IDT ICS83026I-01 Low skew, 1-to-2 differential-to-lvcmos/lvttl fanout buffer Datasheet

ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
GENERAL DESCRIPTION
FEATURES
The ICS83026I-01 is a low skew, 1-to-2 Differential-toLVCMOS/LVTTL Fanout Buffer. The differential input can
accept most differential signal types (LVPECL, LVDS,
LVHSTL, HCSL and SSTL) and translate to two singleended LVCMOS/LVTTL outputs. The small 8-lead SOIC
footprint makes this device ideal for use in applications
with limited board space.
• Two LVCMOS / LVTTL outputs
• Differential CLK, nCLK input pair
• CLK, nCLK pair can accept the following differential
input levels: LVPECL, LVDS, LVHSTL, HCSL, SSTL
• Maximum output frequency: 350MHz
• Output skew: 15ps (maximum)
• Part-to-part skew: 600ps (maximum)
• Additive phase jitter, RMS: 0.03ps (typical)
• Small 8 lead SOIC package saves board space
• 3.3V core, 3.3V, 2.5V or 1.8V output operating supply
• -40°C to 85°C ambient operating temperature
• Available in both standard (RoHS 5) and lead-free RoHS
(6) packages
BLOCK DIAGRAM
PIN ASSIGNMENT
VDD
CLK
nCLK
OE
Q0
CLK
nCLK
1
2
3
4
8
7
6
5
VDDO
Q0
Q1
GND
ICS83026I-01
Q1
8-Lead SOIC
3.8mm x 4.8mm, x 1.47mm package body
M Package
Top View
OE
VDD
CLK
nCLK
OE
1
2
3
4
8
7
6
5
VDDO
Q0
Q1
GND
ICS83026I-01
8-Lead TSSOP
4.40mm x 3.0mm x 0.925mm
package body
G Package
Top View
83026BMI-01
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REV. A AUGUST 4, 2010
ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
TABLE 1. PIN DESCRIPTIONS
Number
Name
1
VDD
Power
Type
Description
2
CLK
Input
3
nCLK
Input
4
OE
Input
5
GND
Power
6
Q1
Output
Clock output. LVCMOS / LVTTL interface levels.
7
Q0
Output
Clock output. LVCMOS / LVTTL interface levels.
8
VDDO
Power
Output supply pin.
Positive supply pin.
Pulldown Non-inver ting differential clock input.
Pullup/
Inver ting differential clock input. VDD/2 default when left floating.
Pulldown
Output enable. When HIGH, outputs are enabled. When LOW, outputs are in
Pullup
High Impedance State. LVCMOS / LVTTL interface levels.
Power supply ground.
NOTE: Pullup and Pulldown refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
TABLE 2. PIN CHARACTERISTICS
Symbol
Parameter
CIN
Input Capacitance
CPD
Power Dissipation Capacitance
(per output)
RPULLUP
Input Pullup Resistor
RPULLDOWN
Input Pulldown Resistor
Test Conditions
Minimum
Typical
Maximum
Units
VDD, VDDO = 3.465V
17
pF
VDD = 3.465V, VDDO = 2.625V
16
pF
4
VDD = 3.465V, VDDO = 1.95V
Output Impedance
ROUT
pF
15
pF
51
kΩ
51
kΩ
VDD, VDDO = 3.3V
7
Ω
VDD = 3.3V, VDDO = 2.5V
8
Ω
VDD = 3.3V, VDDO = 1.8V
10
Ω
TABLE 3. CONTROL FUNCTION TABLE
Input
Outputs
OE
Q0, Q1
0
HiZ
1
Active
83026BMI-01
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REV. A AUGUST 4, 2010
ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD
4.6V
Inputs, VI
-0.5V to VDD + 0.5 V
Outputs, VO
-0.5V to VDDO + 0.5V
Package Thermal Impedance, θJA
8 Lead SOIC
112.7°C/W (0 lfpm)
8 Lead TSSOP
101.7°C/W (0 lfpm)
Storage Temperature, TSTG
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
TABLE 3A. POWER SUPPLY DC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 1.71V TO 3.465V, TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
VDD
Positive Supply Voltage
Minimum
Typical
Maximum
Units
3.135
3.3
3.465
V
3.135
3.3
3.465
V
2.375
2.5
2.625
V
1.71
1.8
VDDO
Output Supply Voltage
1.89
V
IDD
Power Supply Current
10
mA
IDDO
Output Supply Current
3
mA
TABLE 3B. LVCMOS / LVTTL DC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 2.375V TO 3.465V, TA = -40°C TO 85°C
Symbol
Parameter
Maximum
Units
VIH
Input High Voltage
OE
Test Conditions
Minimum
2
Typical
VDD + 0.3
V
VIL
Input Low Voltage
OE
-0.3
0.8
V
5
µA
IIH
Input High Current
OE
VDD = VIN = 3.465V
IIL
Input Low Current
OE
VDD = 3.465V, VIN = 0V
-150
µA
VOH
Output High Voltage; NOTE 1
VDDO = 3.135V
2.6
V
VDDO = 2.375V
1.8
V
VOL
Output Low Voltage; NOTE 1
NOTE 1: Outputs terminated with 50Ω to VDDO/2. See Parameter Measurement Information section,
"Output Load Test Circuit" diagrams.
