Freescale LL1608-FH1N2S Heterojunction bipolar transistor technology (ingap hbt) Datasheet

Freescale Semiconductor
Technical Data
Document Number: MMA25312B
Rev. 0, 9/2012
Heterojunction Bipolar Transistor
Technology (InGaP HBT)
MMA25312BT1
High Efficiency/Linearity Amplifier
The MMA25312B is a high efficiency InGaP HBT amplifier designed for
use in 2400 MHz ISM applications, WLAN (802.11g), WiMAX (802.16e) and
wireless broadband mesh networks. It is suitable for applications with
frequencies from 2300 to 2700 MHz using simple external matching
components with a 3 to 5 volt supply.
2300--2700 MHz, 26 dB
31 dBm
InGaP HBT
Features
• Frequency: 2300--2700 MHz
• P1dB: 31 dBm @ 2500 MHz
• Power Gain: 26 dB @ 2500 MHz
• OIP3: 40 dBm @ 2500 MHz
• Active Bias Control (On--chip)
• Single 3 to 5 Volt Supply
• Single--ended Power Detector
• Cost--effective QFN Surface Mount Package
• In Tape and Reel. T1 Suffix = 1,000 Units, 12 mm Tape Width, 7 inch Reel.
Table 1. Typical CW Performance (1)
CASE 2131--01
QFN 3×3
PLASTIC
Table 2. Maximum Ratings
Characteristic
Symbol
2300
MHz
2500
MHz
2700
MHz
Unit
Small--Signal Gain
(S21)
Gp
26
26
24.5
dB
Input Return Loss
(S11)
IRL
--14
--12
--12
dB
Output Return Loss
(S22)
ORL
--11
--13
--15
dB
Power Output @
1dB Compression
P1dB
30
31
29.8
dBm
Rating
Symbol
Value
Unit
Supply Voltage
VCC
6
V
Supply Current
ICC
550
mA
RF Input Power
Pin
30
dBm
Storage Temperature Range
Tstg
--65 to +150
°C
Junction Temperature (2)
TJ
150
°C
2. For reliable operation, the junction temperature should not
exceed 150°C.
1. VCC1 = VCC2 = VBIAS = 5 Vdc, TA = 25°C, 50 ohm system, CW
Application Circuit
Table 3. Thermal Characteristics
Characteristic
Thermal Resistance, Junction to Case
Case Temperature 91°C, VCC1 = VCC2 = VBIAS = 5 Vdc
Symbol
Value (3)
Unit
RθJC
92
°C/W
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf.
Select Documentation/Application Notes -- AN1955.
© Freescale Semiconductor, Inc., 2012. All rights reserved.
RF Device Data
Freescale Semiconductor, Inc.
MMA25312BT1
1
Table 4. Electrical Characteristics (VCC1 = VCC2 = VBIAS = 5 Vdc, 2500 MHz, TA = 25°C, 50 ohm system, in Freescale CW Application
Circuit)
Characteristic
Symbol
Min
Typ
Max
Unit
Small--Signal Gain (S21)
Gp
24.5
26
—
dB
Input Return Loss (S11)
IRL
—
--12
—
dB
Output Return Loss (S22)
ORL
—
--13
—
dB
Power Output @ 1dB Compression
P1dB
—
31
—
dBm
Third Order Output Intercept Point, Two--Tone CW
OIP3
—
40
—
dBm
Noise Figure
NF
—
3.8
—
dB
Supply Current (1)
ICQ
110
124
138
mA
Supply Voltage (1)
VCC
—
5
—
V
Table 5. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD 22--A114)
2
Machine Model (per EIA/JESD 22--A115)
A
Charge Device Model (per JESD 22--C101)
IV
Table 6. Moisture Sensitivity Level
Test Methodology
Per JESD22--A113, IPC/JEDEC J--STD--020
Rating
Package Peak Temperature
Unit
1
260
°C
1. For reliable operation, the junction temperature should not exceed 150°C.
VBA2
VBA1
VCC1
VCC1
VBA2 VCC1 VCC1
RFout
BIAS
CIRCUIT
RFout
VBIAS
VCC2
12
11
10
VBA1
1
9
RFout
VBIAS
2
8
RFout
RFin
3
7
VCC2
4
5
6
N.C. N.C. PDET
RFin
PDET
Figure 1. Functional Block Diagram
Figure 2. Pin Connections
MMA25312BT1
2
RF Device Data
Freescale Semiconductor, Inc.
