Military & Space Products 128K x 8 STATIC RAM—SOI HX6228 FEATURES RADIATION OTHER • Fabricated with RICMOS™ IV Silicon on Insulator (SOI) 0.7 µm Process (Leff = 0.55 µm) • Read/Write Cycle Times ≤ 16 ns (Typical) ≤ 25 ns (-55 to 125°C) • Total Dose Hardness through 1x106 rad(SiO2) 14 • Typical Operating Power <25 mW/MHz -2 • Neutron Hardness through 1x10 cm • Asynchronous Operation • Dynamic and Static Transient Upset Hardness through 1x1011 rad (Si)/s • CMOS or TTL Compatible I/O • Dose Rate Survivability through <1x1012 rad(Si)/s • Single 5 V ± 10% Power Supply • Soft Error Rate of <1x10-10 upsets/bit-day in Geosynchronous Orbit • Packaging Options - 32-Lead Flat Pack (0.820 in. x 0.600 in.) - 40-Lead Flat Pack (0.775 in. x 0.710 in.) • No Latchup GENERAL DESCRIPTION The 128K x 8 Radiation Hardened Static RAM is a high performance 131,072 word x 8-bit static random access memory with industry-standard functionality. It is fabricated with Honeywell’s radiation hardened technology, and is designed for use in systems operating in radiation environments. The RAM operates over the full military temperature range and requires only a single 5 V ± 10% power supply. The RAM is wire bond programmable for either TTL or CMOS compatible I/O. Power consumption is typically less than 25 mW/MHz in operation, and less than 5 mW in the low power disabled mode. The RAM read operation is fully asynchronous, with an associated typical access time of 15 ns at 5V. Honeywell’s enhancedSOI RICMOS™IV (Radiation Insensitive CMOS) technology is radiation hardened through the use of advanced and proprietary design, layout and process hardening techniques. The RICMOS™ IV process is an advanced 5-volt, SIMOX CMOS technology with a 150 Å gate oxide and a minimum feature size of 0.7 µm (0.55 µm effective gate length—Leff). Additional features include Honeywell’s proprietary SHARP planarization process, and a lightly doped drain (LDD) structure for improved short channel reliability. A 7 transistor (7T) memory cell is used for superior single event upset hardening, while three layer metal power bussing and the low collection volume SIMOX substrate provide improved dose rate hardening. HX6228 FUNCTIONAL DIAGRAM A:3-7,12,14-16 131,072 x 8 Memory Array • • • Row Decoder 9 CE NCS • • • Column Decoder Data Input/Output NWE 8 8 DQ:0-7 WE • CS • CE NOE NWE • CS • CE • OE Signal (0 = high Z) A:0-2, 8-11, 13 1 = enabled # Signal All controls must be enabled for a signal to pass. (#: number of buffers, default = 1) 8 SIGNAL DEFINITIONS A: 0-16 Address input pins which select a particular eight-bit word within the memory array. DQ: 0-7 Bidirectional data pins which serve as data outputs during a read operation and as data inputs during a write operation. NCS Not chip select, when at a low level allows normal operation. When at a high level NCS forces the SRAM to a precharge condition, holds the data output drivers in a high impedance state and disables all the input buffers except CE. If this signal is not used it must be connected to VSS. NWE Negative write enable, when at a low level activates a write operation and holds the data output drivers in a high impedance state. When at a high level NWE allows normal read operation. NOE Negative output enable, when at a high level holds the data output drivers in a high impedance state. When at a low level, the data output driver state is defined by NCS, NWE and CE. If this signal is not used it must be connected to VSS. CE Chip enable, when at a high level allows normal operation. When at a low level CE forces the SRAM to a precharge condition, holds the data output drivers in a high impedance state and disables all the input