TI CY74FCT2543TQCT 8-bit latched transceiver Datasheet

Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY74FCT2543T
8-Bit Latched Transceiver
SCCS042 - September 1994 - Revised March 2000
Features
Functional Description
• Function and pinout compatible with FCT and F logic
• FCT-C speed at 5.3 ns max.
FCT-A speed at 6.5 ns max.
• 25Ω output series resistors to reduce transmission line
reflection noise
• Reduced VOH (typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable feature
• Matched rise and fall times
• Fully compatible with TTL input and output logic levels
• Sink current
12 mA
Source current
15 mA
• Separation controls for data flow in each direction
• Back to back latches for storage
• ESD > 2000V
• Extended commercial temp. range of –40˚C to +85˚C
Functional Block Diagram
The FCT2543T Octal Latched Tranceiver contains two sets of
eight D-type latches. Separate Latch Enable (LEAB, LEBA)
and Output Enable (OEAB, OEBA) permits each latch set to
have independent control of inputting and outputting in either
direction of data flow. For data flow from A to B, for example,
the A-to-B Enable (CEAB) input must be LOW to enter data
from A or to take data from B, as indicated in the truth table.
With CEAB LOW, a LOW signal on the A-to-B Latch Enable
(LEAB) input makes the A-to-B latches transparent; a subsequent LOW-to-HIGH transition of the LEAB signal puts the A
latches in the storage mode and their output no longer change
with the A inputs. With CEAB and OEAB both LOW, the
three-state B output buffers are active and reflect data present
at the output of the A latches. Control of data from B to A is
similar, but uses CEAB, LEAB, and OEAB inputs. On-chip termination resistors have been added to the outputs to reduce
system noise caused by reflections. The FCT2543T can be
used to replace the FCT543T to reduce noise in an existing
design.
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
Pin Configurations
Detail A
SOIC/QSOP
Top View
B0
D Q
LE
A0
Q D
LE
LEBA
1
24
VCC
OEBA
2
23
CEBA
A0
3
22
B0
A1
4
21
B1
A1
B1
A2
5
20
B2
A2
B2
A3
6
19
B3
A3
B3
A4
7
18
B4
A4
B4
A5
8
17
B5
B5
A6
9
16
B6
A7
10
15
B7
CEAB
11
14
LEAB
GND
12
13
OEAB
A5
A6
A7
Detail A x 7
B6
B7
OEBA
FCT2543T–3
OEAB
CEBA
CEAB
LEBA
LEAB
FCT2543T–1
Copyright
© 2000, Texas Instruments Incorporated
CY74FCT2543T
Maximum Ratings[4,5]
Pin Description
Name
(Above which the useful life may be impaired. For user guidelines, not tested.)
Description
OEAB
A-to-B Output Enable Input (Active LOW)
Storage Temperature ..................................... −65°C to +150°C
OEBA
B-to-A Output Enable Input (Active LOW)
CEAB
A-to-B Enable Input (Active LOW)
Ambient Temperature with
Power Applied .................................................. −65°C to +135°C
CEBA
B-to-A Enable Input (Active LOW)
Supply Voltage to Ground Potential..................−0.5V to +7.0V
LEAB
A-to-B Latch Enable Input (Active LOW)
LEBA
B-to-A Latch Enable Input (Active LOW)
A
A-to-B Data Inputs or B-to-A Three-State Outputs
B
B-to-A Data Inputs or A-to-B Three-State Outputs
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage ..............................................−0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ...... 120 mA
Power Dissipation .......................................................... 0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Function Table[1,2]
Operating Range
Inputs
Latch
Outputs
CEAB
LEAB
OEAB
A-to-B[3]
B
H
X
X
Storing
High Z
X
H
X
Storing
X
X
X
H
X
High Z
L
L
L
Transparent
Current A Inputs
L
H
L
Storing
Previous A Inputs
Range
Commercial
Ambient
Temperature
VCC
−40°C to +85°C
5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
Min.
Typ.[7]
2.4
3.3
VOH
Output HIGH Voltage
VCC=Min., IOH=−15 mA
VOL
Output LOW Voltage
VCC=Min., IOL=12 mA
ROUT
Output Resistance
VCC=Min., IOL=12 mA
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VH
Hysteresis[8]
All inputs
0.2
VIK
Input Clamp Diode Voltage
VCC=Min., IIN=−18 mA
−0.7
IIH
Input HIGH Current
IIH
Input HIGH Current
IIL
20
Max.
Unit
V
0.3
0.55
V
25
40
Ω
2.0
V
0.8
V
V
−1.2
V
VCC=Max., VIN=VCC
5
µA
VCC=Max., VIN=2.7V
±1
µA
Input LOW Current
VCC=Max., VIN=0.5V
±1
µA
IOZH
Off State HIGH-Level Output
Current
VCC=Max., VOUT=2.7V
15
µA
IOZL
Off State LOW-Level
Output Current
VCC=Max., VOUT=0.5V
−15
µA
IOS
Output Short Circuit Current[9]
VCC=Max., VOUT=0.0V
−225
mA
IOFF
Power-Off Disable
VCC=0V, VOUT=4.5V
±1
µA
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.
2. A-to-B data flow shown: B-to-A is the same, except using CEBA, LEBA, and OEBA.
3. Before LEAB LOW-to-HIGH transition.
4. Unless otherwise noted, these limits are over the operating free-air temperature range.
5. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
6. TA is the “instant on” case temperature.
2
−60
−120
CY74FCT2543T
Capacitance[8]
Parameter
Description
Test Conditions
Typ.[7]
Max.
