ATMEL AT49F8192AT-90TI 8-megabit (1m x 8/512k x 16) flash memory Datasheet

Features
• Single-voltage Operation
•
•
•
•
•
•
•
•
•
– 5V Read
– 5V Programming
Fast Read Access Time – 70 ns
Internal Erase/Program Control
Sector Architecture
– One 8K Word (16K Bytes) Boot Block with Programming Lockout
– Two 4K Word (8K Bytes) Parameter Blocks
– One 496K Word (992K Bytes) Main Memory Array Block
Fast Sector Erase Time – 10 seconds
Byte-by-byte or Word-by-word Programming – 10 µs Typical
Hardware Data Protection
Data Polling for End of Program Detection
Low Power Dissipation
– 50 mA Active Current
– 100 µA CMOS Standby Current
Typical 10,000 Write Cycles
Description
The AT49F008A(T) and AT49F8192A(T) are 5-volt, 8-megabit Flash memories organized as 1,048,576 words of 8 bits each or 512K words of 16 bits each. Manufactured
with Atmel’s advanced nonvolatile CMOS technology, the devices offer access times
to 90 ns with power dissipation of just 275 mW. When deselected, the CMOS standby
current is less than 100 µA.
The device contains a user-enabled “boot block” protection feature. Two versions of
the feature are available: the AT49F008A/8192A locates the boot block at lowest
order addresses (“bottom boot”); the AT49F008AT/8192AT locates it at highest order
addresses (“top boot”).
8-megabit
(1M x 8/
512K x 16)
Flash Memory
AT49F008A
AT49F008AT
AT49F8192A
AT49F8192AT
To allow for simple in-system reprogrammability, the AT49F008A(T)/8192A(T) does
not require high-input voltages for programming. Reading data out of the device is
similar to reading from an EPROM; it has standard CE, OE and WE inputs to avoid
bus contention. Reprogramming the AT49F008A(T)/8192A(T) is performed by first
erasing a block of data and then programming on a byte-by-byte or word-by-word
basis.
Pin Configurations
Pin Name
Function
A0 - A18
Addresses
CE
Chip Enable
OE
Output Enable
WE
Write Enable
RESET
Reset
RDY/BUSY
Ready/Busy Output
I/O0 - I/O14
Data Inputs/Outputs
I/O15 (A-1)
I/O15 (Data Input/Output, Word Mode)
A-1 (LSB Address Input, Byte Mode)
BYTE
Selects Byte or Word Mode
NC
No Connect
Rev. 1199G–FLASH–11/02
1
AT49F8192A(T) TSOP Top View
Type 1
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE
RESET
NC
NC
NC
A18
A17
A7
A6
A5
A4
A3
A2
A1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
AT49F8192A(T) SOIC (SOP) Top View
NC
A18
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE
GND
OE
I/O0
I/O8
I/O1
I/O9
I/O2
I/O10
I/O3
I/O11
A16
BYTE
GND
I/O15 / A-1
I/O7
I/O14
I/O6
I/O13
I/O5
I/O12
I/O4
VCC
I/O11
I/O3
I/O10
I/O2
I/O9
I/O1
I/O8
I/O0
OE
GND
CE
A0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
RESET
WE
A8
A9
A10
A11
A12
A13
A14
A15
A16
BYTE
GND
I/O15
I/O7
I/O14
I/O6
I/O13
I/O5
I/O12
I/O4
VCC
AT49F008A(T) TSOP Top View
Type 1
A16
A15
A14
A13
A12
A11
A9
A8
WE
RESET
NC
RDY/BUSY
A18
A7
A6
A5
A4
A3
A2
A1
Note:
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
A17
GND
NC
A-1
A10
I/O7
I/O6
I/O5
I/O4
VCC
VCC
NC
I/O3
I/O2
I/O1
I/O0
OE
GND
CE
A0
“•” denotes a white dot marked on the package.
The device is erased by executing the Erase command sequence; the device internally controls the erase operation. The memory is divided into four blocks for erase operations. There
are two 4K word parameter block sections: the boot block, and the main memory array block.
