ON NTHD4102PT3G Power mosfet Datasheet

NTHD4102P
Power MOSFET
−20 V, −4.1 A, Dual P−Channel ChipFETt
Features
• Offers an Ultra Low RDS(ON) Solution in the ChipFET Package
• Miniature ChipFET Package 40% Smaller Footprint than TSOP−6
• Low Profile (<1.1 mm) Allows it to Fit Easily into Extremely Thin
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V(BR)DSS
RDS(ON) TYP
Environments such as Portable Electronics
64 mW @ −4.5 V
• Simplifies Circuit Design since Additional Boost Circuits for Gate
•
•
ID MAX
−20 V
Voltages are not Required
Operated at Standard Logic Level Gate Drive, Facilitating Future
Migration to Lower Levels using the same Basic Topology
Pb−Free Package is Available
85 mW @ −2.5 V
−4.1 A
120 mW @ −1.8 V
S1
S2
Applications
• Optimized for Battery and Load Management Applications in
•
•
Portable Equipment such as MP3 Players, Cell Phones, and PDAs
Charge Control in Battery Chargers
Buck and Boost Converters
G1
G2
D1
MAXIMUM RATINGS (TJ = 25°C unless otherwise noted)
Parameter
P−Channel MOSFET
Symbol
Value
Unit
Drain−to−Source Voltage
VDSS
−20
V
Gate−to−Source Voltage
VGS
"8.0
V
ID
−2.9
A
Continuous Drain
Current (Note 1)
Steady State
t ≤ 10 s
Power Dissipation
(Note 1)
Steady State
t ≤ 10 s
TA = 85°C
−2.1
TA = 25°C
−4.1
TA = 25°C
PD
W
1.1
2.1
−16
A
TJ,
TSTG
−55 to
150
°C
Source Current (Body Diode)
IS
−1.1
A
Lead Temperature for Soldering
Purposes (1/8” from case for 10 s)
TL
260
°C
Symbol
Max
Unit
113
°C/W
Operating Junction and Storage Temperature
THERMAL RESISTANCE RATINGS
Parameter
Junction−to−Ambient, Steady State (Note 1)
Junction−to−Ambient, t ≤ 10s (Note 1)
RqJA
60
Stresses exceeding Maximum Ratings may damage the device. Maximum
Ratings are stress ratings only. Functional operation above the Recommended
Operating Conditions is not implied. Extended exposure to stresses above the
Recommended Operating Conditions may affect device reliability.
1. Surface mounted on FR4 board using 1 in sq pad size (Cu area = 1.127 in sq
[1 oz] including traces)
© Semiconductor Components Industries, LLC, 2011
September, 2011 − Rev. 6
ChipFET
CASE 1206A
STYLE 2
PIN
CONNECTIONS
IDM
tp = 10 ms
P−Channel MOSFET
1
MARKING
DIAGRAM
D1 8
1 S1
1
8
D1 7
2 G1
2
7
D2 6
3 S2
3
D2 5
4 G2
4
C7 M
G
Pulsed Drain
Current
TA = 25°C
D2
6
5
C7 = Specific Device Code
M = Month Code
G
= Pb−Free Package
ORDERING INFORMATION
Device
Package
Shipping†
NTHD4102PT1
ChipFET
3000/Tape & Reel
NTHD4102PT1G
ChipFET
(Pb−Free)
3000/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
Publication Order Number:
NTHD4102P/D
NTHD4102P
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise noted)
Characteristic
Symbol
Test Condition
Min
Drain−to−Source Breakdown Voltage
V(Br)DSS
VGS = 0 V, ID = −250 mA
−20
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V(Br)DSS/TJ
Typ
Max
Unit
OFF CHARACTERISTICS
Zero Gate Voltage Drain Current
IDSS
Gate−to−Source Leakage Current
V
−15
VGS = 0 V
VDS = −16 V
mV/°C
TJ = 25°C
−1.0
TJ = 85°C
−5.0
IGSS
VDS = 0 V, VGS = "8.0 V
VGS(TH)
VGS = VDS, ID = −250 mA
mA
"100
nA
−1.5
V
ON CHARACTERISTICS (Note 2)
Gate Threshold Voltage
Gate Threshold Temperature Coefficient
VGS(TH)/TJ
Drain−to−Source On Resistance
RDS(ON)
Forward Transconductance
gFS
−0.45
2.7
mV/°C
VGS = −4.5 V, ID = −2.9 A
64
80
mW
VGS = −2.5 V, ID = −2.2 A
85
110
VDS = −1.8 V, ID = −1.0 A
120
170
VDS = −10 V, ID = −2.9 A
7.0
S
750
pF
CHARGES, CAPACITANCES, AND GATE RESISTANCE
Input Capacitance
CISS
Output Capacitance
COSS
Reverse Transfer Capacitance
CRSS
Total Gate Charge
VGS = 0 V, f = 1.0 MHz,
VDS = −16 V
45
QG(TOT)
Gate−to−Source Charge
QGS
Gate−to−Drain Charge
QGD
100
8.6
nC
5.5
10
ns
12
25
32
40
23
35
−0.8
−1.2
V
20
40
ns
7.6
VGS = −4.5 V, VDS = −16 V,
ID = −2.6 A
1.3
2.6
SWITCHING CHARACTERISTICS (Note 3)
Turn−On Delay Time
Rise Time
Turn−Off Delay Time
Fall Time
td(ON)
tr
VGS = −4.5 V, VDD = −16 V,
ID = −2.6 A, RG = 2.0 W
td(OFF)
tf
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
VSD
Reverse Recovery Time
tRR
Charge Time
ta
