AD MAT02 Low-noise, matched dual monolithic transistor Datasheet

Low-noise, matched dual
monolithic transistor
MAT02
1.0
SCOPE
This specification documents the detail requirements for space qualified product manufactured on
Analog Devices, Inc.'s QML certified line per MIL-PRF-38535 Level V except as modified herein.
The manufacturing flow described in the STANDARD SPACE LEVEL PRODUCTS PROGRAM
brochure is to be considered a part of this specification http://www.analog.com/aerospace
This data sheet specifically details the space grade version of this product. A more detailed
operational description and a complete datasheet for commercial product grades can be found at
www.analog.com/MAT02
2.0
Part Number. The complete part number(s) of this specification follow:
Part Number
MAT02-903H
2.1
Description
Low-noise, matched dual monolithic transistor
Case Outline.
Letter
H
Descriptive designator Case Outline (Lead Finish per MIL-PRF-38535)
MACY1-X6
6-Lead can package (TO)
Figure 1 - Terminal connections.
3.0
Absolute Maximum Ratings. (TA = 25°C, unless otherwise noted)
Collector to base voltage (BVCBO) .................................................................................. 40V
Collector to emitter voltage (BVCEO) .............................................................................. 40V
Collector to collector voltage (BVCC) ............................................................................. 40V
Emitter to emitter voltage (BVEE) ................................................................................... 40V
Collector current (IC)....................................................................................................20mA
Emitter current (IE).......................................................................................................20mA
Total power dissipation 1/ ........................................................................................ 500mW
Operating ambient temperature range .............................................................-55 to +125°C
Storage temperature range ......................................................................... -65°C to +150°C
Lead temperature (soldering, 60 sec) ........................................................................ +300°C
Dice junction temperature ......................................................................................... +150°C
1/ Rating applies to applications not using heat sinking, device is free air only.
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• MAT02S: Low Noise, Matched Dual Monolithic Transistor
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MAT02
3.1
Thermal Characteristics:
Thermal Resistance, TO-78 (H) Package
Junction-to-Case (JC) = 45°C/W Max
Junction-to-Ambient (JA) = 150°C/W Max
Derate linearly at 6.67 mW/°C for ambient temperatures above 70°C.
Terminal Connections 1/
Terminal
6 lead TO
1
C1
2
B1
3
E1
4
E2
5
B2
6
C2
1/ Substrate is connected to case on TO-78 package. Substrate is normally connected to the most
negative circuit potential, but can be floated.
Table I
Parameter
See notes at end of table
Current Gain
Symbol
hFE
Conditions 1/
IC = 1mA; VCB = 0V, 40V
IC = 100A; VCB = 0V, 40V
IC = 100A; VCB = 15V
IC = 10A; VCB = 0V, 40V
IC = 10A; VCB = 15V
IC = 1A; VCB = 0V, 40V
IC = 1A; VCB = 15V
Subgroup
Limit
Min
1
500
2, 3
275
1
500
2, 3
225
1
400
2, 3
175
1
300
2, 3
150
Limit
Max
Units
Current Gain Match 2/
hFE
IC=10A,100A,1mA; VCB=0V
1
2
%
Offset Voltage
VOS
VCB = 0V
1
50
V
2, 3
80
0.3
V/°C
1
25
V
VCB = 0V; IC = 10A, 1mA
1
25
VCB = 0V, 40V
1
0.6
2, 3
9.0
1
70
pA/V
1
0.5

Offset Voltage vs. Temperature
5/
TCVOS
VCB = 0V
Offset Voltage vs. VCB 3/
VOS
/VCB
VCB = 0V, 40V
Offset Voltage vs. Collector
Current
Input Offset Current
Offset Current vs. VCB
Bulk Emitter Resistance
VOS/IC
IOS
IOS
/VCB
rBE
VCB = 0V, 40V
nA
MAT02
Table I(cont’d)
Parameter
See notes at end of table
Symbol
Collector Base Leakage Current
ICBO
VCB = 40V
Collector Emitter Leakage
Current 4/
ICES
Collector-Collector Leakage
Current 4/
Bias Current
Collector Saturation Voltage
Breakdown Voltage
Noise voltage density
Limit
Max
Units
1
200
pA
VCE = 40V, VBE = 0V
1
200
ICC
VCC = 40V
1
200
IB
VCB = 0V, 40V
1
25
2, 3
60
IC = 1mA, IB = 100A
1
0.1
V
IC = 100A
1
2
nV/ Hz
VCESAT
BVCEO
en
Conditions 1/
Subgroup
Limit
Min
40
IC=1mA,
fO = 10Hz
7
VCB=0V
fO = 100Hz
1
fO = 1000Hz
1
fO = 10KHz
1
TABLE I NOTES:
1/
2/
VCB = 15V; IC = 10A, unless otherwise specified.
100(I B )hFE min
Current gain match (hFE) is defined as: h FE 
IC
3/
4/
Measured at IC = 10A and guaranteed by design over 1A IC  1mA.
ICC and ICES are verified by measurement of ICBO.
5/
Guaranteed by VOS test
nA
V


 TCVOS  OS for VOS  VBE  T = 298°K for TA = +25°C.
T


MAT02
4.1
Electrical Test Requirements:
Table II
Test Requirements
Subgroups (in accordance
with MIL-PRF-38535,
Table III)
Interim Electrical Parameters
1
Final Electrical Parameters
1, 2, 3 1/ 2/
Group A Test Requirements
1, 2, 3, 7
Group C end-point electrical parameters
1 2/
Group D end-point electrical parameters
1
Group E end-point electrical parameters
1
1/ PDA applies to Subgroup 1. Delta's excluded from PDA.
2/ See Table III for delta parameters. See table I for conditions.
4.2
5.0
Table III. Burn-in test delta limits.
TEST
TITLE
hFE @ 1mA
hFE @ 100A
BURN-IN
ENDPOINT
500
500
Table III
LIFE TEST
ENDPOINT
420
410
hFE @ 10A
400
300
±100
hFE @ 1A
300
180
±120
IOS
0.6
1.1
±0.5
DELTA
LIMIT
±80
±90
Life Test/Burn-In Circuit:
5.1
HTRB is not applicable for this drawing.
5.2
Burn-in is per MIL-STD-883 Method 1015 test condition B.
5.3
Steady state life test is per MIL-STD-883 Method 1005.
UNITS
nA
MAT02
Rev
A
B
C
D
E
F
G
Description of Change
Date
Initiate
Aug. 29, 2000
Correct typo at Dice temperature range, change RC package JC from Jan. 7, 2002
18 to 35°C/W, correct typo’s on table I (subscript), make correction
to Table I note 3 (change from “Measured at IC = 10mA and guaranteed by
design over 10mA IC  1mA” to “Measured at IC = 10A and guaranteed by
design over 1A IC  1mA”), add subgroup 7 for en, add subgroup 7 to
table II, delete subgroups 4, 5, 6 from table II.
Update web address. Delete burn-in and rad circuits
June 20, 2003
Update package offering
Oct. 10, 2007
Update header/footer & add to 1.0 Scope description.
Feb. 25,2008
Remove operating junction temperature line and change to Dice
March 31, 2008
Junction Temperature (TJ...150°C)
MAT02-913H – removed because its obsolete
Sept. 23, 2014
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