IDT IDT7143LA45J High-speed 2k x 16 cmos dual-port static ram Datasheet

IDT7133SA/LA
IDT7143SA/LA
HIGH SPEED
2K X 16 DUAL-PORT
SRAM
Features
◆
◆
◆
◆
◆
◆
High-speed access
– Military: 25/35/45/55/70/90ns (max.)
– Industrial: 25/35/55ns (max.)
– Commercial: 20/25/35/45/55/70/90ns (max.)
Low-power operation
– IDT7133/43SA
Active: 1150mW (typ.)
Standby: 5mW (typ.)
– IDT7133/43LA
Active: 1050mW (typ.)
Standby: 1mW (typ.)
Versatile control for write: separate write control for lower
and upper byte of each port
MASTER IDT7133 easily expands data bus width to 32 bits
or more using SLAVE IDT7143
On-chip port arbitration logic (IDT7133 only)
◆
◆
◆
◆
◆
◆
BUSY output flag on IDT7133; BUSY input on IDT7143
Fully asynchronous operation from either port
Battery backup operation–2V data retention
TTL-compatible; single 5V (±10%) power supply
Available in 68-pin ceramic PGA, Flatpack, PLCC and 100pin TQFP
Military product compliant to MIL-PRF-38535 QML
Industrial temperature range (–40°C to +85°C) is available
for selected speeds
Description
The IDT7133/7143 are high-speed 2K x 16 Dual-Port Static RAMs.
The IDT7133 is designed to be used as a stand-alone 16-bit Dual-Port
RAM or as a “MASTER” Dual-Port RAM together with the IDT7143
“SLAVE” Dual-Port in 32-bit-or-more word width systems. Using the
IDT MASTER/SLAVE Dual-Port RAM approach in 32-bit-or-wider
Functional Block Diagram
CEL
R/WRUB
CER
R/WLLB
R/WRLB
R/WLUB
OER
OE L
I/O8L - I/O15L
I/O
CONTROL
I/O0L - I/O7L
I/O8R - I/O15R
I/O
CONTROL
I/O0R - I/O 7R
(1)
BUSYR
BUSYL (1)
A10L
A0L
MEMORY
ARRAY
ADDRESS
DECODER
11
CEL
ADDRESS
DECODER
A10R
A0R
11
ARBITRATION
LOGIC
CER
(IDT7133 ONLY)
2746 drw 01
NOTE:
1. IDT7133 (MASTER): BUSY is open drain output and requires pull-up resistor.
IDT7143 (SLAVE): BUSY is input.
JUNE 2000
1
©2000 Integrated Device Technology, Inc.
DSC 2746/11
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
memory system applications results in full-speed, error-free operation
without the need for additional discrete logic.
Both devices provide two independent ports with separate control,
address, and I/O pins that permit independent, asynchronous access
for reads or writes to any location in memory. An automatic power
down feature, controlled by CE, permits the on-chip circuitry of each
port to enter a very low standby power mode.
Fabricated using IDT’s CMOS high-performance technology, these
devices typically operate on only 1,150mW of power. Low-power (LA)
versions offer battery backup data retention capability, with each port
typically consuming 200µW for a 2V battery.
The IDT7133/7143 devices have identical pinouts. Each is packed
in a 68-pin ceramic PGA, 68-pin flatpack, 68-pin PLCC and 100-pin
TQFP. Military grade product is manufactured in compliance with the
latest revision of MIL-PRF-38535 QML, making it ideally suited to
military temperature applications demanding the highest level of
performance and reliability.
10
8
7
6
5
4
3
2
1
68 67 66 65 64 63 62 61
60
11
59
12
58
13
57
14
56
55
15
16
17
18
19
IDT7133/43
J68-1 / F68-1(4)
54
68-Pin PLCC/Flatpack
Top View(5)
52
53
51
20
50
21
49
22
48
23
47
24
46
25
45
I/O8R
I/O9R
I/O10R
I/O11R
I/O12R
I/O13R
I/O14R
I/O15R
GND(2)
R/WRUB
R/WRLB
OER
A10R
A9R
A8R
A7R
A6R
44
26
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
NOTES:
1. Both VCC pins must be connected to the power supply to ensure reliable
operation.
2. Both GND pins must be connected to the ground supply to ensure reliable
operation.
3. J68-Package body is approximately 0.95 in x 0.95 in x 0.17 in.
F68-Package body is approximately 1.18 in x 1.18 in x 0.16 in.