VBIAS
VCC1
L2
C1
R2
R1
12
1
Z2
11
C2
C7
10
9
BIAS
CIRCUIT
C5
Z1
8
2
RF
OUTPUT
C13
C11
RF
INPUT
7
3
C8
DETECTOR
4
5
VCC2
L3
C14
6
PDET
C9
Z1
Z2
0.140″ x 0.030″ Microstrip
0.073″ x 0.030″ Microstrip
Figure 3. MMA25312BT1 Test Circuit Schematic — 2500 MHz, 5 Volt Operation
Table 7. MMA25312BT1 Test Circuit Component Designations and Values — 2500 MHz, 5 Volt Operation
Part
Description
C1, C2
1 μF Chip Capacitors
C3, C4, C6, C10, C12, C15
Components Not Placed
C5, C9
C7
Part Number
Manufacturer
GRM155R61A105KE15
Murata
100 pF Chip Capacitors
GRM1555C1H101JA01
Murata
8.2 pF Chip Capacitor
04023J8R2BBS
AVX
C8, C13
22 pF Chip Capacitors
04023J22R0BBS
AVX
C11
1.5 pF Chip Capacitor
04023J1R5BBS
AVX
C14
4.7 μF Chip Capacitor
GRM188R60J475KE19D
Murata
L2
1.2 nH Chip Inductor
LL1608-FH1N2S
TOKO
L3
22 nH Chip Inductor
LL1608-FH22N0S
TOKO
R1
430 Ω, 1/16 W Chip Resistor
RC0402JR-07430RL
Yageo
R2
1.6 kΩ, 1/16 W Chip Resistor
RC0402JR-071K60L
Yageo
R3
Component Not Placed
PCB
0.014″, εr = 3.7
FR408
Isola
Note: Component numbers C3, C4, C6, C10, C12, C15 and R3 are labeled on board but not placed.
Note: Component L1 intentionally omitted.
MMA25312BT1
RF Device Data
Freescale Semiconductor, Inc.
3
VCC1
VBIAS(1)
C2
C1
R3*
C3*
L2
R1
RFIN
C6*
C4*
R2
RFOUT
C7
C5
C12*
C11
C13
C8
C10*
C9
C14
L3
C15*
QFN 3x3--12N
Rev. 0
VCC2
VDECT
(1) VBIAS [Board] supplies VBA1, VBA2 and VBIAS [Device].
Note: Component numbers C3*, C4*, C6*, C10*, C12*, C15* and R3* are labeled on board
but not placed.
Figure 4. MMA25312BT1 Test Circuit Component Layout — 2500 MHz, 5 Volt Operation
Table 7. MMA25312BT1 Test Circuit Component Designations and Values — 2500 MHz, 5 Volt Operation
Part
Description
C1, C2
1 μF Chip Capacitors
C3, C4, C6, C10, C12, C15
Components Not Placed
C5, C9
C7
Part Number
Manufacturer
GRM155R61A105KE15
Murata
100 pF Chip Capacitors
GRM1555C1H101JA01
Murata
8.2 pF Chip Capacitor
04023J8R2BBS
AVX
C8, C13
22 pF Chip Capacitors
04023J22R0BBS
AVX
C11
1.5 pF Chip Capacitor
04023J1R5BBS
AVX
C14
4.7 μF Chip Capacitor
GRM188R60J475KE19D
Murata
L2
1.2 nH Chip Inductor
LL1608-FH1N2S
TOKO
L3
22 nH Chip Inductor
LL1608-FH22N0S
TOKO
R1
430 Ω, 1/16 W Chip Resistor
RC0402JR-07430RL
Yageo
R2
1.6 kΩ, 1/16 W Chip Resistor
RC0402JR-071K60L
Yageo
R3
Component Not Placed
PCB
0.014″, εr = 3.7
FR408
Isola
Note: Component L1 intentionally omitted.
(Component Designations and Values table repeated for reference.)
MMA25312BT1
4
RF Device Data
Freescale Semiconductor, Inc.
