Vishay IRFBC30APBF Power mosfet Datasheet

IRFBC30A, SiHFBC30A
Vishay Siliconix
Power MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
• Low Gate Charge Qg Results in Simple Drive
Requirement
600
RDS(on) (Ω)
VGS = 10 V
2.2
Qg (Max.) (nC)
23
Qgs (nC)
5.4
Qgd (nC)
Ruggedness
• Fully Characterized Capacitance and Avalanche Voltage
and Current
11
Configuration
Available
• Improved Gate, Avalanche and Dynamic dV/dt RoHS*
COMPLIANT
Single
• Effective Coss Specified
D
• Lead (Pb)-free Available
TO-220
APPLICATIONS
• Switch Mode Power Supply (SMPS)
G
• Uninterruptable Power Supply
• High Speed Power Switching
S
G
D
TYPICAL SMPS TOPOLOGY
S
• Single Transistor Flyback
N-Channel MOSFET
ORDERING INFORMATION
Package
TO-220
IRFBC30APbF
SiHFBC30A-E3
IRFBC30A
SiHFBC30A
Lead (Pb)-free
SnPb
ABSOLUTE MAXIMUM RATINGS TC = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
LIMIT
Drain-Source Voltage
VDS
600
Gate-Source Voltage
VGS
± 30
Continuous Drain Current
VGS at 10 V
TC = 25 °C
TC = 100 °C
Pulsed Drain Currenta
ID
IDM
Linear Derating Factor
Energyb
UNIT
V
3.6
2.3
A
14
0.69
W/°C
mJ
EAS
290
Repetitive Avalanche Currenta
IAR
3.6
A
Repetitive Avalanche Energya
EAR
7.4
mJ
Single Pulse Avalanche
Maximum Power Dissipation
TC = 25 °C
Peak Diode Recovery dV/dtc
Operating Junction and Storage Temperature Range
Soldering Recommendations (Peak Temperature)
Mounting Torque
for 10 s
6-32 or M3 screw
PD
74
W
dV/dt
7.0
V/ns
TJ, Tstg
- 55 to + 150
300d
°C
10
lbf · in
1.1
N·m
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Starting TJ = 25 °C, L = 41 mH, RG = 25 Ω, IAS = 3.6 A (see fig. 12).
c. ISD ≤ 3.6 A, dI/dt ≤ 170 A/µs, VDD ≤ VDS, TJ ≤ 150 °C.
d. 1.6 mm from case.
* Pb containing terminations are not RoHS compliant, exemptions may apply
Document Number: 91108
S-81243-Rev. A, 21-Jul-08
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IRFBC30A, SiHFBC30A
Vishay Siliconix
THERMAL RESISTANCE RATINGS
PARAMETER
SYMBOL
TYP.
MAX.
Maximum Junction-to-Ambient
RthJA
-
62
Case-to-Sink, Flat, Greased Surface
RthCS
0.50
-
Maximum Junction-to-Case (Drain)
RthJC
-
1.7
UNIT
°C/W
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
PARAMETER
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Static
Drain-Source Breakdown Voltage
VDS Temperature Coefficient
Gate-Source Threshold Voltage
VDS
VGS = 0 V, ID = 250 µA
600
-
-
V
ΔVDS/TJ
Reference to 25 °C, ID = 1 mA
-
0.67
-
V/°C
VGS(th)
VDS = VGS, ID = 250 µA
2.0
-
4.5
V
Gate-Source Leakage
IGSS
VGS = ± 30 V
-
-
± 100
nA
Zero Gate Voltage Drain Current
IDSS
VDS = 600 V, VGS = 0 V
-
-
25
VDS = 480 V, VGS = 0 V, TJ = 125 °C
-
-
250
Drain-Source On-State Resistance
Forward Transconductance
RDS(on)
gfs
ID = 2.2 Ab
VGS = 10 V
VDS = 50 V, ID = 2.2 Ab
µA
-
-
2.2
Ω
2.1
-
-
S
-
510
-
-
70
-
-
3.5
-
-
730
-
Dynamic
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
Output Capacitance
Effective Output Capacitance
Total Gate Charge
Coss
VGS = 0 V,
VDS = 25 V,
f = 1.0 MHz, see fig. 5
VDS = 1.0 V, f = 1.0 MHz
VGS = 0 V
Coss eff.