PN100-Package body is approximately 14mm x 14mm x 1.4mm.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
A6L
A5L
A4L
A3L
A2L
A1L
A0L
BUSYL
CEL
CER
BUSYR
A0R
A1R
A2R
A3R
A4R
A5R
2746 drw 02
I/O9L
I/O8L
I/O7L
I/O6L
I/O5L
I/O4L
I/O3L
I/O2L
GND
I/O1L
I/O0L
OEL
VCC
R/WLLB
N/C
CEL
R/WLUB
N/C
N/C
N/C
A10L
A9L
A8L
A7L
A6L
9
I/O9L
I/O10L
I/O11L
I/O12L
I/O13L
I/O14L
I/O15L
VCC(1)
GND(2)
I/O0R
I/O1R
I/O2R
I/O3R
I/O4R
I/O5R
I/O6R
I/O7R
Index
N/C
N/C
N/C
N/C
I/O10L
I/O11L
I/O12L
I/O13L
GND
I/O14L
I/O15L
VCC
GND
I/O0R
I/O1R
I/O2R
VCC
I/O3R
I/O4R
I/O5R
I/O6R
N/C
N/C
N/C
N/C
1
2
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76
75
74
3
73
4
72
5
71
6
70
7
69
8
68
9
10
11
67
IDT7133/43PF
PN100-1(4)
12
13
14
66
65
64
100-Pin TQFP
Top View(5)
63
62
15
61
16
60
17
18
59
58
19
20
57
56
21
22
55
54
23
24
53
52
25
51
26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
N/C
N/C
N/C
N/C
A5L
A4L
A3L
A2L
A1L
A0L
N/C
BUSYL
GND
N/C
BUSYR
N/C
A0R
A1R
A2R
A3R
A4R
N/C
N/C
N/C
N/C
2746 drw 03
I/O7R
I/O8R
I/O9R
I/O10R
I/O11R
I/O12R
I/O13R
I/O14R
GND
I/O15R
OER
R/WRLB
GND
N/C
CER
R/WRUB
N/C
N/C
N/C
A10R
A9R
A8R
A7R
A6R
A5R
INDEX
I/O8L
I/O7L
I/O6L
I/O5L
I/O4L
I/O3L
I/O2L
I/O1L
I/O0L
VCC(1)
R/WLUB
R/WLLB
OEL
A10L
A9L
A8L
A7L
Pin Configurations(1,2,3)
6.42
2
,
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Pin Configurations(1,2,3) (con't.)
50
51
11
A6L
53
10
52
55
49
A7L
A8L
48
A5L
46
A3L
47
45
A2L
A4L
44
A1L
42
BUSYL
43
41
CEL
A0L
40
CER
38
A0R
39
BUSYR
36
A2R
37
A1R
35
A3R
A10L
08
R/WLLB
57
A9L
30
OEL
58
28
61
06
60
I/O1L
63
05
I/O0L
I/O3L
65
04
22
20
I/O6L
1
I/O8L
3
2
01
Pin 1
Designator
A
5
I/O11L
4
7
I/O13L
6
9
I/O15L
8
11
GND(2)
10
13
I/O1R
12
15
I/O3R
18
I/O5R
14
16
I/O13R
21
I/O10R
I/O9L
I/O15R
23
I/O12R
66
68
02
25
I/O14R
I/O4L
I/O7L
27
24
64
67
OER
GND(2) R/WRUB
I/O2L
I/O5L
03
26
68-Pin PGA
Top View(5)
62
A9R
29
R/WRLB
IDT7133/43G
GU68-1(4)
A7R
31
A10R
VCC(1) R/WLUB
A6R
33
A8R
56
59
07
34
A5R
32
54
09
A4R
I/O11R
19
I/O8R
I/O9R
17
I/O10L
I/O12L
I/O14L
VCC(1)
I/O0R
I/O2R
I/O4R
I/O6R
I/O7R
B
C
D
E
F
G
H
J
K
L
2746 drw 04
NOTES:
1. Both VCC pins must be connected to the power supply to ensure reliable operation.
2. Both GND pins must be connected to the ground supply to ensure reliable operation.
3. Package body is approximately 1.18 in x 1.18 in x 0.16 in.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
Pin Names
Left Port
Right Port
Names
CEL
CER
Chip Enable
R/WLUB
R/WRUB
Upper Byte Read/Write Enable
R/WLLB
R/WRLB
Lower Byte Read/Write Enable
OEL
OER
Output Enable
A0L - A10L
A0R - A10R
Address
I/O0L - I/O15L
I/O0R - I/O15R
Data Input/Output
BUSYL
BUSYR
Busy Flag
VCC
Power
GND
Ground
2746 tbl 01
3
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Absolute Maximum Ratings(1)
Symbol
VTERM(2)
Rating
Terminal Voltage
with Respect
to GND
Commercial
& Industrial
Military
Unit
-0.5 to +7.0
-0.5 to +7.0
V
Grade
Military
o
Temperature
Under Bias
-55 to +125
Storage
Temperature
-65 to +150
PT(3)
Power
Dissipation
2.0
2.0
W
IOUT
DC Output
Current
50
50
mA
TBIAS
TSTG
Maximum Operating
Temperature and Supply Voltage(1,2)
-65 to +135
-55OC to +125OC
0V
5.0V + 10%
0V
5.0V + 10%
0V
5.0V + 10%
O
0 C to +70 C
O
Capacitance (TA = +25°C, f = 1.0mhz)
Conditions(2)
Max.