The typical number of program and erase cycles is in excess of 10,000 cycles.
The optional 8K word boot block section includes a reprogramming lockout feature to provide
data integrity. This feature is enabled by a command sequence. Once the boot block programming lockout feature is enabled, the data in the boot block cannot be changed when input
levels of 5.5 volts or less are used. The boot sector is designed to contain user secure code.
For the AT49F8192A(T), the BYTE pin controls whether the device data I/O pins operate in
the byte or word configuration. If the BYTE pin is set at a logic “1” or left open, the device is in
word configuration, I/O0 - I/O15 are active and controlled by CE and OE.
If the BYTE pin is set at logic “0”, the device is in byte configuration, and only data I/O pins
I/O0 - I/O7 are active and controlled by CE and OE. The data I/O pins I/O8 - I/O14 are tristated and the I/O15 pin is used as an input for the LSB (A-1) address function.
2
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
AT49F008A(T)
Block Diagram
AT49F008A
VCC
AT49F008AT
DATA INPUTS/OUTPUTS
I/O0 - I/O7
DATA INPUTS/OUTPUTS
I/O0 - I/O7
INPUT/OUTPUT
BUFFERS
INPUT/OUTPUT
BUFFERS
PROGRAM DATA
LATCHES
PROGRAM DATA
LATCHES
GND
OE
WE
CE
RESET
CONTROL
LOGIC
Y DECODER
ADDRESS
INPUTS
X DECODER
Y-GATING
MAIN MEMORY
(992K BYTES)
PARAMETER
BLOCK 2
8K BYTES
PARAMETER
BLOCK 1
8K BYTES
BOOT BLOCK
16K BYTES
AT49F8192A(T)
Block Diagram
08000
07FFF
06000
05FFF
04000
03FFF
00000
AT49F8192A
VCC
GND
OE
WE
CE
RESET
CONTROL
LOGIC
Y DECODER
ADDRESS
INPUTS
X DECODER
BOOT BLOCK
16K BYTES
PARAMETER
BLOCK 1
8K BYTES
PARAMETER
BLOCK 2
8K BYTES
MAIN MEMORY
(992K BYTES)
FFFFF
FC000
FBFFF
FA000
F9FFF
F8000
F7FFF
00000
AT49F8192AT
DATA INPUTS/OUTPUTS
I/O0 - I/O15
DATA INPUTS/OUTPUTS
I/O0 - I/O15
INPUT/OUTPUT
BUFFERS
INPUT/OUTPUT
BUFFERS
PROGRAM DATA
LATCHES
PROGRAM DATA
LATCHES
Y-GATING
Y-GATING
MAIN MEMORY
(496K WORDS)
PARAMETER
BLOCK 2
4K WORDS
PARAMETER
BLOCK 1
4K WORDS
BOOT BLOCK
8K WORDS
Device
Operation
Y-GATING
FFFFF
7FFFF
04000
03FFF
03000
02FFF
02000
01FFF
00000
BOOT BLOCK
8K WORDS
PARAMETER
BLOCK 1
4K WORDS
PARAMETER
BLOCK 2
4K WORDS
MAIN MEMORY
(496K WORDS)
7FFFF
7E000
7DFFF
7D000
7CFFF
7C000
7BFFF
00000
READ: The AT49F008A(T)/8192A(T) is accessed like an EPROM. When CE and OE are low
and WE is high, the data stored at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high-impedance state whenever CE or OE
is high. This dual line control gives designers flexibility in preventing bus contention.
COMMAND SEQUENCES: When the device is first powered on, it will be reset to the read or
standby mode, depending upon the state of the control line inputs. In order to perform other
device functions, a series of command sequences are entered into the device. The command
sequences are shown in the Command Definitions table (I/O8 - I/O15 are don’t care inputs for
the command codes). The command sequences are written by applying a low pulse on the
WE or CE input with CE or WE low (respectively) and OE high. The address is latched on the
falling edge of CE or WE, whichever occurs last. The data is latched by the first rising edge of
CE or WE. Standard microprocessor write timings are used. The address locations used in the
command sequences are not affected by entering the command sequences.
