Intersil ISL89168FRTAZ High speed, dual channel, 6a, power mosfet driver with programmable delay Datasheet

High Speed, Dual Channel, 6A, Power MOSFET Driver
With Programmable Delays
ISL89166, ISL89167, ISL89168
Features
The ISL89166, ISL89167, and ISL89168 are high-speed, 6A,
dual channel MOSFET drivers. These parts are similar to the
ISL89160, ISL89161, ISL89162 drivers but use the NC pins for
programming the rising edge time delays of the outputs used for
dead time control.
• Dual output, 6A peak current (sink and source)
As an alternative to using external RC circuits for time delays, the
programmable delays on the RDTA and RDTB pins allows the
user to delay the rising edge of the respective outputs just by
connecting an appropriate resistor value between these pins and
ground. The accuracy and temperature characteristics of the
time delays are specified freeing the user of the need to select
appropriate external resistors and capacitors that traditionally
are applied to the logic inputs to delay the output edges.
• Hysteretic logic inputs for high noise immunity
At high switching frequencies, these MOSFET drivers use very
little internal bias currents. Separate, non-overlapping drive
circuits are used to drive each CMOS output FET to prevent
shoot-thru currents in the output stage.
• Switch mode power supplies
The undervoltage lockout (UV) insures that driver outputs remain
off (low) during turn-on until VDD is sufficiently high for correct
logic control. This prevents unexpected glitches when VDD is
being turn-on or turn-off.
• Clock/Line Driver
• Typical ON-resistance <1Ω
• Specified Miller plateau drive currents
• Very low thermal impedance (θJC = 3°C/W)
• Programmable output rising edge delays using only a resistor.
• ~ 20ns rise and fall time driving a 10nF load.
• Low operating bias currents
Applications
• Synchronous Rectifier (SR) Driver
• Motor Drives, Class D amplifiers, UPS, Inverters
• Pulse Transformer Driver
350
VDD
300
RDTA
RDTB
8
GND
INB
7
2
EPAD
3
6
4
5
+125°C (WORST CASE)
250
OUTA
DELAY (ns)
1
INA
OUTB
4.7µF
200
150
+25°C (TYPICAL)
100
50
-40°C (WORST CASE)
0
0
5
10
15
20
RDT (2k to 20k)
FIGURE 1. TYPICAL APPLICATION
January 14, 2011
FN7720.0
1
FIGURE 2. PROGRAMMABLE TIME DELAYS
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 | Copyright Intersil Americas Inc. 2011. All Rights Reserved
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
ISL89166, ISL89167, ISL89168
Block Diagram
VDD
Separate FET drives, with
non-overlapping outputs,
prevent shoot-thru
currents in the output
CMOS FETs resulting with
very low operating
currents.
The UV comparator holds off
the outputs until VDD ~>
3.3VDC.
For clarity, only one
channel is shown
RDTx
RDTx
ISL89166
rising
edge
delay
INx
OUTx
10k
EPAD
ISL89167,
ISL89168
GND
For proper thermal and electrical
performance, the EPAD must be
connected to the PCB ground plane.
Pin Configurations
ISL89167FR, ISL89167FB
(8 LD TDFN, EPSOIC)
TOP VIEW
ISL89166FR, ISL89166FB
(8 LD TDFN, EPSOIC)
TOP VIEW
RDTA 1
8 RDTB
RDTA 1
8 RDTB
INA 2
7 OUTA
/INA 2
7 OUTA
GND 3
6 VDD
INB 4
5 OUTB
Pin Descriptions
PIN
NUMBER
SYMBOL
DESCRIPTION
1
RDTA
Connect a resistor between this pin and
ground to program the rising edge delay of
OUTA, 0k to 20k
GND 3
6 VDD
2
/INB 4
5 OUTB
3
4
ISL89168FR, ISL89168FB
(8 LD TDFN, EPSOIC)
TOP VIEW
RDTA 1
8 RDTB
/INA 2
7 OUTA
GND 3
6 VDD
INB 4
5 OUTB
2
INA or /INA Channel A input, 0V to VDD
GND
Power Ground, 0V
INB or /INB Channel B enable, 0V to VDD
5
OUTB
Channel B output
6
VDD
Power input, 4.5V to 16V
7
OUTA
Channel A output, 0V to VDD
8
RDTB
Connect a resistor between this pin and
ground to program the rising edge delay of
OUTB, 0k to 20k
EPAD
Power Ground, 0V
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
Ordering Information
PART NUMBER
(Notes 1, 2, 3)
PART MARKING
TEMP RANGE (°C)
INPUT CONFIGURATION
PACKAGE
(Pb-Free)
PKG.