Unit
VIN = 3dV
11
pF
VOUT = 3dV
11
Input Capacitance
Output Capacitance
O
-40 C to +85 C
NOTES:
1. This is the parameter TA. This is the "instant on" case temperature.
2746 tbl 04
Recommended DC Operating
Conditions
Symbol
Parameter
VCC
Supply Voltage
GND
Ground
VIL
Parameter(1)
O
C
VIH
COUT
Vcc
Industrial
o
-65 to +150
2746 tbl 02
CIN
GND
Commercial
C
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. VTERM must not exceed Vcc + 10% for more than 25% of the cycle time or 10ns
maximum, and is limited to < 20mA for the period of VTERM > Vcc + 10%.
Symbol
Ambient
Temperature
Input High Voltage
Min.
Typ.
Max.
Unit
4.5
5.0
5.5
V
0
0
0
V
2.2
____
(1)
Input Low Voltage
6.0
____
-0.5
(2)
0.8
V
V
2746 tbl 05
NOTES:
1. VIL (min.) = -1.5V for pulse width less than 10ns.
2. VTERM must not exceed Vcc + 10%.
pF
2746 tbl 03
NOTES:
1. This parameter is determined by device characterization but is not production
tested.
2. 3dV references the interpolated capacitance when the input and output switch from
0V to 3V or from 3V to 0V.
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range (Either port, VCC = 5.0V ± 10%)
7133SA
7143SA
Symbol
Parameter
Test Conditions
Min.
Max.
Min.
Max.
Unit
10
___
5
µA
10
___
5
µA
___
0.4
___
0.4
V
IOL = 16mA
___
0.5
___
0.5
V
IOH = -4mA
2.4
___
2.4
___
(1)
Input Leakage Current
VCC = 5.5V, VIN = 0V to VCC
___
|ILO|
Output Leakage Current
CE = VIH, VOUT = 0V to V CC
___
VOL
Output Low Voltage (I/O0-I/O15)
IOL = 4mA
VOL
Open Drain Output Low Voltage
(BUSY)
VOH
Output High Voltage
|ILI|
7133LA
7143LA
V
2746 tbl 06
NOTE:
1. At Vcc < 2.0V, input leakages are undefined.
6.42
4
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Operating
Temperature and Supply Voltage Range(2) (VCC = 5.0V ± 10%)
7133X20
7143X20
Com'l Only
Symbol
ICC
ISB1
ISB2
ISB3
ISB4
Parameter
Dynamic Operating
Current
(Both Ports Active)
Standby Current
(Both Ports - TTL
Level Inputs)
Standby Current
(One Port - TTL
Level Inputs)
Full Standby Current
(Both Ports CMOS Level Inputs)
Full Standby Current
(One Port CMOS Level Inputs)
Test Condition
7133X35
7143X35
Com'l, Ind
& Military
Typ. (1)
Max.
Typ. (1)
Max.
Typ. (1)
Max.
Unit
COM'L
S
L
250
230
310
280
250
230
300
270
240
210
295
250
mA
MIL &
IND
S
L
____
____
____
____
250
230
330
300
240
220
325
295
COM'L
S
L
25
25
80
70
25
25
80
70
25
25
70
60
MIL &
IND
S
L
____
____
____
____
25
25
90
80
25
25
75
65
COM'L
S
L
140
120
200
180
140
100
200
170
120
100
180
160
MIL &
IND
S
L
____
____
____
____
140
100
230
190
120
100
200
180
COM'L
S
L
1.0
0.2
15
5
1.0
0.2
15
4
1.0
0.2
15
4
MIL &
IND
S
L
____
____
____
____
1.0
0.2
30
10
1.0
0.2
30
10
COM'L
S
L
140
120
190
170
140
120
190
170
120
100
170
150
MIL &
IND
S
L
____
____
____
____
140
120
220
200
120
100
190
170
Version
CE = VIL , Outputs Disabled
7133X25
7143X25
Com'l, Ind
& Military
(3)
f = fMAX
CEL and CER = VIH
f = fMAX(3)
CE"A" = VIL and CE"B" = VIH(4)
f=fMAX(3)
Active Port Outputs Disabled
Both Ports CEL and
CER > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < 0.2V, f = 0(4)
CE"A" < 0.2V and
CE"B" > VCC - 0.2V(5)
VIN > VCC - 0.2V or V IN < 0.2V
Active Port Outputs Disabled
f = fMAX(3)
mA
mA
mA
mA
2746 tbl 07a
7133X45
7143X45
Com'l &
Military
Symbol
ICC
ISB1
ISB2
ISB3
ISB4
Parameter
Dynamic Operating
Current
(Both Ports Active)
Standby Current
(Both Ports - TTL
Level Inputs)
Standby Current
(One Port - TTL
Level Inputs)
Full Standby Current
(Both Ports CMOS Level Inputs)
Full Standby Current
(One Port CMOS Level Inputs)
Test Condition
Version
CE = VIL, Outputs Disabled
7133X55
7143X55
Com'l, Ind
& Military
7133X70/90
7143X70/90
Com'l &
Military
Typ. (1)
Max.
Typ. (1)
Max.
