Vishay IRFIB7N50LPBF Power mosfet Datasheet

IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Super Fast Body Diode Eliminates the Need for
External Diodes in ZVS Applications
500
RDS(on) (Ω)
VGS = 10 V
0.320
Qg (Max.) (nC)
92
Qgs (nC)
24
Qgd (nC)
44
Configuration
• Lower Gate Charge Results in Simpler Drive
Reqirements
RoHS
COMPLIANT
• Enhanced dV/dt Capabilities Offer Improved
Ruggedness
Single
• Higher Gate Voltage Threshold Offers Improved Noise
Immunity
D
TO-220 FULLPAK
• Lead (Pb)-free
APPLICATIONS
G
•
•
•
•
S
G D S
Zero Voltage Switching SMPS
Telecom and Server Power Supplies
Uninterruptible Power Supplies
Motor Control Applications
N-Channel MOSFET
ORDERING INFORMATION
Package
TO-220 FULLPAK
IRFIB7N50LPbF
SiHFIB7N50L-E3
Lead (Pb)-free
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltage
VDS
500
Gate-Source Voltage
VGS
± 30
VGS at 10 V
Continuous Drain Current
Pulsed Drain
TC = 25 °C
ID
TC = 100 °C
Currenta
IDM
Linear Derating Factor
Single Pulse Avalanche
Energyb
UNIT
V
6.8
4.3
A
27
0.37
W/°C
mJ
EAS
550
Avalanche Currenta
IAR
6.8
A
Repetitive Avalanche Energya
EAR
4.6
mJ
TC = 25 °C
Maximum Power Dissipation
PD
46
W
dV/dt
24
V/ns
TJ, Tstg
- 55 to + 150
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
Mounting Torque
for 10 s
6-32 or M3 screw
300d
°C
10
lbf · in
1.1
N·m
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 12).
b. Starting TJ = 25 °C, L = 24 mH, RG = 25 Ω, IAS = 6.8 A (see fig. 14).
c. ISD ≤ 6.8 A, dI/dt ≤ 650 A/µs, VDD ≤ VDS, dV/dt = 24 V/ns, TJ ≤ 150 °C.
d. 1.6 mm from case.
Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
WORK-IN-PROGRESS
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IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
65
Maximum Junction-to-Case (Drain)
RthJC
-
2.69
UNIT
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
VDS
VGS = 0 V, ID = 250 µA
500
-
-
V
ΔVDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.44
-
V/°C
VGS(th)
VDS = VGS, ID = 250 µA
3.0
-
5.0
V
VGS = ± 30 V
-
-
± 100
nA
VDS = 500 V, VGS = 0 V
-
-
50
µA
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
Gate-Source Threshold Voltage
Gate-Source Leakage
IGSS
Zero Gate Voltage Drain Current
IDSS
Drain-Source On-State Resistance
RDS(on)
Forward Transconductance
gfs
VDS = 400 V, VGS = 0 V, TJ = 125 °C
-
-
2.0
mA
-
0.32
0.38
Ω
VDS = 50 V, ID = 4.1 A
4.7
-
-
S
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
-
2220
-
-
230
-
-
23
-
VDS = 1.0 V, f = 1.0 MHz
-
2780
-
VDS = 400 V, f = 1.0 MHz
-
63
-
-
140
-
-
100
-
-
-
92
-
-
24
-
-
44
-
0.88
-
-
23
-
-
36
-
-
47
-
-
19
-
-
-
6.8
-
-
27
ID = 4.1 Ab
VGS = 10 V
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Coss
Effective Output Capacitance
Effective Output Capacitance
(Energy Related)
Coss eff.
VGS = 0 V
VDS = 0 V to 400 Vc
Coss eff. (ER)
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
Internal Gate Resistance
RG
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
VGS = 10 V
ID = 6.8 A, VDS = 400 V,
see fig. 7 and 16b
f = 1 MHz, open drain
td(on)
tr
td(off)
VGS = 10 V
VDD = 250 V, ID = 6.8 A,
RG = 9.0 Ω,
see fig. 11a and 11bb
tf
pF
nC
Ω
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulsed Diode Forward Currenta
Body Diode Voltage
IS
ISM
VSD
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
TJ = 25 °C, IS = 6.8 A, VGS = 0
S
Vb
-
-
1.5
85
130
Body Diode Reverse Recovery Time
trr
TJ = 25 °C, IF = 6.8 A,
TJ = 125 °C, dI/dt = 100 A/µsb
-
130
200
Body Diode Reverse Recovery Charge
Qrr
TJ = 25 °C, IS = 6.8 A,
TJ = 125 °C, dI/dt = 100 A/µsb
-
280
420
-
570
860
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2
V
ns
nC
Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
TJ = 25 °C
-
5.9
8.9
A
Drain-Source Body Diode Characteristics
Body Diode Reverse Recovery Current
IRRM
Forward Turn-On Time
ton
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 12).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDS.
Coss eff. (ER) is a fixed capacitance that stores the same energy as Coss while VDS is rising from 0 to 80 % VDS.