buffers except the NCS input buffer. If this signal is not used it must be connected to VDD. TRUTH TABLE CE NCS NWE NOE MODE DQ H L H L Read Data Out H L L X Write Data In X H XX XX Deselected High Z L X XX XX Disabled High Z 2 Notes: X: VI=VIH or VIL XX: VSS≤VI≤VDD NOE=H: High Z output state maintained for NCS=X, CE=X, NWE=X HX6228 RADIATION CHARACTERISTICS Total Ionizing Radiation Dose The SRAM will meet all stated functional and electrical specifications over the entire operating temperature range after the specified total ionizing radiation dose. All electrical and timing performance parameters will remain within specifications after rebound at VDD = 5.5 V and T =125°C extrapolated to ten years of operation. Total dose hardness is assured by wafer level testing of process monitor transistors and RAM product using 10 KeV X-ray and Co60 radiation sources. Transistor gate threshold shift correlations have been made between 10 KeV X-rays applied at a dose rate of 1x105 rad(SiO2)/min at T = 25°C and gamma rays (Cobalt 60 source) to ensure that wafer level X-ray testing is consistent with standard military radiation test environments. The SRAM will meet any functional or electrical specification after exposure to a radiation pulse up to the transient dose survivability specification,when applied under recommended operating conditions. Note that the current conducted during the pulse by the RAM inputs, outputs, and power supply may significantly exceed the normal operating levels. The application design must accommodate these effects. Neutron Radiation The SRAM will meet any functional or timing specification after exposure to the specified neutron fluence under recommended operating or storage conditions. This assumes an equivalent neutron energy of 1 MeV. Soft Error Rate Transient Pulse Ionizing Radiation The SRAM is capable of writing, reading, and retaining stored data during and after exposure to a transient ionizing radiation pulse up to the specified transient dost rate upset specification, when applied under recommended operating conditions. To ensure validity of all specified performance parameters before, during, and after radiation (timing degradation during transient pulse radiation is ≤20%), it is suggested that stiffening capacitance be placed on or near the package VDD and VSS, with a maximum inductance between the package (chip) and stiffening capacitance of 0.7 nH per part. If there are no operate-through or valid stored data requirements, typical circuit board mounted de-coupling capacitors are recommended. The SRAM is capable of meeting the specified Soft Error Rate (SER), under recommended operating conditions. This hardness level is defined by the Adams 90% worst case cosmic ray environment for geosynchronous orbits. Latchup The SRAM will not latch up due to any of the above radiation exposure conditions when applied under recommended operating conditions. Fabrication with the SIMOX substrate material provides oxide isolation between adjacent PMOS and NMOS transistors and eliminates any potential SCR latchup structures. Sufficient transistor body tie connections to the p- and n-channel substrates are made to ensure no source/drain snapback occurs. RADIATION HARDNESS RATINGS (1) Parameter Units Limits (2) Total Dose ≥1x106 rad(SiO2) Transient Dose Rate Upset (3) ≥1x1011 rad(Si)/s Transient Dose Rate Survivability ≥1x1012 rad(Si)/s Soft Error Rate <1x10-10 upsets/bit-day Neutron Fluence ≥1x1014 N/cm2 Test Conditions TA=25°C Pulse width ≤1 µs Pulse width ≤50 ns, X-ray, VDD=6.0 V, TA=25°C TA=125°C, Adams 90% worst case environment 1 MeV equivalent energy, Unbiased, TA=25°C (1) Device will not latch up due to any of the specified radiation exposure conditions. (2) Operating conditions (unless otherwise specified): VDD=4.5 V to 5.5 V, -55°C to 125°C. (3) Applies to 40-lead flat pack only. Assume ≥1x1009 rad(Si))/s for 32-lead flat pack. Stiffening capacitance is suggested for optimum expected dose rate upset performance as stated above. 