0.5
V
TABLE 3C. LVCMOS / LVTTL DC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 1.8V ± 5%, TA = -40°C TO 85°C
Symbol
Parameter
VIH
Input High Voltage
Test Conditions
OE
VIL
Input Low Voltage
OE
IIH
Input High Current
OE
VDD = VIN = 3.465V
IIL
Input Low Current
OE
VDD = 3.465V, VIN = 0V
VOH
Output High Voltage
VOL
Output Low Voltage
83026BMI-01
Minimum
Maximum
Units
2
Typical
VDD + 0.3
V
-0.3
0.8
V
5
µA
-150
µA
IOH = -100µA
VDDO - 0.2
V
IOH = -2mA
VDDO - 0.45
V
IOL = 100µA
0.2
V
IOL = 2mA
0.45
V
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ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
TABLE 3D. DIFFERENTIAL DC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 1.71V TO 3.465V, TA = -40°C TO 85°C
Symbol
Parameter
Maximum
Units
nCLK
VIN = VDD = 3.465V
Test Conditions
150
µA
CLK
VIN = VDD = 3.465V
150
µA
IIH
Input High Current
IIL
Input Low Current
VPP
Peak-to-Peak Input Voltage; NOTE 1
Minimum
Typical
nCLK
VIN = 0V, VDD = 3.465V
-150
µA
CLK
VIN = 0V, VDD = 3.465V
-5
µA
0.15
VCMR
Common Mode Input Voltage; NOTE 2, 3
GND + 0.5
NOTE 1: VPP can exceed 1.3V provided that there is sufficient offset level to keep VIL > 0V.
NOTE 2: For single ended applications, the maximum input voltage for CLK, nCLK is VDD + 0.3V.
NOTE 3: Common mode voltage is defined as VIH.
1.3
V
VDD - 0.85
V
TABLE 4A. AC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 3.3V ± 5%, TA = -40°C TO 85°C
Symbol Parameter
fMAX
Output Frequency
tPD
Propagation Delay; NOTE 1
tsk(o)
Output Skew; NOTE 2, 4
tsk(pp)
Par t-to-Par t Skew; NOTE 3, 4
Buffer Additive Phase Jitter, RMS, refer to
Additive Phase Jitter Section
Output Rise/Fall Time
tjit
t R / tF
Test Conditions
Minimum
Typical
IJ 350MHz
1.3
1.9
Maximum
Units
350
MHz
2.5
ns
15
ps
900
ps
0.03
ps
20% to 80%
150
800
ps
IJ 66MHz
48
52
%
67MHz ≤ ƒ≤ 166MHz
45
55
%
167MHz ≤ ƒ≤ 350MHz
40
60
NOTE 1: Measured from the differential input crossing point to VDDO/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at VDDO/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with
equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 6.
%
odc
83026BMI-01
Output Duty Cycle
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REV. A AUGUST 4, 2010
ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
TABLE 4B. AC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 2.5V ± 5%, TA = -40°C TO 85°C
Symbol Parameter
fMAX
Output Frequency
tPD
Propagation Delay; NOTE 1
tsk(o)
Output Skew; NOTE 2, 4
tsk(pp)
Par t-to-Par t Skew; NOTE 3, 4
Buffer Additive Phase Jitter,
RMS, refer to Additive Phase
Jitter Section
Output Rise/Fall Time
tjit
tR / tF
odc
Output Duty Cycle
Test Conditions
IJ 350MHz
Minimum
1.5
Typical
2.0
Maximum
Units
350
MHz
2.6
ns
15
ps
750
ps
0.03
ps
20% to 80%
150
800
ps
IJ 66MHz
48
52
%
67MHz ≤ ƒ≤ 166MHz
46
54
%
167MHz ≤ ƒ≤ 350MHz
40
60
NOTE 1: Measured from the differential input crossing point to VDDO/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at VDDO/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with
equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
%
TABLE 4C. AC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 1.8V ± 5%, TA = -40°C TO 85°C
Symbol Parameter
fMAX
Output Frequency
tPD
Propagation Delay; NOTE 1
tsk(o)
Output Skew; NOTE 2, 4
tsk(pp)
Par t-to-Par t Skew; NOTE 3, 4
Buffer Additive Phase Jitter,
RMS, refer to Additive Phase
Jitter Section
Output Rise/Fall Time
tjit
tR / tF
odc
Output Duty Cycle
Test Conditions
IJ 350MHz
Minimum
1.9
Typical
2.5
Maximum
Units
350
MHz
3.1
ns
15
ps
600
ps
0.03
ps
20% to 80%
200
900
ps
IJ 66MHz
48
52
%
67MHz ≤ ƒ≤ 166MHz
43
57
%
167MHz ≤ ƒ≤ 350MHz
40
60
NOTE 1: Measured from the differential input crossing point to VDDO/2 of the output.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions.