DWG. #
ISL89166FRTAZ
166A
-40 to +125
non-inverting
8 Ld 3x3 TDFN
L8.3x3I
ISL89167FRTAZ
167A
-40 to +125
inverting
8 Ld 3x3 TDFN
L8.3x3I
ISL89168FRTAZ
168A
-40 to +125
inverting + non-inverting
8 Ld 3x3 TDFN
L8.3x3I
ISL89166FBEAZ
89166 FBEAZ
-40 to +125
non-inverting
8 Ld EPSOIC
M8.15D
ISL89167FBEAZ
89167 FBEAZ
-40 to +125
inverting
8 Ld EPSOIC
M8.15D
ISL89168FBEAZ
89168 FBEAZ
-40 to +125
inverting + non-inverting
8 Ld EPSOIC
M8.15D
NOTES:
1. Add “-T*”, suffix for tape and reel. Please refer to TB347 for details on reel specifications.
2. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100% matte
tin plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil
Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
3. For Moisture Sensitivity Level (MSL), please see device information page for ISL89166, ISL89167, ISL89168. For more information on MSL, please
see Technical Brief TB363.
3
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
Absolute Maximum Ratings
Thermal Information
Supply Voltage, VDD Relative to GND . . . . . . . . . . . . . . . . . . . . -0.3V to 18V
Logic Inputs (INA, INB) . . . . . . . . . . . . . . . . . . . . . . GND - 0.3v to VDD + 0.3V
Outputs (OUTA, OUTB) . . . . . . . . . . . . . . . . . . . . . . GND - 0.3v to VDD + 0.3V
Average Output Current (Note 6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 150mA
ESD Ratings
Human Body Model Class 2 (Tested per JESD22-A114E) . . . . . . . . 2000V
Machine Model Class B (Tested per JESD22-A115-A) . . . . . . . . . . . . 200V
Charged Device Model Class IV. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000V
Thermal Resistance (Typical)
θJA (°C/W) θJC (°C/W)
8 Ld TDFN Package (Notes 4, 5). . . . . . . . .
44
3
8 Ld EPSOIC Package (Notes 4, 5) . . . . . . .
42
3
Max Power Dissipation at +25°C in Free Air . . . . . . . . . . . . . . . . . . . . . 2.27W
Max Power Dissipation at +25°C with Copper Plane . . . . . . . . . . . . . 33.3W
Storage Temperature Range. . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Operating Junction Temp Range . . . . . . . . . . . . . . . . . . . .-40°C to +125°C
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Latch-Up
(Tested per JESD-78B; Class 2, Level A)
Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .500 mA
Maximum Recommended Operating
Conditions
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . .-40°C to +125°C
Supply Voltage, VDD Relative to GND. . . . . . . . . . . . . . . . . . . . . .4.5V to 16V
Logic Inputs (INA, INB) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to VDD
Outputs (OUTA, OUTB) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to VDD
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty
NOTES:
4. θJA is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See Tech
Brief TB379 for details.
5. For θJC, the “case temp” location is the center of the exposed metal pad on the package underside.
6. The average output current, when driving a power MOSFET or similar capacitive load, is the average of the rectified output current. The peak output
currents of this driver are self limiting by transconductance or rDS(ON) and do not required any external components to minimize the peaks. If the
output is driving a non-capacitive load, such as an LED, maximum output current must be limited by external means to less than the specified
absolute maximum.
DC Electrical Specifications
VDD = 12V, GND = 0V, No load on OUTA or OUTB, RDTA = RDTB = 0kΩ unless otherwise specified.
Boldface limits apply over the operating junction temperature range, -40°C to +125°C.