3 HX6228 ABSOLUTE MAXIMUM RATINGS (1) Rating Symbol Parameter Min Max Units VDD Supply Voltage Range (2) -0.5 6.5 V VPIN Voltage on Any Pin (2) -0.5 VDD+0.5 V TSTORE Storage Temperature (Zero Bias) -65 150 °C TSOLDER Soldering Temperature (5 Seconds) 270 °C PD Maximum Power Power Dissipation (3) 2.5 W IOUT DC or Average Output Current 25 mA VPROT ESD Input Protection Voltage (4) ΘJC Thermal Resistance (Jct-to-Case) TJ Junction Temperature 1500 V 2 °C/W 175 °C (1) Stresses in excess of those listed above may result in permanent damage. These are stress ratings only, and operation at these levels is not implied. Frequent or extended exposure to absolute maximum conditions may affect device reliability. (2) Voltage referenced to VSS. (3) RAM power dissipation (IDDSB + IDDOP) plus RAM output driver power dissipation due to external loading must not exceed this specification. (4) Class 1 electrostatic discharge (ESD) input protection. Tested per MIL-STD-883, Method 3015 by DESC certified lab. RECOMMENDED OPERATING CONDITIONS Description Parameter Symbol Min Typ Max Units VDD Supply Voltage (referenced to VSS) 4.5 5.0 5.5 V TA Ambient Temperature -55 25 125 °C VPIN Voltage on Any Pin (referenced to VSS) -0.3 VDD+0.3 V CAPACITANCE (1) Worst Case Symbol Parameter Typical Min Max Units Test Conditions CI Input Capacitance 6 7 pF VI=VDD or VSS, f=1 MHz CO Output Capacitance 8 9 pF VIO=VDD or VSS, f=1 MHz (1) This parameter is tested during initial design characterization only. DATA RETENTION CHARACTERISTICS Symbol Parameter VDR Data Retention Voltage (3) IDR Data Retention Current Typical (1) Worst Case (2) Min 2.5 200 Units Test Conditions Max V 1.0 mA NCS=VDR VI=VDR or VSS NCS=VDD=VDR VI=VDR or VSS (1) Typical operating conditions: TA= 25°C, pre-radiation. (2) Worst case operating conditions: TA= -55°C to +125°C, past total dose at 25°C. (3) To maintain valid data storage during transient radiation, VDD must be held within the recommended operating range. 4 HX6228 DC ELECTRICAL CHARACTERISTICS Symbol Typical Worst Case (2) (1) Min Max Parameter Units Test Conditions 0.4 2.0 mA IDDSBMF Standby Supply Current - Deselected 0.4 2.0 mA IDDOPW Dynamic Supply Current, Selected (Write) 4.5 6.0 mA IDDOPR Dynamic Supply Current, Selected (Read) 2.8 4.5 mA VIH=VDD, IO=0, VIL=VSS, f=0MHz NCS=VDD, IO=0, f=40 MHz, f=1 MHz, IO=0, CE=VIH=VDD NCS=VIL=VSS (3) f=1 MHz, IO=0, CE=VIH=VDD NCS=VIL=VSS (3) II Input Leakage Current -5 +5 µA VSS≤VI≤VDD IOZ Output Leakage Current -10 +10 µA VSS≤VIO≤VDD Output=high Z VIL Low-Level Input Voltage 0.3xVDD V V March Pattern VDD = 4.5V V V March Pattern VDD = 5.5V V V VDD = 4.5V, IOL = 10 mA VDD = 4.5V, IOL = 200 µA V V VDD = 4.5V, IOH = -5 mA VDD = 4.5V, IOH = -200 µA IDDSB VIH Static Supply Current High-Level Input Voltage CMOS TTL 1.7 CMOS TTL 3.2 0.8 0.7xVDD 2.2 VOL Low-Level Output Voltage 0.3 0.005 VOH High-Level Output Voltage 4.3 4.5 0.4 0.1 4.2 VDD-0.1 (1) Typical operating conditions: VDD= 5.0 V,TA=25°C, pre-radiation. (2) Worst case operating conditions: VDD=4.5 V to 5.5 V, -55°C to +125°C, post total dose at 25°C. (3) All inputs switching. DC average current. 