VDS = 480 V, f = 1.0 MHz
-
19
-
VDS = 0 V to 480 Vc
-
31
-
-
-
23
-
-
5.4
Qg
VGS = 10 V
ID = 3.6 A, VDS = 480 V
see fig. 6 and 13b
pF
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
-
-
11
Turn-On Delay Time
td(on)
-
9.8
-
-
13
-
-
19
-
-
12
-
-
-
3.6
-
-
14
-
-
1.6
-
400
600
ns
-
1.1
1.7
µC
Rise Time
Turn-Off Delay Time
Fall Time
tr
td(off)
VDD = 300 V, ID = 3.6 A,
RG = 12 Ω, RD = 82 Ω, see fig. 10b
tf
nC
ns
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
IS
Pulsed Diode Forward Currenta
ISM
Body Diode Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
Forward Turn-On Time
ton
MOSFET symbol
showing the
integral reverse
p - n junction diode
D
A
G
S
TJ = 25 °C, IS = 3.6 A, VGS = 0 Vb
TJ = 25 °C, IF = 3.6 A, dI/dt = 100 A/µsb
V
Intrinsic turn-on time is negligible (turn-on is dominated by LS and LD)
Notes
a. Repetitive rating; pulse width limited by maximum junction temperature (see fig. 11).
b. Pulse width ≤ 300 µs; duty cycle ≤ 2 %.
c. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80 % VDS.
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Document Number: 91108
S-81243-Rev. A, 21-Jul-08
IRFBC30A, SiHFBC30A
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
100
100
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
10
1
0.1
4.5V
20μs PULSE WIDTH
TJ = 25 °C
0.01
0.1
1
10
100
I D , Drain-to-Source Current (A)
I D , Drain-to-Source Current (A)
TOP
10
TJ = 150 ° C
1
TJ = 25 ° C
0.1
0.01
4.0
Fig. 1 - Typical Output Characteristics
I D , Drain-to-Source Current (A)
1
4.5V
20µs PULSE WIDTH
TJ = 150 ° C
10
100
RDS(on) , Drain-to-Source On Resistance
(Normalized)
3.0
VGS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
BOTTOM 4.5V
1
6.0
7.0
8.0
9.0
Fig. 3 - Typical Transfer Characteristics
TOP
0.1
0.1
5.0
VGS , Gate-to-Source Voltage (V)
VDS , Drain-to-Source Voltage (V)
10
V DS = 50V
20μs PULSE WIDTH
ID = 3.6A
2.5
2.0
1.5
1.0
0.5
0.0
-60 -40 -20
VGS = 10V
0
20
40
60
80 100 120 140 160
VDS , Drain-to-Source Voltage (V)
TJ , Junction Temperature ( °C)
Fig. 2 - Typical Output Characteristics
Fig. 4 - Normalized On-Resistance vs. Temperature
Document Number: 91108
S-81243-Rev. A, 21-Jul-08
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IRFBC30A, SiHFBC30A
Vishay Siliconix
VGS = 0V,
f = 1 MHZ
Ciss = Cgs + Cgd, Cds SHORTED
Crss = Cgd
Coss = Cds + Cgd
C, Capacitance(pF)
1000
Ciss
100
Coss
10
Crss
100
ISD , Reverse Drain Current (A)
10000
10
TJ = 150° C
TJ = 25 ° C
1
V GS = 0 V
1
1
10
100
0.1
0.4
1000
0.8
OPERATION IN THIS AREA LIMITED
BY RDS(on)
VDS = 480V
VDS = 300V
VDS = 120V
16
12
8
10us
10
100us
1
1ms
4
FOR TEST CIRCUIT
SEE FIGURE 13
0
4
8
12
16
20
24
0.1
10ms
TC = 25 ° C
TJ = 150 ° C
Single Pulse
10
100
1000
QG , Total Gate Charge (nC)
VDS , Drain-to-Source Voltage (V)
Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage
Fig. 8 - Maximum Safe Operating Area
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1.2
100
ID = 3.6A
0
1.0
Fig. 7 - Typical Source-Drain Diode Forward Voltage
ID , Drain Current (A)
VGS , Gate-to-Source Voltage (V)
20
0.6
VSD ,Source-to-Drain Voltage (V)
VDS, Drain-to-Source Voltage (V)
Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage
10000
Document Number: 91108
S-81243-Rev. A, 21-Jul-08
IRFBC30A, SiHFBC30A
Vishay Siliconix
RD
VDS
4.0
VGS
D.U.T.