TJ = +25°C
PARAMETERS
TJ = -40°C to +125°C
MIN
TYP
MAX
MIN
(Note 7)
MAX
(Note 7)
UNITS
-
-
-
4.5
16
V
INx = GND
-
5
-
-
-
mA
INA = INB = 1MHz, square wave
-
25
-
-
-
mA
-
3.3
-
-
-
-
~25
-
-
-
mV
-
-
-
GND
VDD
V
SYMBOL
TEST CONDITIONS
POWER SUPPLY
Voltage Range
VDD
VDD Quiescent Current
IDD
UNDERVOLTAGE
VDD Undervoltage Lock-out
(Note 9)
VUV
INA = INB = True (Note 10)
Hysteresis
V
INPUTs
Input Range for INA, INB
VIN
Logic 0 Threshold
for INA, INB
VIL
Nominally 37% x 3.3V
-
1.22
-
1.12
1.32
V
Logic 1 Threshold
for INA, INB
VIH
Nominally 63% x 3.3V
-
2.08
-
1.98
2.18
V
Input Capacitance of
INA, INB (Note 8)
CIN
-
2
-
-
-
pF
4
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
DC Electrical Specifications
VDD = 12V, GND = 0V, No load on OUTA or OUTB, RDTA = RDTB = 0kΩ unless otherwise specified.
Boldface limits apply over the operating junction temperature range, -40°C to +125°C. (Continued)
TJ = +25°C
PARAMETERS
SYMBOL
Input Bias Current
for INA, INB
IIN
TEST CONDITIONS
GND<VIN<VDD
TJ = -40°C to +125°C
MIN
TYP
MAX
MIN
(Note 7)
MAX
(Note 7)
UNITS
-
-
-
-10
+10
µA
OUTPUTS
High Level Output Voltage
VOHA VOHB
-
-
-
VDD - 0.1
VDD
V
Low Level Output Voltage
VOLA
VOLB
-
-
-
GND
GND + 0.1
V
Peak Output Source Current
IO
VO (initial) = 0V, CLOAD = 10nF
-
-6
-
-
-
A
Peak Output Sink Current
IO
VO (initial) =12V, CLOAD = 10nF
-
+6
-
-
-
A
NOTES:
7. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
8. This parameter is taken from the simulation models for the input FET. The actual capacitance on this input will be dominated by the PCB parasitic
capacitance.
9. A 200µs delay further inhibits the release of the output state when the UV positive going threshold is crossed.
10. The true state of a specific part number is defined by the input logic symbol.
AC Electrical Specifications
VDD = 12V, GND = 0V, No Load on OUTA or OUTB, RDTA = RDTB = 0kΩ unless Otherwise
Specified. Boldface limits apply over the operating junction temperature range, -40°C to +125°C.
TJ = +25°C
PARAMETERS
SYMBOL
TEST CONDITIONS
/NOTES
TJ = -40°C to +125°C
MIN
TYP
MAX
MIN
(Note 7)
MAX
(Note 7)
UNITS
Output Rise Time (see Figure 4)
tR
CLOAD = 10 nF,
10% to 90%
-
20
-
-
40
ns
Output Fall Time (see Figure 4)
tF
CLOAD = 10 nF,
90% to 10%
-
20
-
-
40
ns
Output Rising Edge Propagation Delay (see Figure 3)
tRDLY
RDTx = 0kΩ
-
25
-
-
50
ns
Output Falling Edge Propagation Delay (see Figure 3)
(Note 12)
tFDLY
RDTx = 0kΩ
-
25
-
-
50
ns
Rising Propagation Matching (see Figure 3)
tRM
RDTx = 0kΩ
-
<1ns
-
-
-
ns
Falling Propagation Matching (see Figure 3)
tFM
RDTx = 0kΩ
-
<1ns
-
-
-
ns
tRTDLY20
RTx = 20kΩ,
No load
-
266
-
237
297
ns
RTx = 2.0kΩ, No
load
-
42
-
29
58
ns
-IMP
VDD = 10V,
VMILLER = 5V
-
6
-
-
-
A
-IMP
VDD = 10V,
VMILLER = 3V
-
4.7
-
-
-
A
-IMP
VDD = 10V,
VMILLER= 2V
-
3.7
-
-
-
A
Rising edge timer delay (Note 11)
tRTDLY2
Miller Plateau Sink Current
(See Test Circuit Figure 5)
5
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
AC Electrical Specifications
VDD = 12V, GND = 0V, No Load on OUTA or OUTB, RDTA = RDTB = 0kΩ unless Otherwise
Specified. Boldface limits apply over the operating junction temperature range, -40°C to +125°C. (Continued)
TJ = +25°C
PARAMETERS
SYMBOL
Miller Plateau Source Current
(See Test Circuit Figure 6)
TEST CONDITIONS
/NOTES
TJ = -40°C to +125°C
MIN
TYP
MAX
MIN
(Note 7)
MAX
(Note 7)
UNITS
IMP
VDD = 10V,
VMILLER = 5V
-
5.2
-
-
-
A
IMP
VDD = 10V,
VMILLER = 3V
-
5.8
-
-
-
A
IMP
VDD = 10V,
VMILLER = 2V
-
6.9
-
-
-
A
NOTE:
11. The rising edge delay timer increases the propagation delay for values of RDELx > 2.0kΩ. Time delays for RT < 2.0kΩ and RTx > 20kΩ are not
specified and are not recommended. The resistors tolerances (including the boundary values of 2.0kΩ and 20.0kΩ) are recommended to be 1% or
better.