2.9 V Vref1 + - Valid high output 249 DUT output Vref2 + - Valid low output C L >50 pF* *CL = 5 pF for TWLQZ, TSHQZ, TELQZ, and TGHQZ Tester Equivalent Load Circuit 5 HX6228 READ CYCLE AC TIMING CHARACTERISTICS (1) Worst Case (3) Symbol Parameter Typical -55 to 125°C (2) Min 25 Units Max TAVAVR Address Read Cycle Time 16 ns TAVQV Address Access Time 15 TAXQX Address Change to Output Invalid Time 12 TSLQV Chip Select Access Time 16 TSLQX Chip Select Output Enable Time 12 TSHQZ Chip Select Output Disable Time 5 10 ns TEHQV Chip Enable Access Time 16 25 ns TEHQX Chip Enable Output Enable Time 12 TELQZ Chip Enable Output Disable Time 6 10 ns TGLQV Output Enable Access Time 4 9 ns TGLQX Output Enable Output Enable Time 4 TGHQZ Output Enable Output Disable Time 4 25 3 ns ns 25 5 ns ns 5 ns 2 ns 9 ns (1) Test conditions: input switching levels VIL/VIH=0.5V/VDD-0.5V (CMOS), VIL/VIH=0V/3V (TTL), input rise and fall times <1 ns/V, input and output timing reference levels shown in the Tester AC Timing Characteristics table, capacitive output loading CL >50 pF, or equivalent capacitive output loading CL=5 pF for TSHQZ, TELQZ TGHQZ. For CL >50 pF, derate access times by 0.02 ns/pF (typical). (2) Typical operating conditions: VDD=5.0 V, TA=25°C, pre-radiation. (3) Worst case operating conditions: VDD=4.5 V to 5.5 V, -55°C to 125°C, post total dose at 25°C. TAVAVR ADDRESS TAVQV TSLQV TAXQX NCS TSLQX DATA OUT TSHQZ HIGH IMPEDANCE DATA VALID TEHQX TEHQV CE TELQZ TGLQX TGLQV TGHQZ NOE (NWE = high) 6 HX6228 WRITE CYCLE AC TIMING CHARACTERISTICS (1) Worst Case (3) Symbol Parameter Typical TAVAVW Write Cycle Time (4) -55 to 125°C Units (2) Min Max 13 25 ns TWLWH Write Enable Write Pulse Width 9 20 ns TSLWH Chip Select to End of Write Time 12 20 ns TDVWH Data Valid to End of Write Time 9 15 ns TAVWH Address Valid to End of Write Time 10 20 ns TWHDX Data Hold Time after End of Write Time 0 0 ns TAVWL Address Valid Setup to Start of Write Time 0 0 ns TWHAX Address Valid Hold after End of Write Time 0 0 ns TWLQZ Write Enable to Output Disable Time 5 0 TWHQX Write Disable to Output Enable Time 12 5 ns TWHWL Write Recovery Time 4 5 ns TEHWH Chip Enable to End of Write Time 11 20 ns 9 ns (1) Test conditions: input switching levels VIL/VIH=0.5V/VDD-0.5V (CMOS), VIL/VIH=0V/3V (TTL), input rise and fall times <1 ns/V, input and output timing reference levels shown in the Tester AC Timing Characteristics table, capacitive output loading >50 pF, or equivalent capacitive load of 5 pF for TWLQZ. (2) Typical operating conditions: VDD=5.0 V, TA=25°C, pre-radiation. (3) Worst case operating conditions: VDD=4.5 V to 5.5 V, -55 to 125°C, post total dose at 25°C. (4) TAVAVW = TWLWH + TWHWL. TAVAVW ADDRESS TAVWH TWHAX TAVWL TWHWL TWLWH NWE TWLQZ DATA OUT TWHQX HIGH IMPEDANCE TDVWH DATA IN DATA VALID TSLWH NCS TEHWH CE 7 TWHDX HX6228 DYNAMIC ELECTRICAL CHARACTERISTICS Read Cycle Write Cycle The RAM is asynchronous in operation, allowing the read cycle to be controlled by address, chip select (NCS), or chip enable (CE) (refer to Read Cycle timing diagram). To perform a valid read operation, both chip select and output enable (NOE) must be low and chip enable and write enable (NWE) must be high. The output drivers can be controlled independently by the NOE signal. Consecutive read cycles can be executed with NCS held continuously low, and with CE held continuously high, and toggling the addresses. The write operation is synchronous with respect to the address bits, and control is governed by write enable (NWE), chip select (NCS), or chip enable (CE) edge transitions (refer to Write Cycle timing diagrams). To perform a write operation, both NWE and NCS must be low, and CE must be high. Consecutive write cycles can be performed with NWE or NCS held continuously low, or CE held continuously high. At least one of the control signals must transition to the opposite state between consecutive write