VBIAS
VCC1
L2
C1
R2
R1
12
1
Z2
11
C2
C7
10
9
BIAS
CIRCUIT
C5
Z1
8
2
RF
OUTPUT
C13
C11
RF
INPUT
7
3
C8
DETECTOR
4
5
VCC2
L3
C14
6
PDET
C9
Z1
Z2
0.140″ x 0.030″ Microstrip
0.073″ x 0.030″ Microstrip
Figure 5. MMA25312BT1 Test Circuit Schematic — 2500 MHz, 3.3 Volt Operation
Table 8. MMA25312BT1 Test Circuit Component Designations and Values — 2500 MHz, 3.3 Volt Operation
Part
Description
C1, C2
1 μF Chip Capacitors
C3, C4, C6, C10, C12, C15
Components Not Placed
C5, C9
C7
Part Number
Manufacturer
GRM155R61A105KE15
Murata
100 pF Chip Capacitors
GRM1555C1H101JA01
Murata
8.2 pF Chip Capacitor
04023J8R2BBS
AVX
C8, C13
22 pF Chip Capacitors
04023J22R0BBS
AVX
C11
1.5 pF Chip Capacitor
04023J1R5BBS
AVX
C14
4.7 μF Chip Capacitor
GRM188R60J475KE19D
Murata
L2
1.2 nH Chip Inductor
LL1608-FH1N2S
TOKO
L3
22 nH Chip Inductor
LL1608-FH22N0S
TOKO
R1
100 Ω, 1/16 W Chip Resistor
RC0402JR-07100RL
Yageo
R2
470 Ω, 1/16 W Chip Resistor
RC0402JR-07470RL
Yageo
R3
Component Not Placed
PCB
0.014″, εr = 3.7
FR408
Isola
Note: Component numbers C3, C4, C6, C10, C12, C15 and R3 are labeled on board but not placed.
Note: Component L1 intentionally omitted.
MMA25312BT1
RF Device Data
Freescale Semiconductor, Inc.
5
VCC1
VBIAS(1)
C2
C1
R3*
C3*
L2
R1
RFIN
C6*
C4*
R2
RFOUT
C7
C5
C12*
C11
C13
C8
C10*
C9
C14
L3
C15*
QFN 3x3--12N
Rev. 0
VCC2
VDECT
(1) VBIAS [Board] supplies VBA1, VBA2 and VBIAS [Device].
Note: Component numbers C3*, C4*, C6*, C10*, C12*, C15* and R3* are labeled on board
but not placed.
Figure 6. MMA25312BT1 Test Circuit Component Layout — 2500 MHz, 3.3 Volt Operation
Table 8. MMA25312BT1 Test Circuit Component Designations and Values — 2500 MHz, 3.3 Volt Operation
Part
Description
C1, C2
1 μF Chip Capacitors
C3, C4, C6, C10, C12, C15
Components Not Placed
C5, C9
C7
Part Number
Manufacturer
GRM155R61A105KE15
Murata
100 pF Chip Capacitors
GRM1555C1H101JA01
Murata
8.2 pF Chip Capacitor
04023J8R2BBS
AVX
C8, C13
22 pF Chip Capacitors
04023J22R0BBS
AVX
C11
1.5 pF Chip Capacitor
04023J1R5BBS
AVX
C14
4.7 μF Chip Capacitor
GRM188R60J475KE19D
Murata
L2
1.2 nH Chip Inductor
LL1608-FH1N2S
TOKO
L3
22 nH Chip Inductor
LL1608-FH22N0S
TOKO
R1
100 Ω, 1/16 W Chip Resistor
RC0402JR-07100RL
Yageo
R2
470 Ω, 1/16 W Chip Resistor
RC0402JR-07470RL
Yageo
R3
Component Not Placed
PCB
0.014″, εr = 3.7
FR408
Isola
Note: Component L1 intentionally omitted.
(Component Designations and Values table repeated for reference.)
MMA25312BT1
6
RF Device Data
Freescale Semiconductor, Inc.
3.00
0.70
0.30
2.00
3.40
0.50
1.6 x 1.6 Solder Pad
with Thermal Via
Structure
Figure 7. PCB Pad Layout for QFN 3×3
MA04
YWZ
Figure 8. Product Marking
MMA25312BT1
RF Device Data
Freescale Semiconductor, Inc.
7
PACKAGE DIMENSIONS
MMA25312BT1
8
RF Device Data
Freescale Semiconductor, Inc.
MMA25312BT1
RF Device Data
Freescale Semiconductor, Inc.
9
MMA25312BT1
10
RF Device Data
Freescale Semiconductor, Inc.
PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS
Refer to the following documents, software and tools to aid your design process.
Application Notes
• AN1955: Thermal Measurement Methodology of RF Power Amplifiers
• AN3100: General Purpose Amplifier and MMIC Biasing
Software
• .s2p File
Development Tools
• Printed Circuit Boards
For Software and Tools, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to the
Software & Tools tab on the part’s Product Summary page to download the respective tool.
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
0
Sept. 2012
Description
• Initial Release of Data Sheet
MMA25312BT1
RF Device Data
Freescale Semiconductor, Inc.
11
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E 2012 Freescale Semiconductor, Inc.
MMA25312BT1
Document Number: MMA25312B
Rev. 0, 9/2012
12
RF Device Data
Freescale Semiconductor, Inc.
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