Measured at VDDO/2.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with
equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
83026BMI-01
5
%
REV. A AUGUST 4, 2010
ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
ADDITIVE PHASE JITTER
the 1Hz band to the power in the fundamental. When the required offset is specified, the phase noise is called a dBc value,
which simply means dBm at a specified offset from the fundamental. By investigating jitter in the frequency domain, we get a
better understanding of its effects on the desired application over
the entire time record of the signal. It is mathematically possible
to calculate an expected bit error rate given a phase noise plot.
The spectral purity in a band at a specific offset from the fundamental compared to the power of the fundamental is called the
dBc Phase Noise. This value is normally expressed using a
Phase noise plot and is most often the specified plot in many
applications. Phase noise is defined as the ratio of the noise
power present in a 1Hz band at a specified offset from the fundamental frequency to the power value of the fundamental. This
ratio is expressed in decibels (dBm) or a ratio of the power in
0
Input/Output Additive
Phase Jitter at 155.52MHz
-10
-20
= 0.03ps typical
-30
-40
-50
SSB PHASE NOISE dBc/HZ
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
-160
-170
-180
-190
1k
10k
100k
1M
10M
100M
OFFSET FROM CARRIER FREQUENCY (HZ)
As with most timing specifications, phase noise measurements
have issues. The primary issue relates to the limitations of the
equipment. Often the noise floor of the equipment is higher than
the noise floor of the device. This is illustrated above. The de-
83026BMI-01
vice meets the noise floor of what is shown, but can actually be
lower. The phase noise is dependant on the input source and
measurement equipment.
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REV. A AUGUST 4, 2010
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LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
PARAMETER MEASUREMENT INFORMATION
1.65V±5%
2.05V±0.103V 1.25V±5%
SCOPE
VDD,
VDDO
VDDO
Qx
LVCMOS
SCOPE
VDD
Qx
LVCMOS
GND
GND
-1.65V±5%
-1.25V±5%
3.3VCORE/2.5V OUTPUT LOAD AC TEST CIRCUIT
3.3VCORE/3.3V OUTPUT LOAD AC TEST CIRCUIT
2.4±0.125V 0.9V±0.45V
V DD
SCOPE
V DD
VDDO
nCLK
V
Cross Points
PP
Qx
LVCMOS
V
CMR
CLK
GND
GND
-0.9V±0.45V
3.3VCORE/1.8V OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
PART 1
V
DDO
Qx
Qx
2
PART 2
V
Qy
2
t sk(o)
OUTPUT SKEW
83026BMI-01
DDO
2
V
DDO
DDO
Qy
V
2
t sk(pp)
PART-TO-PART SKEW
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ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
nCLK
CLK
80%
Q0, Q1
VDDO
2
t
Clock
Outputs
PD
PROPAGATION DELAY
80%
20%
20%
tR
tF
OUTPUT RISE/FALL TIME
V
DDO
2
Q0, Q1
t PW
t
odc =
PERIOD
t PW
x 100%
t PERIOD
OUTPUT DUTY CYCLE/PULSE WIDTH/PERIOD
83026BMI-01
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REV. A AUGUST 4, 2010
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LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
APPLICATION INFORMATION
WIRING THE DIFFERENTIAL INPUT TO ACCEPT SINGLE ENDED LEVELS
Figure 1 shows how the differential input can be wired to accept
single ended levels. The reference voltage V_REF = VDD/2 is
generated by the bias resistors R1, R2 and C1. This bias circuit
should be located as close as possible to the input pin. The ratio
of R1 and R2 might need to be adjusted to position the V_REF in
the center of the input voltage swing. For example, if the input
clock swing is only 2.5V and VDD = 3.3V, V_REF should be 1.25V
and R2/R1 = 0.609.