Typ. (1)
Max.
Unit
mA
COM'L
S
L
230
210
290
250
230
210
285
250
230
210
280
250
MIL &
IND
S
L
230
210
320
290
230
210
315
285
230
210
310
280
COM'L
S
L
25
25
75
65
25
25
70
60
25
25
70
60
MIL &
IND
S
L
25
25
80
70
25
25
80
70
25
25
75
65
CE"A" = VIL and CE"B" = VIH(4)
f=fMAX(3)
Active Port Outputs Disabled
COM'L
S
L
120
100
190
170
120
100
180
160
120
100
180
160
MIL &
IND
S
L
120
100
210
190
120
100
210
190
120
100
200
180
Both Ports CEL and
CER > VCC - 0.2V
VIN > VCC - 0.2V or
VIN < 0.2V, f = 0(4)
COM'L
S
L
1.0
0.2
15
4
1.0
0.2
15
4
1.0
0.2
15
4
MIL &
IND
S
L
1.0
0.2
30
10
1.0
0.2
30
10
1.0
0.2
30
10
CE"A" < 0.2V and
CE"B" > VCC - 0.2V(5)
VIN > VCC - 0.2V or V IN < 0.2V
Active Port Outputs Disabled
f = fMAX(3)
COM'L
S
L
120
100
180
160
120
100
170
150
120
100
170
150
MIL &
IND
S
L
120
100
200
180
120
100
200
180
120
100
190
170
f = fMAX(3)
CEL and CER = VIH
mA
(3)
f = fMAX
mA
mA
mA
2746 tbl 07b
NOTES:
1. VCC = 5V, T A = +25°C for Typ., and are not production tested. ICCDC = 180mA (typ.)
2. 'X' in part number indicates power rating (SA or LA)
3. At f = fMAX , address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/ tRC, and using “AC Test Conditions" of input levels of
GND to 3V.
4. f = 0 means no address or control lines change. Applies only to inputs at CMOS level standby.
5. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
5
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Data Retention Characteristics
(LA Version Only) VLC = 0.2V, VHC = VCC - 0.2V
7133LA/7143LA
Symbol
Parameter
Test Condition
Min.
Typ.(1)
Max.
Unit
2.0
___
___
V
µA
VDR
VCC for Data Retention
VCC = 2V
ICCDR
Data Retention Current
CE > VHC
MIL. & IND.
___
100
4000
VIN > VHC or < VLC
COM'L.
___
100
1500
0
___
___
tRC(2)
___
___
tCDR
(3)
Chip Deselect to Data Retention Time
tR(3)
Operation Recovery Time
V
V
2746 tbl 08
NOTES:
1. Vcc = 2V, TA = +25°C, and are not production tested.
2. tRC = Read Cycle Time
3. This parameter is guaranteed by device characterization but is not production tested.
Data Retention Waveform
DATA RETENTION MODE
VCC
4.5V
VDR > 2V
4.5V
tCDR
tR
VDR
CE
VIH
VIH
2746 drw 05
AC Test Conditions
5V
GND to 3.0V
Input Pulse Levels
1250Ω
5ns Max.
Input Rise/Fall Times
Input Timing Reference Levels
1.5V
Output Reference Levels
1.5V
DATAOUT
775Ω
30pF
Figures 1, 2 and 3
Output Load
2746 tbl 09
Figure 1. AC Output Test Load
5V
5V
270Ω
1250Ω
BUSY
DATAOUT
775Ω
5pF*
30pF
2746 drw 06
Figure 2. Output Load
(for tLZ, t HZ, tWZ, tOW )
*Including scope and jig
6.42
6
Figure 3. BUSY Output Load
(IDT7133 only)
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage(3)
7133X20
7143X20
Com'l Only
Symbol
Parameter
7133X25
7143X25
Com'l, Ind
& Military
7133X35
7143X35
Com'l, Ind
& Military
Min.
Max.
Min.
Max.
Min.
Max.
Unit
READ CYCLE
tRC
Read Cycle Time
20
____
25
____
35
____
ns
tAA
Address Access Time
____
20
____
25
____
35
ns
tACE
Chip Enable Access Time
____
20
____
25
____
35
ns
tAOE
Output Enable Access Time
____
12
____
15
____
20
ns
tOH
Output Hold from Address Change
0
____
0
____
0
____
ns
0
____
0
____
0
____
ns
____
12
____
15
____
20
ns
0
____
0
____
0
____
ns
20
____
50
____
50
ns
(1,2)
tLZ
Output Low-Z Time
tHZ
Output High-Z Time (1,2)
tPU
Chip Enable to Power Up Time (2)
Chip Disable to Power Down Time
tPD
(2)
____
2746 tbl 10a
7133X45
7143X45
Com'l &
Military
Symbol
Parameter
7133X55
7143X55
Com'l, Ind
& Military
7133X70/90
7143X70/90
Com'l &
Military
Min.
Max.
Min.
Max.
Min.
Max.
