FAIRCHILD 74F533SC

Revised October 2000
74F533
Octal Transparent Latch with 3-STATE Outputs
General Description
Features
The 74F533 consists of eight latches with 3-STATE outputs
for bus organized system applications. The flip-flops
appear transparent to the data when Latch Enable (LE) is
HIGH. When LE is LOW, the data that meets the setup
times is latched. Data appears on the bus when the Output
Enable (OE) is LOW. When OE is HIGH the bus output is in
the high impedance state. The 74F533 is the same as the
74F373, except that the outputs are inverted.
■ Eight latches in a single package
■ 3-STATE outputs for bus interfacing
■ Inverted version of the 74F373
Ordering Code:
Order Number
Package Number
Package Description
74F533SC
M20B
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
74F533SJ
M20D
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
74F533PC
N20A
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
© 2000 Fairchild Semiconductor Corporation
DS009548
www.fairchildsemi.com
74F533 Octal Transparent Latch with 3-STATE Outputs
April 1988
74F533
Unit Loading/Fan Out
Pin Names
U.L.
Input IIH/IIL
HIGH/LOW
Output IOH/IOL
Description
D0–D7
Data Inputs
1.0/1.0
20 µA/−0.6 mA
LE
Latch Enable Input (Active HIGH)
1.0/1.0
20 µA/−0.6 mA
OE
Output Enable Input (Active LOW)
1.0/1.0
20 µA/−0.6 mA
O0–O7
Complementary 3-STATE Outputs
150/40 (33.3)
−3 mA/24 mA (20 mA)
Functional Description
Function Table
Inputs
The 74F533 contains eight D-type latches with 3-STATE
output buffers. When the Latch Enable (LE) input is HIGH,
data on the Dn inputs enters the latches. In this condition
the latches are transparent, i.e., a latch output will change
state each time its D input changes. When LE is LOW, the
latches store the information that was present on the D
inputs a setup time preceding the HIGH-to-LOW transition
of LE. The 3-STATE buffers are controlled by the Output
Enable (OE) input. When OE is LOW, the buffers are in the
bi-state mode. When OE is HIGH the buffers are in the high
impedance mode but this does not interfere with entering
new data into the latches.
Output
LE
OE
D
O
H
L
H
L
H
L
L
H
L
L
X
O0
X
H
X
Z
H = HIGH Voltage Level
L = LOW Voltage Level
X = Immaterial
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
www.fairchildsemi.com
2
Recommended Operating
Conditions
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Free Air Ambient Temperature
Junction Temperature under Bias
−55°C to +150°C
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
VCC Pin Potential to
−0.5V to +7.0V
Ground Pin
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with VCC = 0V)
Standard Output
−0.5V to VCC
3-STATE Output
−0.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Current Applied to Output
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
in LOW State (Max)
twice the rated IOL (mA)
ESD Last Passing Voltage (Min)
4000V
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Units
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
0.8
V
VCD
Input Clamp Diode Voltage
−1.2
V
VOH
Output HIGH
10% VCC
2.5
Voltage
10% VCC
2.4
5% VCC
2.7
5% VCC
2.7
VOL
Output LOW Voltage
IIH
Input HIGH Current
IBVI
Input HIGH Current
2.0
Input HIGH Current
Output HIGH
Leakage Current
VID
Input Leakage
Test
IOD
Recognized as a LOW Signal
Min
IIN = −18 mA
IOH = −3 mA
V
Min
0.5
V
Min
IOL = 24 mA
5.0
µA
Max
VIN = 2.7V
7.0
µA
Max
VIN = 7.0V
0.5
mA
Max
VIN = 5.5V
50
µA
Max
VOUT = VCC
V
0.0
3.75
µA
0.0
−0.6
mA
Max
VIN = 0.5V
IOH = −1 mA
IOH = −3 mA
10% VCC
Breakdown (I/O)
ICEX
Conditions
Recognized as a HIGH Signal
IOH = −1 mA
Breakdown Test
IBVIT
VCC
V
4.75
Output Leakage
Circuit Current
IID = 1.9 µA
All Other Pins Grounded
VIOD = 150 mV
All Other Pins Grounded
IIL
Input LOW Current
IOZH
Output Leakage Current
50
µA
Max
VOUT = 2.7V
IOZL
Output Leakage Current
−50
µA
Max
VOUT = 0.5V
IOS
Output Short-Circuit Current
−150
mA
Max
VOUT = 0V
IZZ
Bus Drainage Test
500
µA
0.0V
VOUT = 5.25V
ICCZ
Power Supply Current
61
mA
Max
VO = HIGH Z
−60
41
3
www.fairchildsemi.com
74F533
Absolute Maximum Ratings(Note 1)
74F533
AC Electrical Characteristics
Symbol
Parameter
TA = +25°C
TA = −55°C to +125°C
TA = 0°C to +70°C
VCC = +5.0V
VCC = +5.0V
VCC = +5.0V
CL = 50 pF
CL = 50 pF
CL = 50 pF
Min
Typ
Max
Min
Max
Min
Max
tPLH
Propagation Delay
4.0
6.7
9.0
4.0
12.0
4.0
10.0
tPHL
Dn to On
2.5
4.4
7.0
2.5
9.0
2.5
8.0
tPLH
Propagation Delay
5.0
7.1
11.0
5.0
14.0
5.0
13.0
tPHL
LE to On
3.0
4.7
7.0
3.0
9.0
3.0
8.0
tPZH
Output Enable Time
2.0
5.9
10.0
2.0
12.5
2.0
11.0
2.0
5.6
7.5
2.0
10.5
2.0
8.5
tPZL
tPHZ
Output Disable Time
tPLZ
1.5
3.4
6.5
1.5
8.5
1.5
7.0
1.5
2.7
5.5
1.5
7.5
1.5
6.5
Units
ns
ns
ns
ns
AC Operating Requirements
Symbol
Parameter
TA = +25°C
TA = −55°C to +125°C
VCC = +5.0V
VCC = +5.0V
Min
Max
Min
Max
TA = 0°C to +70°C
VCC = +5.0V
Min
tS(H)
Setup Time, HIGH or LOW
2.0
2.0
2.0
tS(L)
Dn to LE
2.0
2.0
2.0
tH(H)
Hold Time, HIGH or LOW
3.0
3.0
3.0
tH(L)
Dn to LE
3.0
3.0
3.0
tW(H)
LE Pulse Width, HIGH
6.0
6.0
6.0
www.fairchildsemi.com
4
Units
Max
ns
ns
ns
74F533
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide
Package Number M20B
5
www.fairchildsemi.com
74F533
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M20D
www.fairchildsemi.com
6
74F533 Octal Transparent Latch with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N20A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
www.fairchildsemi.com
7
www.fairchildsemi.com