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
100
100
10
BOTTOM
ID, Drain-to-Source Current (Α)
ID, Drain-to-Source Current (A)
TOP
VGS
15V
10V
8.0V
7.0V
6.5V
6.0V
5.5V
5.0V
1
5.0V
0.1
TJ = 175°C
10
T J = 25°C
1
VDS = 50V
≤60μs PULSE WIDTH
≤60μs PULSE WIDTH
Tj = 25°C
0.1
0.01
0.1
1
10
3
100
V DS, Drain-to-Source Voltage (V)
5
6
7
8
9
VGS, Gate-to-Source Voltage (V)
Fig. 1 - Typical Output Characteristics
Fig. 3 - Typical Transfer Characteristics
100
10
BOTTOM
VGS
15V
10V
8.0V
7.0V
6.5V
6.0V
5.5V
5.0V
5.0V
1
≤60μs PULSE WIDTH
Tj = 150°C
0.1
RDS(on) , Drain-to-Source On Resistance
(Normalized)
3.0
TOP
ID, Drain-to-Source Current (A)
4
2.5
ID = 6.8A
VGS = 10V
2.0
1.5
1.0
0.5
0.0
0.1
1
10
100
-60 -40 -20
0
20
40
60
80 100 120 140 160
V DS, Drain-to-Source Voltage (V)
T J , Junction Temperature (°C)
Fig. 2 - Typical Output Characteristics
Fig. 4 - Normalized On-Resistance vs. Temperature
Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
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IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
100000
12.0
VGS = 0V,
f = 1 MHZ
C iss = C gs + C gd, C ds SHORTED
ID= 6.8A
C oss = C ds + C gd
10000
C, Capacitance(pF)
VGS, Gate-to-Source Voltage (V)
C rss = C gd
Ciss
1000
Coss
100
Crss
VDS= 400V
10.0
8.0
6.0
4.0
2.0
0.0
10
1
10
100
1000
0
10
20
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
40
50
60
70
Fig. 7 - Typical Gate Charge vs. Gate-to-Source Voltage
100.00
ISD, Reverse Drain Current (A)
12
10
8
Energy (μJ)
30
QG Total Gate Charge (nC)
VDS, Drain-to-Source Voltage (V)
6
4
10.00
T J = 150°C
1.00
T J = 25°C
0.10
2
VGS = 0V
0.01
0
0
50 100 150 200 250 300 350 400 450 500 550
0.0
0.2
0.4
0.6
0.8
1.0
1.2
VSD, Source-to-Drain Voltage (V)
VDS, Drain-to-Source Voltage (V)
Fig. 6 - Typical Output Capacitance Stored Energy vs. VDS
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Fig. 8 - Typical Source-Drain Diode Forward Voltage
Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
ID, Drain-to-Source Current (A)
100
VDS
OPERATION IN THIS AREA
LIMITED BY R (on)
DS
VGS
10
D.U.T.
RG
100μsec
RD
+
- VDD
10 V
1
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
DC
Fig. 11a - Switching Time Test Circuit
0.1
1msec
Tc = 25°C
Tj = 150°C
Single Pulse
10msec
VDS
0.01
1
10
100
1000
10000
90 %
VDS, Drain-to-Source Voltage (V)
Fig. 9 - Maximum Safe Operating Area
10 %
VGS
t d(on)
7
tr
t d(off) t f
Fig. 11b - Switching Time Waveforms
ID, Drain Current (A)
6
5
4
3
2
1
0
25
50
75
100
125
150
T C , Case Temperature (°C)
Fig. 10 - Maximum Drain Current vs. Case Temperature
Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
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IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
Thermal Response ( Z thJC )
10
D = 0.50
1
0.20
0.10
0.05
0.1
0.02
0.01
R1
R1
τJ
0.01
SINGLE PULSE
( THERMAL RESPONSE )
0.001
τJ
τ1
R2
R2
R3
R3
τC
τ
τ2
τ1
τ3
τ2
Ri (°C/W)
0.2965
τi (sec)
0.001144
0.9847
1.4118
0.151939
1.705500
τ3
Ci= τi/Ri
Ci i/Ri
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
0.0001
1E-006
1E-005
0.0001
0.001
0.01
0.1
1
10
100
t1 , Rectangular Pulse Duration (sec)
Fig. 12 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
2500
EAS , Single Pulse Avalanche Energy (mJ)
VGS(th) Gate threshold Voltage (V)
5.0
4.0
ID = 250μA
3.0
2.0
1.0
ID
1.4A
1.7A
BOTTOM 6.8A
TOP
2000
1500
1000
500
0
-75
-50
-25
0
25
50
75
100
125
150
25
50
75
100
125
150
T J , Temperature ( °C )
Starting T J , Junction Temperature (°C)
Fig. 13 - Threshold Voltage vs. Temperature
Fig. 14 - Maximum Avalanche Energy vs. Drain Current
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Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
QG
15 V
10 V
L
VDS
D.U.T
RG
+
A
- VDD
IAS
20 V
tp
QGS
Driver
Q GD
VG
A
0.01 Ω
Charge
Fig. 15a - Unclamped Inductive Test Circuit
Fig. 16a - Basic Gate Charge Waveform
Current regulator
Same type as D.U.T.
V DS
50 kΩ
tp
12 V
0.2 µF
0.3 µF
D.U.T.
+
V
- DS
VGS
3 mA
I AS
IG
ID
Current sampling resistors
Fig. 15b - Unclamped Inductive Waveforms
Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
Fig. 16b - Gate Charge Test Circuit
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IRFIB7N50L, SiHFIB7N50L
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
•
•
•
•
RG
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
Driver gate drive
P.W.
+
Period
D=
+
-
VDD
P.W.
Period
VGS = 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
Body diode
VDD
forward drop
Inductor current
Ripple ≤ 5 %
ISD
* VGS = 5 V for logic level devices
Fig. 17 - For N-Channel
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Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91177.
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Document Number: 91177
S-Pending-Rev. A, 24-Jun-08
Legal Disclaimer Notice
Vishay
Disclaimer
All product specifications and data are subject to change without notice.
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(collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained herein
or in any other disclosure relating to any product.
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therein, which apply to these products.
No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this
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Document Number: 91000
Revision: 18-Jul-08
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