FAIRCHILD RMPA2450

RMPA2450
2.4–2.5 GHz GaAs MMIC Power Amplifier
General Description
Features
The Fairchild RMPA2450 is a fully monolithic power
amplifier in a surface mount package for use in wireless
applications in the 2.4 to 2.5GHz ISM frequency band. The
amplifier may be biased for linear, class AB or class F for
high efficiency applications. On-chip matching components
allow operation in a 50Ω system with no external matching
components. The MMIC chip design utilizes our 0.25µm
power PHEMT process.
•
•
•
•
•
•
35% Power Added Efficiency
31dBm Output Power (P1dB) at Vd = +7V
28dBm Output Power (P1dB) at Vd = +5V
No external RF matching components
Small Package Outline: 0.28" x 0.28" x 0.07"
Thermal Resistance (Channel to Case): 33°C/W
Device
Absolute Ratings
Symbol
Vd1, Vd2
Vg1, Vg2
Vd–Vg
PIN
Ids
Ig
Tch
TCASE
TSTG
Parameter
Positive Drain DC Voltage
Negative Gate DC Voltage
Simultaneous Drain to Gate Voltage
RF Input Power (from 50Ω source)
Drain to Source Current
Gate Current
Channel Temperature
Operating Case Temperature
Storage Temperature Range
©2004 Fairchild Semiconductor Corporation
Rating
+8
-5
+10
+10
575
5
150
-40 to 100
-40 to 125
Units
V
V
V
dBm
mA
mA
°C
°C
°C
RMPA2450 Rev. C
RMPA2450
May 2004
Parameter
Frequency Range
Gain1, 2, 4
Output Power, P1dB1,4
Assoc. Power Added Efficiency
Output Power, P1dB3
Assoc. Power Added Efficiency
Drain Current (Idd1 + Idd2)
Gate Current (Igg1 + Igg2)
Input Return Loss (50Ω)
Min
2400
Typ
2450
30
28
35
31
33
Max
2500
550
5
7.5
Units
MHz
dB
dBm
%
dBm
%
mA
mA
dB
Notes:
1: Idq = 360mA, Vd1 = Vd2 = 5.0V
2: Pin = -3dBm,
3: Vd1 = Vd2 = +7V
4: Production Testing includes Gain, Output Power (P1dB) and Input Return Loss at Vd1 = Vd2 = 5.0V, Vg1 = Vg2 = -0.5V (nominal) , adjusted for Idq = 360mA, Pin
= -3 dBm and at F = 2.45 GHz. Other Parameters are guaranteed by Design Validation Testing.
Vd2
Pin# 4
Vd1
Pin# 5
Ground
Pin# 1, 3, 6, 7, 9, 12, 13
RF OUT
Pins# 2
RF IN
Pin# 8
Vg2
Pin# 11
Vg1
Pin# 10
Figure 1. Functional Block Diagram (RMPA2450)
TOP VIEW
0.200 SQ.
BOTTOM VIEW
654
A
45 6
3
7
8
RMPA
2450
0.030
2
9
2
8
9
1
1
12
10
7
3
0.015
0.041
12
11
11 10
0.069 MAX.
PLASTIC LID
Pin#
1
2
3
4
5
6
7
8
9
10
11
12
13
Description
GND
RF Out
GND
Vd2
Vd1
GND
GND
RF
GND
Vg1
Vg2
GND
GND (PACKAGE
BASE)
0.010
0.230
0.246
0.282
Dimensions in inches
SIDE SECTION
Figure 2. Outline Dimensions (RMPA2450)
©2004 Fairchild Semiconductor Corporation
RMPA2450 Rev. C
RMPA2450
Electrical Characteristics (Note 4, At 25°C, ZO = 50Ω, Unless Otherwise Noted)
The following briefly describes a procedure for evaluating
the high efficiency PHEMT amplifier packaged in a surface
mount package. It may be noted that the chip is a fully
monolithic amplifier for ISM band applications. Figure 1
shows the functional block diagram of the packaged
product.
Test Fixture
Figure 2 shows the outline and pin-out descriptions for the
packaged device. A typical test fixture schematic showing
external bias components is shown in Figure 3. Figure 4
shows typical layout of an evaluation board corresponding
to the schematic diagram. The following should be noted:
(1) Package pin designations are as shown in Figure 2.
Test Procedure for the Evaluation Board
(RMPA2450-TB)
The following sequence of procedure must be followed to
properly test the power amplifier:
CAUTION: LOSS OF GATE VOLTAGES (VG1, VG2)
WHILE DRAIN VOLTAGES (VD1,VD2) ARE PRESENT
MAY DAMAGE THE AMPLIFIER.
Step 1: Turn off RF input power.
Step 2: Use GND terminal of the evaluation board for
DC supplies.
Apply gate supply voltages of typical -0.5V to
evaluation board terminals Vgg.
(3) Vgg1 = Vgg2 = Vgg is the negative supply voltage at
the evaluation board terminal
Step 3: Apply drain supply voltages of +5.0V to evaluation
board terminals Vdd.
Adjust gate supply voltage, if needed, to set the
desired quiescent bias currents Idq (or to the
values as shown on the data summary
accompanying the product samples).
(4) Vd1, Vd2 are the Drain Voltages (positive) applied at
the pins of the package
Step 4: After the bias condition is established, RF input
signal may now be applied.
(5) Vdd1 = Vdd2 = Vdd is the positive supply voltage at the
evaluation board terminal
Step 5: Follow turn-off sequence of:
(i) Turn off RF Input Power (ii) Turn down and off
Vdd (iii) Turn down and off Vgg
(2) Vg1, Vg2 are the Gate Voltages (negative) applied at
the pins of the package
©2004 Fairchild Semiconductor Corporation
RMPA2450 Rev. C
RMPA2450
Application Information
CAUTION: THIS IS AN ESD SENSITIVE DEVICE.
6
C6
4
3
7
RF IN
J1
C4
(Opt)
Vdd
P2
RF OUT
J2
RMPA
2450
9
1
U1
12
GND
P3
Vgg
P1
C5
+
C3
(Opt)
C1
Figure 3. Schematic for a Typical Test Evaluation Board (RMPA2450-TB)
Parts List for Test Evaluation Board (RMPA2450-TB), G654220
Part
C1, C2
C3, C4
C5, C6
U1
P1, P2, P3
J1, J2
Board
Rating
330pF
1000pF
4.75µF
RMPA2550
Terminals
SMA Connectors
FR4
©2004 Fairchild Semiconductor Corporation
Size (L" X W")
.04" X .02"
.04" X .02"
.14" X .11"
.28" X .28" X .07
Vendors
AVX, Murata, Novacap
AVX, Murata, Novacap
Sprague, ATC, AVX, Murata
Sametec
E.F. Johnson
RMPA2450 Rev. C
RMPA2450
C2
+
RMPA2450
C4
4
C2
C6
Vdd1=Vdd2
(+Vdd )
P2
U1
P1
C4
C2
RF In
J1
RF Out
J2
U1
C1
C1
C3
C3
P2
P3
C5
Vgg1=Vgg2
(-Vgg )
P1
Ground
(GND)
P3
Figure 4. Layout and Assembly of Test Evaluation Board (RMPA2450-TB)
©2004 Fairchild Semiconductor Corporation
RMPA2450 Rev. C
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
2. A critical component is any component of a life
1. Life support devices or systems are devices or
support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
the body, or (b) support or sustain life, or (c) whose
support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I11