12. The falling edge propagation delays are independent of the RDT value.
Test Waveforms and Circuits
3.3V
63%
37%
INA, INB
0V
tRDLY
tFDLY
90%
/OUTA
OUTA
tRDLY
OUTA
OR
OUTB
tFDLY
10%
tR
/OUTB
tF
OUTB
tRM
tFM
FIGURE 3. PROP DELAYS AND MATCHING
FIGURE 4. RISE/FALL TIMES
10V
10V
ISL8916x
ISL8916x
0.1µF
0.1µF
10k
10k
VMILLER
VMILLER
10µF
200ns
10µF
200ns
+ISENSE
+ISENSE
10nF
10nF
50m
-ISENSE
FIGURE 5. MILLER PLATEAU SINK CURRENT TEST CIRCUIT
6
50m
-ISENSE
FIGURE 6. MILLER PLATEAU SOURCE CURRENT TEST CIRCUIT
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
Test Waveforms and Circuits (Continued)
10V
Current through
0.1Ω Resistor
IM P
0A
V M ILLER
V OUT
V OUT
V M ILLER
Current through
0.1Ω Resistor
-IM P
0
0V
200ns
200ns
FIGURE 7. MILLER PLATEAU SINK CURRENT
FIGURE 8. MILLER PLATEAU SOURCE CURRENT
Typical Performance Curves
3.5
35
1MHz BIAS CURRENT (mA)
STATIC BIAS CURRENT (mA)
+125°C
+125°C
3.0
+25°C
-40°C
2.5
30
+25°C
25
-40°C
20
15
10
2.0
4
8
12
5
16
4
8
12
VDD
16
VDD
FIGURE 10. IDD vs VDD (1 MHz)
FIGURE 9. IDD vs VDD (STATIC)
1.1
50
16V
VOUT LOW
1.0
40
NO LOAD
0.9
rDS(ON) (Ω)
IDD (mA)
10V
30
12V
20
5V
0.7
10
0
VOUT HIGH
0.8
0.6
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
FREQUENCY (MHz)
FIGURE 11. IDD vs FREQUENCY (+25°C)
7
1.8
2.0
0.5
-45
-20
5
30
55
80
105
130
TEMPERATURE (°C)
FIGURE 12. rDS(ON) vs TEMPERATURE
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
Typical Performance Curves (Continued)
25
3.0
FALL TIME, CLOAD = 10nF
2.5
2.0
RISE/FALL TIME (ns)
INPUT LOGIC THRESHOLDS (3.3V)
3.5
POSITIVE THRESHOLD
1.5
NEGATIVE THRESHOLD
1.0
20
RISE TIME, CLOAD = 10nF
0.5
0.0
-45
-20
5
30
55
80
105
15
-45
130
-20
5
TEMPERATURE (°C)
30
55
80
105
130
TEMPERATURE (°C)
FIGURE 13. INPUT THRESHOLDS
FIGURE 14. OUTPUT RISE/FALL TIME
30
350
+125°C (WORST CASE)
OUTPUT FALLING PROP DELAY
250
25
OUTPUT RISING PROP DELAY
DELAY (ns)
PROPAGATION DELAY (ns)
300
200
150
+25°C (TYPICAL)
20
100
-40°C (WORST CASE)
50
15
5
7
9
11
13
15
VDD
FIGURE 15. PROPAGATION DELAY vs VDD
Functional Description
Overview
The ISL89166, ISL89167, ISL89168 drivers incorporate several
features including precision input logic thresholds, undervoltage
lock-out, fast rising high output drive currents and programmable
rising edge output delays.
The programmable delays require only a resistor connecter
between the RDTA or RDTB pins and ground. This is a useful
feature to create dead times for bridge applications to prevent
shoot-through or for synchronous rectifier applications to adjust
the timing.