Discharge Time
tb
Reverse Recovery Charge
VGS = 0 V, IS = −1.1 A
VGS = 0 V, dIS/dt = 100 A/ms,
IS = 1.0 A
QRR
15
5
0.01
2. Pulse test: pulse width ≤ 300 ms, duty cycle ≤ 2%
3. Switching characteristics are independent of operating junction temperatures
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2
mC
NTHD4102P
TYPICAL PERFORMANCE CURVES (TJ = 25°C unless otherwise noted)
8
−2.4 V
7
6
5
4
3
2
−1.8 V
1
−1.6 V
−1.4 V
0
0
1
2
3
5
4
6
7
7
6
5
4
3
8
125°C
2
25°C
1
0
0
TJ = −55°C
0.5
1
1.5
2
2.5
3
3.5
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
Figure 1. On−Region Characteristics
Figure 2. Transfer Characteristics
4
1.5
0.2
VGS = −4.5 V
RDS(on), DRAIN−TO−SOURCE
RESISTANCE (NORMALIZED)
0.18
0.16
VGS = −2.5 V
0.14
0.12
0.1
VGS = −4.5 V
0.08
0.06
0.04
0.02
0
8
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
2
3
1.3
1.1
0.9
0.7
0.5
−50
6
4
5
−ID, DRAIN CURRENT (AMPS)
−25
0
25
VGS = 0 V
1000
TJ = 125°C
TJ = 100°C
100
10
1
TJ = 25°C
2
3
75
100
125
Figure 4. On−Resistance Variation with
Temperature
10000
0.1
50
TJ, JUNCTION TEMPERATURE (°C)
Figure 3. On−Resistance vs. Drain Current and
Gate Voltage
−IDSS, LEAKAGE (nA)
RDS(on), DRAIN−TO−SOURCE RESISTANCE (W)
9
TJ = 25°C
VGS = −10 V to −2.8 V
9
−ID, DRAIN CURRENT (AMPS)
−ID, DRAIN CURRENT (AMPS)
10
4
5
6
7
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 5. Drain−to−Source Leakage Current
vs. Voltage
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3
8
150
NTHD4102P
TJ = 25°C
C, CAPACITANCE (pF)
900
800
700
Ciss
600
500
400
300
200
100
0
Coss
Crss
0
2
−VGS −VDS
4
6
8
10
12
14
16
18
20
5
QT
4
3
1
0
ID = −2.7 A
TJ = 25°C
7
8
Figure 7. Gate−to−Source and Drain−to−Source
Voltage vs. Total Gate Charge
−IS, SOURCE CURRENT (AMPS)
100
td(off)
tf
tr
td(on)
1
4
VGS = 0 V
TJ = 25°C
3
2
1
0
0.4
100
10
0.5
0.6
0.7
Figure 8. Resistive Switching Time Variation
vs. Gate Resistance
10
10 ms
1
100 ms
1 ms
10 ms
VGS = −8 V
SINGLE PULSE
TC = 25°C
0.01
0.1
0.9
1.0
1.1
1.2
Figure 9. Diode Forward Voltage vs. Current
100
0.1
0.8
−VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)
RG, GATE RESISTANCE (OHMS)
−I D, DRAIN CURRENT (AMPS)
t, TIME (ns)
4
2
3
5
6
Qg, TOTAL GATE CHARGE (nC)
5
VDD = −10 V
ID = −1.0 A
VGS = −4.5 V
1
1
0
Figure 6. Capacitance Variation
10
Q2
Q1
2
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)
1000
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
1000
−VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)
TYPICAL PERFORMANCE CURVES (TJ = 25°C unless otherwise noted)
RDS(on) LIMIT
THERMAL LIMIT
PACKAGE LIMIT
dc
1
10
−VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)
Figure 10. Maximum Rated Forward Biased
Safe Operating Area
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4
100
NTHD4102P
PACKAGE DIMENSIONS
ChipFET]
CASE 1206A−03
ISSUE K
D
8
7
6
L
5
HE
5
6
7
8
4
3
2
1
E
1
e1
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. MOLD GATE BURRS SHALL NOT EXCEED 0.13 MM PER SIDE.
4. LEADFRAME TO MOLDED BODY OFFSET IN HORIZONTAL
AND VERTICAL SHALL NOT EXCEED 0.08 MM.
5. DIMENSIONS A AND B EXCLUSIVE OF MOLD GATE BURRS.
6. NO MOLD FLASH ALLOWED ON THE TOP AND BOTTOM LEAD
SURFACE.
q
2
3
e
4
b
c
RESET
A
0.05 (0.002)
STYLE 2:
PIN 1.
2.
3.
4.
5.
6.
7.
8.
SOURCE 1
GATE 1
SOURCE 2
GATE 2
DRAIN 2
DRAIN 2
DRAIN 1
DRAIN 1
DIM
A
b
c
D
E
e
e1
L
HE
q
MILLIMETERS
NOM
MAX
1.05
1.10
0.30
0.35
0.15
0.20
3.05
3.10
1.65
1.70
0.65 BSC
0.55 BSC
0.28
0.35
0.42
1.80
1.90
2.00
5° NOM
MIN
1.00
0.25
0.10
2.95
1.55
INCHES
NOM
0.041
0.012
0.006
0.120
0.065
0.025 BSC
0.022 BSC
0.014
0.011
0.071
0.075
5° NOM
MIN
0.039
0.010
0.004
0.116
0.061
MAX
0.043
0.014
0.008
0.122
0.067
0.017
0.079
SOLDERING FOOTPRINT*
1
2.032
0.08
2.362
0.093
0.65
0.025
PITCH
8X
8X
0.66
0.026
0.457
0.018
Basic
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
ChipFET is a trademark of Vishay Siliconix.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
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NTHD4102P/D
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