3
1199G–FLASH–11/02
RESET: A RESET input pin is provided to ease some system applications. When RESET is at
a logic high level, the device is in its standard operating mode. A low level on the RESET input
halts the present device operation and puts the outputs of the device in a high-impedance
state. When a high level is reasserted on the RESET pin, the device returns to the read or
standby mode, depending upon the state of the control inputs. By applying a 12V ± 0.5V input
signal to the RESET pin, the boot block array can be reprogrammed even if the boot block program lockout feature has been enabled (see Boot Block Programming Lockout Override
section).
ERASURE: Before a byte or word can be reprogrammed, it must be erased. The erased state
of memory bits is a logic “1”. The entire device can be erased by using the Chip Erase command or individual sectors can be erased by using the Sector Erase command.
CHIP ERASE: The entire device can be erased at one time by using the 6-byte chip erase
software code. After the chip erase has been initiated, the device will internally time the erase
operation so that no external clocks are required. The maximum time to erase the chip is tEC.
If the boot block lockout has been enabled, the chip erase will not erase the data in the boot
block; it will erase the main memory block and the parameter blocks only. After the chip erase,
the device will return to the read or standby mode.
SECTOR ERASE: As an alternative to a full chip erase, the device is organized into four sectors that can be individually erased. There are two 4K word parameter block sections, one
boot block, and the main memory array block. The Sector Erase command is a six-bus cycle
operation. The sector address is latched on the falling WE edge of the sixth cycle while the
30H data input command is latched at the rising edge of WE. The sector erase starts after the
rising edge of WE of the sixth cycle. The erase operation is internally controlled; it will automatically time to completion. Whenever the main memory block is erased and reprogrammed,
the two parameter blocks should be erased and reprogrammed before the main memory block
is erased again. Whenever a parameter block is erased and reprogrammed, the other parameter block should be erased and reprogrammed before the first parameter block is erased
again. Whenever the boot block is erased and reprogrammed, the main memory block and the
parameter blocks should be erased and reprogrammed before the boot block is erased again.
BYTE/WORD PROGRAMMING: Once a memory block is erased, it is programmed (to a logic
“0”) on a byte-by-byte or word-by-word basis. Programming is accomplished via the internal
device command register and is a four-bus cycle operation. The device will automatically generate the required internal program pulses.
Any commands written to the chip during the embedded programming cycle will be ignored. If
a hardware reset happens during programming, the data at the location being programmed
will be corrupted. Please note that a data “0” cannot be programmed back to a “1”; only erase
operations can convert “0”s to “1”s. Programming is completed after the specified tBP cycle
time. The Data Polling feature may also be used to indicate the end of a program cycle.
BOOT BLOCK PROGRAMMING LOCKOUT: The device has one designated block that has
a programming lockout feature. This feature prevents programming of data in the designated
block once the feature has been enabled. The size of the block is 8K words. This block,
referred to as the boot block, can contain secure code that is used to bring up the system.
Enabling the lockout feature will allow the boot code to stay in the device while data in the rest
of the device is updated. This feature does not have to be activated; the boot block’s usage as
a write-protected region is optional to the user. The address range of the boot block is 00000H
to 03FFFH for the AT49F008A; FC000H to FFFFFH for the AT49F008AT; 00000H to 01FFFH
for the AT49F8192A; and 7E000H to 7FFFFH for the AT49F8192AT.
4
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
Once the feature is enabled, the data in the boot block can no longer be erased or programmed when input levels of 5.5V or less are used. Data in the main memory block can still
be changed through the regular programming method. To activate the lockout feature, a series
of six program commands to specific addresses with specific data must be performed. Please
refer to the Command Definitions table.