Unit
READ CYCLE
tRC
Read Cycle Time
45
____
55
____
70/90
____
ns
tAA
Address Access Time
____
45
____
55
____
70/90
ns
tACE
Chip Enable Access Time
____
45
____
55
____
70/90
ns
tAOE
Output Enable Access Time
____
25
____
30
____
40/40
ns
tOH
Output Hold from Address Change
0
____
0
____
0/0
____
ns
tLZ
Output Low-Z Time (1,2)
0
____
5
____
5/5
____
ns
tHZ
Output High-Z Time
(1,2)
____
20
____
20
____
25/25
ns
tPU
Chip Enable to Power Up Time (2)
0
____
0
____
0/0
____
ns
tPD
Chip Disable to Power Down Time (2)
____
50
____
50
____
50/50
ns
NOTES:
1. Transition is measured 0mV fromLow or High-impedance voltage with load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. 'X' in part number indicates power rating (SA or LA).
7
6.42
2746 tbl 10b
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
TIMING WAVEFORM OF READ CYCLE NO. 1, EITHER SIDE(5)
tRC
ADDRESS
tAA
tOH
DATAOUT
tOH
PREVIOUS DATA VALID
DATA VALID
BUSYOUT
tBDD
(3,4)
2746 drw 07
TIMING WAVEFORM OF READ CYCLE NO. 2, EITHER SIDE(5)
tACE
(4)
CE
tAOE
(4)
tHZ
(2)
OE
tLZ
DATAOUT
tLZ
tPU
CURRENT
(1)
(1)
tHZ (2)
VALID DATA
tPD
ICC
50%
50%
ISB
2746 drw 08
NOTES:
1. Timing depends on which signal is asserted last, OE or CE.
2. Timing depends on which signal is deasserted first, OE or CE.
3. tBDD delay is required only in a case where the opposite port is completing a write operation to the same address location. For simultaneous read operations, BUSY has no
relationship to valid output data.
4. Start of valid data depends on which timing becomes effective last, t AOE, tACE, tAA, or tBDD.
5. R/W = VIH, and the address is valid prior to or coincidental with CE transition LOW.
6.42
8
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage(5)
7133X20
7143X20
Com'l Only
Symbol
Parameter
7133X25
7143X25
Com'l, Ind
& Military
7133X35
7143X35
Com'l, Ind
& Military
Min.
Max.
Min.
Max.
Min.
Max.
Unit
WRITE CYCLE
tWC
Write Cycle Time(3)
20
____
25
____
35
____
ns
tEW
Chip Enable to End-of-Write
15
____
20
____
25
____
ns
tAW
Address Valid to End-of-Write
15
____
20
____
25
____
ns
0
____
0
____
0
____
ns
15
____
20
____
25
____
ns
0
____
0
____
ns
tAS
Address Set-up Time
Write Pulse Width
tWP
tWR
Write Recovery Time
0
____
tDW
Data Valid to End-of-Write
15
____
15
____
20
____
ns
tHZ
Output High-Z Time(1,2)
____
12
____
15
____
20
ns
tDH
Data Hold Time(4)
0
____
0
____
0
____
ns
____
12
____
15
____
20
ns
0
____
0
____
0
____
ns
(1,2)
tWZ
Write Enable to Output in High-Z
tOW
Output Active from End-of-Write
(1,2,4)
2746 tbl 11a
7133X45
7143X45
Com'l &
Military
Symbol
Parameter
7133X55
7143X55
Com'l, Ind
& Military
7133X70/90
7143X70/90
Com'l &
Military
Min.
Max.
Min.
Max.
Min.
Max.
Unit
45
____
55
____
70/90
____
ns
30
____
40
____
50/50
____
ns
30
____
40
____
50/50
____
ns
0
____
0/0
____
ns
WRITE CYCLE
tWC
tEW
tAW
Write Cycle Time(3)
Chip Enable to End-of-Write
Address Valid to End-of-Write
tAS
Address Set-up Time
0
____
tWP
Write Pulse Width
30
____
40
____
50/50
____
ns
tWR
Write Recovery Time
0
____
0
____
0/0
____
ns
20
____
25
____
30/30
____
ns
____
20
____
20
____
25/25
ns
5
____
5
____
5/5
____
ns
____
20
____
20
____
25/25
ns
5
____
5
____
5/5
____
ns
tDW
tHZ
tDH
Data Valid to End-of-Write
Output High-Z Time
Data Hold Time
(1,2)
(4)
(1,2)
tWZ
Write Enable to Output in High-Z
tOW
Output Active from End-of-Write (1,2,4)
2746 tbl 11b
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage from the Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization but not production tested.
3. For MASTER/SLAVE combination, tWC = tBAA + tWR + tWP , since R/W = VIL must occur after tBAA.
4. The specification for tDH must be met by the device supplying write data to the RAM under all operation conditions. Although tDH and tOW values will very over voltage and
temperature, the actual tDH will always be smaller than the actual t OW.
5. 'X' in part number indicates power rating (SA or LA).