VDD
R1
1K
Single Ended Clock Input
CLK
V_REF
nCLK
C1
0.1u
R2
1K
FIGURE 1. SINGLE ENDED SIGNAL DRIVING DIFFERENTIAL INPUT
RECOMMENDATIONS FOR UNUSED OUTPUT PINS
OUTPUTS:
LVCMOS OUTPUTS
All unused LVCMOS output can be left floating. We recommend
that there is no trace attached.
83026BMI-01
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LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
DIFFERENTIAL CLOCK INPUT INTERFACE
The CLK /nCLK accepts LVDS, LVPECL, LVHSTL, SSTL, HCSL
and other differential signals. Both VSWING and VOH must meet the
VPP and VCMR input requirements. Figures 2A to 2E show
interface examples for the CLK/nCLK input driven by the most
common driver types. The input interfaces suggested here are
examples only. Please consult with the vendor of the driver
component to confirm the driver termination requirements. For
example in Figure 2A, the input termination applies for LVHSTL
drivers. If you are using an LVHSTL driver from another
vendor, use their termination recommendation.
3.3V
3.3V
3.3V
1.8V
Zo = 50 Ohm
CLK
Zo = 50 Ohm
CLK
Zo = 50 Ohm
nCLK
Zo = 50 Ohm
LVPECL
nCLK
HiPerClockS
Input
LVHSTL
ICS
HiPerClockS
LVHSTL Driver
R1
50
R1
50
HiPerClockS
Input
R2
50
R2
50
R3
50
FIGURE 2A. CLK/nCLK INPUT DRIVEN BY
LVHSTL DRIVER
FIGURE 2B. CLK/nCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER
3.3V
3.3V
3.3V
3.3V
3.3V
R3
125
R4
125
Zo = 50 Ohm
LVDS_Driv er
Zo = 50 Ohm
CLK
CLK
R1
100
Zo = 50 Ohm
nCLK
LVPECL
R1
84
FIGURE 2C.
HiPerClockS
Input
nCLK
Receiv er
Zo = 50 Ohm
R2
84
CLK/nCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER
FIGURE 2D.
CLK/nCLK INPUT DRIVEN BY
3.3V LVDS DRIVER
3.3V
3.3V
3.3V
LVPECL
Zo = 50 Ohm
C1
Zo = 50 Ohm
C2
R3
125
R4
125
CLK
nCLK
R5
100 - 200
R6
100 - 200
R1
84
HiPerClockS
Input
R2
84
R5,R6 locate near the driver pin.
FIGURE 2E. CLK/nCLK INPUT DRIVEN BY
3.3V LVPECL DRIVER WITH AC COUPLE
83026BMI-01
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LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
SCHEMATIC EXAMPLE
LVCMOS drivers. In this example, series termination approach
is shown. Additional termination approaches are shown in the
LVCMOS Termination Application Note.
Figure 3 shows an application schematic example of ICS83026I01. The ICS83026I-01 CLK/nCLK input can directly accepts
various types of differential signal. In this example, the input is
driven by an LVDS driver. The ICS83026I-01 outputs are
VDD
3.3V
R3
1K
Zo = 50 Ohm
VDD
R4
100
1
2
3
4
VDD
CLK
nCLK
OE
VDDO
Q0
Q1
GND
VDDO
8
7
6
5
R1
43
Zo = 50 Ohm
LVCMOS
C2
0.1u
LVDS
U1
ICS83026I-01
C1
0.1u
Zo = 50 Ohm
Zo = 50 Ohm
VDD=3.3V
R2
43
VDDO= 3.3V, 2.5V or 1.8V
LVCMOS
FIGURE 3. ICS83026I-01 SCHEMATIC EXAMPLE
RELIABILITY INFORMATION
TABLE 5A. θJAVS. AIR FLOW TABLE FOR 8 LEAD SOIC
θJA by Velocity (Linear Feet per Minute)
0
Single-Layer PCB, JEDEC Standard Test Boards
Multi-Layer PCB, JEDEC Standard Test Boards
153.3°C/W
112.7°C/W
200
500
128.5°C/W
103.3°C/W
115.5°C/W
97.1°C/W
NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs.