BOOT BLOCK LOCKOUT DETECTION: A software method is available to determine if programming of the boot block section is locked out. When the device is in the software product
identification mode (see Software Product Identification Entry and Exit sections), a read from
the following address location will show if programming the boot block is locked out – 00002H
for the AT49F008A and AT49F8192A; FC002H for the AT49F008AT; and 7E002H for the
AT49F8192AT. If the data on I/O0 is low, the boot block can be programmed; if the data on
I/O0 is high, the program lockout feature has been enabled and the block cannot be programmed. The software product identification exit code should be used to return to standard
operation.
BOOT BLOCK PROGRAMMING LOCKOUT OVERRIDE: The user can override the boot
block programming lockout by taking the RESET pin to 12 volts during the entire chip erase,
sector erase or word programming operation. When the RESET pin is brought back to TTL
levels, the boot block programming lockout feature is again active.
PRODUCT IDENTIFICATION: The product identification mode identifies the device and manufacturer as Atmel. It may be accessed by hardware or software operation. The hardware
operation mode can be used by an external programmer to identify the correct programming
algorithm for the Atmel product.
For details, see “Operating Modes” (for hardware operation) or “Software Product Identification Entry/Exit” on page 13. The manufacturer and device codes are the same for both modes.
DATA POLLING: The AT49F008A(T)/8192A(T) features Data Polling to indicate the end of a
program cycle. During a program cycle an attempted read of the last byte loaded will result in
the complement of the loaded data on I/O7. Once the program cycle has been completed, true
data is valid on all outputs and the next cycle may begin. During a chip or sector erase operation, an attempt to read the device will give a “0” on I/O7. Once the program or erase cycle has
completed, true data will be read from the device. Data Polling may begin at any time during
the program cycle.
TOGGLE BIT: In addition to Data Polling, the AT49F008A(T)/8192A(T) provides another
method for determining the end of a program or erase cycle. During a program or erase operation, successive attempts to read data from the device will result in I/O6 toggling between
one and zero. Once the program cycle has completed, I/O6 will stop toggling and valid data
will be read. Examining the toggle bit may begin at any time during a program cycle.
READY/BUSY: For the AT49F008A(T), pin 12 is an open-drain Ready/Busy output pin, which
provides another method of detecting the end of a program or erase operation. RDY/BUSY is
actively pulled low during the internal program and erase cycles and it is released at the completion of the cycle. The open-drain connection allows for OR-tying of several devices to the
same RDY/BUSY line.
HARDWARE DATA PROTECTION: Hardware features protect against inadvertent programs
to the AT49F008A(T)/8192A(T) in the following ways: (a) VCC sense: if VCC is below 3.8V (typical), the program function is inhibited. (b) VCC power-on delay: once VCC has reached the VCC
sense level, the device will automatically time-out 10 ms (typical) before programming. (c) Program inhibit: holding any one of OE low, CE high or WE high inhibits program cycles. (d) Noise
filter: pulses of less than 15 ns (typical) on the WE or CE inputs will not initiate a program
cycle.
5
1199G–FLASH–11/02
Command Definition in Hex(1)
Command
Sequence
1st Bus
Cycle
Bus
Cycles
Addr
Data
Read
1
Addr
DOUT
Chip Erase
6
5555
AA
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
Data
Addr
Data
Addr
Data
Addr
Data
Addr
Data
2AAA
55
5555
80
5555
AA
2AAA
55
5555
10
2AAA
55
(4)
SA
30
2AAA
55
5555
40
6
5555
AA
2AAA
55
5555
80
5555
AA
Byte/Word Program
4
5555
AA
2AAA
55
5555
A0
Addr
DIN
Boot Block Lockout(2)
6
5555
AA
2AAA
55
5555
80
5555
AA
Product ID Entry
3
5555
AA
2AAA
55
5555
90
(3)
3
5555
AA
2AAA
55
5555
F0
(3)
1
xxxx
F0
Product ID Exit
Notes:
6th Bus
Cycle
Addr
Sector Erase
Product ID Exit
5th Bus
Cycle
1. The DATA FORMAT in each bus cycle is as follows: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex).
The ADDRESS FORMAT in each bus cycle is as follows: A15 - A0 (Hex); A-1 and A15 - A18 (Don’t Care).