To prevent unexpected glitches on the output of the ISL89166,
ISL89167, ISL89168 during power-on or power-off when VDD is
very low, the Undervoltage (UV) lock-out prevents the outputs of
the ISL89166, ISL89167, ISL89168 driver from turning on. The
UV lock-out forces the driver outputs to be low when VDD < ~3.2
VDC regardless of the input logic level.
0
0
5
10
15
RDT (2k to 20k)
20
FIGURE 16. PROPAGATION DELAY vs RDT
input capacitance of the driven FET. The switching transition
period at the Miller plateau is also minimized by the high drive
currents. (See the specified Miller plateau currents in the AC
Electrical Specifications on page 5).
Application Information
Programming Rising Edge Delays
As compared to setting the output delays of a driver using an
resistor, capacitor and diode on the logic inputs, programming
the rising edge output delays of the ISL89166, ISL89167,
ISL89168 is almost trivial.
All that is necessary is to select the required resistor value from
the Propagation Delay vs RDT graph, Figure 16. Unlike using an
RCD network, the operating tolerances over temperature are
specified. If a traditional RCD network (Figure 18) is used on the
input logic, then it is necessary to account for the tolerance of the
logic input threshold, the tolerances of R and C, and their
temperature sensitivity.
Fast rising (or falling) output drive current of the ISL89166,
ISL89167, ISL89168 minimizes the turn-on (off) delay due to the
8
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
12
INx
Vgs GATE-SOURCE VOLTAGE (V)
RDTx
OUTx
ISL89166
FIGURE 17. SETTING DELAYS A RESISTOR
D
INx
Rdel
OUTx
cdel
ISL89160
10
VDS = 64V
8
VDS = 40V
6
4
2
0
0
2
4
6
8
10 12 14 16 18 20 22 24
Qg, GATE CHARGE (nC)
FIGURE 19. MOSFET GATE CHARGE vs GATE VOLTAGE
FIGURE 18. SETTING DELAYS WITH A RCD NETWORK
Equation 1 shows calculating the power dissipation of the driver:
Power Dissipation of the Driver
The power dissipation of the ISL89166, ISL89167, ISL89168 is
dominated by the losses associated with the gate charge of the
driven bridge FETs and the switching frequency. The internal bias
current also contributes to the total dissipation but is usually not
significant as compared to the gate charge losses.
Figure 19 illustrates how the gate charge varies with the gate
voltage in a typical power MOSFET. In this example, the total gate
charge for Vgs = 10V is 21.5nC when VDS = 40V. This is the
charge that a driver must source to turn-on the MOSFET and
must sink to turn-off the MOSFET.
R gate
P D = 2 • Q c • freq • V GS • ------------------------------------------ + I DD ( freq ) • V DD
R
+r
gate
DS ( ON )
(EQ. 1)
Where:
freq = Switching frequency,
VGS = VDD bias of the ISL89166, ISL89167, ISL89168
Qc = Gate charge for VGS
IDD(freq) = Bias current at the switching frequency (see Figure 9)
rDS(ON) = ON-resistance of the driver
Rgate = External gate resistance (if any).
Note that the gate power dissipation is proportionally shared with
the external gate resistor. When sizing an external gate resistor,
do not overlook the power dissipated by this resistor.
Typical Application Circuit
Vbridge
ZVS Full Bridge
SQR
PWM
L
R
L
QUL
VGUL
U1A
QUR
VGUR
SQR
ISL89162
LL
T2
T1A
VGLL
T1B
U1B
QLL
½ ISL89166
VGUL
Red dashed lines
emphasize the
resonant switching LL
delay of the lowside bridge FETs
LR
VGLR
VGLL
U2A
QLR
VGLR
½ ISL89166
U2B
LR
LL: lower left
LR: lower right
UL: upper left
UR: upper right
GLL: gate lower left
VGUR
9
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
The Typical Application Circuit is an example of how the
ISL89166, ISL89167, ISL89168, MOSFET drivers can be applied
in a zero voltage switching full bridge. Two main signals are
required: a 50% duty cycle square wave (SQR) and a PWM signal
synchronized to the edges of the SQR input. An ISL89162 is used
to drive T1 with alternating half cycles driving QUL and QUR. An
ISL89166 is used to drive QLL and QLR also with alternating half
cycles. Unlike the two high side bridge FETs, the two low-side
bridge FETs are turned on with a rising edge delay. The delay is
setup by resistors connected to RDTA and RDTB pins of the
ISL89166. The duration of the delay is chosen to turn on the lowside FETs when the voltage on their respective drains is at the
resonant valley.
