FAIRCHILD QTLP660CIR

QTLP660CIR
1.8mm DOME LENS
EMITTING DIODE
QTLP660CIR
PACKAGE DIMENSIONS
0.134 (3.40)
0.118 (3.00)
Ø0.075 (1.9)
Ø0.067 (1.7)
0.102 (2.6)
0.087 (2.2)
0.091 (2.3)
0.083 (2.1)
TOP
R0.004 (0.1)
5°
7°
0.024 (0.6)
0.016 (0.4)
0.106 (2.7)
0.098 (2.5)
SIDE
0.028 (0.7)
0.020 (0.5)
0.079 (2.0)
BOTTOM
+
POLARITY
NOTE:
Dimensions for all drawings are in inches (mm).
FEATURES
•
•
•
•
•
•
1.8mm Dome Lens Package
Available in 0.315” (8mm) width tape on 7” (178mm) diameter reel; 2,000 units per reel
Narrow Emission Angle, 30°
Wavelength = 940 nm, GaAs
Water Clear Lens
Matched Photosensor: QTLP660CPDF
© 2003 Fairchild Semiconductor Corporation
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3/5/03
QTLP660CIR
1.8mm DOME LENS
EMITTING DIODE
QTLP660CIR
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
Symbol
Rating
Unit
TOPR
-40 to +85
°C
TSTG
-40 to +90
°C
Operating Temperature
Storage Temperature
(Iron)(1,2,3)
TSOL-I
240 for 5 sec
°C
Soldering Temperature (Flow)(1,2)
TSOL-F
260 for 10 sec
°C
Continuous Forward Current
IF
65
mA
Reverse Voltage
VR
5
V
PD
130
mW
IFD
1.0
A
Soldering Temperature
Power
Dissipation(4)
Peak Forward Current (Pulse width = 100µs, Duty Cycle=1%)
Notes:
1. RMA flux is recommended.
2. Methanol or isopropyl alcohols are recommended as cleaning agents.
3. Soldering iron tip at 1/16" (1.6mm) from housing
4. At 25°C or below
ELECTRICAL / OPTICAL CHARACTERISTICS (TA =25°C)
PARAMETER
TEST CONDITIONS
SYMBOL
MIN.
TYP.
MAX.
UNITS
Peak Emission Wavelength
IF = 20 mA
λP
—
940
—
nm
Emission Angle
IF = 20 mA
Θ
—
±15
—
Deg.
—
1.2
1.5
—
1.4
1.85
—
2.6
4.0
—
—
100
1.0
3.0
—
—
14
—
—
140
—
IF = 20 mA
Forward Voltage
IF = 100 mA, tP = 100 µs, Duty Cycle = 0.01
VF
IF = 1 A, tP = 100 µs, Duty Cycle = 0.01
Reverse Current
VR = 5 V
IR
IF = 20 mA
Radiant Intensity
IF = 100 mA, tP = 100 µs, Duty Cycle = 0.01
Ee
IF = 1 A, tP = 100 µs, Duty Cycle = 0.01
V
µA
mW/sr
Rise Time
IF = 100 mA,
tr
—
1
—
µs
Fall Time
tP = 20 ms
tf
—
1
—
µs
© 2003 Fairchild Semiconductor Corporation
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QTLP660CIR
1.8mm DOME LENS
EMITTING DIODE
QTLP660CIR
TYPICAL PERFORMANCE CURVES
Fig. 2 Relative Radiant Intensity vs.
Wavelength
Fig. 1 Forward Current vs.
Ambient Temperature
100
IF = 20 mA
TA = 25˚C
Relative Radiant Intensity (%)
Forward Current IF (mA)
140
120
100
80
60
40
20
0
-25
0
20
40
60
80
80
60
40
20
100
0
880 900 920 940 960 980 1000 1020 1040
Ambient Temperature (°C)
Wavelengthl λ (nm)
Fig. 4 Forward Current vs.
Forward Voltage
104
980
Forward Current IF (mA)
Peak Emission Wavelength (nm)
Fig. 3 Peak Emission Wavelength vs.
Ambient Temperature
960
940
920
900
-25
0
25
50
75
tp=100µs
Duty Cycle=0.01
3
10
102
100
Ambient Temperature TA (°C)
101
0
1
3
4
Forward Voltage (V)
Fig. 5 Relative Intensity vs.
Ambient Temperature (°C)
5
Fig. 6 Relative Radiant Intensity vs.
Angular Displacement
30°
3
Relative Radiant Intensity
Ie - Radiant Intensity (mW/sr)
2
IF=20mA
1
0.1
25
50
75
© 2003 Fairchild Semiconductor Corporation
100
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10°
0°
10°
20°
30°
1.0
40°
0.9
50°
0.8
60°
0.7
70°
80°
0.6
120
20°
0.4
0.2
0
0.2
0.4
0.6
3/5/03
QTLP660CIR
1.8mm DOME LENS
EMITTING DIODE
QTLP660CIR
TYPICAL PERFORMANCE CURVES
Fig. 7 Relative Intensity vs.
Forward Current
Ie–Radiant Intensity (mW/sr)
1000
100
10
1
100
101
102
103
104
IF – Forward Current (mA)
© 2003 Fairchild Semiconductor Corporation
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3/5/03
QTLP660CIR
1.8mm DOME LENS
EMITTING DIODE
QTLP660CIR
RECOMMENDED PRINTED CIRCUIT BOARD PATTERN
0.079 (2.00)
0.098 (2.50)
0.098 (2.50)
0.098 (2.50)
RECOMMENDED IR REFLOW SOLDERING PROFILE
5 sec MAX
soldering time
240° C MAX
+5° C/s MAX
-5° C/s MAX
60 - 120 sec
Preheating
120 - 150° C MAX
© 2003 Fairchild Semiconductor Corporation
Page 5 of 7
3/5/03
QTLP660CIR
1.8mm DOME LENS
EMITTING DIODE
QTLP660CIR
TAPE AND REEL DIMENSIONS
13.2±1.5
2.5±0.5
Ø178.0±1.0
Ø60.2±0.5
2.5±0.5
16.0±0.2
Ø13.0±0.5
2.0±0.05
4.0
1.55±0.05
4.0
Polarity
2.6
3.4±0.1
5.5
0.230±0.1
12.0
1.75
Progressive direction
2.75
Dimensional tolerance is ± 0.1mm unless otherwise specified
Angle: ± 0.5
Unit: mm
© 2003 Fairchild Semiconductor Corporation
Page 6 of 7
3/5/03
QTLP660CIR
1.8mm DOME LENS
EMITTING DIODE
QTLP660CIR
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO
ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME
ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES
OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR
CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
© 2003 Fairchild Semiconductor Corporation
2. A critical component in any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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