2. The boot sector has the address range 00000H to 03FFFH for the AT49F008A; FC000H to FFFFFH for the
AT49F008AT; 00000H to 01FFFH for the AT49F8192A; and 7E000H to 7FFFFH for the AT49F8192AT.
3. Either one of the Product ID Exit commands can be used.
4. SA = sector addresses: (A0 - A18)
For the AT49F008A/8192A
SA = 01XXX for BOOT BLOCK
SA = 02XXX for PARAMETER BLOCK 1
SA = 03XXX for PARAMETER BLOCK 2
SA = 7FXXX for MAIN MEMORY ARRAY
For the AT49F008AT/8192AT
SA = 7FXXX for BOOT BLOCK
SA = 7DXXX for PARAMETER BLOCK 1
SA = 7CXXX for PARAMETER BLOCK 2
SA = 7BXXX for MAIN MEMORY ARRAY
Absolute Maximum Ratings*
Temperature under Bias ................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to VCC + 0.6V
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
Voltage on RESET
with Respect to Ground ...................................-0.6V to +13.5V
6
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
DC and AC Operating Range
AT49F008A/8192A(T)-70
AT49F008A/8192A(T)-90
N/A
N/A
-40°C - 85°C
-40°C - 85°C
5V ± 10%
5V ± 10%
Com.
Operating Temperature (Case)
Ind.
VCC Power Supply
Operating Modes
Mode
CE
OE
WE
RESET
Ai
I/O
VIL
VIL
VIH
VIH
Ai
DOUT
VIL
VIH
VIL
VIH
Ai
DIN
VIH
X(1)
X
VIH
X
High-Z
Program Inhibit
X
X
VIH
VIH
Program Inhibit
X
VIL
X
VIH
Output Disable
X
VIH
X
VIH
Reset
X
X
X
VIL
Read
Program/Erase
(2)
Standby/Program
Inhibit
High-Z
X
High-Z
Product Identification
Hardware
VIL
VIL
Software(5)
Notes:
VIH
VIH
VIH
A1 - A18 = VIL, A9 = VH(3)
A0 = VIL
Manufacturer Code(4)
A1 - A18 = VIL, A9 = VH(3)
A0 = VIH
Device Code(4)
A0 = VIL, A1 - A18 = VIL
Manufacturer Code(4)
A0 = VIH, A1 - A18 = VIL
Device Code(4)
1.
2.
3.
4.
X can be VIL or VIH.
Refer to AC programming waveforms.
VH = 12.0V ± 0.5V.
Manufacturer Code: 001FH
Device Code: 22H (AT49F008A); 00A0H (AT49F8192A); 21H (AT49F008AT); 00A3H (AT49F8192AT).
5. See details under “Software Product Identification Entry/Exit” on page 13.
DC Characteristics
Symbol
Parameter
Condition
ILI
Input Load Current
ILO
Min
Max
Units
VIN = 0V to VCC
10.0
µA
Output Leakage Current
VI/O = 0V to VCC
10.0
µA
ISB1
VCC Standby Current CMOS
CE = VCC - 0.3V to VCC
100.0
µA
ISB2
VCC Standby Current TTL
CE = 2.0V to VCC
3.0
mA
ICC(1)
VCC Active Current
f = 5 MHz; IOUT = 0 mA
50.0
mA
VIL
Input Low Voltage
0.8
V
VIH
Input High Voltage
VOL
Output Low Voltage
IOL = 2.1 mA
VOH
Output High Voltage
IOH = -400 µA
Note:
