
−E−
−T−
AG
G
SEATING
PLANE
AG
48 PL
D
0.08 (0.003)
0.10 (0.004) T
52 PL
M
T X-Y
V
Z
0.05 (0.002)
R
S
AC
AD
EXPOSED PAD
14
26
S
C
MILLIMETERS
MIN
MAX
10.00 BSC
10.00 BSC
1.30
1.50
0.22
0.40
0.45
0.75
0.65 BSC
1.00 REF
0.09
0.20
0.05
0.20
12.00 BSC
12.00 BSC
0.20 REF
0_
7_
0_
----1.70
12 _ REF
12 _ REF
0.20
0.35
0.07
0.16
0.08
0.20
4.58
4.78
4.58
4.78
INCHES
MIN
MAX
0.394 BSC
0.394 BSC
0.051
0.059
0.009
0.016
0.018
0.030
0.026 BSC
0.039 BSC
0.004
0.008
0.002
0.008
0.472 BSC
0.472 BSC
0.008 REF
0_
7_
0_
----0.067
12 _ REF
12 _ REF
0.008
0.014
0.003
0.006
0.003
0.008
0.180
0.188
0.180
0.188
27
13
K
W
N
P
F
H
AE
0.25
GAGE
PLANE
RECOMMENDED
SOLDERING FOOTPRINT
DETAIL AH
12.36
52X
1.18
4.80
39
1
52
40
VIEW AG−AG
4.80
PKG
OUTLINE
www.onsemi.com
11
0.65
PITCH
12.36
52X
0.40
DIMENSIONS: MILLIMETERS
NB100LVEP221
PACKAGE DIMENSIONS
QFN52 8x8, 0.5P
CASE 485M
ISSUE C
D
PIN ONE
REFERENCE
NOTES:
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS
3. DIMENSION b APPLIES TO PLATED TERMINAL
AND IS MEASURED BETWEEN 0.25 AND 0.30
MM FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
A
ÉÉÉÉ
ÉÉÉÉ
ÉÉÉÉ
ÉÉÉÉ
B
DIM
A
A1
A2
A3
b
D
D2
E
E2
e
K
L
E
2X
0.15
C
2X
0.15 C
A2
MILLIMETERS
MIN
MAX
0.80
1.00
0.00
0.05
0.60
0.80
0.20 REF
0.18
0.30
8.00 BSC
6.50
6.80
8.00 BSC
6.50
6.80
0.50 BSC
0.20
--0.30
0.50
0.10 C
A
0.08 C
A3
A1
RECOMMENDED
SOLDERING FOOTPRINT
REF
SEATING PLANE
C
D2
14
52 X
L
8.30
52X
26
0.62
6.75
27
13
E2
6.75
39
1
52 X
K
8.30
52
40
e
52 X
b
NOTE 3
0.10 C A B
PKG
OUTLINE
0.05 C
0.50
PITCH
52X
0.30
DIMENSIONS: MILLIMETERS
ON Semiconductor and the
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries.
SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed
at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation
or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets
and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each
customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended,
or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which
the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or
unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim
alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable
copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada
Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada
Email: [email protected]
N. American Technical Support: 800−282−9855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81−3−5817−1050
www.onsemi.com
12
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative
NB100LVEP221/D
Similar pages