General PCB Layout Guidelines
The AC performance of the ISL89166, ISL89167, ISL89168
depends significantly on the design of the PC board. The
following layout design guidelines are recommended to achieve
optimum performance:
• Place the driver as close as possible to the driven power FET.
• Understand where the switching power currents flow. The high
amplitude di/dt currents of the driven power FET will induce
significant voltage transients on the associated traces.
• Keep power loops as short as possible by paralleling the
source and return traces.
• Use planes where practical; they are usually more effective
than parallel traces.
• Avoid paralleling high amplitude di/dt traces with low level
signal lines. High di/dt will induce currents and consequently,
noise voltages in the low level signal lines.
• When practical, minimize impedances in low level signal
circuits. The noise, magnetically induced on a 10k resistor, is
10x larger than the noise on a 1k resistor.
that source the input signals to the ISL89166, ISL89167,
ISL89168.
• Avoid having a signal ground plane under a high amplitude
dv/dt circuit. This will inject di/dt currents into the signal
ground paths.
• Do power dissipation and voltage drop calculations of the
power traces. Many PCB/CAD programs have built in tools for
calculation of trace resistance.
• Large power components (Power FETs, Electrolytic caps, power
resistors, etc.) will have internal parasitic inductance which
cannot be eliminated.
This must be accounted for in the PCB layout and circuit
design.
• If you simulate your circuits, consider including parasitic
components especially parasitic inductance.
General EPAD Heatsinking
Considerations
The thermal pad is electrically connected to the GND supply
through the IC substrate. The epad of the ISL89166, ISL89167,
ISL89168 has two main functions: to provide a quiet GND for the
input threshold comparators and to provide heat sinking for the
IC. The EPAD must be connected to a ground plane and no
switching currents from the driven FET should pass through the
ground plane under the IC.
Figure 20 is a PCB layout example of how to use vias to remove
heat from the IC through the epad.
EPAD GND
PLANE
EPAD GND
PLANE
• Be aware of magnetic fields emanating from transformers and
inductors. Gaps in these structures are especially bad for
emitting flux.
• If you must have traces close to magnetic devices, align the
traces so that they are parallel to the flux lines to minimize
coupling.
• The use of low inductance components such as chip resistors
and chip capacitors is highly recommended.
• Use decoupling capacitors to reduce the influence of parasitic
inductance in the VDD and GND leads. To be effective, these
caps must also have the shortest possible conduction paths. If
vias are used, connect several paralleled vias to reduce the
inductance of the vias.
• It may be necessary to add resistance to dampen resonating
parasitic circuits especially on OUTA and OUTB. If an external
gate resistor is unacceptable, then the layout must be
improved to minimize lead inductance.
COMPONENT
LAYER
BOTTOM
LAYER
FIGURE 20. TYPICAL PCB PATTERN FOR THERMAL VIAS
For maximum heatsinking, it is recommended that a ground
plane, connected to the EPAD, be added to both sides of the PCB.
A via array, within the area of the EPAD, will conduct heat from
the EPAD to the gnd plane on the bottom layer. The number of
vias and the size of the GND planes required for adequate
heatsinking is determined by the power dissipated by the
ISL89166, ISL89167, ISL89168, the air flow and the maximum
temperature of the air around the IC.
• Keep high dv/dt nodes away from low level circuits. Guard
banding can be used to shunt away dv/dt injected currents
from sensitive circuits. This is especially true for control circuits
10
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
Revision History
The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to web to make
sure you have the latest Rev.
DATE
REVISION
1/14/11
FN7720.0
CHANGE
Initial Release
Products
Intersil Corporation is a leader in the design and manufacture of high-performance analog semiconductors. The Company's products
address some of the industry's fastest growing markets, such as, flat panel displays, cell phones, handheld products, and notebooks.
Intersil's product families address power management and analog signal processing functions. Go to www.intersil.com/products for a
complete list of Intersil product families.
*For a complete listing of Applications, Related Documentation and Related Parts, please see the respective device information page
on intersil.com: ISL89166, ISL89167, ISL89168.