1. In the erase mode, ICC is 90 mA.
2.0
V
0.45
2.4
V
V
7
1199G–FLASH–11/02
AC Read Characteristics
AT49F008A/8192A(T)-70
Symbol
Parameter
Min
Max
tACC
Address to
Output Delay
tCE(1)
CE to Output Delay
tOE(2)
OE to Output Delay
0
35
tDF(3)(4)
CE or OE to Output Float
0
25
tOH
Output Hold from OE, CE or Address, whichever
occurred first
0
tRO
RESET to Output Delay
AT49F008A/8192A(T)-90
Min
Max
Units
70
90
ns
70
90
ns
0
40
ns
0
25
ns
0
800
ns
800
ns
AC Read Waveforms(1)(2)(3)(4)
ADDRESS
ADDRESS VALID
CE
t
CE
t
OE
OE
t
DF
t
t
ACC
RESET
OUTPUT
Notes:
8
OH
t
RO
HIGH Z
OUTPUT
VALID
1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE, whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
Input Test Waveforms and Measurement Level
3.0V
0.0V
tR, tF < 5 ns
Output Test Load
5.0V
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Typ
Max
Units
CIN
4
6
pF
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note:
Conditions
1. This parameter is characterized and is not 100% tested.
9
1199G–FLASH–11/02
AC Word Load Characteristics
Symbol
Parameter
Min
Max
Units
tAS, tOES
Address, OE Setup Time
0
ns
tAH
Address Hold Time
50
ns
tCS
Chip Select Setup Time
0
ns
tCH
Chip Select Hold Time
0
ns
tWP
Write Pulse Width (WE or CE)
50
ns
tDS
Data Setup Time
50
ns
tDH, tOEH
Data, OE Hold Time
0
ns
tWPH
Write Pulse Width High
40
ns
AC Byte/Word Load Waveforms
WE Controlled
CE Controlled
10
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
Program Cycle Characteristics
Symbol
Parameter
Min
Typ
Max
Units
tBP
Byte/Word Programming Time
10
50
µs
tAS
Address Setup Time
0
ns
tAH
Address Hold Time
50
ns
tDS
Data Setup Time
50
ns
tDH
Data Hold Time
0
ns
tWP
Write Pulse Width
50
ns
tWPH
Write Pulse Width High
40
ns
tEC
Erase Cycle Time
5
seconds
Program Cycle Waveforms
PROGRAM CYCLE
OE
CE
t WP
t BP
t WPH
WE
t
AS
A0-A18
t DH
t AH
5555
5555
2AAA
5555
ADDRESS
t DS
55
AA
DATA
A0
AA
INPUT DATA
Sector or Chip Erase Cycle Waveforms
OE
(1)
CE
t WP
t WPH
WE
t AS
A0-A18
t DH
t AH
5555
5555
5555
2AAA
Note 2
2AAA
t EC
t DS
DATA
AA
BYTE/
WORD 0
Notes:
55
BYTE/
WORD 1
80
BYTE/
WORD 2
AA
BYTE/
WORD 3
55
Note 3
BYTE/
WORD 4
BYTE/
WORD 5
1. OE must be high only when WE and CE are both low.
2. For chip erase, the address should be 5555. For sector erase, the address depends on what sector is to be erased.
(See note 4 under Command Definitions.)
3. For chip erase, the data should be 10H, and for sector erase, the data should be 30H.
11
1199G–FLASH–11/02
Data Polling Characteristics(1)
Symbol
Parameter
tDH
Data Hold Time
tOEH
OE Hold Time
Min
Max
OE to Output Delay
tWR
Write Recovery Time
Units
10
ns
10
ns
(2)
tOE
Notes:
Typ
ns
0
ns
1. These parameters are characterized and not 100% tested.
2. See tOE spec in “AC Read Characteristics” on page 8.
Data Polling Waveforms
Toggle Bit Characteristics(1)
Symbol
Parameter
tDH
Data Hold Time
10
ns
tOEH
OE Hold Time
10
ns
tOE
OE to Output Delay(2)
tOEHP
OE High Pulse
tWR
Write Recovery Time
Notes:
Min
Typ
Max
Units
ns
150
ns
0
ns
1. These parameters are characterized and not 100% tested.
2. See tOE spec in “AC Read Characteristics” on page 8.
Toggle Bit Waveforms(1)(2)(3)
Notes:
12
1. Toggling either OE or CE or both OE and CE will operate toggle bit. The tOEHP specification must be met by the toggling
input(s).