9
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage(6)
7133X20
7143X20
Com'l Only
Symbol
Parameter
7133X25
7143X25
Com'l, Ind
& Military
7133X35
7143X35
Com'l, Ind
& Military
Min.
Max.
Min.
Max.
Min.
Max.
Unit
20
____
20
____
30
ns
20
____
20
____
30
ns
BUSY TIMING (For MASTER 71V33)
tBAA
BUSY Access Time from Address
____
tBDA
BUSY Disable Time from Address
____
BUSY Access Time from Chip Enable
____
20
____
20
____
25
ns
tBDC
BUSY Disable Time from Chip Enable
____
17
____
20
____
25
ns
tWDD
Write Pulse to Data Delay(1)
____
40
____
50
____
60
ns
tBAC
tDDD
Write Data Valid to Read Data Delay
____
(2)
tBDD
BUSY Disable to Valid Data
tAPS
Arbitration Priority Set-up Time (3)
tWH
(1)
(5)
Write Hold After BUSY
30
____
35
____
45
ns
____
25
____
30
____
35
ns
5
____
5
____
5
____
ns
20
____
20
____
25
____
ns
0
____
0
____
0
____
ns
ns
ns
BUSY INPUT TIMING (For SLAVE 71V43)
BUSY Input to Write (4)
tWB
(5)
tWH
Write Hold After BUSY
20
____
20
____
25
____
tWDD
Write Pulse to Data Delay(1)
____
40
____
50
____
60
tDDD
Write Data Valid to Read Data Delay (1)
____
30
____
35
____
45
ns
2746 tbl 12a
7133X45
7143X45
Com'l &
Military
Symbol
Parameter
7133X55
7143X55
Com'l, Ind
& Military
7133X70/90
7143X70/90
Com'l &
Military
Min.
Max.
Min.
Max.
Min.
Max.
Unit
BUSY Access Time from Address
____
40
____
40
____
45/45
ns
BUSY Disable Time from Address
____
40
____
40
____
45/45
ns
tBAC
BUSY Access Time from Chip Enable
____
30
____
35
____
35/35
ns
tBDC
BUSY Disable Time from Chip Enable
____
25
____
30
____
30/30
ns
BUSY TIMING (For MASTER 71V33)
tBAA
tBDA
tWDD
Write Pulse to Data Delay
(1)
____
tDDD
Write Data Valid to Read Data Delay
tBDD
BUSY Disable to Valid Data(2)
tAPS
tWH
Arbitration Priority Set-up Time
(1)
(3)
(5)
Write Hold After BUSY
80
____
80
____
90/90
ns
____
55
____
55
____
70/70
ns
____
40
____
40
____
40/40
ns
5
____
5
____
5/5
____
ns
30
____
30
____
30/30
____
ns
0
____
0
____
0/0
____
ns
ns
ns
BUSY INPUT TIMING (For SLAVE 71V43)
tWB
BUSY Input to Write (4)
(5)
tWH
Write Hold After BUSY
30
____
30
____
30/30
____
tWDD
Write Pulse to Data Delay(1)
____
80
____
80
____
90/90
55
____
55
____
70/70
tDDD
Write Data Valid to Read Data Delay
(1)
____
NOTES:
1. Port-to-port delay through RAM cells from writing port to reading port, refer to “Timing Waveform of Write with Port-to-Port Read and Busy".
2. tBDD is calculated parameter and is greater of 0, tWDD - tWP (actual) or tDDD - tDW (actual).
3. To ensure that the earlier of the two ports wins.
4. To ensure that the write cycle is inhibited on port "B" during contention on port "A".
5. To ensure that a write cycle is completed on port "B" after contention on port "A".
6. 'X' in part number indicates power rating (SA or LA).
6.42
10
ns
2746 tbl 12b
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1 (R/W Controlled Timing)(1,5,8)
tWC
ADDRESS
tAS
OE
(6)
tWR(3)
tAW
CE
tHZ
tWP (2)
R/W
(7)
(9)
tWZ (7)
tLZ
DATAOUT
tHZ (7)
tOW
(4)
(4)
tDH
tDW
DATAIN
2746 drw 09
Write Cycle No. 2 (CE Controlled Timing)(1,5)
tWC
ADDRESS
tAW
CE
tAS(6)
R/W
tEW (2)
tWR
(9)
tDW
tDH
DATAIN
2746 drw 10
NOTES:
1. R/W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (tEW or tWP) of a CE = VIL and a R/W = VIL.
3. tWR is measured from the earlier of CE or R/W going HIGH to the end of the write cycle.
4. During this period, the I/O pins are in the output state, and input signals must not be applied.
5. If the CE LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal (CE or R/W) is asserted last.
7. Timing depends on which enable signal is de-asserted first, CE or OE.
8. If OE is LOW during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be placed
on the bus for the required tDW. If OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the
specified tWP.