To report errors or suggestions for this datasheet, please go to www.intersil.com/askourstaff
FITs are available from our website at http://rel.intersil.com/reports/sear
11
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
Package Outline Drawing
L8.3x3I
8 LEAD THIN DUAL FLAT NO-LEAD PLASTIC PACKAGE
Rev 1 6/09
2X 1.950
3.00
B
0.15
8
5
3.00
(4X)
6X 0.65
A
1.64 +0.10/ - 0.15
6
PIN 1
INDEX AREA
6
PIN #1 INDEX AREA
1
4
4
8X 0.30
8X 0.400 ± 0.10
TOP VIEW
0.10 M C A B
2.38
+0.10/ - 0.15
BOTTOM VIEW
SEE DETAIL "X"
( 2.38 )
( 1.95)
0.10 C
Max 0.80
C
0.08 C
SIDE VIEW
( 8X 0.60)
(1.64)
( 2.80 )
PIN 1
C
0 . 2 REF
5
(6x 0.65)
0 . 00 MIN.
0 . 05 MAX.
( 8 X 0.30)
DETAIL "X"
TYPICAL RECOMMENDED LAND PATTERN
NOTES:
1.
Dimensions are in millimeters.
Dimensions in ( ) for Reference Only.
2. Dimensioning and tolerancing conform to AMSE Y14.5m-1994.
3.
Unless otherwise specified, tolerance : Decimal ± 0.05
4.
Dimension applies to the metallized terminal and is measured
between 0.15mm and 0.30mm from the terminal tip.
5. Tiebar shown (if present) is a non-functional feature.
6.
12
The configuration of the pin #1 identifier is optional, but must be
located within the zone indicated. The pin #1 identifier may be
either a mold or mark feature.
FN7720.0
January 14, 2011
ISL89166, ISL89167, ISL89168
Small Outline Exposed Pad Plastic Packages (EPSOIC)
M8.15D
N
INDEX
AREA
H
0.25(0.010) M
8 LEAD NARROW BODY SMALL OUTLINE EXPOSED PAD
PLASTIC PACKAGE
B M
E
INCHES
-B-
1
2
SYMBOL
3
TOP VIEW
L
SEATING PLANE
-A-
A
D
-C-
α
e
A1
B
0.25(0.010) M
C
0.10(0.004)
C A M
B S
SIDE VIEW
MILLIMETERS
MAX
MIN
MAX
NOTES
A
0.059
0.067
1.52
1.72
-
A1
0.003
0.009
0.10
0.25
-
B
0.0138
0.0192
0.36
0.46
9
C
0.0075
0.0098
0.19
0.25
-
D
0.189
0.196
4.80
4.98
3
E
0.150
0.157
3.811
3.99
4
e
h x 45°
MIN
0.050 BSC
1.27 BSC
-
H
0.230
0.244
5.84
6.20
-
h
0.010
0.019
0.25
0.50
5
L
0.016
0.050
0.41
1.27
6
8°
0°
N
α
8
0°
8
7
8°
-
P
0.118
0.137
3.00
3.50
11
P1
0.078
0.099
2.00
2.50
11
Rev. 0 5/07
NOTES:
1
2
3
1. Symbols are defined in the “MO Series Symbol List” in Section
2.2 of Publication Number 95.
2. Dimensioning and tolerancing per ANSI Y14.5M-1982.
P1
3. Dimension “D” does not include mold flash, protrusions or gate
burrs. Mold flash, protrusion and gate burrs shall not exceed
0.15mm (0.006 inch) per side.
4. Dimension “E” does not include interlead flash or protrusions.
Interlead flash and protrusions shall not exceed 0.25mm (0.010
inch) per side.
N
P
BOTTOM VIEW
5. The chamfer on the body is optional. If it is not present, a visual
index feature must be located within the crosshatched area.
6. “L” is the length of terminal for soldering to a substrate.
7. “N” is the number of terminal positions.
8. Terminal numbers are shown for reference only.
9. The lead width “B”, as measured 0.36mm (0.014 inch) or greater
above the seating plane, shall not exceed a maximum value of
0.61mm (0.024 inch).
10. Controlling dimension: MILLIMETER. Converted inch
dimensions are not necessarily exact.
11. Dimensions “P” and “P1” are thermal and/or electrical enhanced
variations. Values shown are maximum size of exposed pad
within lead count and body size.
For additional products, see www.intersil.com/product_tree
Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted
in the quality certifications found at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
13
FN7720.0
January 14, 2011
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