operations. For an address activated read cycle, NCS and CE must be valid prior to or coincident with the activating address edge transition(s). Any amount of toggling or skew between address edge transitions is permissible; however, data outputs will become valid TAVQV time following the latest occurring address edge transition. The minimum address activated read cycle time is TAVAV. When the RAM is operated at the minimum address activated read cycle time, the data outputs will remain valid on the RAM I/O until TAXQX time following the next sequential address transition. The write mode can be controlled via three different control signals: NWE, NCS, and CE. All three modes of control are similar except the NCS and CE controlled modes actually disable the RAM during the write recovery pulse. Both CE and NCS fully disable the RAM decode logic and input buffers for power savings. Only the NWE controlled mode is shown in the table and diagram on the previous page for simplicity; however, each mode of control provides the same write cycle timing characteristics. Thus, some of the parameter names referenced below are not shown in the write cycle table or diagram, but indicate which control pin is in control as it switches high or low. To control a read cycle with NCS, all addresses and CE must be valid prior to or coincident with the enabling NCS edge transition. Address or CE edge transitions can occur later than the specified setup times to NCS, however, the valid data access time will be delayed. Any address edge transition, which occurs during the time when NCS is low, will initiate a new read access, and data outputs will not become valid until TAVQV time following the address edge transition. Data outputs will enter a high impedance state TSHQZ time following a disabling NCS edge transition. To write data into the RAM, NWE and NCS must be held low and CE must be held high for at least TWLWH/TSLSH/ TEHEL time. Any amount of edge skew between the signals can be tolerated, and any one of the control signals can initiate or terminate the write operation. For consecutive write operations, write pulses must be separated by the minimum specified TWHWL/TSHSL/TELEH time. Address inputs must be valid at least TAVWL/TAVSL/TAVEH time before the enabling NWE/NCS/CE edge transition, and must remain valid during the entire write time. A valid data overlap of write pulse width time of TDVWH/TDVSH/TDVEL, and an address valid to end of write time of TAVWH/ TAVSH/TAVEL also must be provided for during the write operation. Hold times for address inputs and data inputs with respect to the disabling NWE/NCS/CE edge transition must be a minimum of TWHAX/TSHAX/TELAX time and TWHDX/TSHDX/TELDX time, respectively. The minimum write cycle time is TAVAV. To control a read cycle with CE, all addresses and NCS must be valid prior to or coincident with the enabling CE edge transition. Address or NCS edge transitions can occur later than the specified setup times to CE; however, the valid data access time will be delayed. Any address edge transition which occurs during the time when CE is high will initiate a new read access, and data outputs will not become valid until TAVQV time following the address edge transition. Data outputs will enter a high impedance state TELQZ time following a disabling CE edge transition. 