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
Software Product Identification Entry(1) Boot Block Lockout Enable Algorithm(1)
LOAD DATA AA
TO
ADDRESS 5555(7)
LOAD DATA AA
TO
ADDRESS 5555(3)
LOAD DATA 55
TO
ADDRESS 2AAA(3)
LOAD DATA 55
TO
ADDRESS 2AAA(7)
LOAD DATA 80
TO
ADDRESS 5555(3)
LOAD DATA 90
TO
ADDRESS 5555(7)
LOAD DATA AA
TO
ADDRESS 5555(3)
ENTER PRODUCT
IDENTIFICATION
MODE(2)(3)(5)
LOAD DATA 55
TO
ADDRESS 2AAA(3)
Software Product Identification Exit(1)(6)
LOAD DATA AA
TO
ADDRESS 5555(7)
LOAD DATA 55
TO
ADDRESS 2AAA(7)
OR
LOAD DATA F0
TO
ANY ADDRESS
LOAD DATA 40
TO
ADDRESS 5555(3)
EXIT PRODUCT
IDENTIFICATION
MODE(4)
LOAD DATA F0
TO
ADDRESS 5555(7)
PAUSE 1 second(2)
Notes:
1. Data Format: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex).
Address Format: A15 - A0 (Hex); A-1 and A15 - A18 (Don’t
Care).
2. Boot Block Lockout feature enabled.
EXIT PRODUCT
IDENTIFICATION
MODE(4)
Notes:
1. Data Format: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex).
Address Format: A15 - A0 (Hex); A-1 and A15 - A18 (Don’t
Care).
2. A1 - A18 = VIL.
Manufacturer Code is read for A0 = VIL.
Device Code is read for A0 = VIH.
3. The device does not remain in identification mode if
powered down.
4. The device returns to standard operation mode.
5. Manufacturer Code: 001FH
Device Code: 22H (AT49F008A); 00A0H
(AT49F8192A);
21H (AT49F008AT); 00A3H (AT49F8192AT)
6. Either one of the Product ID Exit commands can be used.
13
1199G–FLASH–11/02
AT49F008A Ordering Information
tACC
(ns)
ICC (mA)
Standby
Active
Ordering Code
Package
Operation Range
70
50
0.3
AT49F008A-70TI
40T
Industrial
(-40° to 85°C)
90
50
0.3
AT49F008A-90TI
40T
Industrial
(-40° to 85°C)
Package
Operation Range
AT49F8192A(T) Ordering Information
ICC (mA)
tACC
(ns)
Active
Standby
70
50
0.3
AT49F8192A-70TI
48T
Industrial
(-40° to 85°C)
70
50
0.3
AT49F8192AT-70TI
48T
Industrial
(-40° to 85°C)
90
50
0.3
AT49F8192A-90TI
48T
Industrial
(-40° to 85°C)
90
50
0.3
AT49F8192AT-90RI
AT49F8192AT-90TI
44R
48T
Industrial
(-40° to 85°C)
Ordering Code
Package Type
44R
44-lead, 0.525" Wide, Plastic Gull Wing Small Outline Package (SOIC)
40T
40-lead, Plastic Thin Small Outline Package (TSOP)
48T
48-lead, Plastic Thin Small Outline Package (TSOP)
14
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
Packaging Information
44R – SOIC
Dimensions in Millimeters and (Inches).
Controlling dimension: Inches.
0.508(0.020)
0.356(0.014)
13.46(0.530)
13.21(0.520)
16.18(0.637)
15.82(0.623)
PIN 1
1.27(0.050) BSC
28.32(1.115)
28.07(1.105)
2.67(0.105)
2.41(0.095)
0.33(0.130)
1.27(0.050)
0.250(0.010)
0.100(0.004)
0º ~ 8º
1.00(0.039)
0.60(0.024)
04/11/01
R
2325 Orchard Parkway
San Jose, CA 95131
TITLE
44R, 44-lead (0.525" Body) Plastic Gull Wing Small Outline (SOIC)
DRAWING NO.