Unit
CIN
Input Capacitance
5
10
pF
COUT
Output Capacitance
9
12
pF
Typ.[7]
Max.
Unit
0.1
0.2
mA
Power Supply Characteristics
Parameter
ICC
Description
Test Conditions
Quiescent Power Supply Current VCC=Max., VIN≤0.2V, VIN≥VCC−0.2V
∆ICC
Quiescent Power Supply Current
(TTL inputs)
VCC=Max., VIN=3.4V,
f1=0, Outputs Open
0.5
2.0
mA
ICCD
Dynamic Power Supply
Current[11]
VCC=Max., One Input Toggling,
50% Duty Cycle, Outputs Open,
CEAB and OEAB=LOW, CEBA=HIGH,
VIN≤0.2V or VIN≥VCC−0.2V
0.06
1.2
mA/
MHz
IC
Total Power Supply Current[12]
VCC=Max., f0=10 MHz, 50% Duty Cycle, Outputs
Open, One Bit Toggling at f1=5 MHz,
CEAB and OEAB=LOW, CEBA=HIGH,
f0=LEAB =10 MHz, VIN≤0.2V or VIN≥VCC−0.2V
0.7
1.4
mA
VCC=Max., f0=10 MHz, 50% Duty Cycle, Outputs
Open, One Bit Toggling at f1=5 MHz,
CEAB and OEAB=LOW, CEBA=HIGH,
f0=LEAB =10 MHz, VIN=3.4V or VIN=GND
1.2
3.4
mA
VCC=Max., f0=10 MHz, 50% Duty Cycle, Outputs
Open, Eight Bits Toggling at f1=5 MHz,
CEAB and OEAB=LOW, CEBA=HIGH,
f0=LEAB =10 MHz, VIN≤0.2V or VIN≥VCC−0.2V
2.8
5.6[13]
mA
VCC=Max., f0=10 MHz, 50% Duty Cycle, Outputs
Open, Eight Bits Toggling at f1=5 MHz,
CEAB and OEAB=LOW, CEBA=HIGH,
f0=LEAB =10 MHz, VIN=3.4V or VIN=GND
5.1
14.6[13]
mA
[10]
Notes:
7. Typical values are at VCC=5.0V, TA=+25˚C ambient.
8. This parameter is specified but not tested.
9. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametrics tests. In any sequence of parameter
tests, IOS tests should be performed last.
10. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.
11. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
= IQUIESCENT + IINPUTS + IDYNAMIC
12. IC
IC
= ICC+∆ICCDHNT+ICCD(f0/2 + f1N1)
ICC = Quiescent Current with CMOS input levels
∆ICC = Power Supply Current for a TTL HIGH input (VIN=3.4V)
= Duty Cycle for TTL inputs HIGH
DH
= Number of TTL inputs at DH
NT
ICCD = Dynamic Current caused by an input transition pair (HLH or LHL)
= Clock frequency for registered devices, otherwise zero
f0
= Input signal frequency
f1
= Number of inputs changing at f1
N1
All currents are in milliamps and all frequencies are in megahertz.
13. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
3
CY74FCT2543T
Switching Characteristics Over the Operating Range[14]
CY74FCT2543T
Parameter
Description
CY74FCT2543AT
CY74FCT2543CT
Min.
Max.
Min.
Max.
Min.
Max.
Unit
Fig. No.[15]
tPLH
tPHL
Propagation Delay
Transparent Mode
A to B or B to A
2.5
8.5
2.5
6.5
2.5
5.5
ns
1, 3
tPLH
tPHL
Propagation Delay
LEBA to A LEAB to B
2.5
12.5
2.5
8.0
2.5
7.0
ns
1, 5
tPZH
tPZL
Output Enable Time
OEBA or OEAB to A or B
CEBA or CEAB to A or B
2.0
12.0
2.0
9.0
2.0
8.0
ns
1, 7, 8
tPZH
tPZL
Output Disable Time
OEBA or OEAB to A or B
CEBA or CEAB to A or B
2.0
9.0
2.0
7.5
2.0
6.5
ns
1, 7, 8
tS
Set-Up Time HIGH or LOW,
A or B to LEBA or LEAB
2.0
2.0
2.0
ns
9
tH
Hold Time HIGH or LOW,
A or B to LEBA or LEAB
2.0
2.0
2.0
ns
9
tW
Pulse Width LOW
LEBA or LEAB
5.0
5.0
5.0
ns
5
Ordering Information
Speed
(ns)
5.3
6.5
8.5
Ordering Code
CY74FCT2543CTQCT
Package
Name
Package Type
Q13
24-Lead (150-Mil) QSOP
CY74FCT2543CTSOC/SOCT
S13
24-Lead (300-Mil) Molded SOIC
CY74FCT2543ATQCT
Q13
24-Lead (150-Mil) QSOP
CY74FCT2543ATSOC/SOCT
S13
24-Lead (300-Mil) Molded SOIC
CY74FCT2543TQCT
Q13
24-Lead (150-Mil) QSOP
Notes:
14. Minimum limits are specified but not tested on Propagation Delays.
15. See “Parameter Measurement Information” in the General Information section.
Document #: 38−00348−A
4
Operating
Range
Commercial
Commercial
Commercial
CY74FCT2543T
Package Diagrams
24-Lead Quarter Size Outline Q13
24-Lead (300-Mil) Molded SOIC S13
5
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