8 HX6228 TESTER AC TIMING CHARACTERISTICS Input Levels* TTL I/O Configuration CMOS I/O Configuration 3V VDD-0.5 V 1.5 V VDD/2 0V 0.5 V VDD/2 1.5 V Output Sense Levels VDD-0.4V 0.4 V High Z VDD-0.4V High Z 0.4 V 3.4 V High Z 2.4 V High Z = 2.9V High Z 3.4 V 2.4 V High Z = 2.9V * Input rise and fall times <1 ns/V QUALITY AND RADIATIONHARDNESS ASSURANCE Honeywell maintains a high level of product integrity through process control, utilizing statistical process control, a complete “Total Quality Assurance System,” a computer data base process performance tracking system, and a radiation hardness assurance strategy. procurement by eliminating the need to create detailed specifications and offer benefits of improved quality and cost savings through standardization. RELIABILITY The radiation hardness assurance strategy starts with a technology that is resistant to the effects of radiation. Radiation hardness is assured on every wafer by irradiating test structures as well as SRAM product, and then monitoring key parameters which are sensitive to ionizing radiation. Conventional MIL-STD-883 TM 5005 Group E testing, which includes total dose exposure with Cobalt 60, may also be performed as required. This Total Quality approach ensures our customers of a reliable product by engineering in reliability, starting with process development and continuing through product qualification and screening. Honeywell understands the stringent reliability requirements that space and defense systems require and has extensive experience in reliability testing on programs of this nature. This experience is derived from comprehensive testing of VLSI processes. Reliability attributes of the RICMOS™ process were characterized by testing specially designed irradiated and non-irradiated test structures from which specific failure mechanisms were evaluated. These specific mechanisms included, but were not limited to, hot carriers, electromigration and time dependent dielectric breakdown. This data was then used to make changes to the design models and process to ensure more reliable products. SCREENING LEVELS Honeywell offers several levels of device screening to meet your system needs. “Engineering Devices” are available with limited performance and screening for breadboarding and/or evaluation testing. Hi-Rel Level B and S devices undergo additional screening per the requirements of MIL-STD-883. As a QML supplier, Honeywell also offers QML Class Q and V devices per MIL-PRF38535 and are available per the applicable Standard Microcircuits Drawing (SMD). QML devices offer ease of In addition, the reliability of the RICMOS™ process and product in a military environment was monitored by testing irradiated and non-irradiated circuits in accelerated dynamic life test conditions. Packages are qualified for product use after undergoing Groups B & D testing as outlined in MIL-STD-883, TM 5005, Class S. The product is qualified by following a screening and testing flow to meet the customer’s requirements. Quality conformance testing is performed as an option on all production lots to ensure the ongoing reliability of the product. 9 HX6228 PACKAGING The 128K x 8 SOI SRAM is offered in a custom 32-lead or 40-lead Flat Pack. The package is constructed of multilayer ceramic (Al2O3) and features internal power and ground planes. Ceramic chip capacitors can be mounted to the package by the user to maximize supply noise decoupling and increase 40-LEAD FLAT PACK PINOUT 32-LEAD FLAT PACK PINOUT NC A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 DQ1 DQ2 VSS 1 32 2 31 3 4 5 6 7 8 9 10 11 12 13 14 15 16 30 29 28 27 26 25 24 23 22 21 20 19 18 17 Top View board packing density. These capacitors effectively attach to the internal package power and ground planes. This design minimizes resistance and inductance of the bond wire and package, both of which are critical in a transient radiation environment. All NC (no connect) pins should be connected to VSS to prevent charge build up in the radiation environment. VDD A15 CE NWE