9. R/W for either upper or lower byte.
11
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Port-to-Port Read and BUSY(1,2,3)
tWC
MATCH
ADDR"A"
tWP
R/W"A"
tDW
tDH
VALID
DATAIN"A"
(1)
tAPS
MATCH
ADDR"B"
tBDA
tBDD
BUSY"B"
tWDD
DATAOUT "B"
VALID
(4)
tDDD
2746 drw 11
NOTES:
1. To ensure that the earlier of the two ports wins, t APS is ignored for Slave (IDT7143).
2. CEL = CER = VIL
3. OE = VIL for the reading port.
4. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port "A".
Timing Waveform of Write with BUSY(3)
tWP
R/W"A"
tWB
BUSY"B"
tWH
R/W"B"
(1)
(2)
,
2746 drw 12
NOTES:
1. tWH must be met for both BUSY input (IDT7143, slave) and output (IDT7133, master).
2. BUSY is asserted on port "B" blocking R/W"B", until BUSY "B" goes HIGH.
3. All timing is the same for left and right ports. Port " A" may be either left or right port. Port "B" is the opposite from port " A".
6.42
12
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Timing Waveform of BUSY Arbitration Controlled by CE Timing(1)
ADDR"A" AND "B"
ADDRESSES MATCH
CE"A"
tAPS(2)
CE"B"
tBAC
tBDC
BUSY"B"
2746 drw 13
Timing Waveform of BUSY Arbitration Controlled by Addresses(1)
tRC OR
ADDR "A"
tWC
ADDRESSES MATCH
ADDRESSES DO NOT MATCH
tAPS(2)
ADDR "B"
tBAA
tBDA
BUSY "B"
2746 drw 14
NOTES:
1. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port " A".
2. If tAPS is not satisfied, the BUSY will be asserted on one side or the other, but there is no guarantee on which side BUSY will be asserted
(IDT7133 only).
13
6.42
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Functional Description
The IDT7133/43 provides two ports with separate control, address
and I/O pins that permit independent access for reads or writes to any
location in memory. The IDT7133/43 has an automatic power down
feature controlled by CE. The CE controls on-chip power down circuitry
that permits the respective port to go into a standby mode when not
selected (CE HIGH). When a port is enabled, access to the entire
memory array is permitted. Non-contention READ/WRITE conditions
are illustrated in Truth Table 1.
LEFT
RIGHT
R/W
R/W
BUSY
BUSY
When expanding an IDT7133/43 RAM array in width while using
BUSY logic, one master part is used to decide which side of the RAM
array will receive a BUSY indication, and to output that indication. Any
number of slaves to be addressed in the same address range as the
master, use the BUSY signal as a write inhibit signal. Thus on the
IDT7133 RAM the BUSY pin is an output and on the IDT7143 RAM, the
BUSY pin is an input (see Figure 3).
BUSY
270Ω
VCC
R/W
Width Expansion with Busy Logic
Master/Slave Arrays
R/W
BUSY
270Ω
Busy Logic
Busy Logic provides a hardware indication that both ports of the
RAM have accessed the same location at the same time. It also allows
one of the two accesses to proceed and signals the other side that the
RAM is “busy”. The BUSY pin can then be used to stall the access until
the operation on the other side is completed. If a write operation has
been attempted from the side that receives a BUSY indication, the
write signal is gated internally to prevent the write from proceeding.
The use of BUSY logic is not required or desirable for all applications. In some cases it may be useful to logically OR the BUSY outputs
together and use any BUSY indication as an interrupt source to flag the
event of an illegal or illogical operation. If the write inhibit function of
BUSY logic is not desirable, the BUSY logic can be disabled by using
the IDT7143 (SLAVE). In the IDT7143, the BUSY pin operates solely
as a write inhibit input pin. Normal operation can be programmed by
tying the BUSY pins HIGH. If desired, unintended write operations can
be prevented to a port by tying the BUSY pin for that port LOW. The
BUSY outputs on the IDT 7133 RAM are open drain and require pullup resistors.
IDT7133
MASTER
R/W
BUSY
VCC
IDT7143
SLAVE
R/W
BUSY
2746 drw 15
Figure 4. Busy and chip enable routing for both width and depth expansion
with the IDT7133 (MASTER) and the IDT7143 (SLAVE).
Expanding the data bus width to 32 bits or more in a Dual-Port RAM
system implies that several chips will be active at the same time. If each
chip includes a hardware arbitrator, and the addresses for each chip
arrive at the same time, it is possible that one will activate its BUSYL
while another activates its BUSYR signal. Both sides are now BUSY
and the CPUs will await indefinitely for their port to become free.
To avoid the “Busy Lock-Out” problem, IDT has developed a
MASTER/SLAVE approach where only one hardware arbitrator, in the
MASTER, is used. The SLAVE has BUSY inputs which allow an
interface to the MASTER with no external components and with a
speed advantage over other systems.
When expanding Dual-Port RAMs in width, the writing of the SLAVE
RAMs must be delayed until after the BUSY input has settled.
Otherwise, the SLAVE chip may begin a write cycle during a contention
situation. Conversely, the write pulse must extend a hold time past
BUSY to ensure that a write cycle takes place after the contention is
resolved. This timing is inherent in all Dual-Port memory systems where
more than one chip is active at the same time.