TABLE5B. θJAVS. AIR FLOW TABLE FOR 8 LEAD TSSOP
θJA by Velocity (Linear Feet per Minute)
Multi-Layer PCB, JEDEC Standard Test Boards
0
200
500
101.7°C/W
90.5°C/W
89.8°C/W
TRANSISTOR COUNT
The transistor count for ICS83026I-0I is: 260
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REV. A AUGUST 4, 2010
ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
PACKAGE OUTLINE - SUFFIX M FOR 8 LEAD SOIC
PACKAGE OUTLINE - G SUFFIX FOR 8 LEAD TSSOP
TABLE 6A. PACKAGE DIMENSIONS
SYMBOL
MINIMUM
N
A
TABLE 6B. PACKAGE DIMENSIONS
Millimeters
SYMBOL
MAXIMUM
8
Millimeters
Minimum
N
Maximum
8
1.35
1.75
A
--
1.20
A1
0.10
0.25
A1
0.05
0.15
B
0.33
0.51
A2
0.80
1.05
C
0.19
0.25
b
0.19
0.30
D
4.80
5.00
c
0.09
0.20
E
3.80
4.00
D
2.90
3.10
e
1.27 BASIC
E
6.40 BASIC
H
5.80
6.20
E1
h
0.25
0.50
e
L
0.40
1.27
L
0.45
0.75
α
0°
8°
α
0°
8°
aaa
--
0.10
Reference Document: JEDEC Publication 95, MS-012
4.30
4.50
0.65 BASIC
Reference Document: JEDEC Publication 95, MO-153
83026BMI-01
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REV. A AUGUST 4, 2010
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LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
TABLE 7. ORDERING INFORMATION
Part/Order Number
Marking
Package
Shipping Packaging
Temperature
83026BMI-01
3026BI01
8 lead SOIC
tube
-40°C to 85°C
83026BMI-01T
3026BI01
8 lead SOIC
2500 tape & reel
-40°C to 85°C
83026BMI-01LF
026BI01L
8 lead "Lead-Free" SOIC
tube
-40°C to 85°C
83026BMI-01LFT
026BI01L
8 lead "Lead-Free" SOIC
2500 tape & reel
-40°C to 85°C
83026BGI-01
26B01
8 lead TSSOP
83026BGI-01T
26B01
8 lead TSSOP
2500 tape & reel
-40°C to 85°C
-40°C to 85°C
83026BGI-01LF
BI01L
8 lead "Lead-Free" TSSOP
tube
-40°C to 85°C
83026BGI-01LFT
BI01L
8 lead "Lead-Free" TSSOP
2500 tape & reel
-40°C to 85°C
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
While the information presented herein has been checked for both accuracy and reliability, Integrated Device Technology, Inc. (IDT) assumes no responsibility for either its use or for infringement of
any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal commercial and industrial
applications. Any other applications such as those requiring high reliability, or other extraordinary environmental requirements are not recommended without additional processing by IDT. IDT reserves
the right to change any circuitry or specifications without notice. IDT does not authorize or warrant any IDT product for use in life support devices or critical medical instruments.
83026BMI-01
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REV. A AUGUST 4, 2010
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LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
REVISION HISTORY SHEET
Rev
Table
A
T7
A
A
T3C
A
A
T7
T7
A
T7
83026BMI-01
Page
1
3
11
12
13
6
3
1
9
13
13
13
15
Description of Change
Added 8 Lead TSSOP package to Pin Assignment.
Absolute Maximum Ratings - added 8 Lead TSSOP to Package Thermal
Impedance.
Added 8 Lead TSSOP Reliability Information table.
Added 8 Lead TSSOP Package Outline and Package Dimensions.
Ordering Information Table - added 8 Lead TSSOP ordering information.
Additive Phase Jitter - corrected X axis on plot.
Date
6/25/04
8/2/05
LVCMOS DC Characteristics - corrected Test Conditions for IIH and IIL.
Features Section - added lead-free bullet
Added Recommendations for Unused Output Pins.
Ordering Information Table - added lead-free par t number, marking, and note.
Ordering Information Table - added lead-free marking
Updated datasheet's header/footer with IDT from ICS.
Removed ICS prefix from Par t/Order Number column.
Added Contact Page.
14
8/12/05
1/16/06
10/22/07
8/4/10
REV. A AUGUST 4, 2010
ICS83026I-01
LOW SKEW, 1-TO-2
DIFFERENTIAL-TO-LVCMOS/LVTTL FANOUT BUFFER
We’ve Got Your Timing Solution.
6024 Silver Creek Valley Road
San Jose, CA 95138
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Tech Support
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+408-284-8200 (outside USA)
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© 2010 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT, the IDT logo, ICS and HiPerClockS are trademarks of Integrated Device Technology, Inc.
Accelerated Thinking is a service mark of Integrated Device Technology, Inc. All other brands, product names and marks are or may be trademarks or registered trademarks used to identify products or services of
their respective owners.
Printed in USA
83026BMI-01
15
REV. A AUGUST 4, 2010
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