A13 A8 A9 A11 NOE A10 NCS DQ7 DQ6 DQ5 DQ4 DQ3 A16 VSS VDD A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 DQ1 DQ2 NC VDD VSS NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 Top View 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 A15 VSS VDD NWE CE A13 A8 A9 A11 NOE A10 NCS DQ7 DQ6 DQ5 DQ4 DQ3 VDD VSS NC 32-LEAD FLAT PACK Optional capacitors in cutout E 1 22018533-001 Z b (width) TOP VIEW F e S L Q A Cutout Area V E2 Ceramic Body C VDD 1 BOTTOM VIEW D (pitch) Kovar Lid [4] All dimensions in inches VDD VSS U Y X W Lead Alloy 42 [1] [2] [3] [4] E3 10 A b C D e E E2 E3 F L Q S U V W X Y Z 0.135 ± 0.015 0.017 ± 0.002 0.004 to 0.009 0.820 ± 0.008 0.050 ± 0.005 [1] 0.600 ± 0.008 0.500 ± 0.008 0.040 ref 0.750 ± 0.005 [2] 0.295 min [3] 0.026 to 0.045 0.035 ± 0.010 0.080 ref 0.380 ref 0.050 ref 0.075 ref 0.010 ref 0.135 ref BSC - Basic lead spacing between centers Where lead is brazed to package Parts delivered with leads unformed Lid connected to VSS HX6228 40-LEAD FLAT PACK E 1 22019370-001 D 20 S 40 40 Top View b (width) 21 21 e (pitch) L Ceramic Body All dimensions are in inches Kovar Lid [3] A I C X N (Pedestal) Capacitor Pads G A Non-Conductive Tie-Bar Bottom View F H Z 0.131 ± .015 0.008 ± 0.002 0.006 ± 0.0015 0.710 ±0.010 0.775 ± 0.007 0.025 ± 0.004 0.475 ± 0.005 0.760 ± 0.008 0.135 ± 0.005 0.030 ± 0.005 0.285 ± 0.015 0.050 ± 0.004 0.1175 ref 0.064 ref 0.006 ref 0.028 ref 0.125 ref 0.500 ± 0.005 0.140 ref [1] Parts delivered with leads unformed [2] At tie bar [3] Lid tied to VSS W V T A b c D E e F G H I L N S T U V W X Z U 11 HX6228 DYNAMIC BURN-IN DIAGRAM* STATIC BURN-IN DIAGRAM* R R R R R R R R R R R R R R 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 NC A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 DQ1 DQ2 VSS VDD A15 CE NWE A13 A8 A9 A11 NOE A10 NCS DQ7 DQ6 DQ5 DQ4 DQ3 VDD 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 R R R R R R R R R R R R R R R NC F18 F19 F0 F15 F12 F11 F10 F19 F9 F19 F1 F1 F1 F1 F1 R R R R R R R R R R R R R R 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 VDD = 5.6V, R ≤ 10 KΩ, VIH = VDD, VIL = VSS Ambient Temperature ≥ 125 °C, F0 ≥ 100 KHz Sq Wave Frequency of F1 = F0/2, F2 = F0/4, F3 = F0/8, etc. NC A16 A14 A12 A7 A6 A5 A4 A3 A2 A1 A0 DQ0 DQ1 DQ2 VSS 128K x 8 SRAM 1 F17 F16 F7 F6 F5 F4 F3 F2 F8 F13 F14 F1 F1 F1 128K x 8 SRAM VDD VDD A15 CE NWE A13 A8 A9 A11 NOE A10 NCS DQ7 DQ6 DQ5 DQ4 DQ3 32 31 30 29 28 27 26 R R R R R R 25 R 24 R 23 R 22 21 20 19 18 17 R R R R R R VDD = 5.5V, R ≤ 10 KΩ Ambient Temperature ≥ 125 °C *40-Lead Flat Pack burn-in diagrams have similar connections and are available upon request. ORDERING INFORMATION (1) H 6228 X PART NUMBER PROCESS X=SOI SOURCE H=HONEYWELL T S C R SCREEN LEVEL V=QML Class V Q=QML Class Q S=Level S B=Level B E=Engr Device (2) PACKAGE DESIGNATION T=32-Lead FP A=40-Lead FP K=Known Good Die - =Bare die (No Package) TOTAL DOSE INPUT HARDNESS BUFFER TYPE R=1x105 rad(SiO2) C=CMOS Level F=3x105 rad(SiO2) T=TTL Level H=1x106 rad(SiO2) N=No Level Guaranteed (1) Orders may be faxed to 612-954-2051. For technical assistance, contact our Customer Logistics Department at 612-954-2888. (2) Engineering Device description: Parameters are tested from -55 to 125°C, 24 hr burn-in, IDDSB = 10mA, no radiation guaranteed. Contact Factory with other needs. To learn more about Honeywell Solid State Electronics Center, visit our web site at http://www.ssec.honeywell.com Honeywell reserves the right to make changes to any products or technology herein to improve reliability, function or design. Honeywell does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights nor the rights of others. Helping You Control Your World 900156 2/97