The write pulse to the SLAVE should be delayed by the maximum
arbitration time of the MASTER. If, then, a contention occurs, the write
to the SLAVE will be inhibited due to BUSY from the MASTER.
6.42
14
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Truth Table I – Non-Contention Read/Write Control(4)
LEFT OR RIGHT PORT(1)
R/WLB
R/WUB
CE
OE
I/O0-7
I/O8-15
X
X
H
X
Z
Z
Port Disabled and in Power Down Mode, ISB2, ISB4
X
X
H
X
Z
Z
CER = CEL = VIH, Power Down Mode, ISB1 or ISB3
L
L
L
X
DATAIN
DATAIN
L
H
L
L
DATAIN
DATAOUT
H
L
L
L
DATAOUT
DATAIN
L
H
L
H
DATAIN
Z
Data on Lower Byte Written into Memory (2)
H
L
L
H
Z
DATAIN
Data on Upper Byte Written into Memory (2)
H
H
L
L
DATAOUT
DATAOUT
H
H
L
H
Z
Z
Function
Data on Lower Byte and Upper Byte Written into Memory (2)
Data on Lower Byte Written into Memory (2), Data in Memory Output on
Upper Byte (3)
Data in Memory Output on Lower Byte (3), Data on Upper Byte Written into
Memory (2)
Data in Memory Output on Lower Byte and Upper Byte
High Impedance Outputs
NOTES:
1. A0L - A10L≠A0R - A10R
2. If BUSY = LOW, data is not written.
3. If BUSY = LOW, data may not be valid, see tWDD and tDDD timing.
4. "H" = HIGH, "L" = LOW, "X" = Don’t Care, "Z" = High-Impedance, "LB" = Lower Byte, "UB" = Upper Byte
Truth Table II — Address BUSY
Arbitration
Inputs
Outputs
CEL
CER
A0L-A10L
A0R-A10R
BUSYL(1)
BUSYR(1)
Function
X
X
NO MATCH
H
H
Normal
H
X
MATCH
H
H
Normal
X
H
MATCH
H
H
Normal
L
L
MATCH
(2)
(2)
Write Inhibit(3)
2746 tbl 14
NOTES:
1. Pins BUSY L and BUSYR are both outputs on the IDT7133 (MASTER). Both are
inputs on the IDT7143 (SLAVE). On Slaves the BUSY input internally inhibits
writes.
2. "L" if the inputs to the opposite port were stable prior to the address and enable
inputs of this port. “H” if the inputs to the opposite port became stable after the
address and enable inputs of this port. If tAPS is not met, either BUSYL or BUSYR
= VIL will result BUSYL and BUSY R outputs can not be LOW simultaneously.
3. Writes to the left port are internally ignored when BUSYL outputs are driving LOW
regardless of actual logic level on the pin. Writes to the right port are internally
ignored when BUSYR outputs are driving LOW regardless of actual logic level on
the pin.
15
6.42
2746 tbl 13
IDT7133SA/LA, IDT7143SA/LA
High-Speed 2K x 16 Dual-Port RAM
Military, Industrial and Commercial Temperature Ranges
Ordering Information
IDT
XXXX
XX
XX
X
X
Device
Type
Power
Speed
Package
Process/
Temperature
Range
Blank
I
B
Commercial (0°C to +70°C)
Industrial (-40°C to +85°C)
Military (-55°C to +125°C)
Compliant to MIL-PRF-38535 QML
J
G
F
PF
68-pin PLCC (J68-1)
68-pin PGA (GU68-1)
68-pin Flatplack (F68-1)
100-pin TQFP (PN100-1)
20
25
35
45
55
70
90
Commercial Only
Commercial, Industrial & Military
Commercial, Industrial & Military
Commercial & Military
Commercial, Industrial & Military
Commercial & Military
Commercial & Military
LA
SA
Low Power
Standard Power
7133
7143
32K (2K x 16-Bit) MASTER Dual-Port RAM
32K (2K x 16-Bit) SLAVE Dual-Port RAM
Speed in nanoseconds
2746 drw 16
Datasheet Document History
12/18/98:
2/17/99:
3/9/99:
6/9/99:
10/1/99:
11/10/99:
4/1/00:
6/26/00:
Initiated datasheet document history
Converted to new format
Cosmetic and typographical corrections
Added additional notes to pin configurations
Page 2 corrected PN100 pinout
Corrected PF ordering code
Cosmetic and typographical corrections
Changed drawing format
Added Industrial Temperature Ranges and removed corresponding notes
Replaced IDT logo
Changed ±500mV to 0mV in notes
Page 2 Fixed overbar in pinout
Page 4 Increased storage temperature parameters
Clarified TA parameter
Page 5 DC Electrical parameters–changed wording from "open" to "disabled"
CORPORATE HEADQUARTERS
2975 Stender Way
Santa Clara, CA 95054
for SALES:
800-345-7015 or 408-727-6116
fax: 408-492-8674
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
6.42
16
for Tech Support:
831-754-4613
[email protected]
Similar pages