ID , Drain Current (A)
RG
+
- VDD
3.0
10 V
Pulse width ≤ 1 µs
Duty factor ≤ 0.1 %
2.0
Fig. 10a - Switching Time Test Circuit
VDS
1.0
90 %
0.0
25
50
75
100
125
10 %
VGS
150
TC , Case Temperature ( ° C)
td(on)
td(off) tf
tr
Fig. 10b - Switching Time Waveforms
Fig. 9 - Maximum Drain Current vs. Case Temperature
Thermal Response (Z thJC )
10
1 D = 0.50
0.20
0.10
PDM
0.05
0.1
t1
0.02
0.01
t2
SINGLE PULSE
(THERMAL RESPONSE)
Notes:
1. Duty factor D = t 1 / t 2
2. Peak T J = P DM x Z thJC + TC
0.01
0.00001
0.0001
0.001
0.01
0.1
1
t1 , Rectangular Pulse Duration (sec)
Fig. 11 - Maximum Effective Transient Thermal Impedance, Junction-to-Case
VDS
15 V
L
VDS
D.U.T
RG
IAS
20 V
tp
tp
Driver
+
A
- VDD
0.01 Ω
Fig. 12a - Unclamped Inductive Test Circuit
Document Number: 91108
S-81243-Rev. A, 21-Jul-08
IAS
Fig. 12b - Unclamped Inductive Waveforms
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IRFBC30A, SiHFBC30A
EAS , Single Pulse Avalanche Energy (mJ)
Vishay Siliconix
700
ID
1.6A
2.3A
3.6A
TOP
600
BOTTOM
500
400
300
200
100
0
25
50
75
100
125
150
Starting TJ , Junction Temperature( ° C)
Fig. 12c - Maximum Avalanche Energy vs. Drain Current
QG
10 V
V DSav , Avalanche Voltage ( V )
740
QGS
QGD
VG
720
Charge
Fig. 13a - Basic Gate Charge Waveform
700
Current regulator
Same type as D.U.T.
680
50 kΩ
660
12 V
0.2 µF
0.3 µF
+
640
D.U.T.
0.0
1.0
2.0
3.0
-
VDS
4.0
IAV , Avalanche Current ( A)
VGS
3 mA
IG
ID
Current sampling resistors
Fig. 12d - Typical Drain-to-Source Voltage vs.
Avalanche Current
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Fig. 13b - Gate Charge Test Circuit
Document Number: 91108
S-81243-Rev. A, 21-Jul-08
IRFBC30A, SiHFBC30A
Vishay Siliconix
Peak Diode Recovery dV/dt Test Circuit
+
D.U.T
Circuit layout considerations
• Low stray inductance
• Ground plane
• Low leakage inductance
current transformer
+
-
-
•
•
•
•
RG
dV/dt controlled by RG
Driver same type as D.U.T.
ISD controlled by duty factor "D"
D.U.T. - device under test
Driver gate drive
P.W.
+
Period
D=
+
-
VDD
P.W.
Period
VGS = 10 V*
D.U.T. ISD waveform
Reverse
recovery
current
Body diode forward
current
dI/dt
D.U.T. VDS waveform
Diode recovery
dV/dt
Re-applied
voltage
VDD
Body diode forward drop
Inductor current
Ripple ≤ 5 %
ISD
* VGS = 5 V for logic level devices
Fig. 14 - For N-Channel
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see http://www.vishay.com/ppg?91108.
Document Number: 91108
S-81243-Rev. A, 21-Jul-08
www.vishay.com
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Vishay
Disclaimer
All product specifications and data are subject to change without notice.
Vishay Intertechnology, Inc., its affiliates, agents, and employees, and all persons acting on its or their behalf
(collectively, “Vishay”), disclaim any and all liability for any errors, inaccuracies or incompleteness contained herein
or in any other disclosure relating to any product.
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therein, which apply to these products.
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Document Number: 91000
Revision: 18-Jul-08
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