REV.
44R
A
15
1199G–FLASH–11/02
40T – TSOP
PIN 1
0º ~ 8º
c
Pin 1 Identifier
D1 D
L
b
e
L1
A2
E
A
GAGE PLANE
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
NOM
MAX
A
–
–
1.20
A1
0.05
–
0.15
A2
0.95
1.00
1.05
D
19.80
20.00
20.20
D1
18.30
18.40
18.50
Note 2
E
9.90
10.00
10.10
Note 2
L
0.50
0.60
0.70
SYMBOL
Notes:
1. This package conforms to JEDEC reference MO-142, Variation CD.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
L1
0.25 BASIC
b
0.17
0.22
0.27
c
0.10
–
0.21
e
NOTE
0.50 BASIC
10/18/01
R
16
2325 Orchard Parkway
San Jose, CA 95131
TITLE
40T, 40-lead (10 x 20 mm Package) Plastic Thin Small Outline
Package, Type I (TSOP)
DRAWING NO.
REV.
40T
B
AT49F008A(T)/8192A(T)
1199G–FLASH–11/02
AT49F008A(T)/8192A(T)
48T – TSOP
PIN 1
0º ~ 8º
c
Pin 1 Identifier
D1 D
L
b
e
L1
A2
E
A
GAGE PLANE
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
NOM
MAX
A
–
–
1.20
A1
0.05
–
0.15
A2
0.95
1.00
1.05
D
19.80
20.00
20.20
D1
18.30
18.40
18.50
Note 2
E
11.90
12.00
12.10
Note 2
L
0.50
0.60
0.70
SYMBOL
Notes:
1. This package conforms to JEDEC reference MO-142, Variation DD.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
L1
0.25 BASIC
b
0.17
0.22
0.27
c
0.10
–
0.21
e
NOTE
0.50 BASIC
10/18/01
R
2325 Orchard Parkway
San Jose, CA 95131
TITLE
48T, 48-lead (12 x 20 mm Package) Plastic Thin Small Outline
Package, Type I (TSOP)
DRAWING NO.
REV.
48T
B
17
1199G–FLASH–11/02
Atmel Headquarters
Atmel Operations
Corporate Headquarters
Memory
2325 Orchard Parkway
San Jose, CA 95131
USA
TEL 1(408) 441-0311
FAX 1(408) 487-2600
2325 Orchard Parkway
San Jose, CA 95131
TEL 1(408) 441-0311
FAX 1(408) 436-4314
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Theresienstrasse 2
Postfach 3535
74025 Heilbronn, Germany
TEL (49) 71-31-67-0
FAX (49) 71-31-67-2340
Microcontrollers
Europe
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Route des Arsenaux 41
Case Postale 80
CH-1705 Fribourg
Switzerland
TEL (41) 26-426-5555
FAX (41) 26-426-5500
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Room 1219
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Hong Kong
TEL (852) 2721-9778
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Japan
TEL (81) 3-3523-3551
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FAX 1(408) 436-4314
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Maxwell Building
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TEL (44) 1355-803-000
FAX (44) 1355-242-743
e-mail
[email protected]
Web Site
http://www.atmel.com
© Atmel Corporation 2002.
Atmel Corporation makes no warranty for the use of its products, other than those expressly contained in the Company’s standard warranty
which is detailed in Atmel’s Terms and Conditions located on the Company’s web site. The Company assumes no responsibility for any errors
which may appear in this document, reserves the right to change devices or specifications detailed herein at any time without notice, and does
not make any commitment to update the information contained herein. No licenses to patents or other intellectual property of Atmel are granted
by the Company in connection with the sale of Atmel products, expressly or by implication. Atmel’s products are not authorized for use as critical
components in life support devices or systems.
®
ATMEL is the registered trademark of Atmel.
Other terms and product names may be the trademark of others.
Printed on recycled paper.
1199G–FLASH–11/02
/xM
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